chp133 bbp ms
TRANSCRIPT
ABB
Technology and SolutionsProtection and Substation Automation
©AB
B S
witz
erla
nd L
td.-
1C
HP
133_
BB
P_M
S /
2007
09 /
RW
Topic:
Busbar Protection
Measurement System
ABB©AB
B S
witz
erla
nd L
td.-
2C
HP
133_
BB
P_M
S /
2007
09 /
RW
Busbar Protection – Measurement System
r Introductionr BBP Requirement r BBP Basicsr Special Condition for the BBP (≠ LP, TP, GP ….)r The “problem” on CT Saturationr High Impedance Measurement Principler Low Impedance Measurement Principle
q Example and Features of different Methods / Algorithmsq INX-2q INX-5q REB500q REB670
r Calculation examples: Differential & Restraining Current / Differential Voltage
r Open CT / Differential current Supervision r Additional Release / Tripping Criteriasr Intertripping
Objectives / Overview
ABB©AB
B S
witz
erla
nd L
td.-
3C
HP
133_
BB
P_M
S /
2007
09 /
RW
Introduction
q It is extremely important for Busbar Protection applications to have good security since an unwanted operation might have severe consequences
q The unwanted operation of the Busbar Protection will have the similar effect as simultaneous faults on all power system elements connected to the bus
q On the other hand, the BBP has to be dependable as well. Failure to operate or even slow operation in case of a busbar fault can have fatal consequences. Human injuries, power system blackout, transient instability or considerable damage to the surrounding substation equipment and the close- by generators are some of the possible outcomes
ABB©AB
B S
witz
erla
nd L
td.-
4C
HP
133_
BB
P_M
S /
2007
09 /
RW
Introduction
q A fault on a busbar in the network is relatively seldom: Statistically once in every 20 – 30 years per switchgear
q A fault on an overhead line in the network is statistically more than factor 100 higher
q The life time of busbar protection systems could be more than 30 – 40 years
q According to studies all costs to integrate a BBP system will be covered in case of ONE successful trip in it’s life time
q Remember: maloperating / unwanted operating as well as non operating BBP system can and have caused blackouts
ABB©AB
B S
witz
erla
nd L
td.-
5C
HP
133_
BB
P_M
S /
2007
09 /
RW
BBP RequirementsNumber the requirements depending on the importance
___ STABILITY in case of external faults (even with extreme CT saturation)
___ RELIABILITY (extensive self- supervision)___ TRIPPING SPEED
___ easily EXTENDABLE
___ extensive SELFSUPERVISION
___ SIMPLE OPERATION (Maintenance & Commissioning)
___ low CT REQUIREMENTS
___ SELEKTIVITY (only the fault affected busbar is allowed to trip)
___ MALOPERATION extremely unacceptable
___ matching to all switchgear CONFIGURATIONS
___ integration of BREAKER FAILURE PROTECTION (additional protection & monitoring functions)
___ SENSITIVITY
ABB©AB
B S
witz
erla
nd L
td.-
6C
HP
133_
BB
P_M
S /
2007
09 /
RW
Who knows Mr. Kirchhoff ?
BBP Basics
ABB©AB
B S
witz
erla
nd L
td.-
7C
HP
133_
BB
P_M
S /
2007
09 /
RW
Kirchhoff’s 1st Law: Node Rule
I1 + I2 + I3 = Σ I = 0
The sum of all
currents must be zero
BBP Basics
ABB©AB
B S
witz
erla
nd L
td.-
8C
HP
133_
BB
P_M
S /
2007
09 /
RW
Kirchhoff’s 1st Law: Node Rule
I1 + I2 + I3 = Σ I
≠0
⇒ Fault on the busbar
⇒ Trip circuit breaker
If
BBP Basics
ABB©AB
B S
witz
erla
nd L
td.-
9C
HP
133_
BB
P_M
S /
2007
09 /
RW
Differential current measurement
Σ I = I1 + I2 + I3
If
Σ I > differential current setting
⇒Trip Busbar Protection
BBP Basics
the measurement (system) has to be phase segregated3 (4) measurement systems: R; S; T (& special: N)
ABB©AB
B S
witz
erla
nd L
td.-
10C
HP
133_
BB
P_M
S /
2007
09 /
RW
External Fault
BBP Basics
I1 I2
Σ I
⇒ No Differential Current
⇒ No Trip
ABB©AB
B S
witz
erla
nd L
td.-
11C
HP
133_
BB
P_M
S /
2007
09 /
RW
Internal Fault
BBP Basics
⇒ High Differential Current
⇒ TripI1 I2
Σ I
ABB©AB
B S
witz
erla
nd L
td.-
12C
HP
133_
BB
P_M
S /
2007
09 /
RW
External Fault – with DC component
BBP Basics
I1 I2
Σ I
⇒ No Differential Current
⇒ No Trip
A DC component will be super-imposed if the short circuit does not occur at the voltage peak
The DC component will decade with the network time constant τ = L / R
ABB©AB
B S
witz
erla
nd L
td.-
13C
HP
133_
BB
P_M
S /
2007
09 /
RW
Internal Fault – with DC component
BBP Basics
⇒ High Differential Current
⇒ Trip
I1 I2
Σ I
ABB©AB
B S
witz
erla
nd L
td.-
14C
HP
133_
BB
P_M
S /
2007
09 /
RW
Protection Zones
Special Condition for the BBP (≠ LP, TP, GP ….)B
usba
r
Busbar
Line
Tran
sfor
mer
Gen
erat
or -
Tran
sfor
mer
BBG
ABB©AB
B S
witz
erla
nd L
td.-
15C
HP
133_
BB
P_M
S /
2007
09 /
RW
All protection system (excl. BBP):The current in the current transformer (CT) due to a fault inside the protection zone is usually higher than the current in the CT due to a fault outside the protection zone. The reason for this is:
• In case on a feeder fault (near the busbar) the current in the feeders CT is equal to the sum of all feeder currents connected to the busbar.
• In case on a busbar fault the currents in the CTs are limited by the line or transformer reactance.
I external fault < I internal fault• Stability condition: on relatively low currents - CT saturation unlikely
• Tripping condition: on extremely high currents - CT saturation very likely
Special Condition for the BBP (≠ LP, TP, GP ….)
