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2013/12/3 All Rights Reserved - Cloud Testing Service, Inc. 1

CONFIDENTIAL

Cloud Testing Service Inc.

The New Concept of Testing

Moving from “Buying a Tester” to “Using Testing IP” in Test

Company relating with STIL test


The common knowledge was removed as a barrier.

Expensive

Large size

Difficult software

Environment

Anymore・・・

・ “Cloud Testing™ Station” can be use free.

・Very small size W：110mm、H：200mm、D：600mm （CX1000P）

・ Portable, Desktop-sized Testing Terminal.

・ Easy to use, training less software.

・ Needless air-conditioner, 200V power point.

・ “Cloud Testing™ Station” can be move easily (6kg)

・The testing IP can be used only by monthly amount.

How do you thing about Tester price, size, deep software and maintenance cost? Advantest(No.1 share in W.W) proposes testing a new shape using the testing technology.

・ Calibration and free repair service Maintenance

Heavy

Concept

Concept – Problem we would solve:

ATE is essential for post silicon testing in Engineering,

but has associated drawbacks…:

- Footprint.

- Flexibility.

- Ease of use

- Reuse

- … and co$t $$$.


Concept – Problem we would solve:

And, the bench evaluation of devices is available to user, but is …:

- Complicated.

- Cluttered by many instruments.

- Complex and time consuming set up.

- … and co$t $$$.


Digital Multi Meter

Instrument

Power Supply

Signal Generator

Device &

Vector Generator

PC

Concept – Our Solution:

2013/12/3

All Rights Reserved - Cloud Testing Service, Inc. 5

Digital Multi Meter

Instrument

Power Supply

Signal Generator

Device &

Vector Generator

CloudTestingTM Station CX1000P

All-in-one!

Modules

Concept - CloudTesting™ Service

Testing Solution of a large number which ADVANTEST has cultivate.

Testing Solution for a Device of the future.

Leading-edge test solutions available by on demand.

CloudTesting™ Service.


Testing・Algorithm IP Logic circuit function measurement. Memory circuit function measurement. Various voltage and current measurement. Analog measurement.

Testing・Software IP Programing tool. Conversion tool . EDA Link tool. Analysis tool.

Firmware・Function IP Logic・Pattern Generator Memory・Pattern Generator AD/DA Source Synchronous Function

Maintenance

Analysis

OS

Algorithm

CTS Online

2013/12/3 All Rights Reserved - Advantest Corporation

Analysis Tool IPs

Algorithm IPs

Platform IPs

Download IPs to your PC

HW is rental contract

USB

Available whenever, wherever, whoever needs it, and easy to use!

CloudTestingTM Service

Testing IPs in Cloud

Feature – Our Solution:

Purchase cables & the socket board on E-commerce site


Service Overview

Cloud Testing™: Semiconductor Design To Test

EDA

Software /

Simulator

Design

Environment

1st Silicon,

Test Chip

・Functional Analysis

・Logical Analysis

・Characterization

Device A

Mr. A

Mr. B

Miss. C

Mr. D

Miss. E

Mr. F

Design,Development Silicon Debug

STIL

STIL

Reader

STIL

Writer

Cloud Testing

Software’s

“CX1000” + “EDA Linkage Software”

Support and Reduce Your

Semiconductor Debugging Effort

12/3/2013 All Rights Reserved – Cloud Testing Service, Inc. 9

Core Logic IP

Memory IP

Analog IP

STIL STIL

XXX IP

STILReader / STILWriter

Enable Data Xfer: Design(EDA)Silicon Debug

• Support IEEE Std 1450.0-1999, and IEEE Std 1450.2-2002(Next Release)

• Output STIL Timing/Pin Info to CSV Files

• Import CSV Files to Cloud Testing™ Station.

• Provide SQPG(Straight Pattern) & SCPG(SCAN Pattern) Format.

• Auto check HW Restrictions (User Defined)

• All STIL Error Checking Done in One Step.

• Output CX1000 Patterns to “Ann” Statement, Comment and Label.

