european conference program on energy dispersive · total reflection x-ray fluorescence analysis...

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http://iapf.physik.tu-berlin.de/EDXRS2002

European Conference on Energy DispersiveX-Ray Spectrometry

16 - 21 June 2002Berlin, Germany

Hosted by


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Bundesanstalt für Materialforschung und -prüfung (BAM), Physikalisch-Technische Bundesanstalt (PTB) and the Technical University Berlin (TUB) co-organize the EDXRS 2002 conference.

Scientific ChairBurkhard Beckhoff (PTB)Wolf Görner (BAM)Birgit Kanngießer (TUB)

Local Organizing CommitteeBurkhard Beckhoff (PTB Berlin)Wolf Görner (BAM)Christine Hertzsch (PTB Berlin)Birgit Kanngießer (TU Berlin)Silke Merchel (BAM)Rüdiger Schmidt (TU Berlin)

International Advisory CommitteeMaria Luisa Carvalho, PortugalJorge E. Fernández, ItalyYoichi Gohshi, JapanBarbara Holynska, PolandThemis Paradellis, GreeceEva Selin-Lindgren, SwedenSzabina Török, HungaryRené Van Grieken, BelgiumPeter Wobrauschek, Austria

Conference OfficeTU Berlin Servicegesellschaft mbHSteinplatz 1, 10623 Berlin, GermanyTel: +49 – 30 – 314 256 86 or –214 61Fax: +49 – 30 – 314 240 98E-mail: [email protected] web page:http://iapf.physik.tu-berlin.de/EDXRS2002


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Scientific ProgramThe conference follows a series of conferences that bring together scientists from various research fields of Energy Dispersive X-Ray Spectrometry. The program will consist of 12 invited lectures (30 min) from distinguished scientists, 78 oral presentations (15 min), 11 special presentations on recent scientific developments of industrial instruments (10 min), and more than 100 poster contributions. For the first time, a special session on Wavelength Dispersive X-Ray Spectrometry will extend the scope of the EDXRS conference series.

Scientific TopicsNew SourcesEnvironmental and Geological ApplicationsArchaeometric Applications I (PIXE, SR, SEM-EDX)Quantitation in XRSRecent Scientific Developments of Industrial InstrumentsInteraction of X-Rays with MatterQuality Management and Quantitation in XRSXRS Instrumentation at Synchrotron FacilitiesSynchrotron XRS ApplicationsAnalysis of Chemical and Local StructuresWDXRFTXRFRelated Methods and Novel ApplicationsDetectors (Superconductors and Semiconductors)µ-XRF and OpticsBiomedical and Biological ApplicationsArchaeometric Applications II (µ-XRF, µ-XANES, Portable XRF)

SponsorsWe are grateful to the following institutions and companies for supporting the conference:

Û Amptek, Inc.Û BESSY GmbHÛ Institut für Gerätebau GmbHÛ intax GmbHÛ John Wiley & Sons, Ltd.Û Lehmanns Fachbuchhandlung GmbHÛ NeXray L.L.C.Û OpTecBB e.V.Û Philips AnalyticalÛ RÖNTEC GmbHÛ Röntgenanalytik Meßtechnik GmbHÛ Society of Friends and Sponsors of Berliner Elektronenspeicherring-GmbH BESSY e.V.Û Spectro Analytical InstrumentsÛ Thermo Noran GmbH


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Invited SpeakersÛ Heike Bronk, Germany Friday 11:20

ARS VITRARIA MEETS ARS EXPERIMENTALIS: MATERIAL ANALYSIS OF MUSEAL GLASSES AND ENAMELS BY MOBILE MICRO-XRF

Û David R. Chettle, Canada Friday 9:00

IN VIVO X-RAY FLUORESCENCE MEASUREMENT OF TOXIC ELEMENTS IN THE HUMAN BODY

Û Matthias Frank, USA Thursday 13:45

RECENT PROGRESS IN THE APPLICATION OF HIGH-RESOLUTION, CRYOGENIC DETECTORS FOR ENERGY-DISPERSIVE X-RAY SPECTROSCOPY

Û Ferenc Krausz, Austria Monday 9:30

ATTOSECOND X-RAY PULSES FOR TIME-RESOLVED ATOMIC AND MOLECULAR SPECTROSCOPY

Û Pier Andrea Mandò, Italy Monday 14:05

PARTICLE-INDUCED X RAY EMISSION (PIXE) APPLIED TO THE STUDY OF OLD MANUSCRIPTS

Û Michael Mantler, Austria Tuesday 8:30

QUANTITATIVE XRF

Û Izumi Nakai, Japan Wednesday 10:45

HIGH ENERGY X-RAY FLUORESCENCE ANALYSIS AND MATERIAL HISTORY

Û Siegfried Pahlke, Germany Tuesday 14:15

WHAT ARE CURRENT AND FUTURE REQUIREMENTS FOR ANALYTICAL EQUIPMENT IN INDUSTRY? HIGHLIGHTING WITH A PRACTICAL CASE OF TXRF

Û Philip J. Potts, U.K. Monday 11:50

PORTABLE X-RAY FLUORESCENCE IN ENVIRONMENTAL AND ARCHAEOLOGICAL ANALYSIS: NEW ANALYTICAL CAPABILITIES, NEW ANALYTICAL CHALLENGES

Û Héctor Jorge Sánchez, Argentina Thursday 10:45

TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS USING BEAM-GUIDES

Û John R. Sieber, USA Thursday 8:30

CONTRIBUTIONS BY WDXRF IN THE NIST ANALYTICAL CHEMISTRY DIVISION

Û Alexandre Simionovici, France Wednesday 8:30

X-RAY SPECTROSCOPY AND IMAGING FOR MICRO-ANALYSIS


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Proceedings of the EDXRS 2002Presenters may submit a paper for review by July 15, 2002 to appear in a special issue of the international journal X-ray Spectrometry, published by John Wiley & Sons. These papers will undergo the normal peer reviewing process of X-ray Spectrometry. You can either submit the paper at the EDXRS 2002 registration desk or send it electronically to the following address “[email protected]” by July 15, 2002. Instructions for the authors of XRS can be found on:http://www.interscience.wiley.com/jpages/0049-8246/authors.html

Oral PresentationsAuthors are requested to adapt the length of their talks in order to leave enough room for discus-sion. An overhead projector and a beamer (LCD projector) with a note book will be at the disposal ofthe speakers. Please make sure to bring your contribution on a CD Rom as a Power Point Version ̀ 97. The availability of any further equipment should be checked with the conference office.Speakers should be present at least 15 minutes before the beginning of the Session in which they will give their presentation in order to introduce themselves to the Session Chair.

PostersAuthors have the opportunity to discuss their posters during one of the three poster sessions.Posters will be on display from morning until evening of the respective day. The size of the display area is 1.30 m in height and 0.90 m in width.

ExhibitionThe industrial exhibition will play a key role by presenting equipment and books related to X-Ray Spectroscopy such as X-Ray sources, monochromators, optics, detectors and both energy- and wavelength-dispersive XRS instruments.The exhibition starts on Sunday evening, together with the Welcome Reception. It will be open each day until Wednesday at noon. The list of exhibitors is as follows:

Û Amptek, Inc.Û amtec AnalysenmesstechnikÛ Bruker AXS GmbHÛ Gresham Scientific Instruments LtdÛ Helmut Fischer GmbHÛ Institut für Gerätebau GmbHÛ John Wiley & Sons Ltd.Û KETEK GmbHÛ L.O.T. -Oriel GmbHÛ NeXray L.L.C.Û Oxford Instruments AnalyticalÛ Philips AnalyticalÛ RÖNTEC GmbH / intax GmbHÛ Röntgenanalytik Messtechnik GmbH


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Û RTW Röntgen-TechnikÛ Spectro Analytical Instruments GmbH & Co. KGÛ Thermo Noran GmbHÛ X-Ray & Specialty Instruments Inc.Û X-ray Instrumentation AssociatesÛ X-Ray Optical Systems, Inc.Both a Message and a Job Opportunity Board will be available to all attendees and exhibitors throughout the EDXRS 2002 conference week.

ActivitiesÛ Sessions will be held from Monday until Friday.Û Poster presentations will take place on Monday, Tuesday and Thursday at the reception Hall

(“Lichthof”) (all beginning late afternoon).Û Industrial exhibition will last from Sunday at 17:00 until Wednesday at 12:00.Û Sunday, June 16, Get-together reception at 17:00Û Monday, June 17, Opening session at 8:30Û Tuesday, June 18, Public evening lectures and reception at 19:30Û Wednesday, June 19, Visit of the new technological park

Berlin-Adlershof (BESSY II and other institutes), bus transfer leaving at 14:00Û Thursday, June 20, Conference dinner and bestowal of the poster awards at 20:00Û Friday, June 21, Concluding remarks at 13:15Û Saturday, June 22, Excursion to the “Neues Palais” castle in Potsdam at 10:00

VenueBerlin stretches over 38 km (24 miles) north to south and 45 km (28 miles) east to west, and houses some 3.5 million people. It has 12 districts and Charlottenburg-Wilmersdorf is the one where the conference will take place. Berlin is not only the largest city in Germany, it is also the greenest. Some 40% of the city is covered by parks, forest, lakes, and rivers. The river Spree runs right through the city and merges in Berlin-Spandau into the river Havel. In addition, there is an extensive system of river by-passes and canals, one being very close to the TU Berlin (Landwehrkanal).With its three universities, the Freie Universität (FUB), the Humboldt-Universität (HUB), and the Technische Universität (TUB), academies, and numerous research institutes, Berlin has the largest research capacity of Germany. Berlin is also a cultural center. No less than 85 museums preserve numerous treasures of world culture, of which the well-known Pergamon Museum on the Museum Insel in Berlin-Mitte is a must for the Berlin visitor. During the last ten years Berlin has become also famous for the architectural work being done around the Potsdamer Platz close to the New Government City with the Reichstag and its new cupola constructed by Sir Norman Foster. A new cultural center has been developing recently around the S-Bahn-station “Hackescher Markt” with the Hackesche Höfe and the Oranienburger Strasse at its center and with many small art galleries, fashion shops and nice restaurants to enjoy the time.If you want to obtain more information about Berlin and its cultural attractions please enter the URL http://www.berlin.de.If you would like to take a virtual walk through Berlin use URL http://www.bau.berlin.de. English is spoken widely throughout the city.


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Conference SiteThe conference will be held on the campus of the Technical University situated in the center of Berlin. All sessions, the exhibition and the welcome reception take place at:Technische Universität Berlin (TU Berlin) Hauptgebäude (Main Building)Strasse des 17. Juni 13510623 Berlin, GermanyFrom Ernst-Reuter-Platz, which can be reached using the subway U2, walk downStrasse des 17. Juni. The Hauptgebäude is the second building on the right–hand side.

Registration deskThe registration desk will be in the historical reception hall (Lichthof).It will be open:Sunday, June 16, 17:00 to 18:30Monday, June 17, 7:30 to 18:30Tuesday, June 18, 8:00 to 18:30Wednesday, June 19, 8:00 to 13:00Thursday, June 20, 8:00 to 18:30Friday, June 21, 8:30 to 14:00Registration and payment on site with Euro currency will be possible.

CancellationsFor cancellation of the registration after May 1, 2002, no refunds are possible.

