101001r-itcep07v06 report-微星 n05 -version v1.0faenl.msi.com/ftp/ce documents/notebook/ms-n051x...

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:[email protected] http://www.quietek.com

CERTIFICATE

Issued Date: Feb. 03, 2010 Report No.: 101001R-ITCEP07V06

This is to certify that the following designated product

Product : Notebook

Trade name : msi

Model Number : N05, N08,U160, L1600,Uxxx(“x”= 0~9,a~z,A~Z),

Lxxxx(“x”= 0~9, a~z, A~Z)

Company Name : MICRO-STAR INT’L Co., LTD.

This product, which has been issued the test report listed as above in QuieTek

Laboratory, is based on a single evaluation of one sample and confirmed to

comply with the requirements of the following EMC standard.

EN 55022: 2006+A1: 2007 EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2:2006 IEC 61000-4-2 Edition 1.2: 2001-04

EN 61000-3-3:1995+A1:2001+A2: 2005 IEC 61000-4-3 Edition 3.0: 2006

IEC 61000-4-4: 2004

IEC 61000-4-5 Edition 2.0: 2005

IEC 61000-4-6 Edition 2.2: 2006

IEC 61000-4-8 Edition 1.1: 2001-03

IEC 61000-4-11 Second Edition: 2004-03

TEST LABORATORY

Vincent Lin / Manager

Test Report

Product Name ： Notebook

Model No. ： N05, N08,U160, L1600,Uxxx(“x”= 0~9,a~z,A~Z),


Applicant ： MICRO-STAR INT’L Co., LTD.

Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Date of Receipt ： 2009/12/28

Issued Date ： 2010/02/03

Report No. ： 101001R-ITCEP07V06

Report Version ： V1.0

The test results relate only to the samples tested.

The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein.

This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government.

The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity We herewith confirm the following designated products to comply with the requirements set out in the Council Directive on the approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC) with applicable standards listed below.

Product : Notebook

Trade name : msi



EN 55022:2006+A1: 2007, Class B

EN 61000-3-2:2006

EN 61000-3-3:1995+A1: 2001+A2: 2005

EN 55024: 1998+A1: 2001+A2: 2003

Applicable Harmonized

Standards under Directive

2004/108/EC

:

Company Name :

Company Address :

Telephone : Facsimile :

Person in responsible for marking this declaration:

Name (Full Name) Title/ Department

Date Legal Signature

QuieTek Corporation / No.75-1, Wang-Yeh Valley, Yung-Hsing, Chiung-Lin, Hsin-Chu County, Taiwan, R.O.C. Tel: 886-3-592-8858, Fax: 886-3-592-8859, E-mail: [email protected]

Date: Feb. 03, 2010

QTK No.: 101001R-ITCEP07V06

Statement o f Conformi ty

This statement is to certify that the designated product below.

Product : Notebook

Trade name : msi



Company Name : MICRO-STAR INT’L Co., LTD.

EN 55022:2006+A1: 2007, Class B

EN 61000-3-2:2006

EN 61000-3-3:1995+A1: 2001+A2: 2005

EN 55024: 1998+A1: 2001+A2: 2003

Applicable Standards :

One sample of the designated product has been tested and evaluated in our

laboratory to find in compliance with the applicable standards above. The issued

test report(s) show(s) it in detail.

Report Number : 101001R-ITCEP07V06

TEST LABORATORY

Vincent Lin / Manager

The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo.

Accredited by NVLAP, TAF-CNLA, DNV, TUV, Nemko

Report No： 101001R-ITCEP07V06

Page: 2 of 169

Test Report Cert i f icat ion Issued Date : 2010/02/03 Report No. : 101001R-ITCEP07V06

Product Name : Notebook

Applicant : MICRO-STAR INT’L Co., LTD.

Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Manufacturer : MICRO-STAR INT’L Co., LTD.

Model No. : N05, N08,U160, L1600,Uxxx(“x”= 0~9,a~z,A~Z),


EUT Rated Voltage : AC 100-240V, 50-60Hz

EUT Test Voltage : AC 230 V / 50 Hz

Trade Name : msi

Applicable Standard : EN 55022: 2006+A1: 2007 Class B

EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2:2006

EN 61000-3-3:1995+A1:2001+A2: 2005

Test Result : Complied

Performed Location : Quietek Corporation (Linkou Laboratory)

No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang,

Taipei, 244 Taiwan, R.O.C.

TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789

Documented By :

( Adm. Specialist / Leven Huang)

Reviewed By :

(Engineer / Harrison Chen )

Approved By :

( Manager / Vincent Lin )


Page: 3 of 169

Laboratory Information We , QuieTek Corporation, are an independent EMC and safety consultancy that was

established the whole facility in our laboratories. The test facility has been accredited/accepted

(audited or listed) by the following related bodies in compliance with ISO 17025, EN 45001 and

specified testing scopes:

The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site : http://tw.quietek.com/tw/emc/accreditations/accreditations.htm The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory :

No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : [email protected]

LinKou Testing Laboratory :

No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]

Suzhou (China) Testing Laboratory :

No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China.TEL : +86-512-6251-5088 / FAX : +86-512-6251-5098 E-Mail : [email protected]

Taiwan R.O.C. : BSMI, NCC, TAF

Germany : TUV Rheinland

Norway : Nemko, DNV

USA : FCC, NVLAP

Japan : VCCI


Page: 4 of 169

TABLE OF CONTENTS Description Page 1. General Information .................................................................................................... 7

1.1. EUT Description................................................................................................... 7

1.2. Mode of Operation............................................................................................... 9

1.3. Tested System Details ....................................................................................... 12

1.4. Configuration of Tested System......................................................................... 13

1.5. EUT Exercise Software...................................................................................... 15

2. Technical Test ........................................................................................................... 16

2.1. Summary of Test Result..................................................................................... 16

2.2. List of Test Equipment ....................................................................................... 17

2.3. Measurement Uncertainty.................................................................................. 20

2.4. Test Environment ............................................................................................... 22

3. Conducted Emission (Main Terminals)...................................................................... 23

3.1. Test Specification............................................................................................... 23

3.2. Test Setup.......................................................................................................... 23

3.3. Limit ................................................................................................................... 23

3.4. Test Procedure .................................................................................................. 24

3.5. Deviation from Test Standard............................................................................. 24

3.6. Test Result ......................................................................................................... 25

3.7. Test Photograph ................................................................................................ 43

4. Conducted Emissions (Telecommunication Ports).................................................... 46


4.2. Test Setup.......................................................................................................... 46

4.3. Limit ................................................................................................................... 46

4.4. Test Procedure .................................................................................................. 47


4.6. Test Result ......................................................................................................... 48

4.7. Test Photograph ................................................................................................ 66

5. Radiated Emission.................................................................................................... 69


5.2. Test Setup.......................................................................................................... 69

5.3. Limit ................................................................................................................... 70

5.4. Test Procedure .................................................................................................. 71


5.6. Test Result ......................................................................................................... 72

5.7. Test Photograph ................................................................................................ 86

6. Harmonic Current Emission ...................................................................................... 91


Page: 5 of 169


6.2. Test Setup.......................................................................................................... 91

6.3. Limit ................................................................................................................... 91

6.4. Test Procedure .................................................................................................. 93


6.6. Test Result ......................................................................................................... 94

6.7. Test Photograph .............................................................................................. 100

7. Voltage Fluctuation and Flicker............................................................................... 102

7.1. Test Specification............................................................................................. 102

7.2. Test Setup........................................................................................................ 102

7.3. Limit ................................................................................................................. 102

7.4. Test Procedure ................................................................................................ 103

7.5. Deviation from Test Standard........................................................................... 103

7.6. Test Result ....................................................................................................... 104

7.7. Test Photograph .............................................................................................. 107

8. Electrostatic Discharge ........................................................................................... 109


8.2. Test Setup........................................................................................................ 109

8.3. Limit ................................................................................................................. 109

8.4. Test Procedure ................................................................................................ 110


8.6. Test Result ........................................................................................................111

8.7. Test Photograph .............................................................................................. 114

9. Radiated Susceptibility ........................................................................................... 116


9.2. Test Setup........................................................................................................ 116

9.3. Limit ................................................................................................................. 116

9.4. Test Procedure ................................................................................................ 117


9.6. Test Result ....................................................................................................... 118

9.7. Test Photograph .............................................................................................. 121

10. Electrical Fast Transient/Burst ......................................................................... 123


10.2. Test Setup........................................................................................................ 123

10.3. Limit ................................................................................................................. 123

10.4. Test Procedure ................................................................................................ 124


10.6. Test Result ....................................................................................................... 125


Page: 6 of 169

10.7. Test Photograph .............................................................................................. 128

11. Surge ............................................................................................................... 131


11.2. Test Setup........................................................................................................ 131

11.3. Limit ................................................................................................................. 131

11.4. Test Procedure ................................................................................................ 132


11.6. Test Result ....................................................................................................... 133

11.7. Test Photograph .............................................................................................. 136

12. Conducted Susceptibility ................................................................................. 138


12.2. Test Setup........................................................................................................ 138

12.3. Limit ................................................................................................................. 139

12.4. Test Procedure ................................................................................................ 139


12.6. Test Result ....................................................................................................... 140

12.7. Test Photograph .............................................................................................. 143

13. Power Frequency Magnetic Field .................................................................... 146


13.2. Test Setup........................................................................................................ 146

13.3. Limit ................................................................................................................. 146

13.4. Test Procedure ................................................................................................ 146


13.6. Test Result ....................................................................................................... 147

13.7. Test Photograph .............................................................................................. 150

14. Voltage Dips and Interruption........................................................................... 152


14.2. Test Setup........................................................................................................ 152

14.3. Limit ................................................................................................................. 152

14.4. Test Procedure ................................................................................................ 153


14.6. Test Result ....................................................................................................... 154

14.7. Test Photograph .............................................................................................. 157

15. Attachment ...................................................................................................... 159

　 EUT Photograph .............................................................................................. 159


Page: 7 of 169

1. General Information 1.1. EUT Description

Product Name Notebook

Trade Name msi

Model No. N05, N08,U160, L1600,Uxxx(“x”= 0~9,a~z,A~Z),Lxxxx(“x”= 0~9, a~z, A~Z)

Component

Power Adapter (1) MFR: DELTA, M/N: ADP-40PH BB

Input: AC 100-240V,50-60Hz,1.2A

Output: DC 19V,2.1A

Cable Out: Non-Shielded,1.8m,with one ferrite core bonded.

