sk tech co., ltd. · sk tech co., ltd. report no.: skt-ece-140047-a1 page 7 of 46 3.4. test...

SK Tech Co., Ltd.

Report No.: SKT-ECE-140047-A1 of 46

Revision History of Report

Rev. Revisions Effect page Reviewed by Date

- Initial issue All J. S. Yoon March 7, 2014

A1 Administrative change P1 and P5 J. S. Yoon March 20, 2015

(Revision A1)

This amendment test report Ref. No. SKT-ECE-140047-A1 was revised from the original test report Ref. No.

SKT-ECE-140047 without tests by the applicant's requests.

The variant model PSDV220571B was additionally listed on the page 5. The applicant declared that the

variant model is electrically identical to the tested sample except for the type of the output connector.

SK Tech Co., Ltd.


TABLE OF CONTENTS

1 Summary of test results .................................................................................................4

2 Description of equipment under test (EUT) ..................................................................5

3 Test and measurement conditions ................................................................................6

3.1. Operating modes ..................................................................................................................... 6

3.2. Description of support units (accessory equipment)................................................................ 6

3.3. Interconnection and I/O cables................................................................................................ 6

3.4. Test configuration (arrangement of EUT) ................................................................................ 7

3.5. Test date and environmental conditions .................................................................................. 7

4 Facilities and accreditations ..........................................................................................8

4.1. Facilities................................................................................................................................... 8

4.2. Accreditations .......................................................................................................................... 8

4.3. List of test and measurement instruments............................................................................... 8

4.4. Measurement uncertainty ...................................................................................................... 10

5 Technical requirements ................................................................................................ 11

5.1. Emission limits....................................................................................................................... 11

5.2. General performance criteria description .............................................................................. 14

6 EMISSION TEST ............................................................................................................15

6.1. Conducted disturbance test at AC mains terminals............................................................... 15

6.2. Conducted disturbance test at load/control terminals............................................................ 17

6.3. Radiated disturbance test (9 kHz to 30 MHz)........................................................................ 18

6.4. Radiated disturbance test (30 MHz to 300 MHz)................................................................... 21

6.5. Harmonic current emission test ............................................................................................. 22

6.6. Voltage fluctuations and flicker test ....................................................................................... 24

7 IMMUNITY TEST ............................................................................................................25

7.1. Electrostatic discharge immunity test (ESD) ......................................................................... 25

7.2. Radiated, radio-frequency, electromagnetic field immunity test (RS).................................... 27

7.3. Electrical fast transient/burst immunity test (EFT/Burst)........................................................ 28

7.4. Surge immunity test............................................................................................................... 29

7.5. Immunity to conducted disturbances, induced by radio-frequency fields (CS)...................... 30

7.6. Power frequency magnetic field immunity test ...................................................................... 31

7.7. Voltage dips and short interruptions immunity test ................................................................ 32

8 Photographs of the test set-up ....................................................................................33

9 Photographs of EUT .....................................................................................................44

SK Tech Co., Ltd.


1 Summary of test results Please refer to the specific reference standards (identified by date of publication and/or edition number or version number) on the cover page (P1). The cited version applied, unless otherwise specified in this test report.

EMISSION

Standard Test Result Remarks

Insertion loss (150 kHz - 1605 kHz) N/A

Disturbance voltage at mains terminals PASS Meets the requirements

Disturbance voltage at load/control terminals N/A

Radiated disturbances (9 kHz to 30 MHz) PASS Meets the requirements

EN 55015

Radiated disturbances (30 MHz to 300 MHz) PASS Meets the requirements

EN 61000-3-2 Harmonic current emissions PASS Meets class C limits.

EN 61000-3-3 Voltage fluctuations & flicker PASS Meets the requirements

IMMUNITY [EN 61547]

Standard Test Test parameters and severity levels Result±4 kV Contact discharges PASS

EN 61000-4-2 Electrostatic discharge (ESD) ±8 kV Air discharges PASS

EN 61000-4-3 Radiated immunity (RS) 3 V/m 80 MHz to 1000 MHz AM 80 %, 1 kHz, sinusoidal

PASS

±1 kV: AC power ports PASS ±0.5 kV: DC power ports N/A EN 61000-4-4 EFT/Burst ±0.5 kV: signal/control lines N/A

Surge immunity Self-ballasted lamps and semi-luminaires ±0.5 kV: (L-L), ±1.0 kV: (L-G) N/A Luminaires and independent auxiliaries (≤ 25 W) ±0.5 kV: (L-L), ±1.0 kV: (L-G) N/A

EN 61000-4-5

Luminaires and independent auxiliaries (> 25 W) ±1.0 kV: (L-L), ±2.0 kV: (L-G) PASS 150 kHz to 80 MHz AM 80 %, 1 kHz, sinusoidal

3 V: AC power input and output ports PASS 3 V: DC power input and output ports N/A

EN 61000-4-6 Injected current (CS)

