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Page 1: Analog and Telecommunication Electronics · 2016-04-16 · A/D converter architectures • Various types of ADC, which can be classified from: – Complexity » Number of comparators

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Politecnico di TorinoElectronic Eng. Master Degree

Analog and Telecommunication Electronics

D3 - A/D converters

» Error taxonomy» ADC parameters» Structures and taxonomy» Mixed converters

AY 2015-16

Page 2: Analog and Telecommunication Electronics · 2016-04-16 · A/D converter architectures • Various types of ADC, which can be classified from: – Complexity » Number of comparators

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Lesson D3: ADC taxonomy and errors

• Analog to Digital converters– Transfer function and error taxonomy

(linear, nonlinear, dynamic)– Converter parameters: complexity and speed

• Examples of A/D converters– Flash, Tracking, Successive approximation– Residue, subranging, folding, pipeline– Mixed architectures

• References:– Elettronica per Telecom.: 4.3 Convertitori analogico/digitale– Design with Op Amp …: 12.4 A/D Conversion Techniques– Design choices for ADC : course website

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Errors in A/D converters

• Dual transfer function vs D/A– X axis: analog values (continuous)– Y axis: numeric values (discrete)– Same approach to error taxonomy

• Each ADi interval corresponds to a Di value– “stair” transfer function– If N large looks as a continuous line

• Same error classification as D/A– Linear: offset and gain– Nonlinearity: differential and integral– Dynamic parameters

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Ideal A/D transfer function

0 S

01

M

2

D(digital)

A(analog)

1 LSB

AD ADi

Di

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ADC vs DAC transfer function

• DAC:– Discrete input D, discrete output A squence of dots

• ADC:– Continuos input A, discrete output D staircase

D

A

1 LSB

AD 0 1 2

D

A

1 LSB

AD

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Static errors: two-steps analysis

• Linear approximation of actual transfer function

• Actual transfer function vs linear approximation– Nonlinearity errors: integral nonlinearity

• Linear approximation vs ideal transfer function– Linear errors: offset and gain

• Detailed quantization interval analysis– Differential nonlinearity

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Actual vs ideal transfer function

0

0

Actual transfer function

S

A

M

ideal

D

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Best linear approximation

0

0

Actual transfer function

Best approx.straigth line

S

D

A

M

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Linear approx. vs ideal transf. function

0

0

Best approx.straigth line

S

D

A

M

idealG

O

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Integral nonlinearity error

0

0

Actual transfer function

Nonlinearityband

Best approx.straigth line

integralintegralnonlinearitynonlinearityerror error inlinl

S

D

A

M

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Complete view

0

0

Actual transfer function

Nonlinearityband

Best approx.straigth line

integralintegralnonlinearitynonlinearityerror error inlinl

S

D

A

M

ideal

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Linear and nonlinear errors

• Offset error– shift of the output

• Gain errors– rotation of the transfer function

• Both can be compensated with gain and offset corrections in the signal chain

• Integral nonlinearity error inl– Position dependent– Compensation possible (lookup table), but expensive

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0

AD

0 S

D

A

M

Ideal A/D transfer function

• Uniform quantization:– All quantization intervals AD have the same amplitude

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Differential nonlinearity error

• Actual quantization intervals: A’D ≠ AD

– Differential nonlinearity: DNL = AD - A’D

0

A’D

0 S

D

A

M

AD Actual transfer function

Ideal transfer function

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Missing code error

• Wide intervals reduce adjacent ones • Very wide intervals can suppress adjacent ones

– Missing code error high differential nonlin.: |DNL| > 1 LSB

00 S

D

A

M

A’D1

A’D2

This code isnever generated

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Integral and differential nonlinearity

• Integral nonlinearity INL– Unique figure: deviation of transfer function from a straight line

• Differential nonlinearity DNL– Difference AD - A’D between ideal (AD) and actual (A’D)

amplitude of each quantization interval– Specific to each interval (but has a max!)

• εINL = ∫(DNL) = ∑(DNL)

• εDNL = Der(INL)

– Fixed polarity εDNL high εINL

– Alternate polarity εDNL low εINL

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Dynamic parameters

• Conversion from A to D requires some time:conversion time Tc

• Can be specified also as

conversion frequency Fc = 1/Tc

• In most cases – The ADC receives a “Conversion Start” (CS) command – After Tc the ADC raises a “End Of Conversion” (EOC) flag.