Power Adapter (2) MFR: FSP, M/N: FSP040-RAB

Input: AC 100-240V,50-60Hz,1.5A

Output: DC 19V,2.1A

Cable Out: Shielded,1.8m,with one ferrite core bonded.

Power Adapter (3) MFR: LITE-ON, M/N: PA-1400-12

Input: AC 100-240V,50-60Hz,1.0A

Output: DC 19V,2.1A

Cable Out: Non-Shielded,1.8m,with one ferrite core bonded.

Power Cable Non-Shielded,1.8m

Keyparts List

Item Vendor Model

CPU

(pin: 559pin) Intel PINEVIEW-M N450,1.66GHz,FCBGA8-559pin

CLAA101NB03A LCD CPT 10.1”

CLAA101NB03

WD WD1600BEVT

Toshiba MK1655GSX

Seagate ST9160314AS

HGST HTS545016B9A300

2.5 inch,

160GB,

5400RPM

Fujitsu MJA2160BH

WD WD2500BEVT

Toshiba MK2555GSX AZK

Toshiba MK2565GSX

Seagate ST9250315AS

HGST HTS545025B9A300

HDD

2.5 inch,

250GB,

5400RPM

Fujitsu MJA2250BH


Page: 8 of 169

Transcend (ETT)

Hynix

Samsung

Samsung (E die)

Kingston

A-DATA (Hynix)

DDRII 1GB 800MHz

Transcend (ETT)

Hynix

Samsung (Q-die)

Samsung (E-die)

Kingston

Memory Module

A-DATA (Hynix)

DDRII 2GB 800MHz

CELXPERT BTY-S16 11.1V, 2200mAh

SIMPLO BTY-S17, 11.1V,5200mAh Battery

SIMPLO BTY-S17, 11.1V,5800mAh

LITE-ON PA-1400-12

FSP FSP040-RAB Adapter

(40W 3pin) DELTA ADP-40PH BB

BT CSR BSMAN1 (MS-3801)

Wireless LAN Ralink RT3090 (MS-6891)

AZUREWAVE AM-1S005 WebCam

BISON BN82M6SA8-010

HUAWEI EM770 3G module

ERICSSO F3307

Note: The EUT is including six models for different marketing requirement.


Page: 9 of 169

1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were

carried out with the EUT in normal operation, which was shown in this test report and defined as:

Pre-Test Mode Mode 1 Mode 2 Mode 3 Mode 4 Mode 5 Mode 6 Mode 7 Mode 8 Mode 9 Mode 10 Mode 11 Final Test Mode

Emission Mode 1 Mode 2 Mode 3

Immunity Mode 1 Mode 2 Mode 3

ITEM MODE 1 MODE 2

DISPLAY LCD+D SUB 1024*600/60Hz LCD+D SUB 1024*600/60Hz

CPU INTEL,PINEVIEW-M N450,1.66GHz 559PIN

INTEL,PINEVIEW-M N450,1.66GHz 559PIN

LCD CPT, CLAA101NB03A CPT, CLAA101NB03

HDD WD,WD1600BEVT 160G HGST,HTS545025B9A300,250G

DDR DDR II 2G 800M DDR II 2G 800M

BATTERY SIMPLO,BTY-S17 5200mAh SIMPLO,BTY-S17 5800mAh

ADAPTER DELTA,ADP-40PH BB FSP,FSP040-RAB

BT CSR,BSMAN1(MS-3801) CSR,BSMAN1(MS-3801)

WLAN RALINK,RT3090(MS-6891) RALINK,RT3090(MS-6891)

CCD AZUREWAVE,AM-1S005 BISON,BN82M6SA8-010

3G module HUAWEI,EM770 ERICSSO, F3307


Page: 10 of 169

ITEM MODE 3 MODE 4


CPU INTEL , PINEVIEW-M N450,1.66GHz 559PIN

INTEL , PINEVIEW-M N450,1.66GHz 559PIN


HDD Fujitsu,MJA2250BH,250G Seagate,ST9250315AS,250G


BATTERY CELXPERT,BTY-S16 2200mAh SIMPLO,BTY-S17 5200mAh

ADAPTER LITE-ON,PA-1400-12 DELTA,ADP-40PH BB



CCD AZUREWAVE,AM-1S005 BISON,BN82M6SA8-010

3G module ERICSSO, F3307 HUAWEI,EM770

ITEM MODE 5 MODE 6





HDD Toshiba,MK2555GSX AZK,250G WD,WD2500BEVT,250G


BATTERY SIMPLO,BTY-S17 5800mAh CELXPERT,BTY-S16 2200mAh

ADAPTER FSP,FSP040-RAB LITE-ON,PA-1400-12



CCD AZUREWAVE,AM-1S005 AZUREWAVE,AM-1S005


ITEM MODE 7 MODE 8





HDD Fujitsu,MJA2160BH,160G Seagate,ST9160314AS,160G


BATTERY SIMPLO,BTY-S17 5200mAh SIMPLO,BTY-S17 5800mAh

ADAPTER DELTA,ADP-40PH BB FSP,FSP040-RAB



CCD BISON,BN82M6SA8-010 AZUREWAVE,AM-1S005



Page: 11 of 169

ITEM MODE 9 MODE 10





HDD Toshiba,MK1655GSX,160G HGST,HTS545016B9A300,160G


BATTERY CELXPERT,BTY-S16 2200mAh SIMPLO,BTY-S17 5200mAh

ADAPTER LITE-ON,PA-1400-12 DELTA,ADP-40PH BB



CCD BISON,BN82M6SA8-010 AZUREWAVE,AM-1S005

3G module ERICSSO, F3307 ERICSSO, F3307

ITEM MODE 11

DISPLAY LCD+D SUB 1024*600/60Hz


LCD CPT, CLAA101NB03

HDD Toshiba, MK2565GSX,250G

DDR DDR II 2G 800M

BATTERY SIMPLO,BTY-S17 5200mAh

ADAPTER DELTA,ADP-40PH BB

BT CSR,BSMAN1(MS-3801)

WLAN RALINK,RT3090(MS-6891)

CCD AZUREWAVE,AM-1S005

3G module ERICSSO, F3307


Page: 12 of 169

1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including

inserted cards) are:

Test Mode Mode 1

Mode 2

Product Manufacturer Model No. Serial No. Power Cord

1 Monitor Dell 2407WFPb CN-0FC255-46633-67T-

04HS

Non-Shielded, 1.8m

2 Microphone &

Earphone

PCHOME N/A N/A N/A

3 Ipod nano Apple A1236 7K823DNJY0P N/A

4 USB Mouse Logitech M-UV83 LZB34509127 N/A

5 Printer EPSON StyLus C63 FAPY012396 Non-Shielded, 1.8m

6 Notebook P.C. DELL PP04X C8YYM1S Non-Shielded, 1.8m

7 Universal Radio

Communication

tester

Rohde &

Schwarz

CMU200 104846 Non-Shielded, 1.8m

Test Mode Mode 3

Product Manufacturer Model No. Serial No. Power Cord

1 Monitor Dell 2407WFPb CN-0FC255-46633-67T-

04HS

Non-Shielded, 1.8m

2 Microphone &

Earphone

PCHOME N/A N/A N/A

3 Ipod nano Apple A1236 7K823DNJY0P N/A

4 USB Mouse Logitech M-UV83 LZB34509127 N/A

5 Notebook P.C. DELL PP04X C8YYM1S Non-Shielded, 1.8m

6 Universal Radio

Communication

tester

Rohde &

Schwarz

CMU200 104846 Non-Shielded, 1.8m


Page: 13 of 169

1.4. Configuration of Tested System

Test Mode Mode 1

Mode 2

Connection Diagram

Signal Cable Type Signal cable Description

A D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded

B Microphone & Earphone Cable Shielded, 1.6m

C USB Cable Shielded, 1m

D USB Mouse Cable Shielded, 1.8m

E USB Cable Shielded, 1.5m

F LAN Cable Non-Shielded, 7.0m


Page: 14 of 169

Test Mode Mode 3

Connection Diagram

Signal Cable Type Signal cable Description

A D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded

B Microphone & Earphone Cable Shielded, 1.6m

C USB Cable Shielded, 1m

D USB Mouse Cable Shielded, 1.8m

E LAN Cable Non-Shielded, 7.0m


Page: 15 of 169

1.5. EUT Exercise Software

1 Setup the EUT and simulators as shown on 1.4.

2 Turn on the power of all equipment.

3 Notebook reads data from disk.

4 Notebook sends “H” pattern to monitor.

5 Connect LAN and Telecom to Notebook for transmitting data.

6 Activate Wireless interface, and perform the wireless data communication with

the other Notebook (write/delete action).

