integrated advanced microwave sounding unit-a (amsu-a

Report 11183

July 1998

Integrated Advanced Microwave Sounding Unit-A(AMSU-A)

Performance Verification Report

Subassembly and Complete Instrument Assembly

EOS AMSU-A1 Antenna Drive Subassembly,

PIN 1356008-1, SIN 202

Contract No. NAS 5-32314

CDRL 208

Submitted to:

National Aeronautics and Space Administration

Goddard Space Flight Center

Greenbelt, Maryland 20771

Submitted by:

Aerojet

1100 West Hollyvale Street

Azusa, California 91702

Report 11183July 1998

AMSU-A VERIFICATION TEST REPORT

TEST ITEM: AMSU- A1 ANTENNA DRIVE SUBSYSTEM

PART OF P/N: 1356008-1

SERIAL NUMBER : 202

LEVEL OF ASSEMBLY: SUBASSEMBLY AND COMPLETE INSTRUMENTASSEMBLY

TYPE HARDWARE: FLIGHT

VERIFICATION:

PROCEDURE NO.

AE-26002/1C

TEST DATE:

SUBSYSTEM: START DATE:

FINISH DATE:

18 December 1997

10 April 1998

Report11183July1998

TABLE OF CONTENTS

1.0

2.0

3.0

4.0

5.0

5.1

5.2

5.3

5.4

5.5

5.5.1

5.5.2

5.5.3

5.5.4

5.5.5

6.0

7.0

ITEM

INTRODUCTION

SUMMARY

TEST CONFIGURATION

TEST SETUP

TEST RESULTS

REFLECTOR DRIVE ASSEMBLIES

CIRCUIT CARD ASSEMBLIES

SIGNAL PROCESSOR

TRANSISTOR ASSEMBLY

ANTENNA DRIVE SUBSYSTEM TESTS

SCAN MOTION AND JITrER

NOISY BUS PEAK CURRENT AND RISE TIME

RESOLVER READING AND POSITION ERROR

GAIN/PHASE MARGIN

OPERATIONAL GAIN MARGIN

CONCLUSIONS AND RECOMMENDATIONS

TEST DATA

Report11183July1998

1.0 INTRODUCTION

An antenna drive subsystem test was performed on the EOS AMSU-AI_ S/N 202

instrument. The objective of the test was to demonstrate compliance with applicable

paragraphs of AMSU-A specifications S-480-80. Tests were conducted at both the

subassembly and instrument level.

2.0 SUMMARY

The antenna drive subsystem of the EOS AMSU-A1, S/N 202, P/N 1356008-1, completed

acceptance testing per AES Test Procedure AE-26002/1C. The test included: Scan

Motion and Jitter, Noisy Bus Peak Current and Rise Time, Resolver Reading and Position

Error, Gain/Phase Margin, and Operational Gain Margin.

The drive motors and electronic circuitry were also tested at the component level. The

drive motor test includes: Starting Torque Test, Motor Commutation Test, Resolver

Operation/No-Load Speed Test, and Random Vibration. The electronic circuitry was

tested at the Circuit Card Assembly (CCA) level of production; each test exercised all

circuit functions. The transistor assembly was tested during the W3 cable assembly

(1356424-1) test. Refer to Figure 1 for test flow.

CIRCUIT CARD ASSEMBLY

TEST

V

Antenna Subsystem and Subsystem Component Test Flow

The antenna drive subsystem satisfactorily passed all of the performance requirements.

There were no failures in any of the antenna drive components during subsystem testing.


The results of the subsystem and component level testing are discussed in more detail in

the following sections:

Reflector Drive Assembly ...... 5.1

Circuit Card Assemblies ........ 5.2

Signal Processor ..................... 5.3Transistor Assembly .............. 5.4

Antenna Drive Subsystem ...... 5.5

3.0 TEST CONFIGURATION

The Reflector Drive Assembly Tests confirm the operability of the motor under test. The

test configuration includes, the motor, motor shaft, bearings, and a supporting housing.

The Circuit Card Assembly (CCA) Tests confirm the operability of each CCA. Each test

includes the CCA under test, electronic test fixtures, and the necessary loads.

A segment of the Signal Processor Tests ensures the scan drive electronics are

functioning properly prior to it's assembly into the instrument. The test configurationincludes:

• Timing and Control CCA• Scan Control Interface CCA

• Mux/Relay Control CCA• Interface Converter CCA

• Resolver Data Isolator CCA

• R/D Converter CCA

• Motor Driver CCA

• Test fixture and cabling to simulate the 1553 bus interface

• Test fixture and cabling to interrogate and analyze positional data• Test motor and inertia wheel

The Transistor Assembly Test verifies the correct wiring of the transistor assembly and

associated cabling. Test configuration includes the CKT 1000 (continuity and Hi-Pot

tester), and test fixtures.

The Antenna Drive Subsystem Tests:

• Are configured with the same motor control CCA's used in the signal processor

test, interconnecting wiring, the power transistor assembly, and the drive

assembly with reflector.

• The antenna drive subsystem components were all installed in the instrument

when the subsystem test was performed.

• DC power for the motor control circuit cards was provided by a DC/DC converter

simulator P/N: 1359322-1. The simulator operates on 120VAC facility supplied

Report 11183

July 1998

power. The power for the reflector motor drive circuits however was provided

directly by the STE Noisy Bus power supply.

4.0 TEST SETUP

The antenna drive subsystem tests are performed during system integration. During

system integration testing, the instrument is proven electrically safe via ground isolation,

and power distribution checks. Next, the communication link is exercised to ensure

commands are received and interpreted correctly. The Antenna Drive Subsystem Test is

then performed.

5.0 TEST RESULTS

The Antenna Drive Subsystem components designated for use in the EOS AMSU-A1instrument are shown in Table 1.

CCA (AI-1) S/N

Resolver Data Iso lator Assembly (A 1-1) F25

Interface Converter Assembly (A1-1) F19

Motor Driver Assembly (AI-1) F01

R/D Converter/Oscillator Assembly (AI-1) F21

CCA (A1-2) S/N

Resolver Data Isolator Assembly (A 1-2) F26

F20Interface Converter Assembly (A1-2)

Motor Driver Assembly (A 1-2)

R/D Converter/Oscillator Assembly (A 1-2)

F02

F16

OTHER SIN

Reflector Drive Motor (AI-1) F04

Reflector Drive Motor (A1-2) F05

Signal Processor F01

Transistor Assembly (W3 cable) N/A

Table 1.

EOS AMSU-A1 S/N: 202 Antenna

Subsystem Component SfN Designations

During preliminary testing of these components (in preparation for the antenna drive

subsystem test), several component failures occurred. The component failures and system

related dispositions are listed below:

• Reflector Drive Motor (A1-D - during assembly test, it was noted that

the motor was binding. It was determined that excessive bonding

material was used and it flowed onto the shaft. The shaft was cleaning

Report 11183

July 1998

and tests showed a positive resolution. The process planning wasaltered to reduce the risks of recurrence.

Reflector Drive Motor (.41-2) - during vibration testing the resonant

frequency shifted. The motor was disassembled but anomalies were

found. Electronic tests found nothing abnormal either. The motor was

successfully re-vibrated without failure.

All other components designated for use in the EOS AMSU-A1 instrument (pertaining to

the scan drive circuitry) passed on the first time through component testing.

5.1 REFLECTOR DRIVE ASSEMBLIES

The tests performed on this unit are: Starting Torque Test, Motor Commutation Test,

Resolver Operation/No-Load Speed Test, and Random Vibration. The Motor

Commutation and Resolver Operation tests are performed both pre and post-vibration.

