ctk co., ltd. · pdf filectk co., ltd. 386-1, ho-dong, cheoin-gu, yongin-si, gyeonggi-do,...

CTK Co., Ltd. 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea

Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com

Test Report No.: CTK-2013-01069 Date: 2013-07-02

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This Report shall not be reproduced except in full without the written approval of CTK Form No.: CTK-RF-EC-EN61000-6-2 & EN61000-6-4 (Rev.13.7)

EMC TEST REPORT For CE Test Report No. : CTK-2013-01069 Date of Issue : 2013-07-02 Kind of Product : FnIO S-Series Basic Model/Type No. : NA-9211, ST-5725, ST-5726 Variant Model/Type No. : NA-9212 Applicant : CREVIS CO., LTD.

Applicant Address : D-11F, Digital Empire BDG, 980-3, Youngtong-Dong, Youngtong-Gu, Suwon-City, Kyunggi-Do, Korea

Manufacturer : CREVIS CO., LTD. Manufacturer Address : D-11F, Digital Empire BDG, 980-3, Youngtong-Dong,

Youngtong-Gu, Suwon-City, Kyunggi-Do, Korea Contact Person : SUN HO, JIN / Research Engineer Telephone : +82-31-273-6455 Received Date : 2013-05-02 Test period : Start : 2013-05-20 End : 2013-06-04 Test Results : In Compliance Not in Compliance The test results presented in this report relate only to the object tested. Tested by Reviewed by

Sang-Yun Kim EMC Test Engineer

Young-Kug Song EMC Technical Manager

Date: 2013-07-02 Date: 2013-07-02




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REPORT REVISION HISTORY

Date Revision Page No 2013-07-02 Issued (CTK-2013-01069) All

This report shall not be reproduced except in full, without the written approval of CTK Co., Ltd. This document may be altered or revised by CTK Co., Ltd. personnel only, and shall be noted in the revision section of the document. Any alteration of this document not carried out by CTK Co., Ltd. will constitute fraud and shall nullify the document.




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TABLE OF CONTENTS REPORT REVISION HISTORY .......................................................................................... 2 1.0 General Product Description ............................................................................... 4 1.1 Model Differences ............................................................................................. 5 1.2 Device Modifications ......................................................................................... 5 1.3 EUT Configuration(s) ......................................................................................... 6 1.4 Test Software ................................................................................................... 6 1.5 EUT Operating Mode(s) ..................................................................................... 6 1.6 Configuration ................................................................................................... 7 1.7 Calibration Details of Equipment Used for Measurement ......................................... 8 1.8 Test Facility...................................................................................................... 8 1.9 Laboratory Accreditations and Listings ................................................................. 8 1.10 Measurement Uncertainty .................................................................................. 8 2.0 EMC Test Regulations/Standards ......................................................................... 9 2.1 Performance Criteria (PC) ................................................................................ 10 3.0 Results of Individual Test ................................................................................. 11 3.1 Conducted Voltage Emissions of Mains ports ....................................................... 11 3.2 Conducted Voltage Emissions of Telecommunication Ports ..................................... 13 3.3 Radiated Electric Field Emissions (Below 1 ) .................................................... 15 3.4 Radiated Electric Field Emissions (Above 1 ) .................................................... 17 3.5 Harmonic Current Emissions ............................................................................ 18 3.6 Voltage Fluctuations and Flicker ........................................................................ 19 3.7 Electrostatic Discharge .................................................................................... 20 3.8 Radiated Electric Field Immunity ....................................................................... 23 3.9 Electrical Fast Transients/Bursts ........................................................................ 26 3.10 Surge Transients ............................................................................................ 28 3.11 Conducted Disturbance .................................................................................... 30 3.12 Power Frequency Magnetic Field Immunity ......................................................... 32 3.13 Voltage Dips and Short Interrupts ..................................................................... 34 APPENDIX A - Test Setup Photos and Configuration ......................................................... 36