ABB©AB
B S
witz
erla
nd L
td.-
16C
HP
133_
BB
P_M
S /
2007
09 /
RW
Busbar protection system:The current in the current transformer (CT) due to a fault outside the protection zone is usually higher than the current in the CT due to a fault inside the protection zone. The reason for this is:
• In case on a feeder fault (near the busbar) the current in the feeders CT is equal to the sum of all feeder currents connected to the busbar.
• In case on a busbar fault the currents in the CTs are limited by the line or transformer reactance.
I external fault > I internal fault• Stability condition: on extremely high currents - CT saturation very likely
• Tripping condition: on relatively low currents - CT saturation unlikely
Special Condition for the BBP (≠ LP, TP, GP ….)
ABB©AB
B S
witz
erla
nd L
td.-
17C
HP
133_
BB
P_M
S /
2007
09 /
RW
External Fault
CT Saturation
I1 I2
Σ I
⇒ the CT saturation will produce a differential current which could result in a MALOPERATION
ABB©AB
B S
witz
erla
nd L
td.-
18C
HP
133_
BB
P_M
S /
2007
09 /
RW
External Fault – with DC component
CT Saturation
I1 I2
Σ I
The DC component will increase the saturation
⇒ the CT saturation will produce a differential current which could result in a MALOPERATION
ABB©AB
B S
witz
erla
nd L
td.-
19C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
q The only BBP system which can handle CT saturation without any other quantity than Idiff(Σ I ) is the High Impedance Protection System.
q The High Impedance Measurement Principle uses the physical behaviour of the CT saturation to prevent (mal-) operation in case of external fault with (high) CT saturation.
ABB©AB
B S
witz
erla
nd L
td.-
20C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
CT2
feeder 1 feeder 2
RR
BB 1
CT1 U1 UR
RL1 RL2
UR > 0
U2 ImIm
Principle / Components
CT secondary reactance
Line resistance from CT to relay
High impedance (input)
I2I1Idiff = Σ I
ABB©AB
B S
witz
erla
nd L
td.-
21C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
CT refresher course:
Im [A]
10’000
100
1’000
0.001 0.01 0.1 1
U [V
]
2Excitation or magnetizing current
Magnetizing Curve
ABB©AB
B S
witz
erla
nd L
td.-
22C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
CT refresher course:
Im [A]
10’000
100
1’000
0.001 0.01 0.1 1
U [V
]
2Excitation or magnetizing current
Magnetizing Curve
Knee point voltage (when saturation starts)
Dynamical resistant:du/di = r <<<<<<
Dynamical resistant:du/di = r >>>>>>
ABB©AB
B S
witz
erla
nd L
td.-
23C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
CT2
feeder 1 feeder 2
RR
BB 1
CT1 U1 UR
RL1 RL2
UR > 0
U2 ImIm
Internal Fault
Principle:
An internal fault will immediately result in a differential current and therefore a (high) voltage on the high impedance. The overvoltage relay which is measuring at the high impedance will pick up instantly.
The pick up voltage level must be set depending on the lowest possible fault current and the maximum load.
I2I1Idiff = Σ I
ABB©AB
B S
witz
erla
nd L
td.-
24C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
CT2
feeder 1 feeder 2
RR
BB 1
CT1 U1 UR
RL1 RL2
UR > 0
U2 ImIm
Internal Fault
General setting rule:(since UR max = Uk)
RR = High Impedance (e.g. 2000Ω)UR = Voltage at the high impedanceUk = CT knee point voltage (e.g. 400V)N = CT ratio (e.g. 4000A/1A)Uset = overvoltage pick up setting
I2I1Idiff = Σ I
Å Uset ≤ 400V
Uset ≤ Uk
ABB©AB
B S
witz
erla
nd L
td.-
25C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
feeder 1 feeder 2
RR
BB 1
CT1 U1 UR
RL1 RL2
UR > 0
U2 ImIm
External Fault (without CT saturation)
I2I1Idiff = Σ I
CT2
Principle:
An external fault (without CT saturation) will practically produce a very low differential current and therefore “no” voltage on the high impedance. The overvoltage relay which is measuring at the high impedance will not pick up.
RW
ABB©AB
B S
witz
erla
nd L
td.-
26C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
feeder 1 feeder 2
RR
BB 1
CT1 U1 UR
RL1 RL2
UR > 0
U2 ImIm
External Fault (with CT saturation)
I2I1Idiff = Σ I
CT2
Principle:
In case of CT saturation the secondary reactance of the saturated CT will practically come to zero. Only the secondary resistant RCT(winding resistant) will result (du/di = r <<<<<<).
The High impedance will be bypassed by the relatively small sum of RW + 2RL2. Therefore the voltage UR will not reach the pick up level.
RCT
ABB©AB
B S
witz
erla
nd L
td.-
27C
HP
133_
BB
P_M
S /
2007
09 /
RW
CT2
feeder 1 feeder 2
RR
BB 1
CT1 U1 UR
RL1 RL2
UR > 0
U2 ImIm
Setting rules for stability: UR = Voltage at the high impedanceIkmax = maximum possible ext. fault current (e.g. 45kA)N = CT ratio (e.g. 4000A/1A)Uset = overvoltage pick up settingRCT = CT winding resistant (e.g. 6Ω)RL2 = lead resistant (e.g. 2Ω)2.5 = safety margin
I2I1Idiff = Σ I
Ç Uset ≥ 2.5 / 4000 * 45kA * (6Ω + 2 * 2Ω)≥ 281V
External Fault (with CT saturation)
Uset ≥ 2.5 / N * Ikmax * (RCT + 2 * RL2)
RCT
High Impedance Measurement Principle
ABB©AB
B S
witz
erla
nd L
td.-
28C
HP
133_
BB
P_M
S /
2007
09 /
RW
RR = High Impedance (e.g. 2000Ω)Ikmin = minimum possible fault current (e.g. 1kA)N = CT ratio (e.g. 4000A/1A)Uset = overvoltage pick up settingIM = magnetising current at UK/2 (e.g. 0.3mA)x = number of CTs (e.g. 2)
Actual value of primary pick-up current
High Impedance Measurement Principle
Requirements:Å Uset ≤ 400V Ç Uset ≥ 281V
Minimum pick up value for the detection of the minimum primary fault currentUset ≤ (Ikmin / N – x * IM) * RRUset ≤ (1000A / 4000 – 2 * 3mA) * 2KΩUset ≤ 488 V
Minimum primary fault current detection with actual setting of Uset = 300 V:Ikmin = N * (Uset / RR + x * IM)Ikmin = 2000 * (300V / 2000Ω + 2 * 3mA)Ikmin = 624 A
ABB©AB
B S
witz
erla
nd L
td.-
29C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
If necessary,q an additional parallel resistor RP can be connected to change / adapt the sensitivityq an additional VDR can be connected to limit the voltage on the high impedance (to prevent damage)q an additional time delayed low stage overvoltage unit / function can be connected to detect open / missing CT inputs during load condition
Alternatives (1)
Alarm
BlockUR U>>
TripRP VDR U>
t
ABB©AB
B S
witz
erla
nd L
td.-
30C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
There is also the possibility to insert a current instead of voltage measurement.Advantage: the Ikmin can be set directly in a current value: Ikmin = Iset * N
Alternatives (2)
Alarm
Block
UR RP VDR
I>> Trip
I>t
ABB©AB
B S
witz
erla
nd L
td.-
31C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
q simple, sensitive and extremely stable measurement system – CT could theoretically be saturated / pre- magnetised 100%
q tripping time around one halfcycle
q easily extendable, if the correct CT is available!