Starting Torque

The starting torque test is performed on the rotating segment of the drive assembly to

verify the torque associated with bearing friction. Reflector drive assembly (F04) failed

the starting torque test at ambient temperature. The motor was binding due to a process

error. Bonding material flowed onto the motor shaft preventing it from turning with

voltage applied. The shaft was cleaned and re-tested. The reflector drive assembly (F04)

then passed the starting torque test at ambient temperature as well as at the colder

plateaus.

Reflector drive assembly (F05) passed the starting torque test at ambient temperature as

well as at the colder plateaus first time through testing.

Motor Commutation Test

This test is performed to determine the commutation characteristics of the motor under

test. Both reflector drive assemblies (F04 and F05) passed the motor commutation test

both pre- and post-vibration tests without incident.

Resolver Operation/No-Load Speed Test

This test is performed to verify resolver operation as well as speed characteristics and

back electromotive force of the motor. Both reflector drive assemblies (F04 and F05)

passed the resolver operation/no-load speed test both pre- and post-vibration testswithout incident.

6


Random Vibration

Reflector drive assembly (F04) passed vibration testing first time through. The motor

assembly also passed the pre- and post-vibration electronic tests as well as the post-

vibration visual inspection without incident.

Reflector drive assembly (F05) experienced a significant change in resonant frequency at

the random vibration, -6db level. The motor was disassembled, but no anomalies were

found. The motor was successfully re-tested and returned to vibration testing. The motor

was re-vibrated without incident. The reflector drive assembly passed the pre- and post-

vibration electronic tests as well as the post-vibration visual inspection without incident.

5.2 CIRCUIT CARD ASSEMBLIES

Test procedures were prepared for each motor control circuit card; document revision

status is controlled by reference in the shop order. The cards were individually tested to

the procedures and results were recorded on data sheets found in Appendix A. The

following list indexes the CCA Test Data Sheets:

• Appendix A1 ............. Resolver Data Isolator Assembly (AI-1)

• Appendix A2 ............. Resolver Data Isolator Assembly (A1-2)

• Appendix A3 ............. Interface Converter Assembly (AI-1)

• Appendix A4 ............. Interface Converter Assembly (A 1-2)

• Appendix A5 ............. Motor Driver Assembly (AI-1)

• Appendix A6 ............. Motor Driver Assembly (A1-2)

Appendix A 7 ............. R/D Converter/Oscillator Assembly (A 1-1)

Appendix A8 ............. R/D Converter/Oscillator Assembly (A1-2)

All circuit card assemblies passed testing the first time through. The assembly build shop

orders contain the part number and accept tag record the of test and select resistors.

5.3 SIGNAL PROCESSOR

For the first time, the entire antenna drive motor electronics is mated together. The test

instrumentation commands and interrogates the electronics during this segment of testing.

The instrumentation sends position commands to the Interface Converter CCA. The

Interface Converter D/A's the command and provides inputs to the Motor Driver CCA.

The test motor (instrumentation) responds to the drive signal and feeds back positional

data via resolver outputs. The instrumentation then interrogates the Resolver Data

Isolator CCA for position data. A comparison is made in the instrumentation between the


position command sent and the actual position received. The pass/fail indication is

presented to the operator for test data sheet recording.

The signal processor assembly (F01) passed all scan drive tests.

5.4 TRANSISTOR ASSEMBLY

All transistor assemblies are tested along with their respective W3 cable. The cable is

continuity, then hi-pot tested prior to attaching the transistor circuitry. Each transistor

pair is exercised validating the turn on voltage, current drawn, and cable wiring as well.

The W3 cable assembly was placed on an Inspection Report (IR# 101780) for cracks in a

connector. The connector was subsequently repair by applying .003 inch minimum 2216

epoxy over the cracks. This action precludes the separation of any connector moldingmaterial.

The W3 cable and transistor assembly underwent component testing and passed without

incident.

5.5 ANTENNA SUBSYSTEM DRIVE TESTS

The antenna drive motor electronics mates with the instrument microprocessor for the

first time during this segment of testing. The microprocessor sends position commands

from the memory CCA to the Interface Converter CCA. The Interface Converter D/A's

the command and provides inputs to the Motor Driver CCA. The Reflector Drive Motor

responds to the drive signals and feeds back positional data via the resolver outputs. The

microprocessor then interrogates the Resolver Data Isolator CCA for position data.. The

microprocessor in turn communicates with the 1553 interface which subsequently relays

positional data to the STE.

During other segments of the test, positional data is monitored via a potentiometer

attached to the shaft of each reflector drive assembly. This provides scan characteristic

information in regard to overshoot, jitter, and beam position transition timing for each

motor assembly.

The remaining paragraphs in this section discuss tests that ensures the instrument

complies with specific operating parameters. Prior to conducting these tests there is a

series of preliminary checks that are run to select component values that customize the

operating parameters of each motor. These checks perform the following functions:

Report11183July1998

• Program"onboard"memorywith BeamPositionPointingAnglesfor eachreflectordriveassembly

• Adjustfor peakMotor CurrentLimits onbothAI-1 andA1-2motor drive circuits• ObservePreliminaryScanDynamicsonbothAI-1 andA1-2motor drive circuits• IdentifyMechanicalResonantFrequenciesof eachreflectordrive assembly

Beam Position Pointing Angles are calculated from Nadir pointing direction which is

determined on the antenna range. The instrument's EPROMs (EPROMs for testing;

PROMs for final configuration) are programmed to reflect the position commands. The

initial programming may require fine tuning; fine tuning is determined during the

remaining segments of the test procedure.

Motor Current Limits were adjusted, via selecting "test and select" resistors, to comply

with the specification requirement; less than 1 amp peak current.

Preliminary Scan Dynamics looked good; transition times, overshoot and jitter were all

acceptable at the sampled pointing directions (5).

The Mechanical Resonant Frequencies were identified; notch filters were calculated and

installed to compensate for these resonant frequencies.

5.5.1 SCAN MOTION AND JITTER

In this test, the antenna position was measured in a series of five 8-sec full scans. The

measurement was made with a 1-turn test potentiometer temporarily affixed to the rear

end of the motor shaft. A Dynamic Signal Analyzer (DSA) was connected to the pot

wiper to record the antenna position data. Five scans of each AI-1 and A1-2 were

captured and stored on the AMSU-A1 Test Data File disc. One representative waveform

from each subassembly is presented in Appendix B1 (AI-1) and Appendix B34 (A1-2).

Each 3.33 degrees scene step was expanded and checked for both a 35 msec max step

time, and a 165 msec integration period. Expanded waveforms were plotted and are

presented in Appendix B2 thru B31 for the AI-1 subassembly and Appendix B35 thru

B64 for the A1-2 subassembly. All of the scene steps meet the step response requirement

for transition time, overshoot, and jitter.

Slew periods to the cold and warm calibration stations were measured and met

requirements. A time of 0.21 sec is allocated for the 35.0 degree slew to cold cal, and

0.40 sec for the 96.67 degree slew to warm cal. Calibration station jitter was less than the

+ 5 % maximum permitted. Expanded waveforms for each subassembly were plotted and

are presented in Appendix B32 and B33 (AI-1) and Appendix B65 and B66 (A1-2). Thewaveforms are also stored on the AMSU-A1 Test Data File disc. The test data sheets are

presented in Appendix B67 (AI-1) and B68 (A1-2).

Report 11183

July 1998

5.5.2 NOISY BUS PEAK CURRENT AND RISE TIME

The Noisy pulse load bus peak current and the rate of change of current were measured.

The peak cu_ent must be less than 1A at any beam position along the scan. Peak current

along the scan is .940A. The current rate of change while transitioning from one beam

position to the next (including the transition to the cold calibration and warm calibration

targets) should be greater than 35 microseconds. A random 3.33 ° step was selected; the

transition to the next step was 1.6 ms. The transition to the warm cal position start and

stop was significantly longer than the required 35 ms; 1.95 and 1.56 ms respectively.

