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The top documents tagged [area overhead]
Survey of Detection, Diagnosis, and Fault Tolerance Methods in FPGAs Dan Fisher, Addison Floyd
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University of Toronto Minimization of Delay Sensitivity to Process Induced Vth Variations Georges Nabaa Farid N. Najm University of Toronto (georges,najm)@eecg.utoronto.ca
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On the Capability and Achievable Performance of FPGAs for HPC Applications
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Random access scan
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Power Gating
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Test Data Compression Using Bitmask & Dictionary Selection
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An Analytical Model for Worst-case Reorder Buffer Size of Multi-path Minimal Routing NoCs Gaoming Du 1, Miao Li 1, Zhonghai Lu 2, Minglun Gao 1, Chunhua
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NATW 2008 Using Implications for Online Error Detection Nuno Alves, Jennifer Dworak, R. Iris Bahar Division of Engineering Brown University Providence,
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1 A Design Approach for Radiation-hard Digital Electronics Rajesh Garg Nikhil Jayakumar Sunil P Khatri Gwan Choi Department of Electrical and Computer
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Routing Track Duplication with Fine- Grained Power-Gating for FPGA Interconnect Power Reduction Yan Lin, Fei Li and Lei He EE Department, UCLA Partially
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Priyadharshini Shanmugasundaram
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Vishwani D. Agrawal
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DYNAMIC SCAN CLOCK CONTROL FOR TEST TIME REDUCTION MAINTAINING
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Copyright 2005, Agrawal & BushnellVLSI Test: Lecture 20alt1 Lecture 20alt DFT: Partial, Random-Access & Boundary Scan n Definition n Partial-scan architecture
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