phys. rev. lett. 49, 57 (1982)
DESCRIPTION
First STM images. Phys. Rev. Lett. 49, 57 (1982). Phys. Rev. Lett. 50, 120 (1983). I T (z). F eff » 1.5 eV. mechanical contact. lg. F eff » 3.5 eV. -. J. K. Gimzewski and R. Möller, Phys. Rev. Lett. 36, 1284 (1987). Structural information from STM. - PowerPoint PPT PresentationTRANSCRIPT
Phys. Rev. Lett. 49, 57 (1982)Phys. Rev. Lett. 50, 120 (1983)
First STM images
IT(z)
J. K. Gimzewski and R. Möller, Phys. Rev. Lett. 36, 1284 (1987)
mechanical contact
eff 3.5 eV
eff 1.5 eVlg
-
Structural information from STM
J. Tersoff. D. R. Hamann, Phys. Rev. Lett. 31, 805 (1985)
calculated LDOS at EF
T. Gritsch, D. Coulman, R.J.Behm, and G. Ertl, Surf. Sci. 257, 297 (1991)
(1x2) missing row reconstruction on Au(110)
STM at semiconductors
R.J. Hamers, R.M. Tromp, and J.E.Demuth, Phys. Rev. Lett. 56, 1972 (1986)
Si(111) 7x7
STM at close-packed metal surfaces
J. Wintterlin et al., Phys. Rev. Lett. 62, 59 (1989)
D. Wang et al., Phys. Rev. Lett. 23, 1685 (1981)
C. J. Chen, Phys. Rev. Lett. 65, 448 (1990)
J. V. Barth et al., Phys. Rev. B 42, 9307 (1990)
STM imaging of adsorbates
N. D. Lang, Phys. Rev. Lett. 56, 1164 (1986)
D. M. Eigler and E. K. Schweizer, Nature 344, 524 (1990)
Xe on Ni(110)
apparent height: 1 Åvan-der-Waals radius: 3.6 Å
Scanning Tunneling Spectroscopy
Banin et al., Nature 400, 542 (1999)
InAs
B. C. Stipe, M. A. Rezaei, and W. Ho, Phys. Rev. Lett. 82, 1724 (1999)
Atomic force microscopy
G. Meyer and N. M. Amer, Appl. Phys. Lett. 56, 2101 (1990)
T. R. Albrecht et al., J. Vac. Soc. A8, 3386 (1990)
Scanning Near Field Optical Microscopy
from:Kurt W. Kolasinski, Surface Science (Wiley 2002)