7 Run Windows Media Player program and play a disk with color Bar pattern.

8 Repeat the above procedure (4) to (7).


Page: 16 of 169

2. Technical Test

2.1. Summary of Test Result

No deviations from the test standards

Deviations from the test standards as below description:

Emission

Performed Item Normative References Test

Performed Deviation

Conducted Emission EN 55022:2006+A1: 2007 Class B Yes No

Impedance Stabilization

Network

EN 55022:2006+A1: 2007 Class B Yes No

Radiated Emission EN 55022:2006+A1: 2007 Class B Yes No

Power Harmonics EN 61000-3-2:2006 Yes No

Voltage Fluctuation and

Flicker

EN 61000-3-3:1995+A1:2001+A2: 2005 Yes No

Immunity

Performed Item Normative References Test

Performed Deviation

Electrostatic Discharge IEC 61000-4-2 Edition 1.2: 2001-04 Yes No

Radiated susceptibility IEC 61000-4-3 Edition 3.0: 2006 Yes No

Electrical fast transient/burst IEC 61000-4-4:2004 Yes No

Surge IEC 61000-4-5 Edition 2.0: 2005 Yes No

Conducted susceptibility IEC 61000-4-6 Edition 2.2: 2006 Yes No

Power frequency magnetic

field

IEC 61000-4-8 Edition 1.1: 2001-03 Yes No

Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03 Yes No


Page: 17 of 169

2.2. List of Test Equipment Conducted Emission / SR8 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 838251/001 2009/04/27 LISN R&S ESH3-Z5 836679/020 2009/02/17 LISN R&S ENV216 100097 2009/05/28 Pulse Limiter R&S ESH3-Z2 100324 2009/04/16 Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 100366 2009/10/29 LISN R&S ENV4200 833209/007 2009/08/14 LISN R&S ENV216 100085 2009/02/17 Pulse Limiter R&S ESH3-Z2 357.88.10.52 2009/09/10 Impedance Stabilization Network / SR8 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A 18331 2009/11/16 EMI Test Receiver R&S ESCS 30 838251/001 2009/04/27 LISN R&S ESH3-Z5 836679/020 2009/02/17 LISN R&S ENV216 100097 2009/05/28 Pulse Limiter R&S ESH3-Z2 100324 2009/04/16 RF Current Probe FCC F-65 10KHz~1GHz 198 2009/11/13 BALANCED TELECOM ISN FCC FCC-TLISN-T2-02 20316 2009/11/22 BALANCED TELECOM ISN FCC FCC-TLISN-T4-02 20317 2009/11/22 BALANCED TELECOM ISN FCC FCC-TLISN-T8-02 20319 2009/11/22

Impedance Stabilization Network / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A 18331 2009/11/16 EMI Test Receiver R&S ESCS 30 100366 2009/10/29 LISN R&S ENV216 100085 2009/02/17 LISN R&S ENV4200 833209/007 2009/08/14 Pulse Limiter R&S ESH3-Z2 357.88.10.52 2009/09/10 RF Current Probe FCC F-65 10KHz~1GHz 198 2009/11/13 BALANCED TELECOM ISN FCC FCC-TLISN-T2-02 20316 2009/11/22 BALANCED TELECOM ISN FCC FCC-TLISN-T4-02 20317 2009/11/22 BALANCED TELECOM ISN FCC FCC-TLISN-T8-02 20319 2009/11/22

Radiated Emission / Site1 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B 2918 2009/08/01 Broadband Horn Antenna Schwarzbeck BBHA9170 209 2009/07/25 EMI Test Receiver R&S ESCS 30 100121 2009/11/25 Horn Antenna Schwarzbeck BBHA9120D 305 2009/08/26 Pre-Amplifier QTK N/A N/A 2009/08/01 Spectrum Analyzer Advantest R3162 100803482 2009/11/10


Page: 18 of 169

Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B 2704 2009/08/01 Broadband Horn Antenna Schwarzbeck BBHA9170 209 2009/07/25 EMI Test Receiver R&S ESCS 30 100149 2010/01/14 Horn Antenna Schwarzbeck BBHA9120D 305 2009/08/26 Pre-Amplifier QTK N/A N/A 2009/08/01 Spectrum Analyzer Advantest R3162 100803470 2009/11/24 EMI Test Receiver R&S ESI 26 838786/004 2009/06/26

Pre-Amplifier MITEQ QMF-4D-180400-45-6P

925974 2010/01/03

Radiated Emission / 9x6x6_Chamber Instrument Manufacturer Type No. Serial No Cal. Date Spectrum Analyzer (9K-26.5GHz)

Agilent E4408B MY45102743 2009/08/12

Horn Antenna Schwarzbeck 9120D 576 2009/10/21 Pre-Amplifier QuieTek AP-180C CHM/071920 2009/08/01 Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic)

Schaffner NSG 1007 HK54148 2009/08/11

IEC1000-4-X Analyzer(Flicker)

Schaffner CCN 1000-1 X7 1887 2009/08/11

Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic)

Schaffner NSG 1007 HK54148 2009/08/11

IEC1000-4-X Analyzer(Flicker)

Schaffner CCN 1000-1 X7 1887 2009/08/11

Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system TESEQ NSG 438 695 2009/05/12 Horizontal Coupling Plane(HCP)

QuieTek HCP AL50 N/A N/A

Vertical Coupling Plane(VCP)

QuieTek VCP AL50 N/A N/A

Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date

AF-BOX R&S AF-BOX ACCUST

100007 N/A

Audio Analyzer R&S UPL 16 100137 2009/04/15 Biconilog Antenna EMCO 3149 00071675 N/A Directional Coupler A&R DC 6180 22735 N/A Dual Microphone Supply B&K 5935 2426784 2009/04/16 Mouth Simulator B&K 4227 2439692 2009/04/16 Power Amplifier A&R 30S1G3 309453 N/A Power Amplifier A&R 100W10000M7 A285000010 N/A Power Amplifier SCHAFFNER CBA9413B 4020 N/A Power Amplifier AR 75A250A 0325371 N/A


Page: 19 of 169

Power Meter R&S NRVD(P.M) 100219 2009/04/16 Pre-Amplifier A&R 150A220 23067 N/A Probe Microphone B&K 4182 2278070 2009/04/16 Signal Generator R&S SML03 103330 2009/09/08 Electrical fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 0411225 2009/03/10 Surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 0411225 2009/03/10 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator

Schaffner N/A N/A 2009/04/21

Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA 2141 6002 N/A Magnetic Loop Coil Schaffner INA 702 160 N/A Triaxial ELF Magnetic Field Meter

F.B.BELL 4090 114135 2009/03/27

Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 0411225 2009/03/10

Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A 20405 N/A CDN Schaffner TRA U150 20454 N/A CDN M016S Schaffner CAL U100A 20410 N/A CDN M016S Schaffner TRA U150 21167 N/A CDN T002 Schaffner CAL U100 20491 N/A CDN T002 Schaffner TRA U150 21169 N/A CDN T400 Schaffner CAL U100 17735 N/A CDN T400 Schaffner TRA U150 21166 N/A Coupling Decoupling Network

Schaffner CDN M016S 20823 2009/04/02

Coupling Decoupling Network

Schaffner CDN T002 19018 2009/04/02

Coupling Decoupling Network

Schaffner CDN T400 21226 2009/04/02

EM-CLAMP Schaffner KEMZ 801 21024 2009/04/02


Page: 20 of 169

2.3. Measurement Uncertainty

Conducted Emission

The measurement uncertainty is evaluated as ± 2.26 dB.

Impedance Stabilization Network


Radiated Emission


Electrostatic Discharge

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:

1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant ESD standards.

The immunity test signal from the ESD system meet the required specifications in IEC

61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of

voltage and timing as being 1.63 % and 2.76%.

Radiated susceptibility


1999[2], the requirements for measurement uncertainty in RS testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant RS standards.

The immunity test signal from the RS system meet the required specifications in IEC

61000-4-3 through the calibration for the uniform field strength and monitoring for the test

level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.

Electrical fast transient/burst


1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to

have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst

standards. The immunity test signal from the EFT/Burst system meet the required

specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty

for the waveform of voltage, frequency and timing as being 1.63 %, and 2.76%.

Surge


1999[2], the requirements for measurement uncertainty in Surge testing are deemed to

have been satisfied, and the testing is reported in accordance with the relevant Surge

standards. The immunity test signal from the Surge system meet the required specifications

in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the

waveform of voltage and timing as being 1.63 % and 2.76%.


Page: 21 of 169

Conducted susceptibility


1999[2], the requirements for measurement uncertainty in CS testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant CS standards.

The immunity test signal from the CS system meet the required specifications in IEC

61000-4-6 through the calibration for unmodulated signal and monitoring for the test level

with the uncertainty evaluation report for the injected modulated signal level through CDN

and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.

Power frequency magnetic field


1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant PFM standards.

The immunity test signal from the PFM system meet the required specifications in IEC

61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter

to verify the output level of magnetic field strength as being 2 %.

Voltage dips and interruption


1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant DIP standards.

The immunity test signal from the DIP system meet the required specifications in IEC

61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of

voltage and timing as being 1.63 % and 2.76%.


Page: 22 of 169

2.4. Test Environment

Performed Item Items Required Actual

Temperature (C) 15-35 25

Conducted Emission Humidity (%RH) 25-75 50

Barometric pressure (mbar) 860-1060 950-1000


Impedance Stabilization

Network Humidity (%RH) 25-75 50



Radiated Emission Humidity (%RH) 25-75 50



Electrostatic Discharge Humidity (%RH) 30-60 51



Radiated susceptibility Humidity (%RH) 25-75 51



Electrical fast

transient/burst Humidity (%RH) 25-75 51



Surge Humidity (%RH) 10-75 51



Conducted susceptibility Humidity (%RH) 25-75 51



Power frequency magnetic

field Humidity (%RH) 25-75 51



Voltage dips and

interruption Humidity (%RH) 25-75 51



Page: 23 of 169

3. Conducted Emission (Main Terminals)

3.1. Test Specification

According to EMC Standard : EN 55022

3.2. Test Setup

3.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 66 - 56 56 – 46

0.50-5.0 56 46

5.0 - 30 60 50

Remarks: In the above table, the tighter limit applies at the band edges.


Page: 24 of 169

3.4. Test Procedure

The EUT and simulators are connected to the main power through a line impedance

stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the

measuring equipment. The peripheral devices are also connected to the main power through

a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.

(Please refers to the block diagram of the test setup and photographs.)

Both sides of A.C. line are checked for maximum conducted interference. In order to find the

maximum emission, the relative positions of equipment and all of the interface cables must

be changed on conducted measurement.

Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using

a receiver bandwidth of 9kHz.

3.5. Deviation from Test Standard

No deviation.


