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Model 575A Digital IC Tester Copyright 1992-2007 B&K Precision Corp. MODEL 575A HANDHELD DIGITAL IC TESTER OPERATOR’S MANUAL

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Page 1: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual

Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

MODEL 575A HANDHELDDIGITAL IC TESTER

OPERATOR’S MANUAL

Page 2: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual

Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

CONTENTS1. introduction 1

2. DC input 1

3. battery eliminator 2

4. switching on 3

5. operating modes 4

6. entering test numbers 4

7. testing the IC 5

8. test results 6

9. testing further ICs 7

10. continuous testing 8

11. search mode 8

12. self test mode 9

13. CompactLink mode 10

14. specifications 11

15. IC support l ist 12

introduction 12

15.2. series 54/74 TTL ICs 12

15.3. CMOS ICs 14

15.4. memory ICs 15

15.5. interface, peripheral, microprocessor and LSI ICs 16

15.6. notes on TTL ICs 18

15.7. notes on CMOS ICs 18

15.8. notes on memory ICs 18

Page 3: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual

Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

15.9. notes on interface ICs 19

16. Service Information 20

17. Limited One-Year Warranty 21

Page 4: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual
Page 5: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual

Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

Page 1

1. introductionThank you for purchasing the B & KPrecision Model 575A Hand HeldDigital IC Tester.

The basic function of the B & KModel 575A Digital IC Tester is totest a digital IC for correct logicalfunctioning as described in the truthtable and/or function table. The B & K Model 575A applies thenecessary signals to the inputs of the IC, monitoring the outputs ateach stage and comparing them with the expected states. Anydiscrepancy results in a FAIL indication and the faulty pins areshown on the integral display. Additional facil ities are alsoprovided, amongst them test loops that can be used for goodsinwards inspection, detecting intermittent faults or simply providinga rapid method of exercising any IC for demonstration oreducational purposes. Since the B & K Model 575A contains anextensive IC library, it is not necessary to program the unit yourselfother than to key in the IC number. It is also capable of identifyingan unknown IC using the SEARCH mode - this is a feature that manyusers will find extremely valuable.

The B & K Model 575A is provided with an RS-232 interfaceenabling it to be connected to a companion software packagecalled CompactLink running on a PC. CompactLink allows testprograms for ICs not included in the internal l ibrary to be developedand downloaded into the B & K Model 575A memory to enhancethe library according to your wishes.

2. DC inputThe B & K Model 575A is powered by four AA batteries or by theuse of the battery eliminator input at the rear of the case. To insertthe batteries, turn the unit upside down and remove the battery

Page 6: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual

Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

Page 2

cover by removing the two cross head screws holding it in place.The batteries must be inserted in the correct orientation, asindicated by the drawing within the battery compartment. Incorrectinsertion of batteries will not allow the unit to operate. Replace thebattery cover and insert the screws. If the battery voltage falls toolow, a low battery warning symbol will be displayed at the top lefthand cell of the display in normal operating mode. A low batterywarning will also be displayed during a result display. Test resultsmay be inconsistent under these conditions.

3. battery eliminatorAn external battery eliminator is available for prolonged use of theB & K Model 575A. Many bipolar LSI ICs consume a large amountof current when powered up, and battery life can be conserved byusing the eliminator. There is no need to remove the batteries priorto inserting the battery eliminator. However, please note that duringprolonged periods of non-use batteries are prone to leakage andshould be removed. Note that to avoid damage to the unit westrongly advise that you only use the recommended batteryeliminator that is available by contacting your distributor. Note thatusing an incorrect battery eliminator voltage may damage the unitand invalidate the warranty.

Page 7: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual

Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

Page 3

4. switching onTo switch the unit on, simply press the 'ON' key. To preserve batterylife, the unit powers itself off after approximately 3 minutes of non-use or when “Sw Off” is selected from the main menu. When theunit is switched on, it first performs a self-diagnosis test. Therefore,before switching on, check that the test socket is empty to preventinterference with the diagnostics. If the unit passes the self-test, apass result wil l be displayed on the screen. Press a key to enter themain operating mode - the display will be as follows:

When this initial display is obtained the B & K Model 575A is readyfor use. If, however, the message SELF-TEST FAIL: is displayedalong with a fault message, this indicates that a self-test diagnosticfault has been detected. Any detected faults will be displayed oneat a time. Pressing the TEST/EXEC key will then revert to theopening menu as above, but of course operation of the unit willthen be suspect. Before contacting your distributor, check that thetest socket is completely empty.