3 V: signal/control lines N/A

EN 61000-4-8 Power frequency magnetic field 3 A/m 50/60 Hz

PASS

30 % reduction, 10 periods PASS EN 61000-4-11 Voltage dips and voltage short interruptions

100 % reduction, 0.5 periods PASS

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2 Description of equipment under test (EUT) Product: LED CONVERTER

Model: PSDV220571A

Serial number: None (prototype)

Model differences:

Model name Difference Tested (checked)

PSDV220571A Original (basic model that was fully tested)

ILW220N571N1 Listed by the applicant's request without tests; identical to the tested sample and added only for the marketing purpose

PSDV220571B Listed by the applicant's request without tests; identical to

the tested sample except for the type of output connector

Note: 1) All the differences were compared with the basic model.

Technical data:

Rated voltage AC 110 V to 240 V

Rated frequency 50/60 Hz

Rated power consumption 26 W

Rated output voltage DC 34 V

Rated output current 0.57 A

Light regulation none

Voltage during the Test AC 230 V

Frequency during the Test 50 Hz

AC power input cord type 2 terminals without the earth ground

I/O port Type Q'ty Remark

AC input terminal block (2-wire) 1

DC output terminal block (2-wire) 1 (Note) Note: The applicant declared that the cable length of the DC output (load) terminals to be connected to the lamp(s) was fixed

to 0.3 meter, and the tests were performed to the test sample that was provided by the applicant.

Modification of EUT during the compliance testing: none

SK Tech Co., Ltd.


3 Test and measurement conditions

3.1. Operating modes

Operating modes of the sample:

No. Description

1 Normal operating mode

Operating modes used for the Test:

No. Operating mode

1 Normal operating mode

The test sample was operated as the applicant's instruction including the load conditions.

3.2. Description of support units (accessory equipment)

The following support units or accessories were used to form a representative test configuration during the tests.

# Equipment Manufacturer Model No. Serial No.

1 Digital LUX Meter INS DX-100 991436

3.3. Interconnection and I/O cables

The following support units or accessories were used to form a representative test configuration during the tests.

Start End Cable

# Name I/O port Name I/O port length (m)

shielded(Y/N)

1 EUT AC input AC Mains AC Mains 1.2 N

2 EUT DC output (load) LED Lamp - 0.3 N

Note: 1) All the equipment/cables were placed in the worst-case configuration to maximize the emission during the test.

2) Grounding was established in accordance with the manufacturer’s requirements and conditions for the intended use.

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3.4. Test configuration (arrangement of EUT)

The drawing of the test configuration was shown below, and the photographs of the test setup were attached.

AC Mains

LED Lamp

Digital LUX Meter

EUT

3.5. Test date and environmental conditions

Test suites

Test date

(YYYY.MM.DD)

Ambient temperature

(ºC)

Relative humidity

(%)

Atmospheric pressure

(kPa) EMISSION

Insertion loss (150 kHz - 1605 kHz) N/A - - - Disturbance voltage at mains terminals 2014.02.21 18 25 - Disturbance voltage at load/control terminal N/A - - - Radiated disturbances (9 kHz to 30 MHz) 2014.02.25 19 30 - Radiated disturbances (30 MHz to 300 MHz) 2014.02.21 8 46 - Harmonic current emissions 2014.03.04 20 38 - Voltage fluctuations & flicker 2014.03.04 20 38 -

IMMUNITY Electrostatic discharge (ESD) 2014.02.18 23 39 99.7 Radiated immunity (RS) 2014.02.19 20 25 101.6 EFT / Burst immunity 2014.02.25 23 51 100.2 Surge immunity 2014.02.24 20 45 100.1 Injected currents (CS) 2014.02.25 23 51 100.2 Power frequency magnetic field 2014.02.24 20 45 100.1 Voltage dips and voltage interruptions 2014.02.24 20 45 100.1

SK Tech Co., Ltd.


4 Facilities and accreditations

4.1. Facilities

All of the measurements described in this report were performed at SK Tech Co., Ltd

Site I: 820-2, Wolmoon-ri, Wabu-up, Namyangju-si, Kyunggi-do, Korea

Site II: 688-8, Wolmoon-ri, Wabu-up, Namyangju-si, Kyunggi-do, Korea The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR 16-1-4. The sites

comply with the Normalized Site Attenuation requirements given in ANSI C63.4, and site VSWR requirements

specified in CISPR 16-1-4. The measuring apparatus and ancillary equipment conform to CISPR 16-1 series.

4.2. Accreditations

Our testing laboratory is accredited by the following accreditation bodies in accordance with ISO/IEC 17025.

Korea KOLAS No.191

Germany DAkkS D-PL-12162-01-01

The laboratory has been also notified to FCC by RRA as a Conformity Assessment Body, and designated to

perform compliance testing on equipment subject to Declaration of Conformity (DOC) and Certification under

Parts 15 and 18 of the FCC Rules.

