practical application of random vibration signal analysis
TRANSCRIPT
Rochester Institute of TechnologyRIT Scholar Works
Theses Thesis/Dissertation Collections
1994
Practical application of random vibration signalanalysis on structural dynamicsYu-Chin L. Allen
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Recommended CitationAllen, Yu-Chin L., "Practical application of random vibration signal analysis on structural dynamics" (1994). Thesis. RochesterInstitute of Technology. Accessed from
PRACTICAL APPLICATION OF RANDOM
VIBRATION SIGNAL ANALYSIS IN
STRUCTURAL DYNAMICS
Yu-Chin L. Allen
A Thesis Submitted in Partial Fulfillment
of the Requirements for 'the Degree of
Master of Science
in Mechanical Engineering
Approved by: Professor J. S. Torok (Thesis Advisor)
Professor N. Berzak
Advisor D. S. Aldridge (AC Rochester)
Professor C. W. Haines (Dept. Head)
Department of Mechanical Engineering
College of Engineering
Rochester Institute of Technology
Rochester, New York
May 1994
PERMISSION GRANTED:
I, Yu-Chin Allen hereby grant permission to the Wallace Memorial Library of the
Rochester Institute of Technology to reproduce my thesis entitled Practical
Application of Random Vibration Signal Analysis in Structural Dynamics in
whole or in part. Any reproduction will not be for commercial use or profit.
May 17, 1994
Yu-Chin L. Allen
Acknowledgements
I would like to thank my family, my husband Stu for all his patience and
understanding over the past six years as we endeavored to juggle our work,
school, and family. Our children, Russell and Susan, for behaving so I could
work and encouraging me to finish so we can play.
I would also like to thank Dr. Torok for all his support, countless
weekends, and all the course work over the years.
in
Abstract
The use of random signal analysis in vibration and structural analysis is
discussed and documented. The need to minimize product performance and
durability risks due to competitive pressure in the marketplace has forced
industry to streamline methods of product design, processing, and evaluation.
Engineers need to be experienced in much more advanced techniques than
they did even a decade ago. Random vibration signals are used to simulate real
world environments and are another tool in structural analysis. This
investigation outlines the basics of random vibrations, frequency analyzers,
data analysis, along with associated noise and errors problems. A case study
using an aluminum beam is used to demonstrate the concepts presented in this
work.
IV
Table of Contents
Paae
List of Symbols vii
List of Tables ix
List of Figures X
1. Introduction 1
2. Background 4
2.1 Fourier Analysis 5
2.2 Modern Frequency Analyzers 9
2.3 Noise and Error 9
3.0 Random Vibration 10
3.1 Basic Probability and Statistics in Random
Vibration 10
3.2 Correlation 16
3.3 Random Environment Definitions 17
4.0 Data Analysis 22
4.1 Frequency Analyzers 22
4.2 Measurement Functions 23
4.2.1 Time Domain Analysis 23
4.2.2 Amplitude Domain Analysis 23
4.2.3 Frequency Domain Analysis 24
5.0 Noise and Error 27
5.1 Accuracy of Measurements 27
5.2 Fourier Transform Algorithm Error 28
5.3 Error Classification 32
5.4 Noise 33
5.5 Frequency Response Errors 40
5.5.1 Random Errors in Frequency Response 40
5.5.2 Bias Errors in Frequency Response 41
6.0 Theoretical Analysis 43
6.1 Exact Solution of Free Vibration 43
6.2 Approximation Method 56
7.0 Experimental Analysis 66
7.1 Equipment 66
7.2 Damping Analysis 67
7.3 Spectral Analysis and Correlation 70
7.4 Mode Shapes 77
8.0 Conclusion 80
8.1 Theoretical Analysis Application 80
8.2 Conclusions and Recommendations 88
References 91
VI
List of Symbols
F(t) Fourier Transform
Frequency
CO
T Time Period
p(x) Probability Density Function
Standard Deviation
E [ ] Expected Value
RxxCO : Autocorrelation Function
Rxy(T): Cross Correlation Function
Gxx(T): Autospectral or Power Spectral Density (one sided)
Gxy(T): Cross spectral Density (one sided)
Sxx(T): Autospectral or Power Spectral Density (two sided)
Sxx(T): Cross spectral Density (two sided)
H(f) Frequency Response Function
2
Yxv(f)J
Coherence Function
Be Filter Bandwidth
u(t) True Input Signal
v(t) True Output Signal
m(t) Input Noise
vii
n(t) : Output Noise
M Moment
V Shear Force
PMass Density
A Area
HMass per Unit Length
KE Kinetic Energy
U Potential Energy
D Dissipation Function
Qi Generalized Force
[M] : Mass Matrix
[C] : Damping Matrix
[K] : Stiffness Matrix
1>iNormal Mode
qi Generalized Coordinate
nd Number of Averages
? iTrial Function
VIII
List of Tables
Table Page
Table 1 : Typical Values of S(f) and G(f) 21
Table 2: Determination of Log Decrement 67
Table 3: Determination of Damping, C 68
Table 4: Comparison of Natural Frequencies 80
Table 5: Frequency Response Estimates for Mode 2 84
Table 6: Frequency Response Estimates for Mode 3 84
Table 7: Frequency Response Estimates for Mode 4 84
Table 8: Frequency Response Estimates for Mode 5 85
Table 9: Frequency Response Estimates for Mode 6 85
Table 10: Frequency Response Gains from Experimentation 85
Table 1 1 . Frequency Response of First Mode Approximation with Six
Functions at Ten times the Damping Constant 88
Table 12: Frequency Response of First Mode Approximation with Six
Functions at One Hundred times the Damping Constant 88
IX
List of Figures
Figure Page
1 Periodic Signal for Fourier Transform Example 6
2 Fourier Transform Example 8
3 Random Signal 1 1
4 Probability Density Curve 1 2
5 Random Signals Time Aligned 16
6 Typical Random Vibration Spectrum 20
7 Analyzer Block Diagram 22
8 Waterfall Analysis Example 26
9 Sine Wave for Fourier Transform Example 28
10 Sine Wave Used in Discrete Fourier Transform 30
1 1 Ideal Single Input/Single Output System 33
12 System with Noise at Input and Output 35
13 System Model with Noise at Output Only 38
14 Beam Model for Continuous System 42
1 5 Mode Shape 1 with Exact Solution 52
1 6 Mode Shape 2 with Exact Solution 52
1 7 Mode Shape 3 with Exact Solution 53
1 8 Mode Shape 4 with Exact Solution 53
1 9 Mode Shape 5 with Exact Solution 54
20 Mode Shape 6 with Exact Solution 54
x
1.0 Introduction
Fierce competition in the worldwide marketplace has forced industries to
revolutionize their processes. From concept selection to design, prototype
fabrication to mass production, every phase of a product has been scrutinized
and waste of any form (material, process, overhead) eliminated. No longer
does industry have the luxury of long lead times, oligopolies, and product
recalls. Consumers are better educated, have more choices, and will not
accept a second rate product. Industry relies on engineers to be able to
produce functional, durable, esthetically pleasing products which perform
better than the competition in order to stay in business.
To stay ahead of competition, the engineer must make use of many tools
available to streamline the job. The invention of the integrated circuit (IC) has
given today's engineer important tools. Made available to the masses are
reliable and affordable analyzers, data loggers, sensors, and computers as a
result of the IC revolution. No longer does computing power reside in the halls
of universities and government research labs. Powerful computing is available
even to the smallest contract engineering firms and engineering students. Now
we are able to redesign and improve product without hundreds of costly
hardware iterations.
One role engineers must play in today's marketplace is that of the
structural dynamics analyst. As a structural dynamics analyst the engineer must
study the motion of the product to ensure that the product will behave
1
appropriately in the field to guarantee success. Products must withstand their
everyday use without cracking, buckling, or failing their performance. There are
many tools available to the analyst today. Theoretical analysis and modeling
are enhanced by computers armed with sophisticated software packages which
are able to solve systems of complex equations in seconds. Traditional
transducers for force, acceleration, pressure, temperature, etc. are
complimented with computers and various analyzers, which aid in defining the
product and its field of operation. The structural dynamics analyst is
responsible for characterizing a product's dynamic behavior in every
appropriate environment. This makes today's product better suited for fierce
competition.
Random vibration analysis is used by the structural analyst in many
ways. Many environments products are subjected to are considered random,
such as the beating of waves on oil rigs, to the noise emanating from
automobiles. A random environment simulation in product evaluation is
instrumental in predicting and assuring durability. Random vibration is also
used in excitation of products to determine dynamic characteristics, such as the
natural frequency, mode shapes and damping factor. A thorough
understanding of random vibration is invaluable to the analyst.
The study of random vibration is not trivial. This type of environment is
not simply described with just one or two words, but through the definition of
varying frequency spectra. To describe the environment acceleration,
frequency, and statistics must all be utilized. This is usually done with dynamic
signal analyzers which involve complex calculations. Measurement of signals,
characterization of the environment, and simulation are all possible with
sophisticated computer systems which involve analog- to- digital conversions
(A/D), signal processing, and Fast Fourier Transforms (FFT). The terms
correlation and spectral analysis are used used to describe the randomness of
the data and the environment. All of this is necessary to understand the
random vibration environment.
As with any measurements taken with sophisticated equipment, the
question arises as to the validity of the data. The popular adage "garbage in-
garbageout"
has haunted every data taking engineer. Especially with random
vibration where noise can look just as viable as the environment itself, care
must be taken in the winnowing process to separate the data from the noise.
Much work has been done in the field of random vibration to mentor the
inexperienced.
The goal of this thesis is threefold. First, random vibration basics are
detailed, and their use in structural dynamics analysis demonstrated. Second,
noise and error when related to random vibration and signal processing is
detailed. Third, the concepts are all tied together and demonstrated in an
example involving a beam. An aluminum beam is presented, which is evaluated
using several different modeling techniques. The beam is then subjected to a
rigorous dynamic evaluation, and the results compared to the various models.
Recommendations to aid in further work with both random vibration and signal
processing are presented at the end.
2.0 Background
The powerful Integrated Circuit (IC) revolution has changed the job of
engineers. No longer bogged down to solve complicated third and forth order
equations and systems, computer programs are available to determine the
behavior of components through modeling only theorized twenty years ago.