• Some ADC can follow a (slowly) changing signal:– tracking converters– Dynamic behavior specified by max track rate (Slew Rate)

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ADC error summary

• Linear errors:

– Gain: G

– Offset: O

• Nonlinearity errors:

– Integral NL: inl

– Differential NL: dnl

• Dynamic parameters

– Conversion time: tC– Tracking rate: max(dV/dt)

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Lesson D3: A/D converters

• Analog to Digital converters– Error taxonomy (linear, nonlinear, dynamic)– Converter parameters: complexity and speed

• Examples of A/D converters– Flash, – Tracking– Successive approximation,

• Residue/subranging

• Pipeline structures

• Performance tradeoff

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A/D converter architectures

• Various types of ADC, which can be classified from:

– Complexity» Number of comparators in the circuit» Better if few comparators

– Conversion time Tc» Or conversion rate Fc, inverse of Tc» Better if low Tc (high speed, high Fc)

• Linked parameters:– High speed converters are more complex– High speed and high resolution are expensive

.

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A/D converters classification

• Parallel (flash)• Pipeline• Residue• Successive approximation • Tracking, Ramp

Complexity: number of comparators.Conversion time: Tc = 1/Fc

(inverse of the number of conversion/s)

.

Complexity Conv time

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Parallel (flash) ADC

VR

-+

-+

-+

-+

A

thermometricor linear output coding

0

1

1

0

Analog input level (between 0 and VR)

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Flash ADC with coded output

VR

-+

-+

-+

-+

A

0

1

1

0

M N encoder

M = 2N - 1 N

M-Nenc.

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Flash converter parameters

• 2N comparators (2N -1)

• 1 comparison cycle for N bits

• Fast– all comparators operate in the same time slot

• Complex – requires many comparators

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Logic network-+A

D

A’

DAC - feedback converters

• A logic network builds an approximation A’ of the input A using results of A<--> A’ comparison

– A’ is obtained from D through a DAC– D is the numeric representation of A

DAC

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Feedback converters algorithms

• The logic network modifies D till A’ becomes the best approximation of A (within the N-bit resolution)

• Two procedures:

• Steps of one LSB:– tracking converters– 2N steps for full scale change; conversion time: TC = 2N TCK

• Start from MSB:– successive approximation converters– N steps for any conversion: TC = N TCK

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LSB steps: staircase converter

• Counter with enable– If A’ < A , EN = 1 (counter enabled)– If A’ > A , EN = 0 (counter disabled)

• M = 2N steps from 0 to S:TC = 2N TCK

EN counter-+A

D

A’

DAC

CK

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Signal acquisition with staircase ADC

– As long as A’ < A, EN = 1 and counter is enabled, – The feedback signal A’ goes up 1 LSB for each Tck– As A’ > A the comparator disables the counter; A’ stops– max conversion time: Tc max (0 to S change of A) = 2N Tck– For new conversion reset counter to 0

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LSB steps: tracking converter

• Up/Down counter– If A’ < A , D = D + 1– If A’ > A , D = D - 1

• M = 2N steps from 0 to S:TC = 2N TCK

U/D U/D counter-+A

D

A’

DAC

CK

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Acquisition of constant signal

– As long as A’ < A, counter goes UP on CK edges– The feedback signal A’ moves 1 LSB for each Tck– As A’ > A the counter reverses count direction– max conversion time: Tc max (0 to S change of A) = 2N Tck

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Tracking of variable signals

• The converter can track signals with dv/dt < AD/Tck

Tracking

Overload

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Tracking converter parameters

• 1 comparator

• 2N comparison cycle for N bits

• Slow – fully sequential decisions– limited dV/dt tracking capability

• Simple – requires a single comparator

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Start with MSB: succ. approx. ADC

• Input signal compared with S/2: result --> MSB– MSB = 0: next comparison with S/4– MSB = 1: next comparison with 3S/4– result --> MSB - 1– …..

Successive approximation

register (SAR) -+A

D

A’

DAC

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Approximation sequence - 1

• Input signal A

S

0

S/2A

t

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Approximation sequence - 2

• A is compared with S/2 – A’ = S/2 by setting MSB = 1

S

0

S/2

A’ = S/2

A

t

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Approximation sequence - 3

• Since A > S/2 , MSB = 1– 0 - S/2 excluded from possible A values

S

0

S/2

A’ = S/2A > A’MSB = 1

A

t

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Approximation sequence - 4

• A compared with mid-value of possible range– A’ = 3S/4 by setting MSB-1 = 1

S

0

S/2

3S/4

A’ = S/2A > A’MSB = 1

A

t

A’ = 3S/4

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Approximation sequence - 5

• Since A < 3S/4, MSB -1 = 0– 3S/4 - S range excluded from possible A values

S

0

S/2

3S/4

A’ = S/2A > A’MSB = 1

A

A’ = 3S/4A < A’MSB-1 = 0

t

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Approximation sequence - 6

• A is compared with mid-value of possible range– A’ = 5S/8 by setting MSB - 2 = 1