NO:

MODE:Single:RDY

Page 8: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual

Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

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5. operating modesThe B & K Model 575A has a number of test modes that areselected using the MODE/CLEAR key from the initial screen. Thetest modes are as follows:

Single - execute a single test on the IC in the socket.Loop - execute test repeatedly, regardless of the result.P Loop - execute test repeatedly, provided the result was PASS.F Loop - execute test repeatedly, provided the result was FAIL.Search - identify the number of the IC in the socket.Diags - execute the diagnostic self-test.CmLink - enter remote mode for CompactLink software.Sw Off - turn off the unit.

6. entering test numbersPress the MODE/CLEAR key until the desired test mode is displayed.Enter the number of the IC you wish to test. Pressing theMODE/CLEAR key will clear the last digit from the display if amistake is made.

Note: The NUMERIC information only is entered, leav ing out themanufacturers prefixes and suffixes and IC family information.As an example, all the following TTL ICs should be entered as 7,4, 0, 0 on the keypad:

e.g. DM74LS00J, N74LS00N, N74S00N, N7400N, 74ALS00N,SN74HCT00

A very small number of ICs have differing pin-outs for different ICfamilies - in these cases, the most popular pin-out only is supported.The CMOS 4000 series is also supported and the IC numbers for thisfamily should all begin with "4", so that with for example MotorolaICs beginning MC14... the initial "1" should be omitted. The sameprinciples apply also to memory ICs, which are mostly four digitnumbers. With interface ICs of the 8T series the "T" should beomitted. A complete list of all ICs supported by the B & K Model575A is contained in the IC SUPPORT LIST at the end of this

Page 9: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual

Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

Page 5

manual together with notes on any special requirements for certainICs.

Note that if you have stored a user library using CompactLink, an ICin the user library with the same number as one in the internall ibrary will take precedence. This allows a new test to be written foran existing IC. If you wish both tests to be available, use a differentnumber for your user test.

7. testing the ICInsert the IC to be tested in the front of the 40 pin Zero InsertionForce socket with pin 1 towards the display as shown below:

Ensure that the operating lever on the socket is in the open (i.e. up)position before inserting the IC. Close the socket by lowering thelever, making sure that the IC is firmly seated in the socket andmaking good contact. Press the TEST/EXEC key to activate the testsequence for the IC. If an invalid IC type number was entered, or ifthe IC you have requested is not supported the message "Unknown"will be displayed. Simply entering another IC type number willautomatically clear this error message. If a valid type number wasentered, the IC test will begin and the message "BUSY" will bedisplayed while the test proceeds. Many of the tests, however,execute so quickly that this message is not noticeable.

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Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

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8. test resultsA pre-determined sequence of signals is applied to the inputs of theIC and the IC outputs are monitored for the correct logic levels. Theunit uses TTL or CMOS logic thresholds (depending on the selectedIC) when evaluating the response of the IC outputs. If all theoutputs respond correctly, the result PASS will be displayed at thetop right of the display. A scroll ing message will contain the ICfunction and power pin information.

If a short circuit between the power pins of the IC is detected, awarning ‘SHT!' wil l appear on the top right of the display and, sinceno valid test is then possible, the result wil l FAIL. If the IC under testtakes an excessive amount of current when power is applied, awarning 'ICC!' wil l appear. Press the TEST/EXEC key to continuewith the test, or MODE/CLEAR to abandon. Depending on thecondition of the batteries there may also be a ‘BAT!’ warning whichindicates that the batteries are incapable of supplying the currentrequired by the IC under test. You can continue with the test bypressing the TEST/EXEC key, but the unit may malfunction becauseof a drop in battery voltage. To avoid this, change the batteries oruse a battery eliminator. Note that a faulty IC may demand moreoperating current and therefore will quickly drain the batteries.

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Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

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In the case of a FAIL result, the error conditions at all the non-functional pins of the IC will be scrolled on the display, and the ICfunction will be shown. The various failure conditions that can bedisplayed are as follows:

LOW - the output was LOW when HIGH was expected.MID LOW - the output was LOW, but not a valid logic level.HIGH - the output was HIGH when LOW was expected.MID HIGH - the output was HIGH, but not a valid logic level.LOAD 0V - the input cannot be driven HIGH.LOAD 5V - the input cannot be driven LOW.