q CT class TPS (old class X or BS) required – the TPS class defines
q the knee point voltage
q the magnetising current at half of the knee point voltage
q the winding resistance (at 75°C)
q inexpensive protection system – expensive CTs
q all CTs have to be the same type incl. ratio
q no other protection devices are allowed in the same CT circuit
q therefore no integration of CB Failure Protection etc. is possible
Features
ABB©AB
B S
witz
erla
nd L
td.-
32C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
q in case multiple busbar configuration the current switching must be realised mechanically (risk of maloperation during switching; burned / damaged contacts / CTs !). A check zone and therefore a second CT core is strictly required (see following page)
q good testing facility of the measurement system but NOT of the current switching logic (which is the sensitive / week part)
q the principal is a mix of physical behaviour of the CT and numerical (or mechanical / analogue) current and voltage measurement – it is not possible to realize it 100% numerically (with a low impedance scheme)
q the possibility to record the CT currents is not given – therefore fault evaluation is not possible
The state of the art:Usually the High Impedance Protection Principle will only be installed in single busbar or 1 ½ CB configuration
Features
ABB©AB
B S
witz
erla
nd L
td.-
33C
HP
133_
BB
P_M
S /
2007
09 /
RW
High Impedance Measurement Principle
Multiple Busbar with CT Switching and Check ZoneI
X X
X
II
+
I II
Checkzone
DiscriminatingZone
ABB©AB
B S
witz
erla
nd L
td.-
34C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle
Additional Quantity (s) to keep the Stability in case of External Fault with CT Saturation
q as described in the previous slides the quantity Idiff (Σ I ) is NOT sufficient in a Low Impedance Measurement System to guarantee Stability in case of External Fault with CT Saturation
q this additional quantity varies between the products and relay generations
q some examples of “clever” solutions are shown SIMPLIFIED in the following slides
ABB©AB
B S
witz
erla
nd L
td.-
35C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-2– electronic relay generation
Idiff set < | ∑ I |differential current measurement
with instantaneous values
Phase Comparisonphase angle supervision = current
direction supervision with instantaneous values
& t
t = integration
time
TRIP CBs
Setting:- Maximum load < Ikmin < minimum short circuit currentto prevent false operation in case of shorted CT and to detect lowest possible fault current
ABB©AB
B S
witz
erla
nd L
td.-
36C
HP
133_
BB
P_M
S /
2007
09 /
RW
Typical INX-2 Feature:q centralised protection system, location in a centralised panel q automatic test cycle which supervises around 50 – 60 % of all HW components in the protection system and will block the system automatically in case of a HW faultq sometimes it is tricky to find faulty components since the fault indication of the automatic test is not very detailed and a lot of modules / electronic cards are availableq differential current and phase comparison (phase angle) measurement system which evaluates instantaneous current values. The system includes no special CT saturation detection facilityq low CT requirements: 2-3 ms of current signal must be available. This represents 5 times saturation on symmetrical fault currents (see following page)q tripping time around 12msq integration of CB failure and End fault Protection is possible q installation from around year 1968 – 1985q at present, the systems are still being extended (relatively seldom) q around 1200 systems are / were installed
Low Impedance Measurement Principle – BBP Type INX-2– electronic relay generation
ABB©AB
B S
witz
erla
nd L
td.-
37C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle
CT refresher course:
T-3
-2
-1
0
1
2
3
0 5 10 15 20 ms
A1
A2 A3
The areas are equal
t
A1 A2 A 3= = = •∫ i(t) dt10ms
Saturation at symmetrical current due to over-burdening or to high primary current
Ial = 1: current on which the CT starts to saturates
5 – times saturationmeans
5 – times Ial
ABB©AB
B S
witz
erla
nd L
td.-
38C
HP
133_
BB
P_M
S /
2007
09 /
RW
Ikmin < | ∑ I |differential current measurement
with instantaneous values
kset < |∑ I | / ∑ | I |stabilising / restraining measure-
ment with quantity Ires = ∑ | I | with instantaneous values
& t
t = integration
time
TRIP CBs
CT saturation detection
CT saturation detection with instantaneous values
Low Impedance Measurement Principle – BBP Type INX-5– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
39C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5D
iffer
entia
l cur
rent
I diff=
| ΣI |
Restraint current IRest = Σ | I |
internal
fault
no faultIkmin
k= 0,8
k= 1
0
Stabilised / Restraint Characteristic
Setting:- Maximum load < Ikmin < minimum short circuit currentto prevent false operation in case of shorted CT and to detect lowest possible fault current - K typically to 0.8
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
40C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
Internal Fault
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
41C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault – without CT saturation
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
42C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault – with CT saturation
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
43C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault –
with CT saturation
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
44C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault –
with CT saturation
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
45C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault – with CT saturation
Depending on the saturation degree; the k – factor is reached for a longer or shorter time. Maloperation is still possible.