Finite element analysis is widely used by industry to model complex systems
and improve designs without wasting valuable time physically evaluating
hardware iterations. This has spawned the branch of engineering called
computer aided engineering (CAE). The area of test and measurement has
also prospered with the IC revolution with the introduction of affordable signal
processing and analyzers. 1 970 marked the year of the first commercially
available FFT analyzer by Time Data Corporation. General Radio Corporation
was instrumental in developing the algorithms used today to create random
vibration in the laboratory. Virtually any type of vibration environment can be
recreated in the lab from mixed mode vibration to triaxial shaker excitation.
Today the market is supplied by many manufacturers of analysis and test
equipment who compete for the business of structural dynamics analysts. The
IC has replaced the once expensive analog computer and filter equipment
available to the engineer with affordable high speed digital ones.
Random vibration is extensively used in engineering to describe
environments. With random vibration, the exact values cannot be precisely
determined for a given instant of time. Instead, a statistically valid estimate of
the environment is made to describe amplitude occurrences. The study of
random vibration involves probability as well as its application to
measurements. Many events are described by random signals, such as jet
noise and earthquake intensity, since there is no deterministic model that can
describe the unpredictable nature of the events.
Random vibration can also be used when studying the dynamics of a
system. Using random vibration, all frequencies in a predetermined frequency
bandwidth can be simultaneously excited. This can provide a quick method of
identifying natural frequencies of the system by examining the system input and
output. All natural frequencies are excited at once, which allows the
interactions between them to be examined. To the structural dynamics analyst,
this can be of vital importance when resonances have destructive interference
in a random vibration environment.
2.1 Fourier Analysis
A random signal appears as a complex waveform in the time domain. It
is not a trivial task to characterize. Fourier Analysis is used to interpret random
data since the frequency domain is better suited to describe random
environments. The assumption is made that all motion can be described in
terms of sines and cosines of varying frequencies which are harmonically
related. This was discovered first by J. Fourier (1768-1830). Functions are
described by the period and associated amplitude, which are combined to
create the Fourier series. For an example, consider the periodic waveform in
Figure 1. The Fourier series used to describe the signal consists of the
equation:
Periodic Signal
0n
c
*-0.
1-0.
-0.
n-0
.2
1
|.4-
0
z-\
4
6-
8-
1
-1.2 1 1 1 1 1 1 1 1
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2
Time (sec)
Figure 1. Periodic Signal Example for Fourier Transform Example
F( l) := a0+ X! (a COS
("'W
0'
*)+ b
nsin
(n"<
0'
l))
where:
2- jr.
coq:= = fundamental frequency
T
a0-
1
rT
F(t) dt
n'
yF( t)-cosfn-co Q-tj
dt
T
F( t)-sinfn-co0-t) dt
For the example presented in Figure 1 :
ao = an = 0
n"
T
~2
F q-
sinin (n-
coq-
t) dt
bn:-
-F0-(i -cos(n-co0--
T-n-co0
bn'= F q- (l cos
(n-k)J
n-n
n'r
0n^jt
^0F(t)
:=4-
31 g(l-sin(nco0T))
F(t)=4-
ji
sin ( coq-
tj + sin(3-
coq-
t) + -
sin(5-
coq-
t] +
The Fourier spectrum would be appear as in Figure 2.
1 -I
0.9-
F 0.8-
u 0.7-
n 0.6-
c 0.5-
* 0.4-
10.3-
0.1 -
0-
Discrete Spectrum Example
* t
%t
m
A T0 0.5 1 1.5 2 2.5
Frequency (Hz)
1 1
3 \ 4.5
Figure 2: Fourier Transform Example
The operation itself is quite laborious and prohibitive when performed by hand
on a complex signal, but has been assimilated to the modern computer age
through the use of Discrete Fourier Transforms (DFT) where large sets of data
can be manipulated using this algorithm on computers.
The Discrete Fourier Transform is an approximation of the continuous
Fourier transform:
X(f) :=
00
-00
x(t)-e"j23tftdt
Continuous data is sampled at discrete time increments, dt. Then, Fourier
coefficients (Xm) are approximated on the sampled data(amplitude of
measurement at time interval dt) (xn) at frequency fm by:
8
x
1 -j2scf( ndt)
In 1965 J. W. Cooley and J. W. Tukey introduced a new method for determining
coefficients, involved with Fourier transform algorithm, which greatly reduced
the number of data points needed. This is the Fast Fourier Transform (FFT)
which forms the basics for much of the computations in equipment today . For
more information on DFT and FFT see references 2 and 7.
2.2 Modern Frequency Analyzers
Today, the dynamic signal analyzer is a basic tool used by anyone
studying structural dynamics. Analyzers can be multichannel, allowing for the
investigation of multiple inputs simultaneously. Not only can the motion of a
single point be determined, but the interactions between points can be found.
Time and frequency domain measurements are made in a matter of seconds.
Analyzers are flexible; parameters are manipulated to suit the data under
investigation. If peaks value are the main interest of the user, then averaging
techniques and windowing are easily manipulated to reflect peak hold data and
flat top windowing. Data is stored in basic formats for transfer into spreadsheets
for more complex mathematical manipulation through standardization of file
formats such as the Universal File Format (UFF) or Standard File Format (SDF).
Manipulation of data is not a roadblock for today's engineer. Armed with the
appropriate transducer, signal conditioning, and analyzer, engineers can make
any type of measurement.
2.3 Noise and Error
Noise and error plague engineering data. Sophisticated equipment is
haunted by ubiquitous power line noise (usually 60-Hz). The most meticulous
of measurements can be destroyed by a noisy environment or errors. The
recognition of errors and noise and methods to affect them are necessary to
assure viable data. Simple techniques exist, such as increasing statistical
accuracy by increasing the number of measurements used in averages, which
must be weighted against the cost of doing so in the competitive marketplace. It
is difficult to obtain several samples of a one time event, such as the launching
of a satellite. Engineering judgment must be relied on to make a "goodenough"
decision for the current atmosphere.
10
3.0 Random Vibration
Random vibration is a vital part of the analysis of dynamic systems. A few
applications of the concept of random vibration are: resonance identification,
modeling of complex systems, description of realistic environments. Definition
of basic terms used to describe random events is needed before proceeding
further into correlation and spectral analysis.
Random signal analysis is used to identify situations in which precise values
cannot be determined to identify the system, so best estimation is used.
Probability and statistics are needed to describe the properties of the
environment . The study of random vibrations deals with determining the
statistical characteristics of a system and how the output depends on the
dynamic properties of the system under investigation. Several terms are
needed to describe a random signal, such as average, mean square, variance,
and correlation. To understand them, a brief introduction to a few concepts in
statistics will be presented.
3.1 Basic Probability and Statistics in Random Vibration
A fundamental term in statistics relating to random signal analysis is probability
density function (PDF), which is given the symbol p(x). PDF is defined as the
length of time an event occurs between two given limits divided by the total
length of the event under observation. PDF defines the probability an event wil
occur over a given time period. In mathematical terms, it would be:
10
p(xo) = prob ( x0 < x < x0 + dx) = dt/T
where:
dt= the time xo<x<xrj -i-dx
T = the total period of investigation.
r x
Prob (xi<x<x2)
:=p( x) dx
To help understand the concepts of random vibration, a random sample can be
used to identify basic terms. Figure 3 displays a typical random event recorded
over a period of time. The probability that the x value will be in the range of xi
and X2 during the time period T identified is indicated by the shaded area.
1.6
s
i 1.2
g
n
I
0.8
0.4
Random Signal
i i i i i i i i i i i i i i i i i i
0 0.10.20.30.40.50.60.70.80.9 1 1.11.21.31.41.51.61.71.8
Time
Figure 3: Random Signal Example
11
For the example if the period is between 1 and 1 .6 for the time period,
and the probability that the signal is greater than 1 for the identified time, then:
T = 1.6- 1 =0.6
dt = 0.2 (shaded area)
then : p(x) = .2 / .6 =.33.
A Probability Density Curve is a plot of PDF vs. the event . See Figure 4
for an example. The area under the probability density curve gives the
probability. Referring to the example set in Figure 3, the probability the x value
being between x-| and X2 during the time period T is shown by the shaded
region in Figure 4. The probability density curve portrays the probability of x
without the time dependence.
Probability Density Curve
0.4
0.99 0.80 0.95 0.72 0.42 0.45 0.35 0.96 0.310.10 1 2
Signal
Figure 4: Probability Density Curve
12
Measurements of probability density and the probability density curve
can be made with a probability analyzer. The event under investigation is
sampled quickly over a period of time, then displayed. The values for the limits
are then entered and the probabilities determined. Many naturally occurring
events, when sampled over a long period of time, will display a bell shaped
curve which has been been termed the Gaussian Distribution. The formula for
the Gaussian Distribution is:
-,N2
(x
m)
p(x):=-Lr.e
where:
m = mean value of x
a= standard deviation
The Gaussian distribution is also referred to as the normal distribution. In
random vibration theory, the characteristics of many systems are approximated
by this distribution. Random Environments are described by a few key formulas,
such as mean value and standard deviation which will be defined next.
The mean value is a fundamental characteristic of the environment. When p(x)
can be determined for a random process, then a variety of characteristics can
be defined for the process defined as x(t). Allowing the expression E [ ] to
signify the expected value of the term in the brackets, the following definitions
are defined:
Mean value of x ,or average value of x, m ,
is given by:
13
E[x] = m=i:- x(t) dt
Relating the p(x) to the mean, since
dtZt:=p(x)- dx
Then :
E[x] =
00
-00
x-p( x) dx
The mean value gives the central tendency of a function or signal.
Similarly, the mean square value of x = E [ x2
] : average value of x 2
E [ xA2 ] = x(t)2dl
00
x -p(x) dx
Standard Deviation of x, a,and variance, a can then be defined:
a =E[(x-E[x])*2]
14
The variance is the square of the deviation of the x from the mean level
E [ x ] . It can also be shown that the variance is equal to the mean square
minus the mean squares or:
2
a=E[x2]-(E[x])2
Variance provides an indication of the dispersion of the variable about the
mean value.
Now that the basic terms used to describe random processes have been
defined, they can be used to describe environments. A sample function is a
single time history used to describe a random process. A collection of sample
functions is commonly referred to as an ensemble. The mean value of a
sample function can be found through summing the instantaneous values of
each sample function at the same time point, then dividing by the number of
functions(See Figure 5). The term stationary random process refers to a
process in which the characteristics (mean value and variance) of the ensemble
do not depend on absolute time. Stationary also means ensemble average is
equal to each sample average.
