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Dr. T. K. Bhattacharyya,Dept. of E&ECE RF Circuits Design & Analysis Dr. T K Bhattacharyya Dr. T K Bhattacharyya E & ECE Dept. IIT Kharagpur . .

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Dr. T. K. Bhattacharyya,Dept. of E&ECE

RF Circuits –Design & Analysis

Dr. T K BhattacharyyaDr. T K Bhattacharyya

E & ECE Dept.IIT Kharagpur..

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Basics of RF

Dr. T. K. Bhattacharyya,Dept. of E&ECE

What is RF?

•Why Lumped parameters models failed ……………….

• Kirchoff's to Maxwell’s…….

• Failure of two port circuit parameter (Z, Y,ABCD) ……..

• Scattering parameter( S-parameter) on the basis of Maxwell equation comes in …

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Application area of the RF-IC designer

•Wireless communication

•Radar

•Navigation

•Remote sensing

•RF identification

•Automobile and Highways

•Sensors:

•Medical

•Radio- astronomy and space exploration

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Beauty of RF- IC Design: Link between Microwave Engineer and Design Engineer

kirchoff’s law

Total voltage around a loop is zero( KVL)

No net current build up at any node(KCL)

•If ε & μ =0, (c α ) i.e infinitely fast wave propagation of wave gives KVL and KCL

•As the physical dimension of circuit element & sub-circuit in a IC chip is very less (even less than 1/10th of λ [ 30 cm in air at 1 GHz] ) , so finiteness of the speed of light is not noticeable inside chip, so a full transmission line ( Microwave) for on-chip design and analysis is generally unnecessary. Kirchoff’s law is well suited for on-chip design

•But for interfacing the RF signals in / out of the chip, we need connectors, boards, cables etc. Where transmission-line effects cannot be ignored

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Comparison of Analog and RF/MW

( Analog [Low frequency<100MHz] ) ( RF/MW[ High frequency>100MHz] )

Conductor

Capacitor

Resistor

Inductor

Simple wire

Microstrip line

Ceramic

Carbon Thin Film SMD comp.

Thin Film SMD comp.

Wire Wound

Thin Film SMD comp.

1. On Discrete PCB component

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Comparison of Analog and RF/MW

( Analog [Low frequency<100MHz] ) ( RF/MW [High frequency>100MHz] )

1. On Performance Based

A. Small signal AC equivalent circuit analysis

B. Linearity

C. Stability

D. Noise (on few cases)

A. Small signal AC equivalent circuit analysis with parasitic i.e. Good circuit Modeling

B. Matching

E. Linearity

D. Stability

C. Noise

F. Sensitivity

G. Dynamic range

Dr. T. K. Bhattacharyya,Dept. of E&ECE

RF Circuit & Systems – Design IssuesPhase shift of the signal is significant over the extent of the component because it’s size is comparable with the wavelength.

The reactance of the circuit must be accounted for, particularly those associated with the parasitic of the active devices.

Circuit losses causes degradation of Q, reduction of frequency selectivity and noise performance.

Noise especially arising from the circuit can be significant and it’s effect needs to be modeled.

Electromagnetic radiation capacitive coupling and substrate coupling significantly alter the performance of the circuit.

Reflection issues, because circuit size is of the order of a wavelength.

Circuit design should take care to ensure reflections do not cause any loss of gain, power, or failure of components.

Nonlinearity which causes distortion and unwanted frequency components is undesirable, but it may become essential part of the circuit operation, as in mixing or local oscillators.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

High Frequency Device modeling

Silicon Technologies

BiCMOS MOSBipolar

Junction Isolated

BJTs

DielectricIsolated

PMOS NMOS

CMOS

Dr. T. K. Bhattacharyya,Dept. of E&ECE

High Frequency Device modeling (contd.)Visualization of Process Flow

Protective Overcoat

CVD Oxide

p-epi

p-substrate

n+ n+

Gate oxidepolyFOX

contact

Metal-1

via

Metal-2

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Standard Digital CMOS is hardly the ideal medium for RF ICs, because of :Lossy Silicon substrateLarge source/drain parasiticsHigh device noise and poor 1/f noise performanceSeries gate resistance

But,Device scaling …faster CMOS fT (and fmax) ….range of 60GHz doubles roughly every 3 years.CMOS is cost effectiveBoth digital & analog block can be designed on same substrateHigh linearity; Low distortionLow power consumptionOn-chip realization of passive inductors and capacitors

CMOS BJT

Symmetric behavior.

Better linearity (Higher signal swing).

Higher fT at sub-micron feature size.

Better scaling properties.

Low power (no gate DC current).

Higher gm for same bias.

High fT.

Low thermal and 1/fnoise, but input current noise.

Lower DC offset .

No body effect.

Lower overdrive (Low VCE sat).

WHY CMOS FOR RF-IC?

Dr. T. K. Bhattacharyya,Dept. of E&ECE

R

RRpoly Cgs Cgd Cds

Csub

•To calculate magnetic coupling between two adjacent metal line, interlayer capacitance , EMI between subcircuits & on-chip passive component (such as inductor and MIM capacitor) , the Maxwell EM equation is required ( Challenging issue !!!)