Designation No. KR0007

4.3. List of test and measurement instruments

Description Model Manufacturer Serial No. Cal. due Use Conducted emission EMI test receiver 9010/30P Narda 132WX21108 2015-01-24 AMN (LISN) ESH3-Z5 Rohde & Schwarz 836679/018 2014-07-09 AMN (LISN) NNLK8129 Schwarzbeck 8129-215 2014-03-07 ISN ISN T8 TESEQ 24806 2015-02-05 ISN ISN ST08 TESEQ 24800 2015-01-16 EMI test receiver ESHS10 Rohde & Schwarz 835871/002 2014-07-08 AMN (LISN) ESH2-Z5 Rohde & Schwarz 834549/011 2014-07-09 AMN (LISN) KNW-407 Kyoritsu 8-929-19 2014-03-08 ISN CAT 5 8158 Schwarzbeck 8158-0050 2014-07-16 ISN NTFM 8158 Schwarzbeck 8158-0045 2014-07-18 Radiated emission EMI test receiver ESPI7 Rohde & Schwarz 101206 2014-07-08 EMI test receiver ESVS10 Rohde & Schwarz 825120/013 2014-03-08 Pre-amplifier (30 MHz - 1 GHz) 8447F HP 3113A05153 2014-07-08 Bilog broadband antenna VULB9168 Schwarzbeck 9168-189 2014-05-21 Bilog broadband antenna VULB9168 Schwarzbeck 9168-230 2015-01-27 EMI test receiver ESIB40 Rohde & Schwarz 100277 2014-03-07 Pre-amplifier (30 MHz - 1 GHz) 8447D HP 2944A07994 2014-07-08 Pre-amplifier (1 GHz - 18 GHz) MLA-100M18-B02-38 TSJ 1359546 2014-03-07 Bilog broadband antenna JB1 Sunol Sciences A060910 2014-10-25 Horn antenna (1 GHz - 18 GHz) BBHA 9120D Schwarzbeck 9120D-816 2015-02-25 Horn antenna (1 GHz - 18 GHz) 3115 ETS-LINDGREN 00056768 2015-01-27 Radiated emission ( f < 30 MHz) EMI test receiver ESIB40 Rohde & Schwarz 100277 2014-03-07 EMI test receiver ESHS10 Rohde & Schwarz 835871/002 2014-07-08 3-dimensional loop antenna HXYZ9170 Schwarzbeck HFCD9171-174 2014-12-12 Loop antenna HFH2-Z2 Rohde & Schwarz 863048/019 2014-12-04

SK Tech Co., Ltd.


Description Model Manufacturer Serial No. Cal. due Use Harmonic current / voltage flicker Reference impedance network IMP555 Voltech IG147/1172 2014-07-09 Universal power analyzer PM 6000 Voltech 100006700207 2014-12-22 Pacific power source 140AMXT/UPC12/M5283 Pacific 1014-04256 2014-07-09 Electrostatic discharge (ESD) ESD simulator ESS-2000AX Noise Ken ESS0898782 2014-06-25 ESD simulator ESS-B3011 Noise Ken ESS1213056 2014-11-04 Radiated immunity (RS) Signal generator SMY01 Rohde & Schwarz 71400091 2014-03-08 RF power meter NRVD Rohde & Schwarz 100496 2014-07-08 Log periodic antenna HL046 Rohde & Schwarz 100032 N/A RF power amplifier (10 kHz - 1 GHz) CMX10001 IFI 1045-0995 N/A RF power amplifier (10 kHz - 250 MHz) M5300 IFI 1046-0995 N/A RF power amplifier (200 MHz - 1 GHz) SMCC100 IFI 1047-0995 N/A MXG analog signal generator N5181A Agilent MY49061394 2014-03-07 USB power sensor U2004A Agilent MY50000189 2014-03-08 USB power sensor U2004A Agilent MY50000190 2014-03-08 Horn antenna (1 GHz - 18 GHz) BBHA 9120D Schwarzbeck 9120D-816 2015-02-25 Horn antenna (1 GHz - 18 GHz) 3115 ETS-LINDGREN 00056768 2015-01-27 RF power amplifier (1 GHz - 3 GHz) SV120DC PRANA 1311-1449 2014-11-04 RF power amplifier (2 GHz - 6 GHz) 5192R OPHIR 1005 2014-03-08 EFT / Burst Ultra compact simulator UCS 500 M6B EM TEST V0545100862 2014-12-19 Motor variac MV 2616 EM TEST V0545100863 2014-12-19 Capacitive coupling clamp HFK EM TEST 1205-11 2014-07-09 EFT/B simulator 5555 TOKIN S1004 2014-07-09 Capacitive coupling clamp PN-5055 TOKIN 1002 2014-12-07 Surge Ultra compact simulator UCS 500 M6B EM TEST V0545100862 2014-12-19 Motor variac MV 2616 EM TEST V0545100863 2014-12-19 I/O signal line coupler/decoupler CM-I/OCD KeyTek 0005192 N/A Control center E103 KeyTek 9601421 N/A Surge combination wave E501A KeyTek 9601193 2014-07-08 Telecom wave surge module E502B KeyTek 0004238 2014-07-08 Surge coupler/decoupler E551 KeyTek 9601424 2014-07-08 Coupler/decoupler for telecome line CM-TELCD KeyTek 005180 2014-03-08 Injected currents (CS) Conducted immunity test system CIT-10/75 FRANKONIA 102C3202 2014-07-09 Attenuator (6 dB, 75 W) ATT6/75 EM TEST 1104-44 2014-07-09 CDN CDN M016(M2/M3) TESEQ 30431 2014-03-07 CDN CDN S1/75 EM TEST 1105-31 2014-07-08 CDN CDN S1/50 EM TEST 1105-32 2014-07-08 CDN TSCDN-T4 TSJ 02001 2014-07-08 CDN TSCDN-T2 TSJ 02003 2014-07-08 EM clamp KT-30 Kyoritsu 8-1315-2 2014-03-18 Conducted immunity test system CWS 500N1 EM TEST V1223112760 2014-07-08 Attenuator ATT6/75 EM TEST 0712-103 2014-07-08 CDN CDN-M2/M3N EM TEST 0712-28 2014-07-08 CDN CDN-T8-RJ45 EM TEST 0812-50 2014-07-08 EM Clamp EM101 LuthiElektronik 36111 2014-08-16 Power frequency magnetic field Ultra compact simulator UCS 500 M6B EM TEST V0545100862 2014-12-29 Motor variac MV 2616 EM TEST V0545100863 2014-12-29 Magnetic antenna MS100 EM TEST 1205-01 N/A Slidacs DSD1000 Digitek power E10116 N/A Voltage dips and interruptions Ultra compact simulator UCS 500 M6B EM TEST V0545100862 2014-12-19 Motor variac MV 2616 EM TEST V0545100863 2014-12-19 Control center E103 KeyTek 9601421 N/A PQF swell/dip/interrupt EP61 KeyTek 9601477 2015-02-05