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
46C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault – with CT saturation
Depending on the saturation degree; the k – factor is reached for a longer or shorter time. Maloperation is still possible.
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
47C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault – with CT saturation
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
48C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
Electronic circuit to generate Blocking Signals”: e.g. Negative Blocking Signal
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
49C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault – with CT saturation
The CT saturation detection will send blocking signals:
Positive CT saturation blocking signal will block the trip on negative differential current
Negative CT saturation blocking signal will block the trip on positive differential current
POS BLOCKING
SIGNAL (B+)
(B+)
– static relay generation
Neg BLOCKING
SIGNAL (B+) (B-)
ABB©AB
B S
witz
erla
nd L
td.-
50C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault – with CT saturation
(B+)
neg
I diff
– static relay generation
neg
I diff
pos
I diffpos
I diff(B+)
(B-) (B-)
ABB©AB
B S
witz
erla
nd L
td.-
51C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
The CT saturation detection will send blocking signals:
Positive CT saturation blocking signal will block the trip on negative differential current
Negative CT saturation blocking signal will block the trip on positive differential current
– static relay generation
& t
t = integration
time
TRIP CBsB-
Idiff pos
& t
B+
Idiff neg ≥1
ABB©AB
B S
witz
erla
nd L
td.-
52C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault – with CT saturation
The Stability is maintained
– static relay generation
(B+)
neg
I diffneg
I diff
pos
I diffpos
I diff(B+)
(B-) (B-)
ABB©AB
B S
witz
erla
nd L
td.-
53C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
External Fault – with CT saturation & full DC offset
The Stability is maintained
(Idiff -)
(B+)(B+)(B+)(B+)
(Idiff -) (Idiff -) (Idiff -)
BLOCKING METHOD: tripping in case of external fault with CT saturation will be blocked till the next zero crossing is reached
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
54C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle – BBP Type INX-5
Internal Fault – with CT saturation & full DC offset
TRIP (no blocking)
(Idiff +)
(B+)(B+)(B+)
(Idiff +) (Idiff +)
The CT saturation detection will send blocking signals:
Positive CT saturation blocking signal will block the trip on negative differential current
Negative CT saturation blocking signal will block the trip on positive differential current
– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
55C
HP
133_
BB
P_M
S /
2007
09 /
RW
Typical INX-5 Feature:q centralised protection system, location in a centralised panel q automatic test cycle which supervises around 75 – 85 % of all HW components in the protection system and will block the system automatically in case of a HW faultq easy to find faulty components since the fault indication of the automatic test is very detailed and a small number of modules / electronic cards are availableq restrained differential current measurement characteristic which evaluates instantaneous current values. The system includes a CT saturation detection facility: BLOCKING METHOD. A blocking time which is too long delays the tripping command in case of evolving faults (fault evolves from external to internal)
Low Impedance Measurement Principle – BBP Type INX-5– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
56C
HP
133_
BB
P_M
S /
2007
09 /
RW
Typical INX-5 Feature:q low CT requirements: 2 ms of current signal must be available. This represents 5 times saturation on symmetrical fault currentsq tripping time around 12msq integration of CB failure and End fault Protection is possibleq installation from around year 1980 – 2003q at present, the systems are still being extended frequentlyq around 800 systems are / were installed
Low Impedance Measurement Principle – BBP Type INX-5– static relay generation
ABB©AB
B S
witz
erla
nd L
td.-
57C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Ikmin < | ∑ I |differential current measurement with fundamental current values
kset < |∑ I | / ∑ | I |stabilising / restraining measure-
ment with quantity Ires = ∑ | I | with fundamental current values & TRIP CBs
Phase Comparisonphase angle supervision = current
direction supervision with fundamental current values
Firs
t har
mon
ic (f
unda
men
tal)
filte
ring
by F
ourie
r filt
er
The REB500 BBP system will evaluate only the fundamental frequency current signal. This increases accuracy in the case of
relatively small, offset differential currents
ABB©AB
B S
witz
erla
nd L
td.-
58C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
I1I1 I1
I1 I2
I2I2 I2
0 0t
I2
t
Primary current
Restrained differential current and phase comparison algorithms which evaluates “only” the fundamental wave of the current signal:
ABB©AB
B S
witz
erla
nd L
td.-
59C
HP
133_
BB
P_M
S /
2007
09 /
RW
I1I1 I1
I1 I2
I2I2 I2
0 0t
I1 I2
t
Secondarycurrent
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Restrained differential current and phase comparison algorithms which evaluates “only” the fundamental wave of the current signal:
ABB©AB
B S
witz
erla
nd L
td.-
60C
HP
133_
BB
P_M
S /
2007
09 /
RW
I1I1 I1
I1 I2
I2I2 I2
0 0t
I1 I2
t
Fundamentalfrequency component
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Restrained differential current and phase comparison algorithms which evaluates “only” the fundamental wave of the current signal:
ABB©AB
B S
witz
erla
nd L
td.-
61C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
The result is a huge amplitude change (Δ a) and a big phase shift (Δ α) between the two current signals which could result in a maloperation in condition of extreme CT saturation
0 t
IΔ a
Δ α
Fundamentalfrequency component
Restrained differential current and phase comparison algorithms which evaluates “only” the fundamental wave of the current signal:
ABB©AB
B S
witz
erla
nd L
td.-
62C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Result with extreme CT saturation
t ms
50 IN
I / In
Ires / In
Restrained differential current algorithm
Restrained differential current and phase comparison algorithms which evaluates “only” the fundamental wave of the current signal:
ABB©AB
B S
witz
erla
nd L
td.-
63C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Result with extreme CT saturation
t ms
50 IN
I / In
t
Restrained differential current algorithm
k
Restrained differential current and phase comparison algorithms which evaluates “only” the fundamental wave of the current signal:
ABB©AB
B S
witz
erla
nd L
td.-
64C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Result with extreme CT saturation
t ms
50 IN
I / In
t
Phase comparison algorithm
k
Phas
e sh
ift Δ
α
Restrained differential current and phase comparison algorithms which evaluates “only” the fundamental wave of the current signal:
ABB©AB
B S
witz
erla
nd L
td.-
65C
HP
133_
BB
P_M
S /
2007
09 /
RW
Restrained differential current and phase comparison algorithms which evaluate the fundamental wave of the reconstructed current signal:
q The REB500 system will evaluate reconstructedfundamental current values (Fourier filtered values). The system will approximate the saturated current values to it’s origin
