scanning electron microscopy & energy dispersive spectroscopy€¦ · scanning electron...

18
Scanning Electron Microscopy & Energy Dispersive Spectroscopy and X-ray Diffraction Brad Kobe Western University Surface Science Western ISO 9001:2008 Registered

Upload: others

Post on 19-Jun-2020

17 views

Category:

Documents


0 download

TRANSCRIPT

Page 1: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Scanning Electron Microscopy & Energy Dispersive Spectroscopy

and X-ray Diffraction

Brad Kobe Western University

Surface Science Western

ISO 9001:2008 Registered

Page 2: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

How does an SEM work?

Sample

Primary Beam

Backscattered electrons Secondary electrons

Characteristic X-rays

Electron Source

EDX Detectors

SE

STEM Detector

SE Detectors

Page 3: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

System Capabilities

One of the first analytical techniques used to characterize samples

Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm • High resolution images • Atomic number contrast

Energy Dispersive Spectrometry • Beryllium to Uranium • Detection limit ~ 0.1 weight % • Analysis depth typically several

microns • Semi-quantitative • Spot analysis, line scans and

mapping

Page 4: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Fast and Versatile Technique

Nano-materials Biological / Medical Coatings

Failure Analysis Mineralogy Semiconductors

Page 5: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Leaking Automotive Radiator

BSE image and elemental X-ray intensity maps of defect in cross-section

BSE Pin holes

• Where are the leaks occurring? • Result of manufacturing defect,

cracking or corrosion issue?

Page 6: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Automotive Paint Defects: Antiperspirant

Aluminium zirconium tetrachlorohydrex

• Numerous sources responsible for paint defects:

• Silicone, grease, oil, fibres and dirt • SEM/EDX can quickly identify

contaminants

Page 7: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

3D Printed Titanium alloys

BSE images showing difference in the microstructure between wrought and 3D printed titanium alloys

Wrought

3D Printed

• Comparing the microstructure of wrought and 3D printed parts

• Microstructure influences the mechanical properties

β phase

Page 8: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Gold Recovery

• Gold Recovery Process: • liberate the gold grains by grinding • extract the gold in a series of leach tanks • simultaneously adsorb the leached gold on

added activated carbon particles • strip the carbon particles of the adsorbed gold • stripped gold is then smelted

• Operation was reporting ~25% loss of Gold • Comparative analysis between feed and

leach residue using Feature Analysis • Automated gold grain search

• Evaluate degree of gold grain liberation • Evaluate compositional characteristics of gold

grains

1.

Leach Residue

Feed Ore

Page 9: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Evaluation and comparison of Au grains: degree of liberation

Size classified Au grains in the Feed Size classified Au grains in the Leach residue

Free Attached Attached/Locked Locked

Feed results: • Au grains found in all size classes • Liberation: variable across size classes

Leach residue results: • Au grains confined to size classes < 50 ums • Liberation: fine sizes are locked; coarse sizes are free • Composition of Au grains show high Bi and Sb

Page 10: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

STEM Imaging: Mars Meteorite

• Ejected from Mars ~ 22 million years ago • Sample experienced extreme pressure • Interested in shock wave generated zircon

interface • Prepared thin section using focus Ion beam • High angle transmitted electrons (DF-STEM) • Dark field imaging shows contrast between

phases (atomic number)

Sample courtesy of Dr. Desmond Moser, Earth Sciences, Western University

ZrO2

Glassy Phase

ZrSiO4

Si Zr O

Page 11: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Molded PC-ABS Aircraft Parts

• Blend of three polymers Polycarbonate + (acrylonitrile + butadiene)

• What to know the shape, size and distribution of domains

• Domains change the bulk and surface properties

• Prepared a cross-section using argon ion mill

TiO2 filler ABS

Page 12: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

X-ray Diffraction

X-ray Source Sample Detector

• Typically examine crystalline materials with repeating crystal structures • Constructive interference between X-rays and crystal planes (Bragg’s Law) • Relatively fast technique to identify phases in materials

Page 13: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

X-ray Diffraction • Phase identification of powder and bulk samples

• Qualitative & quantitative analysis

• Reflectometry • Thin film structure analysis (thickness and roughness)

• Grazing incidence XRD • Phase identification of coating while minimizing substrate contribution

• SAXS (Small Angle X-ray Scattering) • Determine particle size distribution ( 1 to 100 nm)

• Residual stress analysis

Page 14: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Powder XRD (Minerals)

Page 15: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Thin Film Analysis (Reflectometry)

2.3 nm 2.8 nm 6.0 nm

Native oxide on titanium alloy

Page 16: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Thin Film Analysis

3 nm

3 nm

45.0 nm 45.0 nm

Incidence Angle 0.3 degrees

Page 17: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Degree of Crystallinity in a Polymer

Page 18: Scanning Electron Microscopy & Energy Dispersive Spectroscopy€¦ · Scanning Electron Microscope • Magnification range: 5 X to over 1,000,000 X • Resolution less than 1 nm •

Summary

• These techniques can be used to solve manufacturing issues from many sectors including aerospace, automotive, medical and semiconductor etc.

• SEM/EDX spectroscopy fast technique to examine materials

• XRD quickly identifies phases in a variety of materials

• High resolution images • Atomic number contrast • Elemental analysis (Be to U)

• Semi-quantitative • detection limit 0.1 weight %

ISO 9001:2008 Registered

• Thin film thickness measurements • Particle / void size measurements • Stress analysis • Preferred orientation