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4.4. Measurement uncertainty

4.4.1. EMI uncertainty

The following measurement uncertainty levels have been estimated according to CISPR 16-4-2.

Measurement Frequency Uncertainty Ucispr

Conducted emissions 150 kHz to 30 MHz ±3.14 dB ±3.4 dB 30 MHz to 1000 MHz ±4.20 dB ±6.3 dB

Radiated emissions 1000 MHz to 6000 MHz ±5.06 dB ±5.2 dB

This measurement uncertainty represents an expanded uncertainty expressed at approximately the 95 %

confidence level using a coverage factor of k = 2. If the measurement value is lower or equal to the limit, the EUT is considered to pass the test. When the measured emission is positioned within the range of the measurement uncertainty from the emission limit, compliance or non-compliance with a disturbance limit is determined in the following manner. 1) If Ulab is less than or equal to Ucispr - compliance is deemed to occur if no measured disturbance exceeds the disturbance limit; - non-compliance is deemed to occur if any measured disturbance exceeds the disturbance limit. 2) If Ulab is greater than Ucispr - compliance is deemed to occur if no measured disturbance, increased by (Ulab - Ucispr), exceeds the disturbance limit; - non-compliance is deemed to occur if any measured disturbance, increased by (Ulab - Ucispr), exceeds the disturbance limit.

4.4.2 EMS uncertainty

All parameters are within the tolerances required by the standards, reduced by the tolerances required on the

calibration certificate, so this laboratory has confidence that the EMS Test equipment is in compliance with the

standard with X % confidence level.

Reduced by the uncertainty reported on the calibration certificate. (about X % confidence level)

Tolerance required by the standard

Basic standard Test item k confidence

level U

EN 61000-4-2 Electrostatic discharge (ESD) 2 95 %

EN 61000-4-3 Radiated immunity (RS) 1.65 2

90 % 95 %

±2.64 dB±3.16 dB

EN 61000-4-4 EFT / Burst 2 95 %

EN 61000-4-5

Surge (except following parameters) L1-L2 (open circuit, 1.2/50 μs, 2 Ω) positive 500 V L1-L2 (open circuit, 1.2/50 μs, 2 Ω) negative 1 kV and 2 kV L1-PE (open circuit, 1.2/50 μs, 2 Ω) positive 1 kV

2 1.29 1.44 1.44

95 % 80 % 85 % 85 %

EN 61000-4-6 Conducted immunity (CS) 1.34 1.67

90 % 95 %

±1.34 dB±1.67 dB

EN 61000-4-11 Voltage dips, interruptions and variations 2 95 %

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5 Technical requirements

5.1. Emission limits

5.1.1. Limits for disturbance voltage

Limits for disturbance voltage at the mains terminals

Frequency range Limits (dBμV)a

Quasi-peak Average

9 kHz to 50 kHz 110 -

50 kHz to 150 kHz 90 to 80b -

150 kHz to 0.5 MHz 66 to 56b 56 to 46b

0.5 MHz to 5.0 MHz 56c 46c

5 MHz to 30 MHz 60 50

a At the transition frequency, the lower limit applies.

b The limit decreases linearly with the logarithm of the frequency in the ranges of 50 kHz o 150 kHz and 150 kHz to 0.5 MHz.

c For electrodeless lamps and luminaires, the limit in the frequency range of 2.51 MHz to 3.0 MHz is 73 dB(μV) quasi‐peak and 60

dB(μV) average.

