navy’s first intermittent fault detection & isolation system ......2015/10/29 · oct 27th,...
TRANSCRIPT
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Presented to:
Presented by:
Navy’s First Intermittent Fault Detection
& Isolation System (IFDIS)
JTEG
Brett Gardner
Oct 27th, 2015
Advanced Aircraft Technologies (AAT) FRCSW
16-0007 - Document is cleared for
public release. Distribution is unlimited.
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Outline
• Problem/Background
• Interim Solutions
• Current Solution(s) a. Pros
b. Cons
• Main Issues/Concerns w/Current Technology
a. Cost
b. What is does well
c. What it doesn't do well
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Background
• Intermittent / No fault found (NFF / A799) circuit problem with all Navy WRAs chassis
– No way to reliably detect intermittent faults- currently technology it would take hundreds of hours to fully test a unit for intermittent faults using conventional technology – making current test sets unsuitable for intermittent testing
– Difficult to conduct Engineering Investigations (EIs) when Intermittent chassis faults can not be eliminated from the equation
– Bad actors due to Intermittent Fault continue to grow in the Navy Inventory
• AAT team from FRCSW visited Ogden Air Force Depot and was introduced to IFDIS technology as used on the F16 radar repair line
• Generator Convertor Unit (GCU) consistently appears on the top degrader list
– GCU chassis currently verified with conventional continuity testers provided limited results – intermittent connections continued to be an issue although we could not prove that they were because we could not reliably detect them
– Intermittent circuit detection extremely limited using conventional tester
• IFDIS technology was investigated by AAT 2010 and the idea was born to test the GCU at TQS facility in Ogden
• NAVSUP funded GCU/IFDIS test demonstration to determine if intermittent contact was an issue for the GCU
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Test Demonstration- GCU Chassis
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Test Demonstration - GCU Chassis Tied to IFDIS
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Test Demonstration - GCU Intermittent Wire
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XA3-89
IFDIS precisely detected and isolated one or more intermittent
circuits in 80% of the GCUs tested
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Test Demonstration - Results
• Selected (5) Ready For Use (RFU) GCUs
chassis for IFDIS testing
• IFDIS detected and isolated intermittent
circuits in 80% of the RFU GCU Chassis
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Interim Solutions
• FRCSW uses DIT-MCO , Eclypse, digital
and analog multi-meters testers to isolate
opens, shorts, and miswires.
– This technology is not useful in detecting
intermittent faults
– FRC was unknowingly building back up
chassis with intermittent faults and returning
them to the Fleet
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Current Solution
• FRCSW, through coordination with COMFRC, has
purchased an IFDIS system and three separate GCU
IDs (G1, G2, and G3) via the Depots Capitol
Improvement Program (CIP).
• IFDIS to be installed October – December 2015
• Training to be conducted January - February 2016.
• Local Engineering Specification to be released by
engineering to direct GCU chassis onto IFDIS test bench
• Follow-on WRAs in work for future testing, suggested WRAs
are APG-65/73 RADAR and various cockpit displays
• RIF topic white paper submitted to Navy by Universal
Synaptics for (1) IFDIS test set and three (yet to be
determined) ID’s to be built for COMFRC
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Current Solution – cont.
• Pros
– Will eliminate GCU bad actors that are due to
intermittent chassis within the Fleet
– Testing is short duration; approximately 1 hour,
relatively inexpensive for the gain in reliability
– Will improve reliability of GCU- increased Time on
Wing (TOW) due to reduced A799.
– Programming of chassis is simplistic – self learning
– IFDIS Identifies the exact circuit path that is faulty
making repair relatively straight forward
– Improves FRCSW GCU quality.
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Current Solution – cont.
• Cons
– Unit is costly $$ - no efficiency of purchase for the
Government for the multiple units we have
purchased, (2) @ at Ogden, (I) at FRC SW
– Originally thought that building IDs could be done
organically but – it has taken 9 months to design and
build the 3 GCU ID’s at significant cost
• Possible solution is to stand up organic ID build capability at
IDATS lab in Lakehurst
– No high voltage testing
– Capturing of intermittent waveforms is not automatic,
waveforms must be captured manually
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Main Issues/Concerns w/Current Technology
• Cost
– As mentioned in the previous slide, the system is expensive:
• Suggest buying multiple units to reduce cost per contract.
• ID’s are expensive – Suggest developing Organic capability
• What it does well:
– Quickly identifies intermittent faults
– Identifies opens, shorts, and miswires in seconds
– Identifies approximately 95 % of intermittent faults in
a one axis test
• To obtain 99% detection, the other two axis tests must be
completed – tripling testing time(3 hours)- Still extremely fast
(magnitudes of order better) compared to the other testers
out on the market
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Intermittent Faults
Questions?
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Intermittent
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Backup slides
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Pin not soldered
Intermittent Examples
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Cracked Solder
Joint
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Intermittent Examples
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Conventional Automatic Test Equipment (ATE)
TP1 TP2 TP3 TP4
TP1 TP2 TP3 TP4
25ms 5ms
60ms of testing 1360ms missed 4% Test Coverage
IFDIS
0 360ms
1340ms of testing 100ms missed 93% Test Coverage
I99.99% for a 30min test
*Note – Conventional ATE scanning measurement window must perfectly
synchronize with fault at the precise moment the fault occurs or the fault is missed
completely, the result is No Fault Found.
*Note – All lines All the time test coverage equals no missed
defects!
Test Coverage 101