Dr. T. K. Bhattacharyya,Dept. of E&ECE

RF CMOS MODELLING

Maximum unit power gain Maximum unit power gain frequencyfrequency

Maximum CutMaximum Cut--off frequencyoff frequency

““Standard” (digital oriented) MOS models do not allow for RFStandard” (digital oriented) MOS models do not allow for RF

In RF, Cgs ( whose effect negligible in low frequency analog) affects the matching with

successive blocks . Frequency dependence of Transconductance(gm )

Dr. T. K. Bhattacharyya,Dept. of E&ECE

c.f Lee P-68,70 gc oxC C= cb siC C=sbo

jsb1/ 2sb

0

CC V(1 )=

d b oj d B

1 / 2d b

0

CC V(1 )=

Long channel effect

n ox gs t21

Id 2WC (V V )L

= μ −

g s t3 nf T 22 2 L

( V V )μ=

π−

Short channel effectn

d

c

V1

μ ε=

ε+

ε

d vd y

ε =

d I dI Q WV (y)=,

d I nc

1 dv dvI (1 . ) W Q ( y)dy dy

+ = με

n o xd g s t

g s t

c

2C WI ( V V )V V L2 ( 1 )L

μ= −

−+

εn o x

g s tg s t

2C W ( V V )2[1 ( V V )] L

μ= −

+ θ −

g s t

cm o x s c l

g s t

c

2 ( V V )1 1

Lg W C V

2 ( V V )1

L

−+ −

ε=

−+

ε

scl n cV = μ ε

,

• fT independent of overdrive voltagegs t(V V )−

• fT inversely proportional to L

RF CMOS MODELLINGRF CMOS MODELLING

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Noise

• Thermal Noise-Brownian motion of thermally agitated charge carriers - generated in every physical resistor

- pure reactive components generate no thermal noise

Thermal Noise in MOSFETTh most significant source of noise Channel Noise:

In2 = 4kTγgm

• γ ~1 at a zero VDS for long channel device, 2/3 at saturation, 2-3 for short channel transistor

Significance :The significance of noise performance of a circuit is the limitation it places on thesmallest input signals(MDS) the circuit can handle before the noise degrades the quality of output signal.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

• this noise is negligible at low frequency, but can dominate at RF

• δ ~ 4/3 in long device

- both drain and gate noise share a common origin and they are correlated

Shot Noise-Gaussian white process associated with the transfer of charge across an energy barrier

- due to DC current through p-n junction, gate channel

Flicker noise in MOSFET-random trapping of charge at oxide interface- modeled as a voltage source in series with gate

Gate induced noise

Thermal agitation of channel charge cause fluctuation of channel potential. This couples capacitively with gate terminal, leading to gate noise

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Noise figureNoise figure (cont..)Noise figure of cascaded stages ..

For two stage case it can be shown

For m- stages

• NF of each stages is calculated with respect to the output impedance of previous stages

• The noise is contributed by each stage decreases as the gain preceding the stages increase

•That’s why the first stage of any system should have higher gain with low noise figure ( PRIME CRITERION FOR LOW NOISE AMPLIFIER (LNA) DESIGN OF A RECEIVER)

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Sensitivity

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Dynamic Range

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Modeling of Arbitrary ShapedRF Spiral Inductors for Circuit Simulation

Complex field coupling between turns.

For on- chip spiral inductor the following difficulties arise due to conductive substrate:

1) Eddy current in the substrate 2) Coupling between field generated by the coil and field

generated by the eddy current. This mutual coupling increases the active part of the current and as a result Q decreases.Proposing a New Generic Methodology of Modeling RF Spiral Inductor for Circuit Simulation.Developing a System Identification Algorithm for the proposed modeling technique.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Direct Transfer-Function Estimation from Frequency Response Data:

Dimension and

Material Property

Numerical Techniques

or Measurement

Transfer Function (s)

[S( )] Parameter

Model Order &

Model Parameter

[Y( )] Parameter

Zin( ) = 1/Y11( )

Estimation Algorithm

kω kω

kωkω

inZ

ind11

111

111

111

1Z (s) ;Y (s)

1L Re[Y (s)];

Im[Y (s)]QRe[Y (s)]

=

=

Dr. T. K. Bhattacharyya,Dept. of E&ECE

The basic Idea

Both model order and model parameters are identified with PSO.

Two independent PSO has been used.

One PSO has been used for model parameter Estimation for a given model order.

Another PSO has been used for model order Estimation.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Case Study ITABLE I

Dimensions Of The Inductor Used In Case Study I

Outer Diameter (μm) 120

Metal Width; Metal Spacing (μm) 5.5; 3

No. of Turns 6

Metal Layer; Under Pass M6; M5

Dr. T. K. Bhattacharyya,Dept. of E&ECE

TABLE IIParameters Of The Estimated Transfer Function

K (Gain) 1.5771039E-10

Z1 (1st Zero) 1.0146618E+9

Z2 (2nd Zero) 1.2566E+13

P (Pole) 8.6472026E+11

Dr. T. K. Bhattacharyya,Dept. of E&ECE

TABLE IIIEstimated Parameters Of The Nine-Parameter Model

LS (nH) 1.3041006

RS (Ohm) 2.385343

RSi (Ohm) 1000

CS (fF) 6.1117785

COX (fF) 484.85646

CSi (fF) 8.1567198

Dr. T. K. Bhattacharyya,Dept. of E&ECE

109

1010

1011

1012

10

15

20

25

30

35

40

45

50

55

Frequency (rad/sec)

Mag

nitu

de (

dB)

Measured ZinZin of 9 Parameter ModelEstimated Zin

109

1010

1011

1012

55

60

65

70

75

80

85

90Measured ZinZin of 9 Parameter ModelEstimated Zin

Dr. T. K. Bhattacharyya,Dept. of E&ECE

RF Transceiver Design

Dr. T. K. Bhattacharyya,Dept. of E&ECE

From System level to Component level specifications (contd.)

