04bl094e rpt .l.p megabook s260,ms-1012faenl.msi.com/ftp/ce...

Report No： 04BL094E

Page: 1 of 95 Version:1.0

Test Report

Product Name ： MEGA BOOK

Model No. ： S260,MS-1012

Applicant ： MICRO-STAR INTL Co., LTD.

Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien,

Taiwan, R.O.C.

Date of Receipt ： 2004/11/10

Issued Date ： 2005/01/11

Report No. ： 04BL094E

The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity

The following products is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). The listed standard as below were applied: The following Equipment:

Product : MEGA BOOK Trade Name : MSI Model Number : S260,MS-1012

This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC).For the evaluation regarding EMC, the following standards were applied:

RFI Emission:

EN 55022:1998+A1: 2000 Class B : Product family standard EN 61000-3-2: 2000 Class A : Limits for harmonic current emission

EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity :

EN 55024:1998+A1:2001 Product family standard

The following importer/manufacturer is responsible for this declaration:

Company Name :

Company Address :

Telephone :

Person is responsible for marking this declaration:

Name (Full Name) Position/ Title

Date Legal Signature

QuieTek Corporation / No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: [email protected]

QTK No.:04BL094E

S ta t ement o f Conformi ty

The certifies that the following designated product

Product : MEGA BOOK Trade Name : MSI Model Number : S260,MS-1012

Company Name : MICRO-STAR INT’L CO., LTD.

This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (89/336/EEC). For the evaluation regarding EMC, the following standards were applied:

RFI Emission:

EN 55022:1998+A1: 2000 Class B : Product family standard EN 61000-3-2: 2000 Class A : Limits for harmonic current emission

EN 61000-3-3:1995+A1:2001 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity :

EN 55024:1998+A1:2001 Product family standard

TEST LABORATORY

Gene Chang / Manager The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo.

EMC/Safety Test Laboratory Accredited by DNV, TUV, Nemko and NVLAP



Test Report Cert i f icat ion Issued Date : 2005/01/11 Report No. : 04BL094E

Product Name ： MEGA BOOK Applicant ： MICRO-STAR INTL Co., LTD. Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C. Manufacturer ： MICRO-STAR INTL Co., LTD. Model No. ： S260,MS-1012 Rated Voltage : AC 230 V / 50 Hz EUT Voltage : AC 100-240 V, 50 / 60 Hz Trade Name ： MSI Measurement Standard ： EN 55022:1998+A1:2000,

EN 55024:1998+A1:2001,EN 61000-3-2:2000, EN 61000-3-3:1995+A1:2001

Measurement Procedure ： EN 55022:1998+A1: 2000 EN 61000-3-2: 2000,EN 61000-3-3:1995+A1: 2001 IEC 61000-4-2:1995+A1: 1998+A2: 2000 IEC 61000-4-3:1995+A1: 1998+A2: 2000 IEC 61000-4-4:1995+A1: 2000+A2: 2001 IEC 61000-4-5:1995+A1: 2000 IEC 61000-4-6:1996+A1: 2000 IEC 61000-4-8:1993+A1: 2000 IEC 61000-4-11:1994+A1: 2000

Classification ： B Test Result ： Complied

The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Documented By ：

( D e m i C h a n g )

Tested By ：

( D a v i d D a i )

Approved By ：

( G e n e C h a n g )



TABLE OF CONTENTS Description Page 1. General Information .................................................................................................................6 1.1. EUT Description ..........................................................................................................................6 1.2. Test Mode ....................................................................................................................................9 1.3. Tested System Details..............................................................................................................10 1.4. Configuration of tested System ..............................................................................................11 1.5. EUT Exercise Software ............................................................................................................12 1.6. Test Facility ................................................................................................................................13 2. Conducted Emission .............................................................................................................14 2.1. Test Equipment List ..................................................................................................................14 2.2. Test Setup ..................................................................................................................................14 2.3. Limits...........................................................................................................................................15 2.4. Test Procedure ..........................................................................................................................15 2.5. Uncertainty.................................................................................................................................15 2.6. Test Specification ......................................................................................................................15 2.7. Test Result .................................................................................................................................16 2.8. Test Photo ..................................................................................................................................20 3. Impedance Stabilization Network .......................................................................................22 3.1. Test Equipment List ..................................................................................................................22 3.2. Test Setup ..................................................................................................................................22 3.3. Limits...........................................................................................................................................23 3.4. Test Procedure ..........................................................................................................................23 3.5. Uncertainty.................................................................................................................................23 3.6. Test Specification ......................................................................................................................23 3.7. Test Result .................................................................................................................................24 3.8. Test Photo ..................................................................................................................................27 4. Radiated Emission .................................................................................................................28 4.1. Test Equipment List ..................................................................................................................28 4.2. Test Setup ..................................................................................................................................28 4.3. Limits...........................................................................................................................................29 4.4. Test Procedure ..........................................................................................................................29 4.5. Uncertainty.................................................................................................................................29 4.6. Test Specification ......................................................................................................................29 4.7. Test Result .................................................................................................................................30 4.8. Test Photo ..................................................................................................................................34 5. Power Harmonics ...................................................................................................................36 5.1. Test Equipment List ..................................................................................................................36 5.2. Test Setup ..................................................................................................................................36 5.3. Limits...........................................................................................................................................37 5.4. Test Procedure ..........................................................................................................................38 5.5. Uncertainty.................................................................................................................................38 5.6. Test Specification ......................................................................................................................38 5.7. Test Result .................................................................................................................................39 5.8. Test Photo ..................................................................................................................................43 6. Voltage Fluctuation and Flicker ..........................................................................................44



6.1. Test Equipment List ..................................................................................................................44 6.2. Test Setup ..................................................................................................................................44 6.3. Limits...........................................................................................................................................45 6.4. Test Procedure ..........................................................................................................................45 6.5. Uncertainty.................................................................................................................................45 6.6. Test Specification ......................................................................................................................45 6.7. Test Result .................................................................................................................................46 6.8. Test Photo ..................................................................................................................................48 7. Electrostatic Discharge (ESD).............................................................................................49 7.1. Test Equipment List ..................................................................................................................49 7.2. Test Setup ..................................................................................................................................49 7.3. Limits...........................................................................................................................................50 7.4. Test Procedure ..........................................................................................................................50 7.5. Uncertainty.................................................................................................................................50 7.6. Test Specification ......................................................................................................................50 7.7. Test Result .................................................................................................................................51 7.8. Test Photo ..................................................................................................................................53 8. Radiated Susceptibility (RS)................................................................................................54 8.1. Test Equipment List ..................................................................................................................54 8.2. Test Setup ..................................................................................................................................54 8.3. Limits...........................................................................................................................................55 8.4. Test Procedure ..........................................................................................................................55 8.5. Uncertainty.................................................................................................................................55 8.6. Test Specification ......................................................................................................................55 8.7. Test Result .................................................................................................................................56 8.8. Test Photo ..................................................................................................................................58 9. Electrical Fast Transient/Burst (EFT/B) ............................................................................59 9.1. Test Equipment List ..................................................................................................................59 9.2. Test Setup ..................................................................................................................................59 9.3. Limits...........................................................................................................................................60 9.4. Test Procedure ..........................................................................................................................60 9.5. Test Specification ......................................................................................................................60 9.6. Test Result .................................................................................................................................61 9.7. Test Photo ..................................................................................................................................63 10. Surge..........................................................................................................................................65 10.1. Test Equipment List ..................................................................................................................65 10.2. Test Setup ..................................................................................................................................65 10.3. Limits...........................................................................................................................................66 10.4. Test Procedure ..........................................................................................................................66 10.5. Uncertainty.................................................................................................................................66 10.6. Test Specification ......................................................................................................................66 10.7. Test Result .................................................................................................................................67 10.8. Test Photo ..................................................................................................................................69 11. Conducted Susceptibility (CS)............................................................................................70 11.1. Test Equipment List ..................................................................................................................70 11.2. Limits...........................................................................................................................................70 11.3. Limits...........................................................................................................................................71