q This is realized with the from ABB patented so called “Maximum Prolongation Algorithm”. With this it can be obtained that the system is never blocked due to CT saturation: UNBLOCKING METHOD
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
ABB©AB
B S
witz
erla
nd L
td.-
66C
HP
133_
BB
P_M
S /
2007
09 /
RW
Maximum Prolongation Algorithm
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
ABB©AB
B S
witz
erla
nd L
td.-
67C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Restrained differential current and phase comparison algorithms which uses the “Maximum Prolongation Algorithm” followed by the fundamental wave filter (Fourier filter)
I1I1 I1
I1 I2
I2I2 I2
0 0t
I1 I2
t
Reconstructedcurrent signal
ABB©AB
B S
witz
erla
nd L
td.-
68C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
The result is a relatively small amplitude change (Δ a) and more important a very small phase shift (Δ α) between the two current signals
0 t
IΔ a
Δ α
Fundamental frequency Component of the Maximum Prolongation signal
Restrained differential current and phase comparison algorithms which uses the “Maximum Prolongation Algorithm” followed by the fundamental wave filter (Fourier filter)
ABB©AB
B S
witz
erla
nd L
td.-
69C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Result using the “Maximum Prolongation Algorithm”with extreme CT saturation
t ms
50 IN
I / In
Ires / In
Restrained differential current algorithm
ABB©AB
B S
witz
erla
nd L
td.-
70C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
t ms
50 IN
I / In
t
Restrained differential current algorithm
k
Result using the “Maximum Prolongation Algorithm”with extreme CT saturation
ABB©AB
B S
witz
erla
nd L
td.-
71C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
t ms
50 IN
I / In
t
Phase comparison algorithm
k
Phas
e sh
ift Δ
α
Result using the “Maximum Prolongation Algorithm”with extreme CT saturation
ABB©AB
B S
witz
erla
nd L
td.-
72C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Conclusion:
By prolonging the maximum value, the signal is compensated such that the best possible approximation of the PHASE ANGLE and AMPLITUDE of the origin primary signal is achieved
ABB©AB
B S
witz
erla
nd L
td.-
73C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Ikmin < | ∑ I |differential current measurement with reconstructed fundamental
current values
kset < |∑ I | / ∑ | I |stabilising / restraining measure-
ment with quantity Ires = ∑ | I | with reconstructed fundamental current
values& TRIP CBs
Phase Comparisonphase angle supervision = current
direction supervision with reconstructed fundamental current
values
Firs
t har
mon
ic (f
unda
men
tal)
filte
ring
by F
ourie
r filt
er
max
imum
pro
long
atio
n on
all
CT
Cur
rent
sig
nal
ABB©AB
B S
witz
erla
nd L
td.-
74C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Measurement Algorithm: Stabilized differential current
Restraint Current IRest
Differential currentIDiff
Intern
al Fau
lt
No FaultIkmin
k= 0,85
k= 1
0
ABB©AB
B S
witz
erla
nd L
td.-
75C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
Measurement Algorithm: Phase comparison
Im
Re
Case 1: external fault ∆ϕ ≥ 74°
ϕ12 =139°
I2
I1
Im
Re
ϕ12 =40°
Case 2: internal fault ∆ϕ < 74°
I1
I2
I2I1
Tripping area
Pha
se d
iffer
ence
∆ϕ
No Fault
Internal Fault
Fall 1 2
∆ϕ min = 74°74°
180°
0°
ABB©AB
B S
witz
erla
nd L
td.-
76C
HP
133_
BB
P_M
S /
2007
09 /
RW
Typical REB500 Feature:q decentralised protection system, location might be in a a centralised panel or distributed (e.g. in the feeder protection panels)q continuous self- supervision which supervises around 90 – 95 % of all HW components and SW tasks in the protection system and will block the system automatically in case of a HW / SW faultq very easy to find faulty components since the fault indication of the continuous self- supervision is very detailed and a very small number of modules / electronic cards are availableq restrained differential current measurement (INX-5) and phase comparison (phase angle) (INX-2) algorithm which evaluates reconstructed fundamental current values (Fourier filtered values). The system will approximate the saturated current values to it’s origin with a from ABB patented (so called “maximum prolongation”) algorithm: UNBLOCKING METHOD (the system is never blocked due to CT saturation). No problem in case of evolving faults (fault evolves from external to internal)
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
ABB©AB
B S
witz
erla
nd L
td.-
77C
HP
133_
BB
P_M
S /
2007
09 /
RW
Typical REB500 Feature:q the restrained differential current measurement; phase comparison (phase angle) measurement and the maximum prolongation algorithm could be activated individually for special applicationq typical tripping time around 25msq integration of CB failure and End fault Protection as well as Line & Transformer Protection Functions is possible. Additional measurement functions as event- & disturbance recorder as well as additional release functions like I> or U< are availableq low CT requirements: 2 ms of current signal must be available. This represents 5 times saturation on symmetrical fault currentsq state of the art: installation from year 1994 – futureq over 1500 systems are in service (so far)
Low Impedance Measurement Principle - BBP Type REB500– numerical relay generation
ABB©AB
B S
witz
erla
nd L
td.-
78C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generation
Å Ikmin < | ∑ I |differential current measurement with RMS current values
Çsset < |∑ I | / ∑ | Iin |stabilising / restraining measurement with quantity Ires = ∑ | Iin |
with RMS current values & TRIP CBs
É external fault detection (decision 1.2 ms after zero crossing)
detection internal / external fault with instantaneous / sampledcurrent values
ABB©AB
B S
witz
erla
nd L
td.-
79C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generationRepresentation of the protection zone:
ABB©AB
B S
witz
erla
nd L
td.-
80C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generationCalculation of the instantaneous value of the differential current:
Calculation of the instantaneous sum of positive currents:
Calculation of the instantaneous sum of negative currents:
ABB©AB
B S
witz
erla
nd L
td.-
81C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generationCalculation of the incoming and outgoing currents:
Calculation of the RMS value of e.g. Iin (same for Iout and Idiff)
ABB©AB
B S
witz
erla
nd L
td.-
82C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generationCondition at Internal Fault:
ABB©AB
B S
witz
erla
nd L
td.-
83C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generationCondition at Internal Fault:
sudden split between of RMS Iin and RMS Ioutwill indicate an internal fault
if Å & Ç (Ikmin & s) is fulfilled the protection will trip since É will not see an external fault
ABB©AB
B S
witz
erla
nd L
td.-
84C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generationCondition at External Fault with CT Saturation:
ABB©AB
B S
witz
erla
nd L
td.-
85C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generationCondition at External Fault with CT Saturation:
É will detect an external fault within 1.2ms after the Iin zero crossing (before the CT gets into saturation) and will block till the next zero crossing is reached
ABB©AB
B S
witz
erla
nd L
td.-
86C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generation
Test assembly:
ABB©AB
B S
witz
erla
nd L
td.-
87C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generation
Test values & result:The CT TX war pre- magnetised with a DC current in order to get maximum remanence. Therefore the CT saturates within 1.2 ms!
