tec 4000 x-ray diffraction system

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TEC 4000 X-Ray TEC 4000 X-Ray Diffraction Diffraction System System (Use space bar to step through presentation) (Use space bar to step through presentation)

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TEC 4000 X-Ray Diffraction System. (Use space bar to step through presentation). Introduction to the TEC 4000 X-ray Diffraction System. WHAT IS THE TEC MODEL 4000 X-RAY DIFFRACTION SYSTEM?. A complete system for measuring Residual Stress and Retained Austenite. The System consists of : - PowerPoint PPT Presentation

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Page 1: TEC 4000 X-Ray Diffraction System

TEC 4000 X-RayTEC 4000 X-RayDiffraction SystemDiffraction System

(Use space bar to step through presentation)(Use space bar to step through presentation)

Page 2: TEC 4000 X-Ray Diffraction System

IntroductionIntroduction to the TEC to the TEC 4000 X-ray Diffraction 4000 X-ray Diffraction

SystemSystem

Page 3: TEC 4000 X-Ray Diffraction System

WHAT IS THE TEC MODEL WHAT IS THE TEC MODEL 4000 X-RAY DIFFRACTION 4000 X-RAY DIFFRACTION

SYSTEM?SYSTEM? A complete system for measuring Residual A complete system for measuring Residual

Stress and Retained Austenite.Stress and Retained Austenite.

The System consists of :The System consists of :– Host Computer and peripherals.Host Computer and peripherals.– TEC’s User Friendly SaraTEC Operating TEC’s User Friendly SaraTEC Operating

Software.Software.– Model 4000 Workstation.Model 4000 Workstation.– Model 4000 Diffractometer.Model 4000 Diffractometer.– Customer Selected Options.Customer Selected Options.

Page 4: TEC 4000 X-Ray Diffraction System

TEC 4000 Host ComputerTEC 4000 Host Computer

The system is controlled The system is controlled by a Desktop or by a Desktop or Notebook computer Notebook computer through Universal Serial through Universal Serial Bus (USB) interface.Bus (USB) interface.

Lifetime SaraTEC Lifetime SaraTEC software upgrades software upgrades included.included.

Page 5: TEC 4000 X-Ray Diffraction System

TEC 4000 WorkstationTEC 4000 Workstation

Features of the TEC Features of the TEC 4000 Workstation:4000 Workstation:

Operates on 110-220 VoltsOperates on 110-220 Volts

50-60Hz.50-60Hz.

System is designed for System is designed for Laboratory and Field workLaboratory and Field work

It has a self-contained, It has a self-contained, recirculating cooling recirculating cooling system for X-ray tube system for X-ray tube coolingcooling

Page 6: TEC 4000 X-Ray Diffraction System

TEC 4000 TEC 4000 DiffractometerDiffractometer

Features of the TEC Features of the TEC 4000 Diffractometer:4000 Diffractometer:

Capable of -45° to 60° Capable of -45° to 60° ΨΨ RotationRotation

ΩΩ and and ΨΨ Detector Detector Orientations for Data Orientations for Data AcquisitionAcquisition

An automated touch An automated touch feature for precise Z-feature for precise Z-height adjustmentsheight adjustments

Swivel legs to Swivel legs to accommodate the size accommodate the size and geometry of larger and geometry of larger partsparts

Page 7: TEC 4000 X-Ray Diffraction System

TEC 4000 Safety FeaturesTEC 4000 Safety Features

Low power x-ray tubes.Low power x-ray tubes. Fail safe safety system which includes:Fail safe safety system which includes:

– One optical beam curtain supplied with all One optical beam curtain supplied with all systems. systems.

– Fail Safe circuitry for all cabinet and Fail Safe circuitry for all cabinet and diffractometer safety lights.diffractometer safety lights.

– Circuitry for optional second safety device.Circuitry for optional second safety device.– Key locks for x-ray power and safety circuits.Key locks for x-ray power and safety circuits.

Meets requirements of NBS 111 and ANSIMeets requirements of NBS 111 and ANSI

N43.2 for open beam operation.N43.2 for open beam operation.

Page 8: TEC 4000 X-Ray Diffraction System

TEC 4000 System OptionsTEC 4000 System Options

Standard system includes one PSPC detector, Cr X-ray tube, 156° Standard system includes one PSPC detector, Cr X-ray tube, 156° bracket, Calibration mask, Vanadium Kbracket, Calibration mask, Vanadium Kßß filter, and filter, and

1-5mm round collimators.1-5mm round collimators. Options are:Options are:

- 2 Detector system- 2 Detector system

- Rectangular Collimators (0.5, 1, 1.5, 2, 3mm x 5mm)- Rectangular Collimators (0.5, 1, 1.5, 2, 3mm x 5mm)

- Variety of X-ray Tubes - Cr, Cu, Co, Mn, Ti, Fe and V- Variety of X-ray Tubes - Cr, Cu, Co, Mn, Ti, Fe and V

- - Additional Brackets - Additional Brackets - 128 °,135 °,142 °,149 °, 152.5°, 160 128 °,135 °,142 °,149 °, 152.5°, 160 °°

- Automated - Automated Φ Φ rotation table (360° rotation).rotation table (360° rotation).