In some cases, the scroll ing test results may include one or moreWARNING indications. These warnings indicate conditions that mayresult in an incorrect test result, and are as follows:

D/F - result may be invalid because last self-test failed.BAT - battery voltage too low during test.ICC - large current taken by IC under test.

Before discarding a failed IC check that the correct IC type numberwas entered and also check that the IC pins are clean and makinggood contact with the test socket. Note that there is no way ofstopping a test once it has commenced, but see the description ofloop functions later in this manual.

9. testing further ICsAfter a test is completed, the test result wil l be displayed. To testanother IC of the same type, simply insert the next IC and press theTEST/EXEC key again. To test a different IC, enter the new IC typenumber in the usual way, noticing that pressing the first digit of thenew number automatically clears the previous number from thedisplay. Remember that the MODE/CLEAR key can be used if anerror is made during the entry of the IC type number.

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Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

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10. continuous testingIt is possible to test the same IC repeatedly to detect intermittent ortemperature-related faults, or to rapidly test a batch of identical ICs.There are three types of test loop modes:

Loop - execute a test repeatedly, regardless of the result.P Loop - execute a test repeatedly, provided the result is PASS.F Loop - execute a test repeatedly, provided the result was

FAIL.

The B & K Model 575A is configured into one of the loop modesusing the MODE/CLEAR key as described earlier. Insert the IC andpress TEST/EXEC in the usual way to start the continuous testprocess. The result of each test is displayed as PASS or FAIL on thetop right of the display. In LOOP mode, this allows a large batch ofidentical ICs to be tested, without any action on the part of theoperator other than inserting the IC. When the IC is inserted,sufficient time must be allowed for the test to take place before theresult status is updated, so if in doubt the IC should be tested insingle mode so that the approximate test time can be determined.It wil l be found that high throughput can be obtained using thismode.

To stop any of the test loops, press MODE/CLEAR, but note that thetest in progress is completed before the command is obeyed. Theeffect of this is usually unnoticeable, but where the test takes areasonable time to execute there will be a delay before theinstrument responds to the MODE/CLEAR key.

Note: Testing high current ICs in loop mode will drain thebatteries quickly, and it is recommended that a battery eliminatoris used if you wish to perform loop tests.

11. search modeThis feature allows the type number of an unknown IC to bedetermined, provided the IC is actually contained in the B & K

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Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

Page 9

Model 575A library, and it is a correctly functioning IC. This facil ityis useful when the IC type number is il legible or has been removed.

Use the MODE/CLEAR key to choose SEARCH mode, insert theunknown IC into the socket and press the TEST/EXEC key. You willbe prompted to choose the number of pins of the IC you wish toidentify - use the MODE/CLEAR key to select from 8 to 40 pins or'QUIT' to abandon this mode. Press the TEST/EXEC key again tostart the SEARCH or to quit as required.

During the identification process the display will indicate thenumber of ICs identified (IDENT:) and will show graphically how farthrough the library the SEARCH has progressed. At the end of theSEARCH, a list of all the similar ICs will be scrolled onto the display.The list may be scrolled again by pressing the TEST/EXEC key.

If the IC cannot be identified the message "Not in Library" will bedisplayed. This means either that the IC is not in the library or it isnon-functional. Note that if the B & K Model 575A detectsexcessive supply current (ICC! or BAT! warnings), the IC will not beidentified during the SEARCH, but can stil l be tested in SINGLEmode.

If you have a user library present the search will extend to user ICs inthat library also. However, CompactLink contains a facil ity forexcluding ICs from the search if required.

12. self test modeThis feature allows you to check the integrity of the unit, includingthe pin drivers and receivers, power supplies and other internalhardware. The test executes automatically at switch on, but you canif you wish perform a self-test at any time by selecting Self-Test(DIAGS) mode using the MODE/CLEAR key and pressingTEST/EXEC.

If a fault is discovered a brief description will be displayed which willhelp our engineers to locate and rectify the fault. This message

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Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

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should be noted and quoted in any correspondence relating to aunit fault. Contact your distributor in the event of a self-test fail, butfirst of all ensure that the socket was empty when the diagnosticswere run.

13. CompactLink modeThe B & K Model 575A is provided with an RS-232 interface toconnect to a PC with a serial COM port or using a USB to RS-232converter. A companion software package CompactLink is availablewhich provides library management, test development anddebugging and user library update facil ities. You can also useCompactLink to update the software of your B & K Model 575Awithout replacing the internal memory or opening the case.