NOTE In Japan, the limits in the frequency range 9 kHz to 150 kHz do not apply.

Limits for disturbance voltage at the load terminals

Frequency range Voltage limits (dBμV)a

(MHz) Quasi-peak Average

0.15 to 0.5 80 70

0.5 to 30 74 64


Limits for disturbance voltage at the control terminals

Frequency range Voltage limits (dBμV)

(MHz) Quasi-peak Average

0.15 to 0.5 84 to 74 74 to 64

0.5 to 30 74 64

NOTE 1 The limits decrease linearly with the logarithm of the frequency in the range 0.15 MHz to 0.5 MHz.

NOTE 2 The voltage disturbance limits are derived for use with an impedance stabilization network (ISN) which presents a common

mode (asymmetric mode) impedance of 150 Ω to the control terminal.

5.1.2. Limits for radiated disturbance

Limits for radiated disturbance in the frequency range 9 kHz to 30 MHz

Frequency range Quasi-peak limits for loop diameter (dBμA)a

(MHz) 2 m 3 m 4 m

9 kHz to 70 kHz 88 81 75

70 kHz to 150 kHz 88 to 58b 81 to 51b 75 to 45b

150 kHz to 3.0 MHz 58 to 22b 51 to 15b 45 to 9b

3.0 MHz to 30 MHz 22 15 to 16c 9 to 12c


b Decreases linearly with the logarithm of the frequency. For electrodeless lamps and luminaires, the limit in the frequency range

of 2.2 MHz to 3.0 MHz is 58 dB(μA) for 2m, 51 dB(μA) for 3 m and 45 dB(μA) for 4 m loop diameter.

c Increasing linearly with the logarithm of the frequency.

NOTE In Japan, the limits in the frequency range 9 kHz to 150 kHz do not apply.

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Limits for radiated disturbance in the frequency range 30 MHz to 300 MHz at a measuring distance of 10 m

Frequency range Quasi-peak limits

(MHz) (dBμV/m)a

30 to 230 30

230 to 300 37


5.1.3. Limits for harmonics current

a) Active input power >25 W

For lighting equipment having an active input power greater than 25 W, the harmonic currents shall not exceed

the relative limits for Class C equipment.

Limits for Class C equipment

Harmonic order

n

Maximum permissible harmonic current expressed as a percentage of the input current

at the fundamental frequency %

2 2

3 30 • λ

5 10

7 7

9 5

11 ≤ n ≤ 39

(odd harmonics only)

3

* λ is the circuit power factor

However, the limits for Class A equipment apply to incandescent lighting equipment that has built-in dimmers or

consists of dimmers built in an enclosure.

Limits for Class A equipment Limits for Class D equipment Harmonic

order n

Max. permissible harmonic current

A

Harmonic order

n

Max. permissible harmonic current per watt

mA/W

Max. permissible harmonic current

A Odd harmonics Odd harmonics only

3 2.30 3 3.4 2.30

5 1.14 5 1.9 1.14

7 0.77 7 1.0 0.77

9 0.40 9 0.5 0.40

11 0.33 11 0.35 0.33

13 0.21 13 0.30 0.21

15 ≤ n ≤ 39 0.15 × 15/n 15 ≤ n ≤ 39 3.85/n 0.15 × 15/n

Even harmonics

2 1.08

4 0.43

6 0.30

8 ≤ n ≤ 40 0.23 × 8/n

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b) Active input power ≤25 W

Discharge lighting equipment having an active input power smaller than or equal to 25 W shall comply with one

of the following two sets of requirements:

- the harmonic currents shall not exceed the power-related limits for Class D equipment, column 2, or:

- the third harmonic current, expressed as a percentage of the fundamental current, shall not exceed 86 % and

the fifth harmonic current shall not exceed 61 %. Also, the waveform of the input current shall be such that it

reaches the 5 % current threshold before or at 60º, has its peak value before or at 65º and does not fall below

the 5 % current threshold before 90º, referenced to any zero crossing of the fundamental supply voltage. The

current threshold is 5 % of the highest absolute peak value that occurs in the measurement window, and the

phase angle measurements are made on the cycle that includes this absolute peak value.

5.1.4. Limits for voltage fluctuations & flicker

Test item Limit Remark

Pst 1.0 Pst means short-term flicker indicator.

