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McGuiret
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McGuiret
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These handouts support the High-Speed Digital Design videos provided by Howard Johnson. This is a copy of the hand-outs you would have received if attending the 2-day workshop. It is recommended that they be used in conjunction with the videos for learning purposes.
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Your use of these materials constitutes your agreement to the terms and conditions set out on the registration page for this course.

signal consulting, inc. www.sigcon.com p o box 698, twisp, wa 98856 tel +1.509.997.0505

Dear Colleague:

Welcome to “High-Speed Digital Design: A Two-Day Workshop in Black Magic.” Signal Integrity is one of the most important topics in digital engineering today. As a designer, you must continue to hone and improve your skills in mixed-signal design. This course will give you the tools you need to do your design right the first time, and not get bogged down with problems like ringing, crosstalk and ground bounce.

We hope you enjoy the two days, and look forward to receiving your feedback. As a graduate of “High-Speed Digital Design” you will be automatically added to our student Email forum for issues related to Signal Integrity. You can also Email me with your questions. Although I can’t guarantee a response to each individual question, I’ll certainly do my best!

Thanks again for your interest. If you’d like more information about upcoming events, be sure to check out our website, http://www.sigcon.com, or Email us at [email protected].

Sincerely,

Howard Johnson, Ph.D. About the Presenter Dr. Howard W. Johnson has over 30 years of experience in the design of digital systems, and is a recognized authority on the subject of High-Speed Digital Design. Inventor of PhoneMail, the first integrated voice messaging system Developer of the high-speed switching architecture for ROLM Corp.'s largest multi-node telephone

exchange Author of High-Speed Digital Design: A Handbook of Black Magic First to create gigabit-per-second fiber optic transmission systems for supercomputer networking Key architect of worldwide standards for 100BASE-T Fast Ethernet EDN columnist for Signal Integrity Chair of Gigabit Ethernet Alliance technical activities and Chief Technical Editor of the IEEE 802.3z

Gigabit Ethernet standard Author of High-Speed Signal Propagation: Advanced Black Magic His consulting clients and students receive not only a wealth of material from his workshops, but also benefit during Q&A time from his extraordinary breadth of insight and experience.

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HSDD © 2012 v.15

HIGH-SPEED DIGITAL DESIGN

Dr. Howard Johnson

Seminars, books, articles and films

(509) 997-0505

Signal Consulting, Inc.

www.sigcon.com

1.2 HSDD © 2012 v.15

High-Speed Digital Behavior

Self-induced effects

Ringing

Reflections

Ground bounce

Interactions between circuits

Crosstalk

Power supply noise

Interactions with the natural world

Radiation

Susceptibility

Electrostatic discharge

Signal Integrity

EMI

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1.3 HSDD © 2012 v.15

Purpose of Signal Integrity

Guarantee acceptable signal quality

Voltage margin

Crosstalk

External interference

Timing margin

Jitter

Error rate

Minimize packaged cost

Cost of components

Cost of assembly

Cost of design

Power

Size & Weight

1.4 HSDD © 2012 v.15

What Constitutes a Signal?

Any means of conveying information

Examples:

Semaphore flags (visual)

Mechanical linkages (boat rudder)

Acoustic waves (sonar)

Radiated E&M fields (radio)

Photons (optical fiber)

Electrical signals (current flowing on wires)

The ship's engine telegraph conveys digital information from the bridge to the engine room.

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1.5 HSDD © 2012 v.15

Program

1. Vocabulary of signal integrity

2. Properties of gates

Lab demo: metastability in flip-flops

3. Using your oscilloscope

4. Transmission lines

Example designs: Bus structures

6. Improving signal quality with terminations

5. Ground planes and layer stacking

8. Building a rock-solid power system

Lab demonstration: capacitor series inductance

1.6 HSDD © 2012 v.15

HSDD: 1st-day schedule

Save

8 9 10 11 12 1 2 3 4 5

Short, frequent breaks

Longer, less frequent breaks

Chap 1

Chap 2

Chap 3 Chap 4

1.23 1.53 1.81 3.2 4.3 4.30 (6.10)

1.39 1.81 3.17 4.30 (6.10)

(Chap 6)

MOVIE

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1.7 HSDD © 2012 v.15

HSDD: 2nd-day schedule

Save

8 9 10 11 12 1 2 3 4 5

Chap 6 Chap 5 Chap 8

6.24 5.4

6.41 5.4

Short, frequent breaks

Longer, less frequent breaks

EVALS | MOVIE

6.1

6.1

5.32 8.3 8.26

5.46 8.26

Freeform discussion complete

6.42

1.8 HSDD © 2012 v.15

HSDD: 2nd-day schedule (early release)

Save

8 9 10 11 12 1 2 3 4 5

Chap 5 Chap 6 Chap 12

6.41 6.52 5.17

6.42 5.17

Short, frequent breaks

Longer, less frequent breaks5.54 8.26

MOVIEEVALS

5.54 8.266.11

6.11

Freeform discussion complete

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1.9 HSDD © 2012 v.15

Questions?

I encourage questions. That is why I am here.

Please raise your hand and I’ll acknowledge that I’ve seen you. It may take me a minute, but I’ll get back to you when I get to a good stopping-point.

1.10 HSDD © 2012 v.15

Please Silence Cell Phones and Pagers

If you must take a call, please do so outside the room.

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1.11 HSDD © 2012 v.15

Chapter 1: Vocabulary of Signal Integrity

Circuit Elements

Parasitic Series Inductance

Parasitic Shunt Capacitance

Frequency and Time

Spectral content of digital signals

Propagation delay

Lumped versus distributed systems

Crosstalk effects

Mutual inductance

Mutual capacitance

1.12 HSDD © 2012 v.15

Your Schematic Is Lying

It shows only the intended flow of signal power.

It masks details crucial to the operation of unintentional signal pathways vital to your understanding of high-speed signal performance, crosstalk and EMI.

Two main rules govern unintentional signal flow.

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1.13 HSDD © 2012 v.15

Rule 1: Currents Form Loops

Source

Ground

Signal

Return

Load

50-

Current follows an obvious path in this

simple circuit.

Source

Ground

1.14 HSDD © 2012 v.15

Currents form loops in circuits of any complexity.

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1.15 HSDD © 2012 v.15

The flow of electrical current creates a magnetic field.

Magnetic fields store energy.

Inductance is no more (and no less) than the storage of energy in the form of this magnetic field.

Every Loop Of Current Has Inductance

Every wire has inductance.

1.16 HSDD © 2012 v.15

Every Loop Of Current Has Inductance

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1.17 HSDD © 2012 v.15

Behavior of Inductance

Current builds slowly and decays slowly

-- precisely as if it had momentum.

1.18 HSDD © 2012 v.15

Impedance Magnitude of Inductor

Given a value of L, and

Given also a frequency f,

Then for sinusoidal inputs only,

the effective impedance magnitude:

L 2X fL

1 in.

~ 100 nH

L 2 (1 )(100 ) ( )628 X GHz nH j

Huge!

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1.19 HSDD © 2012 v.15

Effect of Inductor

A series-connected inductor passes DC, but

Blocks high-frequencies (HF)

DC

Switch closed,DC voltage passes through

HF

Switch open,high-frequency noise blocked

A B A B

1.20 HSDD © 2012 v.15

Important Fact About Inductance

Current always makes a loop (out and back).

Both paths contribute magnetic fields.

Both paths therefore influence inductance.

Inductance is a property of a complete circuit, not an isolated wire.

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1.21 HSDD © 2012 v.15

A

B

Rule 2: Proximate ConductorsShare Capacitance

Any two conductors share an electric field.

Through this field unintentional currents flow.

The coupling acts like a shunt capacitance

1.22 HSDD © 2012 v.15

How Capacitors Behave

Turn the switch ON, …and current surges to fill the capacitor.

Turn the switch OFF,…and it just as quickly surges out.

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1.23 HSDD © 2012 v.15

Impedance Magnitude of Capacitor

Given a value of C, and

Given also a frequency f,

Then for sinusoidal inputs only,

the effective impedance magnitude:

C

1

2X

fC

C

1( )160

2 (1 )(1 )X j

GHz pF

Significant.

1 pF

1.24 HSDD © 2012 v.15

Effect of Capacitor

The capacitor blocks DC, but

Passes high-frequencies (HF)

DC

Switch open,no current

HF

Switch closed,direct connect

A

B

A

B

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1.25 HSDD © 2012 v.15

Approximate Values of Capacitance

Capacitance scales with size

Bigger objects have more capacitance

Capacitance varies inversely with spacing

Closer –> more capacitance

Further away –> less

h=0.01 in.

C=100 pF/(square in.)

(r=4.3)

C=3 pF/in.

Z0 = 50 ohmTDELAY= 150 ps/in.(microstrip r=4.3)

R0.2249 pFA

Ch

A

DELAY

0

pF/in. (assumes in ps/in.)T

C TZ

1.26 HSDD © 2012 v.15blank SaveExplore

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1.27 HSDD © 2012 v.15

Practical Circuits are Littered with Parasitic Elements

Parasitic elements dominate circuit behavior at high frequencies.

CIN

LBGA

CBODY

CBODY

LBODY

LBODY

LPWR

LGND

LPWR

LGND

Z0, TDLY

1.28 HSDD © 2012 v.15

What Frequencies Matter?

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1.29 HSDD © 2012 v.15

Data Band

1.30 HSDD © 2012 v.15

Baud Interval Band (Rectangle = Step)

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1.31 HSDD © 2012 v.15

Rising/Falling Edge Band

1.32 HSDD © 2012 v.15

Highest Frequencies Depend on Rise/Fall Time

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1.33 HSDD © 2012 v.15

Frequencies That Matter for Digital Design

From DC up to the Knee Frequency

Knee frequency is a function of rise/fall time, not repetition rate

Frequency associated with incident wave Step-edge rise time

1-nS 500 MHz

KNEER

0.5F

T

FKNEE forms a crude, but useful, translation between the time and frequency domains.

1/4-nS 2000 MHz1/2-nS 1000 MHz

1.34 HSDD © 2012 v.15

Meaning of "Frequency Response"

Replace the driver with a sine-wave source having the same output impedance.

Measure the amplitude of the received signal y(t) as a function of frequency.

– x(t)+

y(t)+

"Frequency response" is the ratio of output magnitude to input

magnitude.

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1.35 HSDD © 2012 v.15

Effect of Parasitics

At high frequencies, the parasitic element take over, destroying your nice, flat frequency response.

CIN

LBGA

CBODY

CBODY

LBODY

LBODY

LPWR

LGND

LPWR

LGND

Z0, TDLY

1.36 HSDD © 2012 v.15

Conceptual Frequency Response of Every PCB Trace

H(f)1.00

Frequency

Flat zone Imperfections

Effect of parasitic elements

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1.37 HSDD © 2012 v.15

Relation of Knee Frequency to Circuit Performance

H(f)1.00

FKNEE

When the knee frequency is low, imperfections above FKNEE don’t matter

Frequency

1.38 HSDD © 2012 v.15

H(f)1.00

Frequency

Effect of Shrinking Rise/Fall Time

Faster circuits move FKNEE higher, exposing imperfections in the digital pathway

Constantly improving IC processes make circuits faster every year.

If your layout doesn't change, here's what happens:

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1.39 HSDD © 2012 v.15

Points to Remember

The response of a circuit at high frequencies affects its processing of short time events.

The response of a circuit at low frequencies affects its processing of long-term events

The important energy in digital pulses concentrates at or below the knee frequency.

To ensure good signal quality, digital circuits need a flat frequency response up to and including FKNEE.

The behavior of a digital circuit above FKNEE has little effect on signal quality.

FKNEE is a crude, but useful, translation between the time and frequency domains.

1.40 HSDD © 2012 v.15

International Technology Roadmap for Semiconductors (ITRS)

The International Technology Roadmap for Semiconductors (ITRS) is an assessment of the semiconductor technology requirements. The objective of the ITRS is to ensure advancements in the performance of integrated circuits. This assessment, called road-mapping, is a cooperative effort of the global industry manufacturers and suppliers, government organizations, consortia, and universities.

The ITRS identifies the technological challenges and needs facing the semiconductor industry over the next 15 years. It is sponsored by the Semiconductor Industry Association (SIA), the European Electronic Component Association (EECA), the Japan Electronics & Information Technology Industries Association (JEITA), the Korean Semiconductor Industry Association (KSIA), and Taiwan Semiconductor Industry Association (TSIA) .

International SEMATECH is the global communication center for this activity.

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1.41 HSDD © 2012 v.15

2011 Jan. update

International Technology Roadmap for Semiconductors

Dynamic RAM (Production)

High-perf. Microprocessor ASIC

Year ½ pitch, nm Chip size, mm2

Gbits per chip

Chip size, mm2

Billions of transistors

per chip

Chip-to-board bus (diff),

GHz

Wiring levels (max)

Total pins/balls

[1]

2011 40 49 4 260 4.4 12 12 5100

2013 32 31 4 260 8.8 17 13 5600

2016 22 31 8 260 17.7 34.9 13 6500

2019 16 31 16 260 35.4 50.7

14 7500

2022 11 31 32 260 70.8 67.5 15 8700

NOTE [1]—50% I/O, 50% Pwr&Gnd

www.itrs.net

1.42 HSDD © 2012 v.15

Propagation Delay in Various Media

Air (radio waves) 85 1.0

Coax cable (75% velocity) 113 1.8

Coax cable (66% velocity) 129 2.3

FR-4 PCB, outer trace 142-172 2.8-4.1 (effective)

FR-4 PCB, inner trace 172 4.1

Alumina PCB, inner trace 240-270 8.0-10.0

Medium Delay Dielectricps/in Constant r

r84.725 ps/in.DelayPerInch

2

r 84.725DelayPerInch (1 ) in./psv DelayPerInch

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1.43 HSDD © 2012 v.15

Example of Mixed Dielectric

Foaming the dielectric (adding air bubbles) reduces the effective electric permittivity.

Decreased delay

Increased speed

Less loss

Coaxial cables

Solid polyethylene

dielectric

Foamed polyethylene

dielectric

66% C 75% C

1.44 HSDD © 2012 v.15

Dielectric Properties of PCB Traces

Effective relative permittivity of microstrip lies between that of FR-4 and air

Microstrip traces go faster than striplines

Electric field exists partly in air, partly

in dielectric

Field is completely contained within

the dielectric

FR-4 dielectricr = 4.1

Reference plane(any DC voltage)

Reference plane(any DC voltage)

Microstrip

Stripline

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1.45 HSDD © 2012 v.15

Outer-Layer PCB Traces Are Faster

Signal arrives here first

Top layer

Bottom layer

Microstrip layer

Stripline layer

FR-4, r = 4.1

Traces have equal lengths.

1.46 HSDD © 2012 v.15

Points to Remember

• Propagation delay varies in proportion to the square root of the dielectric constant.

• The propagation delay of signals traveling in air equals 85 ps/in.

• Outer-layer pcb traces convey signals faster than inner-layer traces.

