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!PSNN-2018-0209
• Safety-related D Non-Safety-related DASMECODE Dothers ( )
I Document No. I FPG-TRT-CS 1-0101 I Rev I 3
NRW-FPGA-Based PRM System Qualification Project
Document Title Qualification Test Summary Report
CUSTOMER NAME None PROJECT NAME NRW-FPGA-Based PRM
System Qualification Project ITEM NAME PRM Equipment ITEM NO. C51 JOB NO. FPG
TOSHIBA ESS NED verified this Design Document;
Method: Design Review
Verification Re2ort No.: DVR-E2-20180528-1
Verified by I.Ito
Groug Name: Second Electrical System Design & Engineering GrouJ;!
Date May 31, 2018
See DCN-FPG-TRT-C51-0101-003
3 May 31, 2018 7:.?11~ 7:.?11~ /T.c//~·
May 31, 2018 May 31, 2018 May 28, 2018
Rev. No. Issue Date Description Approved by Reviewed by Prepared by
Initial Issue Issued by Approved Reviewed Prepared
Document Filing No. Date by by by
Second Electrical System Apr 16,2008 Design &Engineering N. Oda N. Oda H. Sakai RS-5125699
Grouo
Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3
Date History Approved Reviewed
Rev No. by by
0 Apr 16,2008 The first issue N.Oda T.Ito
1 Mar 31,2016 Clarification of test
N.Oda N.Oda configuration
2 Sept. 28, 2017 See DCN-FPG-TRT-C51-0101-002 N.Oda N.Oda
3 See cover page See cover page See cover See cover
page page
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Prepared by
H.Sakai
T.Miyazaki
T.Miyazaki
See cover page
FPG-TRT-C51-0101 Rev. 3
Table of Contents
1. Introduction .................................................................................................................. 5
1.1. Background ............................................................................................................. 5
1.2. Scope of the Qualification Test.. ............................................................................ 8
2. Description of Test Specimen and Test Equipment.. .................................................... 8
2.1. Description of Test Specimen ................................................................................ 8
2.2. Description of Test Equipment .............................................................................. 9
2.3. Test Configuration ................................................................................................. 9·
2.4. Modifications ......................................................................................................... 9
3. Performance Specifications ........................................................................................ 11
3 .1. Environmental Test .............................................................................................. 11
3 .1.1. Test Conditions ............................................................................................. 11
3 .1.2. Performance Requirements ........................................................................... 11
3.2. Seismic Test ......................................................................................................... 11
3 .2.1. Test Conditions ............................................................................................. 11
3.2.2. Performance Requirements ........................................................................... 12
3.3. Electromagnetic Compatibility (EMC) Tests ...................................................... 13
3.3.1. EMI/RFI Emission Tests .............................................................................. 13
3.3.2. EMI/RFI Susceptibility Test.. ....................................................................... 14
3.3.3. Surge Withstand Capability Test .................................................................. 15
3.3.4. EFT/B Test .................................................................................................... 16
3.3.5. ESD Test ....................................................................................................... 16
3.3.6. Class IE to Non-IE Isolation Test.. .............................................................. 17
4. Description of Test Facility and Equipment ............................................................... 18
4.1. Test Facility .......................................................................................................... 18
4.2. Mounting ............................................................................................................. 18
4.2.1. Environmental Test ....................................................................................... 18
4.2.2. Seismic Test .................................................................................................. 19
4.2.3. EMI/RFI, Surge Withstand Capability, EFT/B, ESD and Isolation Tests .... 20
4.3. Test System Configuration and Electrical Connections ...................................... 22
4.4. Instrumentation .................................................................................................... 22
5. Test Procedures ........................................................................................................... 23
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5.1. Pre-Qualification Test .......................................................................................... 29
5.2. Enviromnental Test. ............................................................................................. 30
5.3. Seismic Test ......................................................................................................... 31
5.4. EMI/RFI Test ....................................................................................................... 32
5.4.1. Conducted Susceptibility (Power Leads) ..................................................... 33
5.4.2. Radiated Susceptibility ................................................................................. 34
5.4.3. Conducted Emission ..................................................................................... 34
5 .4 .4. Radiated Emission ........................................................................................ 3 5
5.5. Surge Withstand Capability Test ......................................................................... 35
5.6. EFT /B Test ......................................................................................................... 36
5.7. ESD Test .............................................................................................................. 36
5.8. Class lE to Non-lE Isolation Test ....................................................................... 36
5.9. Performance Proof Test ....................................................................................... 37
5 .10. Testing Conclusion .............................................................................................. 3 8
6. Test Data and Results ................................................................................................. 39
6.1. Baseline Performance of Test Specimen Units .................................................... 39
6.2. Enviromnental Test .............................................................................................. 39
6.2.1. Summary of Enviromnental Test.. ................................................................ 39
6.2.2. Data Evaluation ............................................................................................ 40
6.3. Seismic Test ......................................................................................................... 49
6.3.1. Summary of Seismic Test .......................... ; .................................................. 49
6.3.2. Data Evaluation ............................................................................................ 50
6.4. EMC Test ............................................................................................................. 54
6.4.1. Summary of EMC Test ................................................................................. 54
6.4.2. Data Evaluation ............................................................................................ 57
7. Conclusion .................................................................................................................. 63
8. References, Definitions and Acronyms ...................................................................... 67
8.1. References ........................................................................................................... 67
8.2. Definitions and Acronyms ................................................................................... 68
APPENDIX A Test results data for Seismic Tests ............................................... 70
APPENDIX B Test results data for EMC Tests .................................................. 94
APPENDIX C Details of the Operability Test and the Prudency Test ...................... 135
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1. Introduction
Qualification Test Summary Report Revision 1 incorporates the following:
Clarification of hardware configuration in the Master Configuration List
(Reference (29))
Correction of description for design change of the AO module in Section 2.4
Correction of reference errors
Correction of minor errors
Clarification of description
Qualification Test Summary Report Revision 2 incorporates the following:
Correction of minor errors
Correction of Figure of APPENDIX A and B
Qualification Test Summary Report Revision 3 incorporates the following:
Correction of inconsistencies with other documents and errors.
1.1. Background
Toshiba Nuclear Energy System & Service Division (NED) performed a genenc
qualification of the Non Re-writable Field Programmable Gate Array (NRW-FPGA)
technology for safety-related Instrumentation and Control (I&C) systems. These systems
use programmable logic in the FPGA for all functions and have neither central processing
units (CPUs) nor operating systems. These systems have high testability and are designed
for a long operational life. Toshiba is qualifying the NRW-FPGA-Based I&C systems for
use in safety-related systems at nuclear power plants in the U.S.A.
The specific system to be qualified in this project is the BWR Power Range Monitor (PRM).
The PRM system monitors the reactor power by measuring the neutron flux level,
converting the measured flux to percent power, averaging many measured percent power
readings, and issuing a trip signal when the average percent power exceeds the specified set
point value. The PRM is a safety-related (Class lE) system. Figure 1-1 shows the
overview of this project, which comes from Figure 9-1 of the Qualification Plan
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(Reference (11)).