Conducted Voltage Emissions of Mains Ports ............................................................. 37 Conducted Voltage Emissions of Telecommunication Ports ........................................... 38 Radiated Electric Field Emissions (Below 1 ) .......................................................... 39 Radiated Electric Field Emissions (Above 1 ) .......................................................... 40 Harmonic Current Emissions and Voltage Fluctuations and Flicker ................................ 41 Electrostatic Discharge .......................................................................................... 42 Radiated Electric Field Immunity ............................................................................. 43 Electrical Fast Transients/Bursts .............................................................................. 44 Surge Transients ................................................................................................... 45 Conducted Disturbance .......................................................................................... 46 Power Frequency Magnetic Field Immunity ............................................................... 47 Voltage Dips, Short Interrupts and Voltage Variations ................................................ 48

APPENDIX B – EUT Photographs ................................................................................... 49 Test Configuration Photographs ............................................................................... 50 NA-9211 .............................................................................................................. 51 NA-9212 .............................................................................................................. 55 ST-5725 .............................................................................................................. 59 ST-5726 .............................................................................................................. 62




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1.0 General Product Description

No. ITEM APPLICATION

1 Kind of Product FnIO S-Series

2 Basic Model/Type No. NA-9211, ST-5725, ST-5726

3 Variant Model/Type No. NA-9212

4 Dimensions ()

NA-9211 27.2 (W) x 99.0 (L) x 70.0 (H)

NA-9212 27.2 (W) x 99.0 (L) x 70.0 (H)

ST-5725 12.0 (W) x 99.0 (L) x 70.0 (H)

ST-5726 27.2 (W) x 99.0 (L) x 70.0 (H)

5 Mobility Table-top Floor-standing

Built-in Portable

6 Maximum Clock Frequency 70

7 Electrical Ratings

Input:

NA-9211 System : 24 Vdc, 1.5 A Field : 24 Vdc

NA-9212 System : 24 Vdc, 1.5 A Field : 24 Vdc

ST-5725 5 Vdc, 0.18 A

ST-5726 5 Vdc 0.1 A

Output:

NA-9211 5 Vdc, 1.5 A

NA-9212 5 Vdc, 1.5 A

ST-5725 -

ST-5726 -

8 Test Voltage / Frequency Voltage: 24 Vdc

Frequency: -




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1.1 Model Differences

Model Temp Controller Support NA-9211 Not supported NA-9212 Supported

NA-9211 and NA-9212 are no technical difference from except

1.2 Device Modifications The following modifications were necessary for compliance:

Not applicable




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1.3 EUT Configuration(s) See Appendix A for individual test set-up configuration(s). The following peripheral devices and/or interface cables were connected during the measurement:

Peripheral Devices

Device Model No. Serial No. Manufacturer LCD Monitor GH19PS N794HVCPB1937M SAMSUNG ELECTRONICS Personal Computer - - - Keyboard 6310U - BTC Technology Mouse M-M7URPN 1Z037023 ELECOM FnIO S-Series ST-1218 - CREVIS CO., LTD. FnIO S-Series ST-2328 - CREVIS CO., LTD.

Cable Description

No.

From To Type of Cable

Device I/O Port Device I/O Port Length

(m)

Shielded or

Unshielded

Ferrite Core [Y/N]

1 EUT(NA-9211) System Power DC Power Supply1 (Outside of Test site) DC Output 2.0 U N 2 Field Power DC Power Supply2 (Outside of Test site) DC Output 2.0 U N 3 I/0 Personal Computer I/0 3.0 U N 4 EUT(ST-5726) System Power DC Power Supply2 (Outside of Test site) DC Output 2.0 U N 5 Field Power DC Power Supply2 (Outside of Test site) DC Output 2.0 U N 6 I/O EUT(ST-5725) I/0 3.0 U N 7 FnIO S-Series I/O FnIO S-Series I/O 0.1 U N 8 FnIO S-Series I/O FnIO S-Series I/O 0.1 U N 9 Aluminum Plate FG Line - GND - 2.0 S N 10 Personal Computer USB Keyboard - 2.0 S N 11 USB Mouse - 2.0 S N 12 D-SUB LCD Monitor D-SUB 2.0 S Y 13 AC Power AC Mains - 1.8 U N 14 LCD Monitor AC Power AC Mains - 1.8 U N