11.4. Test Procedure ..........................................................................................................................72 11.5. Uncertainty.................................................................................................................................72 11.6. Test Specification ......................................................................................................................72 11.7. Test Result .................................................................................................................................73 11.8. Test Photo ..................................................................................................................................75 12. Power Frequency Magnetic Field .......................................................................................77 12.1. Test Equipment List ..................................................................................................................77 12.2. Test Setup ..................................................................................................................................77 12.3. Limits...........................................................................................................................................78 12.4. Test Procedure ..........................................................................................................................78 12.5. Uncertainty.................................................................................................................................78 12.6. Test Specification ......................................................................................................................78 12.7. Test Result .................................................................................................................................79 12.8. Test Photo ..................................................................................................................................81 13. Voltage Dips and Interruption Measurement...................................................................82 13.1. Test Equipment List ..................................................................................................................82 13.2. Test Setup ..................................................................................................................................82 13.3. Limits...........................................................................................................................................83 13.4. Test Procedure ..........................................................................................................................83 13.5. Uncertainty.................................................................................................................................83 13.6. Test Specification ......................................................................................................................83 13.7. Test Result .................................................................................................................................84 13.8. Test Photo ..................................................................................................................................86 Attachement.........................................................................................................................................................87 　 EUT Photograph .......................................................................................................................87 Reference : Laboratory of License



1. General Information

1.1. EUT Description

Product Name MEGA BOOK Trade Name MSI Model No. S260,MS-1012

Component Power Adapter(1) LITEON,PA-1650-02

Input: AC 100-240V,50/60Hz,1.6A Output: DC 19V,3.42A Cable Out:Non-Shielded,1.8m,with one ferrite core bonded. Power Cord:Non-Shielded,1.8m

Power Adapter(2) LI SHIN,0335A1965 Input: AC 100-240V,50/60Hz Output: DC 19V,3.42A Cable Out:Non-Shielded,1.8m,with one ferrite core bonded. Power Cord:Non-Shielded,1.8m

Note: The EUT is including two models, The MS-1012 for MSI and the S260 for different marketing requirement.

MS1012 Critical Part List

Item Vendor Model Discription

Pentium M 1.5 GHz Dothan Processor (400FSB)




Pentium M 1.86GHz Dothan Processor (533FSB)


CPU Intel


LCD AU B121EW01 V1 12.1" WXGA MHT2040AT 40GB (Rev.A1, F/W:009A)

Fujitsu MHT2060AT 60GB (Rev.A1, F/W:009A)

MK4025GAS 40GB HDD

Toshiba MK6021GAS 60GB



DVD-ROM SDR-083

Combo Dirve (CD-R/RW+DVD-ROM support "read DVD-RAM")

SBW-242B QSI

DVD Dual SDW-042

DVD-ROM 8x SR-8178-CPK1

Combo Drive (CD-R/RW+DVD)

UJDA-750 Panasonic

Super Multi UJ-820B

ODD

Lite-on DVD-ROM SOSC-2483K

DDR Module 512MB V58C2256804SAS5

DDR400, Mosel Chip

DDR Module 128MB HYB25D256160BT-6

DDR333, Infinion chip

DDR Module 256MB HYB25D256800BT-6

DDR333, Infinion chip Apacer

DDR Module 512MB HYB25D256800BC-6

DDR333, Infinion chip, 32Mx8 FBGA

Transcend DDR Module 256MB, TS32MSD64V4F3

DDR400, Samsung chip, 32M x 8

Memory

Kingston DDR Module 512MB, KVR333X64SC25/512

DDR333, Mosel chip

Inverter Sumida 12.1" WXGA TFT

Battery SMP 4cell Li-ion Battery Li-ion 2200mAH, Panasonic Cell

Lite-on PA-1650-02 65W, 19V AC-adapter

Li-shin 0335A1965 65W, 19V

KW-300-US US/ Canada Keyboard

KW-300-UK UK Keyboard

KW-300-GE

KW-300-FR

KW-300-IT

KW-300-SP

KW-300-RU

KW-300-TC

K/B Zippy

KW-300-SC



Power Cord Fanjet YP-12/YC-14

Touch Pad ALPS KGDDFT956A-1

MDC Modem Actiontec MD560LMI-2

WLAN Intel Intel Pro/Wireless 2200BG (MOW)

IEEE802.11b+g



1.2. Test Mode QuieTek has verified the construction and function in typical operation. All the test modes were

carried out with the EUT in normal operation, which was shown in this test report and defined as:

Pre-Test Mode

EMC Mode 1:Intel Pentium M 1.5GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Mode 3:Intel Pentium M 1.6GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Mode 4:Intel Pentium M 1.73GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Mode 5:Intel Pentium M 1.86GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Mode 6:Intel Pentium M 2.0GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Mode 7:Intel Pentium M 2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON)

Final Test Mode

EMI Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Mode 7:Intel Pentium M 2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON)

EMS Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Mode 7:Intel Pentium M 2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON)

Mode 1 2 3 4 5 6 7 CPU Pentium M

1.5 GHz(400)

Pentium M

1.6 GHz(400)

Pentium M

1.6 GHz(533)

Pentium M

1.73 GHz(533)

Pentium M

1.86GHz (533)

Pentium M

2.0GHz(533)

Pentium M

2.13GHz(533)

LCD Panel AU

B121EW01 V1

AU

B121EW01 V1

AU

B121EW01 V1

AU

B121EW01 V1

AU

B121EW01 V1

AU

B121EW01 V1

AU

B121EW01 V1

HDD MHT2040AT MHT2060AT MK4025GAS MK6021GAS

MHT2040AT

MHT2060AT

MK4025GAS

Module

Device

SDR-083 SBW-242B SDW-042 SR-8178-CPK1 UJDA-750

UJ-820B

SOSC-2483K

DDR Memory DDR Module

512MB

V58C2256804S

AS5

DDR Module

128MB

HYB25D256160

BT-6

DDR Module

256MB

HYB25D256800

BT-6

DDR Module

512MB

HYB25D256800

BC-6

DDR Module

256MB,

TS32MSD64V4F

3

DDR Module

512MB,

KVR333X64SC2

5/512

DDR Module

512MB

HYB25D256800

BC-6

MDC MD560LMI-2 MD560LMI-2 MD560LMI-2 MD560LMI-2 MD560LMI-2 MD560LMI-2 MD560LMI-2

Wireless LAN Intel 2200BG Intel 2200BG Intel 2200BG Intel 2200BG Intel 2200BG Intel 2200BG Intel 2200BG

