inside the black box: system optimization for …€¦ · normal nvis sources can vary in spectral...
TRANSCRIPT
INSIDE THE BLACK BOX: SYSTEM OPTIMIZATION
FOR MEASUREMENT OF NVIS COMPATIBLE DISPLAYS
By Dr. Richard Young, William E. Schneider February 1998
Reprint Number: R19 | Cover Sheet Updated: Mar 2019 | OptronicLabs.comAs part of our policy of continuous product improvement, we reserve the right to change specifications at any time.