15
Acceleration
(g)
Time(sec)
Figure 4: Random Signals Time Aligned
3.2 Correlation
Correlation is used to determine how a function relates to another
function at a later point in time. Two types of correlation are instrumental to the
study of random vibration, autocorrelation and cross correlation.
Autocorrelation relates a function to itself at a later fixed instant of time. The
formula for Autocorrelation is:
Rxx(T) = E[x(t)x(t + T)]
or
RxxW =lim 1rT
T?oo Tx( t)-x(t + x) dt
Autocorrelation has the following properties:
16
1 . if the process x(t) is stationary, then the mean and standard
deviation are independent of t
2. it is an even function
For Cross correlation relates two different functions at a fixed later time:
Rxy(T) = E [ x(t) y(t+T)] and Ryx(T) = E [ y(t) x(t+T)]
or
rT
RXy(x) = lim j_.
T-^-oo Tx(t)-y(t + x) dt
In general, cross correlation if not even. It the time separation T is very large,
no correlation is expected. Correlation is commonly used to detect periodicity in
functions, predict signals in noise, and aid in the measurement of time delays.
3.3 Random Environment Definitions
With the definition of correlation, other terms used to describe random
vibration can be introduced. A nonstationary random process is one in which
the mean and autocorrelation vary with time. The terms weakly stationary or
stationary in the wide sense describe a special case in random vibration where
the mean is constant, but the autocorrelation depends on the time separation
(T) only and not time (t). Strongly stationary or stationary in the strict sense
implies that the correlation is time invariant. A nonstationary random process
has characteristics which depend on time; to characterize it, an instantaneous
average over the ensemble must be used. An ergotic random process is one
17
where the mean and autocorrelation computed for a sample are the same for
the entire function of a stationary random process.
Autospectral or Power Spectral Density (PSD) (Gxx (0) for a stationary
record represents the rate of change of the mean square value with respect to
the frequency. This term is used extensively in describing random vibration
processes, as it relates the vibration amplitude with probability, hence it is
instrumental to random processes. The values are estimated by computing the
mean square value in a narrow frequency bandwidth at central frequencies,
then dividing the value by the frequency bandwidth. The total of all mean
square values divided by frequency gives the total area of the function and is
the total mean square value of the function.
Spectral density functions are commonly used for: determination of
system properties when random vibration is involved, specification of random
vibration test profiles, and identification of energy and noise sources.
Fourier analysis ties together the time and frequency domains of a
signal. The coefficients of the Fourier series can be plotted against frequency
producing the Fourier spectrum. Computers are instrumental in performing
Fourier transforms utilizing the fast Fourier Transform (FFT) algorithm which
minimizes the time to compute values.
The Fourier integral is defined as:
18
X(f) :=
00
x(t)-e~i2ltftdt
with the inverse transform:
x(t):=
00
-00
X(f)-ei2jlftdt
where the integral can be considered as a summation of the continuous
spectrum of sinusoids.
Spectral Density is defined as the Fourier transform of the correlation
function. There is autospectral density defined as:
S(f) :=
XXRxx(x)e l2*fTdx
with the inverse:
RxxG):=
and cross spectral density defined as:
Sxx(
f)-e5tT
dx
Sxy(f) :=
00
Rxy (x) e
1 % x
dx
with the inverse:
19
Rxy(,):=
00
Sxy(f)-ei2:ifTdx
The units for spectral density are the (mean square value)/ (unit of frequency).
Used commonly in vibration is acceleration spectral density or power spectral
density described as gA2/Hz. A graph of a typical random environment of this
type is shown in Figure 6. The mean square value of a stationary random
process is the area under this graph which is also Rxx(O).
Power
Spectral
Density
(gA2/Hz)
0
Frequency (Hz)
Figure 6: Typical Random Vibration Spectrum
Two common terms used to describe processes are narrow band and
broad band. As the names imply, a narrow band process has spectral density
which occupies only a narrow band of frequencies. A broad band process
consists of a wide frequency band of excitation. These types of processes can
be used in dynamics analysis to excite a structure. If a particular frequency
20
range is known then narrow band excitation can be used to excite a small
range. If there is no indication of frequency range to use, then a broad band is
typically selected to provide an indication of further excitation needs.
If the frequency range of interest is limited to positive frequencies only ( from 0
to positive infinity) then one sided spectral densities are of interest. These are
defined as Gxx( f ) and Gyy( f ):
Gxx(f) = 2Sxx(f) andGyy(f) = 2Syy(f).
in which f > 0. This is feasible, since S(f) is even. Typical values of S(f) and G(f)
are presented in Table 1.
Table 1 : Typical values of S(f) and G(f)
Frequency(Hz) S(f) (gA2/H;z)G(f)(gA
0 0.002 0.004
5 0.0052 0.0104
10 0.036 0.072
15 0.009 0.018
20 0.6 1.2
25 0.003 0.006
30 0.0025 0.005
35 0.058 0.116
40 0.006 0.012
45 0.0063 0.0126
50 0.351 0.702
21
4.0 Data Analysis
Data analysis for the structural dynamics analyst typically involves the
frequency response of a structure instrumented with transducers. Basic terms
and applications are presented in this section. Examples are displayed in
Chapter 7 with the aluminum beam example.
4.1 Frequency Analyzer
Frequency analyzers are used throughout industry as a tool in
understanding system behavior. Whether the system is a vibrating mass or a
production line a dynamic signal analyzer will make a physical measurement
then present it in a format the user requires.
A frequency analyzer consists of a bank of variable frequency narrow
band filters with an rms meter to display the filter output. The first analyzers
were analog, which could be very cumbersome and large depending on the
functions it had to perform. Many analyzers today accomplish the filtering
through digital signal processing (dsp) chips, so analyzers can be portable
hand held units. See Figure 7 for a block diagram of a typical frequency
analyzer setup.
Input x(t) Narrow Bandpass filter w/
bandwidth = df and center
frequency= to.
Square
and
Average
Divide by dfGxx(fQ)
Obtain x(fo, df, t)
Figure 7. Analyzer Block Diagram
22
4.2 Measurements Functions
Analyzers are flexible instrumentation. With the appropriate hardware
configuration, structures as large as buildings and as small as electronic
boards have their dynamic characteristics identified. Three common
measurement domains are the time, amplitude, and frequency. Other
measurements are available as special features of equipment manufacturers,
such as Bruel and Kjaer's Cepstrum analysis.
4.2.1 Time Domain Analysis
Time domain analysis usually consists of a time record and the
autocorrelation and cross correlation functions associated with the signals. This
is the type of trace which can be found from an ordinary oscilloscope. Time
domain analysis can be used as a quick method of monitoring signal integrity.
When starting any analysis, a quick view of the transducer prior to measurement
can indicate problems with instrumentation setup. Time domain analysis
(sometime a referred to as running mode) and operating mode deflection are
two analysis types which takes a structure operating in its normal condition and
displays the dynamics as a function of time. It is distinguished from modal
analysis, in that it is time based instead of frequency based. It has the ability to
show product interactions during operation. Analyzers start with data from the
time domain to form frequency and amplitude domain measurements.
4.2.2 Amplitude Domain Analysis
Amplitude domain analysis consist of histogram, probability density
functions, and cumulative probability density functions (See chapter 3 for
23
details). It can provide an indication of data nature ( is it Gaussian or not ?) or
give minimum and maximum data values over the data record. This involves
general statistical analysis.
4.2.3 Frequency Domain Analysis
Frequency domain analyses are important to the structural dynamics
analyst in understanding the dynamic characteristics of the structure. Power
spectrum (both cross and auto), linear spectrum, frequency response,
coherence, and spectral maps are all typical measurements. Power spectra (for
details see chapter 3) are one-sided, versus linear spectra which are two sided.
Linear spectra are the result of direct FFT of a time signal. Spectral
measurements are useful in identifying frequencies of interest ( resonances,
operating frequencies, cutoff frequencies, etc. ).
Frequency response is a two or more channel measurement. One
channel is typically designated the input, and all others the outputs. The
frequency response function of a system, H(f), is defined as:
H(f) :=
00
h (x) eJ T
dx
where:
h ( x ) = the unit impulse function
describing the system
Using complex polar notation to describe frequency response:
H(f) :=|H(f)|-e~j*(f)
where:
24
I H( f ) | = gain factor of a system
<K f )= phase factor of a system
H( f ) is the Fourier tranform of h(x ).
Many engineers use the terms "frequencyresponse"
and "transferfunction"
interchangeably. This should not be practiced, since a transfer function more
accurately describes the Laplace transform of the unit impulse response
function.
The coherence function is also used quite commonly in the study of
system dynamics. Coherence is the ratio of the absolute value of the cross-
spectral density function squared, to the product of the two comprising
autospectral density functions:
^ GXX(f)-Gyy(f)
Coherence is a measure of the accuracy of the linear input/output model
assumed for the system under investigation. Coherence is used successfully in
identifying errors, as will be discussed in chapter 5.
Spectral maps, or waterfall analyses are a three dimensional displays of
data. Typically another parameter, such as revolutions per minute (rpm) for a
rotating piece of machinery, is used to align the typical power spectrum while
conditions are varied. This type of analysis is useful in distinguishing between
system natural frequency and forced vibration. A natural frequency will be
constant on the Waterfall, following the skew of the alignment, while a forced
25
vibration will vary following the third parameter (rpm). See Figure 8 for a
spectral map example.
6320 RPM Spectrum from spectral map
I 13Spectral Map Chan 9 6.32kRPM
Mag
Peak!
gA2fflz
JL A A JUma JL <& iffli
6.48k
0 Functn Lin Hz g^larkerg RCLD
Spectral Map Chan 9
RPM
1.064k
Vibration
Level
g'2/hz
Frequency [hz]
ilA.
3.2k
Figure 8: Waterfall Analysis Example
26
5.0 Noise and Error
The accuracy of measurements made concerning random vibration
signals must be examined to understand the nature of the environment. When
dealing with random data sampling, this type of investigation is extremely
important, due to the unpredictable nature of the subject. The common scenario
of "garbage in / garbageout"
can be the pitfall of an inexperienced engineer.
Error is inherent to random measurements, since measurements are only a
sample of the environment. The sampling technique also produces error in the
data.