- Automated X and Y axis tables (Standard 4” travel).- Automated X and Y axis tables (Standard 4” travel).

Page 9: TEC 4000 X-Ray Diffraction System

Introduction to SaraTEC Introduction to SaraTEC Acquisition User InterfaceAcquisition User Interface

Page 10: TEC 4000 X-Ray Diffraction System

Main Setup ScreenMain Setup Screen

This is where the This is where the parameters for making a parameters for making a measurement are set. measurement are set.

Setup parameters are:Setup parameters are:

-Material Selection -Material Selection

-Collimator Selection-Collimator Selection

-Bracket Selection-Bracket Selection

-Type of Radiation-Type of Radiation

-Time (per Angle)-Time (per Angle)

-Measurement Type-Measurement Type

-Measurement -Measurement DescriptionDescription

-Position Queue (-Position Queue (ΨΨ Tilt Tilt angles to be measured)angles to be measured)

Page 11: TEC 4000 X-Ray Diffraction System

Material SelectionMaterial Selection

All of the All of the materials that materials that TEC has TEC has information on information on are stored in a are stored in a Materials Library Materials Library file in the file in the software. software. Materials can be Materials can be added, edited, or added, edited, or deleted in this deleted in this selection tab.selection tab.

Page 12: TEC 4000 X-Ray Diffraction System

Material Selection - Material Selection - AddAdd

Materials can be Materials can be added in this added in this selection if the selection if the parameters are parameters are known. known.

If needed, TEC If needed, TEC can assist with can assist with this information.this information.

Page 13: TEC 4000 X-Ray Diffraction System

Materials Selection - Materials Selection - EditEdit

Any information Any information that needs to be that needs to be changed for a changed for a material is material is entered here. entered here.

Page 14: TEC 4000 X-Ray Diffraction System

Collimator SelectionCollimator Selection

The collimator The collimator size is selected size is selected according to type according to type of surface (flat or of surface (flat or curved).curved).

- Flat surface generally - Flat surface generally uses a round uses a round collimator.collimator.

- Curved surface - Curved surface generally uses a generally uses a rectangular rectangular collimator.collimator.

Page 15: TEC 4000 X-Ray Diffraction System

Collimator Selection - Collimator Selection - EditEdit

Collimator Collimator selection allows selection allows you to rename you to rename collimators or add collimators or add different sizes of different sizes of collimators. collimators.

(Round sizes in 1,2,3,4, (Round sizes in 1,2,3,4, and 5mm.)and 5mm.)

(Rectangular sizes (Rectangular sizes are .5, 1.0,1.5,2.0, and are .5, 1.0,1.5,2.0, and 3 X 5mm)3 X 5mm)

Page 16: TEC 4000 X-Ray Diffraction System

Bracket SelectionBracket Selection

The bracket that The bracket that is recommended is recommended for the material for the material being measured is being measured is automatically automatically determined when determined when the material is the material is selected.selected.

It can be changed It can be changed manually to manually to accommodate other accommodate other diffraction peaks.diffraction peaks.

Page 17: TEC 4000 X-Ray Diffraction System

Bracket Selection - Bracket Selection - AddAdd

If a bracket needs If a bracket needs to be added it can to be added it can be done with the be done with the ADD option.ADD option.

Page 18: TEC 4000 X-Ray Diffraction System

Detector Orientation Detector Orientation OptionOption

This option is to This option is to let the software let the software know what know what orientation the orientation the detector is in. detector is in. The two options The two options are are ΩΩ and and ΨΨ..

Page 19: TEC 4000 X-Ray Diffraction System

Detector OrientationDetector Orientation

The TEC 4000 is The TEC 4000 is capable of capable of ΨΨ and and ΩΩ Detector Detector Orientations. The Orientations. The orientations are orientations are limited to size and limited to size and geometry (shape) geometry (shape) of the part to be of the part to be measured. Almost measured. Almost every part can be every part can be measured using measured using one of the detector one of the detector orientations.orientations.

