technology migration technique for designs with strong ret-driven layout restrictions

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IBM Server and Technology Group ISPD 2005 April 5, 2005 © 2005 IBM Corporation Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions Xin Yuan, Kevin McCullen, Fook-Luen Heng, Robert Walker, Jason Hibbeler, Robert Allen, Rani Narayan April 5, 2005

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Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions. Xin Yuan, Kevin McCullen, Fook-Luen Heng, Robert Walker, Jason Hibbeler, Robert Allen, Rani Narayan April 5, 2005. Outline. Introduction Review related work Our solution Experimental Results - PowerPoint PPT Presentation

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Page 1: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Server and Technology Group

ISPD 2005 April 5, 2005 © 2005 IBM Corporation

Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

Xin Yuan, Kevin McCullen, Fook-Luen Heng, Robert Walker, Jason Hibbeler, Robert Allen, Rani NarayanApril 5, 2005

Page 2: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation2 ISPD 2005 April 5, 2005

Outline

Introduction

Review related work

Our solution

Experimental Results

Conclusion and ongoing work

Page 3: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation3 ISPD 2005 April 5, 2005

Restrictive Design Rules (RDRs) [Liebmann et al SPIE 2004]

Strong Resolution Enhancement Technique (RET)-driven design rules

Require:

– Limited number of narrow linewidths

– Single orientation of narrow features

– Narrow features placed on uniform and coarse pitch

– Uniform proximity environment for all critical gates

– Limited number of pitches for critical gates

dummy polysilicon

Coarse grid

Page 4: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation4 ISPD 2005 April 5, 2005

Minimum Layout Perturbation (MinPert)-based Design Migration Design migration: key to achieve maximum layout productivity

MinPert [Heng et al ISPD97]: fix all the design rule violations with minimum total perturbation of the layout

– Conventional migration techniques target for area and wirelength minimization (a.k.a. layout compaction)

min M1 space

CA to RX space

violation

Contact

M1

Poly

Diffusion

Layout with design rule violation in new technology

CA to RX space

increased

Tight neighbors are perturbed as

needed

Non min spacing and

width are preserved

Minimally perturbed layout with design rule violation removed

CA to RX space

increasedspacing and

width are squeezed to

minimum

compacted layout using min area and wirelength objective

Page 5: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation5 ISPD 2005 April 5, 2005

Minimum Layout Perturbation (MinPert)-based Legalization

Constraint-based legalization

– Model layout rules constraints into a constraint graph G=(V, A)• layout element Ei Node Vi V • Rule constraints between layout elements arcs between nodes

)()( XVXV oldii Location perturbation objective (LocPert):

Linear programming problem formulation

(1) Problem

AAdXVXVts

XVXVW

ijijij

VV

oldiii

i

,)()(:..

)()(:min

Vi Vj

Ground rule: diffusion overlap past poly by dij

diffusion

poly Vi Vj

dij

Vj(X) - Vi(X) dij

Constraint graph G=(V,A),Linear constraint set

Page 6: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation6 ISPD 2005 April 5, 2005

Minimum Layout Perturbation-based Design Migration for RDR constraints (MPRDR)

Challenges:

– Discrete space constraints (grid constraints)

– A brand new problem, nobody studied it before

– It is a mixed integer linear programming (MILP) problem

• Not practical to use MILP solver

Compaction with grid constraints was solved in 1987 by J. F. Lee et al

– Different objective and not applicable

Our solution is an enhancement to the minimum layout perturbation-based technology migration technique proposed in 1997

Page 7: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation7 ISPD 2005 April 5, 2005

Minimum Layout Perturbation-based Design Migration for RDR constraints (MPRDR) Problem Formulation

Given constraint graph with out RDR constraint G=(V, A) of a layout, build augmented constraint graph G’ =(V, AARDR

sARDRns)

nsRDRij

gi

gj

sRDRij

gi

gj

ijijij

Vvoldiii

AAkPPPXVXV

AAPPXVXV

AAdXVXV

ts

XVXVWi

(2) Problem

},2,{)()(

},2,{)()(

,)()(

:..

)()(:min

23

61

45 7

ARDRns ARDR

s

Relax it to mixed integer linear programming problem (MILP)

RDRgi

gi

nsRDRij

gi

gj

sRDRij

gi

gj

ijijij

Vvoldiii

VVXV

AAXVXV

AAXVXV

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integer, is

(3) Problem

)(

,1)()(

},2,1{)()(

,)()(:..

)()(:min

Page 8: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation8 ISPD 2005 April 5, 2005

Our Solution: A two-stage Approach

Stage 1: Compute the target grid position of gates to meet the grid constraints with MinPert flavor

– model gates and their neighborhood relationship as a directed graph called PC neighborhood graph (PCN-graph)

– Minimum perturbation-oriented placement algorithm PCSP to “place” nodes (gates) on pitch based on the PCN graph

RDRgi

gi

nsRDRij

gi

gj

sRDRij

gi

gj

VV

oldgi

gii

VVXV

AAXVXV

AAXVXVts

XVXVWRDR

gi

integer, is

(4) Problem

)(

,1)()(

},2,1{)()(:..