The qualification ofNRW-FPGA-Based systems was performed in based on the applicable
guidance provided in EPRI TR-107330 (Reference (3)). The generic qualification
approach described in EPRI TR-107330 includes both hardware qualification and software
qualification. EPRI TR-107330 requires tests to be performed as part of the qualification
process, under a 10 CFR 50 Appendix B nuclear quality assurance program. This
Qualification Test Summary Report documents Toshiba's Qualification Tests. The tests
were performed according to the Master Test Plan (MTP) (Reference (12)) in which the
applicable EPRI TR-107330 requirements are implemented.
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Specified in this qualification plan
ERS
Procurement Planning Sheet
Qualification Plan
FPG-TRT-C51-0101 Rev.3
.......................................................................... SQAP
I . . Preliminary Technical Evaluation Report
~co_p~-<?:f. "fu_i~ _e_p_q_~ _., Master Test
Plan
1-------- ------, : Qualification : : Testing : : Activities : , ______________ ,
Qualification Test
Summary Report
L--·-·-·-· ·-·-·-·
Acceptance Plan for CGI
Procurement /QA Spec for
CGI
1------ --------, : Procurement : : Activities I I I , ______ --------1
Acceptance Record for
CGI
Acceptance Plan for CGS
Procurement /QA Spec for
CGS
1---------------, : Procurement : : Activities I I I I , ______ --------·
Acceptance Record for
CGS
Final Technical Evaluation Report
CGD . Packaae
,--- ------ ----, : Software : : Qualification : : Activities : I I , ______________ ,
Qualification · Analysis
report
Software Qualification
Report
l. ........................................................................................................................................................................................................................................................................................................................... : Figure 1-1 Relationship Between Project Documents
(Figure 9-1 of the Qualification Plan)
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1.2. Scope of the Qualification Test
This Qualification Summary Report was issued to document the test results and evaluate
the test results against the acceptance criteria provided in the MTP.
The PRM qualified in this project differs from PLC-based equipment typically qualified
using EPRI TR-107330. The qualification tests were customized to eliminate unnecessary
tests, including incorrect EPRI requirements for aging equipment installed in mild
environments. Equipment Requirement Specification (ERS) (Reference (13)) specifies
equipment requirements of the units to be qualified.
2. Description of Test Specimen and Test Equipment
The Test Specimen Units tested in this qualification proj~ct were designed and
manufactured in accordance with the ERS, which was established to summarize the
applicable requirements from the following three. documents:
• EPRI TR-107330
• PRM System design specification provided for a typical Japanese plant
• Fuchu Complex vendor information
2.1. Description of Test Specimen
The Test Specimen was composed of all units needed to create a Test System which provides
the typical PRM functions for a BWR-5. The Test Specimen for the project consisted of one
LPRM Unit, one LPRM/ APRM Unit, one Flow Unit, interconnecting cables, and the spare
modules and the spare chassis that were provided for maintenance of the Test Specimen
Units. Appendix 1 of the MTP provides a detailed description of the Test Specimen.
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2.2. Description of Test Equipment
The Test Equipment was composed of equipment needed to generate input signals and to
monitor the output signals of the Test Specimen during the Qualification Test. As
described in Section 6.3 of MTP, this included data recording equipment, a variable power
supply, and input simulators. The Test Equipment was provided and controlled based on the
ERS Section 7.3.1.3, which satisfies the requirements of EPRl TR-107330 Section 6.2.3.
The Preliminary Technical Evaluation Report (PTER) (Reference (14)) specified the Test
Equipment requirements. Detailed Test Equipment specifications are described in MTP
Section 6.3.
2.3. Test Configuration
The Qualification Tests were performed on a Test System, which contains the Test
Specimen and Test Equipment. The configuration of the Test System used in this
qualification project is shown in Figure 4-1 of the PTER.
2.4. Modifications The Radiation Exposure Test was conducted in July 2006 with the hardware configuration
identified by the date May 25th, 2.006 in the Master Configuration List (Reference (29)).
The Environmental Test was performed during June 2006 through October 2006 with
hardware configuration identified by the date May 25th, 2006 and August 7th, 2006 in the
Master Configuration List. The Hardware configuration was changed during the
environmental test after a Test System failure caused by incorrect operation of the
environmental chamber, where water condensing on the top of the chamber fell into the
powered electronics. Details for the hardware configuration change are described in Section
6.2.2.2 of this report.
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The EMI/RFI, Surge Withstand Capability, EFT/B, ESD and Class lE to Non-IE Isolation
Tests, were performed from October 2006 through March 2007 with the hardware
configuration identified by the date August 7th, 2006 in the Master Configuration List.
However, the EMI Susceptibility Test failed. The hardware was re-designed to resolve the
test failure. Therefore, for the second EMI/RFI, Surge Withstand Capability, EFT /13, ESD
and Class lE to Non-IE Isolation tests, the LPRM module HNSOll and the AO modules
HNS511, HNS512, HNS513, and HNS514 were replaced with the LPRM module HNS013
and the AO modules HNS515, HNS516, HNS517 and HNS518. This test configuration is
identified with the August 24th 2007 date in.the Master Configuration List. The re-designed
LPRM and AO modules had additional · capacitors to enhance
electric-noise-withstand-capability and passed the test.
Two capacitors were added on the LPRM module. Those two capacitors are the same
capacitors used in the other locations in the LPRM module.
Several changes were made to the multiple output channels on the AO board. The changes
can be grouped into six categories as follows:
(1) Toshiba added 16 capacitors of the same type and capacity used in the LPRM module.
(2) Toshiba added 18 capacitors that are .of the same type as those used in the LPRM
module but have a different capacity.
(3) Toshiba replaced 16 capacitors with the same capacitor described in Item (2).
(4) Toshiba added 16 capacitors of the same type and capacity that were originally used in
the same AO module in different locations.
· (5) Toshiba enhanced the grounding connection in the module
(6) Toshiba moved some labels.
Because the same types of capacitors as the added capacitors had been used in other
modules that passed the EQ tests (the environmental 'test and seismic . test), Toshiba
considered that the results of the environmental test and seismic test for the LPRM and AO
modules without the additional capacitors were applicable to the LPRM and AO modules
with the additional capacitors. Toshiba repeated the electromagnetic qualification tests
with the revised modules.
After the second EMI/RFI, Surge Withstand Capability, EFT/B, ESD and Class lE to
Non-IE Isolation Tests, the replaced modules were removed and the origina:l modules were
re-installed on February 20th, 2008, as shown in the Master Configuration List.
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Figure 2.4.1 [Deleted]
Figure 2.4.2 [Deleted]
3. Performance Specifications
3.1. Environmental Test
3.1.1. Test Conditions
3.1.1.1. Radiation Exposure
The Test Specimen Units were subjected to the total dose of 11 Gy +30%/- 9% gamma
radiation (to satisfy the ERS section 5.5.1 of 10 Gy with 10% margin) using a 6°Co gamma
ray source. The dose rate was measured at 4.27 Gy-air/hour.
