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Koala TetraProbe The is licensed by Forschungszentrum Jülich GmbH Electrical characterization at the nanoscale mProbes SPM with KoalaDrive Conductance anisotropy on Si(111) surface Four-tip STM / Nanoprober Applications: Phys. Rev. Lett. 115 (2015) 066801 F our point conductivity of a graphene flake on hBN Appl. Phys. Lett. 103 (2013) 073113 Disentangling bulk and surface conductivity on Si(111) Phys. Rev. Lett. 115 (2015) 066801 Tip1 Tip3 Tip2 Tip4 A V s s s s I Contact: Prof. Dr. Bert Voigtländer [email protected] mProbes GmbH Altdorfer Str. 32 52428 Jülich Germany www.mprobes.com Find more information including several movies on our website:

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Koala TetraProbe

The is licensed by

Forschungszentrum Jülich GmbH

Electrical characterization at the nanoscale

mProbesSPM with KoalaDrive

Conductance anisotropy on Si(111) surface

Four-tip STM / Nanoprober

Applications:

Phys. Rev. Lett. 115 (2015) 066801

Four point conductivity of a graphene flake

on hBN

Appl. Phys. Lett. 103 (2013) 073113

Disentangling bulk and surface conductivity

on Si(111)

Phys. Rev. Lett. 115 (2015) 066801

Tip1Tip3

Tip2Tip4

A

V

s

s

s

s

I

Contact:

Prof. Dr. Bert Voigtländer

[email protected]

mProbes GmbHAltdorfer Str. 3252428 JülichGermany

www.mprobes.com

Find more information including several movies on our website:

8 7 6 5 4 3 2 1 00

50k

100k

150k

200k

1M

10M

R2

3,

Tip 3 position, î m

measured resistance

simulated resistance

250k

Ultra Compact Four-Tip STM

Measurement capabilties:

The ultra compact Koala TetraProbe STM integrates four

independent high resolution scanning units, resulting in an

unsurpassed mechanical stability, enabling atomic resolution

imaging with each tip.

Features:

Modular and compact design based on the

nanopositioner

Sample and each tip can be positioned independently

Tip coarse positioning under electron or optical

microscope control

Simultaneous tunneling and scanning with all four tips

Atomic resolution with each tip

In situ tip and sample exchange

Software controlled switching between current probe

and voltage probe for each tip

Low temperature version

available

Four point measurements with free positionable local

probes on structured samples

Controlled nondestructive measurements in

spectroscopy mode

Software allows virtually any possible “concerted“

spectroscopic measurements involving the four tips and

the sample

Surface local potential mapping at the nanoscale with

interrapted feedback

Si(111)-7x7

reconstruction

4m

Sample

Scanner 1 Scanner 2

KoalaDriveSEM or opticalmicroscope

Applications:

Four point measurements at silicide nanowires

on a Si surfaceRev. Sci. Instrum. 83 (2012) 033707

Resistance profiling along freestanding GaAs

nanowires

Appl. Phys. Lett. 103 (2013) 143104

2 µm

tip 1

tip 2tip 3

Scanning tunneling potentiometry

Rev. Sci. Instrum. 86 (2015)123701

SEM image of W tips close to a

sample

V

A

V

A

V

A

V

A

V

A

sample

DSP

tip1tip2 tip3

tip4