Conference DinnerThe conference dinner will take place at the “Palmenhof” (Palm Courtyard) and the “Silbersaal” (Silver Hall) of the former Grand Hotel Esplanade. It is located directly at the S-Bahn station

“Potsdamer Platz” next to the Sony Center:KaisersaalBellevuestraße 110785 Berlin

Accommodation and Travel InformationDetailed information about hotel accommodations and low-cost and modest hostel rooms can be found on the conference web pagehttp://iapf.physik.tu-berlin.de/EDXRS2002.Special rates for the conference participants are available.For travel arrangements please contact the following travel agency:EURO LLOYD Reisebüro, Attn. Ms M. JoyceKantstr. 28, 10623 BerlinTel: +49 – 30 – 315 98 410Fax: +49 – 30 – 313 24 24E-mail: [email protected]


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SUNDAY - JUNE 16, 2002

17:00 Registration & Get-together Reception


08:30 - 09:30 Welcome and OpeningRoom H 3010

Session: Novel SourcesRoom H 3010 - Chair: Peter-Viktor Nickles

09:30 - 10:05 INVITED LECTURE: ATTOSECOND X-RAY PULSES FOR TIME-RESOLVED ATOMIC AND MOLECULAR

SPECTROSCOPYFerenc KrauszCenter for Advanced Light Sources, Photonics Institute, Vienna University of Technology, Wien, Austria

10:05 - 10:25 STATE-OF-THE-ART AND OUTPUT CHARACTERISTICS OF TABLE-TOP SOFT X-RAY LASERSK. A. Janulewicz, A. Lucianetti, W. Sandner, P. V. NicklesMax Born Institute, Berlin, Germany

10:25 - 10:45 DEVELOPMENT OF A TUNABLE, MONO-ENERGETIC X-RAY SOURCE USING LASER-COMPTON SCATTERING (LCS) FROM A 20 MeV ELECTRON BEAMK. Chouffani1, D. Wells1, F. Harmon1, J. L. Jones2, G. Lancaster2

1Idaho Accelerator Center, Idaho State University, Pocatello, USA2Idaho National Engineering and Environmental Laboratory, Idaho Falls, USA

10:45 - 11:05 Coffee break

Room H 1028 - Chair: Peter-Viktor Nickles

11:05 - 11:25 X-RAY LASING AT 45 Å BASED ON INNER-SHELL PHOTO-IONIZATIONF. A. Weber, P. M. Celliers, S. J. MoonLawrence Livermore National Laboratory, Livermore, CA, USA

11:25 - 11:45 A TUNABLE MONOCHROMATIC X-RAY SOURCE IN THE 1 – 20 keV ENERGY RANGELaurent Ferreux1, Marie-Christine Lépy1, Johann Plagnard1, Jean-Claude Protas1, Christiane Bonnelle2, Jean-Michel André2, Antoine Avila2, Philippe Jonnard2

1BNM/Laboratoire National Henri Becquerel, CEA Saclay, Gif-Sur-Yvette, France2Laboratoire de Chimie Physique – Matière et Rayonnement, Université Pierre et Marie Curie, PARIS, France



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Session: Environmental and Geological ApplicationsRoom H 1028 - Chair: Eva Selin-Lindgren

11:50 - 12:25 INVITED LECTURE: PORTABLE X-RAY FLUORESCENCE IN ENVIRONMENTAL AND ARCHAEOLOGICAL

ANALYSIS: NEW ANALYTICAL CAPABILITIES, NEW ANALYTICAL CHALLENGESPhilip J. PottsDepartment of Earth Sciences, The Open University, Walton Hall, Milton Keynes, UK

12:25 - 12:45 EVALUATION OF THE Cd-BEARING PHASES IN MSW AND BIOMASS SINGLE FLY ASH PARTICLES USING SR-µXRF SPECTROSCOPYM. C. Camerani1, A. Somogyi2, A. Simionovici3, B. M. Steenari1

1Department of Inorganic Environmental Chemistry, Chalmers University of Technology, Göteborg, Sweden2Department of Chemistry, University of Antwerp (UIA), Antwerp, Belgium3ID22, European Synchrotron Radiation Facility (ESRF), Grenoble, France

12:45 - 13:05 TRACE ELEMENTS CATEGORIZATION OF POLLUTION SOURCES IN THE EQUATOR TOWN OF NANYUKI, KENYAMichael Gatari1,2, Johan Boman1

1Physics and Engineering Physics, Chalmers University of Technology and Göteborg University, Göteborg, Sweden2Institute of Nuclear Science, University of Nairobi, Nairobi, Kenya

13:05 - 14:05 Lunch break

Session: Archaeometric Applications I (PIXE, SR, SEM-EDX)Room H 106 - Chair: Roberto Cesareo

14:05 - 14:40

INVITED LECTURE:PARTICLE-INDUCED X-RAY EMISSION (PIXE) APPLIED TO THE STUDY OF OLD MANUSCRIPTSPier Andrea MandòUniversity of Florence, Department of Physics, Florence, Italy


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Session: Environmental and Geological ApplicationsRoom H 1028 - Chair: Eva Selin-Lindgren

14:45 - 15:05

ASSESSMENT OF ENVIRONMENTAL CONDITION IN THE WASTE DISPOSAL SITE OF EX-ALUMINUM PLANT NEAR OBROVAC IN CROATIAV. Valcović1, K. Nad1, J. Obhodaš1, V. Oreščanin2

1Institute Rudjer Boškovš, Zagreb, Croatia2Analysis & Control Technologies, Zagreb, Croatia

Session: Archaeometric Applications I (PIXE, SR, SEM-EDX) (cont’d)Room H 106 - Chair: Roberto Cesareo

14:45 - 15:05

PROTON INDUCED X-RAY EMISSION USING 68 MeV PROTONSA. Denker, J. Opitz-CoutureauIonenstrahllabor, Hahn-Meitner-Institut, Berlin, Germany

15:05 - 15:25

XRF ANALYSIS APPLIED TO CHEMICAL QUALITY OF QUARTZ IN ARGENTINAD. Pérez1, M. Rubio1, A. Bonalumi2,3,J. Sfragulla2,3, A. López1, A. Guereschi3,C. Vazquez4, M. Gozalvez1, M. Luchesi1, R. G. Badini1, S. L. Cuffini1, G. Sphan1, M. Inga1, A. Germanier1, R. E. Servant4

1Centro de Excelencia en Productos y Procesos (CEPROCOR), Córdoba, Argentina2Dirección de Minería de Córdoba, Córdoba, Argentina3Dpto. Geología Básica, Facultad de Ciencias Exactas, Físicas y Naturales, Universidad Nacional de Córdoba, Córdoba, Argentina4Comisión Nacional de Energía Atómica (CNEA), Buenos Aires, Argentina

15:05 - 15:25

MICROANALYSIS CHARACTERIZATION OF ANCIENT STAINED GLASSESS. Bruni1, G. Maino1,2, G. Martignani3, L. Pilotti3

1ENEA, Applied Physics Division, Bologna, Italy2Facoltà di Conservazione dei Beni Culturali, University of Bologna, Ravenna, Italy3ENEA, Centro Ricerche Nuovi Materiali, Faenza, Italy

15:25 - 15:45

GEOLOGICAL APPLICATIONS OF AN IN SITU-EDXRF-SCANNING TECHNIQUED. Rammlmair, K.-D. TackeBGR, Hannover, Germany

15:25 - 15:45

SPATIAL RESOLVED TRACE ANALYSIS OF DÜRER’S SILVER POINT DRAWINGS BY MEANS OF SR-XRFM. Radtke1, A. Berger1, W. Görner1, S. Merchel1, I. Reiche2, J. Riederer2, H. Riesemeier1

1Bundesanstalt für Materialforschung und –prüfung (BAM), Berlin, Germany

2Rathgenforschungslabor Staatliche Museen zu Berlin Stiftung Preußischer Kulturbesitz, Berlin, Germany


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17:00 - 18:30Poster Session IChairs: Maria Luisa Carvalho, Andrea Denker, Andreas Wittkopp, N. N.

Poster Session – XRS QuantitationINTERNAL EXCITATION CALCULATIONS AND APPLICATIONS FOR X-RAY ANALYSISAndrás Kocsonya, István Demeter, Imre Kovács, Zoltán Szőkefalvi-NagyKFKI Research Institute for Particle and Nuclear Physics, Budapest, Hungary

SIMULATIONS OF CENSORING EFFECTS IN XRF ANALYSISA. Kubala-Kukus, M. PajekInstitute of Physics, Swietokrzyska Academy, Kielce, PolandON MODIFICATION OF THE FUNDAMENTAL PARAMETERS ALGORITHM WITH RECURSIVE DETERMINATION OF ANALYTICAL INTENSITIESAlexander S. Filippov, Dmitry S. Inosov, Viktor V. MartynyukElvatech, Ltd., Kiev, Ukraine

ANALYSES OF POWDERED AND PELLETIZED SAMPLES BY XRF INTERNAL STANDARD METHOD - DESCRIPTION AND INTERPRETATION OF THE OBSERVED PHENOMENONZofia Mzyk1, Jan Mzyk1, Irena Baranowska2, Józef Izydorczyk3

1Institute of Non-Ferrous Metals, Gliwice, Poland2Department of Analytical and General Chemistry, Silesian Technical University, Gliwice, Poland3PROLAB Scientific Technical Bureau, Gliwice, Poland


15:45 - 16:05

LOWERING DETECTION LEVELS FOR HEAVY METALS IN GEOLOGICAL SPECIMENS USING ED-XRFB. Vrebos, W. van den Hoogenhof, S. MilnerPhilips Analytical, Almelo, The Netherlands

16:05 - 16:25

LOW SULFUR IN FUEL - A NEW ANALYTICAL CHALLENGEC. Schäfer1, E. Pappert2, R. Schramm1, D. Wissmann1

1Spectro Analytical Instruments, Kleve, Germany2Thyssen Krupp Stahl AG, Duisburg, Germany

15:45 - 16:05

PHYSICAL-CHEMICAL INVESTIGATION OF ANCIENT KYIV GLAZESAleksey V. Zazhigalov1, Sergey I. Klimovsky2, Valery A. Zazhigalov3, Jerzy Stoch4, Andrzej Kowal4

1National Reserve Kyiv-Pechersk Lavra, Department of Archaeology, Kyiv, Ukraine 2Institute of Archaeology, NAS of Ukraine, Kyiv, Ukraine3Institute of Sorption and Problems of Endoecology, NAS of Ukraine, Kyiv, Ukraine4Institute of Catalysis and Surface Chemistry, PAS, Krakow, Poland


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RANDOM LEFT-CENSORING: A STATISTICAL APPROACH ACCOUNTING FOR DETECTION LIMITS IN X-RAY FLUORESCENCE ANALYSISM. Pajek, A. Kubala-Kukus, D. Banas, J. Braziewicz, U. MajewskaInstitute of Physics, Swietokrzyska Academy, Kielce, Poland

ABOUT THE USE OF MEASURED LINE RATIOS FOR THE QUANTIFICATION OF XRF MEASUREMENTSM. Radtke1, L. Vincze2, A. Knöchel3

1Federal Institute for Materials Research and Testing (BAM), Berlin, Germany2University of Antwerp, Wilrijk-Antwerp, Belgium3University of Hamburg, Hamburg, Germany

ACCURATE DETERMINATION OF THE THICKNESS OF THIN SPECIMENS AND APPLICATIONS IN X-RAYS ATTENUATION MEASUREMENTSC. Q. Tran, C. T. Chantler, Z. Barnea, M. de Jonge, B. B. DhalSchool of Physics, University of Melbourne, Australia

X-RAY FLUORESCENCE QUANTIFICATION AT THE ESRF ID18F MICROPROBEB. Vekemans1, L. Vincze1, A. Somogyi1, M. Drakopoulos2, A. Simionovici2, F. Adams1

1MiTAC, University of Antwerp, Wilrijk, Belgium2ID22 ESRF, Grenoble Cedex, France

FUNDAMENTAL PARAMETERS APPROACH IN TUBE EXCITED SECONDARY TARGET XRF SETUPS: COMPARISON BETWEEN THEORETICAL AND EXPERIMENTAL DATACh. Zarkadas, A. G. Karydas, T. ParadellisLaboratory of Material Analysis, Institute of Nuclear Physics, NCSR “Demokritos”, Aghia Paraskevi, Greece

Poster Session – Fundamental ProcessesSTOCHASTIC HEATING OF PLASMAV. A. Buts, E. A. Kornilov, K. N. StepanovNational Center of Scienc, Kharkov Institute of Physics and Technology, Kharkov, Ukraine

USING SECONDARY RESONANCES FOR AMPLIFICATION OF AN X-RAY RADIATION IN CRYSTALSV. A. ButsNational Center of Science, Kharkov Institute of Physics and Technology, Kharkov, Ukraine

MEASUREMENT OF L-SHELL INTENSITY RATIOS FOR SOME ELEMENTS IN THE ATOMIC NUMBER RANGE 66 ≤ Z ≤ 90 BY PHOTOIONIZATION CONSECUTIVE L-SUBSHELLSH. Erdoğan1, E. Öz2, M. Ertuğrul3, Y. ahin2

1Pamukkale University, Faculty of Arts and Sciences, Department of Physics, Denizli, Turkey2Atatürk University, Faculty of Arts and Science, Department of Physics, Erzurum, Turkey3Atatürk University, Faculty of Education, Department of Physics, Erzurum, Turkey


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MEASUREMENT OF TOTAL, RADIATIVE AND RADIATIONLESS (AUGER) VACANCY TRANSFER PROBABILITIES FROM K TO L

i SUBSHELL OF Cs, Ba AND La

M. ErtuğrulAtaturk University, Education Faculty, Department of Physics, Erzurum, Turkey

MEASUREMENTS OF ATOMIC FORM FACTORSSalih Erzeneoğlu1, Orhan İçelli2, Yusuf ahin1

1Department of Physics, Faculty of Sciences, Atatürk University, Erzurum, Turkey2Department of Physics Education, Education Faculty of Erzincan, Atatürk University, Erzincan, Turkey