Battery Li-ion

4 Cell

Li-ion

4 Cell

Li-ion

4 Cell

Li-ion

4 Cell

Li-ion

4 Cell

Li-ion

4 Cell

Li-ion

4 Cell

Inverter Sumida

S78-3300120-S49

Sumida

S78-3300120-S49

Sumida

S78-3300120-S49

Sumida

S78-3300120-S49

Sumida

S78-3300120-S49

Sumida

S78-3300120-S49

Sumida

S78-3300120-S49

Power

Adapter

PA-1650-02MS 0335A1965 PA-1650-02MS 0335A1965 PA-1650-02MS

0335A1965

PA-1650-02MS



1.3. Tested System Details

The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are:

Product Manufacturer Model No. Serial No. Power Cord

1 Monitor SONY PVM-14M2U 2105742 Non-Shielded, 1.8m

2 Exchange Network

Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m

3 Notebook PC DELL PP01L N/A Non-Shielded, 1.8m

4 Microphone & Earphone

ROSA RSM-900 N/A N/A

5 USB 2.0 HDD Topdisk ME-910 220950 Power by PC

6 Slim COMBO ASUS SCB-2408D 42DM355283 Non-Shielded, 1.8m,with one ferrite core bonded.

7 COMBO HDD Topdisk ME-910 235842 Power by PC

8 USB 2.0 HDD Topdisk ME-910 220956 Power by PC

9 W/LAN Card LEMEL LM-WLC030 1231Q048877 N/A



1.4. Configuration of tested System

Connection Diagram

Signal Cable Type Signal cable Description A LAN Cable Non-Shielded, 7m B TELECOM Cable Non-Shielded, 7m C D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded D Earphone & Microphone Cable Non-Shielded, 1.8m E USB Cable Shielded, 1.8m F 1394 Cable Shielded, 1.2m G USB Cable Shielded, 1.8m H USB Cable Shielded, 1.8m I TELECOM Cable Non-Shielded, 7m



1.5. EUT Exercise Software

1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of all equipment. 3 Notebook reads data from disk. 4 Data will be transmitting and receiving through EUT. 5 The transmitting and received status will be shown on the monitor. 6 Repeat the above procedure (4 ) to (5).



1.6. Test Facility

Ambient conditions in the laboratory:

Items Test Item Required (IEC 68-1) Actual

Temperature (°C) EN55022 CE 15-35 25

Humidity (%RH) 25-60 50

Barometric pressure (mbar) 860-1060 950-1000

Temperature (°C) EN55022 RE 15-35 25



Temperature (°C) IEC 61000-4-11 15-35 23











Barometric pressure (mbar) 860-1060 950-1000 Site Description: July 03, 2002 Accreditation on NVLAP NVLAP Lab Code: 200533-0 June 11, 2001 Accreditation on DNV Statement No. : 413-99-LAB11

April 18, 2001 Accreditation on Nemko Certificate No.: ELA 165 May 03,2001 Accreditation on TUV Rheinland Certificate No.: 10011438-1-2004 Site Name: Quietek Corporation Site Address: No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwa, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]

0914 ILAC MRA



2. Conducted Emission

2.1. Test Equipment List

The following test equipment are used during the conducted emission test:

Item Instrument Manufacturer Type No./Serial No Last Cal.. Remark

1 Test Receiver R & S ESCS 30/838251/001 Jan.,2005

2 L.I.S.N. R & S ESH3-Z5/836679/0023 May,2004 EUT

3 L.I.S.N. R & S ENV 4200/833209/0023 May,2004 Peripherals

4 Pulse Limiter R & S ESH3-Z2 May,2004

5 No.1 Shielded Room N/A

Note: All equipment upon which need to be calibrated are with calibration period of 1 year.

2.2. Test Setup



2.3. Limits

EN 55022:1998+A1: 2000 AC Mains Limits (dBuV)

Class A Class B Frequency

MHz QP AV QP AV

0.15 - 0.50 79 66 66-56 56-46

0.50-5.0 73 60 56 46

5.0 - 30 73 60 60 50

Remarks: In the above table, the tighter limit applies at the band edges

2.4. Test Procedure

AC Mains: The EUT and simulators are connected to the main power through a line impedance

stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm /50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.)

Both sides of AC line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed according to EN 55022:1998+A1: 2000 on conducted measurement. The bandwidth of the field strength meter (R & S Test Receiver ESCS 30) is set at 9kHz.

2.5. Uncertainty

The measurement uncertainty is defined as ± 2.02 dB

2.6. Test Specification

According to EN 55022:1998+A1:2000



2.7. Test Result

Product MEGA BOOK Test Mode Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/13 Test Site No.1 Shielded Room Test Condition Conducted Emission Test Range 0.15-30MHz

Frequency Cable LISN Reading Measurement Limits

Loss Factor Level Level MHz dB dB dBuV dBuV dBuV ============================================================== Line 1 Quasi-Peak * 0.228 0.13 0.10 48.77 49.00 62.52 0.267 0.14 0.10 40.09 40.33 61.20 0.338 0.16 0.10 37.04 37.30 59.26 1.330 0.27 0.11 36.51 36.89 56.00 4.818 0.36 0.17 31.87 32.40 56.00 15.775 0.45 0.37 34.89 35.71 60.00 Average * 0.228 0.13 0.10 39.10 39.33 52.52 0.267 0.14 0.10 29.50 29.74 51.21 0.338 0.16 0.10 25.20 25.46 49.25 1.330 0.27 0.11 30.20 30.58 46.00 4.818 0.36 0.17 20.70 21.23 46.00 15.775 0.45 0.37 29.70 30.52 50.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss.



Product MEGA BOOK Test Mode Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/13 Test Site No.1 Shielded Room Test Condition Conducted Emission Test Range 0.15-30MHz


Loss Factor Level Level MHz dB dB dBuV dBuV dBuV ============================================================== Line 2 Quasi-Peak * 0.240 0.14 0.10 47.65 47.89 62.10 0.334 0.16 0.10 34.78 35.04 59.36 1.326 0.26 0.11 38.11 38.49 56.00 1.775 0.29 0.12 33.30 33.71 56.00 3.353 0.33 0.15 32.32 32.81 56.00 17.087 0.46 0.39 37.09 37.94 60.00 Average 0.240 0.14 0.10 36.30 36.54 52.10 0.334 0.16 0.10 24.00 24.26 49.35 * 1.326 0.26 0.11 32.40 32.78 46.00 1.775 0.29 0.12 24.90 25.31 46.00 3.353 0.33 0.15 24.80 25.29 46.00 17.087 0.46 0.39 32.00 32.85 50.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss.



Product MEGA BOOK Test Mode Mode 7:Intel Pentium M 2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON)Date of Test 2005/01/07 Test Site No.1 Shielded Room Test Condition Conducted Emission Test Range 0.15-30MHz


Loss Factor Level Level MHz dB dB dBuV dBuV dBuV ============================================================== Line 1 Quasi-Peak * 0.201 0.12 0.10 47.98 48.20 63.58 0.267 0.14 0.10 41.61 41.85 61.20 0.466 0.19 0.10 40.83 41.12 56.58 0.728 0.22 0.10 38.21 38.53 56.00 15.005 0.45 0.35 32.95 33.74 60.00 25.099 0.49 0.53 34.86 35.88 60.00 Average 0.201 0.12 0.10 44.70 44.92 53.57 0.267 0.14 0.10 39.00 39.24 51.21 * 0.466 0.19 0.10 40.20 40.49 46.58 0.728 0.22 0.10 30.40 30.72 46.00 15.005 0.45 0.35 29.70 30.49 50.00 25.099 0.49 0.53 29.50 30.52 50.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss.