S

0

S/2

3S/4

A’ = S/2A > A’MSB = 1

A

A’ = 3S/4A < A’MSB-1 = 0

t

A’ = 5S/8

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Approximation sequence - 7

• Since A < 5S/8, MSB - 2 = 1– S/2 - 5S/8 range excluded from possible A values

S

0

S/2

3S/4

A’ = S/2A > A’MSB = 1

A

A’ = 3S/4A < A’MSB-1 = 0

t

A’ = 5S/8A > A’MSB-2 = 1

A’ = 11S/16

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Approximation sequence - 8

• Since A < 11S/16, MSB - 3 must be 0– 11S/16 - 3S/4 range excluded from possible A values

S

0

S/2

3S/4

A’ = S/2A > A’MSB = 1

A

A’ = 3S/4A < A’MSB-1 = 0

t

A’ = 5S/8A > A’MSB-2 = 1

A’ = 11S/16A < A’MSB-3 = 0

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Complete decision tree

S

0

S/2

3S/4

Sequence of possible output A’ from D/A which are compared with A

t

A

lower: 0 higher: 1 lower: 0 1 0

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Successive approx. ADC parameters

• Single comparator

• N comparison cycles for N-bit conversion

• Vs flash ADC– Simpler: 1 comparator vs 2N

– Slower: N steps vs 1

• Vs tracking ADC– Same complexity: 1 comparator– faster: N steps vs 2N

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Speed vs complexity

Complex Conv time

Parallel (flash) 2N 1??? (Pipeline) N 1??? (Residue) N NSuccessive Approx 1 NTracking 1 2N

Complexity: proportional to the number of comparators.Conversion time: the maximum number of comparator delay

(clock periods) to complete a conversion

the table suggest two new types of ADC

.

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Lesson D3: A/D converters

• Analog to Digital converters– Error taxonomy (linear, nonlinear, dynamic)– Converter parameters: complexity and speed

• Examples of A/D converters– Flash, – Tracking– Successive approximation,

• Residue/subranging

• Pipeline structures

• Performance tradeoff

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Comparison in SAR ADC

• Sequence of comparison in the SAR ADC:– MSB: A > S/2 ?

– MSB-1: A > S/4 + S/2 MSB ?A > S/4 if MSB = 0A > S/4 + S/2 if MSB = 1

A - S/2 MSB > S/4 ?2(A - S/2 MSB) > S/2 ?

• A - S/2 MSB = R1 (MSB residue)– MSB-1 decision becomes 2 R1 > S/2 ?

– Similar to MSB decision (comparison A – S/2)

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Comparison in SAR ADC

• Sequence of comparison in the SAR ADC:– MSB: A > S/2 ?

– MSB-1: A > S/4 + S/2 MSB ?A > S/4 if MSB = 0A > S/4 + S/2 if MSB = 1

A - S/2 MSB > S/4 ?2(A - S/2 MSB) > S/2 ?

• A - S/2 MSB = R1 (MSB residue)– MSB-1 decision becomes 2 R1 > S/2 ?

• The SAR algorithm can find bit(MSB-i) by comparing residue Ri with S/2

– MSB: i = 0; MSB-1: i = 1; ….

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Subranging/residue converter

• The residue (order M) is the difference between A and its M-bit approximation

– on each step the residue is amplified (x 2) and compared again with S/2

S

0

S/2

S = S/2MSB = 1

A

t

R1

S = S/2MSB-1 = 0

2 R1

R2

2 R2 R3

S = S/2MSB-2 = 1

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Subranging ADC procedure - 1

• At first step A is compared with S/2– Since A > S/2, MSB = 1

S

0

S/2

S = S/2A > S/2 ?

A

t

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Subranging ADC procedure - 2

• The MSB residue is R1– R1 is amplified (x 2) and compared with S/2

S

0

S/2

S = S/2MSB = 1

A

t

R1

S = S/22R1 > S/2 ?

2 R1

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Subranging ADC procedure - 3

• Since 2R1 < S/2, MSB-1 = 0– The MSB-1 residue is R2– R2 is amplified (x 2)and compared with S/2

S

0

S/2

S = S/2MSB = 1

A

t

R1

S = S/2MSB-1 = 0

R2

2 R2

S = S/22R2 > S/2 ?