MEASUREMENTS OF σL1

, σL2

AND σL3

SUBSHELL PHOTOEFFECT CROSS-SECTIONS FOR SOME ELEMENTS IN THE ATOMIC RANGE 72 ≤ Z ≤ 92A. Karabulut1, A. Gürol1, G. Budak1, R. Polat2, N. Ekinci1

1Atatürk University, Faculty of Art and Science, Department of Physics, Erzurum, Turkey2Atatürk University, Erzincan Education Faculty, Erzincan, Turkey

L-ALPHA AND L-BETALINE X-RAY PRODUCTION CROSS SECTION FOR PROTON BEAMS ON THIN PB TARGETS. Ouziane, A. AmokraneUniversity of sciences and technology Houari Boumedienne, Faculty of Physics, El Alia, Bab, Ezzouar, Algiers, Algeria

Poster Session – Related MethodsAPPLICATION OF ENERGY-DISPERSIVE X-RAY DIFFRACTION FOR MOBILE ANALYSISR. Arnhold1, B. Kämpfe2

1intax Röntgenanalysen-Technik GmbH, Berlin, Germany2Fraunhofer Institut Zuverlässigkeit und Mikrointegration, Berlin, Germany

INVESTIGATION OF Si1-α -β Ge

α C

β /Si STRAIN-COMPENSATED HETEROJUNCTION BY THE

HARD X-RAYS BACKDIFFRACTION METHODHakob P. Bezirganyan1, Siranush E. Bezirganyan1, Hayk H. Bezirganyan (Jr.)2,Petros H. Bezirganyan (Jr.)3

1Faculty of Physics, Yerevan State University, Yerevan, Armenia2Faculty of Informatics and Applied Mathematics, Yerevan State University, Yerevan, Armenia3Dep. of Computer Science, State Engineering University of Armenia, Yerevan, Armenia

COLLIMATION OF DIAGNOSTIC BUNDLE OF X-RAY APPARATUS WITH THE USE OFELECTRIC-MAGNETIC-RHEOLOGIC BASEAndrzej Dyszkiewicz1,2,3, Zygmunt Wróbel1

1Computer Science Department, University of Silesia, Sosnowiec, Poland2Silesian Hospital, Poland3Laboratory of Biotechnology, Cieszyn, Poland


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COMPUTED TOMOGRAPHY WITH X-RAY TUBES AND SYNCHROTRON RADIATIONJ. Goebbels, G. Weidemann, H. RiesemeierFederal Institute for Materials Research and Testing (BAM), Berlin, Germany

INVESTIGATION OF THE Ca12

Al14

O33

CHEMICAL SYNTHESIS AND HYDRATION PROCESS BYX-RAY DIFFRACTIONIonela Carazeanu, Elisabeta Chirila, Carmen Guguta

“Ovidius“ University, Chemistry Department, Constanta, Romania

SUPERCONDUCTING HIGH TEMPERATURE POLYMER CERAMIC COMPOSITIONSA. O. Tonoyan, S. M. Hayrapetyan, S. P. Davtyan, O. Hovnanyan KarlenState Engineering University, Yerevan, Republic of Armenia

NEW METHOD TO STUDY THE CORRELATION BETWEEN THE IMPURITY MODULATION AND DOMAIN WALLS LOCATION IN THE PPLN CRYSTALSS. V. Lavrishchev1, N. F. Evlanova2, I. I. Naumova2, S. A. Blokhin2, T. O. Chaplina2

1General Physics Institute Russian Academy of Science, Moscow, Russia2Physical Department, Moscow State University, Moscow, Russia

X-RAY METHODS FOR RESEARCHING OF PLASMA DEPOSITION PROCEDUREA. B. Kobernichenko, E. N. Moos, V. V. SaltanRyazan State Pedagogical University, Laboratory of Surface Physics, Ryazan, Russia

OPTICAL AND X-RAY SPECTRA FROM A SINGLE XRF SOURCEM. A. Padmanabha RaoCharak Sadan, Vikas Puri, New Delhi, India

THE ANALYSIS OF EXPONENTIAL DECREASING TEMPORAL γ-RAY SPECTRA INITIATED BY NEUTRON RADIATIONA. V. Il’insky1, K. I. Koslovsky2, A. S. Tsybin2, A. E. Shikanov1

1Institute for Geophysics and Radiation Technologies of the HIEAS, Moscow, Russia2Moscow Engineering Physics Institute (State University), Moscow, Russia

X-RAY INVESTIGATION OF THE CHANGES IN STRUCTURE OF Nb2O

5 FILMS CAUSED BY

GENERATING ANION DEFECTS ON THEIR SURFACEL. Skatkov4/23 Shaul ha-Melekh St., Beer-Sheva, Israel


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Poster Session – SR-X-Ray SpectroscopyINVESTIGATION OF A NAKHLITE GRAIN BY THE X-RAY FLUORESCENCE MICROTOMOGRAPHYM. Chukalina1, A. Simionovici2, L. Lemelle3, L. Vincze4, P. Gillet31Institute of Microelectronics Technology RAS, Chernogolovka, Russia2European Synchrotron Radiation Facility, BP220, Grenoble Cedex, France3Laboratoire des Sciences de la Terre, ENS Lyon, Lyon, France4MiTAC, University of Antwerp (UIA), Antwerp, Belgium

HOMOGENEITY MEASUREMENTS ON A THIN LAYER REFERENCE MATERIAL USING SY-XRFK. H. Ecker, M. Radtke, H. RiesemeierFederal Institute for Materials Research and Testing (BAM), Berlin, Germany

APPLICATION OF SY-XRF-MICROPROBE FOR THE INVESTIGATION OF CONTAMINATED LUNG TISSUES OF URANIUM-MINERSJ. Feuerborn1, A. Knöchel1, F. Lechtenberg2, A.-K. Meyer1, M. Paulsen1, S. Staub1, H. Wesch3,G. Weseloh1

1Institut für Anorganische und Angewandte Chemie, Universität Hamburg, Hamburg, Germany2Röntgenanalytikservice Dr. Frank Lechtenberg, Itzehoe, Germany3Deutsches Krebsforschungszentrum (DKFZ), Heidelberg, Germany

A NOVEL INSTRUMENTATION FOR EDXRF AND TXRF ANALYSIS ON 300 mm Si-WAFER WITH SYNCHROTRON RADIATIONB. Beckhoff, R.Fliegauf, J. Weser and G. UlmPhysikalisch-Technische Bundesanstalt, Berlin, Germany

THIN FILM REFERENCE MATERIALS FOR THICKNESS MEASUREMENT BY XRF AND XRD IN THE NANOMETRE RANGEK. Hasche1, K. Herrmann1, M. Krumrey1, G. Ulm1, P. omsen-Schmidt1, S. Schädlich2,W. Frank3, M. Procop4, M. Radtke4

1Physikalisch-Technische Bundesanstalt (PTB) Braunschweig und Berlin, Germany2Fraunhofer Institute for Material and Beam Technology (IWS), Dresden, Germany3Institute for Surface Modification, Leipzig (IOM), Germany4Federal Institute for Materials Research and Material Testing (BAM), Berlin, Germany

A MONTE CARLO MODEL FOR STUDYING THE MICRO-HETEROGENEITY OF TRACE ELEMENTS IN STANDARD REFERENCE MATERIALS (SRM) BY MEANS OF SYNCHROTRON MICRO-XRFL. Kempenaers1, K. Janssens1, L. Vincze1, B. Vekemans1, A. Somogyi2, M. Drakopoulos2,A. Simionovici2, F. Adams1

1Department of Chemistry, University of Antwerp, Antwerp, Belgium2European Synchrotron Radiation Facility, Grenoble, Cedex, France

A DEDICATED X-RAY FLUORESCENCE MICROPROBE AT ELETTRAW. Jark1, K. C. Prince1, M. Matteucci2, M. Altarelli1

1Sincrotrone Trieste, Basovizza (TS), Italy2CNR outstation at the Sincrotrone Trieste, Basovizza (TS), Italy


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16 ED RS2002

16 MONDAY - JUNE 17, 2002 17ED RS2002


17ED RS2002

ANALYSIS AND LOCALIZATION OF METAL- AND METALLOID-CONTAINING PROTEINS BY SYNCHROTRON-RADIATION X-RAY FLUORESCENCEM. Kühbacher1, G. Weseloh1, A. Kyriakopoulos1, C. Wolf1, A. Knöchel2, D. Behne1

1Hahn-Meitner Institut Berlin, Department Trace Element Research in the Life Sciences, Berlin, Germany2Universität Hamburg, Institute of Inorganic and Applied Chemistry, Hamburg, Germany

THE SYNCHROTRON X-RAY-FLUORESCENCE STATION AT ANKA, KARLSRUHE: GENERAL LAYOUTR. Simon1, S. Staub1, C. Frieh2, M. Hagelstein1,2

1Forschungszentrum Karlsruhe, Karlsruhe, Germany2ANKA GmbH, Karlsruhe, Germany

SPATIALLY RESOLVED CHEMICAL SPECIATION: XANES IMAGING AND TOMOGRAPHY AT THE ID22 BEAM-LINE OF THE ESRFA. Somogyi1, C. Rau2, A. Simionovici2

1Micro- and Trace Analysis Centre, University of Antwerp, Wilrijk-Antwerp, Belgium2ID22 ESRF, Grenoble Cedex, France

A VERSATILE INSTRUMENT FOR EDXRF AND TXRF WITH SYNCHROTRON RADIATIONB. Beckhoff, R. Fliegauf, J. Weser, G. UlmPhysikalisch-Technische Bundesanstalt, Berlin, Germany


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16 ED RS2002

16 MONDAY - JUNE 17, 2002 17ED RS2002


17ED RS2002

TUESDAY - JUNE 18, 2002

Session: Quantitation in XRSRoom H 1028 - Chair: Jorge E. Fernández

08:30 - 09:05 INVITED LECTURE: QUANTITATIVE XRF

Michael MantlerInstitute of Solid State Physics, Vienna University of Technology, Austria

09:05 - 09:25 SPECTRUM PROCESSING IN ED-XRF ANALYSIS OF MULTILAYER THIN FILMSBrian Cross, Andreas WittkoppNeXray Corporation, Ronkonkoma, New York, USA

09:25 - 09:45 A FINGERPRINT MODEL FOR INHOMOGENEOUS INK PAPER LAYER SYSTEMS MEASURED WITH MICRO X-RAY FLUORESCENCE ANALYSISW. Malzer1, O. Hahn2, B. Kanngießer1, U. Waldschläger3

1Institut für Atomare und Analytische Physik, Technical Universtity of Berlin, Berlin, Germany,2Federal Institute for Materials Research and Testing (BAM), Berlin, Germany3Intax GmbH, Berlin, Germany

09:45 - 10:05 ASSESSING MULTIPLE DISPERSION INFLUENCE ON ANNULAR RADIOSIOTOPE EXCITED EDXRSRomán Padilla Alvarez1, Arian Abrahantes Quintana1, Pierre M. Van Espen2

1Centre of Technological Applications and Nuclear Development (CEADEN), Havana, Cuba2Department of Chemistry, University of Antwerp, Belgium

10:05 - 10:25 INVESTIGATION OF SECONDARY EXCITATION EFFECTS IN X-RAY FLUORESCENCE ANALYSIS FOR THE LOW-ENERGETIC REGIONN. Kawahara1, T. Yamada1, B. Beckhoff 2, G. Ulm2, R. Herbst3, M. Mantler3

1X-ray Research Lab., Rigaku Corp., Osaka, Japan2Physikalisch-Technische Bundesanstalt, Berlin, Germany3Institut für Festköperphysik, Technische Universität Wien, Wien, Austria


TUESDAY- JUNE 18, 2002


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18 TUESDAY - JUNE 18, 2002 19ED RS2002



10:57 - 11:09

BRUKER AXS GOES EDXPol de Pape, Kai Behrens, Karl Mauser, Wolfgang KlöckBruker-AXS GmbH, Analytical X-Ray Systems, Karlsruhe, Germany

11:05 - 11:25

X-RAY EXTENDED-RANGE TECHNIQUE FOR PRECISION MEASUREMENT OF THE X-RAY MASS ATTENUATION COEFFICIENT AND IM(F) FOR SILICON USING SYNCHROTRON RADIATIONC. Q. Tran1, C. T. Chantler1, Z. Barnea1, D. Paterson1, D. J. Cookson2

1School of Physics, University of Melbourne, Australia2Chem-Mat-CARS-CAT, Argonne National Laboratory, Argonne, IL, USA