The primary test current level was 26kA RMS with the full DC offset
The BBP system REB670 remains fully stable !!!
ABB©AB
B S
witz
erla
nd L
td.-
88C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generationStabilised / Restraint Characteristic
ABB©AB
B S
witz
erla
nd L
td.-
89C
HP
133_
BB
P_M
S /
2007
09 /
RW
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generationStabilised / Restraint Characteristic
Setting:- Maximum load < Ikmin (Diff Oper Level) < minimum short circuit currentto prevent false operation in case of shorted CT and to detect lowest possible fault current
The sensitive (non restraint) operational level is designed to be able to detect internal busbar faults in low impedance earthed power systems: Limited earth fault current to certain level (300 –2000A)
ABB©AB
B S
witz
erla
nd L
td.-
90C
HP
133_
BB
P_M
S /
2007
09 /
RW
Typical REB670 Feature:q centralised protection system, location in a centralised panelq continuous self- supervision which supervises the most of the HW components and SW tasks in the protection system and will block the system automatically in case of a HW / SW faultq very easy to find faulty components since a very small number of modules / electronic cards are availableq restrained differential current measurement algorithm which evaluates RMS current values. The system can decides within 1.2ms after the zero crossing of the current if the fault is external or internal. In case of external fault the measurement will be blocked till the next zero crossing: BLOCKING METHOD. A blocking time which is too long delays the tripping command in case of evolving faults (fault evolves from external to internal)
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generation
ABB©AB
B S
witz
erla
nd L
td.-
91C
HP
133_
BB
P_M
S /
2007
09 /
RW
Typical REB670 Feature:q very low (“almost no”) CT requirements: the system was successfully tested with just 1.2 ms of current signal. This represents >> 5 times saturation on symmetrical fault currentsq tripping time around one halfcycleq integration of CB Failure, OC protection as well as event- & disturbance recorder, monitoring function is possibleq state of the art: installation from year 2005 – futureq the system is a consequently further development / improvement of the well proven BBP systems RADSS, REB103, RED521
Low Impedance Measurement Principle - BBP Type REB670– numerical relay generation
ABB©AB
B S
witz
erla
nd L
td.-
92C
HP
133_
BB
P_M
S /
2007
09 /
RW
Busbar fault condition
I1 =1000A
single injection Calculation examples Internal fault condition
ABB©AB
B S
witz
erla
nd L
td.-
93C
HP
133_
BB
P_M
S /
2007
09 /
RW
Calculation examples
∆ U = ∆ Isec * RR
= 0.5A * 2000Ω= 1 kV (spike)à TRIP
Σ Iin = + + I1
= + 1 kA= 1 kA
Σ I = + + I1
= + 1 kA= 1 kA
∆ Isec = I1/N= 1 kA / 2000 = 0.5 A
∆ I = + I1= + 1 kA= 1 kA
∆ I = + I1= + 1 kA= 1 kA
High Impedance System
(with CT ratio: N = 2000A / 1A;Impedance: RR = 2000 Ω;Knee Point V: UK = 400V)
Low Impedance Measurement System
REB670
Low Impedance Measurement System
REB500
Internal fault condition
ABB©AB
B S
witz
erla
nd L
td.-
94C
HP
133_
BB
P_M
S /
2007
09 /
RW
Diff
eren
tial c
urre
nt I d
iff=
| ΣI |
trip measurement system !!!⇒ ( if I∆ > Ikmin)
Calculation examples
Restraint current IRest = Σ | I |
Restraint current IRest = Σ | Iin |
no faultIkmin
kREB500= 0,85
k= 1
0
Internal fa
ult REB500
Internal fault R
EB670
kREB670= 0,53
Internal fault condition
ABB©AB
B S
witz
erla
nd L
td.-
95C
HP
133_
BB
P_M
S /
2007
09 /
RW
Busbar fault condition
I1 = I2 = I3 = I4 =1000A 2500A 1500A 2000A
multiple injection Calculation examples Internal fault condition
ABB©AB
B S
witz
erla
nd L
td.-
96C
HP
133_
BB
P_M
S /
2007
09 /
RW
∆ U = ∆ Isec * RR
= 3.5A * 2000Ω= 7 kV (spike)à TRIP
Σ Iin = ++ I1++ I2+ + I3++ I4
= + 1 kA + 2.5 kA + 1.5 kA + 2 kA= 7 kA
Σ I = ++ I1++ I2+ + I3+ + I4
= + 1 kA + 2.5 kA + 1.5 kA + 2 kA= 7 kA
∆ Isec = I1/N= 7 kA / 2000 = 3.5 A
∆ I = + I1 + I2 + I3 + I4 = + 1 kA + 2.5 kA + 1.5 kA + 2 kA= 7 kA
∆ I = + I1 + I2 + I3 + I4 = + 1 kA + 2.5 kA + 1.5 kA + 2 kA= 7 kA
High Impedance System
(with CT ratio: N = 2000A / 1A;Impedance: RR = 2000 Ω;Knee Point V: UK = 400V)
Low Impedance Measurement System
REB670
Low Impedance Measurement System
REB500
Calculation examples Internal fault condition
ABB©AB
B S
witz
erla
nd L
td.-
97C
HP
133_
BB
P_M
S /
2007
09 /
RW
Diff
eren
tial c
urre
nt I d
iff=
| ΣI |
trip measurement system !!!⇒ ( if I∆ > Ikmin)
Calculation examples
Restraint current IRest = Σ | I |
Restraint current IRest = Σ | Iin |
no faultIkmin
kREB500= 0,85
k= 1
0
Internal fa
ult REB500
Internal fault R
EB670
kREB670= 0,53
load depending tripping value!!!