5.1 Accuracy of Measurements
Errors are a fundamental problem in any type of experimentation.
Repeatability and reproducibility is a problem with random data. How much
variation can be allowed to characterize the process must be determined.
When analyzing data, only a sample of the infinite ensemble is used. With the
constraints of the analysis hardware ( memory, speed, timing, etc), only a limited
length of a given sample can be analyzed.
When measuring spectral density, a basic dilemma must be resolved
with each measurement. In order to achieve high resolution, the filter
bandwidth of the analyzer, Be, must be small. Filter bandwidth refers to the
frequency span a filter in the frequency analyzer is made to measure. If a filter
is set to measure between 20 to 25 Hz, the Be would be 25-20 = 5 Hz. But, to
achieve good statistical reliability, Be, must be large when compared to the
27
frequency. To compensate for this dilemma, averaging time must be set to a
large value, so the sample function must last for a long time. With many
functions this is possible, but for some events, such as rocket launches, long
samples and repetition can be impossible.
Frequency analyzers are also susceptible to a steady state or bias error
when the filter bandwidth covers a range of frequencies where the spectral
density is changing rapidly over the frequency band. Again the solution to this
is to use an analyzer with narrow enough frequency band and take data over a
long period of time. The speed of digital techniques have made them very
popular in the field of frequency analysis. Digital speed compared to analog
filtering becomes a major factor since it allows for longer time records to be
made reducing error. Taking longer samples with more averages can answer
some error problems, but there is much more to understanding frequency
analysis techniques.
5.2 Fourier Transform Algorithm Error
To understand how a frequency analyzer calculates the Fourier
Transform of a signal, consider the sine wave in Figure 9.
28
A
m
P 1 1
Sine Wave
x,o 11 XJ2.If...
1
i
t
XfJtJt
(- 1 ' ^
u
d
e
i 0^<o3
XjKit-*
U "1 w i
n 0 15 30 45 60 75 90 105120135150165180195
GTime (msec)
Xr = X(t = r*dt)
Discrete Time Series { Xr }, r= .... -1.0, 1.2, ...
Figure 9. Sine Wave for Fourier Transform Example.
The analyzer will determine the statistical characteristics of the function
by manipulating discrete values of Xf. Given the equation for discrete Fourier
transforms:
x(t):=
ag + 2-
Vj [ajc-cos(2-jfk-
j + b j,-
sin f 2- % k-
]]k=i
where:
ak- x(t)-
cos[2- ji- k-
] dt
0
bk:=T x(t)-sin(2-3i-k--Jdt
If the continuous time series is unknown, and only equally spaced samples are
known; we have a sequence of samples (xr), where r = 0,1,2,... (n-1) where and
t =r*
dt. dt=T/N.
29
Replace the above integral with a summation:
1 ^ -i(2,.|).(r.dt)Xk'=
T2-.Xr'C dt
The Xk represents the whole area under the curve (See Figure 10). If T=N*dt is
substituted then:
A
m
P i -,
i
t
u
d
e
n
G
Sine Wave
x( t)-cosxio *" x:2
0 15 30 45 60 75 90 105120135150165180195
Time (msec)
Figure 10: Sine Wave used in DFT
H-l "i-2-jtk-r
Xk:=^SXre N
r=o
The discrete Fourier transform (DFT) of the series { xr}, r= 0, 1, 2, ..., (N-1) is:
Hi)M-/
Xk:=^X>fe
k-o
withk=0, 1,2, 3,..., (N-1).
The inverse discrete Fourier transform (IDFT) is then:
30
xr :=X!XkeHi)
with r= 0, 1, 2, 3,... (N-1). With using the DFT method, the smaller the sampling
interval, the closer the approximation.
Problems arise when trying to calculate values for x|< greater than (N-1).
If k=N+L, then:
.
i-
Xn + L:=N"EXre
2jtl(N+ L)N
Simplifying,
Xn + L:=irZXr.P \ N /. -i-2-KT
but,
i 1 Jt-r ._
no matter the value of r, so x n+[_= x |_. Thus the coefficients of x k just repeat
themselves for k>(N-1) causing distortion, which is called aliasing. The Nyquist
frequency is defined as:
At =sampling time
Sampling Frequency^=Sampling Rate
At
Nyquist Frequency= --SamP|in9 Frequency
2- At
31
This is the maximum frequency that can be detected from data sampled at time
spacing dt. The physical result of sampling at a frequency too low for a system
is that higher frequencies are missed in measurements.
The DFT method of Fourier transform was replaced when J. W. Cooley
and J. W. Tukey introduced the Fast Fourier Transform (FFT) in 1965. This
algorithm streamlined the computation of the Fourier Transform by changing the
method used to interpolate constants in the trigonometric polynomial. This in
combination with the integrated circuit revolution have made frequency
analyzers available to industry. The FFT equation computes the complex
coefficients Ck instead of ak and bk with the formula:
2m- 1
F(x):=l-Vck-eikx
k=o
where:
jiijk
c^:=yi-em
k
k
for each k = 0, 1, 2 2m -1.
Time and frequency domains are usually related through FFT and IFFT in
the frequency analyzers today instead of DFT and IDFT.
An outline of the process frequency analyzers use for spectral estimates
is:
1 . A discrete time series is created by the results of sampling the
continuous event under observation. Data generated are {Xr} and {Yr>
32
for r= 0, 1, 2, 3,..., (N-1) at a time interval dt=T/N.
2. The Fourier Transforms for {Xr} and {Yr} are calculated.
3. Discrete series for spectral densities are determined from {Xr} and
{Yr>. Appropriate spectra are then derived.
4. IFFT is then used to determine the corresponding correlation
functions.
5.3 Error Classification
There are two classes of error when dealing with random vibration, bias
error and random error. Random error is the result of the nature of the data, the
unpredictability from one sampling to the next. The incident of random error is
high when sampling is limited. Bias errors are consistent errors in data which
are due to the processing of the data to the appropriate format for the user. This
can be due to calculation inefficiencies. Combined these errors pollute
measurements being made. This is one reason why they must be identified and
an understanding of how to work with them must be attained by the user of
spectral analysis and correlation
5.4 Noise
To understand noise in a system, use a ideal single input/ single output
system as modeled in Figure 11.
33
x(t)h(x),H(f)
y(t)
Figure 11: Ideal Single Input/ Single Output System
Under ideal conditions:
y(t):=
00
h (x) x (t - x) dx
where h(x) is the transfer function for the linear system
Evaluation of a system frequency response function can be performed from
measurement of x(t) and y(t) using the equation:
H(f)= Gxy(f)/Gxx(f)
H(f) is a complex number which can be represented by:
H(f) = HR (f)- i H i (f)
Frequency response polar form is:
34
H(f) := |H(f)|-ei*(f)
|H(f)| :=(HR(f)2
+H!(f)2)
(|)(f):= atan
:the gain factor
Hi(0\
HR(f)j': the phase factor
If the assumption is that the input x(t) is from a stationary random process, and
data is accumulated over sufficient time so that the transients die out, the input/
output auto spectrum relation is:
Syy(f) = I H(f) 1 2 Sxx (f) : two sided
Gyy(f) = I H(f) 1 2 Gxx (f) :one sided
And the input/output cross spectrum relation is:
SXy(f) = H(f) Sxx (f) : two sided
Gyy(f) = H(f) Gxx (f) :one sided
These are true when there is no extraneous noise, the system is not time
varying, and there are no nonlinear characteristics.
Noise is introduced to the system as in Figure 12:
35
n(t)
u(t)h(T),H(f)
V(t)
^ y(t)
m(Wlux(t)
where: u(t) and v(t) are the true signals
m(t) and n(t) are noise terms.
Figure 12: System with Noise at Input and Output.
Now the terms x(t) and y(t) consist of:
x(t) = u(t) + m(t) and y(t) = v(t) +n(t)
With noise,
Gum(f) = GVn(f)=Gmn(f)=0.
The system spectral relation is:
Gw(f)= IH(f)|2Guu(f)
And the cross spectrum is:
36
GUv<f) = H(f) Guu(f).
The original system spectral density functions are now:
Gxx(f) = Guu(f)+Gmm(f)>Guu(f)
Gyy(f) = Gvv(f) + Gnn(f)>Gw(f)
Gxy(f)=Guv(f)
The coherence is defined by the following:
2._(|Guv(f)[):
Yuv(f)!=
Gmi(f)-Gvv(f)uuvw ~vw -
=s true coherence
vm*._ QGxy(nD
XV -("^|f|is measured coherence.
In an ideal case, coherence is unity. In actual experimentation, coherence
varies from zero to one due to:
1 . Noise in the measurement.
2. Bias errors in the spectral estimate.
3. Nonlinearity in the relationship between x(t) and y(t).
4. The output y(t) affected by inputs other than x(t)
simultaneously.
37
Relating the two:
IGxy(f)l2= IGuv(f)l 2 = IH(f)|2 Guu2(f)= Gw(f)Guu(f)
IH(f)|2= Gw(f)/Guu(f)
2.
Ouu(f)-Gyv(f)Yxy(0
"=
(Guu(f)+Gmm(f))-(Gvv(f)+Gnn(f))
which is less than or equal to 1 .
If input noise exists in a system, then there are two cases:
1 . The noise will pass through the system and:
-Hxy(f) will be a biased estimate of H(f) in gain and phase.
-If Gxm(f) is zero, Hxy(f) is unbiased.
2. The input noise does not pass through the system then:
- gain will be a biased estimate of H(f), but phase will not be
biased.
- phase will however depend on the ratio Gmm(f)/Guu(f) known as
a signal to noise ratio.
- GXy(f) will not be influenced, and hence will give a true estimate
of Guv(f)-
38
If the system has noise in the output only (See Figure 13):
n(t)
x(t)h(T),H(f)
v(t)
"*- y(t)
Figure 13: System Model with Output Noise only.
For the model:
input is virtually noise free
the output is composed of v(t) which is due to x(t) and other
deviations present.
From the coherence of the noise in the system, eliminating input noise, the
relationships:
Gyy(f) := Gvv(f) +Gnn(f)
Gvv(f) :=Yxy(f) -Gyy(f)
Gnn(f) := (i-Yxy(f)2)-Gyy(f)
Thus coherence when there is noise at the output is between zero and one, it
cannot be one.