Sensitivity of the Receiver

Block Diagram of the Receiver System

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Noise Figure of the Front-end

Given

•SNRout Required = 14 dB

•Sensitivity Required( Pin,min) = -90 dBm

•Bandwidth = 2 MHz

The required Noise Figure of the receiver front-end is calculated from the sensitivity eqn.

- 90 = - 174+ 10 log10(2x103) + NF + 14

NF = 7 dB

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Gain, NF and IIP3 of cascaded stages

Total Noise Factor

Total IIP3

p1 p2 pkA A AAp = × × ×L

32 k1

p1 p1 p2 p1 p2 p(k-1)

NF 1NF 1 NF 1NF=NF .....A A A A A ...A

−− −+ + + +

p1 p1 p2 p1 p2 p(k-1)

3 3,1 3,2 3,3 3,k

A A A A A ...A1 1= .....IIP IIP IIP IIP IIP

+ + + +

Total Gain

Where NFi, Api and IIP3,i are respectively Noise Factor , Available Power Gain and input 3rd order intercept point of the i-th stage

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Example- Gain and NF calculation

Dr. T. K. Bhattacharyya,Dept. of E&ECE

RF Transceiver Design:Low Noise Amplifiers

Dr. T. K. Bhattacharyya,Dept. of E&ECE

LOW NOISE AMPLIFIERS

Characteristics :

First gain stage in receiver

Received signal very weak (~μV)

Gains usually moderate (10-20 dB typical)

Noise Figure (NF) should be as low as possible (<3 dB typical)

Linearity is also an issue

Reverse Isolation should be high

Noise Figure: 2~3dB

Gain: 15~20dB

IIP3: ~ -10dBm

Input/output Impedance: 50 Ohm

Input/output Return Loss: -15dB

Reverse Isolation: >30dB

Stability Factor >1

Design consideration :

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Different structure of CMOS LNA

All structures are narrow-band

Common source LNACommon source LNA ac equivalent modelac equivalent model

Capacitive input impedance.Lg cancels Capacitive term.A parallel RS (50 Ω) is added to match input source R50.

To reduce the effect of Zout (img)on tuning circuit, C value should be large compared to Zout

Corresponding circuit

Disadvantage of this circuit :

Due to Rextra , the power divide by 2.

NF ~1+ (γ/α) * Rextra/R50 , γ & α (=gm/gdo) are device parameter. NF~3-4 dB.

Due to Cgd reverse isolation(S11) Bad.

Cgd affects stability due to presence of zero in transfer function (Vout/Vin)

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Most popular LNA topologyRemedy ………

“ Cascode source degeneration common source”Equation for choosing Input matching network ComponentEquation for choosing Input matching network Component

Choosing of device (W/L) & Vgs : determine gm & Cgs value , then Ls and Lg can be found.Effect of channel resistance & gate resistance : modify above equation (Fingering is done in layout to reduce this value ).The parasitic of inductor must be considered for calculating practical component values.

Equation for choosing output matching network componentEquation for choosing output matching network componentGate of M2 is ac ground, so Gate of M2 is ac ground, so output cap due to Zout is Coutput cap due to Zout is Cgd2gd2onlyonly….…. C value lesser.C value lesser.As impedance looking to source As impedance looking to source of M2 is 1/gof M2 is 1/gm2 m2 as a result Miller as a result Miller capcap effect gets reduced.effect gets reduced.

Good L, Q is 2 Good L, Q is 2 ––3, then get Rd, 3, then get Rd, From Rd findFrom Rd find--out equivalent Ld out equivalent Ld by by ASITIC with maximum ASITIC with maximum possible Q.possible Q. then calculate C then calculate C from from ωω00, check whether C is , check whether C is much larger(~10 times of much larger(~10 times of CgdCgd))

Dr. T. K. Bhattacharyya,Dept. of E&ECE

1 V Low Noise Amplifier

Performance Parameters

Values in the typical corner

Supply Voltage 1 Volt

Bandwidth 825 - 975 MHz

Voltage Gain 16.53 dB

Power Consumption 4.06 mW

Noise Figure 2.327 dB

Native MOSes used to facilitate low voltage operationThe input N/W consisting of LG and CGS is tuned to

900 MHz.The LC load is also tuned to 900 MHz.Gate induced noise is included in simulation by an

equivalent resistor.

Schematic

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Subthreshold RF Design:Multiband & Wideband Applications

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Introduction

Major challenges in VLSI Design:Power Consumption.Performance (Speed/Area).Reliability.

Subthreshold region designWeak inversion MOSFET provides sufficient transconductance.