11:09 - 11:21

OPTIMISATION STRATEGIES FOR BENCHTOP EDXRF SYSTEMSAndrew T. EllisOxford Instruments Analytical Ltd, High Wycombe, UK

11:25 - 11:45

MULTIPLE SCATTERING OF X-RAYS BY LARGE WATER SAMPLESS. C. Cardoso1,3, O. D. Gonçalves1, H. Schechter1, J. Eichler2, and H.-J. Schulz2

1Instituto de Física, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil2Technische Fachhochschule, Berlin, Germany

3Ph.D. Scholarship from Conselho Nacional de Desenvolvimento Científico (CNPq)

11:21 - 11:33

HIGH PERFORMANCE SEMICONDUCTOR X-RAY DETECTORS FOR ELEMENT ANALYSIS IN ELECTRON MICROSCOPEST. SchüleinRÖNTEC GmbH, Berlin, Germany

Session: Recent Scientific Developments of Industrial InstrumentsRoom H 1028 - Chair: Gerhard Ulm

10:45 - 10:57

RECENT DEVELOPMENTS IN EDXRF USING POLARISED X-RAYSD. Wissmann, R. SchrammSpectro Analytical Instruments, Kleve, Germany

Session: Interaction of X-rays with MatterRoom H 106 - Chair: Héctor Jorge Sánchez

10:45 - 11:05

ANALYSIS OF THE GEOMETRY EFFECTS ON THE FLUORESCENCE RADIATION FIELD IN THE FRAME OF TRANSPORT THEORYJ. E. Fernandez, V. Molinari, F. TeodoriINFM and Laboratory of Montecuccolino, University of Bologna, Bologna, Italy


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11:45 - 12:05

A STUDY OF INTENSITY DISTRIBUTION OF K-SHELL COMPTON CROSS SECTION IN THE INTERMEDIATE MOMENTUM TRANSFER REGIONBhajan Singh1, Gurdeep Singh2, B.S. Sandhu1, and B. S. Ghumman1

1Physics Department, Punjabi University, Patiala, India2Physics Department, Punjab Agricultural University, Ludhiana, India

11:33 - 11:45

UNIQUE PORTABLE X-RAY EQUIPMENT BY NOVEL X-RAY TECHNOLOGIESArmin Grossintax GmbH, Berlin, Germany

12:05 - 12:25

MEASUREMENT OF ALIGNMENT PARAMETER FOR PHOTON INDUCED OF L

3 VACANCIES IN

ELEMENTS 70≤Z≤81 AT 59.5 keVH. Erdogan1, M. Ertugrul2

1Pamukkale University, Faculty of Science and Arts, Department of Physics, Denizli, Turkey2Ataturk University, K. K. Education Faculty, Dept of Physics, Erzurum, Turkey

11:45 - 11:57

SILICON DRIFT DETECTORS (SSD) FOR THE µ-EDXRF ANALYSIS OF LAYERED MATERIALAndreas Wittkopp, Frank FerrandinoNeXray Corporation, New York, USA

11:57 - 12:09

A MODULAR SYSTEM CONSISTING OF A MICROFOCUS X-RAY SOURCE AND DIFFER-ENT CAPILLARY OPTICS FOR XRF AND XRD APPLICATIONSA. Bjeoumikov1, N. Langhoff1 J. Rabe1,2, R. Wedell1,2

1IfG - Institut für Gerätebau GmbH, Berlin, Germany2IAP - Institut für angewandte Photonik e. V., Berlin, Germany

12:09 - 12:21

MICROFOCUS X-RAY TUBES IN METAL-CERAMIC TECHNIQUEHarald F. H. Warrikhoffrtw Röntgen-Technik Dr. Warrikhoff KG, Neuenhagen b. Berlin, Germany

12:21 - 12:33

HOPG AS A POWERFUL X-RAY OPTICSI. G. Grigorieva, A. A. AntonovInstitute of Carbon Based Materials, Moscow, Russia


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Session: Quality Management and Quantitation in XRSRoom H 1028 - Chair: John R. Sieber

14:15 - 14:50 INVITED LECTURE: WHAT ARE CURRENT AND FUTURE REQUIREMENTS FOR ANALYTICAL

EQUIPMENT IN INDUSTRY? HIGHLIGHTING WITH A PRACTICAL CASE OF TXRF

Siegfried Pahlke, Laszlo FabryWacker Siltronic AG, Central Research and Development, Central Analytical Laboratories, Burghausen, Germany

14:50 - 15:10 QUALITY CONTROL IN ELECTROPLATING BY MEANS OF X-RAY FLUORESCENCE ANALYSISV. Rößiger, B. NenselHelmut Fischer GmbH+Co. KG, Sindelfingen, Germany

15:10 - 15:30 MATRIX CORRECTION FOR TRACE ELEMENT ANALYSIS USING MASS ATTENUATION COEFFICIENTSS. Milner, B. VrebosPhilips Analytical, Almelo, The Netherlands

15:30 - 15:50 DIRECT FITTING OF EDX-SPECTRAKai Behrens, Karl MauserBruker AXS GmbH, Karlsruhe, Germany

12:25 - 12:45

SOME NEW PHYSICAL MECHANISMS FOR GENERATION OF AN X-RADIATION AND FOR A MODIFICATION ITS PARAMETERSV. A. ButsNational center of science, Kharkov Physic-Technical institute, Kharkov, Ukraine

12:33 - 12:45

SUITABILITY OF WD-XRF INSTRUMENTS IN SPECIFIC APPLICATION AREASDidier Bonvin, Ravi Yellepeddi, Kurt JuchliThermo ARL, En Vallaire, Ecublens, Switzerland

12:45 - 12:57

A LIGHTWEIGHT, HAND-HELD PORTABLE X-RAY ANALYZER WITH MINIATURE X-RAY TUBE REDEFINES THE FUTURE OF FIELD PORTABLE XRF ANALYSISStanislaw PiorekNiton Corporation, Billerica, MA, USA

12:45 - 13:05

A COMPARISON BETWEEN THE MCP BASED DETECTORS FOR HARD AND SOFT X-RAYSHossein GolnabiInstitute of Water and Energy, Sharif University of Technology, Tehran, Iran


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15:50 - 16:10 QUANTITATIVE APPLICATION OF FUNDAMENTAL PARAMETERS CALCULATIONS TO SPECTRA ACQUIRED BY A CAPILLARY-FOCUSSED MICRO-XRF SYSTEMW. T. Elam, Robert B. Shen, Bruce Scruggs, Joseph NicolosiEDAX, Inc., Mahwah, NJ, USA

16:30 - 18:00Poster Session IIChairs: Johan Boman, Karl Mauser, Norbert Langhoff, N. N.

Poster Session - Biomedical and Biological ApplicationsDETERMINATION OF THE BIODISTRIBUTION AND BIOKINETICS OF RADIOPHARMACA USED FOR THERAPEUTIC TREATMENT BY ENERGY DISPERSIVE MEASUREMENTSHelmut Fischer1,2, Hannes Aiginger1, Ulrike Prüfert1, Susanne Granegger3, Sedat Ofluoglu3, Christian Pirich3, Helmut Sinzinger3, Ferdinand Steger4

1Atomic Institute of the Austrian Universities, Vienna, Austria 2Department of Biomedical Engineering and Physics, Vienna, Austria3Department of Nuclear Medicine, Vienna, Austria4Austrian Research Centers Seibersdorf, Seibersdorf, Austria

ACCELERATOR BASED NUCLEAR ANALYTICAL METHODS FOR TRACE ELEMENT STUDIES IN MATERIALS-CALCIFIED TISSUESM. Anwar ChaudhriPakistan Council of Scientific and Industrial Research, Laboratories-Complex-Lahore, PakistanSchool of Physics, University of Melbourne, Melbourne, AustraliaThe Institute of Medical Physics, University of Erlangen-Nuernberg, Erlangen, Germany

THE USE OF COMBINED TRACE ELEMENT XRF AND EDXRD AS A HISTOPATHOLOGY TOOL IN CHARACTERISING BREAST TISSUEM. J. Farquharson1, K. Geraki1, R. D. Speller3, D. A. Bradley2, O. D. Goncalves4

1Department of Radiography, City University, London, UK2School of Physics, University of Exeter, Exeter, UK3Department of Medical Physics, University College London, London, UK4Instituto de Fisica Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil

APPLICATION OF THE TXRF METHOD FOR THE ELEMENTAL ANALYSIS OF THE CEREBROSPINAL FLUID (CSF) IN AMYOTROPHIC LATERAL SCLEROSIS (ALS)B. Ostachowicz1, M. Boruchowska1, M. Lankosz1, B. Tomik2, A. Szczudlik2, D. Adamek2

1Department of Radiometric Analyses, Faculty of Physic and Nuclear Techniques, University of Mining and Metallurgy, Krakow, Poland2Institute of Neurology, Collegium Medicum, Jagiellonian University, Krakow, Poland


ED RS2002




XRF ANALYSIS OF ARSENIC DOPED SKIN PHANTOMSR. C. N. Studinski, F. E. McNeill, D. R. ChettleMedical Physics and Applied Radiation Sciences Unit, McMaster University, Hamilton ON, Canada

DETERMINATION OF ELEMENTAL COMPOSITION OF AORTIC VALVE CUSPS BY EDXRFA. Wróbel1,2, G. Goncerz3, P. Podolec4, E. Rokita1,2

1Institute of Physics, Jagiellonian University, Kraków, Poland2Regional Laboratory of Physicochemical Analyses and Structure Research, Jagiellonian University, Kraków, Poland3Department of Anatomy, Collegium Medicum, Jagiellonian University, Kraków, Poland,4Department of Cardiovascular Diseases, Collegium Medicum, Jagiellonian University, Kraków, Poland

Poster Session - Environmental ApplicationsELEMENTAL CONCENTRATIONS OF SOME FISH SAMPLES FROM RIZE ARDESEN AREA OF THE EAST BLACK SEA BY ENERGY DISPERSIVE X-RAY FLUORESCENCE ANALYSISSevim Akyuz1, Tanil Akyuz2,1Department of Physics, Istanbul University, Vezneciler, Istanbul, Turkey2Physics Department, Istanbul University, Vezneciler, Istanbul, Turkey3Institute of Nuclear Physics, Uzbek Academy of Sciences, Ulugbek, Tashkent, Uzbekistan

EXTENDING THE QUANTITATIVE ANALYTICAL CAPABILITIES OF EDXRF TECHNIQUE FOR ENVIRONMENTAL SAMPLESS. A. Bamford1, E. Chinea-Cano1, A. Markowicz1, M. Jaksic2, Z. Medunic2

1IAEA Seibersdorf Laboratories, Seibersdorf, Austria2Ruder Boskovic Institute, Zagreb, Croatia

EDXRF ANALYSIS OF RED AND WHITE WINES FROM BRAZILM. J. Anjos1,2, R. T. Lopes2, E. F. O. de Jesus2, R. C. Barroso1, S. M. Simabuco3, C. R. F. Castro2

1University of Rio de Janeiro State-Physics Institute, Rio de Janeiro, Brazil2Nuclear Instrumentation Laboratory, COPPE, UFRJ, Rio de Janeiro, Brazil3State University of Campinas, FEC/UNICAMP, Brazil

CONCENTRATIONS AND SOURCES OF TRACE ELEMENTS IN PARTICULATE AIR POLLUTION,DAR ES SALAAM, TANZANIA, STUDIED BY EDXRF TECHNIQUEC. Bennet, E. Selin-LindgrenEnvironmental Physics, Physics and Engineering Physics, Göteborg University, Göteborg, Sweden

SOOT AND PARTICULATE POLLUTANTS IN THE VICINITY OF A COAL FIRED POWER PLANT IN NORTHERN VIETNAMAnnemarie Wagner, Johan BomanPhysics and Engineering Physics, Chalmers University of Technology and Göteborg University, Göteborg, Sweden


ED RS2002




DIFFERENCES AND SIMILARITIES IN ELEMENTAL COMPOSITION OF AEROSOLS IN HANOI AND NAIROBIMichael Gatari1,2, Annemarie Wagner1, Johan Boman1

1Physics and Engineering Physics, Chalmers University of Technology and Göteborg University, Göteborg, Sweden2Institute of Nuclear Science, University of Nairobi, Nairobi, Kenya

USE OF X-RAY ANALYSIS IN STUDIES OF QUALITY OF SEEDS OF SOME SPECIES OF AGRICULTURALSusana Calderón Piñar, Maricel Micó InfanzónInstituto de Investigaciones Fundamentales de Agricultura Tropical “Alejandro de Humboldt” (INIFAT), Ciudad de La Habana, Cuba