The peak bus current was measured across the entire scan and met the requirement. The

full scan waveform was plotted and is presented in Appendix C 1. The waveform is also

stored on the AMSU-A1 Test Data File disc. The test data sheet is presented in Appendix

C2.

5.5.3 RESOLVER READING AND POSITION ERROR

The 14-bit command position word is stored in the "on-board" memory and is read to the

motor drive circuitry under microprocessor program control. The microprocessor also

reads the resolver output at each of the thirty scene stations, and at the cold and warm

calibration positions. The readings are made at the start of integration (LOOK 1), and

halfway into the integration period (LOOK 2). The resolver data is sent to the 1553 bus

interface for subsequent transmission to the STE.

The purpose of this portion of the test is to demonstrate that the antenna is meeting beam

pointing requirements.

If the antenna is out of the pointing tolerance of> + 10 counts at LOOK 1 or > + 5 counts

at LOOK 2, the EPROM is reprogrammed to bring the pointing direction to within the

prescribe tolerances. A copy of the STE computer print out showing the pointing

direction is shown in Figure 2 for the AI-1 subassembly and Figure 3 for the A1-2

subassembly.

10

BP

1

2

3

4

5

6

7

8

9

10

11

12

13

14

15

16


Actual Diffe_nce* Actual Difference"

Command Look 1 Look,?. Look1 Look2 BP Commanc Look 1 Look2 Look 1 Look2

14520 14522 14522 -2 -2 17 563 571 563 -8 0

14672 14677 14671 -5 1 18 715 720 714 -5 1

14824 14830 14823 -6 1 t9 866 874 865 -8 1

1497S 14985 14974 -10 1 20 1018 1023 1017 -5 1

15127 15134 15127 -7 0 21 1170 1176 1169 -6 1

15279 15286 15279 -7 0 22 1321 1331 1321 -10 0

15430 15439 15429 -9 1 23 1473 1479 1473 -6 0

15582 15590 15582 -8 0 24 1625 1631 1625 -6 0

15734 15739 15733 -5 1 25 1776 1784 1775 -8 1

15885 15893 15884 -8 1 26 1928 1936 1928 -8 0

16037 16043 16036 -6 1 27 2080 2085 2079 -5 1

16189 16196 16188 -7 1 28 2231 2238 2230 -7 1

16340 16349 16339 -9 1 29 2383 2388 2382 -5 1

108 116 108 -8 0 30 2535 2541 2534 -6 1

260 265 260 -5 0 CC 1 4129 4132 4132 -3 -3

411 421 410 -10 1 WC 8528 8527 8527 1 1

• Difference between Command and Actual

Figure 2. Beam Position Pointing Directions and Error Calculation for AI-1

BP

I

2

3

4

5

6

7

8

9

10

11

12

13

14

15

16

Actual Diffemnce* Actual Difference*

Command Look 1 Look2 Look1 Look2 BP Command Look 1 Look2 Look 1 Look2

14168 14169 14169 -1 -1 17 211 212 210 -1 1

14320 14324 14319 .4 1 18 363 366 361 -3 2

14472 14473 14469 -1 3 19 514 518 513 -4 1

14623 14625 14622 -2 1 20 666 670 664 -4 2

14775 14775 14773 0 2 21 818 819 816 -1 2

14927 14930 14926 -3 1 22 969 971 967 -2 2

15078 15082 15078 -4 0 23 1121 1121 1119 0 2

15230 15234 15233 -4 -3 24 1273 1276 1272 -3 1

15382 15385 15381 -3 1 25 1424 1427 1422 -3 2

15533 15538 15533 -5 0 26 1576 1578 1575 -2 1

15685 15687 15684 -2 1 27 1728 1731 1726 -3 2

15837 15841 15835 -4 2 28 1879 1883 1878 .4 1

15988 15990 15986 -2 2 29 2031 2035 2029 .4 2

16140 16141 16138 -1 2 30 2183 2184 2181 -1 2

16292 16295 16290 -3 2 CC1 3777 3779 3779 -2 -2

59 62 57 -3 2 WC 8176 8178 8178 -2 -2

Difference between Command and Actual

Figure 3. Beam Position Pointing Directions and Error Calculation for A1-2

5.5.4 GAIN/PHASE MARGIN

11


A gain/phase margin test was performed on the antenna drive subsystem. The test was

performed by obtaining a Bode plot of the control loop and measuring the gain at 180 °

phase differential and the phase margin at the 0db crossover point.

The Dynamic Signal Analyzer (DSA) was used to make the measurement operating in the

swept sine mode. Three separate Bode plots were made on the antenna and the gain and

phase margins were determined from each plot. The gain margin measured was 9.55 db

(average of three) for the AI-1 subsystem and 9.26 db (average of three) for the A1-2

subsystem. The phase margin measured was 71.1 ° (average of three) for the AI-1

subsystem and 70.0 ° (average of three) for the A1-2 subsystem. These margins exceed

the specification requirements of 9.2 db and 25 degrees and therefore are acceptable. The

three Bode waveforms were plotted and are presented in Appendix D 1 thru D3 for the

AI-1 subsystem and Appendix D4 thru D6 for the A1-2 subsystem. The waveforms are

also stored on the AMSU-A1 Test Data File disc. The test data sheets are presented in

Appendix D7and D8 for AI-1 and A1-2 respectively.

5.5.5 OPERATIONAL GAIN MARGIN

An operational gain margin test was performed on the instrument three times. This test

consists of increasing the gain of the control loop until oscillation occurs. The gain

increase and frequency of oscillation are measured. An increase in gain greater than 8 db

is required; the frequency of oscillation is an observation.

A 50K pot was connected in series with the R58 feedback resistor on amplifier AR8. The

resistance of the test pot was slowly added to the feedback resistor while observing thereflector for oscillations.

The reflector begins to produce an audible sound as gain is increased. The followingadded resistance values are calculated to have the following gain margins for the A1-1

and A1-2 subsystems:

Resistance

(ohms)36.94 K

Gain

8.6 db

36.01 K 8.4 db

36.03 K 8.4 db

AI-1

Resistance

(ohms)34.16 K

Gain

8.1 db

37.67 K 8.7 db

34.32 K 8.2 db

A1-2

12

Report 11183

July 1998

The first mode mechanical resonance of the shaft and reflector is about 171 Hz for the A1-1

subsystem. The power spectrum waveform was plotted and is presented in Appendix E 1. The

first mode mechanical resonance of the shaft and reflector is about 181 Hz for the A1-2

subsystem. The power spectrum waveform was plotted and is presented in Appendix E2. Thesewaveforms are also stored on the AMSU-A1 Test Data File disc. The test data sheets are

presented in Appendix E3 and E4 for the AI-1 and A1-2 subsystems respectively.

6.0 CONCLUSION

Based on the test results, it can be concluded that the EOS AMSU-A1 S/N 202 antenna

drive subsystem meets the AMSU-A specification requirements

7.0 TEST DATA

Test data for the EOS AMSU-A1 S/N 202 obtained in the antenna drive subsystem test is

attached. Data sheet number and type of test is shown in the following Appendix Index.

13


APPENDIX INDEX

Appendix A 1 ........................

Appendix A2 ........................

Appendix A3 ........................

Appendix A4 ........................

Appendix A5 ........................

Appendix A 6 ........................