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1.47 HSDD © 2012 v.15

Distributed vs. Lumped Systems

Compact system

System delay << Rise/fall time

Easy to analyze using lumped-element assumptions

Characterized by simple harmonic motion

Lumped

Large, complicated system

System Delay >> Rise/fall time

Difficult distributed analysis required

Characterized by distributed delay and reflections

Distributed

1.48 HSDD © 2012 v.15

Critical RatiotD (System delay)

T10-90% (Rise/fall time)

Lumped

Distributed

Very small

1/6

1/3

Larger than 1/2

Lumped-element models accurate to 20%

Lumped-element models accurate to 2%

System reacts coherently; no model needed

System reacts in highly distributed fashion; extensive modeling required

Behavior

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1.49 HSDD © 2012 v.15

Re-Write the Critical Ratio

Classify circuits according to the relation between rising edge length and circuit size.

tD vtD

Let tD represent one-way circuit propagation delay (ps)Let v represent the wave velocity (in/ps)

Physical length of circuit= =

= T10-90% v(velocity, in./ps)

length ofrising edge (in)

(rise time, ps)

T10-90% vT10-90% Length of rising edge

×

1.50 HSDD © 2012 v.15

Start with a Big System

Loss Budgeting for Xilinx RocketIO, 2004

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1.51 HSDD © 2012 v.15

Rising Edge in Motion

1.52 HSDD © 2012 v.15

Edge is Much Larger than Capacitor

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1.53 HSDD © 2012 v.15

How Will It Compare to the Connector?

1.54 HSDD © 2012 v.15

Lumped-Element Assumption:"π " Model of Transmission Line

Circuitdimensions

<6

Totally equivalent circuits for 1-nS

risetime

T10-90% = 1 ns

1-in. trace10Load

L = delayZ0

C = (delay/Z0)

10

Load

LT10-90% = 1 ns "π" model

Applies when:

= 6 in.Z0 = 65 ohmdelay = 1/6 ns

½C ½C

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1.55 HSDD © 2012 v.15

Step Response Comparison

T10-90% = 1 nsRS = 10 ohmsZ0 = 65 ohmLine length = 1 inch (= 1/6 ns)

Full line simulation

Using simplified "" model

0 1 2 3 4 50

0.25

0.5

0.75

1

1.25

1.5

1.75

2

0 1 2 3 4 50

0.25

0.5

0.75

1

1.25

1.5

1.75

2

no load

no load

1.56 HSDD © 2012 v.15

0 1 2 3 4 50

0.25

0.5

0.75

1

1.25

1.5

1.75

2

0 1 2 3 4 50

0.25

0.5

0.75

1

1.25

1.5

1.75

2

Step Response Comparison

T10-90% = 1 nsRS = 10 ohmsZ0 = 65 ohmLine length = 1 inch (= 1/6 ns)

Full line simulation

Using simplified "π" model10-pF load

10-pF load

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1.57 HSDD © 2012 v.15

Tricky Fact About the "π" Model

As long as you follow the rule: (tD/T10-90% ) < 1/6 ,

The capacitive impedance exceeds the inductive impedance for all frequencies up to the knee frequency.

Hint: into the ratio of (1/2fC)/(2fL), substitute the formulas for Land C given previously and the expression 2T10-90% for 1/f.

(1/2fC)/2fL

= (1/f)2 / (42LC)

= (2T10-90%)2 /[(42)(delayZ0)(delay/Z0)]

= (T10-90% /delay)2 / 2

> 62 /2

> 3.647

Ratio of impedances XC/XL

Combine like terms

Substitute for f, L, and C

Express T/delay ratio in numerator

The rule says T10-90%/tD > 6Ratio by which the capacitive

impedance exceeds the inductive impedance

1.58 HSDD © 2012 v.15

Uses for The "π" Model"π" model of short line, grounded at far end

These impedances are too large to matter...

Input

"π" model of short line, open at far end

This impedance is too small to matter...

Input

L

L

½C ½C

½C ½C

Net result

Net result

…looks like an inductor to ground

…looks like a lumped capacitive load

L

C

L = delay*Z0

C = (delay/Z0)

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1.59 HSDD © 2012 v.15

Points to Remember

Rise time relates to physical dimensions:

Circuits smaller than /6 behave as lumped circuits, for which the "π" model may be used

= T10-90% v(velocity, in./ps)(rise time, ps)

×

1.60 HSDD © 2012 v.15

Taxonomy of Component Behavior at High Frequencies

Capacitance

Draws a surge of drive current, and causes reflections on long lines

Inductance

Causes ground bounce and power supply noise

Mutual capacitance

Causes crosstalk between high impedance circuits

Mutual inductance

Causes crosstalk in connectors and in bad layouts

These concepts provide a rich language for describing and understanding the behavior of digital

circuit elements at high speeds.

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1.61 HSDD © 2012 v.15

Classify Reactance With aStep Response Test

Device under testshunts the stepsource

Output impedanceof step source

x(t)Step

source

+

-

RS

+

-Z

I(t)

Step responsey(t)

1.62 HSDD © 2012 v.15

Step Response of Various Reactances

Resistor

Initial step to fraction of open circuit voltage

Stays flat

Capacitor

No initial step

Ramps up to full output

Inductor

Full size initial step

Decays to zero

RL

RS

RS

RS

C

y(t)

y(t)

Same rise time as source

Voltage approachesfull output

x(t) RL

RL + RS

Holds flat at fixed voltage:

Initial stepis full size Voltage decays

to zero

Same rise time as source

0-63% = RSC

100-37% = L/RS

y(t)

y(t)

y(t)

x(t)

x(t)

L

y(t)x(t)

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1.63 HSDD © 2012 v.15

Resistive Step Response: Leaves T10-90% Unchanged

y(t)

10

Signal rises to only 90% of unloaded response

(Same in all cases)

90% of this signal’s own final value

x(t)

RL =

y(t)

t

RL = 100

RL = 10

RL = 1

T10-90%

RL

1.64 HSDD © 2012 v.15

But Varies the Switching Delay

RL =

RL = 100

RL = 10

RL = 1

y(t)

tT10-90%

Fixed threshold VR

y(t)10

Fixed threshold VR

+-

Resistive loading to ground retards the leading edge but accelerates the falling.Resistive loads to VCC do the opposite.

Retards leading

edge Advancesfalling edge

x(t)

RL

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1.65 HSDD © 2012 v.15

Points to Remember

A resistive step response leaves T10-90% unchanged, but varies the switching delay.

A capacitive step response rises.

An inductive step response decays.

1.66 HSDD © 2012 v.15

Mutual Capacitance

End View of twoadjacent terminating resistors

RA

0.1 in.

BR

No copper on circuit sideof printed circuit board (PCB)

0.063-in.-thick epoxy FR-4 PCB

Solid ground plane on solderside of PCB

Wherever there are two circuits, there is mutual capacitance.

About 0.4 pF

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1.67 HSDD © 2012 v.15

Mutual Capacitance Causes Positive Crosstalk

A rising edge at x(t) sends noise current to the right, causing a positive blip of crosstalk at y(t) with a duration equal to the rise time of x(t).

Circuit A Circuit B

Undesired mutual coupling

x(t) y(t)iN(t)

1.68 HSDD © 2012 v.15

Mutual Inductance

Wherever there are two loops of current, there is mutual inductance.

vN(t)

Lowimpedancesource

+

LM

Source ofchangingcurrent

Coupled noise voltage vN(t) from circuit A appears here

Circuit B

-

i(t)

RA

Circuit A

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1.69 HSDD © 2012 v.15

How Mutual Inductance Works

Faraday's law states that the induced voltageis proportional to therate of change of fluxin loop B

(4)

Magnetic field strengthis proportional to theloop current

(1)

i(t)A fixed fraction of thetotal flux from loop A passes through loop B

(2)

The rate of change offlux in loop B is proportional to the rateof change of current

(3)

i(t)

i(t)

B

A

vN(t)-

+

vN(t) = di

dtLM

1.70 HSDD © 2012 v.15

-

+

Mutual Inductance Causes Positive and Negative Crosstalk

A rising edge at x(t) increases current in the direction shown, inducing a positive blip of crosstalk at y(t) with a duration equal to the rise time of x(t).

Node z(t) receives a negative blip of crosstalk.

Circuit A

Circuit B

x(t) y(t)

i(t)

z(t)

Undesired mutual coupling

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1.71 HSDD © 2012 v.15

Practical Measurement ofMutual Coupling

From pulsegenerator

IN

OUT

RB

50

To scope

RA

50

Note: Resistors are eachgrounded on one end

We expect both inductive and capacitive coupling to occur

1.72 HSDD © 2012 v.15

Mutual Coupling of Two 1/4-W Resistors

FIG 1.22

Amplitude (3)91 mV

Area (3)79.96 pVs

1 V

20 mV

20 mV

(1)

(2)

(3)

5 nS/div

500 pS/div

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1.73 HSDD © 2012 v.15

Mutual Coupling Measurement Againwith Reversed Sense Probe

From pulsegenerator

IN

OUTRB

50

To scope

RA

50

When reversing the sense probe:• Inductive coupling flips polarity• Capacitive coupling retains same polarityThis is how we can tell the difference

Note: Resistors are eachgrounded on one end

1.74 HSDD © 2012 v.15

Mutual Coupling of Two 1/4-W Resistors

FIG 1.23

Amplitude (3)70 mV

Area (3)58.91 pVs

1 V

20 mV

20 mV

(1)

(2)

(3)

5 nS/div

500 pS/div

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1.75 HSDD © 2012 v.15

Comparison of Inductive and Capacitive Crosstalk

In digital crosstalk problems, when a low-impedance circuit is exposed to the air through a package pin, connector, or

component body, look first for inductive crosstalk.

Higher impedance circuits (like on-chip nets)experience more capacitive crosstalk.

C-crosstalk 0.4 %

L-crosstalk 3.3 %Typical ratio for50-Ω circuits

(FIG. 1.22 or 1.23)

(Difference between FIG 1.22 and 1.23)

1.76 HSDD © 2012 v.15

Why I Care About the Difference Between Capacitive and Inductive Crosstalk

Aggressor

Victim

0

PCB

(Open-loop wiring)

Load 1

Load 2-

Y(t)+

Undesirable capacitive coupling goes from one signal wire to the other

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1.77 HSDD © 2012 v.15

A Faraday Cage Fixes Capacitive Coupling

Aggressor

Victim

0

PCB

(Open-loop wiring)

Load 1

Load 2-

Y(t)+

...Electric fields from the aggressor cannot escape the shield. Electric field coupling is interrupted...

Add a coaxial shield, grounded at one end...

…But crosstalk remains practically unchanged, because the crosstalk wasn’t coming from mutual capacitance!

1.78 HSDD © 2012 v.15

Mutual Inductance is a Current-Flow Problem

Aggressor

Victim

0

PCB

Load 1

Load 2-

Y(t)+

Aggressive currents at the load must return along the ground wire

Magnetic fields from the returning signal current cause crosstalk

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1.79 HSDD © 2012 v.15

Improving the Return Path Fixes Inductive Crosstalk

Inductive crosstalk exceeds capacitive crosstalk whenever you route low-impedance signals through free space.

You shield against inductive crosstalk by finding the path of returning signal current and causing it to return home closer to the outbound signal.

Aggressor

Victim

0

PCB

Load 1

Load 2-

Y(t)+

Grounding the coax at bothends radically improves the

return path.

Magnetic fields from the outbound and returning currents cancel.

Crosstalk is much improved.

1.80 HSDD © 2012 v.15

Why Many Engineers Think First About Capacitive Crosstalk

Our electrical engineering curricula was developed during the tube era. Tubes are very high-impedance devices. The output impedance of a tube amplifier used for digital logic might be several hundred thousand ohms, far greater than the impedance of free space (377 ohms). These circuits used huge voltages (300 volts) and very small currents (microamps). Most of the electromagnetic field energy surrounding such a high-impedance circuit resides in the electric field mode, not the magnetic field mode, thus the emphasis on capacitive coupling.

We no longer make high-impedance circuits. Modern digital equipment uses low-impedance circuits, with little tiny voltages and great big currents. At 50 ohms, our circuit impedances are far below the impedance of free space. Consequently, most of the electromagnetic field energy surrounding our low-impedance circuits will reside in the magnetic field mode, which is what makes inductive coupling so important.

Sure, capacitance still matters for high-impedance work (example: a high-impedance analog amplifier input). But for most digital crosstalk problems, any time you have exposed your low-impedance circuit to the air, through a package pin, a connector, or a component body, think first about inductive coupling. Identify the path of outbound current and the path of returning signal current. Causing the return current to flow home closer to the outbound path will improve crosstalk.

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1.81 HSDD © 2012 v.15

Points to Remember

Mutual capacitance causes positive crosstalk with a duration equal to the rise time of the aggressive signal.

Mutual inductance can cause either positive or negative crosstalk, with a duration equal to the rise time of the aggressive signal.

Among high-speed, low impedance digital circuits, mutual inductance is often a worse problem than mutual capacitance.

1.82 HSDD © 2012 v.15

Path of Current

First movieon disk

Eleven minutes

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1.83 HSDD © 2012 v.15

Extra for Experts

My next course, Advanced High-Speed Signal Propagation,covers the following topics: Lossy transmission structures Pcb tracesDifferential connections Serial links S-parameters Equalizers ViasConnectorsClock routing, andClock jitter.

A brief excerpt from the course follows. This material is adapted from the book, High-Speed Signal Propagation: Advanced Black Magic.

1.84 HSDD © 2012 v.15

Skin Effect and Dielectric Loss Chart

107 108 109 1010

0.01

0.1

1

10

Dielectric loss in percent per inch

vs. dielectric loss tangent All traces are striplines

(microstrips have slightlyless loss)

Skin effect lossin percent per inchvs. trace width w.

All traces are loosely-coupled 100-ohm differential pairs.

w=.006 in.w=.012 in.

w=.024 in.

= .02 = .01 = .005

Frequency, Hz

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1.85 HSDD © 2012 v.15

Skin Effect and Dielectric Loss ExampleFibre Channel 1.06 Gb/s over 18 in. of FR-4

107 108 109 1010

0.01

0.1

1

10Composite loss (skin+dielectric) at maximum data

alternation rate is 1% per inch; Loss in 18 inches is 18%

For more accurate results use a 2-D field solver to computeskin loss and effective dielectricloss tangent

Trace loss, percent per inch

503 MHz = ½·1.06 Gb/s

Skin effect w=.012 in.

Dielectric loss tan. = .02

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HSDD © 2012 v.15

Chapter 2: Properties of Gates

Ground bounce

IBIS (Supplemental)

2.2 HSDD © 2012 v.15

Voltage Margin Budget

VCC MIN

VOH

VIH

0V

VOL

VIL

VCC

DriverPackagedreceiver

Die thresholds(JEDEC 3.3V CMOS)

PowerSystem

Board-level ringing, crosstalk, ground shifts and other noise

Crosstalk (ground bounce) within package

Driver R[OUT]

–10%

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2.3 HSDD © 2012 v.15

What Is Ground Bounce?