Page: 25 of 169

3.6. Test Result Site : SR-8 Time : 2010/01/27 - 00:57

Limit : CISPR_B_00M_QP Margin : 10

Probe : ENV216-L1 - Line1 Power : AC 230V/50Hz

EUT : Notebook Note : Mode 1


Page: 26 of 169

Site : SR-8 Time : 2010/01/27 - 01:00




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.203 9.704 48.830 58.534 -5.952 64.486 QUASIPEAK

2 0.263 9.667 41.130 50.797 -11.974 62.771 QUASIPEAK

3 0.345 9.650 32.410 42.060 -18.369 60.429 QUASIPEAK

4 0.478 9.640 25.260 34.900 -21.729 56.629 QUASIPEAK

5 3.662 9.700 21.430 31.130 -24.870 56.000 QUASIPEAK

6 12.502 9.893 29.470 39.363 -20.637 60.000 QUASIPEAK

Note:

1. All Reading Levels are Quasi-Peak and average value.

2. " * ", means this data is the worst emission level.

3. Measurement Level = Reading Level + Correct Factor.


Page: 27 of 169

Site : SR-8 Time : 2010/01/27 - 01:00

Limit : CISPR_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.203 9.704 34.440 44.144 -10.342 54.486 AVERAGE

2 0.263 9.667 24.590 34.257 -18.514 52.771 AVERAGE

3 0.345 9.650 15.900 25.550 -24.879 50.429 AVERAGE

4 0.478 9.640 9.950 19.590 -27.039 46.629 AVERAGE

5 3.662 9.700 9.390 19.090 -26.910 46.000 AVERAGE

6 12.502 9.893 18.710 28.603 -21.397 50.000 AVERAGE

Note:





Page: 28 of 169

Site : SR-8 Time : 2010/01/27 - 01:21


Probe : ENV216-N - Line2 Power : AC 230V/50Hz



Page: 29 of 169

Site : SR-8 Time : 2010/01/27 - 01:23




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.205 9.713 42.130 51.843 -12.586 64.429 QUASIPEAK

2 0.271 9.672 34.500 44.172 -18.371 62.543 QUASIPEAK

3 0.341 9.659 29.750 39.409 -21.134 60.543 QUASIPEAK

4 0.443 9.645 24.720 34.365 -23.264 57.629 QUASIPEAK

5 3.478 9.690 17.890 27.580 -28.420 56.000 QUASIPEAK

6 13.693 9.950 21.390 31.340 -28.660 60.000 QUASIPEAK

Note:





Page: 30 of 169

Site : SR-8 Time : 2010/01/27 - 01:23




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.205 9.713 23.610 33.323 -21.106 54.429 AVERAGE

2 0.271 9.672 17.250 26.922 -25.621 52.543 AVERAGE

3 0.341 9.659 10.320 19.979 -30.564 50.543 AVERAGE

4 0.443 9.645 3.360 13.005 -34.624 47.629 AVERAGE

5 3.478 9.690 5.360 15.050 -30.950 46.000 AVERAGE

6 13.693 9.950 14.250 24.200 -25.800 50.000 AVERAGE

Note:





Page: 31 of 169

Site : SR-8 Time : 2010/01/27 - 02:10





Page: 32 of 169

Site : SR-8 Time : 2010/01/27 - 02:11




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.177 9.730 40.300 50.029 -15.200 65.229 QUASIPEAK

2 0.220 9.693 35.850 45.543 -18.457 64.000 QUASIPEAK

3 0.357 9.650 26.620 36.270 -23.816 60.086 QUASIPEAK

4 0.502 9.640 27.260 36.900 -19.100 56.000 QUASIPEAK

5 5.959 9.720 22.950 32.670 -27.330 60.000 QUASIPEAK

6 24.220 10.073 29.230 39.303 -20.697 60.000 QUASIPEAK

Note:





Page: 33 of 169

Site : SR-8 Time : 2010/01/27 - 02:11




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.177 9.730 26.280 36.009 -19.220 55.229 AVERAGE

2 0.220 9.693 24.390 34.083 -19.917 54.000 AVERAGE

3 0.357 9.650 16.270 25.920 -24.166 50.086 AVERAGE

4 * 0.502 9.640 19.230 28.870 -17.130 46.000 AVERAGE

5 5.959 9.720 11.800 21.520 -28.480 50.000 AVERAGE

6 24.220 10.073 22.000 32.073 -17.927 50.000 AVERAGE

Note:





Page: 34 of 169

Site : SR-8 Time : 2010/01/27 - 02:23





Page: 35 of 169

Site : SR-8 Time : 2010/01/27 - 02:24




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.150 9.766 40.800 50.566 -15.434 66.000 QUASIPEAK

2 0.259 9.680 32.050 41.730 -21.156 62.886 QUASIPEAK

3 0.502 9.640 27.260 36.900 -19.100 56.000 QUASIPEAK

4 2.060 9.680 17.320 27.000 -29.000 56.000 QUASIPEAK

5 6.088 9.729 21.870 31.599 -28.401 60.000 QUASIPEAK

6 23.736 10.040 29.850 39.890 -20.110 60.000 QUASIPEAK

Note:





Page: 36 of 169

Site : SR-8 Time : 2010/01/27 - 02:24




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.150 9.766 26.950 36.716 -19.284 56.000 AVERAGE

2 0.259 9.680 21.350 31.030 -21.856 52.886 AVERAGE

3 * 0.502 9.640 20.720 30.360 -15.640 46.000 AVERAGE

4 2.060 9.680 12.260 21.940 -24.060 46.000 AVERAGE

5 6.088 9.729 11.820 21.549 -28.451 50.000 AVERAGE

6 23.736 10.040 23.450 33.490 -16.510 50.000 AVERAGE

Note:





Page: 37 of 169

Site : SR1 Time : 2010/01/29 - 02:43


EUT : Notebook Probe : ENV_216_L1 - Line1

Power : AC 230V/50Hz Note : Mode 3


Page: 38 of 169

Site : SR1 Time : 2010/01/29 - 02:43




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.170 9.790 41.130 50.920 -14.509 65.429 QUASIPEAK

2 0.224 9.790 33.300 43.090 -20.796 63.886 QUASIPEAK

3 * 0.935 9.800 35.320 45.120 -10.880 56.000 QUASIPEAK

4 2.142 9.810 23.290 33.100 -22.900 56.000 QUASIPEAK

5 3.884 9.820 23.640 33.460 -22.540 56.000 QUASIPEAK

6 16.670 10.110 36.410 46.520 -13.480 60.000 QUASIPEAK

Note:



3. Measurement Level = Reading Level + Correct Factor


Page: 39 of 169

Site : SR1 Time : 2010/01/29 - 02:43




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.170 9.790 24.820 34.610 -20.819 55.429 AVERAGE

2 0.224 9.790 18.750 28.540 -25.346 53.886 AVERAGE

3 * 0.935 9.800 30.250 40.050 -5.950 46.000 AVERAGE

4 2.142 9.810 15.600 25.410 -20.590 46.000 AVERAGE

5 3.884 9.820 14.310 24.130 -21.870 46.000 AVERAGE

6 16.670 10.110 29.600 39.710 -10.290 50.000 AVERAGE

Note:





Page: 40 of 169

Site : SR1 Time : 2010/01/29 - 02:44


EUT : Notebook Probe : ENV_216_N - Line2



Page: 41 of 169

Site : SR1 Time : 2010/01/29 - 02:44




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.177 9.780 35.480 45.260 -19.969 65.229 QUASIPEAK

2 0.263 9.780 29.460 39.240 -23.531 62.771 QUASIPEAK

3 * 0.939 9.790 34.610 44.400 -11.600 56.000 QUASIPEAK

4 2.013 9.800 23.090 32.890 -23.110 56.000 QUASIPEAK

5 3.904 9.820 23.730 33.550 -22.450 56.000 QUASIPEAK

6 16.400 10.190 35.830 46.020 -13.980 60.000 QUASIPEAK

Note:





Page: 42 of 169

Site : SR1 Time : 2010/01/29 - 02:44




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.177 9.780 20.820 30.600 -24.629 55.229 AVERAGE

2 0.263 9.780 16.910 26.690 -26.081 52.771 AVERAGE

3 * 0.939 9.790 29.080 38.870 -7.130 46.000 AVERAGE

4 2.013 9.800 15.220 25.020 -20.980 46.000 AVERAGE

5 3.904 9.820 14.450 24.270 -21.730 46.000 AVERAGE

6 16.400 10.190 29.210 39.400 -10.600 50.000 AVERAGE

Note:





Page: 43 of 169

3.7. Test Photograph Test Mode : Mode 1

Description : Front View of Conducted Test

Test Mode : Mode 1

Description : Back View of Conducted Test


Page: 44 of 169

Test Mode : Mode 2


Test Mode : Mode 2



Page: 45 of 169

Test Mode : Mode 3


Test Mode : Mode 3



Page: 46 of 169

4. Conducted Emissions (Telecommunication Ports)



4.2. Test Setup

4.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 84 – 74 74 – 64

0.50 - 30 74 64

Remarks:

The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50

MHz.


Page: 47 of 169

4.4. Test Procedure

Telecommunication Port:

The mains voltage shall be supplied to the EUT via the LISN when the measurement of

telecommunication port is performed. The common mode disturbances at the

telecommunication port shall be connected to the ISN, which is 150 ohm impedance.

Both alternative cables are tested related to the LCL requested. The measurement range is

from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz.

The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable, 55dB

LCL ISN is used for cat. 3.


No deviation.