Resolver Data Isolator CCA TDS (AI-1)

Resolver Data Isolator CCA TDS (A1-2)

Interface Converter CCA TDS (A l-l)

Interface Converter CCA TDS (A1-2)

Motor Driver CCA TDS (AI-1)

Motor Driver CCA TDS (A1-2)

Appendix A 7 ......................... PUD Converter/Oscillator CCA TDS (A 1-1)

Appendix A8 ......................... R/D Converter/Oscillator CCA TDS (A 1-2)

Appendix B1 ......................... Full Scan Step Response (AI-1)

Appendix B2 thru B31 .......... Single Step Responses (AI-1)

Appendix B32 ....................... Cold Calibration Step Response (AI-1)

Appendix B33 ....................... Warm Calibration Step Response (AI-1)

Appendix B34 ....................... Full Scan Step Response (t41-2)

Appendix B35 thru B64 ........ Single Step Responses (A1-2)

Appendix B65 ....................... Cold Calibration Step Response (A1-2)

Appendix B66 ....................... Warm Calibration Step Response (A1-2)

Appendix B67 ....................... Scan Motion Jitter Test TDS (AI-1)

Appendix B68 ....................... Scan Motion Jitter Test TDS (A1-2)

14

Report11183July1998

Appendix C1 ......................... Peak Pulse Load Bus Current Waveform

Appendix C2 ......................... Pulse Load Bus Current TDS

Appendix D1 thru D3 ....... Gain�Phase Margin Bode Plots (AI-1)

Appendix D4 thru D6 ....... Gain�Phase Margin Bode Plots (A1-2)

Appendix D7 ..................... Gain�Phase Margin TDS (A I-1)

Appendix D8 ..................... Gain/Phase Margin TDS (A1-2)

Appendix E1 ..................... Operational Gain Margin Power Spectrum (A I-1)

Appendix E2 ..................... Operational Gain Margin Power Spectrum (A 1-2)

Appendix E3 ..................... Operational Gain Margin TDS (A 1-1)

Appendix E4 ..................... Operational Gain Margin TDS (A 1-2)

15

....... At

AE-26693A10 Feb 97

TEST DATA SHEET B-6 (SheetIof2)

ILESOLVER DATA ISOLATOR CCA (PfN 1334972) (Paragraph 6.6.7 )

Date:S/N:

6.6.7.1 Supply Voltages

Supply*

+5 V fl)

Measured Value CV)

.O'O

+5 v (u) 5. e I

6.6.7.2 Supply Currents

Steps I and 2:

Supply*+5 V 5)

+5 V (U)

Steps 3 and 4:

Measured Value (mA)

_L

Limits (Vdc)

+0.25

+_0.25

Limits (re.A)

100 max

400 max

+5 V (I)

+5 V (U)

Supply*

* I = Isolated, U = Unisolated

6.6.7.3 Resolver Data

Bit No.

API 0 - AP Bit 0

API1-APBitl

API 2 - AP Bit 2API 3 - AP Bit 3 f'

API 4 - AP Bit 4

API 5 - AP Bit 5

API 6 - AP Bit 6

API 7 - AP Bit 7

API 8 - AP Bit 8

API 9 - AP Bit 9

API 10- APBit 10

API 11 - APBit 11

Measured Value (mA)

_t -_7ll. oq

Pass/Fail

f,¢f

6.6.7.4

fff

API 12 - AP Bit 12

API 13 - AP Bit 13

ConverterBusy Pulse

Limits (mA)

150 max

30 max

Converter Busy Pulse15.0

Measured Value (_ec)

I'¢-'1

Pass/Fail

f

Pass/Fail

t"

Pass/Fail

i"?

B-14

TESTDATASHEETB-6 (Sheet 2 of 2)

RESOLVER DATA ISOLATOR CCA (P/N 1334972) (Paragraph 6.6.7 )

AE-26693A10 Feb 97

Comments:.

Conducted by:

Verified by:

Approved by:

_F_st En_neer .

DC_

Date

Date

Da£e

B-15

AE-26693A10Feb97

TESTDATASHEETB-6(Sheet1of2)

RESOLVERD.ATAISOLATORCCA(P/'N1334972)(Para_aph6.6.7)

Date: q'[19' [ q7

S/N: _ - 7_q q _1

6.6.7.1 Supply Voltages

Supply*+5 v Cl)

+5 v (u)


Steps 1 and 2:

Measured Value ('V)_;,,_ 0

Limits (Vdc)

_+0.9_5

__.0.25

Pass/Fail

P

Supply*

+5 v fl)

+5 V (U)

Measured Value (mA)

55._1

57.2.ce

Limits (mA)I00 max

400 max

Steps 3 and 4:

P_s/Fail

¢¢

Supply*+5 v (I)

Measured Value (mA)9,3 ._7

Limits (mA)150 max

+5 v (U) | _ • I I 30 max

Pass/Fail

t'

* I = Isolated, U = Unisolated

6.6.7.3 Resolver Data

Bit No. Pass/Fail

API 0 - AP Bit 0

API 1-APBitl

API 2 - APBit 2

API 3 - AP Bit 3

API 4 - AP Bit 4

API 5 - AP Bit 5

API 6 - AP Bit 6

API 7- APBit 7

API 8- AP Bit 8

fI'f,t'¢,

API 9- APBit 9 fAPI 10- AP Bit 10 (

API 11 - APBit 11

API 12- APBit 12 ffAPI 13- APBit 13

6.6.7.4 Converter Busy Pulse

L _:272.

[ Converter Busy Pulse I Measured Value (_ec) I15.o ,_34-_ _.q _LLimits (_ec)

4- 3.0 Pass/Failt"

B-14

t47..

TEST DATA SHEET B-6 (Sheet 2 of 2)

RESOLVER DATA ISOLATOR CCA (P/N 1334972) (Paragraph 6.6.7 )

AE-26693A

10 Feb 97

Comments:

Conducted by:

Verified by:

Approved by:

_':_e _4E"n_,zine er ..... Date

K)_ Date .--,_ /

B-15

AE-26693A

• I0 Feb 97

Date:

CCA S/N:

6.13.7.1


INTERFACE/CONVERTER CCA (P/N 1331697) (Paragaph 6.13.7)

I-',>I_qT- 1

Supply Voltages

Supply+5V (U)

+15v (I)-15V (I)

+5v G)

Measured Value (Vdc)

5;.0o¢Limits (Vdc)

+5V_ 0.05

15". O_V +I5V+ 0.15

- 13". cc_/ -15V+0.15

Pass/Fail

t'ff

+5v_0.05 /'

Az.


Step I (CP and API Low):

Supply

+5V (U)

+5V (I)

+15V (I)

- 15V (I)

Measured Value (mA)

17.7 )7-0.37

Limits (mA) Pass/Fail

70- 110 f1.5- 5.5 f'15- 23 P

18 - 26 _'

Step 2 (CP and API High):

Supply Measured Value (m A) Limits (mA) Pass/Fail

+5V (U) _4 -'1...0 40 - 70 ('

+5v 0) z3. g.3+15v a) 1 l. "7 o

-]5v (1) _ o. "_z4

18 - 30 f

15 - 23 f

18 -26 f

6.13.7.3 Amplifier Offsets

AmplifierARI

AR2

Measured Value (mY)

- O. Ol

O-7.0

Limits (mY) Pass/Fail

o.o_+o.15 po.o _zo p

B-26


INTEKFACE/CONVERTER CCA (P/'N 1331697) (Paragraph 6.13.7)

AE-26693A10 Feb 97

6.13.7.4 Subtraction and D-A Conversion

Step 1:

Actual Position (API)