* Shielded or Unshielded : Unshielded=U, Shielded=S

1.4 Test Software Manual IO Test, RTD TC Test

Display Test Patterns – V1.5 Ping.exe Not applicable

1.5 EUT Operating Mode(s) Equipment under test was operated during the measurement under the following conditions:

Practice operation – Data Communication




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1.6 Configuration

Aluminum plate

Outside of Test site

AC Mains

Personal Computer

LCD

Monitor

Keyboard

Mouse

EUT (NA-9211)

EUT (ST-5725)

1

2 5

3

ST-2318

ST-1218

ST-1218

ST-2318

7

EUT (ST-5726)

4

6 8

DC Power Supply 1 (Outside of Test site)

DC Power Supply 2 (Outside of Test site)

Outside of Test site

9

12

10

11

13 14




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1.7 Calibration Details of Equipment Used for Measurement Test equipment and test accessories are calibrated on regular basis. The maximum time between calibrations is one year or what is recommended by the manufacturer, whichever is less. All test equipment calibrations are traceable to the Korea Research Institute of Standards and Science (KRISS), therefore, all test data recorded in this report is traceable to KRISS.

1.8 Test Facility The measurement facility is located at 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea. The sites are constructed in conformance with the requirements of ANSI C63.7, ANSI C63.4 and CISPR Publication 22.

1.9 Laboratory Accreditations and Listings

Country Agency Scope of Accreditation Logo USA FCC 3 m & 10 m SAC and Conducted Test Site to

perform FCC Part 15/18 measurements

805871

JAPAN VCCI 3 m & 10 m SAC and Conducted Test Site

C-986, T-1843, R-3627, G-387

KOREA KCC EMI (3 m & 10 m SAC and Conducted Test Site) EMS (ESD, RS, EFT/Burst, Surge, CS, Magnetic, Dips and Interruptions)

No. 51, KR0025

1.10 Measurement Uncertainty Compliance of the product is based on the measured value. However, the measurement uncertainty is included for information purposes. The measurement uncertainties given below are based on a standard uncertainty multiplied by a coverage factor of k=2, providing a level of confidence of approximately 95 %.

Measurement Type Frequency Range Expanded Uncertainty

Conducted Emission 150 to 30 ± 2.42 (C.L.: Approx. 95 %, k=2)Radiated Emission 30 to 1000 ± 3.62 (C.L.: Approx. 95 %, k=2)




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2.0 EMC Test Regulations/Standards The tests were performed according to following regulations: EMC – Directive 2004/108/EC [Emission Test Regulations/Standards]

Applied standard Title Applied Test Result

EN 61000-6-4:2007 +A1:2011

Conducted Voltage Emissions MET NOT MET

Radiated Electric Field Emissions MET NOT MET

EN 61000-3-2:2006 +A1:2009 +A2:2009

Harmonic Current Emissions MET NOT MET

EN 61000-3-3:2008 Voltage Fluctuations and Flicker MET NOT MET

[Immunity Test Regulations/Standards]

Applied standard Title Applied Test Result

EN 61000-6-2:2005

EN 61000-4-2:2009 Electrostatic Discharge MET NOT MET

EN 61000-4-3:2006 +A1:2008 +A2:2010

Radiated Electric Field Immunity MET NOT MET

EN 61000-4-4:2004 +A1:2010

Electrical Fast Transients/Bursts MET NOT MET

EN 61000-4-5:2006 Surge Transients MET NOT MET

EN 61000-4-6:2009 Conducted Disturbance MET NOT MET

EN 61000-4-8:2010 Power Frequency Magnetic Field

Immunity MET NOT MET

EN 61000-4-11:2004 Voltage Dips and Short Interrupts MET NOT MET




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2.1 Performance Criteria (PC) The performance criteria was based on the following guidelines:

Performance criterion A: The apparatus shall continue to operate as intended during and after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. The performance level may be replaced by a permissible loss of performance. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, either of these may be derived from the product description and documentation and what the user may reasonably expect from the apparatus if used as intended. Performance criterion B: The apparatus shall continue to operate as intended during and after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. The performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed. No change of actual operating state or stored data is allowed. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, either of these may be derived from the product description and documentation and what the user may reasonably expect from the apparatus if used as intended. Performance criterion C: Temporary loss of function is allowed, provided the function is self-recoverable, or can be restored by the operation of the controls.