Plt 0.65 Plt means long-term flicker indicator.

Tdt 500 ms Tdt means maximum time that d(t) exceed 3 %.

dc 3.3 % dc means relative steady-state voltage change.

dmax 4 % dmax means maximum relative voltage change.

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5.2. General performance criteria description

Required performance criteria according to EN 61547

Performance

Criteria Description

A During the test, no change of the Iuminous intensity shall be observed and the regulating control, if any, shall operate during the test as intended.

B

During the test, the Iuminous intensity may change to any value. After the test, the Iuminous intensity shall be restored to its initial value within 1 min. Regulating controls need not function during the test, but after the test, the mode of the control shall be the same as before the test provided that during the test no mode changing commands were given.

C

During and after the test, any change of the luminous intensity is allowed and the lamp(s) may be extinguished. After the test, within 30 min, all functions shall return to normal, if necessary by temporary interruption of the mains supply and/or operating the regulating control. Additional requirement for lighting equipment incorporating a starting device: After the test, the lighting equipment is switched off. After half an hour, it is switched on again. The lighting equipment shall start and operate as intended.

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6 EMISSION TEST

6.1. Conducted disturbance test at AC mains terminals

Test set-up: Refer to the test configuration and photographs of the test setup.

frequency range: 9 kHz to 30 MHz

frequency step size: 50 % of the IF bandwidth

IF bandwidth: 200 Hz (frequncy range from 9 kHz to 150 kHz) 9 kHz /10 kHz (frequncy range from 150 kHz to 30 MHz)

measurement time: 1 second

Operating mode: #1

Test results: PASS (The chart below shows the highest readings taken from the final data.) Frequency Reading Line CF CL Actual Limit Margin

(MHz) (dBμV) (L/N) (dB) (dB) (dBμV) (dBμV) (dB)

Quasi-peak data

0.144 49.50 N 0.14 0.01 49.65 80.40 30.75 0.150 51.56 N 0.14 0.01 51.71 66.00 14.29 0.175 52.21 N 0.13 0.01 52.35 64.72 12.37 0.285 44.00 N 0.11 0.01 44.12 60.67 16.55 0.430 40.56 N 0.10 0.02 40.68 57.25 16.57 0.715 40.54 L 0.18 0.02 40.74 56.00 15.26 1.000 39.21 N 0.09 0.03 39.33 56.00 16.67 7.190 38.67 L 0.35 0.13 39.15 60.00 20.85 7.245 38.60 N 0.26 0.13 38.99 60.00 21.01

Average data

0.144 46.78 N 0.14 0.01 46.93 - - 0.150 41.02 N 0.14 0.01 41.17 56.00 14.83 0.175 42.55 N 0.13 0.01 42.69 54.72 12.03 0.285 42.76 N 0.11 0.01 42.88 50.67 7.79 0.430 38.16 N 0.10 0.02 38.28 47.25 8.97 0.715 33.54 L 0.18 0.02 33.74 46.00 12.26 1.000 35.01 N 0.09 0.03 35.13 46.00 10.87 7.190 33.03 L 0.35 0.13 33.51 50.00 16.49 7.245 32.93 N 0.26 0.13 33.32 50.00 16.68

Note: 1) L/N: Line / Neutral 2) CF and CL: correction factor (LISN) and cable loss 3) Actual = Reading + CF + CL 4) Margin = Limit - Actual

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Line to PE

Neutral to PE

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6.2. Conducted disturbance test at load/control terminals




IF bandwidth: 9 kHz (10 kHz)

measurement time: 1 second

Operating mode:

Test results: N/A REMARK: The applicant declared that the cable length of the load terminals to be connected

to the lamp(s) was fixed to 0.3 m, and the radiated disturbance limits were applied under

these conditions by the applicant's request.

(The chart below shows the highest readings taken from the final data.)

Frequency Reading CF CL Actual Limit Margin

(MHz) (dBμV) (dB) (dB) (dBμV) (dBμV) (dB)

Quasi-peak data

Average data

Note: 1) CF and CL: correction factor and cable loss 2) Actual = Reading + CF + CL 3) Margin = Limit - Actual

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6.3. Radiated disturbance test (9 kHz to 30 MHz)


Loop diameter: 2 m



IF bandwidth: 200 Hz (frequncy range from 9 kHz to 150 kHz) 9 kHz /10 kHz (frequncy range from 150 kHz to 30 MHz)

measurement time: 10 ms (1 second if the final QP value was measured)

Operating mode: #1

Test results: PASS

(The chart below shows the highest readings taken from the final data. The other emission levels were very low against the limit.)