Product MEGA BOOK Test Mode Mode 7:Intel Pentium M

2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Date of Test 2005/01/07 Test Site No.1 Shielded Room Test Condition Conducted Emission Test Range 0.15-30MHz


Loss Factor Level Level MHz dB dB dBuV dBuV dBuV ============================================================== Line 2 Quasi-Peak 0.197 0.12 0.10 47.60 47.82 63.74 0.267 0.14 0.10 42.22 42.46 61.20 * 0.466 0.19 0.10 41.09 41.38 56.58 0.865 0.23 0.10 39.06 39.39 56.00 1.197 0.26 0.11 37.69 38.05 56.00 25.095 0.49 0.53 35.25 36.27 60.00 Average 0.197 0.12 0.10 44.60 44.82 53.74 0.267 0.14 0.10 39.30 39.54 51.21 * 0.466 0.19 0.10 40.30 40.59 46.58 0.865 0.23 0.10 38.50 38.83 46.00 1.197 0.26 0.11 37.00 37.36 46.00 25.095 0.49 0.53 29.60 30.62 50.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss.



2.8. Test Photo Test Mode ： Mode 2:Intel Pentium M

1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Front View of Conducted Test - Mode 2

Test Mode ： Mode 2:Intel Pentium M

1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Back View of Conducted Test - Mode 2




2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Front View of Conducted Test - Mode 7


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Back View of Conducted Test - Mode 7



3. Impedance Stabilization Network


The following test equipment are used during the conducted emission test:

Item Instrument Manufacturer Type No./Serial No Last Cal.. Remark

1 Test Receiver R & S ESCS 30/838251/001 Jan.,2005

2 L.I.S.N. R & S ESH3-Z5/836679/0023 May,2004 EUT

3 L.I.S.N. R & S ENV 4200/833209/0023 May,2004 Peripherals

4 Pulse Limiter R & S ESH3-Z2 May,2004

5 ISN SCHAFFNER T400/19099 Apr.,2004

6 Voltage Probe SCHAFFNER CVP 2200A/18331 Apr.,2004

7 RF Current Probe FCC F-65/199 Apr.,2004



3.2. Test Setup



3.3. Limits

Telecommunication ports EN 55022:1998+A1: 2000

Telecommunication ports Limits dB(uV)

Limit for conducted emissions from telecommunication ports of equipment intended for use in

telecommunication centers only

Limit for conducted emissions from

telecommunication ports Frequency

MHz

QP AV QP AV

0.15 – 0.50 97-87 84-74 84-74 74-64

0.5 – 30 87 74 74 64

Remarks: In the above table, the tighter limit applies at the band edges.

3.4. Test Procedure

Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of

telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is used for alternative one.

.

3.5. Uncertainty



According to EN 55022:1998+A1: 2000



3.7. Test Result

Product MEGA BOOK Test Mode Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/19 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network (LAN) Test Range 0.15-30MHz


Loss Factor Level Level MHz dB dB dBuV dBuV dBuV ============================================================== 100Mbps Quasi-Peak 1.334 0.27 9.50 47.28 57.05 74.00 5.236 0.37 9.50 49.40 59.27 74.00 10.795 0.42 9.50 52.46 62.38 84.00 16.228 0.45 9.50 56.50 66.45 84.00 * 23.127 0.48 9.50 60.42 70.40 84.00 26.486 0.49 9.50 57.10 67.09 84.00 Average 1.334 0.27 9.50 47.00 56.77 64.00 5.236 0.37 9.50 47.00 56.87 64.00 10.795 0.42 9.50 50.20 60.12 74.00 16.228 0.45 9.50 55.40 65.35 74.00 * 23.127 0.48 9.50 57.70 67.68 74.00 26.486 0.49 9.50 54.40 64.39 74.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss.



Product MEGA BOOK Test Mode Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/19 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network (LAN) Test Range 0.15-30MHz


Loss Factor Level Level MHz dB dB dBuV dBuV dBuV ============================================================== 10Mbps Quasi-Peak 1.138 0.25 9.50 46.04 55.79 74.00 * 10.002 0.42 9.50 64.69 74.61 84.00 10.634 0.42 9.50 55.21 65.13 84.00 12.498 0.43 9.50 62.92 72.85 84.00 15.002 0.45 9.50 47.87 57.82 84.00 16.248 0.45 9.50 38.50 48.45 84.00 Average 1.138 0.25 9.50 46.00 55.75 74.00 * 10.002 0.42 9.50 62.69 72.61 74.00 10.634 0.42 9.50 55.01 64.93 84.00 12.498 0.43 9.50 62.90 72.83 84.00 15.002 0.45 9.50 47.80 57.75 84.00 16.248 0.45 9.50 38.00 47.95 74.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss.



Product MEGA BOOK Test Mode Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2005/01/11 Test Site No.1 Shielded Room Test Condition Impedance Stabilization Network (Telecom) Test Range 0.15-30MHz


Loss Factor Level Level MHz dB dB dBuV dBuV dBuV ============================================================== 100Mbps Quasi-Peak 0.349 0.16 9.50 51.36 61.02 76.99 0.560 0.20 9.50 43.94 53.64 74.00 0.990 0.24 9.50 41.79 51.53 74.00 * 2.048 0.30 9.50 52.35 62.15 74.00 4.732 0.36 9.50 36.22 46.08 74.00 7.244 0.39 9.50 23.56 33.45 74.00 Average 0.349 0.16 9.50 48.20 57.86 66.99 0.560 0.20 9.50 41.90 51.60 64.00 0.990 0.24 9.50 41.10 50.84 64.00 * 2.048 0.30 9.50 52.00 61.80 64.00 4.732 0.36 9.50 28.00 37.86 64.00 7.244 0.39 9.50 20.60 30.49 64.00 Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + LISN Factor + Cable loss.




1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Front View of ISN Test


1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Back View of ISN Test



4. Radiated Emission


The following test equipment are used during the radiated emission test:

Test Site Equipment Manufacturer Model No./Serial No. Last Cal.

Test Receiver R & S ESCS 30 / 100122 Feb.,2004

Spectrum

Analyzer

Advantest R3162 / 120300652 Feb.,2004

Bilog Antenna SCHAFFNER CBL6112B / 2697 May,2004

OATS 3

Pre-Amplifier QTK QTK-AMP-01 / 0001 Jul.,2004

Note: 1. All equipments that need to be calibrate are with calibration period of 1 year. 2. Mark “X” test instruments are used to measure the final test results.

4.2. Test Setup



4.3. Limits

EN 55022: 1998+A1: 2000 Limits (dBuV/m)

Class A Class B Frequency

MHz Distance (m) dBuV/m Distance

(m) dBuV/m

30 – 230 10 40 10 30

230 – 1000 10 47 10 37

Remarks: In the above table, the tighter limit applies at the band edges.

4.4. Test Procedure

The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated according to EN 55022: 1998+A1: 2000 on radiated measurement. Radiated emissions were investigated over the frequency range from 30MHz to1GHz using a receiver bandwidth of 120kHz. Radiated measurement was performed at an antenna to EUT distance of 10 meters.