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3.0 Results of Individual Test

3.1 Conducted Voltage Emissions of Mains ports Test Date Not applicable Test Location Shielded Room Test Equipment

Name of Equipment Model No. Manufacturer Serial No. Due Date Applied

EMI Test Receiver ESCI7 Rohde & Schwarz 100816 2013-12-14 LISN ENV216 Rohde & Schwarz 101235 2013-08-06 LISN ENV216 Rohde & Schwarz 101236 2013-08-06

EMI Test Receiver ESCI3 Rohde & Schwarz 100032 2014-02-04 LISN ENV216 Rohde & Schwarz 101151 2013-11-09 LISN ESH3-Z5 Rohde & Schwarz 100207 2013-11-09

EMI Test Receiver ESHS30 Rohde & Schwarz 862024/001 2014-02-05 LISN ENV216 Rohde & Schwarz 101150 2014-02-04 LISN 3825/2 EMCO 9607-2575 2013-07-17

Test Software

ESCI7, ESCI3 : EMC32 Ver. 8.50.0 ESHS30 : ESxS-K1 ver. 2.12

Frequency Range of Measurement

150 to 30 Instrument Setting IF Band Width: 9

Climate Condition Temperature:

Relative Humidity: Atmospheric Pressure: Test Result

The requirements are: MET NOT MET

Frequency ()

Measured Data (µV)

Margin () Remark

The Result is calculated by using the following formula;

* Result = Limit – Margin (Result included the correction factor)

* Correction factor = Cable Loss + Insertion loss of LISN




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Test Data




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3.2 Conducted Voltage Emissions of Telecommunication Ports

Test Date Not applicable Test Location Shielded Room Test Equipment

Name of Equipment Model No. Manufacturer Serial No. Due Date Applied EMI Test Receiver ESCI7 Rohde & Schwarz 100816 2013-12-14

ISN ISN T8 TESEQ GMBH 25191 2013-11-14 ISN ENY81-CA6 Rohde & Schwarz 101553 2013-11-09 ISN ISN ST08 TESEQ GMBH 33997 2013-08-09 LISN ENV216 Rohde & Schwarz 101235 2013-08-06 LISN ENV216 Rohde & Schwarz 101236 2013-08-06

Test Software

EMC32 Ver. 8.50.0 Frequency Range of Measurement

150 to 30 Instrument Setting IF Band Width: 9


Relative Humidity: Atmospheric Pressure: Test Result


Tested Ports Frequency

() Measured Data

(µV) Margin

() Remark


* Result = Limit – Margin (Result included the correction factor)

* Correction factor = Cable Loss + Insertion loss of ISN




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Test Data




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3.3 Radiated Electric Field Emissions (Below 1 ) Test Date 2013-05-20 Test Location 10 m SAC (test distance : 10 m) Test Equipment

Name of Equipment Model No. Manufacturer Serial No. Due Date Applied EMI Test Receiver ESCI7 Rohde & Schwarz 100814 2013-12-14

Trilog Broadband Antenna VULB 9161 SE SCHWARZBECK 9161-4133 2014-06-11 6dB Attenuator DNF Rohde & Schwarz 272.4110.50 2013-11-09

Amplifier 310 Sonoma Instrument Co. 291721 2014-03-21

Test Software TOYO EMI software Ver. 5.1.0 Frequency Range of Measurement 30 to 1 Instrument Setting IF Band Width: 120

Climate Condition Temperature: (20 ± 1)

Relative Humidity: (46 ± 1) % Atmospheric Pressure: 99 Test Result The requirements are: MET NOT MET

Frequency ()

Measured Data (µV/m)

Margin () Remark

300.024 42.4 4.6 Quasi-peak


* Result = Reading + Correction factor

* Correction factor = Antenna Factor + Cable Loss + 6 attenuator – Amp Gain




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Test Data




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3.4 Radiated Electric Field Emissions (Above 1 ) Test Date Not Applicable Test Location 3 m SAC Test Equipment


EMI Test Receiver ESU40 Rohde & Schwarz 100336 2014-06-27 Double Ridged Guide Antenna 3115 ETS-Lindgren 78895 2015-02-28

Preamplifier 8449B Agilent Technologies 3008A02307 2013-11-09

Test Software TOYO EMI software Ver. 5.1.0 Frequency Range of Measurement 1 to 6 Instrument Setting IF Band Width: 1