Ground Bounce is also called

Simultaneously Switching Output Noise

SSO Noise

Packaging crosstalk

Ground bounce causes glitches in your logic inputs when the device outputs switch.

2.4 HSDD © 2012 v.15

SSO Test Setup

Observe noise on the victim circuit while transmitting multiple aggressive signals.

Victim crosstalk

Gnd

Scope

Gnd

Vcc

Victim stuck high (or low)

DC Block

BGA package

Z0=50

Z0=50

Multiple aggressors

J1

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2.5 HSDD © 2012 v.15

Theory of Operation: Simplistic View

B

A

E

I/Ocurrent

PCB ground plane

Load

VCC net

PCB power plane

Stuckat zero

Substrate

Die

DVGLITCH

+

Close

LGND

C

Switch A closes, pulling current in through I/O ball B.

This surge of current flows through inductance C, causing a voltage glitch on the substrate D.

The voltage glitch at D is visible at the victim output, E.

2.6 HSDD © 2012 v.15

Signature of Inductive Crosstalk

2 mV/div

2 ns/div

Xilinx Crosstalk due to one aggressorStuck high (red)Stuck low (blue)

Nearby aggressor 4 mA, fast200 mV/div

Tek TDS6804B Digital Storage Oscilloscope.8 GHz bandwidth, 20 Gs/s

Direct inputs with 40 inch semi hard-line SMA cables

measured

Crosstalk at A10

Opposite polarities

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2.7 HSDD © 2012 v.15

How SSO Noise Affects Inputs

This simplistic view of ground bounce ascribes inductance only to the ground connection.

B

A

E

PCB power plane

PCB ground plane

Load

VCC net

Substrate

Die

DVGLITCH

+

LGND

C

+–

I/Ocurrent

2.8 HSDD © 2012 v.15

Factors That Reduce Ground Bounce

VGND (PEAK) =LGND

N

di

dt

Slow down the output switching time

The more power and ground pins the better

Use better packaging with reduced lead inductance

Drive fewer loads, or smaller loads, or more closely-connected loads

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2.9 HSDD © 2012 v.15

A Well-dispersed Array of Pwr/Gnd Pins

TEST BOARD24 layers

110 mil thick3 I/O power regions

500 active I/O’s34x34 BGA

2.10 HSDD © 2012 v.15

Crosstalk Contributions Affecting A10

SC

Victim A-10 is back here on the first row5 mV

Crosstalk from individual neighbors

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2.11 HSDD © 2012 v.15

Other Ways to Mitigate Ground Bounce

Differential inputs

Shared reference pins for groups of inputs

Split-power architecture

2.12 HSDD © 2012 v.15

Differential Inputs

x(t)

SW B

SW A

VCC

Out+–

Pre-driver

PCB Ground

PCB VCC

DGND

-x(t)

Every signal comes with its own reference

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2.13 HSDD © 2012 v.15

Shared Reference

x3

SW B

SW A

VCC

Out

Pre-driver

PCB Ground

PCB VCC

DGND

ref

Groups of signals share one input

reference

+–

+–

+–

x1 x2

2.14 HSDD © 2012 v.15

Split-Power Architecture: Core Logic

x(t)

VR-

+

VCC1

+–

Pre-driver

PCB Ground

PCB VCC

AGND

Slide 2.22 overlay

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2.15 HSDD © 2012 v.15

Split-Power Architecture: I/O Ring

PCB Ground

PCB VCC

SW B

VCC2

SW A Out

DGND

Slide 2.22 overlay

2.16 HSDD © 2012 v.15

Split-Power Architecture: Core + I/O Ring

x(t)

VR-

+

VCC1

+–

Pre-driver

PCB Ground

PCB VCC

Out

VCC2

SW B

SW A

DGNDAGND

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2.17 HSDD © 2012 v.15

Points to Remember

Large I/O currents flow through your power and ground connections

These currents cause SSO (ground bounce and power bounce)

SSO noise can double-clock your flip flops

At high speeds, low-inductance packaging becomes crucial

Differential inputs conquer ground bounce

2.18 HSDD © 2012 v.15

Extra for Experts

Inside BGA Packages

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2.19 HSDD © 2012 v.15

Plastic Ball Grid Array (PBGA)

Adapted from John Lau, Ball Grid Array Technology, McGraw-Hill, 1995, ISBN 0-07-036608-X

Via for ground / signal

Gold wire Molding compound Die pad Plated copperconductor

Solder maskVia for

ground / thermalSolder ball

IC

Chip mounts face-up

B-T epoxysubstrate

2.20 HSDD © 2012 v.15

AMKOR Plastic Ball Grid Array (PBGA) with Solder-Bumped Flip Chip

Adapted from John Lau, Ball Grid Array Technology, McGraw-Hill, 1995, ISBN 0-07-036608-X

Underfillencapsulant

Signal/groundvia

Plated copper conductor

Solder mask

Solder ballThermal/ground viaB-T epoxy substrate

Solder mask

IC

Chip mounts face-down

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2.21 HSDD © 2012 v.15

SGS Thomson Ball Grid Array

Adapted from John Lau, Ball Grid Array Technology, McGraw-Hill, 1995, ISBN 0-07-036608-X

Metal heatsink plate Ag epoxy adhesive B-T epoxy substrate

63Sn/37Pb solder ball1.27 mm pitch (0.050”)

Epoxy molding compoundGold wire

IC

Chip mounts face-down

2.22 HSDD © 2012 v.15

Supplemental: IBIS

Vendor-independent format for driver/receiver modeling

Useful for SPICE-like modeling of signal quality and crosstalk, but hides proprietary details of the driver circuit

Includes V-I curves for high and low states, output capacitance, and HI-LO transition times

Begun in 1995

Ver. 4.2 (ANSI/EIA-656-A) ratified 2006ANSI/EIA-676 Global Engineering Docs (800) 854-7179

IBIS Web page www.eigroup.org/ibis/

IBIS models are widely available from major vendors

(I/O Buffer Information Specification)

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2.23 HSDD © 2012 v.15

Component-centric Modeling

One component comprises of multiple I/O typesplaced on the component pins.

GND

A

A

A

B

C

C

C

VCC

B

B

B

B

B

7

1

2

3

4

5

6

8

14

13

12

11

10

9

2.24 HSDD © 2012 v.15

VccVcc

Basic IBIS Output Architecture

R_pkg

C_comp

L_pkg

C_pkg

PullupPulldown

ESD Package model

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2.25 HSDD © 2012 v.15

Meaning of V-I Curves

The V-I curve for a driver defines its static behavior.

= (VCC–VOH) / IOH

2.26 HSDD © 2012 v.15

IBIS Input Architecture

Vcc

R_pkg

C_comp

L_pkg

C_pkg

Die cap.ESDPackage model

RCV

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2.27 HSDD © 2012 v.15

Best Points About IBIS

The V-I curves measured under multiple load conditions are very useful (v2.2).

Use IBIS for ringing and board-level crosstalk simulation below 1 GHz.

It’s more of a specification than a behavioral model, which allows vendors to make multiple versions of chips that all conform to the specification.

IBIS accommodates hierarchical modeling of thousands of pins.

The models are human-readable, and human-fixable.

IBIS models run quickly.

2.28 HSDD © 2012 v.15

IBIS Limitations

Many vendors don’t provide models

Models provided are often missing sections, or wrong

Chips are not guaranteed to perform to the model

Non-linear aspects of ground bounce are not captured in the model; IBIS-based simulators tend to overestimate ground bounce (IBIS is working on this)

High-frequency behavior in complex packages is a very complex problem

Not as detailed a model as SPICE, but then you rarely see a SPICE model of a 600-pin chip.

Differential driver models are accurate only if you use the same common-mode loading conditions used during model generation.

Even with these limitations, IBIS is a great tool and well worth using.

Practical:

Technical:

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2.29 HSDD © 2012 v.15

Sharp Edges

Harish from UT Arlington writes: "I tried the following snippet in PSPICE and found oscillations in the output." Isn't this circuit too short to have such ringing??

Fig. 1

tD/T10-90% = 1/16

2.30 HSDD © 2012 v.15

Decompose the Signal

PWL edge = Gaussian edge + (PWL - Gaussian)

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2.31 HSDD © 2012 v.15

Frequency Response

2.32 HSDD © 2012 v.15

High-frequency Content in the PWL Edge Causes Visible Resonance

Simulate using a signal that "looks like" the signals in your actual system.

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2.33 HSDD © 2012 v.15

A 5th-order Gaussian Edge Generator

Anatol I. Zvrev, "Handbook of Filter Synthesis", John Wiley, 1967

1 ns10-90%

Controlled voltage source buffers output signal

2.34 HSDD © 2012 v.15

Points to Remember

IBIS is coming (ask your vendors for it).

For PCBs operating below 1 GHz most signal integrity simulation software available today can accurately calculate ringing and board-level crosstalk.

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HSDD © 2012 v.15

Chapter 3: Using Your Oscilloscope

You can’t debug a problem that you can’t see.

Popular types of probes

Probe loading factor

Risetime and bandwidth

Sensitivity to the probe ground wire

Measuring your noise floor

Grounding a differential probe

3.2 HSDD © 2012 v.15

Popular Probes for High-Speed Digital Work

Low-capacitance active probe

Differential active probe

Resistive-input probe

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3.3 HSDD © 2012 v.15

FET-input probe

The FET amplifier acts as a buffer separating the input circuit from the cable effects

Uses the cable in a true 50-Ω transmission line mode - the cable can be any length

Tip gets warm due to power dissipation

Connector pinouts must be compatible with scope

Easily blown out by electrostatic discharge—wear a wrist strap!

FET-input amplifier ishidden in the tip

50-Ω terminatorat scope input

50-Ω coax cableTip

Ground

Equalizer andpower conditioningat end of cable

Power is carriedin the probe cable

Input capacitancetip-to-ground ranges from 2 to as littleas 1/6 pF

Bandwidths to 8 GHz

3.4 HSDD © 2012 v.15

Differential Active Probe

Very similar to single-ended FET probe.

Now with even higher bandwidth options at 250-300 ohms input impedance.

FET-input amplifier ishidden in the tip

Sig (+)Sig (-)

Ground(not used)

Equalizer andpower conditioningat end of cable

Input capacitanceon the order of 1-2 pFeach side to ground.

50-Ω coax cable

Power is carriedin the probe cable

+-

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3.5 HSDD © 2012 v.15

Resistive-input probe

Inexpensive & very high bandwidth

Input impedance of 950- resistor exceeds that of a 1-pF capacitor at all frequencies above 160 MHz

Parasitic capacitance across the 950- resistor defines the input capacitance of only 0.1 pF

Hold resistor body away from circuit to limit parasitic capacitance to ground

Requires 3-mA drive current (for 3.3-v logic) only works with low-impedance circuits

Tip-to-ground loop has very tiny inductance L

1000T10-90 = 2.2

L

1/2 inch loop has rise time of 110 ps

950- resistorexposed at tip - attenuates signal 20:1

50-Ω terminatorat scope input

Tip

Ground

L50-Ω coax cable

3.6 HSDD © 2012 v.15

Keep in Mind: A Probe Is a Substantial Load to a Fast Digital Circuit

A 1-pF probe represents a substantial load to circuits operating at 1 ns or faster

In a 50-ohm circuit 1 pF is worth 50 ps

Impedance of 1-pF scope inputat 500 MHz

Suppose we have 1 ns rising edges FKNEE = = 500 MHz0.5

1 ns

XC = 1

(1 pF) 2π (500 MHz)= 318 ohms

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3.7 HSDD © 2012 v.15

Input Impedance of Probes

105

106

107

108

109

1010

1

10

100

103

105

Ohms

Hz

10-pF

1-pF

1-K

The 1-K probe is the worst in this

region

But best here

3.8 HSDD © 2012 v.15

Effect of Probe on Signal Under Test

0 100 200 300 400 500 600 700 800 900 10000.6

0.4

0.2

0

0.2

0.4

0.6

300-ps Risetime50-ohm source

UNLOADED SIGNAL

0.1-pF,1000-ohm

RESISTIVE INPUT PROBE

Affects amplitude1 pF ACTIVE

PROBEAffects timing

Simulated data

Signalamplitude

Time, ps

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3.9 HSDD © 2012 v.15

Which Probe is Best?

Lo-Z circuit Hi-Z circuit

Fast (< 1 ns)

Slow (> 1 ns) 1-pF FET

1-KΩR-in

3.10 HSDD © 2012 v.15

Rise Time and Bandwidth

Same signal, different probes

300 MHz probe

6 MHz probe (1)

5 ns

1 V

(1) High input impedance probe designed for low bandwidth noise filtering applications

Short rise time

Long, slow rise time

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3.11 HSDD © 2012 v.15

Rise Time of Measured Pulse Depends on Both Probe and Scope Bandwidths

Response of scope and probe to ideal input

Actual risetimeof input signal asloaded by probe

(10-90%)

Probe

Composite responsedisplayed on scope

(10-90%)

Vertical Amplifier

TINPUT TPROBE TINPUT2 + TPROBE

2 + TSCOPE2TSCOPE

TPROBE 0.338/(Probe 3-dB bandwidth)

TSCOPE 0.338/(Scope 3-dB bandwidth)

NOTES:

3.12 HSDD © 2012 v.15

Example Calculations

TINPUT TPROBE TSCOPE TSYSTEM = (TPROBE

2 + TSCOPE2) ½

TDISPLAY

= (TINPUT2 + TSYSTEM

2) ½

300* 338 (1 GHz)

338 (1 GHz)

478

564

300 241 (1.4 GHz)

169 (2 GHz)

295 420 (40% error)

300 169 (2 GHz)

169 (2 GHz)

239 383

300 68 (5 GHz)

68 (5 GHz)

96 315 (5% error)

mag

green

blue

*All values in ps unless otherwise noted.

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3.13 HSDD © 2012 v.15

Points to Remember

When figuring a composite rise time, the squares of 10-90% rise time add

A 5-GHz scope with a 5-GHz probe makes a 3.5-GHz instrument

3.14 HSDD © 2012 v.15

Sensitivity to the Probe Ground Wire

Current flow intothe probe is slowedby the self-inductance of the probe's ground connection.

1 in.

+- V

SRI(t)

L 200 nH

Source resistanceof device under test

L is theinductance of the ground connection

Probe input

capacitance

Toscope

RS

L

+

--

+V

100 KI 1

pF

This part hardlymatters for digital circuits3 in.

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3.15 HSDD © 2012 v.15

Ways to ReduceGround Loop Inductance

3 inch ground wire 100-200 nH

3 inch 18 AWG (much fatter wire) 85-170 nH

Short ground attachment 10-20 nH

Knife blade ground 10-20 nH

(Not worth the trouble)

Big, fat knife blade shorts probe ground to pc ground

(big difference)

Short ground attachment pins havefairly low inductance

Tip

Ground Tip

Ground

3.16 HSDD © 2012 v.15

Do These Methods Work?