Very low power consumption.Major RF Front-end modules

Low Noise Amplifier (LNA)Voltage Controlled Oscillator (VCO)

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Subthreshold Region:

For a MOSFET:

Exponential Current Equation:

Important parameter in subthreshold:Subthreshold Slope

GS THV V<

2.3 2.3(log ) (ln )

GS GST

D D

dV dVS Vd I d I

η⎡ ⎤

= =⎢ ⎥⎣ ⎦

;

( )GS Th

T

V VV

DS onI I e η−

=

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Single Band LNAInput Impedance (in saturation):

Tune gm or LS:Real Part = 50 Ω

Imaginary Part = 0

Input Matching :Pad-Pin parasitics modify input impedance.Separate off-chip matching network required.Matching needed over a bandwidth – Q based matching.

Zin

Iout1m s

in sgs gs

g LZ sLC sC

= + +

LNA input Device

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Subthreshold Operation and Modeling

Accurate input impedance modeling:Closed Form expression of input impedance.Automatic generation of Q-based matching network.

Effect of parasitic capacitors Device capacitors play a major role.Channel not fully formed.Gate-to-Bulk & Source-to-Bulk capacitors

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Subthreshold Operation and Modeling (Contd.)

Lpin Lbond

LS

RSS

M1

M2

LC

R

CpadCframe

Vout

Zin

Schematic of packaged cascode LNA

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Subthreshold Operation and Modeling (Contd.)

+

- +

-

Lpin Lbond

Cframe Cpad Cgb1 Vgs1

Cgd1

Cgs1

gm1Vgs1

Csb1Ls

RS

gm2Vgs2

Vgs2 Cgs2+Csb2+Cdb1

Cout

ZL

Vx

V0V1

Modified Subthreshold region model of LNA input

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Verification of Model

Effect of Cgb and Csb

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Verification of Model (Contd.)

Model and simulation results coincide

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Q-based input matching

Matching over a bandwidth:Bandwidth defined by Quality Factor (Q)

Conventional techniques:and T matching techniques.

0fQf

π L

C1 C2RL RL

L1 L2

C

match T matchπ

Dr. T. K. Bhattacharyya,Dept. of E&ECE

π match network analysis

Variation of matching components with frequency

Dr. T. K. Bhattacharyya,Dept. of E&ECE

π match network analysis (contd.)

Variation of matching components with LS

Dr. T. K. Bhattacharyya,Dept. of E&ECE

π match network analysis (contd.)

Variation of Matching components with VGS

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Effect of Finite component Q

Severe degradation of matching performance

S11 for ideal case and Q=30

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Limitations of Conventional Approach

Unsymmetrical profile for S11 over the bandwidth.

Similar problems with Real and Imaginary part of input impedance.

Effect prominent at lower frequency bands [GSM band (900MHz)].

Dr. T. K. Bhattacharyya,Dept. of E&ECE

PSO Based Matching Technique

Based on Particle Swarm OptimizationHeuristic method.Based on flocking of birds/swarms.Reaches optimum by modifying velocity of each particle.

PSO based approach applied to Q-based matching

Desired Real part profile -

Dr. T. K. Bhattacharyya,Dept. of E&ECE

PSO Based Matching Technique (Contd.)

Equations Optimized :

1 | Re( @850 ) 35 | | Im( @850 ) |in inf Z MHz Z MHz= − +

2 | Re( @950 ) 35| | Im( @950 ) |in inf Z MHz Z MHz= − +

3 | Re( @900 ) 50 | | Im( @900 ) |in inf Z MHz Z MHz= − +

1 1 2 2 3 3optf w f w f w f= + +

Wi’s are weights of fi. Weight of function at 900MHz was maximum

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Results of PSO Based matching

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Concurrent Dual-band LNA

Existing technique (Hashemi):Cancellation of imaginary part at2 frequencies using LC tank network

Real Part = made 50 Ω by adjustinggm and LS.

Lbond

LS

RSS

M1

M2

LC

R

Vout

Zin

Lg

Cg

Sm

gs

LgC

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Concurrent Dual-band LNA (Contd.)

Drawbacks of existing technique:

Pad/Pin parasitics severely influence both real and imaginary part of input impedance.

Input matching is only at 1 frequency, i.e. not Q-based over a bandwidth.

Value of LS required for input match is generally very high at lower center frequencies.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Proposed PSO based matching

LNA input impedance at 2 predefined frequencies

Matching network value for 2 frequencies

Unity Current Source

Q-based pi match

Select Network topology for each pi element

LC tank, LC series, combination, etc

Calculation of network values

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Results of dual-band matching

Accurate input match at both frequencies (900MHz and 1.8GHz)

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Finite Q effect

Finite Q of components affect matching performance.

Individual networks have different effects on final input match.

Lseries and C1 component finite Q have minimal effect on matching performance.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

RF Transceiver Design:Mixers

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Mixer

Mixers Indispensable components of transceiversUsed to up-convert or down-convert a baseband signal to/from the carrier frequency Basic philosophy behind mixing is MULTIPLICATIONSay we have 2 frequencies f1 and f2, then cos 2πf1t and cos 2πf2t are the 2 signals

Multiplying them gives evidently the f1-f2 and the f1+f2 components, out of which, one we select through filtering

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Downconversion Mixers

The most basic Downconversion mixer is the Gilbert cell mixer

RF signal: Radio Frequency signalLO signal: Local Oscillator signalVout gives the IF or the Intermediate frequency signal

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Basic terms associated with mixing

Conversion Gain: Gc= VIF/VRF=> the 2 signals are evidently at 2 different frequenciesNoise Figure (in dB): S/N ratio at IF output port –S/N ratio at RF output port

NFSSB= NFDSB + 3dBLinearity: 1dB compression point, IIP2 and IIP3 shown as

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Gilbert Mixer…… analyzed

Approximating the LO signal as a square waveGc = gmRL

Noise figure is typically of the order of 10-15dB

The main catch, however, is in the DC offset arising from the low LO-RF isolation as shown.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Hmmm….so?