• With GUI Interface. (STILReader / STILWriter)

CX-1000

STIL File STIL

File STIL

File

STIL Reader

STIL Writer



Analysis Tool Linkage

Pattern Viewer Tool Logic Analyzer Tool

SHMOO Plot Tool Oscilloscope Tool

1st Silicon

Test Chip

ATPG

CAD/CAE Data Platform

IP Analysis

Tools

Testing IP’s in Cloud

Measure

Algorithm

IP’s

Download IP’s (Plug-In)

STILReader/STILWriter

Debugging Pattern

Pin Mapping

Pin Condition

Feature - How we resolve:

All Rights Reserved - Cloud Testing Service, Inc. 12

Device A

Commercial Product

Device A

1st Silicon Test Chip

Device A

Sample

Design/R&D, Academic

Product Test Engineering Production

EDA software / Simulator

• Logical Check • Characterize

• Characterize • Coding and Debug

• Production

STIL

Personal use

Target – How we resolve:

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• Personal use model. • No Timesharing like ATE.

Reduce TAT at developing LSI

Hig

h S

peed M

em

ory

I/F

High Speed

I/O I/F

DSP

Core

Processor

Core

Multimedia

Processor

DRAM SRAM

Flash Audio Video RF

RF Tests

Analog/Mixed Signal Tests

≪Each engineer has personal CX1000≫

Digital I/F Tests

Memory Tests

Digital Tests

Development

All Rights Reserved - Cloud Testing Service, Inc.

Development

Development

Development

Development

2013/12/3 All Rights Reserved - Advantest Corporation

Execute DC Test/FT Test by only 4 steps!

Start up Window

Specify Pin Definitions

Select New Measure Item (IP)

Specify Setup and Execution

Specify Flow Execution

CTLab Operations

2

3

4

1


Examples of utilization of STIL①

Emission microscope

Tester of Mass-pro STIL-Reader CX1000

Put into machine

ＳＴＩＬ .csv

.pat

load

STIL

GUI-Base

Small

Making test program is not

Necessary

Put in other instruments Easy and Quick

Failure analysis

【Use Case】 QA analysis at Semiconductor Manufacturer

CTLab


・Reasonable Cost

・Short Time to Market

・Reduce Engineering Resource

ＳＴＩＬ

Examples of utilization of STIL②

STIL Writer

Design Center Production/Outsourcing

【Use Case】 Fabless, Design Section of IDM

Improve efficiency of mass production deployment

by utilizing STIL and CX1000

CX1000 Install Base on W.W.


１００

４５１５

２０

Total 180 Units (30.Nov.2013)

Semiconductor Maker Design

Semiconductor Maker ＱＡ

Research Institution

Semiconductor Trading

University

Assenmbly Maker





Assenmbly Maker

Test Environment

Units Regional Breakdown

STIL 30 Domestic 10/Overseas 20

VCD eVCD 25 Domestic 5/Overseas 20

WGL 30 Domestic 0/Overseas 30

OTHERS 95 Domestic 85/Overseas 10

20

15

40

5

10

10

10

10

40

10

10


- Cloud Testing Service recommends STIL based test environment.

- Japanese customers are positive about introduction of STIL based test

environment

-Foreign customers are negative about introduction of STIL based test

environment.

They want to convert test program from general purpose ATE,

VCD, eVCD or WGL. Especially in US, WGL is still common format.

Customers often ask us if CTS supports WGL or not.

But we do not have enough manpower to develop VCD Reader nor WGL

Reader, so we cannot meet such foreign customer's needs.

Conclusion


Corporate Profile.

Registered Name : Cloud Testing Service, Inc.

Corporate Headquarter : Shin-Marunouchi Center Building, 1-6-2

Marunouchi, Chiyoda-ku, Tokyo 100-0005, Japan

Business Description : Planning and Sales of Testing Service by Testing IP License

Date Established : September 13, 2012

Capital : 300 million yen (As of October 1, 2012)

Directors President & Representative Director :

Manabu Kimura

Director : Yoshiaki Yoshida

Director : Toshiaki Watanabe

Auditor : Takayuki Arai

No. of Employees : 22

About CloudTesting ™ Service, Inc.

Cloud Testing Service E-commerce web site. http://www.cts-advantest.com/en/

the new concept of testing - semi.org | is rental contract usb available whenever, wherever, whoever...

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