FET active probe; 1.7 pF; rated 1 GHz; source = 4.7 ohms.

4.7 Ohm Source

1 Volt

1 nS/div

With plastic probe clipand 3" ground wire

Using bare probe tipand 3" ground wire

Using bare probe tipwith probe collar directlygrounded to circuit boardby X-acto knife method

Ground wire

Ground wire

X-acto knife ground

FRES = 1

2 LC

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3.17 HSDD © 2012 v.15

Points to Remember

A 1-pF probe looks like 300 ohms to a 1-ns rising edge

A three inch ground wire used with a 1-pF probe induces a 350 MHz resonance

The resonance problem shows up the most when probing low impedance sources

Fattening the ground wire hardly helps with ringing

Radically shortening the ground loop radically improves the ringing response

3.18 HSDD © 2012 v.15

Extra for Experts

Checking for magnetic interference

Checking for ground-current noise

Differential probing

Probing without ground

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3.19 HSDD © 2012 v.15

Spurious Magnetic Interference

Ground wire loops pick up noise.

Noise coupled through the probe ground loop is indistinguishable from noise present at the signal node under test.

This additive noise, if synchronous with the signal under test, is difficult to separate from other real features of the signal.

3.20 HSDD © 2012 v.15

How to Tell When Magnetic Pickup Is Going to Be a Problem

Ground the probe to its own tip.

Use the self-grounded probe to look for magnetic fields near printed circuit board.

Don't touch digital logic ground.

Whatever you see willappear superimposed onevery signal you observe.

Using a short ground attachment helpsenormously.

Magneticfield detector

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3.21 HSDD © 2012 v.15

Detecting Circulating Ground Currents

Ground the probe to its own tip.

Touch tip and ground together to digital logic ground.

You should see nothing.

If the pcb digital ground and scope ground differ, then current will flow through the probe ground wire, and from there through the probe shield to the scope, generating noise as it goes along.

This ground-current noise appears superimposed on everything you observe.

Using a short ground attachment helps enormously.

Ground-currentdetector

3.22 HSDD © 2012 v.15

Differential Probing

The differential probe doesn’t need a ground wire

Connect the scope to the digital logic ground through other means.

Place both (+) and (-) probes on ground to test for magnetic and ground-current noise.

Place both (+) and (-) probes on a common signal to test for balance.

Signal +

Signal -

PCB Digital Ground

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3.23 HSDD © 2012 v.15

Probe Network

For accuracy, the probe impedance should greatly exceed the source and grounding impedances.

3.24 HSDD © 2012 v.15

Broken Ground Makes Measurements Unreliable

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3.25 HSDD © 2012 v.15

Points to Remember

Make a magnetic field detector to test for noise induced by mutual inductive coupling.

Touch both probe and ground to digital logic ground to test for noise pickup due to ground currents

Differential probes are not directly grounded to digital logic ground.

Single-ended probes should be grounded at the source.

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HSDD © 2012 v.15

Chapter 4: Transmission Lines

Transmission line impedance and delay

Examples of un-terminated line performance

4.2 HSDD © 2012 v.15

Cross Sections of Popular Transmission Line Geometries

Coaxial cable

Twisted pair

Inner conductor

Jacket (dielectric)

First conductor

Jacket (dielectric)

Second conductor

Inner dielectric

Outer jacket

Outer shield

Stripline

Microstrip

Ground plane

Ground plane

Conductor

Dielectric

Ground plane

Conductor

Dielectric

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4.3 HSDD © 2012 v.15

Properties

Transmission lines have many exotic properties, and are the subject of much scientific study.

We will study here only those basic aspects which apply to the practice of distributing high-speed digital signals over copper PCB traces at moderate distances:

Characteristic impedance

Delay

High-Frequency Loss

Crosstalk

4.4 HSDD © 2012 v.15

Characteristic Impedance:Let's Be Clear

Characteristic impedance is the ratio of voltage to current in a transmission line wave traveling in one direction.

In the first instant after a wave is launched, before it has time to bounce off the far end and return to the source, the input impedance of a PCB trace looks resistive.

During this first instant, it does not look capacitive.

??Nothing comes back until after reflection at far

endOnly one mode exists here

during first round trip

The initial signal flows this way...

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4.5 HSDD © 2012 v.15

Time, ns0 1 2 3 4 5 6 7 8 9 10

-101234

Initial step response at input is flat

Received signal

y(t)

Z0 + RS

x(t) Z0y(t) =

Characteristic Impedance:Response to Step Input

Transmissionline

Capacitiveload = 40pF

+–

RSZ0

–+

RS

y(t)x(t)

z(t)x(t)

Time, ns0 1 2 3 4 5 6 7 8 9 10

-101234

z(t) starts low, then rises to full drive level

Further out in time strange things happen depending on the load...

25= 50

25

4.6 HSDD © 2012 v.15

Ice-Cube Tray Analogy

...Works like an ice-cube tray

The L-C ladder model...

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4.7 HSDD © 2012 v.15

Equivalence of Z0 and RTERM

Initial edgezooms by

Nothing reflects from this

arbitrary position

Nothing reflects from this

perfect termination

The driver perceives these circuits as

equivalent.Initial edge

Infinite

4.8 HSDD © 2012 v.15

Approximate Geometries For 50-Ω and 70-Ω Lines

All substratesFR-4; r = 4.5

Microstrip, 70

Stripline, 70

H4

H

2H

Exact Z0 depends on trace thickness and edge finish

H

H

Stripline, 50

1.5

Microstrip, 50

2H

H

2H

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4.9 HSDD © 2012 v.15

Relations Between Impedance and Delay

Calculations involving L, C, and tD can be accomplished using per-inch units, or whole-line units.

L = 10 nH/inchC = 2 pF/inch

Z0 = 70tD = 140 ps/inch

H/W = 1:1FR-4 outer layer

+–

+–

0

D

LZ

C

t LC

D 0

D

0

L t Z

tC

Z

L

C

4.10 HSDD © 2012 v.15

Points to Remember

In the first instant after a wave is launched, before it has time to bounce off the far end and return to the source, the input impedance of a PCB trace looks resistive.

PCB trace impedance depends on the ratio of trace width to trace height

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4.11 HSDD © 2012 v.15

Effects of Source and Load Impedance

Any combination of source and load impedances connected to a real transmission line will degrade its performance.

The degradation may be slight or it may be devastating.

A good tool for understanding how the source and load interact with a transmission line is the time-space diagram.

4.12 HSDD © 2012 v.15

Exponential Decay

Any process, repeatedly attenuated, declines exponentially.

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4.13 HSDD © 2012 v.15

Exponential Decay

The convergence error declines exponentially.

Convergence error

4.14 HSDD © 2012 v.15

Bounce

T

T

Bounce again

Fraction of signaltransmitted to load

Same attenuation on each pass

HT

A

AHT2H

1

H

H

H

1

2

2

AH (2H1H) T

AH (2H1H)2 T

Far end receives a succession of attenuated steps

Initial attenuation

Time-Space Diagram: Alphabet Soup

Z0ZS

ZL

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4.15 HSDD © 2012 v.15

Step 1

Step 2

Step 3

Evolution of Transmission Line Response

Z0ZS

ZL

T

T

HT

A

2H

1

H

H

H

1

2

2

Time

Time

Volts

Space

4.16 HSDD © 2012 v.15

A Ringing Waveform Decays Exponentially

Decay envelope = kn

Round-trip delay

Final value

k

k2

k3

k4

k5

Any damped process converges given enough time.

Convergenceerror

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4.17 HSDD © 2012 v.15

Mathematical Convergence Relation

(12H2) Exponential convergence factor (roundtrip)

N Number of round-trips

E Permitted fractional settling error

Ways to improve performance

Reduce 1 (source termination)

Reduce 2 (end termination)

Increase N (short-line method)

Decrease H (increase line attenuation)

(12H2)N < E

k

4.18 HSDD © 2012 v.15

The Reflection Function,

1/100 1/10 1 10 100-1

-0.5

0

0.5

1

Normalized termination coefficient ZL/Z0

Reflection coefficient

Reflections never exceed the size of the incoming signal: | | < 1

23

1/21/3

(1+) A matching ratio of 110% yields a reflection of 5%.

Even a horrible matching ratio, like 3:1, still produces a reflection of only 50%.

0.330.50

-0.33-0.50

/2

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4.19 HSDD © 2012 v.15

Reflection Chart

A 10% termination mismatch causes a 5% reflection

A mismatch of 3:1 absorbs half the incoming signal (-6 dB)

Coefficient T often exceeds unity

Z0

T(w)

ZL(w)

Unit step inputZL

Z0

ZL - Z0

ZL + Z0

T = 1 +

0 -1 0

1/3 -1/2 1/2

1/2 -1/3 2/3

0.90 -0.05 0.95

1.00 - 1.00

1.10 +0.05 1.05

2 +1/3 4/3

3 +1/2 3/2

+1 2

=

4.20 HSDD © 2012 v.15

Example: Un-Terminated Line Performance

Source impedance too low

(RS < Z0)

Source impedance too high

(RS > Z0)

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4.21 HSDD © 2012 v.15

Low Source Impedance

Reflection at far end is positive (2 = +1)

Reflection at source end is negative (1 = -1/2 )

Signal alternates polarity each round trip

RS = 17

50

A = 3/40.750

HT = 2

1.50 First incident wave

Roundtrip time = 2tD

Open circuit at end

H

1 = -1/2

-0.375

-0.75+1

-0.375-1/2

+0.187

Total result for perfect step input

Third

Second

2 = +1H 0.750

4.22 HSDD © 2012 v.15

Step Response of Unterminated Line With Low Source Impedance

Reflection at far end is positive, at source end is negative

Signal alternates polarity each round trip

One round-trip delay

Final value 1.00

Initial stepis too big

Exponential decay envelope

2 Z0

RS + Z0

RS = 17

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4.23 HSDD © 2012 v.15

What If We Increase RS ?

One round-trip delay

RS

Final value 1.00

Initial overshootdiminishes

50423525

17Exponential

convergence quickens

4.24 HSDD © 2012 v.15

What if We Lengthen the Risetime ?

Increasing risetimes still leave noticeable ringing with a period of 4tD, but ringing amplitude is diminished.

A very long risetime (T10-90%>6tD) can force a monotonic result.

One round-trip delay

T10-90% = tD

T10-90% = 2tD

T10-90% = 3tD

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4.25 HSDD © 2012 v.15

High Source Impedance

Reflection at far end is positive (2 = +1)

Reflection at source end is positive (1 = +1/2)

Signal accumulates with same polarity each round trip

Open circuit at end

1 = +1/2

H0.125

First incident wave

Roundtrip time = 2tD

Second

Third

Total result for perfect step input

50

RS = 150

HT = 2

A = 1/40.250

0.500

2 = +1H

0.250

4.26 HSDD © 2012 v.15

Step Response of Un-terminated Line With High Source Impedance

Reflection at both ends is positive

Signal accumulates monotonically

One round-tripdelay

Final value 1.00

Initial stepis too small

2 Z0

RS + Z0

Monotonic exponentialbuild-up

Reminds me of a stegosaurus

Copy right 1996 Joe Tucciarone & Jeff Poling

RS = 150

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4.27 HSDD © 2012 v.15

Try Reducing RS

One round-trip delay

Final value 1.00

Convergence time improves assource impedance is reduced.

150

100

705850

RS

Z0 = 50 remains fixed as wetry different value of source impedance.

Start

4.28 HSDD © 2012 v.15

Try Raising Z0

One round-trip delay

Final value 1.00

Convergence time improves whenyou fix the ratio RS/Z0

50

75

107130150

Z0

This time, RS = 150 remains fixed while we vary the line impedance.

Start

All that matters is this ratio: RS/Z0

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4.29 HSDD © 2012 v.15

What if We Lengthen Risetime ?

One round-trip delay

Final value 1.00Resembles R-Crelaxation withT0-63%=RC

This is the source of the myth thatthe input to a transmission line looks

like a capacitive load

T10-90% = tD

T10-90% = 2tD

T10-90% = 3tD

Steps easily mush together

4.30 HSDD © 2012 v.15

Points to Remember

Source impedance too low: Ringing

(RS < Z0)

Initial step too big (overshoot)

Source impedance too high: Stegosaurus

(RS > Z0)

Initial step too small (doesn’t meet VOH)

End chapter 4.

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4.31 HSDD © 2012 v.15

Capacitive Loading

Extra for Experts

4.32 HSDD © 2012 v.15

Remember This Circuit?

T10-90% = 1 ns

1-in. trace10Load

= 6 in.Z0 = 65 ohmdelay = 1/6 ns

Remember this?

Load (optional)

L"π" model

½C ½C

It acts like this:

10 10 nH

1 pF 1 pF10 pF

T10-90% = 1 ns

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4.33 HSDD © 2012 v.15

Disconnect the Load

L"π" model

½C ½C

10 10 nH

1 pF 1 pF

Below 1GHz, this impedance exceeds 160.

In parallel with 10, it's impedance is inconsequential, so we may ignore it, leaving us with a simple 2-pole LPF.

10 10 nH

1 pF

T10-90% = 1 ns

FRES =2 (10 nH)(1 pF)

1

= 1.6 GHz,

The resonance lies well above the knee frequency of 500 MHz so I expect no resonant effects.

4.34 HSDD © 2012 v.15

Now, Add the Load

10 10 nH

1 pF

FRES =2 (10 nH)(11 pF)

1

= 480 MHz,

The load increases the total capacitance by an order of magnitude, dropping the resonant frequency by 1/3rd, leaving it dead on top of the knee frequency.

A large resonance is clearly visiblein the step response.

10 pF

The 10-pF load is huge compared to the natural capacitance of the transmission line.

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!!!"#$%&'("&')

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HSDD © 2012 v.15

Chapter 5: Solid Plane Layers

Intuition about crosstalk and return current

Ground plane slots

Guard traces

Split power planes

Ground isolation regions

5.2 HSDD © 2012 v.15

Early Computers Had No Solid Planes

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5.3 HSDD © 2012 v.15

Microstrip Response to Changing Magnetic Field

5.4 HSDD © 2012 v.15

Microstrip Crosstalk

These lines of flux create crosstalk.

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5.5 HSDD © 2012 v.15

Microstrip 2-D Cross-section

Aggressor Victim

This flux

matters

5.6 HSDD © 2012 v.15

Animation

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5.7 HSDD © 2012 v.15

251 mV for T10-90% < 2(trace delay)

26 mV/inch at T10-90% = 1 ns

148 mV for T10-90% < 2(trace delay)

19 mV/inch at T10-90% = 1 ns

NEXT

FEXT

Board #1 Board #2

Do Not Give Your PCB Vendor Full Control Over H and W

These boards have the same trace impedance, but…

Crosstalk varies strongly with H, so

Board #2 has substantially more NEXT than board #1

W=.005H=.005

W=.007

H=.007

D=.015 D=.015

Same finishedthickness Same W/H

Same Z0

VCC = 3.3V

5.8 HSDD © 2012 v.15

How Much Can You Take?