3.1.1.2. Temperature and Humidity
The Test Specimen Units were subjected to the temperature and humidity conditions as
shown in Figure 5-2 of ERS to evaluate the effects of temperature and humidity on Test
Specimen operability.
3.1.2. Performance Requirements After the test, the performance of the Test Specimen Units was compared to the baseline
performance measured during the Pre-Qualification Test. The test demonstrated that the
Test Specimen was not impacted by these tests.
3.2. Seismic Test
3.2.1. Test Conditions Figure 5-3 of the ERS shows the Required Response Spectra (RRS) for the Operation Basis
Earthquake (OBE) and Safe Shutdown Earthquake (SSE). The peak amplitudes of this
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figure are shown in Table 3-1.
Table 3-1 Peak Amplitude of Seismic Test
Seismic Amplitude Requirement from ERS Section 5.5.2 and EPRI TR-107330
Event Section 4.3.9
OBE 9.8 g
SSE 14 g
3.2.2. Performance Requirements During the initial part of seismic testing, a resonance search was performed to verify that no
resonances exist in the frequency range defined in the applicable standards. During the test,
the Test Specimen Units performed normal processing of input data and produced the
expected output data.
Following the Seismic Test, the Test Specimen Units were determined to be structurally
intact. Specifically, the Test Specimen Units were examined to ensure no parts are damaged
or loosened.
Following the Seismic Test, the Test Specimen Units were determined to be able to perform
the safety functions as required in the ERS Section 4.1.2. Specifically, the Test Specimen
Units met the acceptance criteria specified for the Operability Test following the SSE.
ERS Section 7.2.2 provides the general acceptance criteria for the Operability Test.
The EPRI requirement for performing Prudency and Operability Tests during the seismic
testing cannot be performed, as the seismic test would have to be extended from seconds to
days to provide sufficient time to perform Prudency and OperabHity Tests. Since this is not
reasonable, testing was performed during the seismic events to demonstrate that the
equipment remained operable during application of seismic stressors. Additional testing
was performed after the seismic events to demonstrate that the equipment was still
operable.
Following the test, the performance of the Test Specimen was compared to the baseline
performance (measured during the Pre-Qualification Test) to demonstrate that the test did
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not impact the performance and operability of the Test Specimen. Appendix C shows the
detailed scope and the timing of the Operability Tests and the Prudency Tests in the Seismic
Test.
3.3. Electromagnetic Compatibility (EMC) Tests
The EMC Test includes the following tests:
(1) EMIIRFI Emission Test
(2) EMI/RFI Susceptibility Test
(3) Surge Withstand Capability Test
(4) Electrically Fast Transient and Burst (EFT/B) Test
(5) Electrostatic Discharge (ESD) Test
(6) Class lE to Non-lE Isolation Test
All ab~ve Tests were performed in an anechoic chamber.
3.3.1. EMI/RFI Emission Tests
3.3.1.1. Test Conditions
(1) Radiated Emissions
The tests followed the guidance of MIL-STD-461E (Reference (6)), RE101 and RE102.
The emissions were measured from 30 Hz to 100 kHz (RE101) and 2 MHz to 1 GHz
(RE102).
(2) Conducted Emissions
The tests followed the guidance of MIL-STD-461E, CElOl and CE102. Since the PRM
uses less than 1 KVA, the tests were conducted using less restrictive low power curves,
from 60 Hz for AC Power less than or equal to 1 KVA to 10 kHz (CE101) and 10 kHz to
2MHz (CE102).
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3.3.1.2. Performance Requirements
Conducted emissions were within the limits defined by Figure 5-7 of the ERS, complying
with NRC Regulatory Guide 1.180 Revisionl (RG l.180Rl, Reference (1)) Figure 3.1, and
Figure 5-8 of the ERS, complying with RG l. l 80Rl Figure 3 .2.
Radiated emissions were within the limits defined by Figure 5-9 of the ERS, complying
with RG l.180Rl Figure 3.3, and Figure 5-10 of the ERS, complying with RG l.180Rl
Figure 3.4.
3.3.2. EMI/RFI Susceptibility Test
3.3.2.1. Test Conditions
(1) Radiated Susceptibility, Magnetic Fields
The test followed the guidance of MIL-STD-461E, RSlOl. The applicable frequency
range is 30 Hz to 100 kHz. Field strength is defined by Figure 5-6 of the ERS, complying
with RG l. l 80Rl Figure 4.3.
(2) Radiated Susceptibility, Electric Field
The test followed the guidance of MIL-STD-461E, RS103. The applicable frequency
range is 30M Hz to 1 GHz. Field strength is 10 V/m defined by section 5.5.3.5 of the ERS,
complying with RG 1.180Rl Section 4.3.2.
(3) Low-Frequency Conducted Susceptibility Test at AC Power Leads
The test followed the guidance of MIL-STD-461E, CSlOl. The applicable frequency
range is 120 Hz (the second harmonic of the power line frequency) to 150 kHz. The test
input signal amplitude is defined by Figure 5-4 of the ERS, complying with RG l. l 80Rl
Figure 4.1.
(4) High-Frequency Conducted Susceptibility Test at AC Power Leads
The test followed the guidance of MIL-STD-461E, CS114. The applicable frequency
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range is 10 kHz to 30 MHz. The test input signal amplitude is defined by Figure 5-5 of the
ERS, complying with RG l. l 80Rl Figure 4.2.
(5) High-Frequency Conducted Susceptibility (Signal Leads)
The test followed the guidance of MIL-STD-461E, CS114. The applicable frequency
range is 10 kHz to 30 MHz. The test input signal amplitude is 91 dBµA defined by Section
5.5.3.3 of the ERS, complying with RG1.180Rl Table 14.
(6) Conducted Susceptibility (Signal Leads, Bulk cable injection, impulse excitation)
The test followed the guidance of MIL-STD-461E, CS115. The test input signal
amplitude is 2 amperes (A) defined by Section 5.5.3.3 of the ERS, complying with
RG1.180Rl Table 14.
(7) Conducted Susceptibility (Signal Leads, Damped sinusoidal transients)
The test followed the guidance of MIL-STD-461E, CS116. The applicable frequency
range is 10 kHz to 100 MHz. The test input signal amplitude is 5 amperes (A) defined by
Section 5 .5 .3 .3 of the ERS, complying with RG l .180Rl Table 14.
3.3.2.2. Performance Requirements
During the EMI/RFI Susceptibility Test, the Test Specimen performed the safety functions
as required in ERS Section 4.1.2.
The performance of the Test Specimen Units after the test was compared to the baseline
performance and demonstrated that the test did not impact the performance and operability
of the Test Specimen Units.