)()(:min

v1

v2

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2

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2

11 2

1

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2

2

1

1

Page 9: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation9 ISPD 2005 April 5, 2005

Our Solution: A two-stage Approach

Stage 2: Treat the target grid positions of gates as design rules to be fixed by the minimum perturbation optimization

– For each gate Eig, given the target on-pitch location computed by

PC placement algorithm T(Eig) wrt the cell left boundary position,

denoted as Vlf(X), convert RDR constraints to a set of space constraint between the left boundary and the gates

Left boundary Linear constraint to target location

RDRgi

gi

gilf

RDRgi

gilf

gi

ijijij

Vvoldii

VVETXVXV

VVETXVXV

AAdXVXV

ts

XVXVi

(5) Problem

),()()(

),()()(

,)()(

:..

)()(:min

Page 10: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation10 ISPD 2005 April 5, 2005

PCN-Graph

v1

v2

v3

v5

V4

v7

v6

v8

v10

v9

v12

v11

v14

v16v13

v15

2

2

1

21

1

21

2

112

1

1

12

2

1

1

s0

t0

Page 11: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation11 ISPD 2005 April 5, 2005

PC Shape Placement (PCSP): Algorithm Overview

Estimate the range of possible valid grid positions of each node

analyze the slack of target position based on PCN-graph

Estimate the minimum width of the layout in terms of grids

Place nodes with the least slack in topological order within their valid position range and close to the original positions as

much as possible

Update valid grid position and slack for unplaced nodes

end

PCN-graph

Page 12: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation12 ISPD 2005 April 5, 2005

,6

,19

,17

,16

,14

,12,10

,11

,8

,4

,19,18

,13,5

,3

,2

,0,00

0

3

4

42

12

8

1012

614

16

11

17 1819 19

Compute Slack on PCN-graph

Topological sorting on PCN-graph, {s, v1, v2, v3, v4, v5, v6 ,v7, v8, v9, v11, v10, v12, v13, v14, v15, v16,t}

left(s) =0 , position source node at grid position of 0

Visit node vj in topological order,

– left(vj) = max {left(vi) + w(eij) }, for all eij

v1

v2

v3

v5

V4

v7

v6

v8

v10

v9v12

v11

v14

v16v13

v15

2

2

12

1

1

2 1

2

112

1

11

2

2

1s t0

0

1

Min_W = left(t), right(t) = max{target_W, min_W} , let w0 be the width of the given layout, scaler=right(t) / w0, for each node vi, old(vi) = old(vi)*scaler.

Visit node vi in reversed topological order,

– right(vi) = min {right(vj) - w(eij) }, for all eij

– slack(vj) = right(vj) – left(vj) ,

Page 13: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation13 ISPD 2005 April 5, 2005

PC Shape Placement (PCSP): Algorithm Overview

Estimate the range of possible valid grid positions of each node

analyze the slack of target position based on PCN-graph

Estimate the minimum width of the layout in terms of grids

Place nodes with the least slack in topological order within their valid position range and close to the original positions as

much as possible

Update valid grid position and slack for unplaced nodes

end

PCN-graph

Page 14: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation14 ISPD 2005 April 5, 2005

Experimental Results

PC Shape Placement vs GLPK (a MILP solver) to solve Problem (4) in the first stage

Test

cases

#var #cnst quality runtime

PCSP GLPK

test1 172 1035 1.02 0.01s 24h

test2 347 1914 1.04 0.01s 24h

test3 535 2996 1.19 0.03s 24h

test4 715 3934 1.03 0.03s 24h

test5 1637 8997 1.02 0.03s 24h

RDRgi

gi

nsRDRij

gi

gj

sRDRij

gi

gj

VV

oldgi

gii

VVXV

AAXVXV

AAXVXVts

XVXVWRDR

gi

integer, is

(4) Problem

)(

,1)()(

},2,1{)()(:..

)()(:min

Page 15: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation15 ISPD 2005 April 5, 2005

Experimental Result (con’t)

Before legalization After legalization

Page 16: Technology Migration Technique for Designs with Strong RET-driven Layout Restrictions

IBM Sever and Technology Group

© 2005 IBM Corporation16 ISPD 2005 April 5, 2005

Conclusion and Ongoing Work

Study the problem of MPRDR

Propose a two-stage approach to solve the MILP problem

Propose the heuristic algorithm to compute target on-grid locations with minPert flavor

Our solution works well on industrial layouts

Ongoing works

– Handle hierarchical design

– Handle grid constraints on other layout objects