VCC MIN

VOH

VIH

0V

VOL

VIL

VCC

DriverPackagedreceiver

Die thresholds(JEDEC 3.3V CMOS)

PowerSystem

Board-level ringing, crosstalk, ground shifts and other noise

Crosstalk (ground bounce) within package

Driver R[OUT]

–10%

6%8%

=200 mV

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5.9 HSDD © 2012 v.15

Points to Remember

A solid plane is a very good defense against crosstalk.

The closer you place your traces to the plane, the less crosstalk you will suffer.

5.10 HSDD © 2012 v.15

Where Simulation Fails Us

Signal integrity simulators do well predicting crosstalk ASSUMING

Solid reference plane layers under every trace

Perfect layer transitions

No cuts, separations or slots in the reference planes

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5.11 HSDD © 2012 v.15

The Path of Return Signal Current

High-speed current follows the path of least inductance

At low speeds, currentfollows the path of least resistance

At high speeds, return currentstays tightly bunched undersignal trace

5.12 HSDD © 2012 v.15

The High-Speed Path Can Look Pretty Strange

Signal current

Return current

Return currentcirculates all the way around the loop—it does not cut the corner.

VTT

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5.13 HSDD © 2012 v.15

Distribution of High-Frequency Current Underneath a Signal Trace

Cross-sectional viewof microstrip

Dhorizontaldistance

H

W

Reference plane

H1 +

1

D 2Trace

Stray current density in the tails varies in rough proportion to:

Magnetic fields fromstray current causecrosstalk

5.14 HSDD © 2012 v.15

What about Capacitance?

When low-impedance traces come out of the board on package pins, connectors, or other exposed wiring, inductive crosstalk dominates.

Between two long, parallel traces within a homogeneous dielectric, inductive and capacitive remain in balance.

Fortunately, in this situation capacitive crosstalk follows the same 1/D2 law as inductive crosstalk.

Therefore, all we really have think about, for crosstalk between low-impedance circuits, is inductive crosstalk.

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5.15 HSDD © 2012 v.15

Crosstalk Versus Trace Separation Experiment

50 Ω 50 Ω

50 Ω

Aggressor

Victim

Pulse generator D is variable

D = trace-to-trace horizontal centerline pitch, inchesH = centerline height of traces above ground (0.016”)overlap region = 330 ps in length (2”)

Solid ground plane

37 MHz clock 3V p-p

T10-90% = 2.5 ns

5.16 HSDD © 2012 v.15

Crosstalk Over a Solid Ground Plane

0 10 20 30 40 50–0.4

–0.3

–0.2

–0.1

0

0.1

0.2

0.3

0.4

Time, ns

Volts

D/H = 2D/H = 4

D/H = 8

Tektronix 7000 series

Crosstalk falls off as 1/D2

Aggressor signal: 3v p-p

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5.17 HSDD © 2012 v.15

Crosstalk Over a Solid Ground Plane

Ratio (D/H) of trace pitch to trace height

Crosstalk picked up in 330 ps

overlap region(mV)

1 10 1000.1

1

10

100

1/D2

Stripline Crosstalk Study

H2

H1

The effective height:

H =1

+H1

1

H2

1

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Stripline Crosstalk Versus Separation

NOTE: H is the "effective height"

5.20 HSDD © 2012 v.15

Crosstalk Versus Trace Separation

Microstrip Stray current density falls off with 1/D2 as we move

away from the signal conductor

Stray current causes crosstalk

Therefore, crosstalk falls off with 1/D2 as we separate two traces

Separating traces over a solid ground plane is the most effective way to combat crosstalk

StriplineCrosstalk falls off even more rapidly with distance

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5.21 HSDD © 2012 v.15

C

Aggressor

Victim

Crosstalk is Directional

Near-end crosstalk Far-end crosstalkC

(None for striplines)

Capacitive crosstalk is the same is both directions.

5.22 HSDD © 2012 v.15

Capacitive coupling

Inductive coupling

+L

Crosstalk is Directional

Near-end crosstalk on victim

Far-end crosstalk on victim

These terms reinforce

These terms almost cancel for microstrips,and perfectly cancel for striplines.

+ –

–L

(None for striplines)

C

Aggressor

Victim

C

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5.23 HSDD © 2012 v.15

Points to Remember

Both signal and return currents are equally capable of generating crosstalk.

If you provide a solid reference plane your return current will use it, staying generally underneath the signal trace.

Crosstalk is VERY sensitive to the spacing and height of your traces.

Get a crosstalk simulation tool.

5.24 HSDD © 2012 v.15

Ground Plane Slots

Ground slots happen most often about 3:00 am, when someone runs out of room on the regular routing layers.

They cut a long narrow slot in the solid plane layer and place the trace in the slot.

Slots destroy the effectiveness of your solid plane layer.

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5.25 HSDD © 2012 v.15

Traces Passing Over a Ground Plane Slot

Ground slots add inductance to traces passing perpendicularly over the slot, and increase crosstalk.

C

A

D

B

Signal current remains confined to traces

Return current flows around hole

Hole in reference plane

Reference plane

Slot length

Return current

5.26 HSDD © 2012 v.15

Crosstalk From Ground Plane Slots

The diverted return current from trace A-B overlaps heavily with the current loop formed by trace C-D.

Overlapping current loops make mutual inductance

This mutual inductance causes crosstalk.

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5.27 HSDD © 2012 v.15

Connector Layout Slots

Ground slots also happen on dense back planes which pass through fields of connector pins.

Always make sure the ground clear-outs around each pin have ground continuity between all pins.

Clear-out holesfor connectorpins are too big;ground is not continuous throughthe pin field

Return signalcurrent mustflow aroundthe pin field

Return signalcurrent flowsstraight throughthe pin field

Groundplane

Clear-out holesfor connectorpins are OK

5.28 HSDD © 2012 v.15

Crosstalk Versus Trace Separation: Over a Ground Plane Slot

50 Ω 50 Ω

50 Ω

Aggressor

Victim

Pulse generatorD is variable

D = trace-to-trace pitch (centerline-to-centerline), inchesH = height of traces above ground (0.016”)overlap region = 330 ps in length

Two solid ground planes;either one or both may have a slot

Planes are stitchedtogether all around edges

37 MHz clock 3V p-p

T10-90% = 2.5 ns

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5.29 HSDD © 2012 v.15

Crosstalk Over a Slotted Ground Plane

0 10 20 30 40 50–0.4

–0.3

–0.2

–0.1

0

0.1

0.2

0.3

0.4

Time, ns

Volts

Aggressor signal: 3v p-p

D/H = 2

D/H = 4 D/H = 8D/H = 16

D/H = 33

Crosstalk hardly falls off with distance

Slot in bothtop and bottom planes

Tektronix 7000 series

5.30 HSDD © 2012 v.15

Crosstalk Over a Slotted Ground Plane

1 10 1001

10

100

1000

Ratio of trace pitch to trace height

Cro

ssta

lk,

mV,

pic

ked u

pin

330 p

s ove

rlap

reg

ion

Slot in top only; bottomlayer is solid ground

Slot in top and bottom

Aggressor positions

1/D2

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5.31 HSDD © 2012 v.15

Why Wasn’t the Lower Plane Very Effective?

Crosstalk varies with H2

The lower plane is too far away to provide much help

D/Hratios 2:1

4:16:1

0.015

0.055(4x increase in H)

First plane

Second plane

5.32 HSDD © 2012 v.15

Points to Remember

Slots in a ground plane create unwanted inductance.

Slot inductance slows down rising edges.

Slot inductance creates mutual inductive crosstalk.

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5.33 HSDD © 2012 v.15

These techniques save layers, but…

Not for high-speed digital design.

Ye Olde Non-Continuous Grounde Plaenes (1980)

Still used in low-speed and analog products

Power and ground fingers

Cross-hatched ground grid

We will use these old examples to build your general knowledge of crosstalk.

5.34 HSDD © 2012 v.15

Power and Ground Fingers

Returningcurrentmust flowall theway around edge ofboard

Power and ground tracescontinue under each chip

GroundDirectsignalpath +5 V

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5.35 HSDD © 2012 v.15

+5 VGround Top layer

Backlayer

Trace

length

Y

Returningcurrent mustfollow powerand groundwires, stayingclose tooutgoing signalpath

Cross-hatchedspacing isthe same inboth directions

Tracewidth is

X

Directsignalpath

W

These horizontal members

underneath the verticaltraces

are continuous, passing

Cross-Hatched Ground Grid

5.36 HSDD © 2012 v.15

+5 VGround Top layer

Backlayer

New return path

Directsignalpath

These horizontal members

underneath the verticaltraces

are continuous, passing

Guard Trace Helps a Two-Layer Board

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5.37 HSDD © 2012 v.15

Ordinary Microstrip Crosstalk

5.38 HSDD © 2012 v.15

Make Room for the Guard Trace

0 dB

Gained a factor of

four!

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5.39 HSDD © 2012 v.15

The Guard Trace is Not Yet Grounded

0 dB

5.40 HSDD © 2012 v.15

Even If Grounded, Flux Leaks Through

Guard Floating or not present: NEXT Coefficient = 0.015

-2 dB -9 dB

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5.41 HSDD © 2012 v.15

Guards Appear More Effective at Ridiculous Heights

+9 dB+16 dB

5.42 HSDD © 2012 v.15

Points to Remember

Crosstalk arises whenever the signal path separates from its return path.

If you already have solid planes in your board, do not mess around with guard traces—just use rules of spacing to control crosstalk.

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5.43 HSDD © 2012 v.15

Crossing a Split Power Plane Boundary

PCB cross section

Returning current can’t get across the slot;

GND

+3.3V+2.5V

5.44 HSDD © 2012 v.15

Crossing a Split Power Plane Boundary

Returning current diverts through bypass capacitors.

GND

+3.3V+2.5V

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5.45 HSDD © 2012 v.15

Crossing a Split-Plane Boundary

2.5-V region 3.3-V region

3.3V2.5V

GND GND

High-speed currents divert through capacitors to bridge the gap.

Stitch planes together with a double row of capacitors.

Your best routing layers lie adjacent to ground. Such layers do not reference any split-power regions.

This architecture creates a series of

gaps the size of the capacitor

spacing.

5.46 HSDD © 2012 v.15

Measuring Split-Plane Crosstalk is Easy

Solder bypass capacitors vertically in the holes to simulate your bypass array.

Aggressor

Victim

Pulse generator

Two-sided core.Split the top plane.

Your risetimeand amplitude

50 Ω

50 Ω

50 Ω

cat.5 UTP wires

Bypass locations

Connect planes

Your core spacing

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5.47 HSDD © 2012 v.15

Implications for Signal Routing With300 ps Edges And Faster

Return current cannot simply jump between widely separated planes.

5.48 HSDD © 2012 v.15

Implications for Signal Routing With300 ps Edges And Faster

Bypass capacitors convey returning signals currents between planes wherever the signal path penetrates the layer stack.

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5.49 HSDD © 2012 v.15

A Better Way to Route the Same Board

Use layers on either side of a plane as a routing pair

Reduces crosstalk

Reduces PWR-GND noise

Reduces EMI

Wherever the signal penetrates the planethere exists a natural path for returning signal current.

H

V

H

V

5.50 HSDD © 2012 v.15

Six-Layer Stacks

horiz

horiz

vert

vert

Plane layers at top and bottom

Power layers in center

horiz

horiz

vert

vert

Best for pwr-gnd

noise

Much better for crosstalk

Fix power problems with lots of bypass capacitors

Best overall for digital designs

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Stamp

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5.51 HSDD © 2012 v.15

NASA* Layer Stack

*Only NASA can afford this...

Ground planes sandwich the power layer

0.063-in. totalthickness

0.005

0.005

0.005

0.005

0.005

0.005

0.005

Layer 9: 0.005-in. width, 0.015-in pitch,50 Ω (offset stripline)

Layer 10: 0.005-in. width, 0.015-in. pitch,50 Ω (offset stripline)

Layer 14: 0.008-in. width, 0.015-in. pitch,50 Ω (microstrip)

Layer 1: 0.010-in. width, 0.015-in. pitch,50 Ω (microstrip)

Layer 5: 0.005-in. width, 0.015-in. pitch,50 Ω (offset stripline)

Layer 2: ground plane

Layer 6: 0.005-in. width, 0.015-in. pitch,50 Ω (offset stripline)core

core

core

0.005

0.005

core

0.002

0.002

0.005

0.002

Layer 3: power planeLayer 4: ground plane

Layer 7: funky power planeLayer 8: ground plane

Layer 11: ground planeLayer 12: power planeLayer 13: ground plane

horiz

vert

horiz

vert

horiz

vert

core

core

5.52 HSDD © 2012 v.15

Good High-Speed Practices for Big, Fat Boards

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5.53 HSDD © 2012 v.15

When to Segment the VCC Plane

IC's with the same logic levels, and the same sensitivity to noise, tie together to a common set of Vcc/Gnd planes.

Use separate regions for:

IC's with different power voltages

PLL's or clock generators with special sensitivity to power supply noise

I/O chips that must not have noise on their power terminals

5.54 HSDD © 2012 v.15

Place Your Special Power Region in a Corner of the PCB

Make slot 20H wide

Special power region

Regular VCC

Ground

Inductor or VRM feeds special region

Capacitors control noise only with respect to local ground.

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5.55 HSDD © 2012 v.15

Extra For Experts

Crosstalk NEXT and FEXT examples

5.56 HSDD © 2012 v.15

NEXT and FEXT Can Be Separately Measured

Aggressor

VictimNEXT(t) FEXT(t)

tD

NEXT is a positive pulse with a duration of (2tD + T10-90%).

FEXT for microstrips is a negative pulse with a duration of T10-90%.

FEXT for striplines is zero.

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5.57 HSDD © 2012 v.15

Stretching the Trace Length

100

mV

/div

1 nsec/div

FR-4 substrateZ0=64 ohms3.3-CMOST10-90% = 1 nsD/H = 15/7 = 2.14 Area(FEXT)/Area(NEXT) = 0.31

D=15

W=7H=7

Aggr. Victim

NEXT

FEXT

Crosstalk for parallel runs of1/2, 1, 2, 4, 8 and 16 inches

265 mV

HyperLynx LineSim

NEXT duration grows linearly with trace lengthFEXT amplitude grows linearly with trace length

5.58 HSDD © 2012 v.15

Moving Closer to the Reference Plane

100

mV

/div

1 nsec/div

NEXT

FEXT

Crosstalk for parallel runs of1/2, 1, 2, 4, 8 and 16 inchesD=15

W=5H=5

Aggr. Victim

FR-4 substrateZ0=64 ohms3.3-CMOST10-90% = 1 nsD/H = 15/5 = 3.00 Area(FEXT)/Area(NEXT) = 0.42

155 mV

HyperLynx LineSim

NEXT changes quadratically with HFEXT changes quadratically with H

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5.59 HSDD © 2012 v.15

Separating the Traces

100

mV

/div

1 nsec/div

NEXT

FEXT

Crosstalk for parallel runs of1/2, 1, 2, 4, 8 and 16 inches

FR-4 substrateZ0=64 ohms3.3-CMOST10-90% = 1 nsD/H = 25/5 = 5.00 Area(FEXT)/Area(NEXT) = 0.58

D=25

W=5H=5

Aggr. Victim

55 mV

NEXT changes quadratically with 1/DFEXT changes quadratically with 1/D

HyperLynx LineSim

5.60 HSDD © 2012 v.15

D=15

W=5H1=9

Aggr. Victim

H2=21

Striplines Have No FEXT

Here we’ve changed to a a 5-mil microstrip with 15-mil pitch. The reference plane heights have been adjusted to create 65-ohm traces.