39
5.5 Frequency Response Errors
Estimation for frequency response in single input/ single output systems
involves both random and bias errors. It is extremely important that these errors
are understood, and if possible minimized, for data analysis to be credible.
Coherence functions will aid in the detection and classification of errors, so it is
good practice to analyze coherence whenever making frequency response
measurements.
5.5.1 Random Errors in Frequency Response
Random error in frequency response is due to these common sources:
measurement noise in transducers, computational noise in data processing,
other unwanted inputs, and nonlinearity between the input and the output.
Random error is related to the coherence and number of averages used in
spectral density calculation. To minimize random error these steps should be
utilized:
1. Minimize noise in instrumentation by using appropriate equipment
(high quality transducers when available, watch grounding loops,
etc.)
2. If the coherence falls broadly over a frequency range and the
frequency response is relatively low, extraneous noise at the output
should be suspected. This can be due to uncorrelated inputs as well.
3. If the coherence falls broadly over a frequency range, the
frequency response is not relatively low,and the input power spectral
density is small, then there could be input noise being measured.
40
Bias errors could also be caused by this scenario.
4. If the gain is sharply peaked, as in the case of a system with slight
damping, coherence will peak at corresponding frequencies. This is
due to high signal to noise ratios at these frequencies. If the
coherence does not peak or even worse notches, then nonlinearities
can be suspected. These results may also be indicative of bias errors
in the data.
5.5.2 Bias Errors in Frequency Response Functions
There are several causes of bias error in frequency response function
estimates. Some of the main ones are: noise at the input which does not pass
through the system, spectral density estimation errors due to resolution
problems, unmeasured inputs, and system nonlinearities. To detect and
minimize these bias errors the following guidelines can be followed:
1 . Minimize the noise at the system input when possible.
2. Choose a sufficiently narrow resolution bandwidth, Be, for the
measurement.
3. If coherence falls broadly over a frequency range where the frequency
response is not at a small value and the input spectral density is low,
then input noise is indicated.
4. If coherence notched sharply at the frequency response sharp notch
or peak, then error can be due to either inadequate spectral resolution
or system nonlinearity. This can be easily determined by varying the
spectral resolution and repeating testing. Improved resolution with an
41
increase in coherence will confirm resolution problems. Nonlinearity
is the case otherwise.
42
6.0 Theoretical Analysis
A small aluminum beam is analyzed using techniques presented in the
previous sections. This section details an exact analysis of a cantilever beam
and an assumed modes approximation. The beam is considered a system with
continuously distributed mass and elasticity. It is assumed to be homogeneous
and isotropic with displacements in the elastic region described by Hooke's
Law. The natural frequency and mode shapes of the beam are determined for
the continuous beam system using analytical techniques. Random vibration is
used to excite the beam at the base and the frequency response of the beam
determined using assumed mode methods.
6.1 Exact Solution with Free Vibration
Examining the lateral deflections of a beam without rotary inertia, the
following model is developed. Consider the beam in Figure 14.
/
/
/
/gw V-
dx dx
M +
J
/6M\ck
jdx
Figure 14: Beam Model for Continuous System
Summing all forces in the Y direction gives,
43
p-A-dX-
2
6 Y
6t
,6V,
V + | | dX
SX,
+ V
Where:
p = Mass/ Volume
A = Cross Sectional Area
Simplifying,
p-A-dX-
2
8 Y
St,8X;
dX
p-A-
6 Y 5V
6t6X
Summing the moments about point o yields the following:
SM dX / SV \ dX-dX + M-M- V- - V + dX
SX2 \ SX /
2
If higher order terms are ignored, the equation is simplified to:
44
SMV :=
SX
From strength of materials, M is known to be:
2
6 Ym .=
m-
2
SX
Making the substitution,
2 2/2
8 Y 6 / S-Y'
pA- := - H-r
2 2 1 2
St St \ SX
which is the governing differential equation of a beam when rotary inertia is
insignificant.
If the beam is considered continuous with uniform material, El is constant, the
following equation is derived:
2 4
6 -Y H S Y+ := o
pa
Assume that the solution is of the form:
45
Y(X,t) := Y(X)-SIN((ot)
Substituting into the equation:
2_ e s4y-co Y + := o
PA
This equation eliminates the dependence on time, and has one independent
variable. The partial derivative becomes an ordinary derivative:
. 2
d4-Y pAcoHY := 0
dX4 e
Make the substitution:
P:=
2
pAco
e
And the equation is sirrlplified to
d4-Y
dX4
4
The solution of this equation is assumed to be of the form,
46
_ a.X
Y :=C.-e1
1
Then,
CaD4- e_1"
_ ci- e_l
, a.X 4 a.XCYaV-e1
:= o
Solving this equation,
D2*1/?
or
^
The four roots to the equation are:
aj:= 6 a2
:= ~B
a3
:= iB a4:= -iB
So the solution becomes:
Y(X) := C +C2-e"pX
+C3-eipx
+C4-e"ipX
47
Examining the exponentials, the following relationship can be used to evaluate
the equation:
e"px
:= cosh(BX + sinh(Bx))
e"ipx
:=cos(bx) + sin(px)
And thus,
Y(X) :=
Acosh(Bx) + Bsinh(Bx) + Ocos(bx) + Dsin(Bx)
where A, B, C, and D are all constants of integration.
For the cantilever beam used in the investigation the boundary conditions:
Y(o,t) :=o=>Y(0)
= 0
SY
-(o,t):= o
SX=> Y'(0)=0
2
8 Y
M(L,t) := H- - 0
^Y"(L)=0
3
8 Y
V(L,t) :=e-^-0
8X=> Y'"(L)=0
Making this set of substitutions yields:
Y(0)= 0 = A +C= A = -C
48
Y(0) :=
p-(A-cosh(px) +Bsinh(px)) -Ccos(px) -Dcos(px)=Q
0 := p-(B + D)= B = _D
Y(L) := p2- (Acosh(pL) + B-sinh(pL))-
C-cos(pl)-
Dsin(pL) _
= 0
Simplifying into previous equations and solving for A/B and equating results
yields:
cosh (pi.) + cos (pL) _
sinh (pL) + sin (pL)
(sinh(pL) -sin(pL)) (cosh(pL) +cos(pI_))
This results in the following equation:
cosh (pL) cos (pL) + l := o
The first six roots are:
p i-L:= 1.875
49
2"L:= 4.695
P o-L'= 7.855
P 4-L := 10.996
P trh := 14.137
P fiL "= 17.279
Solving back to frequency yields:
a, =PL2' S
4
pAL
The corresponding eigenvalues are:
coj:= 3.52 '
H
4
pAL
50
eto o
:= 22.0-
I I 4
pAL
to3
:= 61.70-e
pAL
ea,4:= 120.91- I
J pAL
to5
:= 199.86-
e
pAL
to6
:= 298.56-
e
pAL
The eigenfunctions are determined displaying the deflection shape at the
natural frequency. For a specific frequency make the appropriate substitutions:
51
Y j( X ) := A-cosh (& -
x)+ B-
sinh (p {- X\ + C-cos (p -
x)+
D-sin (p {- X)
since C = -A and D =-B, then
Yi(X) := (cosh (p fX)-
cos (p j-
x)) ^ + sinh (p f x)-
sin (p fX)B
Y j( X ) := A-cosh fp - X) + B-
sinh (p {X\ - A-
cos (p - X\ - B-sin (p - X\
The mode shape is given by this function, not exact values, thus B can be
eliminated and the shapes defined by:
Yi(X) :=(cosh(prL-) -cosfpi-L-^)+ sinh (p f L-^ -sin(pfL-B L
For the identified frequencies the following mode shapes are identified:
52
Mode Shape 1
z=x/L
z :=o,.i.. lPL := 1.875
Y j(z) :=cosh(PLz)-cos(pLz)+ ( -.734095 )( sinh( pL-z)-
sin( 0L-z) )
z * lU)
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
0
0.034
0.128
0.273
0.46
0.679
0.922
1.182
1.451
1.725
2
Figure 15: Mode Shape 1 from Exact Solution
Mode Shape 2
z=x/L
z :=0,.l.. 1PL := 4.694
Y 2( z)=
cosh( PL-z)-
cos( pLz) +" 1.018467-
( sinh( PLz)-
sin( pLz) )
z Y2(z)
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
0
0.185
0.602
1.052
1.367
1.427
1.179
0.634
-0.14
-1.047
-2
Figure 16: Mode Shape 2 from Exact Solution
53
Mode Shape 3
z=x/L
z :=o,.l.. 1PL := 7.855
Y 3( z):=
cosh( PL-z)-
cos(PL-
z) +- 1.00-
( sinh( PL z)-
sin(PL-
z) )
Y3(z)
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
0
0.456
1.208
1.509
1.043
0.019
-0.992
-1.41
-0.997
0.002
1.001
Figure 17: Mode Shape 3 from Exact Solution
Mode Shape 4
z=x/L
z :=o,.i.. lPL := 10.996
Y4(z) :=cosh(PL-z)-
cos(PLz) + "1.00-( sinh( fSL-z)-
sin(PLz))
z * 4U)
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
0
0.77
1.508
0.868
-0.63
-1.41
-0.64
0.832
1.397
0.437
-1
Figure 18: Mode Shape 4 from Exact Solution
54
Mode Shape 5
z=x/L
z:=0,.l.. 1pL := 14.137
Y 5( z):=
cosh( PLz)-
cos( PL-z) +- 1.00-
( sinh( pL-z)-
sin( PLz) )
Y5(z)
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
0
2
-2
1.074
1.3191 1 1 1
1 1 ! 1
-0.423
-
1.393
7.335- 10~4
1.397
0.437
-1.26 0 0.2 0.4
z
0.6 0.8 1
-0.831
1
Figure 19: Mode Shape 5 from Exact Solution
Mode Shape 6
z=x/L
z :=o,.i.. lPL := 17.279
Y 6( z):=
cosh( PLz)-
cos(PL-
z) +- 1.00-
( sinh( pL z)-
sin( PL z) )
z *6u)
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
0
1.322
0.674
-
1.339
-0.22
1.414
-0.221
-1.345
0.642
1.144
-1
Figure 20: Mode Shape 6 from Exact Solution
55
6.2 Approximate Methods for Base Excitation
Random vibration excitation is used to determine the dynamic
characteristics of the beam. Consider the beam model in Figure 21 with the
base excited in the direction perpendicular to the beam.