Axis Frequency Actual Limit Margin

(X/Y/Z) (MHz) (dBμA) (dBμA) (dB)

X 0.175 18.91 56.15 37.24 X 0.525 8.08 42.95 34.87 X 0.645 6.51 40.47 33.96 X 18.960 5.80 22.00 16.20 X 29.955 6.18 22.00 15.82 Y 0.610 8.15 41.14 32.99 Y 0.645 9.42 40.47 31.05 Y 8.040 6.79 22.00 15.21 Y 11.370 5.71 22.00 16.29 Y 26.740 6.52 22.00 15.48 Z 0.835 5.32 37.37 32.05 Z 2.695 5.21 23.29 18.08 Z 14.635 5.44 22.00 16.56 Z 18.505 5.50 22.00 16.50 Z 27.010 6.16 22.00 15.84

Note: 1) Margin = Limit - Actual

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Axis X

Axis Y

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Axis Z

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6.4. Radiated disturbance test (30 MHz to 300 MHz)


Test site: OATS SAC

Antenna distance: 10 m 3 m

Rx antenna height: 1 m to 4 m

frequency range: 30 MHz to 300 MHz

IF bandwidth: 120 kHz

Operating mode: #1

Test results: PASS

(The chart below shows the highest readings taken from the final data. The other emission levels were very low against the limit.)

Frequency Pol. Height Reading AMP AF CL Actual Limit Margin

(MHz) (V/H) (m) (dBμV) (dB) (dB/m) (dB) (dBμV/m) (dBμV/m) (dB)

Note: 1) V/H: Vertical / Horizontal polarization 2) AMP, AF and CL: pre-amplifier gain, antenna factor and cable loss 3) Actual = Reading -AMP + AF + CL 4) Margin = Limit – Actual 5) Preliminary scans were performed at 3 m anechoic chamber at the frequency from 30 MHz to 300 MHz in both

vertical and horizontal polarizations in all possible mode of operation. There was no significant emission.

No radiated emissions found

SK Tech Co., Ltd.


6.5. Harmonic current emission test


frequency range: DC to 2 kHz

Equipment class Class A B C D

Operating mode: #1

Test results: PASS REMARK: The measured power was used to establish the limits because the measured

value was outside of the tolerance band around the specified value (26 W).

SK Tech Co., Ltd.


Fluctuating Harmonic Test - Worst Case Table

SK Tech Co., Ltd.


6.6. Voltage fluctuations and flicker test


frequency range: DC to 2 kHz

Operating mode: #1

Test results: PASS

SK Tech Co., Ltd.


7 IMMUNITY TEST

7.1. Electrostatic discharge immunity test (ESD)

Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN 61000-4-2 Discharge impedance: 330 Ω / 150 pF Discharge voltage: Contact discharge: 4 kV (direct / indirect)

Air discharge: 2 kV; 4 kV & 8 kV (direct) Polarity: positive and negative Number of discharge: minimum 10 times for each voltage and polarity Discharge mode: single discharge; 1 second minimum Performance criteria: B

Operating mode: #1 Monitoring / observation: Monitor the EUT during the conditioning period to detect any change in status;

observation of the luminous intensity, functional test. Test results: PASS

Contact discharges

Test point Test level Result

±2 kV ±4 kV ±6 kV ±8 kV Criterion Observation Pass Fail

HCP (0.8 m × 1.6 m) A B Note 1) 2) VCP (0.5 m × 0.5 m) A B Note 1) 2)

Air discharges

Test point Test level Result

±2 kV ±4 kV ±8 kV ±15 kV Criterion Observation Pass Fail

Enclosure (front) A B Note 1) 2) Enclosure (rear) A B Note 1) 2) Enclosure (left) A B Note 1) 2) Enclosure (right) A B Note 1) 2) Enclosure (top) A B Note 1) 2)

Note: 1) There was no change compared with initial operation during and after the tests.

SK Tech Co., Ltd.


Photographs for discharge points of EUT Air discharges:

Contact discharges:

SK Tech Co., Ltd.


7.2. Radiated, radio-frequency, electromagnetic field immunity test (RS)

Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN 61000-4-3 Test field strength: 3 V/m Frequency range: 80 MHz to 1000 MHz Modulation: 80 % AM with 1 kHz sinusoidal signal Frequency step: 1 % of preceding frequency value Dwell time: 3 s Polarity of TX antenna: horizontal and vertical TX antenna distance: 3 m Performance criteria: A



AM (80 %)

Frequency Test level Polarity Position Result

(MHz) 1 V/m 3 V/m 10 V/m Observation Pass Fail

80 - 1000 V & H Front Note 1) 2) 80 - 1000 V & H Rear Note 1) 2) 80 - 1000 V & H Left Note 1) 2) 80 - 1000 V & H Right Note 1) 2)


SK Tech Co., Ltd.