4.5. Uncertainty



According to EN 55022: 1998+A1: 2000



4.7. Test Result

Product MEGA BOOK Test Mode Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/10 Test Site OATS 3 Test Condition Radiated Emission Test Range 30-1000MHz

Freq. Cable Probe PreAMP Reading Measurement Margin Limit

Loss Factor Level Level MHz dB dB/m dB dBuV dBuV/m dB dBuV/m ============================================================= Horizontal: 150.008 1.49 10.32 0.00 6.35 18.16 11.84 30.00 166.580 1.57 9.09 0.00 10.49 21.15 8.85 30.00 200.136 1.74 8.40 0.00 9.96 20.10 9.90 30.00 360.025 2.57 13.68 0.00 7.75 24.01 12.99 37.00 401.350 2.78 14.76 0.00 6.38 23.93 13.07 37.00 * 600.057 3.80 17.65 0.00 8.71 30.16 6.84 37.00

840.068 5.04 19.33 0.00 4.64 29.01 7.99 37.00 Note:

1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary.

2. “ * ”, means this data is the worst emission level. 3. Measurement Level = Reading Level + Probe Factor + Cable Loss.



Product MEGA BOOK Test Mode Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/10 Test Site OATS 3 Test Condition Radiated Emission Test Range 30-1000MHz


Loss Factor Level Level MHz dB dB/m dB dBuV dBuV/m dB dBuV/m ========================================================== Vertical: 132.220 1.39 10.59 0.00 5.97 17.96 12.04 30.00 150.000 1.49 9.13 0.00 9.37 19.99 10.01 30.00 * 165.932 1.57 8.42 0.00 15.01 25.00 5.00 30.00 199.980 1.74 8.40 0.00 10.62 20.76 9.24 30.00 250.000 2.00 11.86 0.00 6.32 20.18 16.82 37.00 600.057 3.80 19.54 0.00 6.17 29.52 7.48 37.00 666.550 4.14 17.63 0.00 8.49 30.26 6.74 37.00 995.800 5.85 19.97 0.00 2.51 28.32 8.68 37.00

Note:






2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Date of Test 2005/01/05 Test Site OATS 3 Test Condition Radiated Emission Test Range 30-1000MHz


Loss Factor Level Level MHz dB dB/m dB dBuV dBuV/m dB dBuV/m ============================================================= Horizontal: 108.840 1.28 11.87 0.00 4.06 17.21 12.79 30.00 132.980 1.40 11.49 0.00 6.30 19.19 10.81 30.00 166.440 1.57 9.09 0.00 7.18 17.84 12.16 30.00 * 200.000 1.74 8.40 0.00 12.16 22.30 7.70 30.00 360.036 2.58 13.68 0.00 4.22 20.48 16.52 37.00 480.029 3.19 16.70 0.00 8.30 28.19 8.81 37.00 532.970 3.47 16.62 0.00 1.54 21.63 15.37 37.00 600.062 3.81 17.65 0.00 7.39 28.85 8.15 37.00 840.086 5.04 19.33 0.00 1.62 26.00 11.00 37.00

Note:






2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Date of Test 2005/01/05 Test Site OATS 3 Test Condition Radiated Emission Test Range 30-1000MHz


Loss Factor Level Level MHz dB dB/m dB dBuV dBuV/m dB dBuV/m ========================================================== Vertical: 108.620 1.28 10.65 0.00 9.62 21.55 8.45 30.00 132.700 1.40 10.55 0.00 11.90 23.85 6.15 30.00 152.040 1.51 9.18 0.00 7.20 17.89 12.11 30.00 180.015 1.64 8.41 0.00 8.71 18.76 11.24 30.00 200.000 1.74 8.40 0.00 10.68 20.82 9.18 30.00 300.031 2.26 12.06 0.00 3.60 17.92 19.08 37.00 499.100 3.30 16.34 0.00 1.12 20.75 16.25 37.00 531.630 3.45 17.17 0.00 5.34 25.96 11.04 37.00 * 666.485 4.14 17.63 0.00 9.40 31.17 5.83 37.00 798.620 4.83 19.34 0.00 3.76 27.93 9.07 37.00

Note:






1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Front View of Radiated Test- Mode 2


1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Back View of Radiated Test- Mode 2




2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Front View of Radiated Test- Mode 7


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Back View of Radiated Test- Mode 7



5. Power Harmonics


Item Instrument Manufacturer Type No/Serial No. Last Calibration

1 Power Harmonics Tester

SCHAFFNER Profline 2105-400

S/N: HK54148

Feb.,2004

2 Analyzer SCHAFFNER CCN 1000-1/X71887 Feb.,2004



5.2. Test Setup



5.3. Limits

Limits of Class A Harmonics Currents Harmonics

Order

n

Maximum Permissible harmonic current

A

Harmonics Order

n


A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 ≤ n ≤ 40 0.23 * 8/n

11 0.33

13 0.21

15 ≤ n ≤ 39 0.15 * 15/n

Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table which is the limit of Class A multiplied by a factor of 1.5.

Limits of Class C Harmonics Currents Harmonics Order

n

Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency

％

2 2

3 30．λ＊

5 10

7 7

9 5

11 ≤ n ≤ 39 (odd harmonics only)

3

＊λ is the circuit power factor



Limits of Class D Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current per watt

mA/W


A 3 3.4 2.30

5 1.9 1.14

7 1.0 0.77

9 0.5 0.40

11 0.35 0.33

11 ≤ n ≤ 39 (odd harmonics only)

3.85/n See limit of Class A

5.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.

5.5. Uncertainty

The measurement uncertainty is defined as ± 3.23 %


According to EN 61000-3-2:2000



5.7. Test Result

Date of Test 2005/01/07 Test Site No.3 Shielded Room

Test Mode Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN)

Product MEGA BOOK

Test Condition Power Harmonics Test Range

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-3-2-10123

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.00

0.05

0.10

0.15

0.20

0.25

0.30

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #0 with 0.00% of the limit.



Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test:

V_RMS (Volts): 229.85 Frequency(Hz): 50.00 I_Peak (Amps): 2.915 I_RMS (Amps): 0.639 I_Fund (Amps): 0.272 Crest Factor: 4.564 Power (Watts): 62 Power Factor: 0.422

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.004 3 0.259 0.211 0.0 0.261 0.316 0.00 Pass 4 0.004 5 0.247 0.118 0.0 0.249 0.177 0.00 Pass 6 0.004 7 0.230 0.062 0.0 0.232 0.093 0.00 Pass 8 0.004 9 0.209 0.031 0.0 0.211 0.046 0.00 Pass 10 0.005 11 0.184 0.022 0.0 0.187 0.033 0.00 Pass 12 0.005 13 0.158 0.019 0.0 0.160 0.028 0.00 Pass 14 0.004 15 0.132 0.016 0.0 0.133 0.024 0.00 Pass 16 0.004 17 0.106 0.014 0.0 0.107 0.021 0.00 Pass 18 0.004 19 0.081 0.013 0.0 0.083 0.019 0.00 Pass 20 0.003 21 0.060 0.011 0.0 0.061 0.017 0.00 Pass 22 0.003 23 0.042 0.010 0.0 0.043 0.016 0.00 Pass 24 0.002 25 0.030 0.010 0.0 0.030 0.014 0.00 Pass 26 0.002 27 0.022 0.009 0.0 0.023 0.013 0.00 Pass 28 0.002 29 0.020 0.008 0.0 0.020 0.012 0.00 Pass 30 0.001 31 0.019 0.008 0.0 0.020 0.012 0.00 Pass 32 0.001 33 0.019 0.007 0.0 0.019 0.011 0.00 Pass 34 0.001 35 0.017 0.007 0.0 0.017 0.010 0.00 Pass 36 0.001 37 0.014 0.006 0.0 0.015 0.010 0.00 Pass 38 0.001 39 0.011 0.006 0.0 0.011 0.009 0.00 Pass 40 0.001

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same

window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W.