MSB LSB

00000000000000

00000000000001

00000000000010

Command Position (CP)MSB LSB

00000000000000

00000000000000

00000000000000

ARI Output*

Voha_e Required (Vdc)0.00000

-0.00061

-0.00122

00000000000011 00000000000000 -0.00184

00000000000100 00000000000000 -0.00245

00000000001000 00000000000000 -0,00490

00000000010000 00000000000000 -0.00979

00000000100000 00000000000000 -0.01958

00000001000000 00000000000000 -0.03917

00000010000000 00000000(300000 -0.07834

00000100000000 00000000000000 -0.15667

00000000000(0X)00001000000000 -0.31334

01000000(X)0000

00010000000000 00000000000000 -0.62669

00100000000000 00000000000000 -1.25338

00000000000000 -2.50675

I0000000000000 O000000000OO00

* Tolerance on output voltage is + 10%

-5.01350

Test Result

(Vdc)

- 0. ete&l

- o. e,c.,..q,{- _. OQocqq

-n.e!ooc

-o. 1&¢5)

-O.Sa.I _ 3

l_ 0. (Q/..i.,'_/..t-0

- :z._(,qq

-5. i5¢I_

Pass/Fail

P.pf,4'

I"e

I'

ef,

Step 2:


MSB LSB

00000000000000

o0o00o0o000o00

Command Position (CP)MSB LSB

00000000000000

o00000o0o00001

AR 1 Output"

Volta_e Required (Vdc)0.00000

0.00061

00000000000000 000000000000 i0 0.00122

00000000000000 0000000000001 i 0.00184

0000000000(O_ 00000000000100 0.00245

00000000000000 00000000001000 0.00490

00000000000000 00000000010000

00000000100000

0.00979

00000000000000 0.01958

00000000000000 00000001000000 0.03917

00000000000000 00000010000000 0.07834

00000000000000 00000100000000 0.15667

00001000000000 0.31334

0001000000(O_ 0.62669

00000000000000

10000000000000

00000000000000

00000000000000 00100000000000 1.25338 _C'_r_#l

00000000000000 01000000000000 2.50675

-5.0135000000000000000

voltage is + 10%* Tolerance on output

Test Result

(Vdc)

•_o. 0o0oI

4-0.cOc.T:_'_''

Pass/Fail

fI'ff,fI"fffeff

B-27

AE-26693A10Feb97

TESTDATASHEETB-13 (Sheet 3 of 3)

INTERFACE/CONVERTER CCA (P/N 1331697) (Para_aph 6.13.7)

6.13.7.5 Strobe Function

Step I: Strobe Low

No E11 Change

with Input CP Changes

Pass/Fail

f

Step2: Strobe High

El I Change


Pass/Fail

6.13.7.6 Amplifier Gain

Ell

El0

E 10 Voltage

E! 1 Voltage

Measured Value (Vdc)o.2 zlzS

Limits (Vdc)

10.7 - 11.3

Pass/Fail

____L_

___L_

6.13.7.7 Ground Isolation

Pin 91 to Pin 7

DC Resistance

Measured Value.(Mfh Limits (Mr2)

0:_ >20

Pass/Fail

f,

C°mments_k.}O _.

Conducted by:

Verified by:

Approved by:

_,_est Engineer I Date

DCMC -- /

B-28

AE-26693A• I0 Feb 97

Date:CCA S/N:

6.13.7.1


INTERFACE/CONVERTER CCA (P/N 1331697) (Paragraph 6.13.7)

Supply Voltages

Supply+5v (U)

+15V (I)

-15v (D+5v (I)

Measured Value (Vdc)_..,;.ol v'

Limits (Vdc)

-t %.o( v'

+5V± 0.05

q-l_, c3 V +15v+0.15

-15V± 0.15

-f S. ooV +5V± 0.05

Pass/Fail

ei'PI:'


Step 1 (CP and API Low):

Supply+5V (U)

+SV fI)

+15V (I)

-15V (I)

Step 2 (CP and API High):

Measured Value (mA) Limits (mA)

IL¢,. 17 .^ 70- 11o5,37 _ 1.5-5.5

_7. q[ _1_ 15-2318 - 26

Pass/Fail

99g

Supply+5V (U)

+sv (1)+I5V (I)

-15V fl)

Measured Value (mA)

l.. _ .z,q_,_tLimits (mA)

40 - 70

18 - 30

15 - 23

18 - 26

Pass/Fail

t't'¢?

6.13.7.3 Amplifier Offsets

AmplifierAR1

AR2

Measured Value (mV) Limits (mY) Pass/Fail

PP

B-26

Aq

TEST DATA SHEET B-I3 (Sheet 2 of 3)

INTERFACE/CONVERTER CCA (P/N 1331697) (Para_aph 6.13.7)

AE-26693A

10 Feb 97

6.13.7.4 Subiraction and D-A Conversion

Step 1 :

Actual Position (API) Command Position (CP)MSB LSB MSB LSB

00000000000000 00000000000000

00000000000001 00000000000000

00000000000010 00000000000000

00000000000011 00000000000000

00000000000100 00000000000000

ARI Output*

Voltage Required (Vdc)0.00000

-0.00061

-0.00122

-0.00184

-0.00245

00000000001000 00000000000000 -0.00490

00000000010000 0000000(0300000 -0.00979

Test Result

(Vdc)

tO. ¢0oo 5'

-O. Q0i?-_-0. ec,IQ,_

-0. f.31_,I'0

Pass/Fail

fff

00000000100000 0000000(X)00000 -0.01958 - 0. c 2.t Z (,00000001000000 000000013000000 -0.03917 f

00000010000000 00000000000(300 -0.07834

00000100000000 00000000000000 -0.15667

-0.3133400001000000000 00000000000000

00010000000000 00000000000000 -0.62669

00100000000000 00000000000000 -1.25338

01000000000000 00000000000000 -2.50675

0000000000000010000000000000

-0.o_cSq-0.eoaiz-7'

- o. 3z_57,7

-O._s)eo_).._Dz3-z. (.oq7

-5.'zc']q--S.01350

P

ff,

Tolerance on output voltage is + 10%

e-e

Ft'

ff

Step 2:


/vISB LS B

Command Position (CP)

MSB LSB

00000000000000 00000000000000

00000000000000 00000000000_ 1 0.00061

00000000000000 00000000000010 0. 00122

00000000000000 00000000000011 0.00184

00000000000000

00000000000000

AR 1Output*

Voltage Required (Vdc)0.00000

00000000000100 0.00245

00000000001000 0.00490

00000000000000 00000000010000 0.00979

00000000000000 00000000100000 0.01958

00000001000000 0.03917

00000010000000 0.07834

00000100000000 0.15667

00000000000000

0000000OO00000

00000000000000

00000000000000 00001000000000 0.31334

00000000000000 00010000000000 0.62669

1.2533800000000000000

(NDO00000000000

00000000000000

0010{_}000000(03

0100000O(0)0O00

10000000000000

voltage is + 10%* Tolerance on output

2.50675

-5.01350

Test Result

(Vdc) Pass/Fail

i'I'

f

ft'fe

fef

P

f,

f

B-27

AE-26693AI0Feb97


INTERFACE/CONVERTER CCA (P/N 1331697) (Parag'raph 6. I3.7)

6.13.7.5 S.trobe Funciion

step i: Strobe Low

No E11 Change


Pass/Fail

Step 2: Strobe High

E11 Change


Pas s/Fa iI

__£___

6.13.7.6 Amplifier Gain

Ell

El0

E 10 Voltage

El I Voltage

Measured Value (Vdc)O.-3z_._, 1

3.5 135,

Limits (Vdc)

10.7 - 11.3

Pa___.ss/Fail

__f_____

__L_

__f,

6.13.7.7 Ground Isolation

Pin 91 to Pin 7

DC Resistance

Measured Value (Mr2)

cP

Limits (Mf_)

>20

Comments:

Conducted by:

Verified by:

Approved by:

est Engineer t Date

uality ICon_ro¶ InspeCt\

B-28

_5

.pi.

