introduction to mineralogy dr. tark hamilton chapter 14: lecture 27-29 analytical & imaging...
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Introduction to MineralogyDr. Tark Hamilton
Chapter 14: Lecture 27-29Analytical & Imaging Methods
in Mineral Science
Camosun College GEOS 250
Lectures: 9:30-10:20 M T Th F300
Lab: 9:30-12:20 W F300
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Analytical Techniques in Mineralogy• XRD: X-Ray Diffraction of single crystals or powders in
cameras or slide mounts (structure)• XRF: X-Ray Fluorescence of bulk mineral or rock powders or
during Microprobe analyses (chemistry)• SEM: Scanning Electron Microscopy for surface imagery of
micrometer size mineral crystals and textures• TEM: Transmission Electron Microscopy of micrometer thick
mineral films & crystal slices for imagery of phase boundaries & electron diffraction patterns
• EMPA: Electron Microprobe Analyses, Quantitative or qualitative chemical analyses down to 1 micron sizes of polished mineral surfaces WDA, EDA spectroscopy (major & minor elements down to ~0.1%)
• SIMS: Secondary Ion Mass Spectrometry using O- or Cs+ beams of trace elements down to ppb concentrations
• AFM: Based on Scanning Tunnelling Microscopy of Metals and Conductive Sulphide Minerals, used for imaging Insulators on Atomic Scale
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Electromagnetic Spectrum
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1.0 nm > Xray λ > 0.01 nm(~the size of atoms)
10 Å = 10-9 m
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Generation of X-Rays• Energetic electron transmission & elastic
collision preserves Kinetic Energy (most)
• Inelastic ejects inner shell electrons (few)
• Outer shell electrons (N O P Q) are weakly held & closely spaced in energy levels so these generate IR or Visible Light Photons
• Inner Shell Electrons (K, L, M) are close to the nucleus & feel the full atomic number so they generate hard UV or X-Ray photons
• Cascade from adjacent shells is most common, e.g. L K making a Kα photon
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Sealed Vacuum X-Ray Source Tube
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Common Sources:Mo, Cu, Co, Fe, Cr, W
Soft X-RayExclusion
Filter
Usually 15 to 30 KeV
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Continuous & Characteristic X-Ray Spectra
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W @ EnergiesMo Source
&Transitionsto K shell
Kα = 0.7107Kβ = 0.6308Absorbtion
Edge
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X-Ray Absorbtion Edges• As the optical excitation of a core level electron
requires the binding energy EB as a minimum photon energy, exceeding this energy will coincide with an increased absorption coefficient. This leads to the formation of absorption edges, which may be indexed by their atomic subshells (K,L,M...). Beyond the absorption edge the intensity of a monochromatic X-ray passing through a medium of thickness d will follow the absorption law
• I = exp (-μd) where μ = Z2 / (hv)2
• whereby μ depends the atomic number Z of the medium and decreases with increasing photon energy hv
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Production of K L & M Characteristic X-Ray Spectra
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K lines transit to K Shellα is from the L shellβ is from the M Shell
L lines transit to L Shellα is from the M shellβ is from the N Shell
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X-Ray Source• Schematic Diagram of an X-ray
Generator. The heated filament boils off electrons, which then accelerate toward the positively charged Cu anode. ~99% just collide and heat up the target. ~1% generate X-Rays. The photons are absorbed by shielding and collimators (not shown), except those headed along the main beam axis. (After Piccard and Carter, 1989.)
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X-Ray K Wavelengths for Common Sources
Source Wavelength Filter Abs. Edge.