High frequency losses will be similar to the 5x5 microstrip.

The D/H ratio is similar to the 7x7 D=15 microstrip, so you will get similar amounts of NEXT, but no FEXT.

H(effective) 1/(1/9 + 1/21) = 6.3D/H = 15/6.3 = 2.38

100

mV

/div

1 nsec/div

Crosstalk for parallel runs of1/2, 1, 2, 4, 8 and 16 inches

NEXT

No FEXT

263 mV

HyperLynx LineSim

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5.61 HSDD © 2012 v.15

How NEXT Becomes a Far-End Problem

Aggressor

Victim

The aggressive signal creates NEXT that proceeds towards the source.

FEXT(t) + NEXT(t-tD)

tD

The NEXT bounces off the victim driver and finally appears at the far end.

t

The receiver gets a combination of both FEXT and NEXT.

5.62 HSDD © 2012 v.15

It Doesn’t Help to Use Source-Termination

Aggressor

Victim

Along the way back, it creates some NEXT

The aggressive signal goes out

t

Which ends up at the receiver.

And bounces off the endpoint

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5.63 HSDD © 2012 v.15

FR-4 substrateZ0=64 ohms3.3-CMOST10-90% = 1 nsD/H = 15/5 = 3.00

FEXT + NEXT at End of Line

NEXT(reflected)

FEXT

Aggregate

100

mV

/div

1 nsec/div

FEXT+NEXT for parallel runs of1/2, 1, 2, 4, 8 and 16 inchesD=15

W=5H=5

Aggr. Victim

Waveforms have been time-aligned for clarityEnd termination is used.

HyperLynx LineSim

5.64 HSDD © 2012 v.15

The Both-Ends Termination Kills NEXT

Aggressor

Victim

Along the way out, it creates some NEXT...

The aggressive signal goes out...

t

...And dies at the endpoint.

...That dies at the source.

NEXT never reaches the receiver.

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5.65 HSDD © 2012 v.15

Bonus Question

In a case with weak crosstalk coupling, what happens if the victim is left un-terminated?

5.66 HSDD © 2012 v.15

Factors That Influence Crosstalk

Most powerful factors

Move traces closer to the nearest reference plane (and make them skinnier to keep impedance constant)

Move traces further apart

Reduce amplitude of the aggressor

Special factors applicable onlywhen risetime exceeds roundtrip delay

Reduce length of the parallelism

Slow down the rise/fall time

Systemic factors

Use stripline (kills FEXT)

Use both-ends termination (kills NEXT)

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HSDD © 2012 v.15

Chapter 6: Terminations

End-Terminations

Source Terminations

Comparison of termination types

Multi-drop configurations

Double-terminated bus design

PCI bus design

6.2 HSDD © 2012 v.15

Systems That Ring Benefit From Termination

-+Long line with

powerful driver andno terminations

Short line with powerful driver and

large capacitive load

10

A stegosaurus is not improved by termination.

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6.3 HSDD © 2012 v.15

Standard Ways to Stop Reflections

End termination

Series termination

Both ends termination

Any of these approaches can prevent problems withlong-line reflections or short-line ringing

Most popular styles for digital logic

6.4 HSDD © 2012 v.15

End Termination

Uses terminating resistor at far end.

Sets far end reflection to zero.

End terminations dissipate a lot of static power.

Z0

Low impedance at source

2 = 0

Practically nothingsurvives the first reflection

RT = Z0

A = 1

T = 1

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6.5 HSDD © 2012 v.15

Function of Split Termination

The values R1 and R2 in the split termination set the amount of driver current required in the LO (and HI) states of operation.

Z0

IOL = - (VCC - VOL) / R1 - VOL/R2

R1VOLVOL

R2

VCCI+

I-

LO state

-IOL

6.6 HSDD © 2012 v.15

Design Constraints

Tradeoff HI and LO drive current requirements to match gate capabilities

Constraints:

(R1 R2)/(R1 + R2) = Z0

Don’t exceed IOL max

Don’t exceed IOH max

VCC

Z0

R2

VCC

R1

R1 in parallel with R2should equal Z0 ohms

A two-variable optimization problemwith three constraints (one of which is non-linear).

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6.7 HSDD © 2012 v.15

Mental Image of Split Terminator

Think of the split terminator as a single resistor, of value RT=Z0, connected to a battery.

Setting VT higher makes it easier to drive high, but harder to drive low

Setting VT lower makes it easier to drive low, but harder to drive high

Setting VT in the middle makes it equally difficult to drive high or low

RT

VT

Values R1 and R2 in the split terminator determine the battery voltage.

6.8 HSDD © 2012 v.15

Design Process

1. Set resistor value equal to Z0

2. Adjust VT to satisfy IOL max and IOH max

3. Simple equations convert (RT, VT) into split-terminator topology

VCC

GND

R1

R2

…then transform to this...

RT

VT

First design this…

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6.9 HSDD © 2012 v.15

Solve for VT and RT

If ZMIN < Z0 , solutions exist for RT = Z0 .

If ZMIN > Z0, solutions exist only for RT ZMIN .

Whatever value you pick for RT, make sure VT falls between the solution constraints [1] and [2].

VT > VOH - IOHRT

VT < VOL - IOLRT

High drive condition

Low drive condition

ZMIN=

Solution constraints for VT (final-value current conditions):

Always check this quantity:

IOH - IOL

VOH - VOL ZMIN is the smallest impedance a gate can safely drive.

[1]

[2]

[3]

Solutions exist only for RT ZMIN

6.10 HSDD © 2012 v.15

Transform Back to Split Topology

VCC

GND

R1 = RT

VCC

VT

R2 = RT

VCC

VCC - VT

RT

VT…do this...

Given VT and RT :

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Time

Voltage

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6.13 HSDD © 2012 v.15

Amplitude of Reflected Pulse

(approximation)

Z0 = 50 ΩC = 5 pF gate T10-90% = 1 nS

12%

(1/2) Z0 C

T10-90%

Where

Result

VPEAK

V

VPEAK

VThe derivation of this formulaappears in AHSSP chapter 3.

6.14 HSDD © 2012 v.15

Effect of Stub at Termination

T10-90%Z0

CINCSTUB

VPEAK V(1/2)(Z0(CIN+CSTUB))

T10-90%

RTERM Z0

Substituting CSTUB = tSTUB/Z0,

VPEAK V(1/2)(Z0CIN)

T10-90%

+ V(1/2)(Z0(tSTUB/Z0))

T10-90%

= V(1/2)(Z0CIN)

T10-90%

+ V(1/2)tSTUB

T10-90%

The contribution of the stub to the reflected signal is this:A 10% stub makes a 5%

reflection.

The stub adds to the total load capacitance at the end of the trace, increasing the size of the reflected signal.

tSTUB

VPEAK V(1/2)(Z0CIN)

T10-90%

+ V(1/2)(Z0CSTUB)

T10-90%

Separating terms,

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6.15 HSDD © 2012 v.15

Points to Remember

Split terminations trade off I[OH] against I[OL].

The lowest impedance an I/O circuit can drive equals:

Capacitance at the receiver creates unwanted reflections.

OH OLMIN

OH OL

V V

ZI I

6.16 HSDD © 2012 v.15

Series Termination (Source Termination)

Signal is cut in half by source resistor

First edge (half amplitude)

Signal doubles, appearing atnormal size as it bounces off open-circuited endpoint

Reflected signal travels back towards source still at half amplitude

Reflection dies at source resistor; drive current drops to zero

A = 1/2

T = 2

2 = +1

Series terminations dissipate power only on signal transitions

R = Z0

VCC

Z0

Reflected edge

Full height

t v(t)

1 = 0

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6.17 HSDD © 2012 v.15

Signal Near Endpoint

Signal is cut in half by source resistor

First edge (half amplitude)

Reflected signal is still half-sized

Reflection dies at source resistor; drive current drops to zero

A = 1/2

T = 2

2 = +1

1 = 0

R = Z0

VCC

Z0

Reflected edge

Full height

t v(t)

Signal appearsnormal size at endpoint

6.18 HSDD © 2012 v.15

Resistor Value for Source Terminator

An ideal driver has zero output impedance.

Practical drivers have a small resistive output impedance.

Reduce your source terminator by the expected output impedance of the driver

External source-termination resistor

Output impedanceof driver

= Z0 of line+

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6.19 HSDD © 2012 v.15

Application of Source-Terminated Line

For clock inputs, the daisy chain topology does not work with source terminators.

All clock loads must connect near the end of the line.

A load connected mid-line sees this wave form:

Mid-level is OK for D input, but not for clock

Never place a clock input in the middle of a long series-terminated line.

t

v(t)

6.20 HSDD © 2012 v.15

Clock Receivers Can Go...

At the end of a source-terminated line

Daisy-chained in the middle of an end-terminated line

But not in the middle of a source-terminated line

D-inputs are OK anywhere, as long as you wait for the signal to stabilize before clocking

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6.21 HSDD © 2012 v.15

What's That Plateau?

CPU

DRAM

Plateau

3"

6.22 HSDD © 2012 v.15

The Signal at the Bitter End of the Line Might Be OK

Voltage waveforms for an ideal, series-terminated configuration always display beautiful, flat plateaus.

CPU

DRAM

3"

50

1"

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6.23 HSDD © 2012 v.15

What's That Glitch?

Reflections from the double load capacitance at B/C cause glitches at A.

Scrunching all the loads near the end of a series-terminated structure works best.

2" 2"

A

B

C50-Driver

2 ns/div

2 ns/div

6.24 HSDD © 2012 v.15

Capacitive Loads Make Lumpy Waveforms

The bigger the capacitance, the bigger the lumps.

Big lumps in the wrong place cause big problems.

Always check the expected lump size: (1/2)Z0CL/tR

Consider the location of your lumps

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6.25 HSDD © 2012 v.15

Reflection from Package Inductance

The main signal strikes the endpoint and reflects back to the source.

The initially high impedance of the inductor reflects a small pulse.

The (positive) pulse returns to the endpoint one round trip time after the initial edge.

50Ω1-nsperfect driver

Series inductance creates a reflection

6.26 HSDD © 2012 v.15

How Close Must a Series-Terminator Lie?

VPEAK V(1/2)(LSTUB /Z0)

T10-90%

tSTUB

Looking from this point to the left, the stub looks likea short section of transmissionline connected to a lowimpedance. Provided that tSTUB << T10-90% we canmodel the stub as an inductorhaving a value of LSTUB = tSTUBZ1.

Z1 Z0

RS Z0

Reflected pulse from inductor:

Substituting LSTUB = tSTUBZ1,

VPEAK V(1/2)(tSTUBZ1 /Z0)

T10-90%

If Z1=Z0, the contribution of the stub to the reflected signal is this:

A 10% stub makes a 5% reflection.

Waveform returning from endpoint

V(1/2) tSTUB Z1

T10-90% Z0

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6.27 HSDD © 2012 v.15

Points to Remember

A series-terminated structure displays a beautiful plateau.

De-rate the ideal source termination value by the output resistance of your driver.

Do NOT place clock receivers in the middle of a long source-terminated line.

6.28 HSDD © 2012 v.15

Both Ends Termination

Combination of end termination also used with series termination.

Used in critical timing applications where even small percentage reflections are intolerable.

Received amplitude is cut in half.

Terminating both ends wastes a lot of power.

Half-sized signal createdby source termination

End termination of Z0

Very little signal bounces off far end

Even less signal bounces a second time Practically nothing

survives first round trip

VCC VCCA=1/2 T=1 Only a half-sized signalmakes it through to the receiver

Z0

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6.29 HSDD © 2012 v.15

Comparison of Termination Styles

End termination (a.k.a. split termination)

Series termination

AC termination

Z0

VCC VCC

Z0

Z0

VCC

VCCVCC

VCC

6.30 HSDD © 2012 v.15

End Termination

Termination damps ringing

Signal looks good at any point

First incident wave meets VOH and VOL

+/- 30 mA drive required

Time, ns

Volts

mA

3.3-volt logic, 30-mA driver, 1-ns rise/fall,2-ns line, 50-Ω

source end

far end

(VOH-VT)/Z0 = 30mA

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6.31 HSDD © 2012 v.15

Series Termination

Termination damps ringing

Signal appears correct only at far end

Maximum delay is at source

When driving a CMOS input, VOH and VOL are ideal

Current drops to zero after first roundtrip

+/- 30 mA drive required

Time, ns

Volts

mA

3.3-volt logic, 30-mA driver, 2-ns line, 50- Ω

A B

A

B

(VOH/2)/Z0 = 30mA

VOH VCC

6.32 HSDD © 2012 v.15

AC Termination

Termination too weak to dampen ringing

Signal displays overshoot and ringing

Time, ns

Volts

mA

3.3-volt logic, 30-mA driver, 2-ns line, 50- ΩTry zero to 30 pF

0 pF

30 pF

R = 50

C

Z0 = 50T10-90% = 1 ns

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6.33 HSDD © 2012 v.15

AC Termination

Termination becomes strong enough to dampen ringing

Signal becomes square, with no overshoot or ringing

Signal doesn’t meet VOH and VOL

Similar effects happens in the reverse direction when capacitor is charged positively*

+/- 60 mA drive required to actually meet VOH and VOL Time, ns

Volts

mA

3.3-volt logic, 30-mA driver, 2-ns line, 50- Ω

Try 25 to 2000 pF

*In this example, the capacitor starts out discharged

25 pF

50 pF

2000 pF

6.34 HSDD © 2012 v.15

Transmission Line States: Drive Current Required for Full-Sized Step

50

0V 0V 0V

0V 0V 0V

0V 0V 0V

- 30 mA+60 mA

+30 mA

0 mA+30 mA

+30 mA

0 mA+60 mA

+60 mA

Past stateDelta-I required

Initial drive current

Past stateDelta-I required

Initial drive current

Past stateDelta-I required

Initial drive current

Past history helps us out

Need a full-sized step, but there is no pasthistory to help.

No past history, but we only need a half-step

Assumptions

VCC = 3.3V

Z0 = 50 Ω

Past history leaves line with continuous IOL = -30 mA

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6.35 HSDD © 2012 v.15

RT

VT

Can Dynamic Termination Ever Work?

What constraints apply to the manipulations of the being?