Page: 48 of 169

4.6. Test Result Site : SR-8 Time : 2010/01/27 - 01:36

Limit : ISN_Voltage_B_00M_QP Margin : 10

Probe : ISN-T4 - Line1 Power : AC 230V/50Hz

EUT : Notebook Note : Mode 1, ISN 100Mbps


Page: 49 of 169

Site : SR-8 Time : 2010/01/27 - 01:37




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.392 9.729 54.110 63.839 -13.247 77.086 QUASIPEAK

2 0.455 9.718 48.110 57.828 -17.458 75.286 QUASIPEAK

3 0.814 9.730 47.260 56.990 -17.010 74.000 QUASIPEAK

4 2.123 9.750 46.770 56.520 -17.480 74.000 QUASIPEAK

5 16.228 9.760 46.250 56.010 -17.990 74.000 QUASIPEAK

6 23.127 9.800 49.370 59.170 -14.830 74.000 QUASIPEAK

Note:





Page: 50 of 169

Site : SR-8 Time : 2010/01/27 - 01:37

Limit : ISN_Voltage_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.392 9.729 53.810 63.539 -3.547 67.086 AVERAGE

2 0.455 9.718 39.330 49.048 -16.238 65.286 AVERAGE

3 0.814 9.730 36.970 46.700 -17.300 64.000 AVERAGE

4 2.123 9.750 36.130 45.880 -18.120 64.000 AVERAGE

5 16.228 9.760 44.890 54.650 -9.350 64.000 AVERAGE

6 23.127 9.800 49.250 59.050 -4.950 64.000 AVERAGE

Note:





Page: 51 of 169

Site : SR-8 Time : 2010/01/27 - 01:33





Page: 52 of 169

Site : SR-8 Time : 2010/01/27 - 01:34




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.392 9.729 54.420 64.149 -12.937 77.086 QUASIPEAK

2 0.877 9.740 46.180 55.920 -18.080 74.000 QUASIPEAK

3 1.369 9.740 47.770 57.510 -16.490 74.000 QUASIPEAK

4 4.947 9.710 41.910 51.620 -22.380 74.000 QUASIPEAK

5 7.502 9.723 48.620 58.343 -15.657 74.000 QUASIPEAK

6 12.447 9.750 42.580 52.330 -21.670 74.000 QUASIPEAK

Note:





Page: 53 of 169

Site : SR-8 Time : 2010/01/27 - 01:34




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.392 9.729 53.990 63.719 -3.367 67.086 AVERAGE

2 0.877 9.740 38.140 47.880 -16.120 64.000 AVERAGE

3 1.369 9.740 37.200 46.940 -17.060 64.000 AVERAGE

4 4.947 9.710 32.270 41.980 -22.020 64.000 AVERAGE

5 7.502 9.723 37.450 47.173 -16.827 64.000 AVERAGE

6 12.447 9.750 30.210 39.960 -24.040 64.000 AVERAGE

Note:





Page: 54 of 169

Site : SR-8 Time : 2010/01/27 - 02:06





Page: 55 of 169

Site : SR-8 Time : 2010/01/27 - 02:07




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.582 9.710 50.660 60.370 -13.630 74.000 QUASIPEAK

2 0.916 9.740 46.640 56.380 -17.620 74.000 QUASIPEAK

3 1.709 9.750 40.230 49.980 -24.020 74.000 QUASIPEAK

4 7.923 9.730 39.940 49.670 -24.330 74.000 QUASIPEAK

5 13.420 9.750 44.690 54.440 -19.560 74.000 QUASIPEAK

6 23.127 9.800 49.690 59.490 -14.510 74.000 QUASIPEAK

Note:





Page: 56 of 169

Site : SR-8 Time : 2010/01/27 - 02:07




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.582 9.710 50.460 60.170 -3.830 64.000 AVERAGE

2 0.916 9.740 38.210 47.950 -16.050 64.000 AVERAGE

3 1.709 9.750 34.630 44.380 -19.620 64.000 AVERAGE

4 7.923 9.730 37.670 47.400 -16.600 64.000 AVERAGE

5 13.420 9.750 43.220 52.970 -11.030 64.000 AVERAGE

6 23.127 9.800 47.880 57.680 -6.320 64.000 AVERAGE

Note:





Page: 57 of 169

Site : SR-8 Time : 2010/01/27 - 02:01



EUT : Notebook Note : Mode 2,ISN 10Mbps


Page: 58 of 169

Site : SR-8 Time : 2010/01/27 - 02:02




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.485 9.710 51.710 61.420 -13.009 74.429 QUASIPEAK

2 0.892 9.740 46.320 56.060 -17.940 74.000 QUASIPEAK

3 2.502 9.742 40.170 49.912 -24.088 74.000 QUASIPEAK

4 5.326 9.710 37.410 47.120 -26.880 74.000 QUASIPEAK

5 9.400 9.740 38.270 48.010 -25.990 74.000 QUASIPEAK

6 11.849 9.751 38.950 48.701 -25.299 74.000 QUASIPEAK

Note:





Page: 59 of 169

Site : SR-8 Time : 2010/01/27 - 02:02




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.485 9.710 51.700 61.410 -3.019 64.429 AVERAGE

2 0.892 9.740 38.580 48.320 -15.680 64.000 AVERAGE

3 2.502 9.742 33.460 43.202 -20.798 64.000 AVERAGE

4 5.326 9.710 24.100 33.810 -30.190 64.000 AVERAGE

5 9.400 9.740 26.740 36.480 -27.520 64.000 AVERAGE

6 11.849 9.751 25.860 35.611 -28.389 64.000 AVERAGE

Note:





Page: 60 of 169

Site : SR1 Time : 2010/01/29 - 02:51


EUT : Notebook Probe : ISN_T4 - Line1

Power : AC 230V/50Hz Note : Mode 3,ISN 100Mbps


Page: 61 of 169

Site : SR1 Time : 2010/01/29 - 02:51




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.400 10.000 44.780 54.780 -22.077 76.857 QUASIPEAK

2 1.150 9.980 41.250 51.230 -22.770 74.000 QUASIPEAK

3 2.595 10.000 34.890 44.890 -29.110 74.000 QUASIPEAK

4 5.236 9.980 38.230 48.210 -25.790 74.000 QUASIPEAK

5 * 16.166 10.130 49.020 59.150 -14.850 74.000 QUASIPEAK

6 28.685 10.090 48.320 58.410 -15.590 74.000 QUASIPEAK

Note:





Page: 62 of 169

Site : SR1 Time : 2010/01/29 - 02:51




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.400 10.000 44.320 54.320 -12.537 66.857 AVERAGE

2 1.150 9.980 39.560 49.540 -14.460 64.000 AVERAGE

3 2.595 10.000 29.270 39.270 -24.730 64.000 AVERAGE

4 5.236 9.980 37.810 47.790 -16.210 64.000 AVERAGE

5 * 16.166 10.130 47.190 57.320 -6.680 64.000 AVERAGE

6 28.685 10.090 46.160 56.250 -7.750 64.000 AVERAGE

Note:





Page: 63 of 169

Site : SR1 Time : 2010/01/29 - 02:49



Power : AC 230V/50Hz Note : Mode 3, ISN 10Mbps


Page: 64 of 169

Site : SR1 Time : 2010/01/29 - 02:50




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.400 10.000 44.840 54.840 -22.017 76.857 QUASIPEAK

2 0.798 9.980 41.860 51.840 -22.160 74.000 QUASIPEAK

3 1.150 9.980 41.030 51.010 -22.990 74.000 QUASIPEAK

4 2.302 10.000 38.150 48.150 -25.850 74.000 QUASIPEAK

5 12.572 10.079 28.420 38.499 -35.501 74.000 QUASIPEAK

6 16.295 10.130 33.240 43.370 -30.630 74.000 QUASIPEAK

Note:





Page: 65 of 169

Site : SR1 Time : 2010/01/29 - 02:50




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.400 10.000 44.390 54.390 -12.467 66.857 AVERAGE

2 0.798 9.980 41.490 51.470 -12.530 64.000 AVERAGE

3 1.150 9.980 38.790 48.770 -15.230 64.000 AVERAGE

4 2.302 10.000 34.740 44.740 -19.260 64.000 AVERAGE

5 12.572 10.079 22.700 32.779 -31.221 64.000 AVERAGE

6 16.295 10.130 27.730 37.860 -26.140 64.000 AVERAGE

Note:





Page: 66 of 169


Description : Front View of ISN Test

Test Mode : Mode 1

Description : Back View of ISN Test


Page: 67 of 169

Test Mode : Mode 2


Test Mode : Mode 2



Page: 68 of 169

Test Mode : Mode 3


Test Mode : Mode 3



Page: 69 of 169

5. Radiated Emission



5.2. Test Setup

Under 1GHz Test Setup:

Above 1GHz Test Setup:


Page: 70 of 169

5.3. Limit

Limits

Frequency

(MHz) Distance (m) dBuV/m

30 – 230 10 30

230 – 1000 10 37

Limits

Frequency

(GHz)

Distance

(m)

Peak

(dBuV/m)

Average

(dBuV/m)

1 – 3 3 70 50

3 – 6 3 74 54

Remark:

1. The tighter limit shall apply at the edge between two frequency bands.

2. Distance refers to the distance in meters between the measuring instrument antenna

and the closed point of any part of the device or system.

Highest frequency generated or used

in the device or on which the device

operates or tunes (MHz)

Upper frequency of measurement

range (MHz)

Below 108 1000

108 – 500 2000

500 – 1000 5000

Above 1000 5th harmonic of the highest frequency

or 6 GHz, whichever is lower


Page: 71 of 169

5.4. Test Procedure

The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The

turn table can rotate 360 degrees to determine the position of the maximum emission level.

The EUT was positioned such that the distance from antenna to the EUT was 3/10 meters.

The antenna can move up and down between 1 meter and 4 meters to find out the maximum

emission level.

Both horizontal and vertical polarization of the antenna are set on measurement. In order to

find the maximum emission, all of the interface cables must be manipulated on radiated

measurement.

Radiated emissions were invested over the frequency range from 30MHz to1GHz using a

receiver bandwidth of 120kHz and above 1GHz using a receiver bandwidth of 1MHz.

30MHz to1GHz Radiated was performed at an antenna to EUT distance of 10 meters.

Above1GHz Radiated was performed at an antenna to EUT distance of 3 meters.

It is placed with absorb on the ground between EUT and Antenna.


No deviation.


