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The top documents tagged [automatic test equipment]

11/17/05ELEC 5970-001/6970-001 Lecture 201 ELEC 5970-001/6970-001(Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic Circuits
11/17/05ELEC 5970-001/6970-001 Lecture 201 ELEC 5970-001/6970-001(Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic Circuits
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Copyright Agarwal & Srivaths, 2007 Low-Power Design and Test, Lecture 8 Test Power
Copyright Agarwal & Srivaths, 2007 Low-Power Design and Test, Lecture 8 Test Power
219 views
Fall 2006, Nov. 30 ELEC 5270-001/6270-001 Lecture 12 1 ELEC 5270-001/6270-001(Fall 2006) Low-Power Design of Electronic Circuits Test Power Vishwani D
Fall 2006, Nov. 30 ELEC 5270-001/6270-001 Lecture 12 1 ELEC 5270-001/6270-001(Fall 2006) Low-Power Design of Electronic Circuits Test Power Vishwani D
217 views
Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9 1 ELEC 5270/6270 Fall 2007 Low-Power Design of Electronic Circuits Test Power Vishwani D. Agrawal James
Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9 1 ELEC 5270/6270 Fall 2007 Low-Power Design of Electronic Circuits Test Power Vishwani D. Agrawal James
220 views
IDDQ Signatures1 New Graphical I DDQ Signatures Reduce Defect Level and Yield Loss (U. S. Patent Pending) New Graphical I DDQ Signatures Reduce Defect
IDDQ Signatures1 New Graphical I DDQ Signatures Reduce Defect Level and Yield Loss (U. S. Patent Pending) New Graphical I DDQ Signatures Reduce Defect
217 views
Spring 07, Jan 30 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 SOC Test Scheduling Vishwani D. Agrawal James
Spring 07, Jan 30 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 SOC Test Scheduling Vishwani D. Agrawal James
225 views
Iris Range : «Unconventional» conventional detectors
Iris Range : «Unconventional» conventional detectors
223 views
Finding Optimum Clock Frequencies for Aperiodic Test Master’s Thesis Defense Sindhu Gunasekar Dept. of ECE, Auburn University Advisory Committee: Dr. Vishwani
Finding Optimum Clock Frequencies for Aperiodic Test Master’s Thesis Defense Sindhu Gunasekar Dept. of ECE, Auburn University Advisory Committee: Dr. Vishwani
217 views
Enea Detectors Range. Introducing new devices ENEAis a range of analog addressable detectors and ancillaries for hi end applications ED100 – SMOKE DETECTOR
Enea Detectors Range. Introducing new devices ENEAis a range of analog addressable detectors and ancillaries for hi end applications ED100 – SMOKE DETECTOR
226 views
HIT, July 13, 2012Agrawal: Power and Time Tradeoff...1 Invited Seminar Power and Time Tradeoff in VLSI Testing Vishwani D. Agrawal James J. Danaher Professor
HIT, July 13, 2012Agrawal: Power and Time Tradeoff...1 Invited Seminar Power and Time Tradeoff in VLSI Testing Vishwani D. Agrawal James J. Danaher Professor
217 views
1 Logistics Systems Engineering Logistics System Definitions NTU SY-521-N SMU SYS 7340 Dr. Jerrell T. Stracener, SAE Fellow
1 Logistics Systems Engineering Logistics System Definitions NTU SY-521-N SMU SYS 7340 Dr. Jerrell T. Stracener, SAE Fellow
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PS3: Protection & Control of Series Compensated Networks
PS3: Protection & Control of Series Compensated Networks
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