yole st l3g3250 3-axis gyroscope april 2012 sample
TRANSCRIPT
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2012 by SYSTEM PLUS CONSULTING, all rights reserved. STMicro L3G3250A 3-Axis MEMS Gyroscope 1
9 rue Alfred Kastler - BP 10748 - 44307 Nantes Cedex 3 - France
Phone : +33 (0) 240 180 916 - email : [email protected] - website : www.systemplus.fr
April 2012 - Version 1
Written by: Romain FRAUX
DISCLAIMER : System Plus Consulting provides cost studies based on its knowledge of the manufacturing and selling prices of electronic components and systems. The given values are realistic
estimates which do not bind System Plus Consulting nor the manufacturers quoted in the report. System Plus Consulting is in no case responsible for the consequences related to the use which is
made of the contents of this report. The quoted trademarks are property of their owners.
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Table of Contents
Glossary
1. Overview / Introduction............4 Executive Summary Reverse Costing Methodology
2. STMicroelectronics Company Profile..........6 ST Profile ST key fabs, assembly and R&D locations ST MEMS Gyroscopes Portfolio L3G3250A Characteristics ST Business Model
3. L3G3250A Physical Analysis..................13 Physical Analysis Methodology Package Characteristics & Markings Package Pin-Out Package X-Ray Package Cross-Section Package Opening ASIC Dimensions ASIC Markings ASIC Cross-Section ASIC Process Characteristics MEMS Dimensions MEMS Markings MEMS Bond Pads Opening MEMS Bond Pads MEMS Cap Opening MEMS Cap MEMS Sensing Area MEMS Cross-section MEMS Process Characteristics Physical Data Summary
4. Manufacturing Process Flow...59 Global Overview ASIC Process Flow Description of the ASIC Wafer Fabrication Unit MEMS Process Overview MEMS Sensor Process Flow MEMS Cap Process Flow MEMS Wafer Bonding Process Flow Description of the MEMS Wafer Fabrication Unit
5. Cost Analysis.....75 Synthesis of the Cost Analysis Main Steps of Economic Analysis Yields Explanation Yields Hypotheses Die per wafer & Probe Test ASIC Front-End : Hypotheses ASIC Front-End Cost ASIC Back-End 0 : Probe Test, Backgrinding & Dicing ASIC Dies Cost MEMS Front-End : Hypotheses MEMS Front-End Cost MEMS Front-End Cost per Process Steps MEMS Front-End : Equipment Cost per Family MEMS Front-End : Material Cost per Family MEMS Back-End 0 : Probe Test & Dicing MEMS Die Cost (Front End + Back End 0) Back-End 1 : Packaging Cost Back-End 1 : Final test & Calibration Cost L3G3250A Component Cost (FE + BE 0 + BE 1)
6. Estimated Price Analysis..........100 Definition of Prices Manufacturer Financial Ratios L3G3250A Estimated Manufacturer Price L3G3250A Estimated Selling Price
Contact.......107
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2012 by SYSTEM PLUS CONSULTING, all rights reserved. STMicro L3G3250A 3-Axis MEMS Gyroscope 3
Executive Summary
This full reverse costing study has been conducted to provide insight on technology
data, manufacturing cost and selling price of the STMicroelectronics L3G3250A
component.
The L3G3250A is a 3-axis MEMS gyroscope manufactured using a surface
micromachining process (THELMA process).
It is suitable for further applications:
Gaming and virtual reality input devices
Motion control with MMI (man-machine interface)
GPS navigation systems
Appliances and robotics
Compatible with SMD process, the L3G3250A is provided in a 3.5x3x1.0mm LGA 16-
pin package.
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Reverse Costing Methodology
The reverse costing analysis is conducted in 3 phases:
Package is analyzed and measured.
The dies are extracted in order to get overall data: dimensions, main
blocks, pad number and pin out, die marking
Set up of the manufacturing process.
Setup of the manufacturing environment
Cost simulation of the process steps with different year scenarios
Supply Chain Analysis
Analysis of the selling price
Teardown
analysis
Costing
analysis
Sellingprice
analysis
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Packages X-Ray
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Package OpeningSEM view
Package Opening
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MEMS Cap Opening
MEMS with Cap removed OverviewSEM View
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ST's 3-Axis Gyroscope MEMS Dies Comparison
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MEMS - Cross-Section
MEMS cap cross-sectionSEM View
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Sensor Process Flow
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Si wafer
Thinning 300m
Isolation oxide
(Oxide1) deposit
Si wafer
Buried Poly (Poly1)deposition
Ion implantation
Pattern & etch
Si wafer
Sacrificial oxide(Oxide 2) deposit
Pattern & etch
Si wafer
Structural Layer(Poly 2) deposit
CMP & ion implant
Sensor Process Flow 1/2
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ASIC Front-End Cost
Probe Test Cost
Backgrinding & Dicing Cost
We perform the economic analysis of the ASIC with the IC Price+ software.
We perform the economic analysis of the MEMS and the packaging with the MEMS CoSim+ software.
Packaging Cost
Final Test & Calibration Cost
Component Cost
MEMS Front-End Cost
Probe Test Cost
Dicing Cost
Main steps of economic analysis
L3G3250A
Back-End 0
Back-End 1
Front-End
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ASIC Die Cost (Front-End + Back-End 0)
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MEMS Front-End Cost
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MEMS FE Cost per Process Steps (1/2)
Sensor Manufacturing Steps Cost (Simu lated with MEMS CoSim+ Cost Simulation Tool)
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L3G3250A Component Cost (FE+BE 0+BE 1)
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L3G3250A Estimated Selling Price (Medium Yield)
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