* x
Yb
y(x, t)
/////////
Figure 21 : Cantilever Beam with Base Motion Excitation Perpendicular to Beam
The.assumed mode method assumes that the solution to the boundary-
value problem is of the form:
y(x,t):=yb + X(t)i(x)'qi(t)
i
where:
9 j Cx ) = shape functions
q i ( t ) = generalized coordinates
Lagrange's equations are used to approximate the equations of motion. Using
the following definitions:
56
p,(x) = mass/length
E = Young's Modulus
I = Area Moment of Inertia
f(x, t)= force/length
The equations for energy for a cantilever beam with base excitation can be
defined. For a continuous system kinetic energy is:
rL
KE := -
2/5^q i<t> A -nO) dx
Potential energy is:
rL
U := -
2
e f?" 9 A -p(x) dx
To accommodate damping, use the Dissipation Function:
L
2 (?q
i"
<t> A -c(x) dx
For generalized forces use:
rL
Qi:= f(x,t)-(|)-(x)dx
Lagrange's Equations is then defined as:
57
d /6KE\_
6KE
dtUqJ Sqj
6U+ :=Qi
qi
where i = 1, 2, ...
Since the KE does not depend on coordinate q j (t) and U does not depend on
*
velocity q j (t) Lagrange's equation becomes with damping and generalized
forces:
d /ske\ sd su
dt^Sq^ fiqj 6qi
In matrix form:
[M]{af(t)} + [C]{dr(t)} + [ K]{cT(t)}=[Q]
Set:
y(x,t)=
yb + ^]q1(t)-i|)1(x)
or
y=
yb +X^i'^i
where:
i|) ( x )= Normal Mode or a shape function
This creates a system of N generalized coordinates or degrees of freedom:
58
q 1 (t). q 2(t). q 3(t) qn(t)
Which provide N equations of motion:
* .
[ M ] nxn 'q + [ C ] nxnq + [ K] nxnq = Q
with:
M |x(x)-i|ji(x)-i() j(x) dx
L
c(x)-t|j j(x)-i|jj(x) dx
K
L
e-ip-(x)-ii>j(x) dx
To effectively perform calculations, let z= x/L ,a dimensionless variable and
replace integration limits from 0 to 1,instead of x= 0 to x= L.Thus:
l
M^L-
H"9 i(z)"9 j(z) dz
Clj:=L-c-ijj i< z)-i|> (z) dz
Kr=
Ict
d d . , x d d, , v jH-
i|>i(z)-
i|j :(z) dz
dz dz dz dzJ
59
r 1
Q i:= L-
f(z,t)-i|)(z) dz
To analyze the vibration of the beam, let:
"! i( z):=
<j>i(z)
Using the results of the exact analysis for normal modes, and substituting into
the defined equations:
K .=
1 0 0 0 0 0
0 1 0 0 0 0
M;-
0
0
0
0
1
0
0
1
0
0
0
0
0 0 0 0 1 0
0 0 0 0 0 1
'
1 0 0 0 0 0"
0 1 0 0 0 0
C :=
0
0
0
0
1
0
0
1
0
0
0
0
0 0 0 0 1 0
0 0 0 0 0 1
12.360 0 0 0 0 0
0 485.481 0 0 0 0
0 0 3806.629 0 0 0
0 0 014617.05-
0 0
0 0 0 0 39941.929 0
0 0 0 0 0 87094.658
60
Q:=
.783
.434
.254
.182
.141
.116
Since the normal modes are orthogonal, the equations are decoupled to form
the following set of equations to describe the beam with base excitation:
jiLMj-qi + cLCj-qj + qj:=-pLQj-y b
L
for i = 1 to 6.
This system can be simplified by dividing through by L and substituting values
for Mj and C\:
H-K
p-qj + c-qj + qi:=-pQryb
The frequency response function of this system can be determined by takingthe Fourier transforms ( FT( ) )of both sides:
FTK
a>% + ica> +-i)-FT(q>) ^-pQj-FT^y^)
-M-Qi
2 EIKi-
co p + icco +
Make the following substitution,
61
FT
EIKjk, := -
1L4
then,
(qj) ._
"HQi
FT(yb)2
-
co p + icco + kj
Furthermore,
Fr(q*i)
FT(yb)
2-
pQ- co
2-
co p + icco + kj
If the Frequency response function H is defined as:
FT [ output ] = H ( co)*FT[input]
where: FT [ ] Fourier transform of |
then,
dHwir, (*V-Qi>2
-
-2
( kj p co J (ceo)
can be used to solve for the response of the system when excited with random
vibration at the base. See Figure 22 for example.
62
A^Ks "^-1 H I A2 *Syb
hkSyb
Frequency
So
tFrequency
Figure 22: Frequency Response Function Example with Random Vibration Input
for Single Degree of Freedom System
SqW:= (|H(co)|)2Sy(co)
Vibration measurements are typically measured using acceleration units
instead of displacements. The equations derived can be transformed to
acceleration equivalents:
y:=
y b+ ^ i( x)q i( x>
Displacement
y:=yb + ^i(x)-qi(x)
Acceleration
The Fourier Transform FT [ ] can be represented by:
FT[y]= FT[yb]+ ^/FTtqj]
For 1 function, the acceleration shape function is:
63
FT[y]= FT[ybr l + (-coj-ij) x(x-pQ
)
-
co p + icoc + (kj)
thus,
Hv(co):= 1+ (-co2) -9 1(x)-T
-pQ
-
co p + ICOC + (K ])
For two functions:
Y(x,t)=yb(t) +^ j(x)-q j(t) +H)2(x)-q2(t)
and
y:=yb + ^ i(x)-q 1
+ iMx)'q2
FT[y] = FT[yb]+ ^l(x)FT[q*1] + ^2(x)FT[q2]
which can be shown to be:
FT[y] =FT[yb]*
1 +
co -pQ j-tIj x(x) co -pQ2"9 2(x)
2 2
co p + icoc + (k -A-
co p + icoc + A:9)
and
Hv(co):= 1 +
co -pQ j-ip x(x) co-pQ2-^2(x)
-
co p + icoc + (k j)-
co p + icoc + A:2)
64
This technique can be expanded for six functions:
FT[y] = FT[yb]*i+l>n<x>-pco Qn
-
co p + icco + ^kn"\
and
Hy(to) := i + ^]^n(X).pco Qn
co p + icco + (k ^
65
7.0 Experimental Analysis
An aluminum beam is fixed to a small modal shaker through an
aluminum support (See Figure 23). The beam is instrumented with four
accelerometers located at the support, the end of the beam, and equally
spaced along the beam. The system is then excited at the base with broadband
random vibration and the response of the beam is measured.
Accelerometer (Accel.) corresponds to
channels on analyzer
Accel. 1
_TL
Accel. 4
D-
Accel. 3
D-
Small
Support
Accel. 2
Pi
Small Modal
Shaker
Aluminum Beam2"x9.5"x1/8"
Figure 23: Experimental Setup
7.1 Equipment
A small 50 Ibf modal shaker was used to excite the beam. A random
noise generator supplied the signal to the shaker amplifier. Four DJB Industry
accelerometers, model 28 ,were selected due to their high charge output with
low mass. This would minimize mass loading effect on the beam's dynamics.
A Hewlett-Packard (HP) 3566A analyzer was selected to make all
measurements. This analyzer is capable of time, frequency, and amplitude
66
domain measurements. The analyzer has a usable frequency range from DC to
12.8 kHz, which is ample for the beam investigation.
All measurements were tape recorded with a Kyowa Dengyo 21 channel
Beta tape recorder for future analysis. The tape recorder has a 46 dB signal to
noise ratio and was set to have a viable frequency range of 2.5 kHz.
7.2 Damping Analysis
The damping ratio of the beam was determined using log decrement. The
beam was supported, and the accelerometer attached to the free end monitored
while the beam was struck. The motion was allowed to decay while being
recorded. Using the following equation for log decrement:
xillog decrement 5 .
= ln
\X2J
See Figure 24 for damping decay result. The log decrement and damping ratio
are calculated in Table 2.
Table 2: Determination of Log Decrement and Damping Ratio
Vibration Peak Time (msec) Level ( g ) Log Decrement Period (msec) Damping Ratio
1 26.855 33.605
2 55.604 20.8 0.479 28.749 0.379
3 84.961 15.84 0.272 29.357 0.210
4 109.863 10.21 0.439 24.902 0.400
5 139.648 7.48 0.311 29.785 0.237
6 168.945 5.373 0.330 29.297 0.256
7 197.754 3.516 0.424 28.809 0.334
8 227.051 2.636 0.288 29.297 0.223
0.291 Average Damping Ratio
67
To determine c from the experimental data, the decay rate was
determined by using the data in table 2. An exponential discrete least squares
approximation technique was used (See table 3).
Table 3: Determination of Damping, C
Vibration Peak Time (sec) Level ( g ) In(Level) Time A 2 time*ln(Level)
1 0.026855 33.605 3.5156 0.0007212 0.0944
2 0.055604 20.8 3.0349 0.0030918 0.1688
3 0.084961 15.84 2.7625 0.0072184 0.2347
4 0.109863 10.21 2.3234 0.0120699 0.2553
5 0.139648 7.48 2.0122 0.0195016 0.2810
6 0.168945 5.373 1.6814 0.0285424 0.2841
7 0.197754 3.516 1.2573 0.0391066 0.2486
8 0.227051 2.636 0.9693 0.0515522 0.2201
Sum 1.010681 99.46 17.5557 0.1618040 1.7869
a= -12.6328084023769953
In b= 3.7904348874763876
y=44.276eA(-12.633)t
Using the relationship for determiningc on the aluminum beam:
qi(t) :=K-e2-H
c= 1.602*
10A-3 lb-sec/inA2
where:
p:= 63.41-
10-6
Ib-sec^/in^
68
L_
J
r
i
L L L
L
_J
L r r
r r i
L
J
r
n
r
i
1 ! ! 1 f
05.*
13
CO
CD
rr
c
CD
E(Dk-
JD
CD
Q
o
CO
D)
O
I ^J CM
= CD
u_
69
7.3 Spectral Analysis and Correlation
Power spectral measurements of all accelerometers were performed to
obtain the overall vibration environment of the positions. Analysis was carried
out between 0-1600 Hz. Be=4 Hz and Averaging = 50 counts was used. See
Figure 25 for the power spectra. The overall grms level of each position is
identified by RMS:. Using the formula for random error percent,
-/"dRandomError -
^u j
where,
11^= number of averages
Performing a stable average of 50 counts, random error = 14 %.