To enter CompactLink mode, user the MODE/CLEAR key to enterCMLINK mode, then press TEST/EXEC. Press TEST/EXEC againto confirm that you wish to enter CompactLink mode, and thedisplay will show “Not Connected”. Run the CompactLink softwareon your PC, connect the serial cable and follow the CompactLinkmanual instructions to connect to the B & K Model 575A.

For comprehensive instructions on using CompactLink please referto the manual and built-in help supplied with the software.

Note that in CompactLink mode, including waiting for a connection,the normal power down timeout is disabled and the unit will remainon for ever. We recommend using a battery eliminator when usingCompactLink mode to develop test programs.

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Copyright 1992-2007 B&K Precision Corp.

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14. specificationsSPECIFICATIONSBatteries 4 X AA sizeDC input 6V, 850mA max, center positive, regulatedPower consumption Power off 10A max

Standby 30mATesting IC dependent

Test thresholds (internal library) TTL low 0.5V maxTTL switching 1.2VTTL high 2.4V minCMOS low 0.5V maxCMOS switching 2.4VCMOS high 3.8V min

Test thresholds (user library) Programmable 0V to 5V (using CompactLink)RS-232 settings 38400 baud, 8 data bits, 1 stop bit, no parityDimensions 200mm X 100mm X 55mm approx.Library ICs TTL, CMOS, VLSI, Interface, Memory, User

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Copyright 1992-2007 B&K Precision Corp.

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15. IC support list

15.1. introductionThis section is a complete list of the ICs supported by the B & KModel 575A. If there are any special requirements necessary for aparticular IC, there will be a number in brackets referring to thenotes at the end of this manual. Always consult this list beforetesting an IC you have not tested before, particularly when there is anote to refer to.

15.2. series 54/74 TTL ICs740074017402740374047405740674077408740974107411741274137414741574167417741874197420742174227423742474257426742774287430

7431743274337437743874397440744274437444744574467447744874497450 (1)7451 (2)7453 (1)7454 (2)74557456745774607464746574707472747374747475

74767477747874807482748374857486 (2)74897490749174927493749474957496749774100741047410574107741097411074111741127411374114741167411874119

7412074122 (3)74123 (3)741257412674128741327413374134741357413674137741387413974140741437414474145741477414874150741517415274153741547415574156741577415874159

Software Version No.

BK575A 2.02

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7416074161741627416374164741657416674167741687416974170741717417374174741757417674177741787417974180741817418274183741847418574188 (6)7418974190741917419274193741947419574196741977419874199742007420174224742257423074231742377423874240

74241742427424374244742457424674247742487424974251742537425774258742597426074261742657426674273742767427874279742807428174283742847428574287 (6)74288 (6)7428974290742937429574298742997430074301743227432374347743487435074351743527435374354

74355743567435774363743647436574366743677436874373743747437574376743777437874379743817438274384743857438674387 (6)743907439374395743987439974408744127441574422 (3)74423 (3)7442574426744367443774440744417444274443744447444574446744477444874449

7446574466744677446874470 (6)74471 (6)74472 (6)74473 (6)7447474475744907451874519745207452174522745337453474540745417454374560745617456374564745687456974573745747457674580745907459174592745937459574596745977460474605746067460774620746217462274623

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746387463974640746417464274643746447464574646746477464874649746517465274653746547465774666746677466874669

746707467174672746827468374684746857468874689746907469174692746937469674697746987469974760748047480574808

748327486775869748737487474876748787487974880749067490774929741000741002741003741004741005741008741010741011741020

741032741035741240741241741242741243741244741245741620741621741622741623741638741639741640741641741642741643741644741645

15.3. CMOS ICsNote: 74C/HC/HCT ICs are listed in the TTL section

400040014002400640074008400940104011401240134014401540164017401840194020402140224023

402440254026402740284029403040314032403540384040404140424043404440494050405140524053

405640604063406640674068406940704071407240734075407640774078408140824085408640894093

40944098 (3)4099410441064160416141624163417441754192419341944195424042444245437343744501

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45024506450745084510451145124514451545164517451845194520452245264527

4528 (3)4530453145324538 (3)453945414543454445474555455645574558455945604561

4572458345844585 (4)45994724473140085400974009840102401034010440106401074010940160

401614016240163401744017540181401924019340194401954024040244402454037340374502922100