3.3.3. Surge Withstand Capability Test
3.3.3.1. Test Conditions
The Surge Withstand Capability Test was performed at 2 kV for the AC power line to meet
the requirements in the ERS Section 5.5.4, complying with RG 1.180 RI Sections 5.1 and
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5.2. The ring wave test was performed in accordance with IEC 61000-4-12 (Reference
(10)). The Combination wave test was performed in accordance with IEC 61000-4-5 (Reference (9)).
3.3.3.2. Performance Requirements
During the surge application, the Test Specimen Units performed its safety functions as
required in ERS Section 4.1.2.
The performance of the Test Specimen after the test was compared to the baseline
performance and demonstrated that the test did not impact the performance and operability
of the Test Specimen Units.
3.3.4. EFT/8 Test
3.3.4.1. Test Conditions
The EFT/B Test was performed at 2 kV for the AC power lines to meet the requirements
shown in ERS Section 5.5.5, complying with RG1.180Rl Section 5.3. The test was
performed in accordance with IEC 61000-4-4 (Reference (8)).
3.3.4.2. Performance Requirements
During the EFT/B Application, the Test Specimen Units performed its safety functions as
required in ERS Section 4.1.2.
The performance of the Test Specimen Units after the test was compared to the baseline
performance and demonstrated that the test did not impact the performance and operability
of the Test Specimen Units.
3.3.5. ESD Test
3.3.5.1. Test Conditions
The ESD Test was performed at 8 kV (Contact Discharge) and 15 kV (Air Discharge) to
meet the requirements shown in ERS Section 5.5.6, complying with EPRI TR-102323
(Reference (2)), Appendix B, Section 3.5. The test was performed in accordance with IEC
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61000-4-2 (Reference (7)).
3.3.5.2. Performance Requirements
The ESD was applied to the test points which can be touched by persons during normal
operation and the points that can be touched with maintenance personnel with wristband
under the administrative permission during maintenance as a special case. During ESD
Testing the Test Specimen Units performed its safety functions as required in the ERS
Section 4.1.2.
The performance of the Test Specimen Units after the test was compared to the baseline
performance and demonstrated that the test did not impact the performance and operability
of the Test Specimen Units.
3.3.6. Class 1 E to Non-1 E Isolation Test
3.3.6.1. Test Conditions
The Cla_ss lE to Non-IE Isolation Test was performed at 600 VAC and 250 VDC to meet
the requirements shown in the ERS Section 5.5.7, complying with EPRI TR-107330
Section 4.6.4.
3.3.6.2. Performance Requirements
During the test level voltage application to the test points, the Test Specimen Units
demonstrated the ability to perform safety functions as required in ERS Section 4.1.2.
The performance of the Test Specimen Units after the test was compared to the baseline
performance and demonstrated that the test did not impact the performance and operability
of the Test Specimen Units. Appendix C shows the detailed scope and the timing of the
Operability Tests and the Prudency Tests in the EMC Test.
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4. Description of Test Facility and Equipment
4.1. Test Facility
All Qualification Tests except the
[ [ ]"personnel at the [
Facility in July 2006.
, [ Ja,c Radiation Exposure Test were conducted at r The Radiation Exposure Test was performed by
]"High Level Radiation Effects
The Environmental Test was performed during June 2006 through October 2006. During
August 2006, the test was suspended due an equipment fault caused by incorrect operation
of the environmental chamber.
The other tests, EMI/RFI, Surge Withstand Capability, EFT/B, ESD and Class lE to
Non-IE Isolation Tests, were first performed during October 2006 through March 2007.
However, the . EMI Susceptibility Test failed. The LPRM and AO modules were
re-designed by adding capacitors on the printed circuit boards to enhance noise rejection.
The re-designed modules were installed in the Test Specimen. The retest was performed
during October 2007 to March 2008 and completed successfully.
After the completion of these tests, the replaced modules were removed and the original
modules were installed. After installation of the original modules, the Performance Proof
Test was performed to demonstrate that the safety functions required in the ERS Section
4.1.2 were still operable after testing.
4.2. Mounting
4.2.1. Environmental Test
For the Environmental and Radiation Exposure Tests, the Test Specimen Units were placed
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in a :free-standing instrument rack. Figure 4-1 shows the mounting of the Test Specimen.
a.c
Figure 4-1 Mounting of Test Specimen for Temperature and Humidity Test
4.2.2. Seismic Test
Figure 4-2 shows the mounting of the Test Specimen. The Test Specimen Units were
mounted on a structure that was sufficiently stiff. The mounting structure was constructed
as follows:
Two pieces of 6 inches x 3 inches x 3/8 inch steel tubing were welded to the test table
with 3/16 inch fillet welds approximately 4 inches in length (two at each comer).
The test fixture was constructed from 2 inch by 2 inch steel angle and was welded to the
lower mounting tubes on each comer of the test fixture to form vertical 2 inch by 2 inch
rails.
The fixture was installed on the [ rrriaxial Seismic Simulator Table such that its
horizontal axes were collinear with the horizontal axis of the table.
The Test Specimen Units were mounted in the [ Jprovided test fixture using MS
mounting hardware located in the front of the chassis and M4 screws located in the rear
of each unit. The three varistor panels were mounted horizontal to the test table using
MS mounting hardware.
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FPG-TRT-C51-0101 Rev.3
a,c
Figure 4-2 Mounting of Test Specimen for Seismic Test
4.2.3. EMI/RFI, Surge Withstand Capability, EFT/B, ESD and Isolation Tests
The Test Specimen Units were installed in the free-standing instrument rack used in the
Environmental Test. This rack was designed not to shield . emissions from the Test
Specimen Units, and not to shield the applied fields used to evaluate the susceptibility of
the Test Specimen Units.
The Test Specimen Units were installed in [
Figures 4-3 and 4-4.
ranechoic chamber as shown m
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FPG-TRT-C51-0101 Rev.3
rn
1 meters
11 S VAC Power Strip
Anecboic Mllterial
Protective Earth Ground LISN shown connected to the Green Wu-c or bottom LJ.S.N. wa,; used only during CElOl and CE102 tests when mei,suring the Protective Earth Ground. Protective Ean.h Ground was nornully connttted to 1he shiddcd m c1osurc floor
Power line filter
atcb Panel
EUT Support Equipment Rack
ComputN"S
Decoupling Nen\•orb
Door
Patch Paud withMTK M1833 Fil1ers
Drnwiug is not to scale
Figure 4-3 Layout in the test chamber
Figure 4-4 Picture in the test chamber
a,c
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FPG-TRT-C51-0101 Rev.3
4.3. Test System Configuration and Electrical Connections
The Schematic Diagram (Reference (15)) shows the representative electrical connections.
The Schematic Diagram was developed according to the requirements provided in Figure
4-1 of the PTER, as described in Section 2.3 of this report.
The Schematic Diagram shows the representative configuration. The specific modifications
required for the test conditions, such as penetrations through the EMC chamber walls, were
implemented as required.
