welcome to boin gmbh
DESCRIPTION
Welcome to Boin GmbH. WAFERMAP. WAFERView.OCX. PANELMAP. Supported File Formats. WAFERMAP. We add customer imports upon request. Award winning software package Collect, edit, visualize and analyze measured physical parameters on semiconductor wafers. - PowerPoint PPT PresentationTRANSCRIPT
Welcome Welcome to to
Boin GmbHBoin GmbH
WAFERMAPWAFERMAP
PANELMAPPANELMAP
WAFERView.OCXWAFERView.OCX
WAFERMAPWAFERMAP
• Award winning software package
• Collect, edit, visualize and analyze measured physical parameters on semiconductor wafers
• Import data from various metrology tools
- Ellipsometers
- 4 point probes
- Thickness gauges Supported File Formats
We add customer imports
upon request
• 9 different visualization plots from 1D to 3D
• Data operations and filtering
• File comparison
• Statistical Process Control SPC
- Browser
- Trend chart
• Inter-application Communication (Active X)
•
WAFERMAPWAFERMAP
New features:
• New easy to use XML-based Boin file format
• Multiple wafers and multi-measurements in one file
• Import of multi-measurement wafers at once
• Free rotation of 3D plots
•
WAFERMAPWAFERMAP
New Release: Version 3.0
WAFERMAPWAFERMAP
New features:
• Export of *.jpg and *.bmp
• Export of *.html
• … and many more
New Release: Version 3.0
WAFERMAPWAFERMAP
• Compare your measurements
• Work off-line
• Work outside the clean room
WAFERMAP is your choice
• Advanced Micro Devices• ASM • Atmel• Canon• Hitachi• Hypernex • Infineon• Intel• Jordan Valley SC• LSI Logic• Mattson Technology• Motorola/ Freescale
• Nicolet• Osram • Philips, Philips Analytical• Mitsubishi• Seagate• Sematech • ST Microelectronics• Sumitomo Eaton Nova• Silicon Valley Group• Thermawave• Tokyo Electron• Tru-Si• Varian
WAFERMAPWAFERMAP
References – Partial List of WAFERMAP Customers
References – OEM Customers
WAFERMAPWAFERMAP
• Cyrium
• Foothill Instruments
• Jenawave
• Jordan Valley
• KLA - Tencor
• LayTec
• Napson
• Sigmatech
• SOPRA
• Technos
• Tepla AG
• Thermawave
• Thermo Electron
• Carl Zeiss
Sell WAFERMAP as analysis and visualization tool together with your equipment
PANELMAPPANELMAP
• Transfer of Award winning technology to flat panel geometry
• Collect, edit, visualize and analyze measured physical parameters on LCD, TFT, flat panels
• Import data from different metrology tools
- Ellipsometers
- 4 point probes
- Thickness gauges
Supported File Formats
We add customer imports
upon request
• 9 different visualization plots from 1D to 3D
• Data operations and filtering
• File comparison
• Statistical Process Control SPC
- Browser
- Trend chart
• Inter-application Communication (Active X)
•
PANELMAPPANELMAP
• New easy to use XML-based Boin file format
• Multiple panels and multi-measurements in one file
• Import of multi-measurement panels at once
• Free rotation of 3D plots
• Export of *.jpg and *.bmp
• Export of *.html
• … and many more
•
PANELMAPPANELMAP
PANELMAPPANELMAP
• Compare your measurements
• Work off-line
• Work outside the clean room
PANELMAP is your choice
• Provides Boin visualization techniques as integration tool
• 9 different plots from 1D to 3D
• Easy to use integration
• Detailed Property pages for each plot
• Detailed Method descriptions
WAFERView.OCXWAFERView.OCX
WAFERView.OCXWAFERView.OCX
• Integrate award winning Boin technology directly into your own equipment software
• Save development costs
• Save development time
WAFERView.OCX is your choice
WAFERView.OCXWAFERView.OCX
References – Partial List of WAFERView.OCX Customers
• Nicolet
• SOPRA
• Thermawave
• Thermo Electron
• Timbre
Thank you very muchThank you very much for your interest infor your interest in
Boin productsBoin products