Next, frequency response is examined. Accelerometer 1 is designated
the control or input, and the accelerometers 2, 3, and 4 are responses or output.
See Figure 26 for results.
Some conclusions about the system can be derived from the power
spectra and frequency responses. A peak exists in all plots between 0 and 80
Hz. This is impart due to system limitations; the small modal shaker has limited
displacement and cannot excite low frequencies with high displacement. The
first natural frequency of the beam is also enclosed in this frequency range
causing some of the peak. Threeother peaks are noted in the spectra, at 240,
680, and 1356 Hz. These are identified as natural frequencies of the beam. In
channel 1, these appear as anomalies to the flat random background the
shaker is attempting to run. Natural frequency responses are often difficult to
control, resulting in irregular spikes and notches. In channel 2, the beam
70
>- 1 ^-~-r-<^ ,.
j. j .j.
.__ ir>'__
' ' > ' I
e r ^ '~S t r
cr*
t i \ 3 ! !r I t -S I I<-o l I i c? I Icn-| , [-> T r-a- ' I -t^ t i
Ln| |
_sr ] ]1
-j \~P^^] j T
^-Tirirtr^r^^-L^ ! 1 1
1 1 jJj i i
J 1 S i 1 1
1 1 -W^ 1 1
T-J
- ^i-u
^
1
1{.
1 S-^ 1
DO I I<^
1 I
o-j 1 I -^^I l
Cn, | _3 | |
^j. 1^- I !
_|7_ tr^c____i 1 l___
J- L 1 j- I 1
j l i>^-- ' '
4- -I
J^X^' '
E
i_*-*
o
CDQ.
CO
k_
CD
O
a.
16l_
<d>
O
LO
CVJ
CDi_
Zl
D)
U_
71
Freq Response Ch 2 : 1 Avg=50
LogMag
Functn Lin Hz g^arkerg RCLD 1.6k
Freq Response Ch 3 : 1 Avg=50
LogMag
0 Functn Lin Hz [^Markerg RCLD 1.6k
Freq Response Ch 4 : 1 Avg=50
LogMag
Functn Lin Hz [^Vlarker[g RCLD 1.6k
Figure 26: Frequency Response Spectra For Beam
72
natural frequencies appear as peaks. The greatest changes occur at
accelerometer position 2, which is the end of the beam. This is due to the lack
of constraints. This channel will be focused on for further analysis. The gain,
phase, and coherence are all examined (See Figure 27 a,b, and c). The
coherence from 300 to 1600 Hz is near unity, indicating a near ideal system
analysis. Data below this and at the identified resonances requires further
investigation. Between 0-30 Hz, the gain is at a minimum. System limitation is
one reason for this. Examining the gain and coherence leads to identification of
random and bias errors. Both graphs are at a minimum in the analyzed data,
suggesting that there is extraneous noise at the output. From 30-200 Hz,
coherence deviance from 1 could be attributed to noise at the input. This is
suspected, since the gain is not near a minimum. At the beam natural
frequencies, the coherence dips from unity corresponding to sharp peaks in the
gain. This is attributed to the signal to noise ratio being the highest at these
points. The phase plot also aids in the identification of the beam system
response. Phase shifts of 1 80 degrees are noted at the natural frequencies.
The above analysis was repeated to distinguish bias errors from possible
system nonlinearities. Measurements were obtained with finer spectral
resolution, Be = 2 Hz (Figures 28 a, b, and c) and Be = 1 Hz (Figures 29 a, b,
and c). The coherence should increase as spectral resolution becomes finer.
The coherence at 1356 is greatly reduced as resolution is increased, indicating
nonlinearities.
73
Freq Response Ch 2 : 1 Avg=S0
360
Phase
Deg
Functn Lin Hz [^rtarkerg RCLD
Freq Response Ch 2 : 1 Avg=50
Mag
1.6k
\ ! ! i I I ! iV_L_IlL__i i i I I
\i Ip::^TS
j j | jI
\ i i i ~i l l i0 Functn Lin Hz g^arkerg RCLD 1.6k
Coherence Ch 2 : 1 Avg=50
Functn Lin Hz gJMarkerg RCLD 1.6k
Figure 27: Frequency Response for Position 2
400 Line Resolution, Be = 4 Hz
a.) gain
b.) phase
c.) coherence
74
Freq Response Ch 2 : 1 Avg=40
360
Phase
Functn Lin Hz g)arker[g RCLD
Freq Response Ch 2 : 1 Avg=40
1.6k
Deg
0 Functn Lin Hz g^arkerg RCLD 1.6k
Coherence Ch 2 : 1 Avg=40
MagFjfH*
W 1 ! CL-,"*
"T
Functn Lin Hz [^larkerg RCLD 1.6k
Figure 28: Frequency Response for Position 2
800 Line Resolution, Be = 2 Hz
a.) gain
b.) phase
c.) coherence
75
Freq Response Ch 2 : 1 Avg=20
LogMag
2m
360
Functn Lin Hz [^ilarkerg RCLD
Freq Response Ch 2 : 1 Avg=20
1.6k
0 Functn Lin Hz g^flarker[g RCLD
Coherence Ch 2 : 1 Avg=20
1.6k
Mag
M^^VM
Functn Lin Hz Qiflarkerfg RCLD 1.6k
Figure 29: Frequency Response for Position 2
1600 Line Resolution, Be = 1 Hz
a.) gain
b.) phase
c.) coherence
76
7.4 Mode Shapes
Once the data has been deemed viable, it can be used to determine the
dynamics of the unit under investigation. Two type of analysis were performed
with the tape recorded data, time domain, and frequency domain. Time domain
analysis indicates how the beam deflects under excitation. The accelerometer
responses are used in Vibrant Technology's ME Scope to identify beam
dynamics in the time domain (See Figure 30) This shows how several modes
are excited simultaneously; their interactions can be identified.
Frequency domain analysis allows for the identifications of natural
frequencies of the beam. Aligning the frequency response of the beam at the
four analyzed locations with ME Scope, the dynamics of the beam are identified
at 36, 240, 680, and 1356 Hz (See Figures 31,32,33, and 34).
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77
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78
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79
8.0 Conclusions
Data from the experimental analysis are used to complement and finalize
theoretical data. The data is then compared, and discrepancies explored.
General guidelines extracted from this analysis are then summarized.
8.1 Theoretical Analysis Application
Material properties of the aluminum test beam are used in the theoretical
analysis. The following values are used:
[i := 63.41-io~6lb-secA2/inA2
E := io- io6
psi
I := 3.255- io"4 inA4
c := 1.602-io~3
lb-sec/inA2
L := 9.5in
Theoretical results and experiment results for natural frequency are presented
in Table 4.
Table 4: Comparison of Natural Frequencies
Natural Frequencies Analytical Results(Hz) Experimental Results(Hz) % Difference
1
2
3
4
5
6
The analytical results were derived without damping considerations, so values
80
44.475 36 19
277.966 240 13.66
779.569 680 12.77
1528 1356 11.26
2525
3772
for experimental data are lower. The first natural frequency has the greatest
error at 19 %. This is due to the difficulty of the system to control at such a low
frequency, noted by the large peak in the power spectra graphs on channel 1.
All other differences are less than 14 % which is within the random error
percentage calculated. Theoretical values are calculated beyond the
experimental results. The frequency analysis range was limited to 1600 Hz.
Mode shapes five and six are useful in determining how the structure behaves
at higher frequencies where testing was not recorded. Many situations occur in
which measurement of high frequency data is impossible due to test system
limitations, so the results of lower frequency analysis are used to confirm the
model and aid credibility of high frequency analysis. If a -14 % error is allowed
predicted from the trend of the first four mode shapes for the experimental
natural frequencies, then the fifth mode would occur in the 2171-2525 Hz
frequency range, and for the sixth mode a range of 3244-3772 Hz range.
The mode shape results are similar for the exact solutions and
experimental results, displaying the same general form, except for mode 4
(compare Figure 1 5 results to 31,1 6 to 32, 1 7 to 33, and Figure 1 8 to 34). This
can be attributed to the crude model of the beam used being insufficient to
model the mode deflection. There is also indication that the mode exhibits
nonlinear characteristics which influences the differences. More resolution of
the structure is possible with the theoretical exact solution, since transducer size
and limitation do not plague analytical analysis.
The frequency response of the system is determined for mode 1 using 1,
2, and 6 function assumed mode methods (See Figure 35 for calculation of 1
81
function, 36 for two function, and 37 for 6 function).
i--f^[n:=63.4iio~6
c:=1.602-10~3
z:=o,-..i
fiLj:= 1.875 co
t:= 279.445 kj:= 4.9402 Q j
:=.782989
i]> !(z) :=(cosh(PL1z)-cos(pL1z))- ( sinh( pL j-z)-
sin( pL j-z) )
Hjdo ) :=
CO - CO
co ~-q!(z)-
V i(z)
|*-Q
0 0
0.333 0.331
0.667 1.094
1 2
(-ton+iwc+kj)
H^co)
+ 1
1
0.927 - 2.865i
0.758 - 9.467i
0.557 - 17.309i
Figure 35: One Function Approximation for Mode 1
PL2:= 4.694 co 2
:= 1746.512 k2:= 194.0285 Q 2
:=.433931
o|>2(z):=(cosh(PL2z)- cos(PL2z))- 1.018467-
( sinh( PL 2z)-
sin(PL2z))
-co 2-o^ jCz)^-!*^!) -co2-il)2(z)(-nQ2)
H2(co ) :=i + -7j \+T2 V
I _co |i + i(o -c+k J I ~co -ji + ico c+ k 2)
1>l(z) ,>l'2(z)
0 0
0.333 0.331
0.667 1.094
1 2
0
1.179
0.845
-2
H2(co )
1
0.94- 2.865i
0.767 - - 9.467i
0.534 - -
17.308i
Note: This approximation uses values presented in single function
approximation.