2 R1

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Subranging ADC procedure - 4

• Since 2R2 > S/2, MSB-2 = 1– The MSB-2 residue is R3– R3 is amplified (x 2)and compared with S/2

S

0

S/2

S = S/2MSB = 1

A

t

R1

S = S/2MSB-1 = 0

R2

R3

S = S/2MSB-2 = 1

2 R1 2 R2

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Subranging ADC procedure - 5

• Ri = A – (i-bit approximation of A)– At each step the residue Ri is amplified (x 2) and compared with

S/2

S

0

S/2

S = S/2MSB = 1

A

t

R1

S = S/2MSB-1 = 0

R2

S = S/2MSB-2 = 1

R3

2 R2

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Residue converter parameters

• The residue ADC uses, for each bit

– One comparator (for bit value decision)

– One 1-bit DAC(to build the approximation)

– One (analog) adder (to evaluate the residue)

– One amplifier (gain = 2) (to bring residue to full scale)

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Block diagram of residue ADC

or

R1

2R1

R2

2R2

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Precision in subranging converters

• Any error in residue evaluation is propagated to the following stages

– Residue must be evaluated with a resolution corresponding to the residual bit number

» ADC precision» DAC precision» Amplifiers and S/H (pipeline) precision

• Previous example– First stage (MSB): ADC and DAC need 8-bit precision– Second stage (MSB-1): only 7 bits must be evaluated;

the precision required corresponds to 7-bit ADC– Third stage: 6 bits remaining …– Precision decreases going towards LSBs

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Subranging ADC parameters

• N comparators

• N comparison cycles for N-bit conversion

• Vs successive approximation ADC:– Same speed: N steps– Higher complexity: N vs 1 comparator

• No benefit

• Useful as starting structure for pipeline ADC

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Lesson D3: A/D converters

• Analog to Digital converters– Error taxonomy (linear, nonlinear, dynamic)– Converter parameters: complexity and speed

• Examples of A/D converters– Flash, – Tracking– Successive approximation,

• Residue/subranging

• Pipeline structures

• Performance tradeoff

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Pipeline sequence

• Input sample sequence: A, B, C, D, ...• Operate on different samples at the same time

Needs analog memory elements

• Processing: stage t1 t2 t3 t41 A B C D2 X A B C3 X X A B4 X X X A

t1: Input sample 1t2: Input sample 2, processA 1t3: Input sample 3, processA 2, processB 1....

result of sample A conversion available

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Pipeline-subranging ADC

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Comparison with other techniques

• A N-bit pipeline A/D converter uses:– N comparators– N comparison cycles

(to complete the conversion of each sample)

• Conversion time:– N-cycle latency– 1-cycle conversion (throughput)

• Same speed as a flash with N comparators– (2N in the flash)

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Speed vs complexity

Complex Conv time Latency

Parallel (flash) 2N 1 1Pipeline N 1 NResidue N N NSuccessive Approx 1 N NTracking 1 2N 2N

Complexity: proportional to the number of comparators.Conversion time: the maximum number of comparator delay

(clock periods) to complete a conversionLatency: delay to get the result

.

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“Classic” 8-bit converters

• 8-bit Flash:– 28-1 = 255 comparators; TCT = TC

• 8-bit SAR:– 1 comparator; TCT = 8 TC + 7 TDA

• Limited choice

• No room for tradeoff

• Can we do something between?– Faster than SAR, slower than flash– Less expensive than flash (less comparators)

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Example: best cost/speed architecture

• Goal:– 8-bit ADC– Conversion time Tct < 60 ns– Devices available: comparators with Tc = 10 ns

• Suitable “classic” design– SAR: conversion time Tc = 8 x 10 = 80 ns too long– Flash: Tc = 10 ns, but

» Expensive: 255 comparators» Overkill: too fast, 60 ns is enough !

• Any other choice ?

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Multibit residue architectures

• First-stage conversion on 1, 2, 3, … M bits– Comparators are replaced by M-bit ADC– The approximation is built using M-bit DAC– Residue has a max value Ad = S/ 2M

– Gain required to bring residue up to S: 2M

• Multibit-residue provides various speed/complexity tradeoffs

– Higher speed, with the same number of comparators– Less comparators for the same speed– Better tuning of design to specifications

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Choices for 8-bit converters

• Comparators, conversion time (TCT), latency (TL)