Internal fault condition
ABB©AB
B S
witz
erla
nd L
td.-
98C
HP
133_
BB
P_M
S /
2007
09 /
RW
e.g. line fault
External fault condition
I2 = I3 = I4 =2500A 1500A 2000A
I1 =6000A
Calculation examples
ABB©AB
B S
witz
erla
nd L
td.-
99C
HP
133_
BB
P_M
S /
2007
09 /
RW
∆ U = ∆ Isec * RR
= 0A * 2000Ω= 0 kVà NO TRIP
Σ Iin = + I2+ +I3++ I4
= 2.5 kA + 1.5 kA + 2 kA= 6 kA
Σ I = ++ I1++ I2+ +I3++ I4
= + 6 kA + 2.5 kA + 1.5 kA + 2 kA= 12 kA
∆ Isec = I1/N= 0 kA / 2000 = 0 A
∆ I = + I1 + I2 + I3 + I4 = - 6 kA + 2.5 kA + 1.5 kA + 2 kA= 0 kA
∆ I = + I1 + I2 + I3 + I4 = - 6 kA + 2.5 kA + 1.5 kA + 2 kA= 0 kA
High Impedance System
(with CT ratio: N = 2000A / 1A;Impedance: RR = 2000 Ω;Knee Point V: UK = 400V)
Low Impedance Measurement System
REB670
Low Impedance Measurement System
REB500
Calculation examples External fault condition
ABB©AB
B S
witz
erla
nd L
td.-
100
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
Diff
eren
tial c
urre
nt I d
iff=
| ΣI |
no trip stable !!!
Calculation examples
Restraint current IRest = Σ | I |
Restraint current IRest = Σ | Iin |
no faultIkmin
kREB500= 0,85
k= 1
0
Internal fa
ult REB500
Internal fault R
EB670
kREB670= 0,53
External fault condition
ABB©AB
B S
witz
erla
nd L
td.-
101
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
during fault condition (Ι)
Current transformer failure (Ι)
I2 = I3 = I4 =2500A 1500A 2000A
I1 =6000A
CT shorted !!!
Calculation examples
ABB©AB
B S
witz
erla
nd L
td.-
102
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
∆ U = ∆ Isec * RR
= 1A * 2000Ω= 2 kV (spike)à TRIP !!!
Σ Iin = + + I1
= + 6 kA = 6 kA
Σ I = + + I1+ + I2 + + I3 + + I4
= + 6 kA + 2.5 kA + 1.5 kA + 0 kA= 10 kA
∆ Isec= I1/N= 2 kA / 2000 = 1 A
∆ I = + I1 + I2 + I3 + I4 = - 6 kA + 2.5 kA + 1.5 kA + 0 kA= 2 kA
∆ I = + I1 + I2 + I3 + I4 = - 6 kA + 2.5 kA + 1.5 kA + 0 kA= 2 kA
High Impedance System
(with CT ratio: N = 2000A / 1A;Impedance: RR = 2000 Ω;Knee Point V: UK = 400V)
Low Impedance Measurement System
REB670
Low Impedance Measurement System
REB500
Calculation examples Current transformer failure (Ι)
ABB©AB
B S
witz
erla
nd L
td.-
103
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
Diff
eren
tial c
urre
nt I d
iff=
| ΣI |
Calculation examples
Restraint current IRest = Σ | I |
Restraint current IRest = Σ | Iin |
no faultIkmin
kREB500= 0,85
k= 1
0
Internal fa
ult REB500
Internal fault R
EB670
kREB670= 0,53
Current transformer failure (Ι)
REB500: no trip stableREB670: no trip stable
ABB©AB
B S
witz
erla
nd L
td.-
104
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
during fault condition (ΙΙ)
I2 = I3 = I4 =2500A 1500A 2000A
I1 =6000A
CT shorted !!!
Calculation examples Current transformer failure (ΙΙ)
ABB©AB
B S
witz
erla
nd L
td.-
105
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
∆ U = ∆ Isec * RR
= 3A * 2000Ω= 6 kV (spike)à TRIP !!!
Σ Iin = + + I2 + + I3+ + I4
= + 2.5 kA + 1.5 kA + 2 kA= 6 kA
Σ I = + + I1+ + I2 + + I3 + + I4
= + 0 kA + 2.5 kA + 1.5 kA + 2 kA= 6 kA
∆ Isec= I1/N= 6 kA / 2000 = 3 A
∆ I = + I1 + I2 + I3 + I4 = + 0 kA + 2.5 kA + 1.5 kA + 2 kA= 6 kA
∆ I = + I1 + I2 + I3 + I4 = + 0 kA + 2.5 kA + 1.5 kA + 2 kA= 6 kA
High Impedance System
(with CT ratio: N = 2000A / 1A;Impedance: RR = 2000 Ω;Knee Point V: UK = 400V)
Low Impedance Measurement System
REB670
Low Impedance Measurement System
REB500
Calculation examples Current transformer failure (ΙΙ)
ABB©AB
B S
witz
erla
nd L
td.-
106
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
Diff
eren
tial c
urre
nt I d
iff=
| ΣI |
Calculation examples
Restraint current IRest = Σ | I |
Restraint current IRest = Σ | Iin |
no faultIkmin
kREB500= 0,85
k= 1
0
Internal fa
ult REB500
Internal fault R
EB670
kREB670= 0,53
Current transformer failure (ΙΙ)
⇒ trip measurement system !!!(worst case condition)
ABB©AB
B S
witz
erla
nd L
td.-
107
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
during load condition
I2 = I3 = I4 =250A 150A 200A
I1 =600A
CT shorted !!!
Calculation examples Current transformer failure (ΙΙΙ)
ABB©AB
B S
witz
erla
nd L
td.-
108
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
∆ U = ∆ Isec * RR
= 1.2A * 2000Ω= 2.4kV (spike)à possible TRIP !!!