HEAVY ELEMENTS IN THE INDUSTRIAL WASTESJ. M. Chatterjee, M. Sarkar, S. RoySaha Institute of Nuclear Physics, Kolkata, India

ELEMENTAL AEROSOL CHARACTERIZATION OVER LAKE BALATONJasna Injuk, René Van GriekenDepartment of Chemistry, University of Antwerp, Antwerp, Belgium

ENERGY DISPERSIVE X-RAY FLUORESCENCE ANALYSIS SPECTROMETRY IN DAR ES SALAAMY. I. A. Koleleni, J. W. A. KondoroPhysics Department, University of Dar es Salaam, Dar es Salaam, Tanzania

LEAD LEVELS IN THE ATMOSPHERE OF DAR ES SALAAM DETERMINED BY X-RAY FLUORESCENCE ANALYSISY. I. A. KoleleniPhysics Department, University of Dar es Salaam, Dar es Salaam, Tanzania

CHARACTERISATION OF PAINT LAYERS BY RADIOISOTOPE INDUCED XRFI. Kovács, I. Demeter, A. Kocsonya, Z. Szőkefalvi-NagyKFKI Research Institute for Particle and Nuclear Physics, Budapest, Hungary

COCONUT ELEMENTAL ANALYSIS BY XRF - COMPARING WATER AND EDIBLE PULPRafael Arromba de Sousa, Antenor Lopes, Solange Cadore, Maria Izabel M. S. BuenoDepartamento de Química Analítica – Instituto de Química - UNICAMP, Campinas-SP, Brasil

COMPOSITION, COMPONENTS AND SOURCES OF FINE AEROSOL FRACTIONS USING MULTIELEMENTAL EDXRF ANALYSISG. M. Marcazzan, M. Ceriani, G. Valli, R. VecchiIstituto di Fisica Generale Applicata - University of Milan, Milan, Italy


ED RS2002




ELEMENTAL SIZE DISTRIBUTION OF AIRBORNE PARTICLES IN RIGA CITY, LATVIAArturs Viksna1, Eva Selin Lindgren2, Paulis Standzenieks2, Jan Jacobsson2

1University of Latvia, Department of Analytical Chemistry, Riga, Latvia2Chalmers University of Technology, Department of Environmental Physics, Gothenburg, Sweden

Poster Session - Geological ApplicationsENERGY DISPERSIVE X-RAY FLUORESCENCE AND NEUTRON ACTIVATION ANALYSES OF SEDIMENTS FROM TURKISH COAST OF THE BLACK SEAS. Akyuz1, T. Akyuz2, N. M. Mukhamedshina3, A. A. Mirsagatova3

1Department of Physics, Istanbul University, Istanbul, Turkey2Physics Department, Istanbul University, Istanbul, Turkey3Institute of Nuclear Physics, Uzbek Academy of Sciences, Ulugbek, Tashkent, Uzbekistan

ENERGY DISPERSIVE X-RAY FLUORESCENCE ANALYSIS OF MAGMATIC ROCKS FROM KELAAT M’GOUNA (WESTERN ANTI ATLAS, MOROCCO)F. Benyaïch1, M. Bounakhla2, A. Rahmani1, A. Sâadane1, E. Bilal3, J. Moutte3, J. J. Gruffat3

1Faculté des Sciences, Université Moulay Ismaïl, Beni M’Hamed, Meknès, Morocco2Centre National de l’Energie, des Sciences et Techniques Nuclèaires, Agdal, Rabat, Morocco3Département GENERIC, Centre SPIN, Ecole des Mines de Saint-Etienne, Cours Fauriel, Saint-Etienne, France

WD-XRF AND ICP-AES ANALYSIS OF SOILS AND SEDIMENTS ALONG THE OUED BOUFEKRANE RIVER (MOROCCO)M. Tahri1, A. Rahmani1, F. Benyaïch1, M. Bounakhla2, F. Zahry2, E. Bilal3, J. J. Gruffat3,J. Moutte3, D. Garcia3, L. Torrisi4

1Université Moulay Ismaïl, Faculté des Sciences, Département de Physique, Béni M’Hamed, Meknès, Morocco2Centre National de l’Energie, des Sciences et Techniques Nucléaires, Agdal, Rabat, Morocco3Département GENERIC, centre SPIN, Ecole Nationale Supérieure des Mines, Saint-Etienne, France4Dipartimento di Fisica, Università di Messina, S. Agata, Messina, Italy

GENESIS OF PLOMIN BAY SEDIMENTSV. Oreščanin1, K. Nađ2, J. Obhođaš2, V. Valković2

1Analysis & Control Technologies, Zagreb, Croatia2Institute Rudjer Boškoviš, Zagreb, Croatia

MINERALOGICAL APPLICATIONS OF AN EDXRF-MICROSCOPED. Rammlmair, K.-D. TackeBGR, Hannover, Germany


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XRF ANALYSIS APPLIED TO STUDY INDUSTRIAL FELDSPARS AND GRANITOIDS OF ARGENTINAD. Pérez1, M. Rubio1, A. Bonalumi2,3, J. Sfragulla2,3, A. López1, A. Guereschi3, C. Vazquez4, M. Gozalvez1, M. Luchesi1, R. G. Badini1, S. L. Cuffini1, G. Sphan1, M. Inga1, A. Germanier1,R. E. Servant4

1Centro de Excelencia en Productos y Procesos (CEPROCOR), Agencia Córdoba Ciencia S.E., Córdoba, Argentina2Dirección de Minería (Córdoba), Córdoba, Argentina3Dpto. Geología Básica, Facultad de Ciencias Exactas, Físicas y Naturales, Universidad Nacional de Córdoba, Córdoba, Argentina4Comisión Nacional de Energía Atómica (CNEA), Buenos Aires, Argentina

CHEMICAL DETERMINATION OF COLOURED ZONED MINERALS IN “NATURAL STONES” BY EDS/WDS ELECTRON MICROPROBE: AN EXAMPLE FROM DUMORTIERITE QUARZITESA. Borghi1, R. Cossio2, L. Fiora1, F. Olmi3, G. Vaggelli3

1Dip. di Scienze Mineralogiche e Petrologiche, Universita’ di Torino, Torino, Italy2Dip. di Scienze della Terra, Universita’ di Torino, Torino, Italy3CNR – Istituto di Geoscienze e Georisorse, Sezione di Firenze, Firenze, Italy

RECONSTRUCTION OF METAL POLLUTION EVENTS IN THE CATCHMENT AREA OF THE TISZA RIVER BY MEANS OF SEDIMENT-ANALYSISI. Szalóki1, M. Braun2, J. Injuk, M. Leermakers3, B. Alföldy4, H. L. Nguyen3, Johan de Hoog5, R. Van Grieken5

1Institute of Experimental Physics, University of Debrecen, Debrecen, Hungary2Department of Inorganic Chemistry, University of Debrecen, Debrecen, Hungary3Department of Analytical and Environmental Chemistry, Vrije University Brussel, Brussels, Belgium4KFKI Atomic Energy Research Institute, Budapest, Hungary5Department of Chemistry, University of Antwerp, Antwerp, Belgium

APPLICABILITY OF STANDARDLESS ED-XRF FOR ASSESSMENT AND REMEDIATION OF HEAVY METALS IN SOILS C. Vanhoof, B. Noten, V. Corthouts, K. TirezFlemish Institute for Technological Research (Vito), Mol, Belgium

TOTAL AND AVAILABLE METAL CONTENTS IN SEDIMENTS BY SYNCHROTRON RADIATION TOTAL REFLECTION X-RAY FLUORESCENCES. M. Simabuco1, G. A. Sobrinho1, E. F. O. de Jesus2, A. E. S. Vives3, R. T. Lopes2

1Civil Engineering Faculty, UNICAMP, Campinas, SP, Brazil2Federal University of Rio de Janeiro, Rio de Janeiro, RJ, Brazil3Methodist University of Piracicaba, SP, Brazil


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Poster Session – Various XRS ApplicationsAPPLICATION OF X-RAY FLUORESCENCE ANALYSIS AND RUTHERFORD BACK-SCATTERING FOR THE EXAMINATION OF CORRODED SURFACESM. Anwar ChaudhriPakistan Council of Scientific and Industrial Research, Laboratories-Complex-Lahore, PakistanSchool of Physics, University of Melbourne, Melbourne, AustraliaThe Institute of Medical Physics, University of Erlangen-Nuernberg, Erlangen, Germany

IDENTITY CHECK OF SOLID SAMPLES BY ENERGY DISPERSIVE X-RAY FLUORESCENCE SPECTROSCOPYT. Ernst1, M. Bartels1, M. Ohm2, K. Beckenkamp2

1Central Analytical Research, Merck KgaA, Darmstadt, Germany2Production and Filling - Analytical Laboratories, Merck KgaA, Darmstadt, Germany

EVALUATION OF FATIGUE DAMAGE IN COARSE-GRAINED ALUMINUM BY ENERGY DISPERSIVE DIFFRACTION MICROSCOPYYoshinori Hosokawa1, Yoshio Miyoshi, Hirotaka Tanabe, Tohru Takamatsu1X-ray Precision, Inc., Kyoto, Japan2School of Engineering, The University of Shiga Prefecture, Hassaka-cho Hikone Shiga, Japan

CURCUMIN AS A COMPLEXING AGENT IN EDXRF ANALYSISAntenor Lopes, Maria Izabel M. S. BuenoDepartamento de Química Analítica – Instituto de Química-UNICAMP, Campinas-SP, Brasil

RESEARCHING OF WELDED JOINT BY EPMA METHODV. V. Boyko, Elena V. Moos, M. M. SluginOptic Spectroscopy Laboratory, Ryazan, Russia

ANALYSIS OF WEAR METALS IN USED OIL - COMPARISON OF ED-PXRF AND OESC. Schäfer1, R. Schramm1, M. Van Driessche2, D. Wissmann1

1Spectro Analytical Instruments, Kleve, Germany,2Texaco Technology Gent, Gent, Belgium

DETERMINATION OF SELENIUM BY NUCLIDE-EXCITED X-RAY FLUORESCENCE ANALYSIS AND OTHER INSTRUMENTAL TECHNIQUES – A COMPARISON OF METHODS C. Segebade1, A. Berger1, G. Monse2, W. Görner1

1Bundesanstalt für Materialforschung und –prüfung, Berlin, Germany,2RETORTE GmbH, Röthenbach, Germany

ANALYSIS OF INKS AND PIGMENTS IN MEDIEVAL MANUSCRIPTS BY THE X-RAY FLUORESCENCE METHODT. Čechák1, L. Musílek1, J. Šimečková2

1CTU in Prague, Faculty of Nuclear Sciences and Physical Engineering, Praha, Czech Republic2National Library of the Czech Republic, Praha, Czech Republic


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Public Evening Lectures and Reception at theHermann-von-Helmholtz Building of the PTB19:30 Introduction to the public evening lectures

19:35 - 19:55 THE 1st CENTURY OF THE 1st PHYSICS NOBEL PRIZE: AN OVERVIEWMaria Luisa Carvalho, L. SalgueiroCentro Fisica Atómica, Universidade de Lisboa, Lisboa Codex, Portugal

19:55 – 20:40 HIGH TECH – HIGH ART A SCIENTIFIC DIALOGUE

Dietrich WildungDirector of the Egyptian Museum and Papyrus Collection, Berlin, Germany

20:40 Reception


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28 WEDNESDAY - JUNE 19, 2002 29ED RS2002


WEDNESDAY - JUNE 19, 2002


Session: Synchrotron XRS InstrumentationRoom 1028 - Chair: Szabina Török

08:30 - 09:05 INVITED LECTURE: X-RAY SPECTROSCOPY AND IMAGING FOR MICRO-ANALYSIS

Alexandre SimionoviciID22 Group, ESRF, Grenoble, France

09:05 - 09:25 LAYOUT AND FIRST APPLICATIONS OF THE BAMline AT BESSY IIH. Riesemeier1, B. R. Müller1, W. Görner1, M. Radtke1, M. Krumrey2

1Bundesanstalt für Materialforschung und -prüfung, Berlin, Germany2Physikalisch-Technische Bundesanstalt, Berlin, Germany

09:25 - 09:45 X-RAY FLUORESCENCE ANALYSIS BY USE OF ALLIGATOR LENSES: A LOW-COST FLEXIBLE SYNCHROTRON RADIATION BEAMLINE CONCEPTW. JarkSincrotrone Trieste, Basovizza (TS), Italy