Figure 36 Two Function Approximation for Mode 1
82
PL3:= 7.855 co 3
:= 14898.176 k3:= 1521.2379 Q3
:=.254435
PL4:= 10.996 co 4:= 9600 k4
:= 5841.3942 Q4:=. 181906
PL5
= 14.137 co 5:= 15865.043 k
5:= 15962.7052 Q5'=
.141471
PL6:= 17.279 co 6
:= 23700.175 kg:= 35620.5672 Q g
:=.1 15749
oj) 3( z):=
cosh( PL3-
z)-
cos( PL3-
z)-
( sinh( PL 3z)-
sin( PL3-
z) )
r|> 4(z) :=(cosh(PL4-z)-
cos(PL4z))-
(sinh(PL4-z)-
sin(PL4z))
t}> 5( z):=
( cosh( PL5-
z)-
cos( PL5-
z) )-
( sinh( PL5-
z)-
sin( PL5-
z) )
\|> 6( z):= ( cosh( PL
6-
z)-
cos( PLg-
z) )-
( sinh( PLg-
z)-
sin( PLg-
z) )
Ha^co) :=
Ha 2(co ) '=
Ha3( co ) :=
-co -Tj) i(z)-("n-Q1)
("co2n + icoc+ k,)
-co -il)2(z)-(-tx-Q2)
+ icoc+ k2)("%
-co Tl3(z)-(-n-Q3)
("co n + icoc+ k3J
Ha4(co) :-
Ha5(co) =
Ha6(co) :=
-co -aJ>4(z)-(-(i-Q4)
("co \i + icoc+ k4J
-co -^5(z)(-liQ5)
^-co2li + icoc+ k
-ip6(z)-(-ti-Q6)
(~co2|i + icoc+ k,
H6(oo):=l + Ha1(co) + Ha2(co) + Ha3(co)-I-Ha4(co)-I-Ha5(co)-|-Ha6(co)
z i|>i(z) n2(z) ^3(z) ^4(z) ^5(z) ^6(z) Hg(co)
0 0 0
0.333 0.331 1.179
0.667 1.094 0.845
1 2 -2
0 0
1.439 0.391
-1.361 0.367
1.001 -1
0 0
-0.991-
1.363
1-
1.366
1 -1
1
0.941 - 2.865i
0.766 - 9.467i
0.535 -
17.308i
Note: This approximation utilizes values presented in the one and two function
approximations.
Figure 37: Six Function Approximation of Mode 1
Similarly, results can be approximated for modes 2-6, See Tables 5-9
83
Table 5: Frequency Response Estimates for Mode 2
Utilizing 1, 2, and 6 Function Approximations
CO .- CO
Hjdo)
0
0.333
0.667
1
0.734-0.004i
0.121 0.013i
-0.607--
0.024i
H2(co)
1
8.082 - 33.78i
5.39-24.23i
-
13.068 + 57.254i
H6(co)
1
8.136- 33 .78i
5.343 - 24.23i
13.036 + 57.254i
Table 6: Frequency Response Estimates for Mode 3
Utilizing 1, 2, and 6 Function Approximations
CO --co 3
H^co)
0
0.333
0.667
H2(co)
1 1
0.741-4.399i-10~4
0.222- O.OOli
0.143-O.OOli
-
0.229 - 0.002i
-0.566- 0.003i0.313 - O.OOli
H6(co)
1
-1.458+ 0.01 li
0.996 - 0.015i
1.317 0.014i
Table 7: Frequency Response Estimates for Mode 4
Utilizing 1, 2, and 6 Function Approximations
CO --co 4
H^co) H2(co)
0
0.333
0.667
1 1
0.7410.211 -0.002i
-0.237- 0.003i0.143 -0.002i
0.33 - 0.002i-0.567- 0.004i
H6(co)
1
-4.634- 26.379i
-3.692- 24.735i
10.877 + 67.406i
84
Table 8: Frequency Response Estimates for Mode 5
Utilizing 1, 2, and 6 Function Approximations
CO - CO
0
0.333
0.667
1
5
H^co)
1
0.741 - 4.13i- 4
0.143- O.OOli
-0.566- 0.002i
H2(co)
1
0.223 - O.OOli
"0.228-- 0.002i
0.312--O.OOli
H6(co)
1
-8.777 +87.234i
8.354- 88.05i
8.653- 88.018i
Table 9: Frequency Response Estimates for Mode 6
Utilizing 1, 2, and 6 Function Approximations
co .-co 6
z
0
0.333
0.667
1
H^co) H2(co) Hg(to)
1 1 1
0.741- 2.764i-
10~4
0.226-
12.67 + 146.886i
-
12.913 + 147.234i0.143-9.132M0"4
-0.225- O.OOli
-9.307+ 107.805i
0.306 - 7.345i-10_4
-0.566 -0.002i
Values for the Frequency Response Function are in Table 10.
Table 10: Frequency Response Gains From Experimentation.
Location
Freq(Hz) 0.333 0.666 1
36 -0.301-.252i -0.508-.399i -0.736-.577i
240 -.933-6.07i -0.985-3.59i 1.407+8.91 01 i
680 -4.41-13. 5i -2.07+1 2. 59i 5.28-1 5.43i
1356 -0.262-.747i .444-5. 5i -10+1 9.81 i
The values are noted at peaks of the imaginary axis. This typically identifies
85
resonances, while the real portion should cross zero. The values do not match
the theoretical values. This is due to several inefficiencies in the calculation,
such as calculation of damping, resolution problems, approximation for
modeling, and other errors noted in chapter 7 . Damping is assumed to be
uniform in the model, when in fact it is not. Varying constraints on the beam
( cantilever being fixed at one end, and free at the other ) alter the damping
along the beam. Damping was calculated for the first natural frequency of the
beam, and assumed to be the same for all modes. Damping varies for each
mode; the damping constant assumed introduced error in the calculations. The
first natural frequency greatly influences the logarithmic decrement, and
analyzer limitations prevent a high enough frequency resolution to calculate
the higher mode damping. The approximation used to model the beam is
simple, with few terms, more sophisticated methods would produce more
accurate results. The technique is viable; it consists of superposing the
modes and base excitation to predict mode shapes. At natural frequencies the
output is high resulting in the mode shape being heavily influenced by the
corresponding natural frequency mode shape, all other shapes are a forced
vibration and typically would not have a great influence. The greater the
number of functions, the better the prediction, as shown in Figure 38. Figure 38
displays the frequency response function versus frequency for one, two, and six
function approximations for the first mode (compare to experimental results in
Figures 27, 28, and 29). For the frequency range displayed, the greater the
number of functions, the truer the frequency response.
The weakest portion of the calculation is the damping estimate. As stated
previously, damping is difficult to estimate and obtain good results. If the
damping is increased ten times, the frequency response more closely
86
approaches the experimental data as shown in Table 1 1 . One hundred time
multiplication of the damping constant improves results shown in Table 12.
|Hi(ip -
|H2(co)|
100
8000 1'10
100
|H6(a.)
2000 4000 6000 80001'104
CD
Figure 38: Frequency Response Function for Approximation
of Mode One at position 2
87
Table 1 1 : Frequency Response of First Mode Approximation with Six Functions
at Ten times the Damping Constant
z h 6( co )
0.333
0.667
1
1
1.014- 0.287i
1.006 - 0.948i
0.974- 1.73 li
Table 12: Frequency Response of First Mode Approximation with Six Functions
at One Hundred times the Damping Constant
z H6(co)
0.333
0.667
1
1
1.014- 0.032i
1.008-0.097i
0.979 - 0.168i
When using random vibration signals, precise values are important, but
indicate trends. The mode shape results are often the goal of the analysis. The
mode shapes of the bar are presented in Figure 39. These are a crude
approximation of the theoretical results due to the small number of transducers
used.
8.2 Conclusions and Recommendations
Random vibration signal analysis is a powerful tool for structural
dynamics analysis. Dynamics of structures can quickly and efficiently be
characterized through its use. Care must be taken to insure this type of analysis
is performed with viable data, since the random nature makes it difficult to
recognize errors.
To minimize errors, the following guidelines should be observed:
88
1. Have a general knowledge of the structure before proceeding with
experimentation. This will aid in the placement of transducers and help
distinguish between good and bad data.
CO - CO
CO .-co
H6() H6(<) 0 -
CO - CO CO .- CO
H6(co)
-10
20
Figure 39: Mode Shape Results Using the Six Function Approximation
2. Understand measurement equipment and limitations. Random signal
analysis noise is prevalent in any measurement, and must be examined to
make sound engineering judgment on data.
3. Maximize analysis parameters whenever feasible. Better frequency
resolution or averaging can exponentially improve data, but not without the
89
sacrifice of another parameter. Weight the results of each.
4. Always examine coherence and phase as well as gain in any
frequency response measurement. Trends in this data can indicate errors and
reveal necessary action to improve measurements.
Future studies should be performed to determine better estimates of the
damping. Filtering techniques can be investigated to limit the signal analysis
band and damping experimentation performed to improve the model. More
analysis can be performed changing the frequency span to obtain estimates of
the model at higher frequencies. The same analysis can be performed using
transient excitation instead of random and the results compared to determine
advantages and disadvantages of each technique. Other modeling techniques
can be used to enhance the model such as Galerkin approximation or finite
difference techniques.
90
References
1. Bendat, Julius S. and Allen G. Piersol., Engineering Applications of
Correlation and Spectral Analysis. New York: John Wiley and
Sons, 1980.
2. Bendat, Julius S. and Allen Piersol.,Random Data
,2nd edition,
New York: John Wiley and Sons, 1986.
3. Burden, Richard L. and J. Douglas Faires, Numerical Analysis, 4th ed.,
Boston: PWS-Kent Publishing Company, 1989.
4. Freund, John E.,Modern Elementary Statistics, 7th ed. New Jersey,
Prentice-Hall, 1988.
5. Harris,Cyril M. and Charles C. Crede, Shock and Vibration
Handbook, New York: McGraw-Hill Book Company, 1961.
6. Meirovitch, Leonard, Elements of Vibration Analysis, New York:
McGraw-Hill Book Company, 1986.
7. Newland, D. E., An Introduction to Random Vibration and Spectral
Analysis, Longman Group Ltd., London, 1975.
8. Randall, R. B. and B. Tech, Freouencv Analysis, Bruel and Kjaer,
Denmark, 1987
9. Thomson, William T., Theory of Vibration with Applications, 3rd ed.,
New Jersey, Prentice Hall, 1988.
10. Wylie, C. Ray and Louis C. Barrett, Advanced Engineering
Mathematics, McGraw-Hill Book Company, New York, 1982.
91