4.4. Instrumentation
The instrumentation measuring and test equipment used for this test was calibrated by
equipment traceable to the National Institute of Standard and Technology (NIST) or the
National Metrology Institute of Japan (NMIJ). Both NIST and NMIJ are signatories to the
Bureau International des Poids et Mesures (BIPM). The test signal inputs and data
acquisition system were located outside the anechoic chamber.
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FPG-TRT-C51-0101 Rev.3
5. Test Procedures
The initial tests were performed for the assembled Test System in Japan. Then, the Test
Specimen and some of the Test Equipment were shipped to the U.S for the test at the [ r [ r The tests performed were as follows:
• Pre-Qualification Tests, conducted prior to Qualification Test to determine that the
system operates correctly and to provide baseline data on equipment performance.
These tests were performed at the Toshiba Fuchu Complex, and repeated at the [ r test facility. The Pre-Qualification testing includes:
•
• System Set-up and Check-out Test at Fuchu Complex, performed as a part of
the System Validation Test for V &V activities
• Burn-in Test at Fuchu Complex, performed as a part of the System Validation
Test for V & V activities
• System Set-up and Check-out Test at[ ]"(after shipping and re-assembly)
• Operability Test
• Prudency Test
Qualification Tests, conducted to demonstrate compliance with the ERS requirements,
and to demonstrate suitability of the Test Specimen while being subjected to stress
conditions. The Qualification Tests were performed at [ ron the assembled Test
System after the Test System has passed the Pre-Qualification Test acceptance criteria.
The Qualification testing includes:
• System Set-up and Check-out Test, after each Test System disassembly,
reassembly, or relocation
• Radiation Exposure Test
• Environmental Test
• Seismic Test
• EMI/RFI Test
• Surge Withstand Capability Test
• EFT/B Test
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FPG-TRT-C51-0101 Rev.3
• ESD Test
• Class lE to Non-lE Isolation Test
• Power quality Test (performed during other tests)
• Performance Proof Tests, conducted to confirm satisfactory operation after being
subjected to Qualification Test conditions. The Performance Proof Tests are a repeat
of the operability test and prudency test performed in the Pre-Qualification Tests to
identify any changes in equipment performance. Performance Proof Tests were
performed at[ J~d included:
• System Set-up and Check-out Test
• Operability Test (retest)
• Prudency Test (retest)
The sequence of tests is shown in Table 5-1 (a), (b) and Figure 5-1 below. Table 5-1 (a) lists
the Reference page in the ERS, Test procedure document number, and the Test Lab test
procedure number. Table 5-1 (b) lists the contents of the Operability Test and the Prudency
Test for the PRM. Please note Figure 5-1 does not show the points where the Operability
Test and/or the Prudency Test were performed during the Qualification test. Appendix C
shows the detailed scope and the timing of the Operability Test and the Prudency Test.
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Test
1. Pre-Qualification Test
2. Qualification Test
3. Performance Proof Test
FPG-TRT-C51-0101 Rev.3
Table 5-1 Qualification Test Overview
(a)
ERS Toshiba Test Procedure Ref. Para. Number
1.1 System Set-up Not applicable and Check-out Test FPG-TPRC-C51-0001
1.2 Burn-in Test 7.2.1 8 1.3 System Set-up
N_ot applicable FPG-TPRC-C51-1001 and Check-out Test
1.4 Operability Test 7.2.2, 7.2.4 FPG-TPRC-C51-1 009
1.5 Prudency Test 7.2.3, 7.2.4 FPG-TPRC-C51-1010
2.2 Environmental Test (Radiation 7.3.2.4, 5.5.1 FPG-TPRC-C51-1002
Exposure)
2.4 Environmental 7.3.2.4, 5.5.1 FPG-TPRC-C51-1002 Test (Temperature
and Humidity)
2.6 Seismic Test 7.3.2.5, 5.5.2 . FPG-TPRC-C51-1003
2.8 EMI/RFI Test 7.3.2.2, 5.5.3 FPG-TPRC-C51-1004
2.9 Surge Withstand Capability Test
7.3.2.7, 5.5.4 FPG-TPRC- C51-1005
2.10 EFT/ 8 Test 7.3.2.9, 5.5.5 FPG-TPRC- C51-1006
2.11 ESDTest 7.3.2.10, 5.5.6 FPG-TPRC- C51-1007
2.12 Class 1 E to Non-1 E Isolation 7.3.2.8, 5.5.7 FPG-TPRC- C51-1008
Test
3.2 Operability Test 7.2.2, 7.2.4 FPG-TPRC-C51-1009
3.3 Prudency Test 7.2.3, 7.2.4 FPG-TPRC- C51-1010
[ r Test Procedure Number
Not applicable
Not applicable
Not applicable
Not applicable
Not applicable
FPG-VDN-C51-0200
FPG-VDN-C51-0200
FPG-VDN-C51-0200
FPG-VDN,C51-0201
FPG-VDN-C51-0201
FPG-VDN-C51-0201
FPG-VDN-C51-0201
FPG-VDN-C51-0201
Not applicable
Not applicable
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(b)
Operability Test Prudency Test
Pre-Qualification Test Conducted Conducted
Radiation Exposure - -Environmental Before High Temperature and High Conducted for specific scope -
Test Humidity Exposure (Note 1)
During High Temperature and High - -Humiditv Exoosure
After High Temperature and High Conducted for specific scope Conducted for specific scope Humidity Exposure (Note 1) (Note 3)
During Low Temperature Exposure - -
After Low Temperature Exposure Conducted for specific scope -(Note 1)
During Low Humidity Exposure - -
After Low Humidity Exposure Conducted for specific scope -(Note 1)
After all Environmental Conducted for specific scope -(Note 1)
Seismic Test Before Seismic Test - -During Seismic Test - -
After Seismic Test Conducted -
Replacement of Modules (LPRM Modules were replaced with HNS013 from HNS011.AO Modules were replaced with HNS515/516/517/518 from HNS511/512/513/514.
EMC Test Before EMC Test Conducted for specific scope -(Note 2)
During EMC Test - -After EMC Test - -
Isolation Test(Class 1 E to Non 1 E Test) - -
Post Qualification Test(Before re-replacement of Conducted for specific scope -modules) (Note 2)
Re-Replacement of Modules (LPRM Modules were replaced with HNS011 from HNS013. AO Modules were replaced with HNS511/512/513/514from HNS515/516/517/518.
Post-Qualification Test(After re-replacement of Conducted Conducted modules)
Notes for this table are listed in the next page.
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FPG-TRT-C51-0101 Rev.3
The Operability Test and the Prudency Test conducted in the Pre-Qualification Test and the
Post-Qualification Test (After re-replacement of modules) include the following Tests.