Others the result should be pass.



Date of Test 2005/01/07 Test Site No.3 Shielded Room Test Mode Mode 7:Intel Pentium M

2.13GHz(533),LCD+CRT(1208*800/60Hz), Adapter(LITEON)

Product MEGA BOOK

Test Condition

Power Harmonics Test Range

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-6-4-20246

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.00

0.05

0.10

0.15

0.20

0.25

0.30

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #0 with 0.00% of the limit.



Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(pk%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test:

V_RMS (Volts): 229.86 Frequency(Hz): 50.00 I_Peak (Amps): 3.420 I_RMS (Amps): 0.688 I_Fund (Amps): 0.268 Crest Factor: 5.143 Power (Watts): 61 Power Factor: 0.388

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.005 3 0.257 0.208 0.0 0.259 0.312 0.00 Pass 4 0.005 5 0.248 0.116 0.0 0.251 0.174 0.00 Pass 6 0.006 7 0.237 0.061 0.0 0.239 0.092 0.00 Pass 8 0.006 9 0.222 0.031 0.0 0.224 0.046 0.00 Pass 10 0.006 11 0.204 0.021 0.0 0.206 0.032 0.00 Pass 12 0.007 13 0.184 0.018 0.0 0.186 0.027 0.00 Pass 14 0.007 15 0.163 0.016 0.0 0.165 0.024 0.00 Pass 16 0.007 17 0.141 0.014 0.0 0.142 0.021 0.00 Pass 18 0.006 19 0.119 0.012 0.0 0.120 0.019 0.00 Pass 20 0.006 21 0.098 0.011 0.0 0.099 0.017 0.00 Pass 22 0.005 23 0.078 0.010 0.0 0.078 0.015 0.00 Pass 24 0.004 25 0.059 0.009 0.0 0.060 0.014 0.00 Pass 26 0.004 27 0.043 0.009 0.0 0.043 0.013 0.00 Pass 28 0.003 29 0.029 0.008 0.0 0.029 0.012 0.00 Pass 30 0.002 31 0.018 0.008 0.0 0.018 0.011 0.00 Pass 32 0.001 33 0.010 0.007 0.0 0.010 0.011 0.00 Pass 34 0.001 35 0.008 0.007 0.0 0.008 0.010 0.00 Pass 36 0.001 37 0.009 0.006 0.0 0.009 0.010 0.00 Pass 38 0.001 39 0.011 0.006 0.0 0.011 0.009 0.00 Pass 40 0.001

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same

window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W.

Others the result should be pass.




1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Power Harmonics Test Setup -Mode 2


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Power Harmonics Test Setup -Mode 7



6. Voltage Fluctuation and Flicker



1 EMCPRO PLUS KeyTek EMC Immunity Feb.,2004

2 No.6 Shielded Room


6.2. Test Setup



6.3. Limits

Voltage Fluctuations and Flicker: The following limits apply: － the value of Pst shall not be greater than 1.0; － the value of P1t shall not be greater than 0.65; － the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500 ms; － the relative steady-state voltage change, dc, shall not exceed 3.3 ％; － the maximum relative voltage change, dmax, shall not exceed;

a) 4 ％ without additional conditions; b) 6 ％ for equipment which is:

－ switched manually, or － switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption.

NOTE The cycling frequency will be further limited by the Pst and P1t limit. For example: a dmax of 6％producing a rectangular voltage change characteristic twice per hour will give a P1t of about 0.65.

c) 7 ％ for equipment which is: － attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or － switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption. Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.

6.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.

6.5. Uncertainty



According to EN 61000-3-3:1995+A1:2001



6.7. Test Result


1.6GHz(400),LCD+CRT(1208*800/60Hz), Adapter(LI SHIN)

Product MEGA BOOK

Test Condition Flicker Test Range

Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.00

0.25

0.50

0.75

1.00

Pst

12:07:40

Time is too short for Plt plot

Parameter values recorded during the test:

Vrms at the end of test (Volt): 229.73

Highest dt (%): 0.00 Test limit (%): 3.30 Pass

Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass

Highest dc (%): 0.00 Test limit (%): 3.30 Pass

Highest dmax (%): 0.00 Test limit (%): 4.00 Pass

Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass

Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass




2.13GHz(533),LCD+CRT(1208*800/60Hz), Adapter(LITEON)

Product MEGA BOOK

Test Condition

Flicker Test Range

Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.00

0.25

0.50

0.75

1.00

Pst

3:02:50

Time is too short for Plt plot

Parameter values recorded during the test:

Vrms at the end of test (Volt): 229.71

Highest dt (%): 0.00 Test limit (%): 3.30 Pass

Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass

Highest dc (%): 0.00 Test limit (%): 3.30 Pass

Highest dmax (%): 0.00 Test limit (%): 4.00 Pass

Highest Pst (10 min. period): 0.001 Test limit: 1.000 Pass

Highest Plt (2 hr. period): 0.001 Test limit: 0.650 Pass




1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Flicker Test Setup -Mode 2


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Flicker Test Setup -Mode 7



7. Electrostatic Discharge (ESD)



1 ESD Simulator System SCHAFFNER NSG 438,S/N:167 Mar.,2004

2 Horizontal Coupling Plane(HCP)

QuieTek HCP AL50 N/A

3 Vertical Coupling Plane(VCP)

QuieTek VCP AL50 N/A



7.2. Test Setup



7.3. Limits

Item Environmental Phenomena

Units Test Specification Performance Criteria

Enclosure Port Electrostatic Discharge Kv (Charge Voltage) ±8 Air Discharge

±4 Contact Discharge B

Remark: The Contact discharges were applied – at least total 200 discharges at a minimum of four test points.

7.4. Test Procedure

Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT.

Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point.

7.5. Uncertainty



According to IEC 61000-4-2:1995 +A1:1998+A2:2000



7.7. Test Result

Product MEGA BOOK Test Mode Mode 2:Intel Pentium M 1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI

SHIN) Date of Test 2004/11/22 Test Site No.3 Shielded Room Test Condition Electrostatic Discharge Test Range

Item Amount of Discharge

Voltage Required Criteria

Complied To Criteria (A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

B

A

Pass

Pass

Contact Discharge 25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(HCP)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass Note:

The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.

NR: No Requirement

Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.

Remark:

The Contact discharges were applied at least total 200 discharges at a minimum of four test points.




2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Date of Test 2005/01/06 Test Site No.3 Shielded Room Test Condition Electrostatic Discharge Test Range

Item Amount of Discharge

Voltage Required Criteria


Results

Air Discharge 10

10

+8kV

-8kV

B

B

B

A

Pass

Pass

Contact Discharge 25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(HCP)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.

NR: No Requirement


EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.

Remark:

The Contact discharges were applied at least total 200 discharges at a minimum of four test points.




