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Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and Area dterm 1 Average: 79.7 (of 85) Std. Dev.: 4.4

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Page 1: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Penn ESE370 Fall 2014 -- Townley & DeHon

ESE370:Circuit-Level

Modeling, Design, and Optimization for Digital Systems

Day 14: October 1, 2014

Layout and AreaMidterm 1 Average: 79.7 (of 85) Std. Dev.: 4.4

Page 2: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Problem 4 • Failure – my fault

– Should be: min(max(3*(Va-Vb),0),1)

• Failed to provide good diagnosis of restoration understanding– Noisy measurement

• Result– Exam not provide very high precision

assessment of students• Cannot distinguish A from B students

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 3: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Exam Successes (not fail)

• Does provide enough information to diagnose anyone ein big trouble and should drop – separate the DF from AB

• Diagnose a few R C items– Need that down cold will use heavily

• Did focus you on understanding these items, including restoration

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 4: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

4

Today

• Layout– Transistors– Gates

• Design rules

• Standard cells

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 5: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Layout

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 6: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

6

Transistor

Side view

Perspective view

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 7: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

7

Layout

• Sizing & positioning of transistors

• Designer controls W,L

• tox fixed for process– Sometimes

thick/thin oxide “flavors”

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 8: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

8

NMOS Geometry

Top view Perspective view

L

W

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 9: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

9

NMOS Geometry

Top view

L

W

• Color scheme– Red: gate– Green: source and drain

areas (n type diffusion)S DG

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 10: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

10

NMOS vs PMOS

Rabaey text, Fig 2.1Penn ESE370 Fall 2014 -- Townley & DeHon

• NMOS built on p substrate

• PMOS built on n substrate– Needs an N-well

Page 11: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

11

PMOS Geometry

n well

L

W

• Color scheme– Red: gate– Orange: source and drain

areas (p type)– Green: n well

• NMOS built on p wafer– Must add n material to

build PMOS

S DG

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 12: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

12

Body Contact

• “Fourth terminal”• Needed to set

voltage around device– PMOS: Vb = Vdd

– NMOS: Vb = GND

• At right: PMOS (orange) with body contact (dark green)

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 13: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

13

Body Contact

• Needed to set voltage around device– PMOS: Vb = Vdd

– NMOS: Vb = GND

• What happens if NMOS body contact is Vdd?

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 14: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

14

Body Contact

• Needed to set voltage around device– PMOS: Vb = Vdd

– NMOS: Vb = GND

• What happens if NMOS body contact is Vdd?– Polarity of field wrong– Won’t invert channel

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 15: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

15

Body Contact

• Needed to set voltage around device– PMOS: Vb = Vdd

– NMOS: Vb = GND

• Always to same supply as the transistor might be connected in CMOS

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 16: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Penn ESE370 Fall 2014 -- Townley & DeHon

Rotate All butPMOS Transistor90 degrees

Page 17: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

17

Interconnect• Connect transistors

– Different layers of metal• “Contact” - metal to transistor• “Via” - metal to metal

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 18: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

18

Interconnect• Connect transistors

– Different layers of metal• “Contact” - metal to transistor• “Via” - metal to metal

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 19: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

19

Interconnect Cross Section

ITRS 2007Penn ESE370 Fall 2014 -- Townley & DeHon

Page 20: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

20

Masks

• Define areas want to see in layer– Think of “stencil” for material deposition

• Use photoresist (PR) to form the “stencil”– Expose PR through mask– PR dissolves in exposed area– Material is deposited

• Only “sticks” in area w/ dissolved PR

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 21: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

21

Masking Process

• Goal: draw a shape on the substrate– Simplest example: draw a rectangle

Silicon wafer

Mask

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 22: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

22

Masking Process

• First: deposit photoresist

photoresist

Mask

Silicon wafer

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 23: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

23

Masking Process

• Expose through mask– UV light

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 24: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

24

Masking Process• Remove mask and

develop PR– Exposed area

dissolves– This is “positive

photoresist”

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 25: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

25

Masking Process• Deposit metal through PR

window– Then dissolve remaining PR

• Why not just use mask?– Masks are expensive– Shine light through mask to

etch PR– Can reuse mask

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 26: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

26

Reverse EngineerInverter Layout

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 27: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

27

Layout Revisited

• How to “decode” circuit from layout?