Operability Test:
(1) Linearity test for APRM level, TPM level, and LPRM level at the LPRM gains 40µA/100%
(2) Linearity test for APRM level, TPM level, and LPRM level at the LPRM gains 400µA/100%
(3) Linearity test for APRM level, TPM level, and LPRM level at the LPRM gains
2400µA/100%
( 4) APRM Upscale (High-High) trip and TPM Upscale trip response time test at the LPRM gains
40µA/100%
(5) APRM Upscale (High-High) trip and TPM Upscale trip response time test at the LPRM gains
400µA/100%·
(6) APRM Upscale (High-High) trip and TPM Upscale trip response time test at the LPRM gains
2400µA/100%
(7) Linearity test for FLOW level
(8) APRM Inoperable trip function test
(9) DI function test
(10) Low voltage power supply failure test for LPRM unit
(11) Low voltage power supply failure test for LPRM/APRM unit
(12) Low voltage power supply failure test for FLOW unit
(13) Watchdog function test for LPRM unit
(14) Watchdog function test for LPRM/APRM unit
(15) Watchdog function test for FLOW unit
(16) Current value test of Square Root module in FLOW unit
(17) Loss of power test
(18) Power interruption test
Prudency Test:
(19) DI Toggling test
(20) AI Toggling test
(21) Failure simulation test
Note 1: Toshiba did not conduct (1), (3), (4), (6), (8), (10), (11), (12), (13), (14), (15).
Note 2: Toshiba did not conduct (2), (3), (5), (6), (13), (14), (15), (16), but Toshiba conducted watchdog timer function test for the LPRM module inserted Slotl ofLPRM and LPRM/APRM units.
Note 3: Toshiba did not conduct (21).
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FPG-TRT-C51-0101 Rev.3
r-r-· ·--·-,·---···--·-i I I
-----,-------------n·11~~~--=:.· .. := i ··----c-:-T 1----·-·-- ...... i !
Sy stem Validation I FPG-TPRC-C51-0001 '
-=~1=== i
-. .L -··--· .. ! I·- --·-· i-·· i-
i
' ': ·;· I : Trailsvortation 1o I"·' (rn"s1,T,;;-j},;~ -' .. ,
r-1----,---·n------- ·-_____ ! ____
>- ·- -- .. ·-· l!L ____ ...;, ___
'"""'j :c- ·--- ,.,.. ' ' ' ' -,-
: ' .
! Sy stem Set Up and
Operability Prudency Check-out , •.. FPG-TPRC-C51-1001 - FPG-TPRC-C51-1009 FPG-TPRC-C51-1010
' I
. -•··--····•· .....
Pre-Qualification Test r---·-·, ---······-··· ''' ' ... ,, ... .• L J•,c .. , ... 1 -··"r ·----·. to Radiation Testing Facility in . '" I I I i I I I I I I
·-r- ! I i ,~. ,, to.!a1Jan ·- ---- -I I ! i I I
I I
Environmental Test Environmental Test Modification of the (Radiation) I I (Temperature &
Seismic Test
-l- rmdules ta enhance the , ............... FPG-TPRC-C51-1002 I Humidity) - FPG-TPRC-C51-1003
noise withstand FPG-TPRC-C51-1002 capability r
'.Jc L ,~. ,c ~-
- ·-I'" J1;st Procedure J1;st Procedure < J~;st I - i!~---····
Rmlint;n» Testing Facility [ ,.,,, .......... '""·"·-·
-··1---~- ·--l"T i ......... i''
·- .... I IOL J ,,c
I I : i I. i I l i I ..•..
System Set Up and EMI/RFI Test
Surge Withstand EFT/8 Test ESD Test Class 1E to Non-1E
-- Check-out for re-setup FPG-TPRC-C51-1004
Capability Test FPG-TPRC-C51-1006 - FPG-TPRC-C51-1007 ->-
Test FPG-TPRC-C51-1001 FPG-TPRC-C51-1005
FPG-TPRC-C51-100B
-.... , ...... ' ' '' '
I a,c ]'r~st Procedure [ L JTest ..
]~~st Procedure ..
]~;st Procedure ,-- [ ]~;st Procedure Procedure "'
.... ,. I
, I i
I : I I i I
I I I Qualification Test i I I I I
i I ' i I ! ! 1 i I I i i i i j
! I t 11 I ! I ·f-· ..... _.+ ·-l- ·--t-i I I i I i .... .. .. Re-install the original modules to evaluate
Operability Prudency TransEortation 11 ,F~chu
- the aging effects ' INSPECT
during environmental FPG-TPRC-C51-1009 FPG,TPRC-C51-1010 I & STORE
testing
" ·-·"" , ........... I I -··· I
I
1~--~·-··· .U .. lj '
I Toshiba r.. . ... ; ... , ""
Performance Proof Test "! ... T
I .
- i -' i ·--f- ·-
~ _,.. ·-· ~ - '" '
-· i
i
I I 11 '
Figure 5-1. Actual Test Flow Diagram
TIJSHIBA ENERGY SYS1EMS I SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
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-·-
--··-
---: ....
. --
, .....
f- "
, __
......
··+-·" -
' +-
··-··
I I
....
FPG-TRT-C51-0101 Rev. 3
5.1. Pre-Qualification Test
The Pre-Qualification Test was performed pnor to the Qualification Test. The
Pre-Qualification Test demonstrated that the Test Specimen operated as intended, and
provided a performance baseline for the Qualification Test.
The NRW-FPGA-Based PRM Units were manufactured with the correct application logic,
and thus required no application software objects testing.
All Test Specimen module parameters and switches were set and checked in the System
Set-up and Check-out Test.
The Burn-in Test was carried out on the Test Specimen to detect any failures in early life
that would corrupt the Qualification Test results. The Burn-in Test required 352 hours of
continuous operation of the Test Specimen.
The Operability Test and the Prudency Test were performed to establish the baseline
performance. The Operability Test was performed in order to demonstrate the
functionality of the Test Specimen. The Prudency Test was performed to demonstrate the
operability of the Test Specimen under highly dynamic conditions. The test requirements
are provided in the ERS Section 7.2.
Table 5-1 and Figure 5-1 show the order for the Pre-Qualification Test, and the procedures
used. The Pre-Qualification Test was performed as follows:
(1) System Set-up and Check-out Test (FPG-TPRC-CSl-0001). This test verifies
proper assembly, integration and operation of the assembled Test System for the
Pre-Qualification Test in the Toshiba's facility. 1'his test confirmed proper
connection and operation of the Test System including the monitoring instruments,
variable power supplies, and signal simulators. This test was performed as a part
of the System Validation Test for V & V activities.
(2) Burn-in Test (FPG-TPRC-CSl-0001) .. This test implemented a 352 hour burn-in
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FPG-TRT-C51-0101 Rev.3
of the assembled Test System, to detect any failures in early life that might
otherwise impact the subsequent Qualification Test activities. This test was
performed as a part of the System Validation Test for V & V activities.