15.4. memory ICs1220 2k * 81403 16k * 12015 2k * 82016 2k * 82102 1k * 12111 256 * 42112 256 * 42114 1k * 42141 4k * 12142 1k * 42147 4k * 12148 1k * 42149 1k * 42600 64K * 12700 256 * 12703 16 * 43101 16 * 44164 64k * 141256 256k * 141257 256k * 141464 64k * 44256 256k * 14416 16k * 44464 8k * 84532 32K * 1 (5)4816 16k * 15110 1024k * 1

5256 256k * 45516 2k * 85517 2k * 85518 2k * 86104 4K * 16116 2k * 86167 16k * 162256 32k * 86264 8k * 86810 128 * 87164 16k * 47185 8k * 87186 8k * 87489 16 * 474189 16 * 474200 256 * 174201 256 * 174289 16 * 474300 256 * 174301 256 * 174929 1k * 18225 16 * 42716 2k * 8 EPROM (6)2732 4K * 8 EPROM (6)2764 8K * 8 EPROM (6)27128 16K * 8 EPROM (6)27256 32K * 8 EPROM (6)

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27512 64K * 8 EPROM (6)27101 128K * 8 EPROM (6)271001 128K * 8 EPROM (6)1410 256 * 4 PROM (6)1822 256 * 8 PROM (6)1830 32 * 8 PROM (6)1842 512 * 8 PROM (6)1846 512 * 8 PROM (6)74188 32 * 8 PROM (6)74287 256 * 4 PROM (6)

74288 32 * 8 PROM (6)74387 256 * 4 PROM (6)74470 256 * 8 PROM (6)74471 256 * 8 PROM (6)74472 512 * 8 PROM (6)74473 512 * 8 PROM (6)74474 512 * 8 PROM (6)74475 512 * 8 PROM (6)

15.5. interface, peripheral, microprocessor and LSI ICs75... SERIES751137511475121751227512375124751257512775128751297513675138751467515175153751587515975160751617516375172751737517475175751837518975192751947519575401754027540375404

754167541775418754197545175452754537545475465754667546875469754767547775478754797549175492

ULN2... SERIES20012003200420052064206520662067206820692070

DS88.. SERIES8815

883088318837883888818885

8T SERIES8T13 use 8138T14 use 8148T23 etc8T248T268T288T388T978T988T1278T1288T129

82... SERIES8234825182668273

25/26/29... SERIES251025142515251825222595

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2525172525212525362525682525692610261126312632263329012902290729082911291829222924298212982229823298242982529826298412984229843298442984529846

MC68... SERIES680068026805 (12)68186820682168456850688068876888688968681

MC34... SERIES3438344634863487

Z80... SERIES780 Z80 CPU8400 Z80 CPU8420 Z80 PIO8430 Z80 CTC8440 Z80 SIO8442 Z80 SIO-28470 Z80 DART

MC65... SERIES650265106520652265456551

INTEL SERIES803180328039 (9)8040 (9)8042 (8)80858088 (7)815581568212821682268228823782438250825382548255825982798282

828382868287828882898755 (6)

MISCELLANEOUS10051006148938449149254525456354564581676595764181318136816082308252826282778641901493019309931293149324932893389347934896149640964199019902 (10)9995 (11)

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15.6. notes on TTL ICsNote 1: The 7450 and 7453 ICs have non-TTL compatibleexpander inputs that are often not used in designs. These inputsare not tested.

Note 2: The 74LS51 and 74LS54 have differing pin connectionsand functions from the standard 7451 and 7454 ICs. The testassumes that the 'LS version is being tested - to test the standardversion use the numbers 7450 and 7453 respectively. In addition,the 74L86 IC has a different pin out to the standard 7486 ICs, but itcan be tested using the 74386 test.

Note 3: When testing these ICs the warning "EXT" will appear onthe LCD display. This means that external timing components arerequired to test the IC. The timing components should be insertedinto the socket as given in following table:

IC COMPONENTS74122/74422 2.2F between pins 24 and 26 of the ZIF socket, +ve to pin 2674123/74423 2.2F between pins 18 and 19 of the ZIF socket, +ve to pin 19

2.2F between pins 27 and 26 of the ZIF socket, +ve to pin 274528/4538/4098 0.22F between pins 13 and 14 of the ZIF socket.

0.22F between pins 27 and 26 of the ZIF socket.

15.7. notes on CMOS ICsNote 4: Certain differences exist between manufacturers parts withthis IC which may cause a FAIL result with ICs other than (Motorola)MC14585 ICs. Consult the data sheets for full details.

