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© 2017 Consolidated Edison and SEL If You Cannot Test It, You Cannot Use It – IEC 61850 GOOSE System Designed With Testing in Mind Don Burkart Consolidated Edison of New York William Edwards, Anne Atalay, and Stephen Snuggs Schweitzer Engineering Laboratories, Inc.

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Page 1: If You Cannot Test It, You Cannot Use It – IEC 61850 GOOSE ...prorelay.tamu.edu › wp-content › uploads › sites › 3 › 2017 › ... · IEC 61850 GOOSE System Designed With

© 2017 Consolidated Edison and SEL

If You Cannot Test It, You Cannot Use It –IEC 61850 GOOSE System Designed

With Testing in Mind

Don BurkartConsolidated Edison of New York

William Edwards, Anne Atalay, and Stephen SnuggsSchweitzer Engineering Laboratories, Inc.

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• Testing• Test plans / sets• Drawings• System expansion• System updates

Keys to a Successful GOOSE SystemWhere to Plan?

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Hardwired vs. EthernetHow Is Virtual Wiring Different?

Publishing IED

Subscribing IED

Subscribing IED

Subscribing IED

Ethernet Network

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How Can GOOSE Systems Be Designed to

Support Testing?

GOOSE Word Bit

From Device

IED Word Bit Description

VB001 Tie 1-2 n/a Communications failureVB002 Tie 1-2 LT10 Test mode enabledVB003 Tie 1-2 SV02T AF pickupVB004 Tie 1-2 SV11T FB blockVB005 Tie 1-2 LT18 AF lockout tripVB006 Tie 1-2 LT20 FB lockout tripVB007 Tie 1-2 (unused) Breaker closed VB008 SpareVB009 SpareVB010 SpareVB011 Source 2 n/a Communications failureVB012 Source 2 LT10 Test mode enabledVB013 Source 2 (unused) AF pickup VB014 Source 2 (unused) FB block VB015 Source 2 LT17 AF lockout tripVB016 Source 2 LT19 FB lockout tripVB017 Source 2 SV28T Breaker closedVB018 SpareVB019 SpareVB020 Spare

VB051 Feeder E (future) Communications failureVB052 Feeder E (future) Test mode enabledVB053 Feeder E (future) AF pickup VB054 Feeder E (future) FB block VB055 Feeder E (future) AF lockout tripVB056 Feeder E (future) FB lockout tripVB057 Feeder E (future) Breaker closedVB058 SpareVB059 SpareVB060 Spare

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GOOSE Word Bit

From Device

IED Word Bit Description

VB001 Tie 1-2 n/a Communications failureVB002 Tie 1-2 LT10 Test mode enabledVB003 Tie 1-2 SV02T AF pickupVB004 Tie 1-2 SV11T FB blockVB005 Tie 1-2 LT18 AF lockout tripVB006 Tie 1-2 LT20 FB lockout tripVB007 Tie 1-2 (unused) Breaker closed VB008 SpareVB009 SpareVB010 Spare

Page 6: If You Cannot Test It, You Cannot Use It – IEC 61850 GOOSE ...prorelay.tamu.edu › wp-content › uploads › sites › 3 › 2017 › ... · IEC 61850 GOOSE System Designed With

How Can GOOSE Systems Be Designed to Support Testing?

Page 7: If You Cannot Test It, You Cannot Use It – IEC 61850 GOOSE ...prorelay.tamu.edu › wp-content › uploads › sites › 3 › 2017 › ... · IEC 61850 GOOSE System Designed With

How Can GOOSE Systems Be Designed to Support Testing?

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• Global SER visibility• Consistent logging• Positive and negative

receipt verifications

How Can GOOSE Systems Be Designed to Support Testing?

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How Can Relay Technicians Incorporate GOOSE System Verifications Into Relay Test Plans?

Page 10: If You Cannot Test It, You Cannot Use It – IEC 61850 GOOSE ...prorelay.tamu.edu › wp-content › uploads › sites › 3 › 2017 › ... · IEC 61850 GOOSE System Designed With

DrawingsHow Should GOOSE Signals Be Incorporated

Into Drawing Packages?

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25 Synchronism Check27 Undervoltage50 Instantaneous Overcurrent50G Ground Instantaneous Overcurrent51 Time Overcurrent51G Ground Time OvercurrentAF Arc-Flash TrippingCOM Communications-Based Tripping Scheme EnabledFB Fast-Bus TrippingMET Metering

50G51G

5051

AF FB COM

2527MET 27

DC

Source 1 Relay

Source 1 Breaker

Trips Source 1 Breaker

To SCADA

3Φ 1Φ

CTs 1–3 (1200:5A)

CTs 4–6 (1200:5A)

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TOL1

TOL2

RB21LT10

Light Input 1

Light Input 2

Test Send

Test Mode Enabled

SV02T0 PU

0.1 DO

SV02

Send AF Pickup (PU) Via GOOSE to Adjacent Sources

PB04_PULLT10 To Other Relays Via GOOSE

SET10 = Test Mode EnabledRST10 = Test Mode Disabled

To Other Internal Logic

Pushbutton 4 Pulsed

SET10 RST10

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• Subscription mapping pattern

• Reserved blocks for expansion

• Convenient logic

How Can GOOSE Systems Be

Designed With Expansion in Mind?

VB051 Feeder E (future) Communications failureVB052 Feeder E (future) Test mode enabledVB053 Feeder E (future) AF pickup VB054 Feeder E (future) FB block VB055 Feeder E (future) AF lockout tripVB056 Feeder E (future) FB lockout tripVB057 Feeder E (future) Breaker closed

GOOSE Word Bit

From Device

IED Word Bit Description

VB001 Tie 1-2 n/a Communications failureVB002 Tie 1-2 LT10 Test mode enabledVB003 Tie 1-2 SV02T AF pickupVB004 Tie 1-2 SV11T FB blockVB005 Tie 1-2 LT18 AF lockout tripVB006 Tie 1-2 LT20 FB lockout tripVB007 Tie 1-2 (unused) Breaker closed VB008 SpareVB009 SpareVB010 Spare

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• Transmit message modifications

• New transmit messages• Relay logic updates

What Impact Do Settings Modifications Have on Test Validation?

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• Logical subscription mapping patterns prevent and identify virtual wiring errors

• GOOSE signal isolation is critical to in-service testing• System visualization aids in testing

Summary

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• GOOSE system verifications should be documented in test plans

• GOOSE signals should be documented in drawing packages

• Design should allow expansion and minimize retesting

Summary

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Questions?