1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： ESD Test Setup -Mode 2


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： ESD Test Setup -Mode 7



8. Radiated Susceptibility (RS)


The following test equipment are used during the test: Item Equipment Manufacturer Model No. / Serial No. Last Cal.

1 Signal Generator R & S SYM02 / 825454/029 Jan.,2005

2 Power Amplifier A & R 100W10000M7 / A285000010

N/A

3 RF Power Amplifier OPHIRRF 5022F / 1075 N/A

4 Bilog Antenna Chase CBL6112B / 2452 Sep.,2004

5 Power Meter R & S NRVD / 100219 Sep.,2004

6 Directional Coupler A & R DC6180 / 22735 Feb.,2004

7 No.2 EMC Fully Chamber Jul.,2004

Note: All equipment upon which need to calibrated are with calibration period of 1 year.

8.2. Test Setup



8.3. Limits


Units Test Specification

Performance Criteria

Enclosure Port

Radio-Frequency Electromagnetic Field Amplitude Modulated

MHz V/m(Un-modulated, rms) % AM (1kHz)

80-1000 3 80

A

8.4. Test Procedure

The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and six sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.

All the scanning conditions are as follows: Condition of Test Remarks

1. Field Strength 3 V/M Level 2

2. Radiated Signal AM 80% Modulated with 1kHz

3. Scanning Frequency 80MHz - 1000MHz

4 Dwell Time 3 Seconds

5. Frequency step size ∆ f : 1%

6. The rate of Swept of Frequency 1.5 x 10-3 decades/s

8.5. Uncertainty



According to IEC 61000-4-3:1995+A1:1998+A2:2000



8.7. Test Result


1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2005/01/06 Test Site Chamber2 Test Condition Radiated Susceptibility Test Range 80-1000MHz

Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength (V/m)

Required Criteria


Results

80-1000 FRONT H 3 A A PASS

80-1000 FRONT V 3 A A PASS

80-1000 REAR H 3 A A PASS

80-1000 REAR V 3 A A PASS

80-1000 RIGHT H 3 A A PASS

80-1000 RIGHT V 3 A A PASS

80-1000 LEFT H 3 A A PASS

80-1000 LEFT V 3 A A PASS

80-1000 TOP H 3 A A PASS

80-1000 TOP V 3 A A PASS

80-1000 BOTTOM H 3 A A PASS

80-1000 BOTTOM V 3 A A PASS



There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz. No false alarms or other malfunctions were observed during or after the test.



Product MEGA BOOK Test Mode Mode 7:Intel Pentium M 2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON)Date of Test 2004/11/14 Test Site Chamber2 Test Condition Radiated Susceptibility Test Range 80-1000MHz

Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength (V/m)

Required Criteria


Results

80-1000 FRONT H 3 A A PASS

80-1000 FRONT V 3 A A PASS

80-1000 REAR H 3 A A PASS

80-1000 REAR V 3 A A PASS

80-1000 RIGHT H 3 A A PASS

80-1000 RIGHT V 3 A A PASS

80-1000 LEFT H 3 A A PASS

80-1000 LEFT V 3 A A PASS

80-1000 TOP H 3 A A PASS

80-1000 TOP V 3 A A PASS

80-1000 BOTTOM H 3 A A PASS

80-1000 BOTTOM V 3 A A PASS



There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz. No false alarms or other malfunctions were observed during or after the test.




1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Radiated Susceptibility Test Setup -Mode 2


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Radiated Susceptibility Test Setup -Mode 7



9. Electrical Fast Transient/Burst (EFT/B)



1 Fast Transient/Burst Generator

SCHAFFNER NSG 2050 S/N: 200124-031AR

Jun.,2004



9.2. Test Setup



9.3. Limits



Signal Ports and Telecommunication Ports Fast Transients

Common Mode kV (Peak) Tr/Ts ns Rep. Frequency kHz

±0.5 5/50 5

B

Input DC Power Ports Fast Transients


±0.5 5/50 5

B

Input AC Power Ports Fast Transients


±1 5/50 5

B

9.4. Test Procedure

The EUT and load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. For Signal Ports and Telecommunication Ports:

The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1min.

For Input DC and AC Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 min. The length of power cord between the coupling device and the EUT shall be 1m.


According to IEC 61000-4-4:1995+A1: 2000+A2: 2001



9.6. Test Result


1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/14 Test Site No.6 Shielded Room Test Condition Electrical Fast Transient/Burst Test Range

Inject Line

Polarity Voltage

kV

Inject Time

(Second)

Inject Method

Required Criteria

Complied to Criteria Result

L ± 1kV 60 CDN B A PASS

N ± 1kV 60 CDN B A PASS

PE ± 1kV 60 CDN B A PASS

L-N ± 1kV 60 CDN B A PASS

L-PE ± 1kV 60 CDN B A PASS

N-PE ± 1kV 60 CDN B A PASS

L+N+PE ± 1kV 60 CDN B A PASS

LAN ± 0.5kV 90 Clamp B A PASS

Telecom ± 0.5kV 90 Clamp B B PASS


Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV of Line .

No false alarms or other malfunctions were observed during or after the test.




2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Date of Test 2005/01/06 Test Site No.6 Shielded Room Test Condition Electrical Fast Transient/Burst Test Range

Inject Line

Polarity Voltage

kV

Inject Time

(Second)

Inject Method

Required Criteria


L ± 1kV 60 CDN B B PASS

N ± 1kV 60 CDN B B PASS

PE ± 1kV 60 CDN B B PASS

L-N ± 1kV 60 CDN B B PASS

L-PE ± 1kV 60 CDN B B PASS

N-PE ± 1kV 60 CDN B B PASS

L+N+PE ± 1kV 60 CDN B B PASS

LAN ± 0.5kV 90 Clamp B A PASS

Telecom ± 0.5kV 90 Clamp B A PASS








1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： EFT/B Test Setup -Mode 2


1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： EFT/B Test Setup -Mode 2-Clamp




2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： EFT/B Test Setup -Mode 7


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： EFT/B Test Setup -Mode 7-Clamp



10. Surge



1 EMCPRO PLUS SchaHner EMC Immunity Nov.,2004



10.2. Test Setup



10.3. Limits



Signal Ports and Telecommunication Ports (See 1) and 2)) Surges

Line to Ground Tr/Ts uS kV

1.2/50 (8/20) ± 1 B

Input DC Power Ports Surges

Line to Ground Tr/Ts uS kV

1.2/50 (8/20) ± 0.5 B

AC Input and AC Output Power Ports Surges

Line to Line Line to Ground

Tr/Ts uS kV kV

1.2/50 (8/20) ± 1 ± 2

B

Notes: 1) Applicable only to ports which according to the manufacturer’s may directly to outdoor

cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the

EUT,no test shall be required.

10.4. Test Procedure

The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports:

The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min.

10.5. Uncertainty



According to IEC 61000-4-5:1995+A1:2000



10.7. Test Result


1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/14 Test Site No.6 Shielded Room Test Condition Surge Test Range

Inject Line

Polarity AngleVoltage

kV

Time Interval

(Second)

Inject Method

Required Criteria


L-N ± 0 1kV 60 Direct B A PASS




L-PE ± 0 2kV 60 Direct B A PASS




N-PE ± 0 2kV 60 Direct B A PASS











2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Date of Test 2005/01/07 Test Site No.6 Shielded Room Test Condition Surge Test Range

Inject Line

Polarity AngleVoltage

kV

Time Interval

(Second)

Inject Method

Required Criteria


L-N ± 0 0.5kV 60 Direct B A PASS



















1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： SURGE Test Setup-Mode 2


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： SURGE Test Setup-Mode 7



11. Conducted Susceptibility (CS)


The following test equipment are used during the test: Item Equipment Manufacturer Model No. / Serial No. Last Cal.