Relative Humidity: Atmospheric Pressure: Test Result The requirements are: MET NOT MET

Frequency ()

Measured Data (/m)

Margin () Remark


* Result = Reading + Correction factor

* Correction factor = Antenna Factor + Cable Loss– Amp Gain

Test Data




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3.5 Harmonic Current Emissions Test Date Not Applicable

Test Location Shielded Room

Test Equipment

Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Universal Power Analyzer PM6000 Voltech 200006700362 2013-07-07

AC Power Source NSG1007-3-240 Schaffner 54350 2014-06-13

Test Software Voltech IEC 61000-3 Windows Software 1.14.06RC1


Relative Humidity: Atmospheric Pressure: Classification of Equipment for Harmonic Current Emissions Class A Class B Class C Class D Test Results The requirements are:

MET MET (Because the EUT power is less than 75 W, limits are not specified.) NOT MET NOT APPLICABLE Test Data




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3.6 Voltage Fluctuations and Flicker Test Date Not Applicable

Test Location Shielded Room

Test Equipment

Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Universal Power Analyzer PM6000 Voltech 200006700362 2013-07-07

AC Power Source NSG1007-3-240 Schaffner 54350 2014-06-13

Test Software Voltech IEC 61000-3 Windows Software 1.14.06RC1


Relative Humidity: Atmospheric Pressure: Test Result The requirements are:

MET NOT MET Test Data




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3.7 Electrostatic Discharge

Reference Standard EN 61000-4-2:2009

Test Date 2013-05-20 Test Location

Shielded Room Test Equipment

Name of Equipment Model No. Manufacturer Serial No. Due Date Applied ESD Simulator ESS-2000 Noiseken 0199C02387 2014-04-02

ESD Gun TC-815R Noiseken ESS0898829 2014-04-02


Relative Humidity: (46 ± 1) % Atmospheric Pressure: 99 Test Specifications Discharge Factor: ≥ 1 s Discharge Impedance: 330 Ω / 150 Kind of Discharge: Air, Contact (direct and indirect) Polarity: Positive and Negative

Number of Discharges per location (each polarity): 10 for Air discharge

Required Performance Criteria: B

Discharge Voltage:

Direct discharge Indirect discharge

Contact Air HCP VCP

Test Voltage

± 4 ± 2 ± 4 ± 4 - ± 4 - - - ± 8 - -

Notes: HCP: Horizontal coupling plane VCP: Vertical coupling plane




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Location of Discharge:

Air

Contact

3 3

3

1

1 1

1

2

2

2

3




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Test Results


Test Method

No. Applied Point Discharge Method Performance

Result Comments

Indirect discharge

- HCP Contact

discharge

A -

VCP A -

Direct discharge

1 Insulating surfaces Air discharge A -

2 Apertures Air discharge A -

3 Port apparatus Air discharge A -

Remarks

No any function degraded during the test.

2

1

1

2




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3.8 Radiated Electric Field Immunity

Reference Standard EN 61000-4-3:2006 +A1:2008 +A2:2010

Test Date 2013-05-21 Test Location Fully anechoic chamber Test Equipment

Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Power Meter E4418B Agilent MY45104818 2014-03-21

Control Unit System Controller NA25MF1G2010 Noiseken A00148 N/A Power Sensor 8482A HP US37293310 2013-07-11

BAND 1 Power Amplifier NA25MF1G2010 Noiseken A00148 2014-03-21 BAND 2 Power Amplifier NA25MF1G2010 Noiseken A00148 2014-03-21 P.S. UNIT Power Supply NA25MF1G2010 Noiseken A00148 N/A

RF AMPLIFIER NA1GF3G50 Noiseken A70540 2014-03-21 Signal Generator SML03 Rohde & Schwarz 103171 2013-11-08

ULTRA Broadband Antenna HL562 Rohde & Schwarz 100203 N/A


Relative Humidity: (56 ± 1) % Atmospheric Pressure: 99 Test Specifications Antenna Polarization: Horizontal & Vertical unless indicated otherwise Antenna Distance: 3 m

Field Strength: 10 V/m Frequency Range: 80 to 1 , 1.4 to 2.0 , 2.0 to 2.7 Modulation: AM 80 %, 1 sine wave