Page: 72 of 169

5.6. Test Result Site : OATS-1 Time : 2010/01/27 - 15:12


EUT : Notebook Probe : Site1_CBL6112_10M_0811 - HORIZONTAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 * 120.000 13.396 12.900 26.297 -3.703 30.000 QUASIPEAK

2 137.440 12.980 8.200 21.180 -8.820 30.000 QUASIPEAK

3 180.000 10.623 9.800 20.423 -9.577 30.000 QUASIPEAK

4 216.000 10.572 10.600 21.172 -8.828 30.000 QUASIPEAK

5 440.070 19.725 5.400 25.124 -11.876 37.000 QUASIPEAK

6 685.000 23.125 7.600 30.725 -6.275 37.000 QUASIPEAK

Note:

1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or

average measurements as necessary.




Page: 73 of 169

Site : OATS-1 Time : 2010/01/27 - 15:23


EUT : Notebook Probe : Site1_CBL6112_10M_0811 - VERTICAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 * 45.060 11.368 13.400 24.768 -5.232 30.000 QUASIPEAK

2 110.590 13.013 10.300 23.313 -6.687 30.000 QUASIPEAK

3 148.130 12.146 11.000 23.146 -6.854 30.000 QUASIPEAK

4 186.140 10.565 11.700 22.265 -7.735 30.000 QUASIPEAK

5 216.000 10.572 9.800 20.372 -9.628 30.000 QUASIPEAK

6 374.100 18.222 6.000 24.221 -12.779 37.000 QUASIPEAK

7 685.000 23.125 7.200 30.325 -6.675 37.000 QUASIPEAK

Note:






Page: 74 of 169

Site : OATS-1 Time : 2010/01/26 - 15:40




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 * 138.420 12.915 13.000 25.915 -4.085 30.000 QUASIPEAK

2 146.910 12.245 12.300 24.545 -5.455 30.000 QUASIPEAK

3 186.100 10.565 8.900 19.465 -10.535 30.000 QUASIPEAK

4 221.200 11.046 9.100 20.146 -9.854 30.000 QUASIPEAK

5 240.000 13.300 15.100 28.400 -8.600 37.000 QUASIPEAK

6 303.900 15.853 6.500 22.353 -14.647 37.000 QUASIPEAK

7 714.020 23.728 7.200 30.929 -6.071 37.000 QUASIPEAK

Note:






Page: 75 of 169

Site : OATS-1 Time : 2010/01/27 - 14:54




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 46.680 10.600 14.100 24.700 -5.300 30.000 QUASIPEAK

2 148.440 12.122 12.600 24.722 -5.278 30.000 QUASIPEAK

3 166.350 11.379 13.200 24.579 -5.421 30.000 QUASIPEAK

4 229.230 11.722 9.300 21.022 -8.978 30.000 QUASIPEAK

5 303.950 15.855 6.900 22.755 -14.245 37.000 QUASIPEAK

6 * 714.020 23.728 8.200 31.929 -5.071 37.000 QUASIPEAK

Note:






Page: 76 of 169

Site : OATS-3 Time : 2010/01/29 - 03:35




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 129.026 14.857 5.100 19.956 -10.044 30.000 QUASIPEAK

2 161.300 13.156 5.800 18.956 -11.044 30.000 QUASIPEAK

3 244.094 15.880 5.800 21.680 -15.320 37.000 QUASIPEAK

4 360.970 19.034 8.500 27.534 -9.466 37.000 QUASIPEAK

5 * 524.009 22.476 5.800 28.276 -8.724 37.000 QUASIPEAK

6 714.000 25.082 0.800 25.882 -11.118 37.000 QUASIPEAK

Note:






Page: 77 of 169

Site : OATS-3 Time : 2010/01/29 - 03:10




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 61.445 7.776 15.400 23.176 -6.824 30.000 QUASIPEAK

2 130.640 14.798 8.500 23.297 -6.703 30.000 QUASIPEAK

3 * 148.457 13.913 12.100 26.013 -3.987 30.000 QUASIPEAK

4 162.541 13.110 6.800 19.911 -10.089 30.000 QUASIPEAK

5 199.995 12.743 6.800 19.543 -10.457 30.000 QUASIPEAK

6 247.426 16.121 9.800 25.921 -11.079 37.000 QUASIPEAK

7 361.752 19.050 7.400 26.450 -10.550 37.000 QUASIPEAK

8 714.000 25.082 0.800 25.882 -11.118 37.000 QUASIPEAK

Note:






Page: 78 of 169

Site : 9x6x6_Chamber Time : 2010/01/27 - 04:41

Limit : EN55022_B_(Above_1G)_3M_PK Margin : 6

EUT : Notebook Probe : 9120D_1-18G_Horn - HORIZONTAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 1070.140 -6.335 51.410 45.075 -24.925 70.000 PEAK

2 * 2492.985 -1.569 47.200 45.631 -24.369 70.000 PEAK

Note:






Page: 79 of 169



EUT : Notebook Probe : 9120D_1-18G_Horn - VERTICAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 1070.140 -6.335 51.300 44.965 -25.035 70.000 PEAK

2 * 2494.985 -1.560 47.630 46.070 -23.930 70.000 PEAK

Note:






Page: 80 of 169

Site : 9x6x6 Chamber Time : 2010/01/27 - 05:19




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 * 1070.140 -6.335 52.639 46.304 -23.696 70.000 PEAK

2 2492.985 -1.569 46.387 44.818 -25.182 70.000 PEAK

Note:






Page: 81 of 169

Site : 9x6x6 Chamber Time : 2010/01/27 - 05:22




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 1070.140 -6.335 52.718 46.383 -23.617 70.000 PEAK

2 * 2494.985 -1.560 48.269 46.709 -23.291 70.000 PEAK

Note:






Page: 82 of 169





Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 1255.000 -4.160 55.400 51.240 -18.760 70.000 PEAK

2 * 1925.000 -3.511 55.400 51.889 -18.111 70.000 PEAK

3 2415.000 -1.906 47.600 45.694 -24.306 70.000 PEAK

Note:






Page: 83 of 169


Limit : EN55022_B_(Above_1G)_03M_AV Margin : 6



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 1255.000 -4.160 37.210 33.050 -16.950 50.000 AVERAGE

2 * 1925.000 -3.511 39.680 36.169 -13.831 50.000 AVERAGE

Note:






Page: 84 of 169





Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 * 1482.000 -3.734 54.800 51.066 -18.934 70.000 PEAK

2 2409.000 -1.927 50.100 48.173 -21.827 70.000 PEAK

Note:






Page: 85 of 169


Limit : EN55022_B_(Above_1G)_03M_AV Margin : 6



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 * 1482.000 -3.734 38.000 34.266 -15.734 50.000 AVERAGE

Note:






Page: 86 of 169


Description : Front View of Radiated Test

Test Mode : Mode 1

Description : Back View of Radiated Test


Page: 87 of 169

Test Mode : Mode 1

Description : Front View of High Frequency Radiated Test

Test Mode : Mode 2



Page: 88 of 169

Test Mode : Mode 2


Test Mode : Mode 2



Page: 89 of 169

Test Mode : Mode 3


Test Mode : Mode 3



Page: 90 of 169

Test Mode : Mode 3



Page: 91 of 169

6. Harmonic Current Emission


According to EMC Standard : EN 61000-3-2

6.2. Test Setup

6.3. Limit

(a) Limits of Class A Harmonics Currents

Harmonics

Order

n

Maximum Permissible

harmonic current

A

Harmonics

Order

n

Maximum Permissible

harmonic current

A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 n 40 0.23 * 8/n

11 0.33

13 0.21

15 n 39 0.15 * 15/n


Page: 92 of 169

(b) Limits of Class B Harmonics Currents

For Class B equipment, the harmonic of the input current shall not exceed the maximum

permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.

(c) Limits of Class C Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current

Expressed as a percentage of the input

current at the fundamental frequency

％

2 2

3 30．λ＊

5 10

7 7

9 5

11 n 39

(odd harmonics only) 3

＊λ is the circuit power factor

(d) Limits of Class D Harmonics Currents

Harmonics Order

n

Maximum Permissible

harmonic current per watt

mA/W

Maximum Permissible

harmonic current

A

3 3.4 2.30

5 1.9 1.14

7 1.0 0.77

9 0.5 0.40

11 0.35 0.33

11 n 39

(odd harmonics only) 3.85/n See limit of Class A


Page: 93 of 169

6.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same

normal voltage and frequency as the rated supply voltage and the equipment under test.

And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be

performed.


No deviation.


Page: 94 of 169

6.6. Test Result Product Notebook

Test Item Power Harmonics

Test Mode Mode 1

Date of Test 2010/01/29 Test Site No.3 Shielded Room

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-3

-2

-1

0

1

2

3

-300

-200

-100

0

100

200

300

Cu

rre

nt (A

mp

s)

Vo

ltag

e (V

olts)

Harmonics and Class D limit line European Limits

0.000

0.025

0.050

0.075

0.100

0.125

Cu

rre

nt R

MS

(Am

ps)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #0 with 0.00% of the limit.


Page: 95 of 169


THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000

Highest parameter values during test:

V_RMS (Volts): 229.62 Frequency(Hz): 50.00

I_Peak (Amps): 1.668 I_RMS (Amps): 0.305

I_Fund (Amps): 0.102 Crest Factor: 5.943

Power (Watts): 25.7 Power Factor: 0.366

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.002 3 0.092 0.087 0.0 0.088 0.131 0.00 Pass 4 0.002 5 0.089 0.049 0.0 0.086 0.073 0.00 Pass 6 0.002 7 0.086 0.026 0.0 0.083 0.038 0.00 Pass 8 0.002 9 0.081 0.013 0.0 0.079 0.019 0.00 Pass 10 0.002 11 0.076 0.009 0.0 0.074 0.013 0.00 Pass 12 0.002 13 0.070 0.008 0.0 0.068 0.011 0.00 Pass 14 0.002 15 0.064 0.007 0.0 0.063 0.010 0.00 Pass 16 0.002 17 0.058 0.006 0.0 0.056 0.009 0.00 Pass 18 0.002 19 0.051 0.005 0.0 0.050 0.008 0.00 Pass 20 0.002 21 0.045 0.005 0.0 0.044 0.007 0.00 Pass 22 0.002 23 0.039 0.004 0.0 0.038 0.006 0.00 Pass 24 0.002 25 0.033 0.004 0.0 0.033 0.006 0.00 Pass 26 0.002 27 0.027 0.004 0.0 0.028 0.005 0.00 Pass 28 0.001 29 0.023 0.003 0.0 0.023 0.005 0.00 Pass 30 0.001 31 0.018 0.003 0.0 0.019 0.005 0.00 Pass 32 0.001 33 0.014 0.003 0.0 0.015 0.004 0.00 Pass 34 0.001 35 0.011 0.003 0.0 0.011 0.004 0.00 Pass 36 0.001 37 0.008 0.003 0.0 0.008 0.004 0.00 Pass 38 0.001 39 0.005 0.003 0.0 0.006 0.004 0.00 Pass 40 0.001

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the

same window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power

>75W. Others the result should be pass.