Molybdenum 0.7107 Niobium 0.66
Copper 1.5418 Nickel 1.49
Cobalt 1.7902 Iron 1.743
Iron 1.9373 Manganese
Chromium 2.2909 Vanadium
Tungsten Tantalum
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X-Ray Diffraction Effects• Incident X-Ray beam of photons causes
electrons in lattice atoms to resonate & emit new wave fronts of the same wavelength
• Usually these new wavefronts distructively interfere
• When the spacing between atoms is a regular trigonometric function of the X-Ray wavelength, constructive interference occurs
• This reinforced scattering of relatively intense X-rays is termed “Diffraction”
• For fixed λ, lattice d-spacings relate to the angle
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Constructive Diffraction: 1 Atomic Row
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AB = nλ = c cos Φ
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Constructive Interference from Atomic Lattices
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Successive Diffraction Conesfrom a Row of Atoms
AB = nλ = c Cos Φ
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Scattering from 3D Intersecting Atomic Rows
Solution to3 Laue equations
= 1 line, 1 spot
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The Bragg Equation: Reflections from Planes of Atoms in a Crystal Lattice
nλ = 2d Sin θ , θ = 90°- Φ
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Laue X-Ray Diffraction Photographof Vesuvianite 4/m 2/m 2/m
Ca19 (Al,Fe,Mg)13 (Si2O7)4 (SiO4)10 (O,OH,F)10
Contact Metamorphism Impure Limestones
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Precession Photograph About C-Axisof Vesuvianite 4/m 2/m 2/m
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Determination of a Crystal Structure
• I = k [ Σ f exp(i2π(hx+ky+lz))]2 = kF2hkl
• Intensity of a diffracted beam for (hkl)
• k is a combined experimental constant
• f is the scattering factor for an atom, depending on Z, scattering angle θ, & thermal motion
• Fhkl is the Structure Factor, depending on atom types & positions in unit cell
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P4-Single Crystal Diffractometer
X-Ray TubeX-Ray Detector
4 Circle Goniometer
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Electron Density Map for Diopside on (010) from Fourier Sums & Atomic Positions
2/m cut obliqueTo (110) Cleavage
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Derivation of Crystal Structure from Stoichiometry & Unit Cell
• NaCl: Space Group 4/m 3 2/m• a = 5.64 Å, unit cell edge (V=a3)• 39.4% Na & 60.6% Cl by weight• (39.4 / 22.99) / (60.6 / 35.453) = 1.71/1.71 = 1• ρ = 2.165 g/cm• Since density & unit cell volume are known, the
number of formula units per cell are:• Z = (n D V)/M where Z is formula units, D is density, V
is molar volume, M is formula weight & n is Avogadro’s number
• For NaCl : Z = (6.022 x 1023 per mol) x (2.165 g/cm3) (5.64 x 10-8 cm)3 / 58.443 g/mol = 4.002 formulae per unit cell
• Na+/Cl- =1.02/1.81 = 0.564, 0.41 < .564 < 0.73 FCC
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Other Spectroscopic Techniques for Determining Crystal Structures
• Neutron or Electron Diffraction: wave behaviour of particle beams
• Infrared: energy absorbtion bands related to bonds, strengths & atomic masses, stretching, bending, torsion of bonds; molecular ions
• Mossbauer: Distinguishes positions & valences of Iron, Fe2+ versus Fe3+, e.g. M1 versus M2
• Nuclear Magnetic Resonance: useful for Hydrogen & other elements with unpaired nuclear spins. Good for O-2 versus OH-
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X-Ray Powder Diffraction
For Randomly Oriented Crystals, AllBragg Angles are solved Simultaneously
nλ = 2d sin θ
Flat Plate MethodWorks only for small 2θ
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X-Ray Powder Camera:Straumanis Method
Pb Beam Catcher
Powder Spindle
Film Strip, Low 2θ
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X-Ray Powder Diffractometer
Sample & Detector RotateRespectively by θ & 2θ
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Powder Diffractometer Scan for α-Quartz 32
Peak Intensity is Scaled Relative to (101)=1,(or whatever is the strongest peak)
What kind of a form is thestrongest diffraction for low Quartz?