Dwell Time: 3 s

Frequency step: 1 % step # of Sides Radiated: 4 6 Required Performance Criteria: A




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Test Results

The requirements are: MET NOT MET [AM, 80 %, 1 sine wave, 80 to 1 , 10 V/m]

Performance Result Side Exposed Horizontal Vertical

Front A A

Right A A

Back A A

Left A A

Top

Bottom

[AM, 80 %, 1 sine wave, 1.4 to 2 , 10 V/m]

Performance Result

Side Exposed Horizontal Vertical

Front A A

Right A A

Back A A

Left A A

Top

Bottom




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[AM, 80 %, 1 sine wave, 2 to 2.7 , 10 V/m]

Performance Result

Side Exposed Horizontal Vertical

Front A A

Right A A

Back A A

Left A A

Top

Bottom

Note: “Blank” = Not performed Remarks No any function degraded during the test.




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3.9 Electrical Fast Transients/Bursts

Reference Standard EN 61000-4-4:2004 +A1:2010

Test Date 2013-05-20 Test Location Shielded Room Test Equipment

Name of Equipment Model No. Manufacturer Serial No. Due Date Applied FAST Transient Burst Simulator FNS-AX3 B50B Noiseken FNS10Y0900 2014-06-10 Fast Transient Noise Simulator FNS-AX II Noiseken 7079B00212 2013-07-07 Capacitive Coupling Clamp 15-00001A Noiseken - 2013-11-12


Relative Humidity: (42 ± 1) % Atmospheric Pressure: 99 Test Specifications

Pulse Amplitude & Polarity:

Input/Output a.c. power ports ± 2.0 Input/Output d.c. power ports ± 2.0 Signal ports ± 1.0

Burst Period: 300 Repetition Rate: 5 Duration of Test Voltage: ≥ 1 min Required Performance Criteria: B




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Test Results


Input/Output a.c. power ports – Coupling/Decoupling Network used

Mode of Application Performance Result

(+) Burst () (-) Burst ()

Input/Output d.c. power ports – Coupling/Decoupling Network used



NA-9211 System power DC Input port A A

ST-5726 System power DC Input port A A

Signal ports– Coupling Clamp used



NA-9211 I/O port A A

ST-5725 I/O port A A

ST-5726 I/O port A A





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3.10 Surge Transients



Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Lightning Surge Simulator LSS-6030 Noiseken 0189E00251 2013-07-07 Lightning Surge Simulator LSS-15AX-C3A Noiseken LSS0780786 2014-02-04 Telecom Lines Injection Unit LSS-INJ6401TEL Noiseken LSS0961027 N/A Interconnection Line Unit LSS-INJ6400SIG Noiseken LSS0961028 N/A


Relative Humidity: (46 ± 1) % Atmospheric Pressure: 99 Test Specifications Input/Output a.c. power ports

Surge Amplitude: Common Mode (0.5, 1.0, 2.0)

Differential Mode (0.5, 1.0) Number of Surges: 5 surges per angle Angle: 0°, 90°, 180°, 270°

Polarity: Positive & Negative Required Performance Criteria: B Input/Output d.c. power ports Surge Amplitude: Common Mode

0.5 Number of Surges: 5 surges Polarity: Positive & Negative Repetition Rate: 1 surge per min Required Performance Criteria: B




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Signal ports

Surge Amplitude: Common Mode (0.5, 1.0)

Number of Surges: 5 Surges Polarity: Positive & Negative Repetition Rate: 1 Surge per min

Required Performance Criteria: B

Test Results


Input/Output a.c. power ports


(+) Surge () (-) Surge () 0.5 1.0 2.0 0.5 1.0 2.0

Input/Output d.c. power ports


(+) Surge () (-) Surge () 0.5 0.5

NA-9211 System power DC Input port A A

ST-5726 System power DC Input port A A

Signal ports


(+) Surge () (-) Surge () 0.5 0.5

ST-5725, ST-5726 I/O port A A





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3.11 Conducted Disturbance



Name of Equipment Model No. Manufacturer Serial No. Due Date Applied Power Meter E4419B HP GB39290775 2013-07-10

RF Power Amplifier CBA954815 Schaffner 1011 2013-07-09 Power Sensor E9304A Agilent MY41497499 2013-07-10