In the HIGH state, VT must eventually approach VCC

In the LOW state, VT must eventually approach 0

In between, VT must change s-l-o-w-l-y compared to tD

Z0

tD

Let’s re-design the R-C termination in a very general way, by connecting RT

not to a capacitor, but to an adjustable voltage source...

…controlled by a magic being.

VCC

GND

6.36 HSDD © 2012 v.15

Requirements for AC Termination

Always set R=Z0.

RC product must be significantly larger than tD, not merely larger than T10-90%.

The shorter the line, the better an RC termination will work.

Raising the source impedance of the driver closer to Z0 helps.

RT

Z0

tD

Rise/fall time T10-90%

C

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6.37 HSDD © 2012 v.15

AC Terminator on Short Line (1/2 ns)

We begin with a moderate ringing problem:

T10-90%/tD = (1000 ps)/(500 ps) = 2.0

Add to that an RC time constant that’s significant compared to tD:

RC/tD = (25 pF)(50)/500 ps = 2.5

Signal overshoot improves

Signal meets VOH and VOL at receiver

Driver output current rises modestly, but still enjoys periods of rest.

0 4 8 12 16 20 24 28 32 36 401

0.5

0

0.5

1

1.5

2

2.5

3

3.5

4

4.5

5

5.5

6

0 4 8 12 16 20 24 28 32 36 40100

50

0

50

100

Time, ns

Volts

mA

3.3-volt logic, 30-mA driver, 0.5-ns line, 50- Ω

No termination With AC terminationC = 25 pF

At source

At receiver

6.38 HSDD © 2012 v.15

General Difficulty of Ringing Problem

tD /T10-90% Ringing Solution for first-incident wave switching

2 Full-sized, maximal ringing*

Resistive termination

1 Full-sized, maximal ringing*

Resistive termination

1/2 Slightly attenuated

1/3 Substantially abated

Anything dissipative helps (resistors, diodes, R-C, skin effect, dielectric loss, etc.)

1/6 Almost gone Not necessary

*Maximal as determined by driver source impedance RS and characteristic impedance of line Z0.Relative overshoot on first edge is (Z0-RS)/(Z0+RS).

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6.39 HSDD © 2012 v.15

Power Dissipated in Split Termination

VCC = 1.5 V

R2

R1Max. voltage dropacross R1 = 1.5 V

Max. voltage dropacross R2 = 1.5 V

50- Ω line

Power (1.5V) = (1.50)2

100= 0.02 W

VCC

100

100

Power (5.0V) = (5.00)2

100= 0.25 W

6.40 HSDD © 2012 v.15

Power Dissipated in End Termination Using VT

Half the dissipation of a split terminator

VCC = 1.5 V

R1

Max. voltage dropacross R1 = 0.75 V

50- Ω line

Power (1.5 V) = (0.75)2

50= 0.01 W

VT = 0.75 V

50

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6.41 HSDD © 2012 v.15

Comparison of Terminations

VT

Vcc/2

Unknown

*Depends on duty cycle1.5-V logicZ0 = 50

Basic workhorse0.02-1414Split

CommentsPwrIOLIOHType

Moves dissipation off-card0.01-1414End

Perfect for point-to-point*-1414Series

Perfect for clocks0.01-1414AC w/ DC Bal.

Check V[OH] and V[OL] *-2727AC w/out DC Bal.

Check V[OH] and V[OL] *-2727Double series

6.42 HSDD © 2012 v.15

Effect of Capacitive Loads

Perfect source-terminated line with no capacitive loading

0 10 20 30 40 ns

Source

Far end

20 in.

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6.43 HSDD © 2012 v.15

0 1108

2108

3108

4108

0 10 20 30 40 ns

Add One Load in Middle of Line

Every load generates a reflection.

ReflectedFraction =

Edge A hits the capacitor from the left, generating a reflection that bounces back to the source and is absorbed at the driver.

Later, edge B hits the capacitor from the right, generating the reflected blip C.

5-pF

A

B

C

1 Z0 * C2 T10-90%

= 17%

Z0 = 70ΩTDLY = 3.5 nsT10-90% = 1 ns

6.44 HSDD © 2012 v.15

Convert to End-Terminated Line

End termination doesn’t much change the reflected amplitude.

Edge A hits the capacitor, generating a reflected blip that bounces back towards the source.

The blip arrives at the source at B, where it reverses direction, and proceeds to the far end at point C.

0 1108

2108

3108

4108

0 10 20 30 40 ns

70 Ω

5-pF

A

B

C

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6.45 HSDD © 2012 v.15

Add More Loads

We have placed the loads uniformly, and spaced within a risetime of each other.

Interestingly, it doesn’t get that much worse.

0 1108

2108

3108

4108

0 10 20 30 40 ns

70 Ω

5-pF each load

6.46 HSDD © 2012 v.15

Wrong termination

Slow Down the Risetime

Slowing down the risetime by a factor of two cuts the bump height in half.

Note that at end of line, the system appears improperly terminated.

Loaded line impedance is:

0 1108

2108

3108

4108

0 10 20 30 40 ns

70 Ω

5-pF each load

2-ns risetime

ZLOADED = Z0 = 57 CLINE

CLOAD + CLINE

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6.47 HSDD © 2012 v.15

Adjust the End Termination

Apply a new termination of 57 Ω.

This straightens out the response.

Note that line delay increases when the loaded line impedance decreases.

57 Ω

5-pF each load

DelayLOADED = Delay0 = 4.4 ns CLOAD + CLINE

CLINE

0 1108

2108

3108

4108

0 10 20 30 40 ns

6.48 HSDD © 2012 v.15

Comparison: Lump All the Loads in the Middle

Individual loads revert to their lumped-element behavior.

Reflection percentage skyrockets.

Ringing gets worse.

Termination is wrong.

0 1108

2108

3108

4108

0 10 20 30 40 ns

57 Ω

25-pF load all lumped in the middle

Evenly spreading the loads helps!

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6.49 HSDD © 2012 v.15

Key Equations

The loaded impedance of the bus is less than Z0

Basic line parameters (whole-line values or per-section values)

The loaded delay of the bus is greater than the initial delay tD

Adding capacitance reduces ZL

…and increases tLOADED

D 0 0t L C D0

0

tC

Z

0 D 0L t Z

0LOADED 0

0 L

CZ Z

C C

0 LLOADED D

0

C Ct t

C

6.50 HSDD © 2012 v.15

Heavily-Loaded Bus Design

0.5"

Z0=50

0

0

0.5 in. 180 ps/in.1.8 pF

50

delayC

Z

0 0 0.5 in. 180 ps/in. 50 4500 pHL delay Z

L 5.5 pFC

0

LOADED0 L

4500 pH24.8 Ω

1.8 5.5 pF

LZ

C C

(Values calculated on a per-load basis)

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6.51 HSDD © 2012 v.15

Idea for Design

Stagger the loads on a bus for better signal quality.

This layout has twice as many loads, eachwith half the CL, and half the spacing.

Looks good on layout,but doesn’t perform as well.

DSP DSP DSP

DSPDSP DSPT

ER

M

TE

RM

DSP

DSP

DSP

DSP

DSP

DSP

TE

RM

TE

RM

6.52 HSDD © 2012 v.15

Points to Remember

Capacitive loads cause reflections

If evenly spread, we can counteract the effect of capacitive loading

Evenly-spaced capacitive loads decrease line impedance, and increase delay

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6.53 HSDD © 2012 v.15

PCI-Bus Derivation (ver 2.1, 1995)

25 Ω

Z0 = 25 Ω Big, fat 25- Ω trace

Step response at various points(ordinary series-terminated response)

"2nd-Wave Reflected Switching"

6.54 HSDD © 2012 v.15

PCI-Bus Derivation

25 Ω

Z0 = 25 Ω Big, fat 25-Ω trace

Step response at various points(ordinary series-terminated response)

25 Ω

Z0 = 50 Ω

Two traces of 50 Ω each

Same exact response at various points(nothing changes)

Z0 = 50 Ω

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6.55 HSDD © 2012 v.15

PCI-Bus Derivation

25 Ω

Z0 = 50 Ω

Z0 = 50 Ω

25 ΩZ0 = 50 Ω

Same exact response at various points(nothing changes)

Z0 = 50 Ω

Now change the layout to spread the two traces apart.

6.56 HSDD © 2012 v.15

What About Transceivers at the Ends?

PCI-bus concept

Use reasonable output impedances (20-60 ohms)

Plan to wait a few roundtrips for signals to settle down

Make the bus very short, so settling happens quickly

25 Ω

Z0 = 50 Ω

The best source impedance for this driver would be 50 Ω

Z0 = 50 Ω

50 Ω

There is no one perfect impedance that works everywhere.

The best source impedance for this driver would be 25 Ω

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6.57 HSDD © 2012 v.15

Circle Bus

Good for embedded multi-processors.

Everybody thinks they are in the middle.

RS should ideally equal Z0/2, where Z0 is the loaded impedance of the structure.

25 Ω

Z0 = 50 Ω

25 Ω

25 Ω

25 Ω25 Ω

Equally space the loadsaround the ring.

RS

May be covered by U.S. pat. 5,146,634

25 Ω

6.58 HSDD © 2012 v.15

Extra for Experts

Multiple Loads Clumped at End of Series-term Line

Bi-Directional Termination

Risetime with Capacitive Load

Effect of Inductive Bead on Risetime

Diode Termination

The Weak End-Termination

Differential Terminations

Effect of Tightly Coupling the Differential Pair

Right-Angle Bends

Via Reflections

Reflections from Taps

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6.59 HSDD © 2012 v.15

Multiple Loads Clumped at End of Series-Terminated Line

If delay among endpoints is small compared to T10-90%/6, you can treat this whole circuit as a single lumped-element capacitive load.

tD

T10-90%

RS = Z0

CL = 3CIN + 3CSTUB

The source impedance looking back this way equals Z0.

This load induces an extra group delay of 0-63% = Z0CL

0-63%

time

x(t)y(t)

x(t) y(t)

Whatever bounces off the load dies at the source

Equivalent circuit:

6.60 HSDD © 2012 v.15

Bi-Directional Termination

T10-90%

Whatever bounces off the load dies at the source

The load behaves as a single capacitor fed by the line impedance Z0

in series with RS.

Transmitting Receiving (tri-state)

Z0

RS Z0 RS Z0

This configuration induces an extra group delay of 0-63% = 2Z0CL

0-63%

y(t)

y(t)

COUT

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6.61 HSDD © 2012 v.15

Risetime with Capacitive Load

T10-90%

RTERM Z0

Z0

The load behaves as a single capacitor fed by the line impedance Z0

in parallel with RTERM.

This configuration induces an extra group delay of 0-63% = (1/2)Z0CL , plus extra reflections that re-appear after time 2tD

Termination 0-63%

Bi-directional 2Z0COUT

Series-term Z0CL

End-term ½ Z0CIN

0-63%

y(t)

y(t)tD

6.62 HSDD © 2012 v.15

Effect of Inductive Bead on Risetime

To generate a specific time constant 0-63% using an inductive bead,

Let f = 1/(20-63%)

Pick bead such that the bead impedance Z(f) equals Z0 at frequency f.

The load impedance lookingthis way equals Z0.

x(t)

0-63%

y(t)

y(t) The inductor introduces an extra group delay of 0-63% = (L/Z0) in the initial launched waveform.

The 10-90% risetime of the initially-launched waveform is approximately: TLAUNCHED = (T10-90%

2 + (2.20-63%)2)1/2

T10-90%

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6.63 HSDD © 2012 v.15

Diode Termination

The diode clamps prevent overshoot if and only if, The driver output is full-sized (RS << Z0)

The diodes clamp quickly (tON, tOFF << T10-90%)

To the correct voltage (diode Vf << VCC)

With low enough impedance (diode area is HUGE)

And the load capacitance is insignificant (Z0CIN << T10-90%)

If all conditions are satisfied, The diodes clamp perfectly

There is no overshoot

The received voltage equals the transmitted voltage (T = 1)

No reflections ensue (p2 = 0)

Large currents persist on the line (IOH(t0) = V/Z0)

T10-90%VCC

Z0 y(t)

tD

2 = T - 1 T = 1 + 2

CIN

Diodes and other non-linear active terminations only work for relatively short lines.

6.64 HSDD © 2012 v.15

Diode Termination Examples

Each figure compares three different terminations styles:

None (open-circuited at endpoint)

Diode termination (Schottky diodes, 5-ohm RON, Cp=3 pF)

Series termination (perfect 65- source)

0V

3V

2 ns/div

0V

3V

2 ns/div

0V

3V

2 ns/div

T10-90% = 1 ns

Z0 = 65 ohms

Driver RS = 23 ohms

NoneDiode

Series

NoneDiode

Series

NoneDiode

Series

2-inch line 4-inch line 8-inch line

Diodes help reduce ringback, andDiodes dissipate very little power, butThey aren’t perfect.

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6.65 HSDD © 2012 v.15

The Weak End-Termination

2:1 termination mis-match results in 10 dB reflection loss per round trip

1/2 the power dissipation of a regular end termination

Signal isn’t perfect, but it’s better than nothing

First incident edge still doesn’t meet VOH and VOL , but it’s closer

+/- 45 mA drive required to actually meet VOH and VOL

Time, ns

Volts

mA

3.3-volt logic, 30-mA driver, 2-ns line, 50- Ω

Try 100-Ω end termination (200/200)

6.66 HSDD © 2012 v.15

Z0

Connects to reference plane usedby traces.

+-

2Z0 +-

This circuit terminates both differential and common-mode signals (like intra-pair skew). Use it when you have a low-impedance driver on a long line, with no other attempt made to dampen common-mode resonances:

Z0

End Termination of Differential-Mode Signals

This circuit terminates only the differential mode, not the common mode. Use it when your driver has a moderate output impedance, something that can partly damp common-mode resonance:

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6.67 HSDD © 2012 v.15

Differential Termination with Re-Biasing

RT = Z0

+-

RT = Z0

This circuit does the job...

...But this one introduces less DC offset.

Z0

+-

Z0

Connect tosource of bias voltage

Either circuit can accept DC-blocking capacitors for DC-level adjustment of DC-balanced signals (like clocks, Manchester

coding, 8B10B coding, etc.) .

6.68 HSDD © 2012 v.15

Effect Of Tightly Coupling the Differential Pair

Routing the two elements of a differential pair extraordinarily close together has these effects:

Lowers the differential impedance (you have to make the lines extra-skinny to correct the impedance).

Raises skin-effect losses (because the traces are now skinnier).

Pisses off your layout people (because now the pair can’t be split to traverse obstacles).

Contrary to what you may hear, it doesn’t improve EMI, because it is mostly the common-mode signals from your drivers (the natural imbalance, the skew, etc.) that radiate.

Permits somewhat better pair-to-pair pitch, due to slightly lowered crosstalk. This is the only good reason for using tightly-coupled traces.

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6.69 HSDD © 2012 v.15

Right Angle Bends

Here’s a theme I hear all the time.

Usually it comes from a layout person who has worked on ECL systems.