• 8-bit Flash:– 28-1 = 255 comparators; TCT = TC TL = 1

• 8-bit SAR:– 1 comparator; TCT = 8 TC + 7 TDA TL = 8

• Something in the middle: multibit residue subranging converters

– Two cascaded 4-bit flash: 2(24-1) = 30 comparators; TCT = 2TC + TDA TL = 2

– Four cascaded 2-bit flash: 4(22-1) = 12 comparators; TCT = 4TC + 3 TDA TL = 4

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Multibit residue ADC comparison

+

A/D - 2bit

D/A - 2bit

4

+

A/D - 2bit

D/A - 2bit

4

+

A/D - 2bit

D/A - 2bit

4

A/D - 2bit

MSB, MSB-1(D7, D6)

D5, D4

D3, D2

LSB+1, LSB(D1, D0)

+

A/D - 4bit

D/A - 4bit

16

A/D - 4bit

MSB, …..(D7, 6, 5, 4)

D3, 2, 1, 0

8-bit residue ADC: 2 4-bit cells

Total conversion time:Tct = 2 x Tc(A/D) + Ta(D/A)

8-bit residue ADC: 4 2-bit cells

Total conversion time:Tct = 4 x Tc(A/D) + 3 x Ta(D/A)

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Mixed and multistage converters

• Application of subranging to bit groups (K-bit)– Comparator N bit ADC– Residue evaluation N bit DAC + differential amplifier– With K-bit groups N/K stages– Interstage amplifier gain 2N

• Basic ADC: FLASH– Complexity: Ps = 2K total: PT = N/K x 2K

– Conversion time TC = 1 total: TCT = N/K x TC

• Basic ADC: SAR– Complexity: Ps = 1 total: PT = N/K– Conversion time TC = K total: TCT = N x TC

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Speed vs complexity with multibit - 1

Complex Speed Conv time Latency

Parallel (flash) 2N 1 1Pipeline N 1 NResidue N N NResidue K bit N/K N/K NSuccessive Approx 1 N NTracking 1 2N 2N

.

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Pipeline converters

• Pipeline can be used for any multistage– Reduces the equivalent conversion time TCT

– Faster equivalent conversion rate FS

– Same latency time

• Pipeline = Residue + Memory element (analog) at the input of each stage

– Change each amplifier into Sample/Hold + amplifier– Some added complexity

• Multibit residue pipeline– FLASH ADC: equivalent TCT = 1 (more precisely TC + TDA )– SAR ADC: equivalent TCT = K TC (more precisely K (TC + TDA ))– Additional design freedom

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Speed vs complexity with multibit - 2

Complex Speed Time Latency

Parallel (flash) 2N 1 1Pipeline N 1 NResidue N N NResidue K bit Flash (2K)N/K N/K N/KResidue K bit SAR N/K N NSuccessive Approx 1 N NTracking 1 2N 2N

.

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Speed vs complexity - graph

.

Complexity(log)

Conversion time (log)

SARSAR

1 N 21 N 2NN

22NN

N N

11

FlashFlash

TrackingTracking

ResidueResiduePipelinePipeline

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Choices for 12-bit residue ADC

.

Complexity(log)

Conv. time

<bit/stage>x<num stage><bit/stage>x<num stage>

1 2 3 4 6 121 2 3 4 6 12---->>

40954095

126126

45 45 282818181212

Residue 12x1 (Flash)Residue 12x1 (Flash)

Residue 6x2Residue 6x2

Residue 4x3Residue 4x3Residue 3x4Residue 3x4

Residue 2x6Residue 2x6Residue 1x12Residue 1x12

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Telecom applications ADC

• Direct RF or IF signal conversion

• Key parameters

– Dynamic range (resolution, bit number)

– Conversion rate (1/Tc)

– Linearity (total harmonic distortion: THD)

– Full power bandwidth

– Spurious free dynamic range (SFDR)

– Signal/(noise+distortion) ratio (SINAD)

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Lab experiment

• Operation and errors of a D/A converter– D/A converter with weighted resistors or ladder network, voltage

switches, voltage output.– Voltage SW: CMOS logic circuit output (counter)– Measurement of A(D)– Evaluation of approximating straight line– Evaluation of gain, offset, nonlinearity errors

• Conversion in tracking ADC– Dynamic range and slew rate verification

• Text reference (IT) sect. 4.L1

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Lesson D3 - final test

• Which is the effect of strong differential nonlinearity error?

• Describe the missed-code error.

• Which parameters can be used to classify ADCs?

• Draw the block diagram of a residue/subranging converter.

• Explain the difference between conversion time and latency.

• How many comparators are required for a 8-bit flash ADC?

• Which is the conversion delay (as number of comparator decision times) for a 8-bit SAR ADC?

• Draw the block diagram of a residue converter using 3 stages, with 3 bits each.