%,


MOTOR DRIVER 3-HALL SENSOR CCA (P/N 1331694) (Para_aph 6.4.3)

AE-26693A

I 0 Fel_ 97

S/N:

Date:

6.4.3.2

#l_qql

Input Si_n.al Offset

Step No. Test Results Limits

4 e, 7_; b_/ 0.0 +I mVdc

6 i'Ig _,q 0.0 + I mVdc

0.0 + I mVdc

Step No. Test Resistor Resistance Measured13 E7-E8 (R25)

E9-E 10 (R52)

El 1-El2 (R33)

EI3-EI4(R53)

EIS-EI6 (R42)

EI7-EI8 (R54)

q. zg

3 ,)_h

_-76 I_,.z,,.._k

.zt. 7-zk

Step No. Resisiors Selected Trim Resistors

14 R25

R52

R33

R53

R42

R54

g¢c. 5..gJe.tTr_F-._g _,'c.s.s-.1-:__' !F.S-

Step No. E Point Test Results Limits Pass/Fail19 El9 0.0 _+1 mVdc

E20

E21

q.: t_q_

- O.¢2hV 0.0 +_1 mVdc

0.0 _+I mVdc

PPP

6.4.3.3

Clockwise Rotation:

Motor Driver Operation

Step No. Test Results Limits Pass/Fail2 +5V-+0.05Vdc

3

4

5

_,q_,v

I_,-e7qi. _,_,v,A

- _ff, 1,t vI_ •7"" _,

._._.IoV

70mAde max

+15V+0.15Vdc3.0mAde max

-15V_+0.15Vdc

25mAde max

+28V+0.SVdc

8mAde max

400mVdc max

50mAdc max

50mAdc max

i't'?

F'¢,

B-9

A5

AE-26693A

':" l0 Feb 97%,


MOTOR DRIVER 3-HALL SENSOR CCA (P/N 1331694) (Para_aph 6.4.3)

Counter Clockwise Rotation:

Step No. Test Resuhs Limits

3 '7- _ _ h g 400mVdc max

5 _ O. 2-_ A 50mAdc max

Pass�Fail

f

f

6.4.3.4 .Current Limit Test

Pass/Fail

Comments:

Conducted by:

Verified by:

Approved by:

estEngineer I " _

( Qjla_;t:_._ospoc4rl"-7.,n,.//h/,_ ."'

DCMC

Date

Date

Date

B-10

4"t

S/N:

TEST DATA SHEET B-4 (Sheet I of 2)

MOTOR DRIVER 3-HALL SENSOR CCA (P/N 1331694) (Paragraph 6.4.3)

AE-26693AI0 Feb"97

Date:

6.4.3.2

a.ho/ q7

Input Signal Offset

Step No. Test Results Limits

4 I-'Z'_" I_'_/ 0.0 _.+1 mVdc

6 ],'_C _"V 0.0 +_.ImVdc

8 0.0 • 1 mVdc

I I

Step No. Test Resistor Resistance Measured13 E7-E8 (R25)

E9-E10 (R52)

E11-El2 (R33) ">, 1( K

EI3-EI4 (R53)

EI5-E16 (R42)

EI7-E18 (R54)

Step No.14

Resistors

R25

R52

R33

R53

R42

R54

Selected Trim Resistors

g_c _;5.173"zt FS"

_ h] C 9 5 S q "zZ I F ._

Step No. E Point Tesi Results19 El9

E20

E21

Limits Pass/Fail

0.0 -+1 mVdc p0.0 + 1 mVdc

0.0 + I mVdc 1_

6.4.3.3

Clockwise Rotation:

Motor Driver Operation

Step No.2

3

4

5

Test Results

_. #7V

__. ,/&v

_._

Limits

+5V:t0.05Vdc

70mAdc max

+15V_+0.15Vdc

3.0mAdc max

-15V+0.15Vdc

25mAdc max

+28V_+0.5Vdc

8mAde max

400mVdc max

50mAdc max

50mAde max

Pass/Fail

fffffffff

f

B-9

AE-26693A

:_ l0 Feb 97%,

TEST DATA SHEET B4 (Sheet 2 of 2)

MOTOR DRIVER 3-HALL SENSOR CCA (P/N I331694) (Paragraph 6.4.3)

Counter Clockwise Rotation:

Step No. Test Results Limits Pass/1::ail3 400mVdc max

4

55_,q_A 50mAdc max

50mAdc max

ei'f,

6.4.3.4Current Limit Test

I StepNo. I Test Results I Limits..2-'" _ # 7 t11_ 350-500mAdc I Pass/Failf,

Comments:

Conducted by:

Verified by:

Approved by:

Date("'NTest Engineer

( Quality C_nt_ol Inspec_b'r \ Date

DCMC Date

B-10

TEST DATA SHEET B-5 (Sheeti of3)

R-D CONVERTERJOSCILLATOR CCA (P/N 1337739) (Para_aph 6.5.7)

A_

AE-26693B

19 Jun 97

Date

CCA S/N

6.5.7.1

Step 2:

F .I13377_q- I-U'I/F Pre-Test

Supply Currents C,Vithout UUT)

Step 6:

Supply ('Vdc) (Baseline) Measured Value (mA) Limits (mA) Pass/Fail

(Without UUT)+15 O. 06 0-I

-15

+5

--o.zg0.06

-I-0

0-I

ff

Supply Voltages _Vithout UUT)

Supply+15V (I)

Measured Value (V)

l$.o 2_-15V(I) - L_, O (

+5V fl) _;.Ob

Limits (V) Pass/Fail

± 0.50

± 0.50

_-+0.25 O

Supply Currents (UUT Installed)

Supply (Vdc) Measured Value (mA) Difference (mA) 'Limits (mA)('UU-I"Installed) (Measured - Baseline)

+ 15 20-40

-15 -. j_. _+5 )4- / 0

-30 - -50

30-70

Pass/Fail

Fr

6.5.7.2 Supply Voltages (LrLFF Installed)

Suppl_,

+15V fl) ..

Measured Value (V) Limits CV,)I5. o_ _.0.50

-15v (D - t_. ¢7 _+0.50

+5V (1) _. o 7. _+0.25

Oscillator Frequency..Dutv Cycle, and ..Output Voltage

Parameter Measured Value Limits

1550-1650 Hz

Pass/Fail

t"t'F

6.5.7.3

Frequency

Du D, Cycle

Output Voltage 7.'/'t V

45'55 %

7.6-8.4 Vrms

Pass/Fail

P

B-II

AE -26693B

19 Jun 97


R-D CONVERTER/OSCILLATOR CCA (P/N 1337739) (Parauaph 6.5.7)

At/

6.5.7.4 R-.D Converter Operation

Step 1:

Bit Number/ CW CCW

Test Fixture Label Pass/Fail Pass/Fail

API 0/1 . , /bAPI I/2

API 2/3

API 3/4

API 4/5

API 5/6

API 6i7

API 7/8

API 8/9

API 9/10

API 10111

API 11/12

API 12/13

API 13114

Converter Busy

rr

I,t

P

i;)

,fStep 2:

RS I Measured Value Calculated Value (Vdc) * Calculated Value (Vde) * Pass/Fail

(El0) I (Vdc) CCA - I Assy CCA -2 AssyCW Rotation** t. #_fTq (+) I" "/'_G V (+) ld[_ -

CCW Rotation** - l- _'2. i (-,) 1"7 _ G' _ (-) _[&

• Signal level function of te{.t and calibration gain resistors. Record calculated value and measured value. Measuredvalue shall be within +_I.0"percent of calculated value. The equation is as follows:

Amplifier Gain

" ' PES-I_S

6.5.7.5

PES = +0.300 Vdc

PES = -0.300 Vdc I-l (_

Measured Value Limits (Vdc)

(Vdc)

i • i 1.ootol.3O '1.00 to 1.30

6.5.7.6 Direction Control Si_=nal

DIR CNTR.L Measured Value Limits (V'dc) Pass/Fail

(Vdc)

CW Rotation _-. e 0 I 4:5 to 5.5 f

CCW Rotation O. I 3 ._ 0.0 to 0.4 -p

¢

B-12


R-D CONVERTER/OSCILLATOR CCA (P/N 1337739) (Paragraph 6.5.7)

,4ri

AE-26693B

19 Jun 97

6.5.7.7 . N.otch Filter Frequency Response

Frequency Measured Value (Hz) Calculated Value (Hz) * Calculated Value (Hz) * Pass/Fail

CCA - I Assy CC.A -2 Ass),

_3 Notch _ t_ wi_r _ fPr dl/_

AR4 Notch _ - IARS Notch _ " [ | I

• Notch frequencies shall be within +_.3percent of values determined by test and calibration resistors. Record calculatedand measured values.