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PDF file for Low Quartz from ICDD
217,000 filesExperimental &
Calculated,for natural &
Syntheticcompounds
Usually <5 peaks< 75° 2θ
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Applications of Powder XRD• Minerals with solid solution have variations in
“d-spacings” proportionate to ionic substitutions• Some “d-spacings” are particularly sensitive as
are molar volume and density as with Fe vs Mg• Fine grained minerals like clays, zeolites & Fe,
Mn or Al oxy-hydroxides often occur in mixtures. Comparing patterns of pure end members & known mixtures permit calculation of compostions e.g. illite vs montmorillonite or natrolite vs thompsonite or limonite vs goethite
• The Reitveld refinement method is the main tool for clay mineral structures
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Example d-spacing Calculation
• nλ = 2d sinθ or d = λ/2sinθ
• λ = 1.540598 Å for Cu Kα1
• θ(100) = 10.425° for d (100) as measured
• So for α-Quartz:
• d(100) = 1.540598 Å / 2 • (0.18094) = 4.2570 Å
• Data from table 14.18 in Klein & Dutrow (2002)
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Variation in Vmol Å3, β Å & 2θ(1,11,0) for
Monoclinic Amphiboles: Cummingtonite-Grunerite
After Klein &Waldbaum (1967)
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Formula Units from Crystal Structure for Unit Cell of Grunerite
• Grunerite: 2/m , Fe7Si8O22(OH)2
• b = 18.44 Å, β = 102°• M = 1001.614 g/mol• ρ = 3.6 g/cm• Since density & unit cell volume are known, the
number of formula units per cell are:• Z = (n D V)/M where Z is formula units, D is density, V
is molar volume, M is formula weight & n is Avogadro’s number
• For Grunerite: Z = (6.022 x 1023 per mol) x (3. 6 g/cm3) (925 x 10-24 cm3) / 1001.614 g/mol = 2.004 formulae per unit cell
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XRF: X-Ray FluorescenceEmission Spectroscopy
• Chemical Analyses of Inorganic Compounds, Rocks and Minerals
• Mining, Ceramics, Metallurgy, Mineralogy, Petrology• Compressed powdered sample + binder or flux if
fused• Polychromatic X-ray Source• Absorbtion according to Beer’s Law:• log(Io/I) = KdΔd , I-Intensities, Kd–Constant, Δd-
thickness• Absorbed X-ray photons expel inner shell e- & falling e-
L to K emits characteristic X-rays for each element• Spectra for 2 or more elements need to be resolved
for emission lines proportions
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XRF: X-Ray FluorescenceEmission Spectroscopy
Spectrum for 2Elements
Molybdenum & Copper
BackgroundSpectrum
CharacteristicSpectrum
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X-Ray Fluorescence Spectrometer
Differentelements & λ’s
LIF: LiF, ADP: Ammoniumdihydrogen phosphate
KAP: Potassium biphthalate,Known d-spacings
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XRF Spectrum of a Genuine Bank Note(Counterfeiting is not a way to get ahead)
W is due to X-RayTube Target Metal
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Schematic of Electron Microprobe
Magnetic Lenses
10-7 Torr
or Energy Dispersive Spectrometerw/ Be window & SiLi detector
~30 KeV
SEM’s have detectors forElectrons to image sample
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SEM or EMP Stage
BSE: Backscattered e- sSE: Secondary e- s
CL: Cathodoluminescence
25 Å < Resolution < 50 Å
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Cathodoluminescence SEM ImagesGranite Llano Texas
J.Schreiber, IUSandstone Simon Fm Ill
Rob Reed, UofTx
Calcite &K-spar
Quartz &Barite
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TEM Schematic
Magnetic Lenses
Resolution to 0.14 Å(half a small unit cell)
Where are those impurities?
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EMPA & Analytical VolumeVolume is proportional to Average Z
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SIMS: Secondary Ion Mass Spec
Most Elements & Isotopes 1H to 92U
Especially Light Elements
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SHRIMP: Ion Microprobe
U & Pb isotopesOn a 20 μ scale
Zircon growth zones
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SHRIMP Analyses for Dating
research.eas.ualberta.ca/rif/mc_icp_ms.html
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AFM: Atomic Force Microscope
Electro-mechanical AmplifierOf the Force Between Atoms
Outgrowth of STEM for conductors
Atomic Topography