09:45 - 10:05 NEW X-RAY OPTICS INFRASTRUCTURE AT HASYLAB BEAMLINE L FOR MICRO-XRF AND MICRO-XANES EXPERIMENTSGerald Falkenberg, . TschentscherHamburger Synchrotronstrahlungslabor HASYLAB at Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany

10:05 - 10:25 HARD X-RAY MICRO-EXAFS BEAMLINE PROJECT AT BESSYA. Erko, F. Schäfers, A. FirsovBESSY GmbH, Berlin, Germany



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28 WEDNESDAY - JUNE 19, 2002 29ED RS2002



Session: Synchrotron XRS ApplicationsRoom H 1028 - Chair: Alexandre Simionovici

10:45 - 11:20

INVITED LECTURE:HIGH ENERGY X-RAY FLUORESCENCE ANALYSIS AND MATERIAL HISTORYIzumi NakaiDepartment of Applied Chemistry, Science, University of Tokyo, Japan

11:25 - 11:45

IDENTIFICATION OF HOT PARTICLES IN THE ENVIRONMENT USING SINGLE-PARTICLE X-RAY EMISSION ANALYSISS. Török1, J. Osán1, M. Betti2, C. A. Perez3

1KFKI Atomic Energy Research Institute, Budapest, Hungary2European Commission, JRC, ITU, Karlsruhe, Germany3LNLS, Campinas, Brazil

Session: Analysis of Chemical and Local StructuresRoom H 106 - Chair: Koen H. A. Janssens

11:25 - 11:45

SPECIATION AND MICROANALYSIS OF INDIVIDUAL PARTICLES BY MEANS OF MICRO-XANESK. Proost1, K. Janssens1, Y. omassen2,O.-C. Lind3, B. Salbu3, P. Danesi4, G. Falkenberg5

1Department of Chemistry, University of Antwerp, Antwerp, Belgium2National Institute of Occupational Health, Oslo, Norway3Laboratory for Analytical Chemistry, Agricultural University of Norway, Aas, Norway4International Atomic Energy Agency Laboratories, Seibersdorf, Austria5HASYLAB at DESY, Beamline L, Hamburg, Germany

11:45 - 12:05

THE ID18F MICRO-PROBE END-STATION AT THE EUROPEAN SYNCHROTRON RADIATION FACILITY (ESRF)A. Somogyi1, M. Drakopoulos2, B. Vekemans1, L. Vincze1, K. Janssens1, A. Simionovici2, F. Adams1

1Micro- and Trace Analysis Centre, University of Antwerp, Wilrijk-Antwerp, Belgium2ID22 ESRF, Grenoble, France

11:45 - 12:05

TXRF – NEXAFS INVESTIGATION OF ORGANIC CONTAMINATION ON Si WAFERSG. Pepponi1, B. Beckhoff2, T. Ehmann3, G. Ulm2, C. Streli1, L. Fabry3

1Atominstitut der Österreichischen Universitäten, Wien, Austria2Physikalisch-Technische Bundesanstalt, Berlin, Germany3Wacker Siltronic AG, Burghausen, Germany


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30 THURSDAY - JUNE 20, 2002 31ED RS2002


THURSDAY - JUNE 20, 2002


14:00 - 15:00 Bus transfer from the conference site at the TU Berlin to Berlin-Adlershof

15:00 - 17:30 Visit of the Technological Park Berlin-Adlershof (BESSY II incl. PTB laboratory and BAM line, X-ray companies, BAM, Max-Born-Institute)

17:30 Reception at the synchrotron radiation facility BESSY II

12:05 - 12:25

ELEMENTAL DISTRIBUTION BY MICROANALYTICAL TECHNIQUES IN HUMAN REMAINS OF THE NEOLITHIC PERIODA. F. Marques1, M. Telles Antunes2, A. S. Cunha3, J. P. Marques1, C. Casaca1,2, J. Brito1, M. L. Carvalho1

1Centro de Fisica Atómica, Universidade de Lisboa, Lisboa, Portugal2Centro de Estudos Geológicos da Universidade Nova de Lisboa, Portugal3Instituto de Medicina Legal, Lisboa, Portugal

12:05 - 12:25

CHARACTERIZATION OF SEDIMENT PARTICLES IN EAST-HUNGARIAN RIVERS USING MICROSCOPIC X-RAY EMISSION AND ABSORPTION SPECTROMETRYJános Osán1, Sándor Kurunczi1, Szabina Török1, Bálint Alföldy1, Gerald Falkenberg2

1KFKI Atomic Energy Research Institute, Budapest, Hungary2HASYLAB at DESY, Hamburg, Germany

12:25 - 12:45

THE SYNCHROTRON X-RAY-FLUORESCENCE STATION AT ANKA, KARLSRUHE: DETECTION LIMITS AND STABILITYR. Simon1, S. Staub1, C. Frieh2, M. Hagelstein1,2

1Forschungszentrum Karlsruhe, Karlsruhe, Germany,2ANKA GmbH, Karlsruhe, Germany

12:25 - 12:45

SYNCHROTRON RADIATION REFRACTION TOPOGRAPHY FOR CHARACTERIZATION OF LIGHT WEIGHT MATERIALSBernd R. Müller, Axel Lange, Manfred P. HentschelBundesanstalt für Materialforschung und

–prüfung (BAM), Berlin, Germany


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Session: WDXRFRoom H 1028 - Chair: Michael Mantler

08:30 - 09:00 INVITED LECTURE: CONTRIBUTIONS BY WDXRF IN THE NIST ANALYTICAL CHEMISTRY DIVISION

John R. SieberNational Institute of Standards and Technology, Gaithersburg, Maryland, USA

09:05 - 09:25 QUANTITATIVE OR SEMI-QUANTITATIVE? – COMPARISION OF THE RESULTS OBTAINED FROM MEASUREMENTS ON NICKEL-BASE ALLOYS BY A LAB-BASED WD-XRF SPECTROMETER AND A MOBILE ED-XRF SPECTROMETERChristoph N. Zwicky-Sobczyk, Peter LienemannSwiss Federal Laboratories for Materials Testing and Research (EMPA), Duebendorf, Switzerland

09:25 - 09:45 HIGH PRECISION XRF-ANALYSIS BY RECONSTITUTION TECHNIQUESiegfried NoackFederal Institute for Materials Research and Testing (BAM), Berlin, Germany

09:45 - 10:05 RECENT ADVANCES IN STANDARDLESS WAVELENGTH DISPERSIVE XRF ANALYSISF. de Beurs, B. VrebosPhilips Analytical, Almelo, The Netherlands

10:05 - 10:25 CALIBRATION METHODS IN WDXRF: EMPIRICAL VERSUS FUNDAMENTAL PARAMETERSArnd Bühler, Karl MauserBruker AXS GmbH, Karlsruhe, Germany



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Session: TXRFRoom H 1028 - Chair: Peter Wobrauschek

10:45 - 11:20

INVITED LECTURE:TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS USING BEAM-GUIDESHéctor Jorge SánchezFacultad de Matemática Astronomía y Física, Universidad Nacional de Córdoba, Córdoba, Argentina

11:25 - 11:45

SYNCHROTRON RADIATION INDUCED TXRF OF LOW Z ELEMENTS AT THE PTB UNDULA-TOR BEAMLINE AT BESSY II: ANALYSIS OF Si WAFER SURFACESC. Streli1, G. Pepponi1, P. Wobrauschek1, B. Beckhoff2, G. Ulm2, S. Pahlke3, L. Fabry3, . Ehmann3, B. Kanngießer4, W. Malzer4

1Atominstitut der Österr. Universitäten, Wien, Austria2Physikalisch-Technische Bundesanstalt, Berlin, Germany3Wacker Siltronic, Burghausen, Germany4Inst. f. Atomare Physik und Fachdidaktik, Techn. Univ. Berlin, Berlin, Germany

Session: Related X-Ray Methods and Novel ApplicationsRoom H 106 - Chair: Philip J. Potts

11:25 - 11:45

QUANTITATIVE SPECIATION AND SURFACE ANALYSIS OF INDIVIDUAL MICROPARTICLES BY THIN-WINDOW TRIPLE-ENERGY EPXMA: METHODOLOGY AND ENVIRONMENTAL APPLICATIONSR. Van Grieken1, J. De Hoog1, R. Godoi1, J. Osan1, C.-U. Ro1,3, I. Szaloki1,4, A. Worobiec1

1Department of Chemistry, University of Antwerp, Antwerp, Belgium2KFKI Atomic Energy Research Institute, Budapest, Hungary3Department of Chemistry, Hallym University, ChunCheon, Korea4Institute of Experimental Physics, University of Debrecen, Debrecen, Hungary

11:45 - 12:05

TOWARDS THE FAST MAPPING OF WAFER CONTAMINATION DISTRIBUTIONS BY SR-TXRFR. Barrett, E. Papillon, M. NavizetEuropean Synchrotron Radiation Facility, Grenoble, France

11:45 - 12:05

MULTILAYER REFLECTIVITY ANALYSIS OF MULTILAYERS USING AN ENERGY DISPERSIVE X-RAY SPECTROMETERJun Kawai1, Shingo Harada1, Pavel Karimov1, Hisataka Takenaka2

1Department of Materials Science and Engineering, Kyoto University, Japan2NTT-AT, Japan


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12:05 - 12:25

DETERMINATION OF TRACE ELEMENTS IN LUBRICATING OILS BY SYNCHROTRON RADIATION TOTAL REFLECTION X-RAYFLUORESCENCE ANALYSIS (SR-TXRF)S. Moreira1, E. F. O. de Jesus2, A. E. Vives3, R. T. Lopes2

1Civil Engineering Faculty, UNICAMP, Campinas, SP, Brazil2Federal University of Rio de Janeiro – UFRJ/COPPE, Rio de Janeiro, Brazil3Methodist University of Piracicaba – Piracicaba, SP, Brazil

12:05 - 12:25

CHARACTERIZATION OF BIOLOGICAL TISSUES USING X-RAY SYNCHROTRON DIFFRACTIONR. C. Barroso1, M. J. Anjos1,2, D. Braz2, C. R. F. Castro2, R. T. Lopes2

1University of Rio de Janeiro State - Physics Institute, Rio de Janeiro, Brazil2Nuclear Instrumentation Laboratory, COPPE, UFRJ, Rio de Janeiro, Brazil

12:25 - 12:45

TXRF HEAVY METAL ANALYSIS AFTER IMMOBILIZATION AS PAN COMPLEXESN. Kallithrakas-KontosTechnical University of Crete, Analytical and Environmental Chemistry Laboratory, Chania, Greece

12:25 - 12:45

THE STRUCTURAL PECULIARITIES OF SERICITES FROM SHAMLUGH (ARMENIA) COPPER-PYRITE DEPOSITER. G. Mkhitaryan, V. R. Israelyan, K. H. HovnanyanInstitute of Geological Sciences NAS, Yerevan, Republic of Armenia

Session: Detectors - SuperconductorsRoom H 106 - Chair: Siegfried Pahlke

13:45 - 14:20

INVITED LECTURE:RECENT PROGRESS IN THE APPLICATION OF HIGH-RESOLUTION, CRYOGENIC DETECTORS FOR ENERGY-DISPERSIVE X-RAY SPECTROSCOPYMatthias FrankLawrence Livermore National Laboratory, Livermore, USA


ED RS2002





Session: µ-XRF and OpticsRoom H 1028 - Chair: David R. Chettle

14:25 - 14:45

IN-SITU CHARACTERIZATION OF MULTI-LAYERED LEAD-BASED HOUSE PAINTS BY MICRO EDXRFG. S. Hall, L. Chow, J. Tinklenberg, L. SmithDepartment of Chemistry and Chemical Biology, Rutgers, The State University of New Jersey, New Brunswick, NJ, USA

Session: Detectors - Superconductors (cont’d)

Room H 106 - Chair: Siegfried Pahlke

14:25 - 14:45

APPLICATIONS OF THE CRYOGENIC MICROCALORIMETER SPECTROMETERS TO THE DETERMINATION OF LOCAL CRYSTALLINE STRUCTURE BY MEANS OF THE BETA ENVIRONMENTAL FINE STRUCTUREF. Gatti1, F. D’acapito2, L. Gastaldo1, C. Maurizio3, S. Mobilio4, D. Pergolesi1, M. Razeti1

1University and INFN of Genoa, Genoa, Italy2INFM – OGG, GILDA at ESRF, Grenoble, France3University and INFM of Padova, Padova, Italy4University of Rome III and INFN of Frascati, Italy

14:45 - 15:05

EXAMINATIONS OF THE INTENSITY DISTRIBU-TION OF A POLY-CAPILLARY LENSM. HaschkeRöntgenanalytik Messtechnik GmbH, Taunusstein, Germany