The problem of DC offset arising out of poor LO-RF isolation can pose serious problems by saturating the IF stage The problem arises simply because the LO and the RF bands lie in such close proximity in the frequency spectrum

……………..What if we mix LO(=RF/2) with RF instead of RF with LO=RF?This is precisely what we mean by even harmonic mixing

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Even Harmonic Mixing

Harmonic mixer suppresses the fundamental mixing between the signal and LO

It allows mixing of the signal with the harmonics of LO

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Lets “even” out things!!

The basic structure is as follows:The RF signal is amplified by the transconductor stage to generate the RF current.This RF current is fed to a switching stage controlled by the LO signals. The transconductor has been designed as shown:

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Let’s “even” out things (2)

The LO-controlled switching stage is as shown:

The LO signals are applied in quadrature mode i.e. each one is 90° phase-shifted from the other.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Let’s “even” out things(3)

The quadrature LO signals are applied in an AND-OR mode as shown in the switching stage resulting in a frequency doubling as shown diagrammatically

AND

OR

Dr. T. K. Bhattacharyya,Dept. of E&ECE

RF Transceiver Design:Frequency Synthesizers

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Frequency Synthesizer Block Diagram

PLL-based Frequency Synthesizer consists-Phase Frequency Detector (PFD)Charge Pump (CP)Loop Filter (LF)Voltage Control Oscillator (VCO)Frequency Divider

Integer N Divider (Integer N Frequency Synthesizer)Fractional N Divider (Fractional N Frequency Synthesizer)

Block Diagram of Frequency SynthesizerBlock Diagram of Frequency Synthesizer

OUTPUT FREQUENCYPFD CHARGE

PUMPLOOP

FILTER

VCO

FREQUENCYDIVIDER

REFERENCE FREQUENCY

Channel Control

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Open loop

Closed loop

sK

sKK vd =

Ks /11

+That is fine for small signal linear control loopBut large signal(bias) output of PD may not be directly compatible withVCO input. Need gain/attenuation/shift/filtering: Loop filter

Normally vp is discrete(like PWM)Required vo is steady (DC)vp can be converted to vo by simple LPF

Discrete nature of PD (and vp) can be treated by continuous linear loopif bandwidth of the loop is within 1/10-th of the frequency of vp

fIN +fOUT

-PD VCO 1/s

w

fIN +fOUT

-PD VCO 1/s

wKh

Basic PLL

vp vovp vo

Kh

Dr. T. K. Bhattacharyya,Dept. of E&ECE

x(t)

y(t)

PD output

LPFoutput

+

-PD

VCO 1/s

Loop filt

x(t)

y(t)

A walk around the loop

Dr. T. K. Bhattacharyya,Dept. of E&ECE

w0 w0 + Dw

System has memoryAt lock, input and output frequencies are equal

x(t)

y(t)

PD output

LPFoutput

Frequency step at input

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Simple XOR PD works for a small range of Df, for a large range it becomes nonlinear/non-monotonic

-2p -p 0 p 2p

+

-PD

Phase Detector

Phase error

PD o/p

XOR Phase detector

Kd = VDD/p

Steady state phase error for most useful range : ?

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Phase Detector

Sequential Phase detector (SR flip-flop)

x(t)

y(t)

o/p

Kd = VDD/2pMost useful range offered when Df = p : cannot use for 0 steady state phase error

Df

-4p -2p 0 2p 4p

x(t) set

y(t) reset o/p

VDD

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Phase Frequency Detector (PFD)

Three-state state machine representation

Output UP and DN pulses

x(t)

y(t)

up

dn

x(t)

y(t)

up

dn

+

-PFD

x(t)

y(t)

up

dn

Create down pulse

All reset Create up pulse

x(t) rising edge x(t) rising edge

y(t) rising edge y(t) rising edgey(t) rising edge

x(t) rising edge

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Phase Frequency Detector (PFD)

Sequential three-state PFD provides large and linear detection rangeAlso it indicates sign and magnitude of frequency error since once it is set by one edge of one clock, can only be reset by edge of the other clockPhase error detection is sampled in nature : introduces delay in the loop

Used PFD

DFF

DFF

‘1’

‘1’

DN

UPRCLK

FCLK

0 2p 4p

VDD

- 4p - 2p

Average Voltage

Phase error

PFD Characteristics

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Phase Frequency Detector (PFD)

Dead zone: phase error below the zero gain region cannot be correctedNon-monotonic / non-linear behavior near 0 is also a problem

PFD dead zone and non-linearity near zero

Phase error

PFD o/p

Phase error

PFD o/p

Dead zone Non-linearity

Dead zone problem is eliminated by using a certain minimum UP and DN pulse under lock condition

Simulated waveform of PFD under lock condition

DN

UP

Vfbk

Vref

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Charge Pump (CP)

out

outDN

UPB

n2

DNB

UPd1

d2

i bias

i cp

i cp

n3

n1

M1

M2

M3

M4

gnd

Vdd

DN

UPB

d3

d4

MU

MD

Charge Pump current ICP= 24 uA

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Phase-Frequency Detector + Charge pump

+-

PFD

x(t)

y(t)

up

LPFoutput

dn

x(t)

y(t)

up

dn

LPFoutput

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Phase-Frequency Detector + Charge pump

PFD & Cpump combined gain characteristic is obtained by plotting average charging current for different phase differences between x(t) and y(t).