1 Signal Generator R & S SYM01 / 10065 Jan.,2005

2 Power Amplifier A & R 150A220 / 23076 N/A

3 Power Meter HP EPM-4418A / GB37482040 Feb.,2004

4 Power Sensor Agilent 8482A / MY41091031 Aug.,2004

5 Directional Coupler A & R DC2600 / 23325 Feb.,2004

6 CDN Lüthi CDN L-801 M1 / 2047 Jun.,2004

7 CDN Lüthi CDN L-801 M2/M3 / 2043 Jun.,2004

8 FIXED PAD TRILITHIC HFP-525-3/6-NF/NF / N/A N/A

9 EM Clamp Lüthi EM101 / 3552C Apr.,2004

10 No.2 EMC Fully Chamber N/A

Note: All equipment upon which need to calibrated are with calibration period of 1 year.

11.2. Limits



11.3. Limits



Signal Ports and Telecommunication Ports Radio-Frequency

Continuous Conducted

MHz V (rms, Un-modulated) % AM (1kHz)

0.15-80 3 80

A

Input DC Power Ports Radio-Frequency



0.15-80 3 80

A

Input AC Power Ports Radio-Frequency



0.15-80 3 80

A




The EUT are placed on a table that is 0.8 meter height, and a ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and ground reference plane. For Signal Ports and Telecommunication Ports

The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT.

For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires.

All the scanning conditions are as follows:

Condition of Test Remarks

1. Field Strength 130dBuV(3V) Level 2

2. Radiated Signal AM 80% Modulated with 1kHz

3. Scanning Frequency 0.15MHz – 80MHz

4 Dwell Time 3 Seconds

5. Frequency step size ∆ f : 1%

6. The rate of Swept of Frequency 1.5 x 10-3 decades/s

.

11.5. Uncertainty






11.7. Test Result


1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/22 Test Site Chamber2 Test Condition Conducted Susceptibility Test Range 0.15-80MHz

Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port of

EUT

Required

Criteria

Performance

Criteria Complied

To

Result

0.15~80 130 (3V) CDN AC IN A A PASS

0.15~80 130 (3V) Clamp LAN A A PASS

0.15~80 130 (3V) Clamp Telecom A A PASS



EUT stopped operation and could / could not be reset by operator at dBuV(V) at frequency MHz.

No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.




2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Date of Test 2005/01/06 Test Site Chamber2 Test Condition Conducted Susceptibility Test Range 0.15-80MHz

Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port of

EUT

Required

Criteria

Performance

Criteria Complied

To

Result

0.15~80 130 (3V) CDN AC IN A A PASS

0.15~80 130 (3V) Clamp LAN A A PASS

0.15~80 130 (3V) Clamp Telecom A A PASS



EUT stopped operation and could / could not be reset by operator at dBuV(V) at frequency MHz.





1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Conducted Susceptibility Test Setup -Mode 2


1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Conducted Susceptibility Test Setup -Mode 2-Clamp




2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Conducted Susceptibility Test Setup -Mode 7


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Conducted Susceptibility Test Setup -Mode 7-Clamp



12. Power Frequency Magnetic Field



1 Power Line Maganetics SCHAFFNER INA 2141 S/N: 6002

Jun.,2004

2 Gauss Meter F.W.BELL 4090 Jun.,2004

3 Magnetic Field Coil SCHAFFNER INA702 S/N: 199749-020 IN

Jun.,2004



12.2. Test Setup



12.3. Limits



Enclosure Port

Power-Frequency Magnetic Field

Hz A/m (r.m.s.)

50 1

A


The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90° in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations).

12.5. Uncertainty






12.7. Test Result


1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/14 Test Site No.3 Shielded Room Test Condition Power Frequency Magnetic Field Test Range

Polarization Frequency (Hz)

Magnetic Strength (A/m)

Required Performance

Criteria


Complied To

Test Result

X Orientation 50 1 A A PASS

Y Orientation 50 1 A A PASS

Z Orientation 50 1 A A PASS


EUT stopped operation and could / could not be reset by operator at kV of

Line . No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were

met, and the EUT passed the test.




2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Date of Test 2005/01/06 Test Site No.3 Shielded Room Test Condition Power Frequency Magnetic Field Test Range

Polarization Frequency (Hz)

Magnetic Strength (A/m)


Criteria


Complied To

Test Result

X Orientation 50 1 A A PASS

Y Orientation 50 1 A A PASS

Z Orientation 50 1 A A PASS


EUT stopped operation and could / could not be reset by operator at kV of

Line . No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were

met, and the EUT passed the test.




1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Power Frequency Magnetic Field Test Setup -Mode 2


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Power Frequency Magnetic Field Test Setup -Mode 7



13. Voltage Dips and Interruption Measurement



1 EMCPRO PLUS KeyTek EMC Immunity Nov.,2004



13.2. Test Setup



13.3. Limits



Input AC Power Ports

Voltage Dips >95 0.5

% Reduction Period

B

30 25

% Reduction Periods

C

Voltage Interruptions > 95 250

% Reduction Periods

C


The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test:

The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms, for 60% voltage dip of supplied voltage and duration 100ms with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 5000ms with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 0O, 45O, 90O, 135O, 180O, 225O, 270O, 315O

of the voltage.

13.5. Uncertainty






13.7. Test Result


1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Date of Test 2004/11/14 Test Site No.6 Shielded Room Test Condition Voltage Dips and Interruption Measurement Test Range

Voltage Dips and Interruption

Reduction(%)

Angle Test Duration (Periods)


Criteria


Complied To

Test Result

>95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS


The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV of

Line .





2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Date of Test 2005/01/07 Test Site No.6 Shielded Room Test Condition Voltage Dips and Interruption Measurement Test Range

Voltage Dips and Interruption

Reduction(%)

Angle Test Duration (Periods)


Criteria


Complied To

Test Result

>95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS 30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 250 C A PASS >95(0V) 45 250 C A PASS >95(0V) 90 250 C A PASS >95(0V) 135 250 C A PASS >95(0V) 180 250 C A PASS >95(0V) 225 250 C A PASS >95(0V) 270 250 C A PASS >95(0V) 315 250 C A PASS


The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV of

Line .





1.6GHz(400),LCD+CRT(1208*800/60Hz),Adapter(LI SHIN) Description： Voltage Dips Test Setup -Mode 2


2.13GHz(533),LCD+CRT(1208*800/60Hz),Adapter(LITEON) Description： Voltage Dips Test Setup -Mode 7



Attachement

EUT Photograph

(1) EUT Photo

(2) EUT Photo



(3) EUT Photo

(4) EUT Photo



(5) EUT Photo

(6) EUT Photo



(7) EUT Photo

(8) EUT Photo



(9) EUT Photo

(10) EUT Photo



(11) EUT Photo

(12) EUT Photo



(13) EUT Photo

(14) EUT Photo



(15) EUT Photo

(16) EUT Photo



Reference : Laboratory of License

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