Page: 96 of 169

Product Notebook


Test Mode Mode 2




-3

-2

-1

0

1

2

3

-300

-200

-100

0

100

200

300

Cu

rre

nt (A

mp

s)

Vo

ltag

e (V

olts)


0.000

0.0250.0500.0750.1000.125

0.1500.1750.200

Cu

rre

nt R

MS

(Am

ps)

Harmonic #4 8 12 16 20 24 28 32 36 40



Page: 97 of 169














Page: 98 of 169

Product Notebook


Test Mode Mode 3




-3

-2

-1

0

1

2

3

-300

-200

-100

0

100

200

300

Cu

rre

nt (A

mp

s)

Vo

ltag

e (V

olts)


0.000

0.025

0.050

0.075

0.100

0.125

0.150

0.175

Cu

rre

nt R

MS

(Am

ps)

Harmonic #4 8 12 16 20 24 28 32 36 40



Page: 99 of 169














Page: 100 of 169

6.7. Test Photograph

Test Mode : Mode 1

Description : Power Harmonics Test Setup

Test Mode : Mode 2



Page: 101 of 169

Test Mode : Mode 3



Page: 102 of 169

7. Voltage Fluctuation and Flicker


According to EMC Standard : EN 61000-3-3

7.2. Test Setup

7.3. Limit

The following limits apply:

－ the value of Pst shall not be greater than 1.0;

－ the value of Plt shall not be greater than 0.65;

－ the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500

ms;

－ the relative steady-state voltage change, dc, shall not exceed 3.3 ％;

－ the maximum relative voltage change, dmax, shall not exceed;

a) 4 ％ without additional conditions;

b) 6 ％ for equipment which is:

－ switched manually, or

－ switched automatically more frequently than twice per day, and also has either a

delayed restart (the delay being not less than a few tens of seconds), or manual restart,

after a power supply interruption.

NOTE The cycling frequency will be further limited by the Pst and P1t limit.

For example: a dmax of 6％producing a rectangular voltage change characteristic twice per

hour will give a P1t of about 0.65.


Page: 103 of 169

c) 7 ％ for equipment which is:

－ attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment

such as mixers, garden equipment such as lawn mowers, portable tools such as

electric drills), or

－ switched on automatically, or is intended to be switched on manually, no more than

twice per day, and also has either a delayed restart (the delay being not less than a

few tens of seconds) or manual restart, after a power supply interruption.

Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.

7.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same

normal voltage and frequency as the rated supply voltage and the equipment under test.

And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be

performed.


No deviation.


Page: 104 of 169


Test Item Voltage Fluctuation and Flicker

Test Mode Mode 1


Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

23:0

7:3

4

Plt and limit line

0.00

0.25

0.50

Plt

23:0

7:3

4

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.56 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.064 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.028 Test limit: 0.650 Pass


Page: 105 of 169

Product Notebook


Test Mode Mode 2




0.25

0.50

0.75

1.00

Pst

22:4

9:2

5

Plt and limit line

0.00

0.25

0.50

Plt

22:4

9:2

5



Page: 106 of 169

Product Notebook


Test Mode Mode 3




0.25

0.50

0.75

1.00

Pst

23:4

0:3

6

Plt and limit line

0.00

0.25

0.50

Plt

23:4

0:3

6



Page: 107 of 169


Description : Flicker Test Setup

Test Mode : Mode 2



Page: 108 of 169

Test Mode : Mode 3



Page: 109 of 169

8. Electrostatic Discharge


According to Standard : IEC 61000-4-2

8.2. Test Setup

8.3. Limit

Item Environmental

Phenomena

Units Test Specification Performance

Criteria

Enclosure Port

Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge

±4 Contact Discharge B


Page: 110 of 169

8.4. Test Procedure

Direct application of discharges to the EUT:

Contact discharge was applied only to conductive surfaces of the EUT.

Air discharges were applied only to non-conductive surfaces of the EUT.

During the test, it was performed with single discharges. For the single discharge

time between successive single discharges will be keep longer 1 second. It was at

least ten single discharges with positive and negative at the same selected point.

The selected point, which was performed with electrostatic discharge, was marked

on the red label of the EUT.

Indirect application of discharges to the EUT:

Vertical Coupling Plane (VCP):

The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned

at a distance 0.1m from, the EUT, with the Discharge Electrode touching the

coupling plane.

The four faces of the EUT will be performed with electrostatic discharge. It was at


Horizontal Coupling Plane (HCP):

The coupling plane is placed under to the EUT. The generator shall be positioned

vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching

the coupling plane.

The four faces of the EUT will be performed with electrostatic discharge. It was at



No deviation.


Page: 111 of 169


Test Item Electrostatic Discharge

Test Mode Mode 1


Item Amount of

Discharge Voltage

Required

Criteria

Complied To

Criteria

(A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

B

B

Pass

Pass

Contact Discharge 25

25

+4kV

-4kV

B

B

B

B

Pass

Pass

Indirect Discharge

(HCP)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Note:

The testing performed is from lowest level up to the highest level as required by standard,

but only highest level is shown on the report. NR: No Requirement

Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.

Remark:

The Contact discharges were applied at least total 200 discharges at a minimum of four

test points.


Page: 112 of 169

Product Notebook


Test Mode Mode 2


Item Amount of

Discharge Voltage

Required

Criteria

Complied To

Criteria

(A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

B

B

Pass

Pass


25

+4kV

-4kV

B

B

B

B

Pass

Pass

Indirect Discharge

(HCP)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Note:





Remark:


test points.


Page: 113 of 169

Product Notebook


Test Mode Mode 3


Item Amount of

Discharge Voltage

Required

Criteria

Complied To

Criteria

(A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

B

B

Pass

Pass


25

+4kV

-4kV

B

B

B

B

Pass

Pass

Indirect Discharge

(HCP)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Note:





Remark:


test points.


Page: 114 of 169


Description : ESD Test Setup

Test Mode : Mode 2



Page: 115 of 169

Test Mode : Mode 3



Page: 116 of 169

9. Radiated Susceptibility



9.2. Test Setup

9.3. Limit

Item Environmental

Phenomena

Units Test

Specification

Performance

Criteria

Enclosure Port

Radio-Frequency

Electromagnetic Field

Amplitude Modulated

MHz

V/m(Un-modulated, rms)

% AM (1kHz)

80-1000

3

80

A


Page: 117 of 169

9.4. Test Procedure

The EUT and load, which are placed on a table that is 0.8 meter above ground, are

placed with one coincident with the calibration plane such that the distance from

antenna to the EUT was 3 meters.

Both horizontal and vertical polarization of the antenna and four sides of the EUT are set

on measurement.

In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.

All the scanning conditions are as follows:

Condition of Test Remarks

1. Field Strength 3 V/m Level 2

2. Radiated Signal AM 80% Modulated with 1kHz

3. Scanning Frequency 80MHz - 1000MHz

4 Dwell Time 3 Seconds

5. Frequency step size f : 1%

6. The rate of Swept of Frequency 1.5 x 10-3 decades/s


No deviation.


Page: 118 of 169


Test Item Radiated susceptibility

Test Mode Mode 1

Date of Test 2010/01/30 Test Site Chamber5

Frequency

(MHz)

Position

(Angle) Polarity

(H or V)

Field

Strength

(V/m)

Required

Criteria

Complied

To Criteria

(A,B,C)

Results

80-1000 FRONT H 3 A A PASS

80-1000 FRONT V 3 A A PASS

80-1000 BACK H 3 A A PASS

80-1000 BACK V 3 A A PASS

80-1000 RIGHT H 3 A A PASS

80-1000 RIGHT V 3 A A PASS

80-1000 LEFT H 3 A A PASS

80-1000 LEFT V 3 A A PASS

80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS

80-1000 DOWN H 3 A A PASS

80-1000 DOWN V 3 A A PASS

Note:

The testing performed is from lowest level up to the highest level as required by

standard, but only highest level is shown on the report.


There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz.

No false alarms or other malfunctions were observed during or after the test.


Page: 119 of 169

Product Notebook


Test Mode Mode 2


Frequency

(MHz)

Position

(Angle) Polarity

(H or V)

Field

Strength

(V/m)

Required

Criteria

Complied

To Criteria

(A,B,C)

Results









80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS



Note:





at frequency MHz.



Page: 120 of 169

Product Notebook


Test Mode Mode 3


Frequency

(MHz)

Position

(Angle) Polarity

(H or V)

Field

Strength

(V/m)

Required

Criteria

Complied

To Criteria

(A,B,C)

Results









80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS



Note:





at frequency MHz.



Page: 121 of 169


Test Mode : Mode 1

Description : Radiated Susceptibility Test Setup

Test Mode : Mode 2



Page: 122 of 169

Test Mode : Mode 3



Page: 123 of 169

10. Electrical Fast Transient/Burst



10.2. Test Setup

10.3. Limit

Item Environmental Phenomena

Units Test Specification Performance Criteria

I/O and communication ports Fast Transients Common Mode

kV (Peak) Tr/Th ns Rep. Frequency kHz

+0.5 5/50 5

B

Input DC Power Ports Fast Transients Common Mode


+0.5 5/50 5

B

Input AC Power Ports Fast Transients Common Mode


+1 5/50 5

B


Page: 124 of 169

10.4. Test Procedure

The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on

the table, and uses a 0.1m insulation between the EUT and ground reference plane.