14:45 - 15:05

PERFORMANCE OF 32-CHANNEL TIME-DIVI-SION SQUID MULTIPLEXER FOR X-RAY MICRO-CALORIMETERSJ. Beyer, P. A. J. de Korte, L. R. Vale, K. D. IrwinNIST Boulder, Boulder, CO, USA

15:05 - 15:25

MONOCHROMATIZATION, POLARIZATION AND FOCUSING OF Rh- AND W-Lα RADIATIONJ. Heckel1, G. Vittiglio1, K. Janssens2

1SPECTRO A. I., Kleve, Germany2MiTAC, University of Antwerp, Antwerp, Belgium

15:05 - 15:25

SUPERCONDUCTING TUNNEL JUNCTIONS AS DETECTORS FOR HIGH RESOLUTION X-RAY SPECTROSCOPYMichael Huber, Godehard Angloher, Alexander Rüdig, Josef Jochum, Walter Potzel, Franz von FeilitzschPhysik-Department E15, Technische Universität München, Garching, Germany


ED RS2002




Session: µ-XRF and Optics (cont’d)

Room H 1028 - Chair: David R. Chettle

15:40 - 16:00

A NEW GENERATION OF POLYCAPILLARY OPTICS FOR XRF AND XRD APPLICATIONSA. Bjeoumikov1, V. I. Beloglasov1,2, N. Langhoff1, N. B. Skibina1,2, V. Arkadiev1,3, R. Wedell1,3

1IfG - Institut für Gerätebau GmbH, Berlin, Germany2Technology Equipment Glass Structure, Saratov, Russia3IAP - Institut für angewandte Photonik e.V., Berlin, Germany

Session: Detectors - Semiconductors (cont’d)

Room H 106 - Chair: Mathias Frank

15:40 - 16:00

A NEW XRF SPECTROMETER FOR FAST ELEMENTAL MAPPING BASED ON A MONOLITHIC ARRAY OF SILICON DRIFT DETECTORSA. Longoni1, C. Fiorini1, C. Guazzoni1, A. Gianoncelli1, S. Buzzetti1, L. Strüder2, H. Soltau3, P. Lechner3, A. Bjeoumikhov4, J. Schmalz4, N. Langhoff4, R. Wedell4

1Politecnico di Milano, Dipartimento di Elettronica e Informazione, Milano, Italy2MPI für Extraterrestrische Physik, Halbleiterlabor, München, Germany3KETEK GmbH, Oberschleissheim, Germany4IfG - Institut für Gerätebau GmbH, Berlin, Germany

16:00 - 16:20

PLANAR WAVEGUIDE-RESONATOR - NEW DEVICE FOR X-RAY OPTICSV. K. Egorov, E. V. EgorovIPMT RAS, Chernogolovka, Moscow dist., Russia

16:00 - 16:20

NOVEL HIGH RESOLUTION SILICON DRIFT DETECTORSP. Lechner, A. Pahlke, H. SoltauMPI-Halbleiterlabor, München, Germany

16:20 - 16:40

ON SURFACE AND BULK X-RAY CHANNELINGS. B. DabagovINFN – Laboratori Nazionali di Frascati, Frascati, Italy; RAS – P.N. Lebedev Physical Institute, Moscow, Russia

16:20 - 16:40

MODELLING THE RESPONSE FUNCTION OF ENERGY-DISPERSIVE SEMICONDUCTOR X-RAY DETECTORSF. Scholze, B. Beckhoff, G. UlmPhysikalisch-Technische Bundesanstalt, Berlin, Germany


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17:00 - 18:30Poster Session IIIChairs: Joachim Heckel, Christina Streli, Bruno Vrebos, N. N.

Poster Session – TXRFTXRF AND SEM STUDY OF ELECTROCHEMICALLY MODIFIED HETEROGENEOUS ELECTRODE SURFACESNikolai V. AlovDepartment of Analytical Chemistry, Lomonosov Moscow State University, Moscow, Russia

QUANTITATIVE TXRF ANALYSIS ON CERAMIC SEDIMENTS FROM GRINDING AND WATER SUSPENSION PROCESSF. Cariati1, P. Fermo1, S. Gilardoni1, L. Bonizzoni2, A. Galli2,3, M. Milazzo2

1Dipartimento di Chimica Inorganica, Metallorganica e Analitica, Università di Milano, Milano, Italy2Istituto di Fisica Generale Applicata, Università di Milano, Milano, Italy3Present address: INFM and dipartimento di Scienza dei Materiali, Università di Milano-Bicocca, Milano, Italy

COMPARISON OF A Si DRIFT DETECTOR WITH A Si(Li) DETECTOR IN A TXRF SPECTROMETER FOR WAFER ANALYSISF. Osmic1, P. Wobrauschek1, C. Streli1, S. Pahlke2, L. Fabry2

1Atominstitut der Österreichischen Universitäten, TU Wien, Wien, Austria2Wacker Siltronic AG, Burghausen, Germany

COMPARISON OF SR-TXRF EXCITATION-DETECTION GEOMETRIES FOR SAMPLES WITH DIFFERING MATRICESG. Pepponi1, C. Streli1, P. Wobrauschek1, S. Zamini1, N. Zöger1, G. Falkenberg2

1Atominstitut der Österreichischen Universitäten - TU Wien, Wien, Austria2Hamburger Synchrotronstrahlungslabor HASYLAB at Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany

16:40 - 17:00

HIGH ENERGY RESOLUTION XRMF SPECTROMETER USING POLYCAPILLARY X-RAY OPTICS AND PSPCXunliang Ding, Liu Zhiguo, Yiming Yan, Qiuli PanThe Key Laboratory of Beam Technology and Materials Modification of Ministry of Education, Beijing Normal University, Beijing, China; Institute of Low Energy Nuclear Physics, Beijing Normal University, Beijing, China; Beijing Radiation Center

16:40 - 17:00

SILICON DRIFT DETECTORS WITH ENLARGED SENSITIVE AREAO. Boslau, T. Eggert, P. Goldstraß, J. Kemmer, P. LechnerKETEK GmbH, Oberschleißheim, Germany


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SYNCHROTRON RADIATION INDUCED TXRF OF LOW Z ELEMENTS ON Si WAFER SURFACES AT SSRL, BEAMLINE 3-3C. Streli1, G. Pepponi1, P. Wobrauschek1, N. Zoeger1, P. Pianetta2, K. Baur2, S. Pahlke3, L. Fabry3, C. Mantler3, B. Kanngießer4, W. Malzer4

1Atominstitut der Österr. Universitäten, Wien, Austria,2Stanford Synchrotron Radiation Laboratory (SSRL), CA, USA3Wacker Siltronic, Burghausen, Germany4Inst. f. Atomare Physik und Fachdidaktik, Techn. Univ. Berlin, Berlin, Germany

TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS USING AN ADJUSTABLE REFLECTORK. Tsuji, F. Delalieux, K. WagatsumaInstitute for Materials Research (IMR), Tohoku University, 2-1-1 Katahira, Sendai, Japan

THE TABLE-TOP TXRF SPECTROMETER FOR WIDE-RANGE ELEMENT ANALYSIS WITH TRIPLE EXCITATION SOURCESC. Uno, A.Kagamihata, S. Maeo, K. TaniguchiOsaka Electro-Communication University, Japan

IMPLANTATION PROFILES STUDIES WITH TXRFShokufeh Zamini, Peter Wobrauschek, Christina Streli, Giancarlo PepponiAtominstitut der Österreichischen Universitäten, Vienna, Austria

Poster Session – DetectorsELECTRONICS FOR STJ DETECTOR ARRAYSS. Bechstein1, S. Friedrich2, R. Fliegauf1, B. Beckhoff1, G. Ulm1

1Physikalisch-Technische Bundesanstalt, Germany2Lawrence Livermore National Laboratory, Livermore, CA, USA

CALIBRATION OF A SEMICONDUCTOR SI(LI) DETECTOR SYSTEM FOR XRF AND TXRF RESEARCH IN THE PTB LABORATORY AT BESSY IIG. Brandt, B. Beckhoff, F. Scholze, J. Weser, R. Fliegauf, R. ornagel, G. UlmPhysikalisch-Technische Bundesanstalt, Berlin, Germany

SEMICONDUCTOR PELTIER COOLED DETECTORS FOR X-RAY FLUORESCENCE ANALYSISD. Docenko, A. Loupilov, A. Sokolov, V. GostiloBaltic Scientific Instruments, Riga, Latvia

DEVELOPMENT OF A TRANSITION EDGE SENSOR CRYOGENIC MICROCALORIMETER WITH SUPERCONDUCTING ABSORBER FOR VERY HIGH RESOLUTION SOFT X-RAY SPECTROSCOPYF. Gatti, L. Gastaldo, D. Pergolesi, M. RazetiUniversity and INFN of Genoa, Genoa, Italy


ED RS2002




A NEW APPROACH TO DETERMINE THE FANO FACTOR FOR SEMICONDUCTOR DETECTORST. Papp1, M.-C. Lépy2, J. Plagnard2, G. Kalinka1, D. Varga1

1Institute of Nuclear Research of the Hungarian Academy of Sciences Debrecen, Debrecen, Hungary2BNM / Laboratoire National Henri Becquerel, CEA Saclay, Gif-sur-Yvette Cedex, France

Poster Session – Methodological Developments and Novel SourcesCALCULATION OF GE-EPMA INTENSITY AND THIN-FILM ANALYSISF. Delalieux1, K. Tsuji1, K. Wagatsuma1, S. Sato2

1Institute for Materials Research (IMR), Tohoku University, Aoba, Sendai, Japan2Nano Analysis Section, Research Department, NISSAN ARC, LTD. 1, Yokosuka, Japan

THE ENERGY DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER ElvaXAlexander S. Filippov, Viktor V. MartynyukElvatech, Ltd., Kiev, Ukraine

THE DEVELOPMENT OF THE X-RAY TUBE WITH TRIPLE EXCITATION SOURCESS. Maeo1, Y. Satoh2, S. Fukai2, M. Sado2, K. Taniguchi1

1Osaka Electro-Communication University, Japan2NEIS corporation, Japan

APPLICATION OF A LASER-BASED X-RAY SOURCE TO NEXAFS SPECTROSCOPY OF PHOTOSYNTHETIC PIGMENTSH. Stiel1, M. Beck1, H. Lokstein2, C. Spitz1,3, U. Vogt1, D. Leupold1

1Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, Berlin, Germany2Institut für Biologie/Pflanzenphysiologie, Humboldt-Universität zu Berlin, Berlin, Germany3Present address: Institut für Physik, Universität Potsdam, Potsdam, Germany

ROUTINE X-RAY FLUORESCENCE ANALYSIS OF POWDER MATERIALS USING “VERBA-XRF” MODEP. O. VerkhovodovKyiv consulting group, Kyiv, Ukraine

THE DRESDEN EBIT: A NOVEL SOURCE OF X-RAYS FROM HIGHLY CHARGED IONSU. Kentsch1, S. Landgraf1, G. Zschornack1, F. Grossmann2, V. P. Ovsyannikov2, F. Ullmann2

1Technische Universität Dresden, Institut für Kern- und Teilchenphysik, Dresden, Germany2Leybold Vakuum Dresden GmbH, Dresden, Germany

Poster Session – µ-XRF and OpticsFEASIBILITY STUDY OF THREE-DIMENSIONAL XRF SPECTROMETRY USING A PINHOLE APERTURE IN QUASI-CONTACT MODEF. Delalieux, K. TsujiInstitute for Materials Research (IMR), Tohoku University, Sendai, Japan


ED RS2002




DUAL POLYCAPILLARY OPTICS FOR MICRO X-RAY FLUORESCENCE ANALYSIS OF RADIOACTIVE MATERIALSDavid Gibson, Ning Gao, Paul J. SchieldsX-ray Optical Systems, Inc., Albany, NY, USA

MONOCHROMATIC MICROBEAM XRF USING DOUBLY CURVED CRYSTAL OPTICSZ. W. Chen, P. J. Schields, J. Bly, D. GibsonX-ray Optical Systems, Inc., Albany, NY, USA

GRAZING-EXIT ELECTRON PROBE X-RAY MICRO ANALYSIS OF LIGHT ELEMENTSZ. Spolnik1, K. Tsuji2, R. Van Grieken1

1University of Antwerp, Chemistry Dept., Antwerp, Belgium2Institute for Materials Research (IMR), Tohoku University, Aoba, Sendai, Japan

