scanning electron microscopy · and system, and secondary electron detection (everhart - thornley...

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www.reading.ac.uk/EMLab Scanning Electron Microscopy Peter Harris

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Page 1: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

www.reading.ac.uk/EMLab

Scanning Electron Microscopy

Peter Harris

Page 2: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Scanning Electron Microscopy

What is scanning electron microscopy?

Looking at “wet” samples in the high vacuum SEM

Basic features of conventional SEM

Limitations of conventional SEM

Cryo-SEM and Environmental SEM

Page 3: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

SEM & TEM

Scanning electron microscope

Electron gun

Specimen

Electron gun

Condenser lens

Objective lens

Specimen

Projector lens

Fluorescent screen

Electron gun

Digital camera

Condenser lens

Objective lens

Specimen

Projector lens

Fluorescent screen

Electron gun

Digital camera

Transmission electron microscope

Workshop: November 13

Page 4: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Electron sources for SEM

Tungsten thermionic source

Schottky Field Emission Source

Low brightness

Energy spread ~ 1-2eV

High brightness

Energy spread < 0.5 eV

Page 5: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Interaction of high-energy electrons with specimen

Page 6: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Interaction of electrons with specimen

• S = secondaries • B = backscattered • (A are auger)

Page 7: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Secondary and backscattered electrons

• What are backscattered electrons? • They are primary electrons that have entered the sample and then escaped back out:

• What are secondary electrons? • They are electrons dislodged from the specimen itself.

Page 8: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Detectors for SEM

Everhart Thornley detector: Scintillator – photomultiplier system.

Secondary electrons

Everhart Thornley or solid state detector (silicon diode).

Usually positioned around the final lens or inside.

Backscattered electrons

Page 9: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

◊ Secondary electrons Topographic information

◊ Backscattered electrons

◊ X-rays

Compositional information

Spectra; Maps

Session on X-ray analysis: November 27

Information given by different signals

Page 10: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Origin of topographic contrast

Everhart Thornley detector

Page 11: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Early history of SEM

1942, Zworykin et al., RCA Laboratories, USA - first working SEM.

1950s, C.W. Oatley et al., Engineering Department, Cambridge - major improvements in electron optics and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector.

1965: first commercial SEM, Cambridge Instrument Company, Stereoscan Mark 1.

1935, M. Knoll, Germany – proposed concept of a scanning electron microscope.

Page 12: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

EM Lab’s high vacuum SEM

Page 13: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Conventional SEM images

Compact disc

Polypropylene spherulites

Integrated circuit

Page 14: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Problems with conventional SEM

No wet samples

Surface must be electrically conducting

Non-conducting samples have to be coated

Can only operate at low pressure (10-5 Torr)

Page 15: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Looking at “wet” samples in the high vacuum SEM

Animal and plant tissues up to 98% water.

Options for examining these materials in the high vacuum SEM:

Chemical fixation, drying

Freeze drying

Critical point drying

Page 16: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Critical point drying

Specimen prepared by CPD: Hyphae and spores in Stilton cheese

• Evaporative drying of specimens can cause collapse of structures, mainly due to effects of surface tension.

• Effect can be reduced by substitution of water with a liquid with a lower surface tension

Page 17: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Cryo - SEM

Workshop: November 20

Page 18: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Cryo – SEM of food

Probiotic yoghurt with bacteria. Scale bar 5μm

Raw potato

Page 19: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Environmental SEM

Workshop: November 20

Cooled specimen

• Special pumping system allows water vapour to be introduced into chamber.

• Cooled specimen to retain moisture.

• New (backscattered) electron detector.

Page 20: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Introducing water vapour into the chamber enables uncoated samples to be examined

Positively charged water molecules are attracted to negatively charged sample.

Negative charge at sample surface is neutralized..

Secondary electrons from sample strike water molecules.

Page 21: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

EM Lab’s FEI Quanta 600 ESEM

Pressures up to 20 Torr - samples typically cooled to 5oC.

Gaseous secondary electron detector – fits on objective lens.

Page 22: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Environmental SEM

• Raspberry buds : Hiroyuki Imanishi, Plant Sciences

Page 23: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Becoming an EMLab user

Sherrie Foo

Page 24: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Booking system

Page 25: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

Remaining workshops

Date

Topic

13 November 2013 Transmission Electron Microscopy

20 November 2013 Environmental & Cryo SEM

27 November 2013 X-ray Analysis and Elemental Mapping

Page 26: Scanning Electron Microscopy · and system, and secondary electron detection (Everhart - Thornley detector). First backscattered detector. 1965: first commercial SEM, Cambridge Instrument

EM Workshops 2013

► Questions?

Electron Microscopy Laboratory

► Demo