The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and

projected beyond the EUT by at least 0.1m on all sides.

Test on I/O and communication ports:

The EFT interference signal is through a coupling clamp device couples to the signal and

control lines of the EUT with burst noise for 1minute.

Test on power supply ports:

The EUT is connected to the power mains through a coupling device that directly couples the

EFT/B interference signal.

Each of the Line and Neutral conductors is impressed with burst noise for 1 minute.

The length of the signal and power lines between the coupling device and the EUT is 0.5m.


No deviation.


Page: 125 of 169


Test Item Electrical fast transient/burst

Test Mode Mode 1


Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result

L+N+PE ± 1kV 60 Direct B A PASS

LAN ± 0.5 kV 60 Clamp B A PASS

Note:



Meet criteria A : Operate as intended during and after the test

Meet criteria B : Operate as intended after the test

Meet criteria C : Loss/Error of function

Additional Information

EUT stopped operation and could / could not be reset by operator at kV of

Line .



Page: 126 of 169

Product Notebook


Test Mode Mode 2


Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result



Note:








Line .



Page: 127 of 169

Product Notebook


Test Mode Mode 3


Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result



Note:








Line .



Page: 128 of 169


Test Mode : Mode 1

Description : EFT/B Test Setup

Test Mode : Mode 1

Description : EFT/B Test Setup-Clamp


Page: 129 of 169

Test Mode : Mode 2


Test Mode : Mode 2



Page: 130 of 169

Test Mode : Mode 3


Test Mode : Mode 3



Page: 131 of 169

11. Surge



11.2. Test Setup

11.3. Limit

Item Environmental Phenomena Units Test Specification Performance Criteria

Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) 1

B

Input DC Power Ports Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) 0.5

B

AC Input and AC Output Power Ports Surges Line to Line Line to Ground

Tr/Th us kV kV

1.2/50 (8/20) 1 2

B

Notes:

1) Applicable only to ports which according to the manufacturer’s may directly to outdoor

cables.

2) Where normal functioning cannot be achieved because of the impact of the CDN on the

EUT, no immunity test shall be required.


Page: 132 of 169


The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane

measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least

0.1m on all sides. The length of power cord between the coupling device and the EUT shall

be 2m or less.

For Input and Output AC Power or DC Input and DC Output Power Ports:

The EUT is connected to the power mains through a coupling device that directly couples the

Surge interference signal.

The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and

the peak value of the a.c. voltage wave. (Positive and negative)

Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with

interval of 1 min.


No deviation.


Page: 133 of 169


Test Item Surge

Test Mode Mode 1


Inject

Line Polarity Angle

Voltage

kV

Time

Interval

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result

L-N ± 0 1kV 60 Direct B A PASS




L-PE ± 0 2kV 60 Direct B A PASS




N-PE ± 0 2kV 60 Direct B A PASS




Note:


standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV of Line .



Page: 134 of 169

Product Notebook

Test Item Surge

Test Mode Mode 2


Inject

Line Polarity Angle

Voltage

kV

Time

Interval

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result













Note:






Page: 135 of 169

Product Notebook

Test Item Surge

Test Mode Mode 3


Inject

Line Polarity Angle

Voltage

kV

Time

Interval

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result













Note:






Page: 136 of 169


Test Mode : Mode 1

Description : SURGE Test Setup

Test Mode : Mode 2



Page: 137 of 169

Test Mode : Mode 3



Page: 138 of 169

12. Conducted Susceptibility



12.2. Test Setup

CDN Test Mode

EM Clamp Test Mode


Page: 139 of 169

12.3. Limit

Item Environmental Phenomena Units Test Specification

Performance Criteria

Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted

MHz V (rms, Un-modulated) % AM (1kHz)

0.15-80 3 80

A

Input DC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80

A

Input AC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80

A


The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz – 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s


No deviation.


Page: 140 of 169


Test Item Conducted susceptibility

Test Mode Mode 1


Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required

Criteria

Performance

Criteria

Complied To

Result

0.15~80 130 (3V) CDN AC IN A A PASS

0.15~80 130 (3V) CDN LAN A A PASS

Note:







EUT stopped operation and could / could not be reset by operator at dBuV(V) at

frequency MHz.

No false alarms or other malfunctions were observed during or after the test. The

acceptance criteria were met, and the EUT passed the test.


Page: 141 of 169

Product Notebook


Test Mode Mode 2


Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required

Criteria

Performance

Criteria

Complied To

Result


0.15~80 130 (3V) CDN LAN A A PASS

Note:








frequency MHz.




Page: 142 of 169

Product Notebook


Test Mode Mode 3


Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required

Criteria

Performance

Criteria

Complied To

Result


0.15~80 130 (3V) CDN LAN A A PASS

Note:








frequency MHz.




Page: 143 of 169


Description : Conducted Susceptibility Test Setup

Test Mode : Mode 1

Description : Conducted Susceptibility Test Setup -CDN


Page: 144 of 169

Test Mode : Mode 2


Test Mode : Mode 2



Page: 145 of 169

Test Mode : Mode 3


Test Mode : Mode 3



Page: 146 of 169

13. Power Frequency Magnetic Field



13.2. Test Setup

13.3. Limit Item Environmental

Phenomena Units Test Specification Performance

Criteria Enclosure Port Power-Frequency

Magnetic Field Hz A/m (r.m.s.)

50 1

A


The EUT and its load are placed on a table which is 0.8 meter above a metal ground

plane measured at least 1m*1m min. The test magnetic field shall be placed at central

of the induction coil.

The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.

And the induction coil shall be rotated by 90 in order to expose the EUT to the test field

with different orientation (X, Y, Z Orientations).


No deviation.


Page: 147 of 169


Test Item Power frequency magnetic field

Test Mode Mode 1


Polarization Frequency

(Hz)

Magnetic

Strength

(A/m)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result

X Orientation 50 1 A A PASS

Y Orientation 50 1 A A PASS

Z Orientation 50 1 A A PASS

Meet criteria A: Operate as intended during and after the test

Meet criteria B: Operate as intended after the test

Meet criteria C: Loss/Error of function


EUT stopped operation and could / could not be reset by operator at kV

of Line .




Page: 148 of 169

Product Notebook


Test Mode Mode 2



(Hz)

Magnetic

Strength

(A/m)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result









of Line .




Page: 149 of 169

Product Notebook


Test Mode Mode 3



(Hz)

Magnetic

Strength

(A/m)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result









of Line .




Page: 150 of 169


Test Mode : Mode 1

Description : Power Frequency Magnetic Field Test Setup

Test Mode : Mode 2



Page: 151 of 169

Test Mode : Mode 3



Page: 152 of 169

14. Voltage Dips and Interruption



14.2. Test Setup

14.3. Limit

Item Environmental

Phenomena

Units Test Specification Performance

Criteria

Input AC Power Ports

% Reduction

Period

30

25 C

Voltage Dips

% Reduction

Period

>95

0.5 B

Voltage Interruptions % Reduction

Period

> 95

250 C


Page: 153 of 169


The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane

measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least

0.1m on all sides. The power cord shall be used the shortest power cord as specified by the

manufacturer.

For Voltage Dips/ Interruptions test:

The selection of test voltage is based on the rated power range. If the operation range is

large than 20% of lower power range, both end of specified voltage shall be tested.

Otherwise, the typical voltage specification is selected as test voltage.

The EUT is connected to the power mains through a coupling device that directly couples to

the Voltage Dips and Interruption Generator.

The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods,

for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three

voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied

voltage and duration 250 Periods with a sequence of three voltage interruptions with

intervals of 10 seconds.

Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the

voltage.


No deviation.


Page: 154 of 169


Test Item Voltage dips and interruption

Test Mode Mode 1


Voltage Dips and

Interruption

Reduction(%)

Angle Test

Duration

(Periods)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result

30 0 25 C A PASS 30 45 25 C A PASS 30 90 25 C A PASS 30 135 25 C A PASS 30 180 25 C A PASS 30 225 25 C A PASS 30 270 25 C A PASS 30 315 25 C A PASS

>95 0 0.5 B A PASS >95 45 0.5 B A PASS >95 90 0.5 B A PASS >95 135 0.5 B A PASS >95 180 0.5 B A PASS >95 225 0.5 B A PASS >95 270 0.5 B A PASS >95 315 0.5 B A PASS >95 0 250 C B PASS >95 45 250 C B PASS >95 90 250 C B PASS >95 135 250 C B PASS >95 180 250 C B PASS >95 225 250 C B PASS >95 270 250 C B PASS >95 315 250 C B PASS Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information

The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV

of Line .




Page: 155 of 169

Product Notebook


Test Mode Mode 2


Voltage Dips and

Interruption

Reduction(%)

Angle Test

Duration

(Periods)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result




of Line .




Page: 156 of 169

Product Notebook


Test Mode Mode 3


Voltage Dips and

Interruption

Reduction(%)

Angle Test

Duration

(Periods)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result




of Line .




Page: 157 of 169


Description : Voltage Dips Test Setup

Test Mode : Mode 2



Page: 158 of 169

Test Mode : Mode 3



Page: 159 of 169

15. Attachment EUT Photograph

(1) EUT Photo

(2) EUT Photo


Page: 160 of 169

(3) EUT Photo

(4) EUT Photo


Page: 161 of 169

(5) EUT Photo

(6) EUT Photo


Page: 162 of 169

(7) EUT Photo

(8) EUT Photo


Page: 163 of 169

(9) EUT Photo

(10) EUT Photo


Page: 164 of 169

(11) EUT Photo

(12) EUT Photo


Page: 165 of 169

(13) EUT Photo

(14) EUT Photo


Page: 166 of 169

(15) EUT Photo

(16) EUT Photo


Page: 167 of 169

(17) EUT Photo

(18) EUT Photo


Page: 168 of 169

(19) EUT Photo

(20) EUT Photo


Page: 169 of 169

(21) EUT Photo

(22) EUT Photo

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