For I1 = I2 = I

+-

PFD

-4p -2p 0 2p 4p

I1

I2

x(t)

y(t)

VOUT

I

Status of UP/DOWN pulses is converted to a DC current to get PFD + CP gain characteristic.average charging current = (t1/T)*I1

average discharging current = (t2/T)*I2

t1: on time of UP pulset2: on time of DN pulseT: time period

Average current

Phase error

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Integer N Frequency Divider

Circuit diagram of CML DFF AND/NAND gate

Divide by 2/3 cell based topology is chosen for the divider implementation

Eight such cells are cascaded to achieve the required division factor range of 480 – 495

DFFs of first two 2/3 cell of divider are designed in CML logic. DFFs of remaining six cell of divider are designed in digital logic

Current for the fastest DFF circuit is kept to 200 µA. It is halved for consecutive CML stage.

Total divider current of 1.6mA from 1.8V supply

For such n stage divider, output signal time period (Tout) is expressed as function of input signal time period (Tin) by the following expression. Where pr is the division control signal of the rth 2/3 cell.

1 2 11 2 1(2 2 2 ........ 2 )n n n

out n n inT p p p p T− −−= + + + + +

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Integer N Frequency Divider

Simulated waveforms of divider for divide by 490

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Layout of the chip

Die area: 1812.4um x 1965.04um

Dr. T. K. Bhattacharyya,Dept. of E&ECE

RF Transceiver Design:Power Amplifiers

Dr. T. K. Bhattacharyya,Dept. of E&ECE

PHASE NOISE AN ISSUE OF CONCERN

WHAT IS PHASE NOISE ?

It is the most critical parameter in the design of a high performance VCO or for that matter in any application requiring spectral purity

•When one talks about spectral purity he essentially means an impulse at the frequency of interest. But phase noise causes spilling around this central frequency of interest in the form of side bands.

•So instead of having all the energy concentrated at one single point in the frequency domain, the energy gets distributed at and around the central frequency leading to wastage of power

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Phase noise manifests itself in the form of timing jitter (although there are other factorsthat contribute to jitter as we shall see shortly) in the time domain.Phase noise as the term suggests is addition of unwanted phase (phase angle) to any desired frequency. Mathematically, it is defined as a zero-mean stochastic process φ(t) in the general expression for the output voltage of an oscillator which is given by

Where the second term in the first bracket represents amplitude error while the time dependent phase term in the second bracket, φ(t) represents the phase error. In general the amplitude control mechanism takes care of the amplitude error and it is the phase error that is of real concern to us. (even if not taken care of completely the amplitude error is not of great concern to us. We are interested in the spectral purity of the signal.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

What contributes to Phase noise ?

Any oscillator circuit consists of both passive as well as active components. They both contribute to noise. In general the noise is composed of the thermal noise, the flicker noise & the shot noise. Shot noise is a type of electronic noise that occurs when the finite number of particles that carry energy, such as electrons in an electronic circuit or photons in an optical device, is small enough to give rise to detectable statistical fluctuations in a measurement.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

How To Deal With Phase Noise ?

Thus far we have dealt with phase noise in general but we will have to quantify it if we have to make it a basis of our design implementation and so the obvious question is how to interpret it or what kind of mathematical model do we have for it?As such there are three mathematical models (1) Linear Time Invariant model (2) Linear Time Variant model (3) Non-Linear Time Variant modelHere we will briefly present the important points of the first two models. The 3rd model although perfectly fine is way too complicated for us to make any use of it in practical implementation.The first model the linear time invariant one is due to Leeson and so is often referred to as Lesson's model. He derived an expression for the phase noise spectral density of a feedback oscillator. The general expression is

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Where F is the circuit noise factor, k is the Boltzmann’s constant, T is the temperature,P0 is the oscillator output power, QL is the loaded quality factor of the resonator, ω0

is the oscillator fundamental frequency, ωC is the flicker noise corner frequency and Δω is the offset

frequency.

In fact Leeson’s model is a correction of an already existing model that ignored the noise contribution from the active devices. Actually if we take into account a lossless energy restoration device coupled with an LC tank

We would get the following equation

Dr. T. K. Bhattacharyya,Dept. of E&ECE

A comparison of the oscillator phase noise vs the offset frequency w.r.t. the central

frequency for the old model and the corrected model shows the effectiveness of Leeson’s model

But the fact that neither the corrected model nor the old one can make quantitative predictions about phase noise indicates that at least some of the assumptions used in the derivations are invalid, despite their apparent reasonableness. To develop a theory that does not possess the enumerated deficiencies we need to revisit, and perhaps revise these assumptions. And this was done by Lee and Hajimiri leading to the making of time variant model.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Lee and Hajimiri suggested that although the linear assumption is more or less valid, the time invariance would effectively mean that the irrespective of the point of time in the timedomain at which the noise or the error shows up it’s effect on the system would remain thesame. This assumption was challenged by them and they introduced something known as the impulse sensitivity factor Γ(x).

