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Chapter 0 Introduction Jin-Fu Li Advanced Reliable Systems (ARES) Laboratory Department of Electrical Engineering National Central University Jhongli, Taiwan

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Chapter 0Introduction

Jin-Fu LiAdvanced Reliable Systems (ARES) Laboratory

Department of Electrical EngineeringNational Central University

Jhongli, Taiwan

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 2

Applications of ICsConsumer Electronics Automotive Electronics

Green Power Electronics Biomedical Electronics

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 3

System on Chip

SOC a product class and design style that integrates

technology and design elements from other system driver classes (microprocessor unit, embedded memory, analog/mixed-signal component—as well as reprogrammable logic) into a wide range of high-complexity, high-value semiconductor products (ITRS 2011)

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 4

Trends for SOC Consumer Portable Driver

Source: ITRS 2011

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 5

SOC Consumer Portable Driver Architecture

Source: ITRS 2011

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 6

SOC Consumer Portable Design Complexity

Source: ITRS 2011

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 7

SOC Consumer Portable Power Consumption

Source: ITRS 2011

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 8

SOC Consumer Portable Processing Performance

Source: ITRS 2011

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 9

Source: ITRS 2010

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 10

Modern SOC Design Challenges

Power issue: Energy consumption, power dissipation,

power delivery Reliability issue Variability Soft error (single-event upset) Device degradation

Yield issue Y=e -AD

….

Multi-core chip architecture Use multiple identical cores to design a chip

Network-on-chip communication infrastructure Multiple point-to-point data links interconnected by switches (i.e.,

routers)

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 11

Architecture of Current SOC Chips

Source: IEEE Computer, 2005.

DDR2Controller

DDR2Controller

μ Engine

Source: IEEE Micro, 2007.

RAM unit

Compute unit

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 12

Examples

Source: IEEE JSSC, 2006.

SPARC V9 (Sun) Cell Processor (IBM)

Source: IEEE JSSC, 2006.

Teraflops processor (Intel)

Source: IEEE Micro, 2007.

Source: IEEE Micro, 2007.

4x4 mesh built with Xpipeslibrary components

Niagara2 (Sun)

Source: IEEE JSSC, 2008.

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 13

Cell Processor (JSSC, Jan. 2006)

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 14

Example: Niagara2 & POWER6 (JSSC, 2008)Niagara2 (Sun) POWER6 (IBM)

Design-for-Testability Features:

1. 32 Scans + ATPG2. BIST for arrays 3. ….

Design-for-Testability Features:

1. Logic BIST2. BIST for arrays 3. BISR for arrays4. …

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 15

Example: SPARC (JSSC, 2011)

Process: TSMC 40nmMetal layers (Cu): 11Transistor types: 4# of Cores: 166MB L2 cacheDie area: 377mm2

# of pins: 2117

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 16

Number of Transistors per Microprocessor Chip

Source: Proceedings of IEEE, May 2012.

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 17

Transistor Cost

Source: Proceedings of IEEE, May 2012.

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 18

Downsizing Rates of Audio/Video Products

Source: Proceedings of IEEE, May 2012.

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 19

Fundamental Elements of Electronic Systems

Computation

Data (Content) Communication

Processor (multi-core architecture)

Memory Interface; Bus; Network

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 20

3D Integration Technology

Technology evolution Bipolar CMOS Multicore 3D integration +

System-in-package (3D-SiP) System-in-package stacking dies using bonding wires

Source: ISQED, 2008.

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 21

Emerging IC Design Technology▬3D IC 3D integration stacking dies using through

silicon via (TSV)

Source: IBM, 2008.

Energy/Power

Processor

Memory Stack

RFADCDAC

NanoDeviceMEMS

Other Sensors,Imagers

Chemical &Bio Sensors

Source: Proceedings of IEEE, Jan. 2009

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 22

Advantages of 3D IC: Heterogeneous Integration

Combine disparate technologies DRAM, flash, RF, etc.

Combine different technology nodes For example: 65nm technology and

45nm technology

Energy/Power

Processor

Memory Stack

RFADCDAC

NanoDeviceMEMS

Other Sensors,Imagers

Chemical &Bio Sensors

Source: Proceedings of IEEE, Jan. 2009

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 23

Advantages of 3D IC: Low Power & Small Form Factor

SIP

3D-IC

SOBPower

Technology

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 24

Advantages of 3D IC: High Bandwidth

3D IC allows much more IO resources than 2D IC For example, Stacking of processor and memory

Memory

CPU

Bandwidth is limited by IOs

CPU

Memory

Many TSVs are allowed for high bandwidth transportation

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 25

Applications of 3D ICs

Memory wall

Sh

ort-term M

idiu

m-term

Long

-term

Memory capacitySmart or Trusted Memory

Heterogeneous Integration

Heterogeneous Integration & High Complexity Systems (terabyte of internet traffic/sec; petabytes of data stored in the cloud; etc.)

Source: Proceedings of IEEE

Source: Proceedings of IEEE

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 26

Possible Applications: Smart Phone

An important development direction is the interaction with the user, and sensor-based smartphones. Motion sensors, accelerometers and gesture reading devices should improve a lot this interaction, and combined with the connectivity widespread, it should create a new set of opportunities for consumers. Unfortunately, an aspect which won't mean a major leap in smartphonesdevelopment is battery life.

Augmented Reality Map

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 27

Possible Applications: Automotive Cloud Service System

Source: IEEE Computer, June 2012.

Requirement: high bandwidth (real time) and low power; small form factor

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 28

Possible Applications: Active Safety for Automotive

Source: IEEE Computer, June 2012.

Subaru introduced the EyeSight system version 2, introduced in 2010, which can stop a vehicle traveling at up to 30 km/h via a stereo camera mounted inside the front window. A 3D image processor analyzes the images that two cameras capture and estimates the distance to the obstacle.

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 29

Possible Applications: Healthcare

Source: Proceedings of IEEE, May 2012.

Adhesive-bandage-type sensor

Bionic ear

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 30

Possible Applications: Healthcare

Source: Proceedings of IEEE, May 2012.

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 31

Possible Applications: Superspecs

Source: Mail Online, 2012.

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 32

Challenges of 3D-IC Implementations

Yield Design for resiliency

Thermal Can we overcome it?

Test Reliability…

Source: IBM, 2008.

Advanced Reliable Systems (ARES) Lab.

Jin-Fu Li, EE, NCU 33

What will You Learn from This Course?

Source: IEEE JSSC, 2008.

Memory array

Testing

Memory

Link Input/Output

To/from network

Processor

Control

Datapath

Input

Output

CPU I/O

Low-Power Design

Chip Architecture

Subsystems