Right angle bends slow down fast signals

Right angle bends cause reflections

You have to avoid right angle bends or the signal will jump right off the trace and propagate into space, just like an antenna

Is it true?

6.70 HSDD © 2012 v.15

Stories About Right Angle Bends Have a Basis in Fact

w

w

Effective widthat corner is too large

w

Nominalwidth

The shaded areaacts like an extra capacitanceconnectedto the line

The additional capacitance in the shaded area is approximately:

The peak value of the signal reflected from a capacitive load is:

Example: w = .010 in.er = 4.3Z0 = 50 ΩC = 0.025 pFT10-90 = 1 nsV = 3.3 V (amplitude of incoming step)VPEAK = 0.0021 V

Nominalwidth

61 w er1/2

Z0

C = pF1 Z0 * C2 T10-90%

VPEAK = V

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6.71 HSDD © 2012 v.15

What About the Right-Angle Bend Going Down Into a Via?

The right-angle bend doesn’t do anything, but the parasitic capacitance between the via to ground does, and so does the temporary separation of signal and return paths.

Overall height.063 in.

Clearance hole Solid ground plane

Pad .028 in.

Body of via .016 in.

.050 in.

A

Your signal goes rightdown the hole

6.72 HSDD © 2012 v.15

Via Reflections

The capacitance of a .028-pad via is on the order of 1/2 pF to 1 pF, depending on the board construction and ground plane configuration

C = 1 pF

The peak value of the signal reflected from a capacitive load is:

Example: Z0 = 70 ΩT10-90% = 1 ns = 3.5 % (small, but noticeable)

Signal vias that traverse multiple planes are subject to additional inductive effects due to the temporary separation of signal and return paths.

1 Z0 * C2 T10-90%

VPEAK = V

VPEAK

V

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6.73 HSDD © 2012 v.15

What About the Taps?

Traces associated with the taps just add parasitic capacitance.

They raise the effective aggregate load capacitance at each tap.

Tap traces should have as high an impedance as practical.

Try putting the trace taps on the outer layers, where it’s easy to make a higher impedance.

75-Ω traces on the outer layers

50-Ω traces on the inner layers

6.74 HSDD © 2012 v.15

Extra Slides for Classes Related toGigabit Ethernet

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6.75 HSDD © 2012 v.15

Serial Interface (1.25 Gb/s)

ZTERM

Z0 = 75ΩS

ecti

on 1

Sec

tion

2

Sec

tion

3

Sec

tion

4

Vias will be added here and here

The simulation models four sections of balanced, 150-ohm transmission line.

2” 2” 2” 2”

Z0 = 75Ω

ZSOURCE

This example demonstrates theefficacy of both-ends termination.

6.76 HSDD © 2012 v.15

Perfect Line: Both Ends Terminated

Len

gth

Z0

Ser

ies-

L (

nH)

Shun

t-C

(pF

)

section 1section 2section 3section 4

0 0.5 1 1.5 21.5

1

0.5

0

0.5

1

1.5Eye pattern

params

2

2

2

2

75

75

75

75

0

0

0

0

0

0

0

0

=

ZSOURCE 0( ) 75=

ZTERM 0( ) 75=

0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8 41.5

1

0.5

0

0.5

1

1.5

Signal at end of line

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6.77 HSDD © 2012 v.15

With Dielectric Loss

8-inch lineTan =0.02

0 0.5 1 1.5 21.5

1

0.5

0

0.5

1

1.5Eye pattern

params

2

2

2

2

75

75

75

75

0

0

0

0

0

0

0

0

=

ZSOURCE 0( ) 75=

ZTERM 0( ) 75=

0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8 41.5

1

0.5

0

0.5

1

1.5

Signal at end of line

F0 0.02

Re R SKIN 2j 109

0

6.78 HSDD © 2012 v.15

With Skin Effect

RSKIN = 1.00 Ω/inchAt 1 GHz

0 0.5 1 1.5 21.5

1

0.5

0

0.5

1

1.5Eye pattern

F0 0.02

Re R SKIN 2j 109

1

params

2

2

2

2

75

75

75

75

0

0

0

0

0

0

0

0

ZSOURCE 0( ) 75

ZTERM 0( ) 75

0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8 41.5

1

0.5

0

0.5

1

1.5

Signal at end of line

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6.79 HSDD © 2012 v.15

Add Some Termination Mismatch

ZS = 60ZL = 60Z0 = 75

0 0.5 1 1.5 21.5

1

0.5

0

0.5

1

1.5Eye pattern

ZSOURCE 0( ) 60

ZTERM 0( ) 60

0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8 41.5

1

0.5

0

0.5

1

1.5

Signal at end of line

F0 0.02

Re R SKIN 2j 109

1

params

2

2

2

2

75

75

75

75

0

0

0

0

0

0

0

0

6.80 HSDD © 2012 v.15

Add Two Small Vias

0 0.5 1 1.5 21.5

1

0.5

0

0.5

1

1.5Eye pattern

ZSOURCE 0( ) 60

ZTERM 0( ) 60

0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8 41.5

1

0.5

0

0.5

1

1.5

Signal at end of line Two vias,1-pF each,located 4” and 6”

from source

F0 0.02

Re R SKIN 2j 109

1

params

2

2

2

2

75

75

75

75

0

0

0

0

0

1

1

0

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6.81 HSDD © 2012 v.15

Add Receiver Load

0 0.5 1 1.5 21.5

1

0.5

0

0.5

1

1.5Eye pattern

0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8 41.5

1

0.5

0

0.5

1

1.5

Signal at end of line Additional3-pF at receiver

ZSOURCE 0( ) 60

ZTERM 0( ) 60

F0 0.02

Re R SKIN 2j 109

1

params

2

2

2

2

75

75

75

75

0

0

0

0

0

1

1

3

6.82 HSDD © 2012 v.15

Convert to Termination at End Only

0 0.5 1 1.5 21.5

1

0.5

0

0.5

1

1.5Eye pattern

ZSOURCE 0( ) 10

ZTERM 0( ) 60

0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8 41.5

1

0.5

0

0.5

1

1.5

Signal at end of lineSource impedance=10 ohms

F0 0.02

Re R SKIN 2j 109

1

params

2

2

2

2

75

75

75

75

0

0

0

0

0

1

1

3

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!!!"#$%&'("&')

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HSDD © 2012 v.15

Other Courses by Dr. Howard Johnson

Private classes available

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ADVANCED HIGH-SPEEDSIGNAL PROPAGATION

Press your design to the upper limits of speed and distance

HIGH-SPEEDNOISE AND GROUNDING

Master the art of mixed-signal system design

HSDD © 2012 v.15

Chapter 8: Rock-Solid Power

Performance of individual capacitors

Arrays of capacitors

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8.3 HSDD © 2012 v.15

The Four Parts of a Power System

VRM and its connector/wiring

Bulk decoupling capacitor

Bypass capacitor array

VCC-GND plane-to-plane capacitance

PLAY MOVIE WM9

8.4 HSDD © 2012 v.15

Electrical Model of Capacitor

As long as you stay below the maximum voltage rating, a capacitor behaves much like an L-R-C series resonant circuit.

Parasitic series inductance(ESL)

Parasitic series resistance (ESR)

Sensitivity toTemperature

& AgeMaximum voltage rating

(DCWV)

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8.5 HSDD © 2012 v.15

Capacitor Performance at High Frequencies

XC(f) = | R + j2πf L + |1j2πfC

XC( f )(Ω)

f (Hz)

1000

0.1

10

106 108 1010

0.1 Ω

0.05 uF

1 nH

1/3 nH

8.6 HSDD © 2012 v.15

Four 22-ohm resistors in parallel with 50-ohm source and load produce a 5-ohm source impedance

How to Measure ESR and Series Inductance

Device under test (DUT)goes between these points

Solid ground plane with hole in the middle

From 50-Ω stepsource(tr = 1-ns)

To 50- Ω scope

50

2222

22

2250

Metal circle inset into hole

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8.7 HSDD © 2012 v.15

Thevenin Equivalent for Test Circuit

+-

+

-

5.0 Ω

t10-90 = 1.0 ns

100 mVstep

y(t)

D.U.T. goes here

8.8 HSDD © 2012 v.15

You Might Expect

y(t)

Voltage asymptotically approachesfull output level

t0-63% = RSCL

Let’s zoom in on just this little partright at the beginning

Let RS be the tester source impedance, andCL be the D.U.T. capacitance

t

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8.9 HSDD © 2012 v.15

Measured Results

figure 8.11 2 nS/div

OpenCircuit

Capacitorresponse

Open circuit (1)

Capacitor response (2)

Spike Step Slow ramp

50 mV

50 mV

20 nS/div

8.10 HSDD © 2012 v.15

Three Parts of a Capacitor Step Response

+

+

All three superimposed

together

=

The inductance (ESL) produces a quick pulse

The resistance (ESR) makes a plateau of constant height

The capacitance determines the rate of charge—on a very fast scale of time the slope looks quite shallow

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8.11 HSDD © 2012 v.15

Estimating Lead Inductance

We can use the area under the inductive spike to estimate the lead inductance.

RS Source resistance of test jig, ohms

ΔV Open circuit step voltage of test jig, volts

L Lead inductance, Henries

A Area under inductive spike, volt-seconds

L = ΔV

RS A

8.12 HSDD © 2012 v.15

Inductance of Metal Objects

Not much of a reduction given that

this wire is 10x fatter than in the previous

case…

10 in.

700 nH

+

415 nH

210 nH

15 nH

3.5 in.

Making the loop radically smaller really helps.

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8.13 HSDD © 2012 v.15

Inductance of Leaded Bypass Capacitors

0.01 uF long legs 25.8 nH

0.01 uF short legs 4.6 nH

10 uF electrolytic 1.9 nH

2200 uF electrolytic 9.4 nH

8.14 HSDD © 2012 v.15

Surface-Mounted Configurations

I tried a variety of surface-mounted capacitor layouts at 100:1 physical scale.

0.030 squaresoldering pad

All dimensions in inches

.024 roundvia pad

0603 component

0.050

.0075

0.050

.030

.010 dia.hole

0603 skinny 0603 fat 0603 end

0402 end

0603 side

0402 side

0.020 squaresoldering pad

Same via and hole

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8.15 HSDD © 2012 v.15

Inductance of Surface-Mounted Layouts

All inductance values in nH

Hole dia. 0.010 in. Hole dia. 0.020 in.

Via length: .020 .010 .006 .004 .020 .010 .006 .004

0603 skinny 2.87 2.18 1.77 1.51 2.68 2.13 1.66 1.51

0603 fat 2.23 1.52 1.17 0.95 2.07 1.47 1.12 0.89

0603 end 1.16 0.77 0.59 0.50 1.07 0.68 0.53 0.42

0603 side 0.85 0.61 0.46 0.36 0.67 0.51 0.38 0.33

0402 end 1.01 0.67 0.50 0.42 0.82 0.58 0.44 0.38

0402 side 0.60 0.40 0.32 0.26 0.43 0.32 0.25 0.21

8.16 HSDD © 2012 v.15

Points to Remember

ESR acts like a resistor in series with a capacitor

ESL acts like an inductor in series with a capacitor

The inductance is determined by where current flows within the capacitor layout and package

Inductance degrades the performance of a capacitor at high frequencies

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8.17 HSDD © 2012 v.15

New Surface-Mounted Packages are Constantly Being Developed

Smaller packages

Try out the new 0402 (and even tinier 0201)

Pad design becomes critical for these tiny parts

Talk to your component vendor

Some companies have developed proprietary pad designs (for example, see Motorola patent U.S. 5,453,581)

Capacitors arrays

0603-size with four capacitors (which you can place in parallel)

(http://www.murata.com)

1206-size with eight capacitors (already wired in parallel)

(http://www.avxcorp.com)

8.18 HSDD © 2012 v.15

AVX Interdigitated Capacitor (IDC)

Alternating solder pads connect to VCC, GND.

Very low-inductance structure.

Intended for BGA applications.

Eight-via footprint:

Gnd

Vcc

+ - + -

+-+-

Gnd

Vcc

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8.19 HSDD © 2012 v.15

Points to Remember

Packaging and mounting techniques dramatically affect lead inductance

Lead inductance is just as important as capacitance

8.20 HSDD © 2012 v.15

Modeling Arrays of Capacitors

The overall impedance of an array of N capacitors is N times less than that of its individual elements at all frequencies.

The equivalent capacitance becomes N times bigger.

The equivalent series inductance becomes N times smaller

The equivalent series resistance becomes N times smaller.

X( f )(Ω)

f , (Hz)

1 104

1 105

1 106

1 107

1 108

1 1090.001

0.01

0.1

1

10

100

0.1 uF, 0.2 Ω, 6 nH

100

0.01

0.1

10

1

105 106 107 108 109

(0.1 uF, 0.2 Ω, 6 nH) x 100

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8.21 HSDD © 2012 v.15

10 100 1 103 1 104 1 105 1 106 1 107 1 108 1 1090.001

0.01

0.1

1

10

10 102 103 104 105 106 107 108 109

10

1

0.1

0.01

0.001

Modeling a Complete Power System

The four parts of a power system work together to keep the PWR-GND impedance below your specified target value at all frequencies of interest.

Power supply

X(f)

+

-

CBULK

LBULK

CARRAY

LARRAY

CPLANES

LPOWER

.025 μF10,000 μF 100 x 0.05 μF

3 nH/10010 nH10 μH

X(f)Ω

Hz

8.22 HSDD © 2012 v.15

Point to Remember

The power supply impedance chart reveals which frequency regimes are controlled by which components.

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Olde Tyme Use of Dual-Value Capacitor Arrays (1960)

1050.1

1

10

100

1000

106 107 109

f (Hz)

XC(ohms)

In 1960, a big capacitor always had a big series inductance...

Paralleling the two parts delivered the benefit of large capacitance here...

Big cap .1 uF

Small cap .001 uF20 nH

2 nH While a small capacitor had a small inductance

…and small inductance here.

108

8.24 HSDD © 2012 v.15

The Same Approach Today Doesn’t Work

1050.1

1

10

100

1000

106 107 109

f (Hz)

XC

(ohms)

Today all ceramic capacitors in the same package havethe same series inductance, regardless of the capacitance.

Paralleling these two parts delivers only a 6dB improvement at the high end.

Big cap .1 uF

Small cap .001 uF Both in parallel = 1 nH

Each cap. = 2 nH

0.2-ESR

Resonanceeffect

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8.25 HSDD © 2012 v.15

10

100

1000

XC

(ohms)

1050.1

1

106 107 108 109

f (Hz)

Just Choose the Smallest Package You Can Manufacture, And Buy the Biggest Value You Can

A better approach, if the capacitors are all in the same package, is to simply use twice as many of the biggest value. This scheme delivers 6 dB across all frequencies, and is simpler to manage.

Big cap.

Small cap.

Two big caps

8.26 HSDD © 2012 v.15

Points To Remember

For bypass applications, use the lowest-inductance (smallest) package you can.

Choose the largest value you can reliably purchase in that package size.

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