(3) System Set-up and Check-out Test (FPG-TPRC-CSl-1001). After the.Bum-in
Test, the Test Specimen and Test Equipment were transported to the [ r [ Jin the U.S. The System Set-up and Check-out Test was performed
before the Operability Test. This test verified proper assembly, integration, and
operation of the assembled Test System in [ r This test confirmed proper
connection and operation of the Test System including monitoring instruments,
variable power supplies, and signal simulators.
(4) Operability Test (FPG-TPRC-CSl-1009). This test verified the Test System
functions correctly before starting Qualification Tests. The initial· performance
confirmed in the Operability Test procedure also established the baseline Test
System performance. The baseline performance was used for comparison to
performance measured during the Qualification Tests.
(5) Prudency Test (FPG-TPRC-CSl-1010). This test verified that the Test System . .
functions correctly while being exercised in various ways to simulate potential
in-service stresses. The initial performance of the Prudency Test procedure also
established baseline performance of the Test System for comparison to performance
measured during Qualification Tests.
5.2. Environmental Test
The Environmental · Test was performed to demonstrate that the Test Specimen Units
provide the performance required under the environmental conditions provided in ERS
Section 5.5.1. The conditions in the ERS comply with the conditions in EPRI TR-107330.
The required conditions of temperature and humidity used for testing are provided in the
ERS Section 5.5.1.
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According to the requirements of ERS Section 7 .3 .2.11, a power quality tolerance test was
performed, at the end of the elevated temperature test while still at high temperature.
Input voltage ranges and frequency ranges of power supplies for connection to AC and DC
sources are given in ERS Section: 5.5.8, and the margin is given in IEEE Std 323 (Reference
(5)).
Radiation Exposure Testing was included in the environmental evaluation in ERS Section
5 .5.1. A 11 Gy gamma dose was applied, including a 10% margin above the requirement
of 10 Gy. The 10 Gy exposure requirement is stated in the ERS Section 5.5.1 and satisfies
the requirements of EPRI TR-107330 Section 4.3.6.1. The Radiation Exposure Test was
performed in accordance with the guidance of IEEE Std 323.
Abnormal environmental conditions for each Environmental Test were defined by the
abnormal.environmental basic conditions provided in the ERS Section 5.5.1 considering the
margins for each condition.
5.3. Seismic Test
The Seismic Test was performed to assure that the Test Specimen Units provide the
performance and seismic withstand capability under the Seismic Test conditions provided
in the ERS Section 5.5.2. These conditions in the ERS comply with the conditions in
EPRI TR-107330 to the extent achievable at[ r This test involved the following activities:
• Mounting of the Test Specimen Units on a vibration table,
• Setting up the Test System,
• Performing a System Set-up and Check-:-out Test to verify correct setup,
• Performing a Resonance Search Test,
• Performing five tri-axial Seismic Tests representative of an Operating Basis
Earthquake (QBE) of the Test Specimen, followed by an inspection to verify
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FPG-TRT-C51-0101 Rev.3
structural integrity of the affected Test System components,
• Performing a Seismic Test representative of a Safe Shutdown Earthquake (SSE) ,
followed by an inspection to verify structural integrity of the affected Test System
components,
• Performing an Operability Test to compare the system performance to baseline
performance.
Figure 5-3 of the ERS shows the Required Response Spectra (RRS) for the QBE and SSE.
The peak amplitudes of this figure are shown in Table 3-1. Based on the information
provided by [ r:roshiba _expected that the seismic test facility at [ J~ould not be
capable of performing a test according to the ERS spectra requirement. Toshiba
negotiated with [ Jto determine the achievable spectra for the Test Specimen Seismic
Qualification Test, which was performed to the table limits. Details of the results are
provided in section 6.
5.4. EMI/RFI Test
This test demonstrates the suitability of the Test Specimen Units to withstand exposure to
EMI/RFI and verifies that the Test Specimen does not emit more than acceptable levels of
EMI/RFI. The EMI/RFI levels shown in the ERS comply with the levels shown in RG
l.180Rl.
Nate that the test levels specified were not the same as those specified in the EPRI
TR-107330 requirements. Instead, the test levels used were obtained from RG1.180Rl,
which was issued in October 2003. Toshiba considered these new Regulatory Guide
values were to better reflect the current requirements of US utilities. Note that EPRI
TR-107330 was published in December 1996, prior to issuance of RG l .180Rl.
The EMI/RFI susceptibility and emissions withstand capability given in NRC RG l. l 80Rl
were tested using the following test methods from MIL-STD 461E:
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Test Type
(a) Low-Frequency Conducted Susceptibility (Power):
(b) High-Frequency Conducted Susceptibility (Power):
(c) High-Frequency Conducted Susceptibility (Signal):
( d) Radiated Susceptibility, Magnetic Field:
( e) Radiated Susceptibility, Electric Field:
(f) Low-Frequency Conducted Emissions:
(g) High-Frequency Conducted Emissions:
(h) Radiated Emissions, Magnetic Field:
(i) Radiated Emissions, Electric Field:
FPG-TRT-C51-0101 Rev.3
Test Method
CS101
CS114
CS114
CS115
CS116
RS101
RS103
CE101
CE102
RE101
RE102
5.4.1. Conducted Susceptibility (Power Leads)
5.4.1.1. Low-Frequency Conducted Susceptibility (Power Leads)
This test was performed on the input power leads of the AC power sources. The test was
performed according to MIL-STD-461E requirement CS101. The envelope is shown in
ERS Figure 5-4. The test was performed from 120 Hz to 150 kHz.
5.4.1.2. High-Frequency Conducted Susceptibility (Power Leads)
This test was performed on the input power leads to the AC power sources. The test was
performed according to MIL-STD-461E requirement CS114. The envelope is shown in
ERS Figure 5-5. The test is performed from 10 kHz to 30 MHz.
5.4.1.3. High-Frequency Conducted Susceptibility (Signal Leads)
This test was performed on all signal leads in accordance with MIL-STD-461E requirement
CS114. The envelope was set from 10 kHz to 30 MHz, and 91 dBµA.
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FPG-TRT-C51-0101 Rev.3
5.4.1.4. High-Frequency Conducted Susceptibility (Signal Leads - Impulse
Excitation)
This test was performed according to MIL-STD-461E requirement CS115. The operating
envelope was set to 2 amperes (A).
5.4.1.5. High-Frequency Conducted Susceptibility (Signal Lead - Damped
Sinusoidal Transients)
This test was performed according to MIL-STD-461E requirement CS116. The operating
envelope was set to 5 amperes (A). The test was performed from 10 kHz to 100 MHz.
5.4.2. Radiated Susceptibility
5.4.2.1. Radiated Susceptibility, Magnetic Field
This test was performed according to MIL-STD-461E requirement RS101. The Test
Specimen Units were installed in close proximity (< 1 m) to sources of large magnetic
fields (> 600 Alm). The frequency is set from 30 Hz to 100 kHz. The test level is shown
in ERS Figure 5-6.
5.4.2.2. Radiated Susceptibility, Electric Field
This test was performed according to MIL-STD-461E requirement RS103. The test
frequency was set from 30 MHz to 1 GHz, and the applied electric field level was 10 V/m
for all frequencies. The test was performed with both vertical and horizontal polarized
waves.