A COMPACT MICRO-XRF SPECTROMETER FOR IN-SITU ANALYSISG. Vittiglio1,2, S. Bichlmeier1, P. Klinger1, J. Heckel1, W. Fuzhong2, L. Vincze2, K. Janssens2,P. Engström3, A. Rindby3, K. Dietrich4, D. Jembrih-Simbürger4, M. Schreiner4, D. Denis5,Attar Lakdar5, A. Lamotte5

1Spectro Analytical Instruments GmbH, Kleve, Germany2MiTAC, University of Antwerp, Belgium3COX Analytical Systems, Gotebörg, Sweden4Academy of Fine Arts, Vienna, Austria5Laboratoire de Police Scientifique, Lyon, France

MICROANALYSIS WITH A POLYCAPILLARY IN A VACUUM CHAMBERP. Wobrauschek, N. Marosi, C. StreliAtominstitut der Österreichischen Universitäten, TU Wien, Vienna, Austria

Poster Session – Portable XRF and Archaeometric ApplicationsRADIOISOTOPE X-RAY FLUORESCENCE ANALYSIS OF SOME VALUABLE STAMPS OF OTTOMAN EMPIRE AND TURKISH REPUBLICTanil Akyuz1, Sevim Akyuz2

1Cekmece Nuclear Research and Training Center, Istanbul, Turkey2Physics Department, Istanbul University, Istanbul, Turkey

INVESTIGATION OF XV CENTURY FRESCOES BY MEANS OF ELECTRON MICROSCOPY AND MICROANALYSISS. Bruni1, M. Gagliardi2, G. Maino1,3, D. Biagi Maino3

1ENEA, Applied Physics Division, Bologna, Italy2ENEA guest researcher3Facoltà di Conservazione dei Beni Culturali, University of Bologna, Ravenna, Italy


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GIOTTO IN THE CHAPEL OF THE SCROVEGNI: ENERGY DISPERSIVE X-RAY FLUORESCENCE ANALYSIS WITH PORTABLE EQUIPMENTSRoberto Cesareo1, A. Castellano2, G. Buccolieri2, S. Quarta2, M. Marabelli3, P. Santopadre3

1Dipartimento di Matematica e Fisica, Università di Sassari, Sassari, Italy2Dipartimento di Scienza dei Materiali, Università di Lecce, Lecce, Italy3Istituto Centrale del Restauro, Rome, Italy

ANALYSIS OF PIGMENT’S MICRO-SAMPLES BY EDXRF SPECTROMETRYNikolla CiviciInstitute of Nuclear Physics, Tirana, Albania

INVESTIGATION OF A FOSSILIZED CALOTTE FROM LAGOA SANTA-BRAZIL BY EDXRFM. J. Anjos1,2, R. T. Lopes1, S. M. F. Mendonça de Souza3, E. F. O. de Jesus1

1Federal University of Rio de Janeiro/COPPE, Nuclear Instrumentation Laboratory Rio de Janeiro, Brazil2University of Rio de Janeiro State, Physics Institute, Rio de Janeiro, Brazil3Fundação Oswaldo Cruz, ENSP and National Museum/UFRJ, RJ, Brazil

IN-SITU CHARACTERIZATION OF COUNTERFEIT PAPER DOCUMENTS BY MICRO EDXRFGene S. HallDepartment of Chemistry and Biological Chemistry, Rutgers, The State University of New Jersey, New Brunswick, NJ, USA

AN APPLICATION OF THE MULTIVARIATE AND X-RAY FLUORESCENCE ANALYSIS FOR THE STUDY OF THE 18-TH CENTURY VESSELS FROM LUBACZÓW GLASSHOUSE: A PROBLEM OF DATING AND GLASSWARE SERVICES IDENTIFICATIONJoachim Kierzek1, Jerzy Kunicki-Goldfinger1, Aleksandra J. Kasprzak2,Bożena Małożewska-Bućko1

1Institute of Nuclear Chemistry and Technology, Warsaw, Poland2National Museum in Warsaw, Warsaw, Poland

PROBLEMS OF QUANTITATIVE ANALYSIS OF GLASSES BY PORTABLE INSTRUMENT. EXCITING X-RAY TUBE SPECTRUM DETERMINATION AND AUTOABSORPTION EVALUATIONL. Bonizzoni, A. Galli, M. MilazzoIstituto di Fisica Generale Applicata, Università di Milano, Milano, Italy

ELEMENTAL ANALYSIS OF MALHAR COINS (1st CENTURY B.C. TO 4th CENTURY A.D.) BY THE X-RAY FLUORESCENCE TECHNIQUEAtish Chandra Mandal1, Debasis Mitra2, Manoranjan Sarkar2, Dipan Bhattacharya2,Sushmita Bose Majumdar3

1Department of Physics, Burdwan University, Burdwan, India2Saha Institute of Nuclear Physics, Kolkata, India3Sanskrit College, Kolkata, India


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ANALYSIS OF ARCHAEOLOGICAL OBJECTS AT AN EXCAVATION SITE IN EGYPT USING A NEW PORTABLE X-RAY FLUORESCENCE SPECTROMETER EQUIPPED WITH THREE EXCITATION SOURCES AND SDDI. Nakai1, S. Yamada1, Y. Terada1, Y. Shindo2, T. Utaka3

1Department of Applied Chemistry, Faculty of Sciences, Science University of Tokyo, Shinjuku, Tokyo, Japan2The Middle Eastern Culture Center in Japan, Oosawa, Mitaka, Tokyo, Japan3OURSTEX Corporation,13-20 Honmachi, Neyagawa-shi, Osaka, Japan

AN EXTERNAL PIXE STUDY: MOGUL PAINTING PIGMENTSU. Reinholz1, I. Reiche2, H.-P. Weise1, G. Bukalis1, R. Britzke1

1Bundesanstalt für Materialforschung und -prüfung, Labor I.41 Ionenstrahlanalytik, Berlin, Germany2Rathgenforschungslabor, Staatliche Museen zu Berlin, Stiftung Preußischer Kulturbesitz, Berlin, Germany

ANALYSING LIMOGES SCHOOL ENAMELS FROM THE 16th TO 19th CENTURY BY USING A PORTABLE MICRO X-RAY FLUORESCENCE SPECTROMETERStefan Röhrs1, Heike Bronk2

1Technische Universität Berlin, Department for Chemistry, Berlin, Germany2Technische Universität München, Lehrstuhl für Restaurierung, Kunsttechnologie undKonservierungswissenschaft, Munich, Germany

ANALYSES OF GLAZES AND COBALT PIGMENTS IN VALENCIAN CERAMICS BY PORTABLE EDXRF SPECTROMETRYC. Roldán1, J. Coll2, J. L. Ferrero1, D. Juanes1

1Unidad de Arqueometría, Instituto de Ciencia de los Materiales de la Universitat de València, Valencia, Spain2Museo Nacional de Cerámica y Artes Suntuarias “González Martí”, Valencia, Spain

SEM AND EDXRS INVESTIGATION OF GOLD TISSUES FROM SARCOPHAGI AND THIN LAYERS OF GOLD ON A SMALTA. V. Zazhigalov1, S. A. Balakin1, V. A. Zazhigalov2, J. Stoch3, A. Kowal3

1National Reserve Kyiv-Pechersk Lavra, Department of Archaeology, Kyiv, Ukraine2Institute of Sorption and Problems of Endoecology, NAS of Ukraine, Kyiv, Ukraine3Institute of Catalysis and Surface Chemistry, PAS, Krakow, Poland

20:00 CONFERENCE DINNER at the “Palmenhof” (Palm Courtyard) and the “Silbersaal” (Silver Hall) of the

former Grand Hotel Esplanade, Potsdamer Platz, Berlin Ceremony for the best poster awards during the conference dinner


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42 FRIDAY - JUNE 21, 2002 43ED RS2002


FRIDAY - JUNE 21, 2002


Session: Biomedical and Biological ApplicationsRoom H 1028 - Chair: René Van Grieken

09:00 - 09:35 INVITED LECTURE: IN VIVO X-RAY FLUORESCENCE MEASUREMENT OF TOXIC ELEMENTS IN THE

HUMAN BODYDavid R. ChettleMedical Physics & Applied Radiation Sciences Unit, McMaster University, Hamilton, Canada

09:35 - 09:55 DIFFERENCES IN Pb AND Ca CONCENTRATIONS IN BONE TRANSITION ZONES DETERMINED BY SR-XRFP. Wobrauschek1, N. Zöger1, G. Pepponi1, C. Streli1, S. Zamini1, G. Falkenberg2, W. Osterode3

1Atominstitut der Österreichischen Universitäten, Wien, Austria2Hamburger Synchrotronstrahlungslabor HASYLAB at Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany3Universitätsklinik für Innere Medizin IV, Wien, Austria

09:55 - 10:15 ELEMENTAL COMPOSITION ANALYSIS OF HUMAN FETAL LIVER X-RAY FLUORESCENCE

M. Anwar ChaudhriPakistan Council of Scientific and Industrial Research, Laboratories-Complex-Lahore, PakistanSchool of Physics, University of Melbourne, Melbourne, AustraliaThe Institute of Medical Physics, University of Erlangen-Nuernberg, Erlangen, Germany

10:15 - 10:35 ELECTRON PROBE X-RAY MICROANALYSIS OF LIGHT ELEMENTS IN BIOLOGICAL CELLSKarl Zierold1, Jean Michel2, Christine Terryn2, Gérard Balossier2

1Max-Planck-Institute of Molecular Physiology, Dortmund, Germany2INSERM ERM 203, University of Reims, Reims, France

10:35 - 10:55 TOPOGRAPHIC AND QUANTITATIVE MICROANALYSIS OF HUMAN CENTRAL NERVOUS SYSTEM TISSUE USING SYNCHROTRON RADIATIONM. Boruchowska1, M. Lankosz1, J. Ostachowicz1, D. Adamek2, A. Krygowska-Wajs2, B. Tomik2, A. Szczudlik2, A. Simionovici3, S. Bohic3

1Department of Radiometric Analyses, Faculty of Physic and Nuclear Techniques, University of Mining and Metallurgy, Krakow, Poland2Institute of Neurology, Collegium Medicum, Jagiellonian University, Krakow, Poland3European Synchrotron Radiation Facility, Grenoble, France


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42 FRIDAY - JUNE 21, 2002 43ED RS2002




Session: Archaeometric Applications II (µ-XRF, XANES, Portable XRF)Room H 1028 - Chair: Izumi Nakai

11:20 - 11:55 INVITED LECTURE: ARS VITRARIA MEETS ARS EXPERIMENTALIS: MATERIAL ANALYSIS OF MUSEAL

GLASSES AND ENAMELS BY MOBILE MICRO-XRFHeike BronkTechnische Universität München, Lehrstuhl für Restaurierung, Kunsttechnologie und Konservierungswissenschaft, Munich, Germany

11:55 - 12:15 INVESTIGATION OF THE Fe2+/Fe3+ REDOX EQUILIBRIUM IN INKS OF HISTORICAL DOCUMENTS AND MODEL SAMPLES BY MEANS OF MICRO-XANESK. Janssens1, K. Proost1, B. Wagner2, E. Bulska2, M. Heck3, H. Ortner3,M. Schreiner4, G. Falkenberg5

1Department of Chemistry, University of Antwerp, Antwerp, Belgium2Department of Chemistry, University of Warsaw, Warsaw, Poland3Dept. Chemical Analytics, Univ. of Darmstadt, Darmstadt, Germany4Institute for Sciences and Technologies in Art, Academy of Fine Arts, Wien, Austria5HASYLAB at DESY, Beamline L, Hamburg, Germany

12:15 - 12:35 CHARACTERISATION OF IRON GALL INKS IN HISTORICAL MANUSCRIPTS USING MICRO X-RAY FLUORESCENCE SPECTROMETRYO. Hahn1, W. Malzer2, B. Kanngießer2, B. Beckhoff 3, U. Waldschläger4

1Federal Institute for Materials Research and Testing (BAM), Berlin, Germany2Institut für Atomare und Analytische Physik, Technical University Berlin, Berlin, Germany3Physikalisch Technische Bundesanstalt (PTB), Berlin, Germany4INTAX GmbH, Berlin, Germany

12:35 - 12:55 ELEMENTAL IMAGING USING MICRO X-RAY FLUORESCENCE IN ART AND ARCHEOLOGYGeorge J. Havrilla, omasin Miller, Karen Trentleman, Robert MortonLos Alamos National Laboratory, Los Alamos, NM, USADetroit Institute of Art, Detroit MI, USAPhilips Petroleum, Bartlesville, OK, USA

12:55 - 13:15 N. N.

13:15 - 13:45 Concluding remarks

european conference program on energy dispersive · total reflection x-ray fluorescence analysis...

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