Ψ (PSI)Orientation

Ω (Omega)Orientation

Page 20: TEC 4000 X-Ray Diffraction System

Detector ParametersDetector Parameters

The detector The detector parameters are parameters are entered during a entered during a detector detector calibration. Once calibration. Once set, they do not set, they do not need to be need to be adjusted until the adjusted until the detector or detector or detector detector electronics is electronics is replaced.replaced.

Page 21: TEC 4000 X-Ray Diffraction System

X-Ray Tube StatusX-Ray Tube Status

The type of The type of radiation being radiation being used is displayed used is displayed here along with here along with the power the power settings.settings.

Page 22: TEC 4000 X-Ray Diffraction System

Measurement DescriptionMeasurement Description

The Measurement The Measurement Description box Description box allows the user to allows the user to identify the part, identify the part, location, and location, and directions in directions in which the which the measurements measurements were taken.were taken.

Page 23: TEC 4000 X-Ray Diffraction System

X-Ray Tube X-Ray Tube ParametersParameters

This is where the This is where the target radiation target radiation (Tube Selection) (Tube Selection) and operating and operating parameters for parameters for the X-ray tube the X-ray tube are set.are set.

Edit X-Ray Tubes Edit X-Ray Tubes lists all the X-Ray lists all the X-Ray tubes available tubes available by TEC.by TEC.

Page 24: TEC 4000 X-Ray Diffraction System

Edit X-Ray TubesEdit X-Ray Tubes

Edit X-Ray Tubes Edit X-Ray Tubes selection displays selection displays the type of the type of radiation source, radiation source, the abbreviation, the abbreviation, and also the type and also the type of filter needed of filter needed for Kb for Kb suppression.suppression.

Page 25: TEC 4000 X-Ray Diffraction System

Modify Positions Modify Positions OptionOption

The Modify The Modify Positions selection Positions selection is where the is where the angles for angles for ΨΨ, Z-, Z-height, X-Y table, height, X-Y table, and and ΦΦ Rotation Rotation table parameters table parameters are set.are set.

Page 26: TEC 4000 X-Ray Diffraction System

Modify Measurement Modify Measurement PositioningPositioning

ΨΨ angles and angles and oscillation oscillation parameters are parameters are set in this tab.set in this tab.

Single angles and Single angles and multiple angles multiple angles are entered here are entered here in degrees.in degrees.

Page 27: TEC 4000 X-Ray Diffraction System

ModifyModify Measurement Measurement PositioningPositioning

Z-height is Z-height is automatically automatically calculated and set calculated and set during the during the calibration calibration procedure.procedure.

Page 28: TEC 4000 X-Ray Diffraction System

Modify Measurement Modify Measurement PositioningPositioning

The X tab is for X The X tab is for X table parameters. table parameters.

It allows for table It allows for table movement from movement from left to right.left to right.

Page 29: TEC 4000 X-Ray Diffraction System

Modify Measurement Modify Measurement PositioningPositioning

The Y tab is for Y The Y tab is for Y table parameters. table parameters.

It allows for table It allows for table movement from movement from front to back.front to back.

Page 30: TEC 4000 X-Ray Diffraction System

Modify Measurement Modify Measurement PositioningPositioning

The The Φ Φ tab is for tab is for the the ΦΦ rotation rotation table parameters.table parameters.

It allows for table It allows for table movement in movement in 360° rotations.360° rotations.

Page 31: TEC 4000 X-Ray Diffraction System

Manual ControlManual Control

The manual The manual control selection control selection allows the user to allows the user to manually move manually move the motors for the motors for ΨΨ, , Z, X, Y, and Z, X, Y, and ΦΦ motorsmotors

Page 32: TEC 4000 X-Ray Diffraction System

Manual Control - Manual Control - OptionsOptions

The The ΨΨ Motor can Motor can be moved be moved manually in manually in increments of 1°, increments of 1°, 5°, and 10° steps.5°, and 10° steps.

The Z Motor can The Z Motor can be moved be moved vertically in vertically in increments of .05, increments of .05, .1, and .5 inch .1, and .5 inch increments.increments.

Page 33: TEC 4000 X-Ray Diffraction System

Motor Control KeypadMotor Control Keypad

The Motor Control The Motor Control Keypad allows Keypad allows the user to make the user to make motor motor movements for movements for setting up the setting up the sample to be sample to be measured.measured.

Page 34: TEC 4000 X-Ray Diffraction System

Options SelectionOptions Selection

The Options The Options selection displays selection displays the General, the General, System, and System, and Measurement Measurement information.information.

Page 35: TEC 4000 X-Ray Diffraction System

Options - General TabOptions - General Tab

The General tab The General tab lets the user lets the user select where to select where to save the save the measurements measurements and automatically and automatically increments the increments the file numbers for file numbers for each each measurement.measurement.