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 28: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

28

Reverse EngineerInverter Layout

Penn ESE370 Fall 2014 -- Townley & DeHon

Power (Vdd)

GND

Page 29: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

29

Reverse EngineerInverter Layout

• Where is PMOS transistor?

• NMOS?

Penn ESE370 Fall 2014 -- Townley & DeHon

Power (Vdd)

GND

Page 30: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Penn ESE370 Fall2010 -- DeHon30

Layout to Circuit

• 1. Identify transistors

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 31: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

31

Inverter Layout

• Where is Input?

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 32: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

32

Inverter Layout

• Where is Output?

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 33: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

33

Layout to Circuit

• 2. Add wires

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 34: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

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Layout to Circuit

• 2. Add wires

Penn ESE370 Fall 2010 -- Townley (DeHon)Penn ESE370 Fall 2014 -- Townley & DeHon

Page 35: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

35

Inverter Layout

• What is structure at top and bottom?

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 36: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

36

Layout to Circuit

• 2. Add wires

Penn ESE370 Fall 2010 -- Townley (DeHon)Penn ESE370 Fall 2014 -- Townley & DeHon

Page 37: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

37

Layout to Circuit

• 2. Add wires

Penn ESE370 Fall 2010 -- Townley (DeHon)Penn ESE370 Fall 2014 -- Townley & DeHon

Page 38: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

38

Design Rules• Why not adjacent

transistors?– Plenty of empty

space– If area is money,

pack in as much as possible

• Recall: processing imprecise– Margin of error for

process variation

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 39: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

39

Design Rules• Contract between process engineer &

designer– Minimum width/spacing– Can be (often are) process specific

• Lambda rules: scalable design rules– In terms of = 0.5 Lmin (Ldrawn)– Can migrate designs from similar process– Limited scope: 22nm process != 1m

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 40: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Design Rules: Some Examples

Penn ESE370 Fall 2014 -- Townley & DeHon

2

66

3

2

2

1.5

n doping

p doping

gate

contact

metal 1

metal 2

via

Legend

Page 41: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

41

Layout #2 (practice)

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 42: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

42

Layout #2 (practice)

• How many transistors?– PMOS?– NMOS?

• How connected?– PMOS, NMOS?

• Inputs connected?• Outputs?• What is it?

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 43: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

43

Standard Cells• Lay out gates so that heights match

– Rows of adjacent cells– Standardized sizes

• Motivation: automated place and route– EDA tools convert HDL to layout

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 44: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Penn ESE370 Fall 2014 -- Townley & DeHon

Standard Cell Area

inv nand3

All cellsuniformheight

Width ofchanneldeterminedby routing

Cell area

Identify the full custom and standard cell regions on 386DX diehttp://microscope.fsu.edu/chipshots/intel/386dxlarge.html

Page 45: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Standard Cell Layout Example

Penn ESE370 Fall 2014 -- Townley & DeHon

http://www.laytools.com/images/StandardCells.jpg

Page 46: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

ALU in Standard Cell

Penn ESE370 Fall 2014 -- Townley & DeHon

http://www.erc.msstate.edu/mpl/distributions/scmos/images/alu_yongchen.gif

Page 47: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Penn ESE370 Fall 2014 -- Townley & DeHon

Standard Cell Area

inv nand3

All cellsuniformheight

Width ofchanneldeterminedby routing

Cell area

Identify the full custom and standard cell regions on 386DX diehttp://microscope.fsu.edu/chipshots/intel/386dxlarge.html

Page 48: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

48

Big Idea

• Layouts are physical realization of circuit– Geometry tradeoff

• Can decrease spacing at the cost of yield• Design rules

• Can go from circuit to layout or layout to circuit by inspection

Penn ESE370 Fall 2014 -- Townley & DeHon

Page 49: Penn ESE370 Fall 2014 -- Townley & DeHon ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 14: October 1, 2014 Layout and

Admin

• HW5 out– Due Tuesday – (Thursday next week is Fall Break)

• Here on Friday

Penn ESE370 Fall 2014 -- Townley & DeHon