It gives us an idea of the disturbance an impulse of error would produce depending on the time at which it shows itself. Based on it the system could be so designed so as to ensure that the error which if unavoidable should be minimum.The ISF is a periodic function and has it’s maximum value at the zero crossings of a signal and minimum value (0) at the points where the signal (required) has it’s maximum value.

The figure on the shows the output of a LC oscillator and a ring oscillator in that order. While that on the bottom shows their impulse response in the same order.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

A The impulsive phase disturbance can be written as

We can compute the excess phase using the superposition integral (In simple words simply sum up the contribution due to impulsive disturbances throughout the cycle)

A The ISF being a periodic function can be expressed as a Fourier series.

There isn’t exactly a healthy correlation between the various noise sources in the above expression and so the extra phase term in the cosine expression is ignored based on the assumption that the different noise sources are uncorrelated making their relative phase irrelevant.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Now we substitute the last expression into the earlier expression for the extra phase.Considering a noise source with frequency very close to an integer multiple of the central frequency say

Substituting this in place of the noise source in the equation used to calculate the extra phase gives us a general result for a noise source with frequency close to an integer multiple of the central frequency. In computing this expression we have ignored contribution from product of trigonometric expressions with different frequencies based on the assumption that their contribution would be minimal since whenever the product of a sine and a cosine or a sine and a sine or vice versa is computed over one full cycle for integer multiples of frequency the end result is a zero and since here we have frequency of one term close to an integer multiple of the other this assumption is valid

A The spectrum of has two equal side bands at even though the injection of noise occurred at some near integer multiple of the central frequency.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

The previous expressions simply give us an idea of excess phase but we need to see how it affects the output voltage. To do so we consider the general expression for the output voltage. Note that the amplitude noise or disturbance being mentioned here in this expression is already taken are of by the nonlinear amplitude control that exists in the oscillator.

Performing Phase to voltage conversion and assuming small amplitude disturbances, results in two equal power-sidebands symmetrically disposed about the central frequency

A Extending the above result to the general case of white noise gives us

It is clear from the above expression that minimizing the coefficients of ISF would ultimately minimize the phase noise. Another very apparent observation that can be made is that the power due to white noise sources varies as 1/ f2 thus explaining the middle segment of Leeson’s curve

Dr. T. K. Bhattacharyya,Dept. of E&ECE

The ISF approach is the more accurate approach amongst the existing methodologies. But the real problem with the ISF approach is the determination of the ISF function. Of the existing ways to determine the ISF the one that determines it most accurately is by carrying out transient analysis of the oscillator by feeding it with impulses varying in their timing from the start to the end of one cycle. The oscillator is simulated for a few cycles after the injection of the impulse. In order to use this method one has to have the oscillator design before hand.The simulation can be carried out in CADENCE software.

Once the ISF is known it needs to be expanded in a Fourier series to determine the Fourier coefficients. One may also use Fourier analysis directly ( in order to determine the various coefficients ) if we have the complete ISF curve (MATLAB can be used for this purpose).

Apart from it we would be needing the device noise 1/f corner frequency and a specification of the offset from the central frequency at which we wish to calculate the phase noise

Phase Noise Prediction

Dr. T. K. Bhattacharyya,Dept. of E&ECE

TRADE OFFS•supply voltage•output power,•power efficiency•distortion

REQUIREMENTS•Ability to work at low supply voltages •High operating frequencies.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Dr. T. K. Bhattacharyya,Dept. of E&ECE

CMOS PA: Related Design Issues

Low breakdown voltage of deep sub-micron technologies Substrate interaction in a highly integrated CMOS IC Low value of optimum load resistance requires higher impedance transformation ratioLow Q values of inductors PA delivers large output current – parasitics in circuit may cause performance degradationConventional transistor models for CMOS devices are moderately inaccurate for RFICs.

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Power Amplifier Characteristics

Function: Deliver power to antenna

Power Dissipation easily dominates the transceiver power budget

Key Specification:

Maximum Output Power

Efficiency/Power Added Efficiency

Power Gain

Linearity

Stability

Radiation Pattern

Thermal Emission

Dr. T. K. Bhattacharyya,Dept. of E&ECE

PERFORMANCE METRICS

Output PowerEfficiencyLinearity

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Output PowerPower delivered to the load within the band of interest.

Load is usually an antenna with Z0 of 50Ω

Doesn’t include power contributed by the harmonics or any unwanted spurs

Sinusoidal

Modulated Signal

Dr. T. K. Bhattacharyya,Dept. of E&ECE

EfficiencyPower Added Efficiency Most common efficiency metric

DC RF

Shows how efficiently supply DC power is converted to RF power

Drain efficiency is often used to indicate the efficiency of a single power amplifier stage

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Linearity

Linearity Requirement can be different based on modulation

Variable EnvelopeInformation is carried in the amplitude

∏/4 DQPSK and OQPSK

Constant EnvelopeInformation is carried in the phase

GMSK and GFSK

Dr. T. K. Bhattacharyya,Dept. of E&ECE

CLASSIFICATION OF RF POWER AMPLIFIER

LinearSwitch mode

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Linear PA: Class A,B,AB and C

transistor acts as a current source

Since certain amount of voltage must exist to keep the device in the current source mode, there is always certain power dissipation on the device

Switch mode PA: Class D,E,F

Active device acts as a switch

There is either zero voltage across or zero current through a switch

100% efficiency possible

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Resistor Loaded Class A Amplifier

