phd project - École polytechnique · phd project subject: electronic solder joints microstructure...

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Schlumberger-Private PhD Project Subject: Electronic solder joints microstructure evolution (characterization and modeling) when subjected to harsh environments. Nowadays electronic assemblies of oilfield industries are used in harsher and harsher conditions with usage temperature usually in-between 150°C and 200°C. The main reliability limiting factor of the electronics is such environment is the solder interconnect system (see left figure). During downhole conditions, these electronics are subjected to thermo-mechanical stresses combining thermal cycling at elevated temperature (around 0.90 homologous), high level of shock and the excitation of a broad spectrum of vibration frequency. Cyclic fatigue involves the microstructural damage and failure of solder joints (see right figure). Figure: section of a part of a Ball Grid Array (BGA), a type of solder interconnect system. The diameter of such SnAgCu balls (on the right) is only a few hundred micrometers (sources: Wikipedia and Schlumberger). This thesis aims to develop statistical damage model(s) based on constitutive relations integrating microstructure evolution to assess solder creep response and damage evolution of SAC305 solder joints subjected to harsh environment conditions: thermal aging, thermal cycling and shock & vibration. In addition, the results should be used to provide guidance on process parameter adjustments. The thesis will consist of two main parts: 1. Characterize the grain structures of solder joints and analyze the effect of the microstructure evolution (recrystallization, grain orientation, size and shape) when subjected to various thermal cycling up to 185°C (low cycle fatigue/low strain rate) and shock & vibration loading (high cycle fatigue/high strain rate) conditions. Different manufacturing processes (soldering thermal profiling) should also be studied. 2. Develop a microstructure-based constitutive models using statistical approach to predict damage experienced by electronic component solder joint. Ideal candidates should have an excellent scientific background, be highly motivated and enjoy experimental work as well as theory, modeling and programming. The project will enfold its activities between the two partners: Schlumberger and Ecole Polytechnique in France.

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Page 1: PhD Project - École Polytechnique · PhD Project Subject: Electronic solder joints microstructure evolution (characterization and modeling) when subjected to harsh environments

Schlumberger-Private

PhDProject

Subject: Electronic solder joints microstructure evolution (characterization and modeling) whensubjectedtoharshenvironments.

Nowadays electronic assemblies of oilfield industries are used in harsher and harsher conditionswithusage temperature usually in-between 150°C and 200°C. The main reliability limiting factor of theelectronics is such environment is the solder interconnect system (see left figure). During downholeconditions,theseelectronicsaresubjectedtothermo-mechanicalstressescombiningthermalcyclingatelevated temperature (around 0.90 homologous), high level of shock and the excitation of a broadspectrumofvibrationfrequency.Cyclicfatigueinvolvesthemicrostructuraldamageandfailureofsolderjoints(seerightfigure).

Figure:sectionofapartofaBallGridArray(BGA),atypeofsolderinterconnectsystem.Thediameterofsuch

SnAgCuballs(ontheright)isonlyafewhundredmicrometers(sources:WikipediaandSchlumberger).

This thesis aims to develop statistical damage model(s) based on constitutive relations integratingmicrostructureevolutiontoassesssoldercreepresponseanddamageevolutionofSAC305solderjointssubjected to harsh environment conditions: thermal aging, thermal cycling and shock & vibration. Inaddition,theresultsshouldbeusedtoprovideguidanceonprocessparameteradjustments.

Thethesiswillconsistoftwomainparts:

1. Characterizethegrainstructuresofsolderjointsandanalyzetheeffectofthemicrostructureevolution (recrystallization, grain orientation, size and shape) when subjected to variousthermalcyclingupto185°C(lowcyclefatigue/lowstrainrate)andshock&vibration loading(high cycle fatigue/high strain rate) conditions.Differentmanufacturingprocesses (solderingthermalprofiling)shouldalsobestudied.

2. Develop a microstructure-based constitutive models using statistical approach to predictdamageexperiencedbyelectroniccomponentsolderjoint.

Ideal candidates should have an excellent scientific background, be highly motivated and enjoyexperimentalwork aswell as theory,modeling andprogramming. Theprojectwill enfold its activitiesbetweenthetwopartners:SchlumbergerandEcolePolytechniqueinFrance.

Page 2: PhD Project - École Polytechnique · PhD Project Subject: Electronic solder joints microstructure evolution (characterization and modeling) when subjected to harsh environments

Schlumberger-Private

FINANCEMENT:ThèseCIFREhttp://www.anrt.asso.fr/fr/cifre-7843CONTACTS:Prof.EricCharkalukLaboratoiredeMécaniquedesSolides-CNRS-EcolePolytechnique,91128PalaiseaucedexFranceeric.charkaluk@polytechnique.eduProf.AndreiConstantinescuLaboratoiredeMécaniquedesSolides-CNRS-EcolePolytechnique,91128PalaiseaucedexFranceandrei.constantinescu@polytechnique.eduDr.MaximeVilmayMicroelectronicTechnologyGroupSchlumbergerRiboudProductCenter,92142Clamart–FranceMVilmay@slb.comCleversonSouzaChavesMicroelectronicTechnologyGroupSchlumbergerRiboudProductCenter,92142Clamart–[email protected]