Page 36: TEC 4000 X-Ray Diffraction System

Options - System InfoOptions - System Info

The System Info The System Info tab gives tab gives information information pertaining to pertaining to detector detector calibration calibration information, information, motor operating motor operating ranges, and ranges, and firmware firmware versions.versions.

Page 37: TEC 4000 X-Ray Diffraction System

Options - Movement Options - Movement TabTab

The movement The movement tab sets the tab sets the Controlling Controlling ΨΨ Angle, shows the Angle, shows the Motor Home Motor Home Offset, Count Offset, Count Time Adjustment, Time Adjustment, and default and default settings for ROI settings for ROI and Peak and Peak Bounding.Bounding.

Page 38: TEC 4000 X-Ray Diffraction System

Diagnostics SelectionDiagnostics Selection

The Diagnostics The Diagnostics selection displays selection displays log files for log files for Exposure, Error, Exposure, Error, and Status.and Status.

It also monitors It also monitors hardware and hardware and safety system safety system components.components.

Page 39: TEC 4000 X-Ray Diffraction System

Diagnostics - Hardware Diagnostics - Hardware TabTab

The hardware tab The hardware tab shows the type of shows the type of X-ray power X-ray power supply, and state of supply, and state of the X-ray power the X-ray power supply key switch.supply key switch.

It monitors the It monitors the cooling water flow cooling water flow and tube temp. to and tube temp. to protect the tube protect the tube from overheating.from overheating.

Page 40: TEC 4000 X-Ray Diffraction System

Diagnostics - Status Log Diagnostics - Status Log TabTab

The status log is The status log is generated to let generated to let the user know the user know what events have what events have taken place while taken place while the software is the software is active. active.

It can be used in It can be used in troubleshooting troubleshooting the system for the system for hardware faults.hardware faults.

Page 41: TEC 4000 X-Ray Diffraction System

Diagnostics - Exposure Log Diagnostics - Exposure Log TabTab

This log is This log is generated to let generated to let the user know how the user know how long the X-rays long the X-rays where energized.where energized.

It logs the time It logs the time that the x-rays that the x-rays were turned on were turned on and off while the and off while the system is being system is being operated.operated.

Page 42: TEC 4000 X-Ray Diffraction System

Diagnostics - Error Log Diagnostics - Error Log TabTab

This log is This log is generated when generated when the system the system detects an error detects an error that the system that the system encounters.encounters.

Page 43: TEC 4000 X-Ray Diffraction System

Diagnostics - Safety System Diagnostics - Safety System TabTab

The Safety features of The Safety features of this system are this system are monitored here. monitored here.

If the system If the system encounters a encounters a problem, it will be problem, it will be displayed here and displayed here and the system will the system will display a safety display a safety system error message system error message and will not proceed and will not proceed with a measurement.with a measurement.

Page 44: TEC 4000 X-Ray Diffraction System

Display During Data Display During Data AcquisitionAcquisition

A display of the A display of the spectra will be spectra will be displayed during displayed during Data Acquisition in Data Acquisition in real time screen real time screen updates once the updates once the measurement has measurement has been started.been started.

Page 45: TEC 4000 X-Ray Diffraction System

After Data AcquisitionAfter Data Acquisition

After the data After the data acquisition is acquisition is finished, the finished, the corrected spectra corrected spectra is displayed is displayed and the launch and the launch analysis button will analysis button will start the SaraTEC start the SaraTEC Analysis software Analysis software and will display and will display the resultsthe results..

Page 46: TEC 4000 X-Ray Diffraction System

Benefits of using the Benefits of using the TEC 4000TEC 4000

Fast results allow production, statistical, and Fast results allow production, statistical, and process control to improve quality and to reduce process control to improve quality and to reduce costs.costs.

System can be easily and quickly reconfigured to System can be easily and quickly reconfigured to analyze a wide variety of materials.analyze a wide variety of materials.

Nondestructive testing possible since parts often Nondestructive testing possible since parts often do not require sectioning.do not require sectioning.

Stress vs. Depth Profile is easily performed to Stress vs. Depth Profile is easily performed to evaluate peening intensity.evaluate peening intensity.

Page 47: TEC 4000 X-Ray Diffraction System

For further information regarding equipment For further information regarding equipment and / or Lab services please contact:and / or Lab services please contact:

TEC Materials Testing DivisionTEC Materials Testing Division10737 Lexington Drive10737 Lexington DriveKnoxville, TN 37932Knoxville, TN 37932 Phone: (865) 966-5856Phone: (865) 966-5856

or visit us on the web at:or visit us on the web at: www.tecstress.comwww.tecstress.comEmail: [email protected]: [email protected]