C°mmen_:g0_'_.

Conducted by:

Verified by:

Approved by:

- - D te/ /

DCIvlC Date

B-13

A_

°.:


Date


CCA S/N

6.5.7.1I")_ 77_9-- I

UUT Pre-Test

Step 2:

Supply Currents O,Vithout UUT)

Supply (Vdc) (Baseline) Measured Value (mA) Limits (mA) Pass/Fail

(Without UUT)

+15 0-1-15

+5

-I -0

0-I

f?P

Supply Voltages (Without UUT)

Supply+15V (I)

-15V (I)+5V (I)

Measured Value (V)

15. 97.v

!;. o3V

Limits (V)

± 0.50

z 0.50

_+0.25

Pass/Fail

PP

Step 6:

Supply Currents (UUT Installed)

P

Supply (Vdc) Measured Value (mA) Difference (mA) Limits (mA) Pass/Fail

(UUT Installed) (Measured - Baseline)

+ 15 20-40

-15", I. 7.._-

90.51[_t_

-3o - -5o

PP

+5 30-70 p

Limits (V) Pass/Fail

*_0.50 I_

AE-26693A

10 Feb 97

6.5.7.2 Supply Voltages (UUT Installed)

SupPlY

+lSV (I)

Measured Value (V)15;.o IV

-luc. q_V-15V (I) *_0.50

+5V (I) '3- _ 2.,,4 --,20.25

6.5.7.3 Oscillator Frequency, Duty Cycle. and Output Voltage

Parameter Limits Pass/Fail

Frequency

Duty Cycle

Output Voltage

Measured Value

I& 15 _'l'Z 1550-1650 Hz

_9., .'_'o 45-55 %

]1. o._gb '_ 7.6-8.4 Vrms

t'fi=,

aP

B-I1

AE-26693A.: 10 Feb 97



6.5.7.4

Step l:

Step 2:

R-D Converter Operation

Bit Number/ CW CCW

Test Fixture Label Pass/Fail Pass/Fail

API 0/1

API 1/2

API 2/3

API 3/4

API 4/5

AP[ 5/6

API 6/7

API 7/8

API 8/9

API 9/10

API 10/l I

API 11/12

API 12/13

API 13/14

Converter Busy

f

f,

¢,t_

fI'

fff,f,f1>

t'fe

f

Measured Value Calculated Value (Vdc) * Calculated Value (Vdc) * Pass/Fail

la._ ('_ so_ fVdc) CCA-1 Ass>, CCA -2 AssyCW Rotation** _. S _ V 1-74 V _///_

CCW Rotation** - I, 19 _' -- [_7_IV ' k//h t7

• Signal level function of test and calibration gam resistors. Record calculated value and measured value. Measured

value shall be within +10 percent of calculated value.'Y'_ _./£_-- cx._-,_...._,_'_:

-- _ _ - Fx__ox v _ RTx _;lh

6.5.7.5 Amplifier Gain _ _. t_, ,9,_

PES-RS Measured Value Limits (Vdc) Pass/Fail '

(Vdc) /PES = +0.300 Vdc _ • i 0 V 1.00 tol.30

PES = -0.300 Vdc _, I "2.- V 1.00 to 1.30

6.5.7.6 Direction Control Signal

DIR CNTRL Measured Value Lim'its (Vd¢) Pass/Fail

(Vdc)

; J_'CW Rotation _, o o V 4.5 to 5.5 _'CCW Rotation _ , I "_I/' 0.0 to 0.4

_'- t 9-9"/

B-12

,4g


R-D CON'VERTERJOSCILLATOR CCA (P/N 1337739) (Paragraph 6.5.7)

AE-26693A

10 Feb 97

6.5.7.7 Notch Filter Frequency Response

Frequency

AR3 Notch

AR4 Notch

AR5 Notch

Measured Value (Hz)

)J

Calculated Value (Hz) *

CCA - 1 Assy

-I

Calculated Value {Hz) * Pass/Fail

CCA -2 Assv

* Notch frequencies shall be within +3 percent of values determined by test and calibration resistors. Record cland measured values.

Comments:

Conducted by:

Verified by:

Approved by:

f"'_Test Engineer , Date ,

B-13

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TEST DATA SI:I'EET 7 (Sheet 1 Of 4)Scan Motion and Jitter Test (AI-1) (Paragraph 3.4.4.5)

Step No.7

9

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A-10

TESTDATA SHEET 7 (Sheet 2 Of 4)Scan Motion and Jitter Test (A1-I)

AE-26002fIC2 Oct 97

Step No.17

18

19

2O

21

22

23

24

DescriptionScene 9-103.33* step


Scene 11-123.330 step


Requirement Test Result<35 msec dse time per Figure 7







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<:. 3S m 5cc

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A-II

G,'7

AE-26002/lC2 Oct 97

TEST DATA SHEET 7 (Sheet 3 Of 4)Scan Motion and litter Test (AI-1)

Test Result Pass/FailStep No.25

26

27

28

29

3O

31

32

DescriptionScene 17-18

3.33 ostep

Scene 18-19

3.33° step



Scene 21-22'3.33ostep


Scene 23-243.33o step

Scene 24-253.33* step

Requirement<35 msec rise time per Figure 7

< -*-5%jitter per Figure 7< 3% overshoot for 10 msec







< ±5% jitter per Figure 7_< 3% overshoot for 10 msec

;<35 msec rise time per Figure 7




< +5% jitter per Figure 7< 3% overshoot for 10 msec

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A-12

TESTDATASI-IEET 7 (Sheet 4 Of 4)Scan Motion and Jitter Test (AI-I)

AE-26002/1C2 Oct 97

Step No.33

34

35

36

37

38

DescriptionScene 25-26

3.33 ° step



Requirement<35 msec rise time per Figure 7

< ±5% jitter per 15igure7< 3% overshoot for 10 msec<35 msec rise time per Figure 7



Test Result

__ 3,5-zn a-e-c

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/

3"2°



Scene 30Cold Cal

35.0 ° slew

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< ±0.11_i ° jitter per Figure 11

39 Cold Cal - <0.40 see slew time per Figure 12 _L_ O__ o E_ cWarm Cal

96.67°slew <±0.165°jitterperFigure13 _. ± _1[=,5"_

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A-13

AE-26002J1C2Oct97

TESTDATAStIEET8 (Sheet1 Of 4)ScanMotionandJitterTest(AI-2)(Paragraph3.4.4.5)

Step No.44

10

11

12

13

14

15

Description




Scene 4-53.330 step


Scene 6-73.330 step

Scene 7-83.330 step

Scene 8-93.330 step

16

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Requirement _=

Stepping Slewing /_<8 sec period per Figure

Q."7, T_L,_,_'_ est Result

< _.05...,-



,_±5%'jitter per Figure 7< 3% overshoot for 10 msec<35 msec rise time per Figure 7