7.3. Electrical fast transient/burst immunity test (EFT/Burst)

Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN 61000-4-4 Test peak voltage: AC power ports: 1 kV

DC power ports: 0.5 kV Signal/control lines: 0.5 kV

Polarity positive and negative Repetition frequency: 5 kHz Impulse wave shape 5/50 ns Burst duration / period: 15 ms / 300 ms Test duration: Not less than 1 min. Performance criteria: B



AC power ports

Test port Test level Result

±0.5 kV ±1 kV ±2 kV ±4 kV Criterion Observation Pass Fail

L1-L2 A B Note 1) 2)

DC power ports


±0.25 kV ±0.5 kV ±1 kV ±2 kV Criterion Observation Pass Fail

N/A A B Note 1) 2)

Signal / control lines


±0.25 kV ±0.5 kV ±1 kV ±2 kV Criterion Observation Pass Fail

N/A A B Note 1) 2)


SK Tech Co., Ltd.


7.4. Surge immunity test

Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN 61000-4-5 Test peak voltage:

Self-ballasted lamps and semi-luminaires: (line to line) 0.5 kV (line to ground) 0.5 kV & 1 kV

Luminaires and independent auxiliaries for input power ≤ 25 W

(line to line) 0.5 kV (line to ground) 0.5 kV & 1 kV

for input power > 25 W (line to line) 0.5 kV & 1 kV (line to ground) 0.5 kV; 1 kV & 2 kV

Polarity positive and negative Wave shape 1.2/50 μs (8/20 μs) Source impedance: 2 Ω (between power supply networks)

12 Ω (between power supply network and ground) Number of application: minimum 5 pulses for each voltage and polarity Phase (AC power port) 90º and 270º (min. 5 pulses for each phase) Pulse repetaition rate: 1 time/min. (maximum) Performance criteria: C



AC power ports


±0.5 kV ±1 kV ±2 kV ±4 kV Criterion Observation Pass Fail

L1-L2 A B Note 1) 2)


SK Tech Co., Ltd.


7.5. Immunity to conducted disturbances, induced by radio-frequency fields (CS)

Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN 61000-4-6 Test voltage (emf): 3 V Frequency range: 0.15 MHz to 80 MHz Modulation: 80 % AM with 1 kHz sinusoidal signal Frequency step: 1 % of preceding frequency value Dwell time: 3 s Performance criteria: A



AM (80 %)

Frequency Test level Test port Injection Result

(MHz) 1 V 3 V 10 V method Observation Pass Fail

0.15 - 80 AC Mains CDN (M2) Note 1) 2)


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7.6. Power frequency magnetic field immunity test

Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN 61000-4-8 Test feild strength: 3 A/m Power frequency: 50 Hz / 60 Hz Inductive coil: 1 m × 1 m 1 turn Observation time: more than 1 minute Performance criteria: A



Frequency Test level Direction Result

(Hz) 1 A/m 3 A/m 10 A/m 30 A/m Observation Pass Fail

50 X Note 1) 2) 50 Y Note 1) 2) 50 Z Note 1) 2) 60 X Note 1) 2) 60 Y Note 1) 2) 60 Z Note 1) 2)


SK Tech Co., Ltd.


7.7. Voltage dips and short interruptions immunity test

Test set-up: Refer to the test configuration and photographs of the test setup. Test specification: Basic standard: EN 61000-4-11 Number of reductions: 3 dips/interruptions for each test level and duration Interval between events: minimum 10 seconds Voltage changes: occur at 0 degree crossover point of the voltage wave Performance criteria: C (for voltage dips; 30 % reduction, 10 periods)

B (for voltage short interruptions; 100 % reduction, 0.5 periods)



Voltage Duration Result

(% reduction) (period) Criterion Observation Pass Fail

30 10 A B C Note 1) 2) 3) 100 0.5 A B C Note 1) 2) 3)


2) The function stopped during the tests, but can be recoverable by itself operation after the tests. 3) The function stopped during the tests, but can be recoverable manually after the tests.

SK Tech Co., Ltd.


8 Photographs of the test set-up

Conducted emission test at AC mains port

SK Tech Co., Ltd.


Radiated disturbance test (9 kHz to 30 MHz)

SK Tech Co., Ltd.


Radiated disturbance test (30 MHz to 300 MHz)

SK Tech Co., Ltd.


Harmonic current emission and Voltage fluctuations & flicker test

SK Tech Co., Ltd.


Electrostatic discharge immunity test (ESD)

SK Tech Co., Ltd.


Radiated, radio-frequency, electromagnetic field immunity test (RS)

SK Tech Co., Ltd.


Electrical fast transient/burst immunity test (EFT/Burst)

SK Tech Co., Ltd.


Surge immunity test

SK Tech Co., Ltd.


Immunity to conducted disturbances, induced by radio-frequency fields (CS)

SK Tech Co., Ltd.


Immunity to power frequency magnetic field

SK Tech Co., Ltd.


Voltage dips, short interruptions and voltage variations immunity test

SK Tech Co., Ltd.


9 Photographs of EUT

External view

SK Tech Co., Ltd.


Cover opened

SK Tech Co., Ltd.


Main board

sk tech co., ltd. · sk tech co., ltd. report no.: skt-ece-140047-a1 page 7 of 46 3.4. test...

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