Signal Generator SML03 R o h d e & S c h w a r z 102254 2014-03-21 Attenuator 100-A-FFN-06 BIRD 9933 2013-07-10

CDN NCDN-M2-32A Noiseken 2001 2013-11-14 CDN NCDN-M3-32A Noiseken 2016 2013-11-14

RF-Synthesizer/Amplifier NSG2070-1 Schaffner 1068 2013-11-12 Attenuator INA2070-1 Schaffner 2068 2013-11-09

CDN NCDN-M2-16A FCC 091361 2013-07-16 CDN NCDN-M3-16A FCC 091362 2013-07-16 CDN NCDN-T2 Noiseken 2001 2013-11-14 CDN NCDN-T4 Noiseken 2002 2013-11-14 CDN NCDN-T8 Noiseken 2015 2013-11-14 CDN NCDN-C1-50-BNC Noiseken 2001 2013-11-14

EM Clamp NEM-23 Noiseken 540 2013-07-13 EM Clamp NEM-23 Noiseken 275 2013-11-28


Relative Humidity: (46 ± 1) % Atmospheric Pressure: 98 Test Specifications Frequency range: 150 to 80

Voltage Level: 10 V Modulation: AM, 80 %, 1 sine wave

Dwell Time: 3 s

Frequency step: 1 % step

Required Performance Criteria: A




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Test Results


Input/Output a.c. power ports

Coupling Location (Line Stressed) Coupling Method Performance Result

Input/Output d.c. power ports


NA-9211 System power DC Input port CDN (M2) A

ST-5726 System power DC Input port CDN (M2) A

Signal ports


NA-9211 I/0 port EM Clamp A

ST-5725 I/0 port EM Clamp A

ST-5726 I/0 port EM Clamp A





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3.12 Power Frequency Magnetic Field Immunity



Name of Equipment Model No. Manufacturer Serial No. Due Date Applied EMC Test Instrument BEST PLUS SCHAFFNER SC2697A012 2014-03-21

Induction Coil Package INA 702 SCHAFFNER 200012-003SC N/A


Relative Humidity: Atmospheric Pressure: Test Specifications Field Strength: 30 A/m Frequency: 50 , 60 Required Performance Criteria: A




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Test Results


Immersion method

Coil orientation Performance Result

X - axis

Y - axis

Z - axis

Proximity method

Coil orientation Performance Result

X - axis

Y - axis

Z - axis

Note: “blank” = Not performed

Remarks




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3.13 Voltage Dips and Short Interrupts




Power Quality Test System ProfLine 2103 SCHAFFNER 54350, 200048-202EK 2014-06-10


Relative Humidity: Atmospheric Pressure: Test Specifications Overshoot/undershoot of the actual voltage: Less than 5 % of TU

Voltage rise time and fall time: 1 – 5

Frequency of the test voltage: Within ± 2 %

Number of Applications: 3 Interval: 10 s Required Performance Criteria:

Test Specification Period Required Performance

Criteria 50 60

0 % TU 1 B

40 % TU 10 12 C

70 % TU 25 30 C

0 % TU 250 300 C




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Test Results


Test Specification Period

Result Comments

50 60

0 % TU 1

40 % TU 10 12

70 % TU 25 30

0 % TU 250 300

Remarks




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APPENDIX A - Test Setup Photos and Configuration




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Conducted Voltage Emissions of Mains Ports




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Conducted Voltage Emissions of Telecommunication Ports




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Radiated Electric Field Emissions (Below 1 )




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Radiated Electric Field Emissions (Above 1 )




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Harmonic Current Emissions and Voltage Fluctuations and Flicker




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Electrostatic Discharge




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Radiated Electric Field Immunity




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Electrical Fast Transients/Bursts




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Surge Transients




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Conducted Disturbance




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Power Frequency Magnetic Field Immunity




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Voltage Dips, Short Interrupts and Voltage Variations




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APPENDIX B – EUT Photographs




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Test Configuration Photographs




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NA-9211




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NA-9212




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ST-5725




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ctk co., ltd. · pdf filectk co., ltd. 386-1, ho-dong, cheoin-gu, yongin-si, gyeonggi-do,...

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