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A-14

TEST DATA SHEET 8 (Sheet 2 Of 4)Scan Motion and JitterTest (A1-2)

AE-26002/1C2 Oct 97

Step No. Description Requirement Test Result Pass/Fail17

18

19

2O

21

22

23

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Scene 9-103.33 ostep


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A-15

AE-26002/1C2 Oct 97

TEST DATA SI-IEET 8 (Sheet 3 Of 4)Scan Motion and Jitter Test (A1-2)

Step No.25

26

27

28

29

3O

31

32

DescriptionScene 17-183.330 step

Scene 18-19

3.33 ° step


Scene 20-21

3.330 step


Scene PP-233.33 ° step

Scene 23-24

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Requirement Test Result Pass/Fail<35 msec rise time per Figure 7






<35 msec risetime per Figure 7

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A-16

TEST DATA SHEET 8 (Sheet4 Of 4)

ScanMotionandJitterTest(AI-2)

AE-2600211C

2 Oct97

Step No.33

34

35

36

37

38

39

Descriptionscene 25-26

3.33 ° step

' scene 26-27

3.33 ° step

scene 27-28

3.33 ° step

Scene 28-293.33°step

Scene 29-30

3.33°step

Scene 30Cold Cal

35.0 ° slew

ColdCal-Warm Cal

96.67 ° slew

Requirementi<35 msec rise time per Figure 7

I< ±5% jitter per Figure 7< 3% overshoot for 10 msec


< ±5% jitter per Figure 7< 3% overshoot for 10 msec<35 msec rise time per Figure

< ±5% jitter per Figure 7< 3% overshoot for 10 msec<35 msec rise time per IZigure 7


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Test Result

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TEST DATA SHEET 9

28V Bus Peak Current and Rise Time Test (Paragraph 3.4.4.6)

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4 < 1 A peak any place in the scan _'_f 0 /_ _ /3

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Gain/Phase Margin (AI-1) (Paragraph 3.4.4.8)

Test Setup Verified: ?_,_

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Shop OrderNo. _ _ _ 6"'6/

Dq

AE-26002/1C

2 Oct 97

Requirement

9.2 dB minimum

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A-19

AE-26002/1C2 Oct 97

D_

TEST DATA SHEET 11

Gain/Phase Margin (A1-2) (Para_aph 3.4.4.8)

_FTemperature: 7_,.3 "C

'Requirement

9.2 dB minimum

25 degrees minimum

1

23

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C_erafional Gain Margin (A1-l) (Paragraph 3.4.4.9)i-) r/till __

Test Setup Verified: __J e ShopOrderNo.. =_'_(

Temperature:" r vl C

E5

AE-26002/1C2 Oct 97

Step No.

11

12

16

RequirementR58 Resistance (kohms)

Test Pot Resistance (kohms)

Oscillation Frequency (Hz)

Gain Margin, 8 dB minimum

Test ResuR

1 36. 7"/ /_ "£'="

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a •

A-21

AE-26002/1C2Oct97

TESTDATA SHEET 13

Operational Gain Margin (A1-2) (Para_aph 3.4.4.9)

Test Setup Verified: _l,.Jl('_h/_A]_,'_//_ Shop Order No. Z_'_,ff(_/

Temperature: _'e F*C

_q

Step No.

11

12

16

RequirementR58 Resistance (kohms)

Test Pot Resistance (kohms)

Oscillation Frequency (Hz)

Gain Margin, 8 dB minimum

"I /'_ nil,, #

2 _,_

1231

12:3

Test Result

4' Ac't/-;'zs_q_ 37,b7_v,)3'4.37_ K/-_---

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Unit:

Serial No.:

I35"6 O0 _- _ -- I T

ZOZ

Test Engineer: _A__//_

,, 7 ff/Qu ity suranc¢: |,_ _5.'_-_'S'_ _

Da,o:l-z?-?8

A-22

53-55NFSD 89-0 (June 30, 1989) FORMS

N/LRANational Aeronautics and

Space AdmlnisVation

Report Documentation Page

1. Report No, 2. Government Accession No.

4. Title and Subtitle

integrated Advanced Microwave Sounding Unit-A

(AMSU-A), Performance Verification Report

7. Author(s)

A. Nieto

9. Performing Organization Name and Address

Aerojet1100 W. HollyvaleAzusa, CA 91702

12. Sponsoring Agency Name and Address

NASA



3. Recipient's Catalog No.

5. Report Date

July 1998

6 Performing Organization Code

18. Performing Organization Report No.

11183

10. Work Unit No.

11. Contract or Grant No.

NAS 5-32314

13. Type of Report and Period Covered

Final

14. Sponsonng Agency Code

___

15. Supplementary Notes

16. ABSTRACT (Maximum 200

words )

This is the Performance Verification Report, EOS AMSU-A1 Antenna Drive Subassy, PIN

1356008-1, SIN 202 for the Integrated Advanced Microwave Sounding Unit-A (AMSU-A).

17. Key Words (Suggested by Author(s))

EOS

Microwave System

18. Distribution Statement

Unclassified- Unlimited

19, Security Classif, (of this report)

Unclassified

20. Security Classif. (of this page)

Unclassified

21. No. of pages 22. Pdce

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4. TITLE AND SUBTITLE

Integrated Advanced Microwave Sounding Unit-A

(AMSU-A), Performance Verification Report

6. AUTHOR(S)A. Nieto

7. PERFORMING ORGANIZATION NAME(S) AND ADDRESS(ES)

Aerojet

1100 W. Hollyvale

Azusa, CA 91702

9. SPONSORING/MONITORING AGENCY NAME(S) AND ADDRESS(ES)

NASA



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July 1998

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This is the Performance Verification Report, EOS AMSU-A1 Antenna Assy, PIN 1356008-1,

SIN 202 for the Integrated Advanced Microwave Sounding Unit-A (AMSU-A).

14. SUBJECT TERMS

EOS

Microwave System

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Block 13. Abstract. Include a brief Maximum 200 wnrd_

factual summary of the most significant information contained in

the report.

Block 14. Subject Terms. Keywords or phases identifying major

subjects in the report.

Block 15. Number of Pages.Enter the total number of pages.

Block 16. Price Code. Enter appropriate price code_TIS

only),

Block 17- 19.Security Classifications. Serf-explanatory. Enter

U.S. Security Classification in accordance with U.S. Security

Regulations (i.e., UNCLASSIFIED). If form contains classified

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Standard Form 298 Back(Rev. 2-89)

53-86

DOCUMENT APPROVAL SHEET

__ II_J,,ql =,_ ___u 'wm,__-- - •

TITLE

Performance Verification Report

Subassembly and Complete Instrument AssemblyEOS AMSU-A1 Antenna Drive Subassembly, P/N 1356008-1, S/N 202

DOCUMENT NO.

Report 11183

July 1998

INPUT FROM: DATE

A. NietoCDRL:

2O8

CHECKED BY: DATE

SPECIFICATION ENGINEER:

JOB NUMBER:

DATE

DATE

APPROVED SIGNATURES

Engineering (T. Higgins) (--_.,

Product Team Leader (A. Nieto)

Systems Engineer (R. Platt) _'P.

Design Assurance (E. Lorenz)

Quality Assurance (R. Taylor)

Technical Director/PMO (R. Hauerwaas) _/)/_\\

Management (J. Cavanaugh)/_Configuration

,_j//,

By my signature, I certify the above document has been reviewed by me and concurs with the technical

requirements related to my area of responsibility.

DEPT. NO.

7831

8341

8311

8331

7831

4001

8361

DATE

RELEASE (Data Center) FINAL