Σ Iin = + + I1+ + I2 + + I3 + + I4
= + 250 A + 150 A + 200 A= 600 A
Σ l = + + I1+ + I2 + + I3 + + I4
= + 0 kA + 250 A + 150 A + 200 A= 600 A
∆ Isec = I1/N= 0.6 kA / 2000 = 1.2 A
∆ I = + I1 + I2 + I3 + I4 = + 0 kA + 250 A + 150 A + 200 A= 600 A
∆ I = + I1 + I2 + I3 + I4 = + 0 kA + 250 A + 150 A + 200 A= 600 A
High Impedance System
(with CT ratio: N = 2000A / 1A;Impedance: RR = 2000 Ω;Knee Point V: UK = 400V)
Low Impedance Measurement System
REB670
Low Impedance Measurement System
REB500
Calculation examples Current transformer failure (ΙΙΙ)
ABB©AB
B S
witz
erla
nd L
td.-
109
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
Diff
eren
tial c
urre
nt I d
iff=
| ΣI |
Calculation examples
Restraint current IRest = Σ | I |
Restraint current IRest = Σ | Iin |
no faultIkmin
kREB500= 0,85
k= 1
0
Internal fa
ult REB500
Internal fault R
EB670
kREB670= 0,53
Current transformer failure (ΙΙΙ)
⇒ measurement system stable !!!⇒ differential current alarm !!!
ABB©AB
B S
witz
erla
nd L
td.-
110
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WOpen CT / Differential Current AlarmWith a Differential Current Supervision it is possible to detect open / missing CTs during load condition
The Differential Current Supervision sends a TIME DELAYED ALARM and there is a setting option to BLOCKthe Protection system zone selectively (REB670: also Phase selectively)
The Supervision is able to detect q a missing CT input (e.g. CT circuit not connected to the system)q a wrong CT ratioq a wrong current direction
Therefore the PICK UP VALUE of the Differential Current Supervision should be set lower than the lowest possible load current. The time delay 2–5 seconds)
ABB©AB
B S
witz
erla
nd L
td.-
111
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
⇒ the “differential current / Open CT alarm” is able to detect a missing / wrong CT input
⇒ therefore the “differential current alarm” is very important and must not be ignored by the operating personal
If not, there is a risk of maloperation !!!
Open CT / Differential Current Alarm
ABB©AB
B S
witz
erla
nd L
td.-
112
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release Criterias
Additional Tripping / Release Criterias are used to get
q Additional SECURITY
or
q Additional FAULT LOCATION
The usage is depending on the
CUSTOMERS PHILISOPIE
ABB©AB
B S
witz
erla
nd L
td.-
113
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release Criterias
Release forSECURITY
&TRIP CBs
Tripping forFAULT LOCATION
Measurement System
≥1
ABB©AB
B S
witz
erla
nd L
td.-
114
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release Criterias
Release forSECURITY
&TRIP CBs
Neutral Differential Current Measurement
Measurement System
≥1
ABB©AB
B S
witz
erla
nd L
td.-
115
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release CriteriasNeutral Differential Current Measurementis designed to be able to detect internal busbar faults in low impedance earthed power systems: Limited earth fault current to certain level (300 –2000A)
No Trip for Phase Differential Measurement !!!
ABB©AB
B S
witz
erla
nd L
td.-
116
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release CriteriasNeutral Differential Current Measurement
Δ I = ∑IN
IRest = ∑IN
(IN = Neutral Current)
and therefore:
K = ∑IN / ∑IN = IK / IK = 1
TRIP
ABB©AB
B S
witz
erla
nd L
td.-
117
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release Criterias
Check
Zone
&TRIP CBs
Neutral Differential Current Measurement
Measurement System
≥1
ABB©AB
B S
witz
erla
nd L
td.-
118
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release CriteriasCheck Zone
ABB©AB
B S
witz
erla
nd L
td.-
119
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W
Diff
eren
tial c
urre
nt I d
iff=
| ΣI |
Restraint current IRest = Σ | I |
no faultIkmin
k= 1
0
Internal fa
ult REB500
kfault
Additional Tripping / Release CriteriasCheck Zone
ABB©AB
B S
witz
erla
nd L
td.-
120
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release CriteriasCheck Zone
q The stability factor k must be calculated very carefully !
q The Phase Comparison Algorithm is not used in the REB500 system
ABB©AB
B S
witz
erla
nd L
td.-
121
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release Criterias
Over Current
&TRIP CBs
Neutral Differential Current Measurement
Measurement System
≥1
ABB©AB
B S
witz
erla
nd L
td.-
122
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release CriteriasOver Current ReleaseOnly that feeders on which a settable over current value is reached will be tripped in case of a trip of the busbar protection
I1 = I2 = I3 = I4 =300A 250A 50A 100A
I> I> I> I>
ABB©AB
B S
witz
erla
nd L
td.-
123
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release CriteriasOver Current ReleaseOnly that feeders on which a settable over current value is reached will be tripped in case of a trip of the busbar protection
I1 = I2 = I3 = I4 =1000A 2500A 1500A 2000A
I> I> I> I>
ABB©AB
B S
witz
erla
nd L
td.-
124
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release Criterias
U<Under Voltage
&TRIP CBs
Neutral Differential Current Measurement
Measurement System
≥1
ABB©AB
B S
witz
erla
nd L
td.-
125
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release CriteriasUnder Voltage ReleaseThe busbar zone which should be tripped must fulfil a settable under voltage value
U
U U
U
ABB©AB
B S
witz
erla
nd L
td.-
126
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WAdditional Tripping / Release CriteriasUnder Voltage ReleaseThe busbar zone which should be tripped must fulfil a settable under voltage value
U
U <U
U
ABB©AB
B S
witz
erla
nd L
td.-
127
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
WIntertripping
Tripping flow chart
trip all CBs connected to zone x
TRIP BBP
zone x
TRIP CB
TRIP CB
TRIP CB
Measurement
system
Intertripping
system
just the Intertripping system can send a tripping signal to the CB because it “knows” which CB to trip (the measurement systems are only
responsible for measuring !)
Detailed information in a separate presentation !
ABB©AB
B S
witz
erla
nd L
td.-
128
CH
P13
3_B
BP
_MS
/ 20
0709
/ R
W