In a Class A amplifier, the active device conducts current 100% of time

For maximum output swing (and thus output power), the quiescent output voltage is set at VDD/2, and bias current at VDD/2RL

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Other Power Efficiency Parameters

Normalized Power Output Capability PN

Ratio between power delivered to load and peak current times peak voltage on the output deviceMeasure related to output device power handling

Power Added Efficiency (PAE)Added signal power by the amplifier divided by DC biasing power

At low frequencies, PAE=η for the previous amplifier

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class A RF Power Amplifier

Inductor improves peak amplitude, thus power efficiency

L1: Large inductor: acts as current source

C1: DC block (prevents DC power in RL)

L2, C2: Output tank circuit

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Drain Voltage and Current Waveforms

Since L1 presents a DC short to VDD, the drain voltage waveform must be symmetric around VDD. the maximum amplitude of sinusoid at the drain is VDD.

The drain voltage (and the output voltage) swings to twice the power supply! (in practice limited by device breakdown)

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Normalized Power Output Capability

Class A amplifiers are linear, but have poor efficiency!

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class B Power Amplifier

Same circuit, but Vbias is set so that M1 conducts only 50% of time

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class B Power Amplifier

Vbias is set so that M1 conducts only 50% of time

The harmonics in the output waveform are filtered by output tank circuit

The fundamental component is a linear function of the input

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class B Power Efficiency, Continued

The DC component of max. iD half-sine wave is

The DC power is then

And the efficiency

Normalized Output Power Capability:

Since DC power is proportional to the amplitude, η is proportional to square root of output power: slower degradation at lower power than class A

Same as Class A

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Conduction Angle vs. Class

Conduction Angle φ :2φ is the portion of period during which the output transistor M1 conducts

2φ=2π: Class Aπ<2φ<2π: Class AB2φ=π: Class B0<2φ<π: Class C

(Class AB or C output cannot be a linear function of input)

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Push-Pull Amplifier

Depending on Vbias and Vinpush- pull amplifier can be operated as Class A, B, AB, C, or D amplifier.Theoretically a Class B push- pull amplifier has low distortion comparable to class A because either half will be conducting at any time.Real Class B is not possible because devices do not have abrupt turn- on characteristic–most are Class AB

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Voltage and Current Waveforms of Class B Push-Pull

Waveforms shown for maximum amplitude output

typically, ‘crossover distortion’ arises at the switching point of the two halves due to imprecise turn-on voltages

Crossover distortion is reduced by class AB operation

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class C Amplifier

Same amplifier, but biased to conduct less than 50% of time

The output amplitude is not a linear function of input: more suitable for constant-amplitude power amp (such as in PM or FM)

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class C Amplifier Waveforms

Conduction angle

Solving for the DC bias to achieve conduction angle φ

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class C Power Efficiency Calculation

The average value of iD

The fundamental component of iD

Maximum output swing is reached when

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class C Power Efficiency, Continued

Maximum efficiency is then

The normalized output capability is poor at small conduction angles

Thus, the efficiency must be sacrificed for reasonable PN

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class D Amplifier Power Efficiency

With ideal switches, Class D amplifier efficiency would be 100%

In practice, finite switch ON resistance and nonzero on-off transients limit efficiency (use high ft device!)

In biploar Class D amplifier, the efficiency is further comprised due to charge storage in saturation and VCE,SAT.

Normalized power capability is shown to be

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class E Power Amplifier

Finite switching speed causes v-i product at the switching instant non-zero -> power loss

Class E amplifiers tries to make both v and I zero at the off-to-on transients (solves only half of the problem)

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Typical Voltage and Current Waveforms

Source: Shawn Kuo,’Linearization of a PulseWidth Modulated Power Amplifier,” S.B. Thesis, MIT, June 2004

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class F Power Amplifier

Allows square wave on drain

Single-ended version of class D

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class F Power Amplifier Waveforms

The waveforms are similar to half of class D Push-Pull

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Class F Power Amplifier Analysis

Refer Thomas. H. Lee’s book

Amplitude of fundamental frequency of drain voltage

Power delivered to the load

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Linearization Techniques

How to linearize highly efficient PAs?

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Linearization Techniques

Non-linear power amplifier can reach great efficienciesBut they lack linearityLinearization techniques can be applied to non-linear PAs to get a good linearity and a modest efficiencyControl is applied at

InputBack-offPre-distortionCartesian feedbackPolar feedback

OutputFeed-forwardLINC (Linearization using Nonlinear Components)

Supply EER (Envelope Elimination and Restoration)

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Input: Back-off

Simplest and most common linearization

PAE is greatly reduced

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Input: Pre-distortion

Tracking gain and change variations of amplifier is very challenging using analog techniquesDigital Look-up tables often usedPA gain and phase response varies with bias,

temperature and supply changes

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Input: Cartesian Feedback

Feedback is used to increase linearityLarge loop gain is needed to improve linearity; very difficult to achieve at RF frequenciesDown-converting alleviates this problemStability is a big challenge

Dr. T. K. Bhattacharyya,Dept. of E&ECE

Supply: EER(Envelope Elimination and Restoration)

Amplitude and phase are amplified separatelyAmplitude information is fed at the output by supplySubstantial power could be dissipated in the supply modulation circuitry providing the whole current of PADc-to-dc can be used but still delivered current is quite largeDelay mismatch between two paths introduces distortion