15.8. notes on memory ICsNote 5: The 4532 32k DRAM is in fact a partially non-functional 64kDRAM. Four types exist, manufactured by OKI and TI who eachsupply two types. The type numbers 45321 and 45322 are used forOKI types, and 45323 and 45324 are used for TI types. The firstnumber in each case is for the low array version, and the secondnumber for the high array version. See the IC data sheets for furtherdetails.

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Note 6: The ROM/EPROM tests perform a blank check andchecksum on the IC, and display the contents of the first 16locations. These tests cannot confirm the integrity of an IC, oridentify it in SEARCH mode, since they have no knowledge of theintended contents of the EPROM. Please be patient when testingEPROMs in this way - some of the larger ICs take a long time toread.

15.9. notes on interface ICsNote 7: The MOS version of this IC is internally dynamic, and thetest may FAIL after a prolonged in-circuit LOOP test. The CMOSversion, however, is completely static.

Note 8: The 8742 EPROM version of this IC must have the erasewindow covered otherwise the test may FAIL.

Note 9: The 8039 and 8040 ICs should be tested in FAIL LOOPmode due to the power down mode of the ICs affecting testersynchronization.

Note 10: This IC should only be tested in SINGLE MODE with a 1uFdecoupling CAPACITOR connected across the supply and groundpins 29 and 20 of the ZIF socket (IC pins 18 and 9) due to its highsupply current requirement.

Note 11: This IC requires a 1uF decoupling CAPACITOR to beconnected across the supply and ground pins 10 and 31 of the ZIFsocket due to its high supply current requirement.

Note 12: This IC may need to be tested in FAIL LOOP MODE.

Page 24: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual

Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

Page 20

16. Service InformationContact B&K Precision to receive a repair Return Authorizationtracking number. This number must be clearly written on theexterior of the shipping carton and will assist us with the processingof your return. Return all merchandise to B&K Precision Corp. withpre-paid shipping. The flat-rate repair charge includes returnshipping to locations in North America. For overnight shipmentsand non-North America shipping fees contact B&K Precision Corp.

Warranty Serv ice: Please return the product in the originalpackaging with proof of purchase to the below address. Clearly statein writing the performance problem and return any leads, connectorsand accessories that you are using with the device.

Non-Warranty Serv ice: Return the product in the original packagingto the below address. Clearly state in writing the performanceproblem and return any leads, connectors and accessories that youare using with the device. Customers not on open account mustinclude payment in the form of a money order or credit card. For themost current repair charges contact the factory before shipping theproduct.

B&K Precision Corp. Phone: 714- 921-909522820 Savi Ranch Parkway Facsimile: 714-921-6422Yorba LindaCA 92887-4604

Include with the instrument your complete return shipping address,contact name, phone number and description of problem.

Protected by the manufacturer’s copyright laws. All rights reserved.

Page 25: Testequipmentshop.com Lab Test Equipment Digital Integrated Circuit Locater TES 575A Manual

Model 575A Digital IC Tester

Copyright 1992-2007 B&K Precision Corp.

Page 21

17. Limited One-Year WarrantyB&K Precision Corp. warrants to the original purchaser that itsproduct and the component parts thereof, will be free from defectsin workmanship and materials for a period of one year from the dateof purchase. B&K Precision Corp. will, without charge, repair orreplace, at its’ option, defective product or component parts.Returned product must be accompanied by proof of the purchasedate in the form a sales receipt.

To obtain warranty coverage in the U.S.A., this product must beregistered by completing and mailing the enclosed warranty card to:B&K Precision Corp., 22820 Savi Ranch Parkway, Yorba Linda, CA92887 - 4604 within fifteen (15) days from proof of purchase.

Exclusions: This warranty does not apply in the event of misuse orabuse of the product or as a result of unauthorized alterations orrepairs. It is void if the serial number is altered, defaced orremoved.

B&K Precision Corp. shall not be liable for any consequentialdamages, including without limitation damages resulting from lossof use. Some states do not allow limitation of incidental orconsequential damages, so the above limitation or exclusion maynot apply to you. This warranty gives you specific rights and youmay have other rights, which vary from state-to-state.

Model Number: _______________________

Date Purchased: _______________________

B&K Precision Corp. Phone: 714- 921-909522820 Savi Ranch Parkway Facsimile: 714-921-6422Yorba LindaCA 92887-4604