polymer tantalum capacitors for advanced high reliability ... day/new... · why hermetical...
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©2014 AVX CONFIDENTIAL 1
Polymer Tantalum Capacitors for Advanced High Reliability Applications
J.Petržílek, M. Uher, J. Navrátil, M.Biler
AVX Czech Republic s.r.o., Dvorakova 328, 563 01 Lanskroun, Czech Republic Tel.: +420 465 358 126 e-mail:[email protected]
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Tantalum Capacitors – Dielectric Contacting
Liquid electrolyte MnO2 Polymer
WET Tantalums ionic conduction hermetically sealed + surge robust + high voltage + high temperature - temperature dependent - frequency dependent - electrolyte leak possible
Solid - MnO2 electronic conduction + high temperature + well established reliability - failure mode - voltage limited - ESR higher
Solid - Polymer electronic conduction + low ESR + safe failure mode + high voltage - temperature limited - humidity & oxygen sensitive
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Hermetically Sealed Polymer Capacitor
Ta capacitor with polymer Why Hermetical Packaging Thin cathode layers under extreme condition are subject of potential degradation
TCH Series Hermetic seal: Protects from degradation by humidity Protects from degradation by oxidation
Stable low ESR Stable parts under extreme conditions
Solution developed with ESA partnership
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optimized anode with robust dielectric
pre-polymerized PEDT based cathode material
use of special ageing and screening processes
hermetic seal, inert atmosphere
parallel connection of multiple capacitors
high voltage potential up to 100 – 125V
High Voltage Low ESR Polymer Capacitor
Basic concept
low ESR potential
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Robust Mechanical Design
Mechanical Test Method Reference Result Shock 100g (MIL-STD-202, Method 213, Condition C) PASS Vibration 20g (MIL-STD-202, Method 204, Condition D) PASS PIND 20g (MIL-STD-883, Method 2020, Condition A) PASS
ceramic case anode wire welded to leadframe leadframe welded to internal contacts internal filler applied inert dry atmosphere metal lid welded undertab or L-shape J lead
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Ageing and Screening Procedures
20151050
99.9
99
959080706050403020105
1
0.1
DCL at 90% of formation voltage [uA]
Per
cen
t
arbitrary limit
3xSD limit
Every capacitor is stressed by voltage
Statistical approach applied to removal of weaker parts
Final capacitors are aged 168h
100V rated voltage capacitor
Screening before assembling
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1001010.1
350
300
250
200
150
100
50
0
time [hours]
Cas
e te
mpe
ratu
re [
°C]
Internal Filler Influence on Highly Accelerated Ripple Current Life
Air
Nitrogen
syntactic foam powder encapsulant
heat conductive sillicone
sillicone
heat conductive and inert material increases life under high power conditions
Measurement conditions: TCH 9 22µF 100V external ambient temperature 10V DC bias 20 kHz, 8A AC case filled by gas or solid material
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Moisture Influence on Capacitance
1258525-55-196
65
60
55
50
45
40
1258525-55-196
K
T [C]
Cap
[uF
]Sstandard cathode experimental cathode
WETSTD
DRY
nominal capacitance 47uF
capacitance retained up to -196 ºC humidity increases cap cathode modification can increase
dry capacitance
parts before final sealing: humidified WET not conditioned STD dried DRY
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Moisture Influence on DCL
DCL measurement at temperatures (22uF/ 100V)
604530150
1000
100
10
1
0.1
0.01
604530150
open
t [min]
I [u
A]
sealed
25°C
85°C
125°C125°C
25°C
lid open = traces of water in
cathode
sealed = dry
fast DCL stabilization for open case or closed case and elevated temperatures
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Moisture Influence on DCL
403020100
0.01
0.001
0.0001
0.00001
403020100
23
U [V]
I [m
A]
125
DRY
WET
STD
°C °C
dry unit at low temperature has steeper characteristics how is this DCL related to its stability under accelerated conditions?
V/I measurement by 1V/80s parts before final sealing: humidified WET not conditioned STD dried DRY
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Moisture Influence on DCL Stability
2000150010005000
100
10
1
0.1
0.01
0.001
0.0001
2000150010005000
2000150010005000
dry
Time [hrs]
DC
L at
35V
/125
°C [
mA
]
STD wetdried
before sealing humidified
before sealing
stable DCL
increasing DCL
failures
Highly accelerated life test (2.1x recommended voltage/ 125ºC)
not conditioned before sealing
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Stability of Hermetically Sealed Capacitors
20000150001000050000
100
75
50
25
0
t[h]
CA
P[u
F]
20000150001000050000
100
75
50
25
0
t[h]
20000150001000050000
0.100
0.075
0.050
0.025
0.000
t[h]
ESR
[Ohm
]
20000150001000050000
0.100
0.075
0.050
0.025
0.000
t[h]
T[°C ] = 85; Utest = Ur T[°C ] = 125; Utest = Ur
Stability of capacitance and ESR 35V rated voltage capacitor (100uF)
Stable Performance
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Challenges – super low ESR - Modular Solution
TCH 9 case 22µF/ 100V ESR 60 mOhm Customized case
400µF/ 100V ESR 3 mOhm
TO3 case 100µF/ 100V ESR 9 mOhm
Multiple capacitors connected in parallel Capacitace high ESR low
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Challenges – super low ESR - Modular Solution
400µF/ 100V
Capacitace stable with temperature and frequency
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1600012000800040000
20
15
10
5
0
t[h]
CA
P[u
F]
100007500500025000
20
15
10
5
0
t[h]2000150010005000
20
15
10
5
0
t[h]14001100800500200
20
15
10
5
0
t[h]
1600012000800040000
0.20
0.15
0.10
0.05
0.00
t[h]
ES
R[O
hm
]
100007500500025000
0.20
0.15
0.10
0.05
0.00
t[h]2000150010005000
0.20
0.15
0.10
0.05
0.00
t[h]14001100800500200
0.20
0.15
0.10
0.05
0.00
t[h]
U [V] = 100 V; T [°C] = 85 °C U [V] = 67 V; T [°C] = 125 °C U [V] = 50 V; T [°C] = 150 °C U [V] = 0 V; T [°C] = 175 °C
U [V] = 100 V; T [°C] = 85 °C U [V] = 67 V; T [°C] = 125 °C U [V] = 50 V; T [°C] = 150 °C U [V] = 0 V; T [°C] = 175 °C
Challenges – Higher Temperature
Stability of capacitance and ESR 100V rated voltage capacitor (22uF)
Almost stable performance above 125ºC
150ºC 175ºC
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Challenges – Higher Voltage
Extremely High Voltage Ta Polymer Capacitors TCH 9 10uF/175V
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■ stable performance and reliability exceeding 10,000 hours, 85°C at Vr, 125°C at 0.66xVr
■ up to 100V rated voltages (22uF in CTC21D size) ■ lightweight solution typically 2.2g per CTC21D size ■ ESCC evaluation under progress
Summary & Conclusion
Hermetically Sealed Low ESR high voltage high Reliability Tantalum Capacitors
■ higher temperatures: 150°C at 0.5xVr released soon ■ very low ESR, high voltage, high ripple current modular solution ■ higher voltages up to 175V
Potential for