5.4.3. Conducted Emission
5.4.3.1. Low-Frequency Conducted Emissions
This test was performed on the power input leads, according to MIL-STD-461E
requirement CElOl. Envelope limits were the "envelope for less than lkVA AC" limits
shown in ERS Figure 5-7. Data is reported in dBµA. The frequency range was from 60
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FPG-TRT-C51-0101 Rev.3
Hz to 10 kHz since the PRM consumes less than 1 KV A.
5.4.3.2. High-Frequency Conducted Emissions
This test was performed on the power input leads, according to MIL-STD-46IE
requirement CE102. The recommended emissions limits are shown in ERS Figure 5-8.
The test frequency was set from 10 kHz to 2 MHz. Data was reported in dBµ V.
5.4.4. Radiated Emission
5.4.4.1. Radiated Emissions, Magnetic Field
This test was performed according to MIL-STD-46IE requirement RElOl. The envelope
limits are shown in ERS Figure 5-9. The test frequency was set from 30 Hz to 100 kHz.
All measurements were performed at 7 cm, as specified by REI01.
5.4.4.2. Radiated Emissions, Electric Field
This test was performed according to MIL-STD-46IE requirement RE102. The
recommended emissions limits are shown in ERS Figure 5-10. The test frequency was set
from 2 MHz to 1 GHz. This test was performed with both vertical and horizontal
polarized waves.
5.5. Surge Withstand Capability Test
This test demonstrates the suitability of the Test Specimen Units as a safety-related device
for lightning induced electrical perturbations, using surge withstand capability test
protocols. As stated in ERS Section 5.5.4, IEC 61000-4-5 and IEC 61000-4-12 tests were
performed.
The Surge Withstand Capability Test was performed to assure that the Test Specimen Units
withstand the surge limits given in the ERS Section 5.5.4. The Surge Withstand
Capability Test levels shown in the ERS comply with RG l. l 80Rl.
The Surge Withstand Capability Test was performed in the same location as the EMIIRFI
test.
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FPG-TRT-C51-0101 Rev.3
5.6. EFT/ 8 Test
This test demonstrates the suitability of the Test Specimen Units as a safety-related device
for electrical perturbations from relay coil collapse, using the EFT/B withstand capability
test. As stated in the ERS Section 5.5.5, IEC 61000-4-4 test was performed.
The EFT/B Test was performed to assure that the Test Specimen Units withstand the EFT/B
waveforms provided in ERS Section 5.5.5. The EFT/B Test levels shown in the ERS
comply with the levels shown in RG1.180Rl. The EFT/B Test was performed in the same
location as the EMI/RFI Test.
5.7. ESD Test
This test demonstrates the ability of the Test Specimen Units to withstand Electro Static
Discharge (ESD). IEC 61000-4-2 was performed.
The ESD Test was performed to assure that the Test Specimen withstands the ESD levels
given in ERS Section 5.5.6. The ESD Test levels comply with the levels shown in EPRI
TR-107330 Section 4.3.8. One restriction was added to the User's Guide for maintenance,
requiring use of grounded wrist straps when contacting the normally enclosed back of the
units.
The tests were performed according to EPRI TR-102323-Rl Appendix B Section 3.5. The
test was performed at 58% ( day 1) and 51 % ( day 2) of the ESD testing relative humidity,
which is within the required 30 to 60% relative humidity. The ESD Test was performed in
the same location as the EMI/RFI, Surge Withstand Capability and EFT/B Tests.
5.8. Class 1 E to Non-1 E Isolation Test
This test demonstrates the ability of the Test Specimen Units to provide electrical isolation
from the Class lE PRM to Non-IE field connections. The testing performed to
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demonstrate ERS Section 5.5.7 requirements demonstrates compliance to IEEE Std 384
(Reference (4)). The test levels shown in the ERS comply with the level shown in Section
4.6.4 ofEPRI TR-107330 and IEEE Std 384.
The isolation device prevents any short, ground, or open circuits or application of the
maximum credible voltage on the Non-Class lE side from degrading the operation of the
circuits on the Class 1 E side.
The Class lE to Non-lE Isolation Test was performed in the same physical location as the .
EMI/RFI, Surge Withstand Capability, EFT/Band ESD Tests. For the NRW-FPGA-Based
PRM System, the AO module is required to have a Non-lE to Class lE isolation capability.
A high voltage was applied to the Non-lE side of the AO module, and the test confirmed
that the safety-related functions which were performed in Class lE side were not affected
by this isolation test.
5.9. Performance Proof Test
In the Pre-Qualification Test (section 5.1), the acceptable operation and baseline
performance data of the Test Specimen Units were confirmed by conducting Operability
and Prudency Tests. In the Qualification Tests (Sections 5.2 to 5.8), operability and
performance of the Test Specimen under and after applying the environmental stressors
were confirmed.
At the Performance Proof Tests, the Operability and Prudency Tests were performed
repeated to confirm that the Test Specimen provided the required operability and
performance even after being exposed to the environmental stress factors of the complete
Qualification Test.
The Performance Proof Test was carried out as follows:
(1) System Set-up and Check-out Test (Test Procedure: FPG-TPRC-CSl-1001). This test verified proper assembly, integration, and operation of the assembled Test
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System for the Performance Proof Test. This test confirmed proper connection and
operation of the Test System peripherals including monitoring instruments, power
supplies, signal simulators, and communication links.
(2) Operability Test (Test Procedure: FPG-TPRC-CSl-1009). This test demonstrated
acceptable system operability at the end of the Qualification Test.
(3) Prudency Test (Test Procedure: FPG-TPRC-CSl-1010). This test demonstrated
acceptable system performance at the end of the Qualification Test.
5.10. Testing Conclusion
Successful completion of these tests demonstrates that there are no common cause
environmental stressors that could preclude operation, as long as the PRM is installed and
maintained in accordance with Toshiba instructions, in an environment that complies with
the assumptions made to generate the limits defined by the U.S. Nuclear Regulatory
Commission in RG l. l 80Rl.
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6. Test Data and Results
6.1. Baseline Performance of Test Specimen Units
Prior to the Environmental, Seismic, and EMC Tests, the Pre-Qualification Test described
in Section 5.1 was performed to confirm the baseline performance of the Test Specimen
Units. The Test Specimen Units passed all tests included in the Pre-Qualification Test,
and the baseline performance was established.
After the Environmental, Seismic, and EMC Tests, the Performance Proof Test described in
Section 5.9 was performed, and the test confirmed that the Test Specimen Units provided
the required operability and performance even after being exposed to aging and stress
factors of the complete Qualification Test. The Test Specimen Units passed all tests.
included in the Performance Proof Test, and the baseline performance was verified.
6.2. Environmental Test
6.2.1. Summary of Environmental Test The Test Specimen Units were subjected to a radiation exposure, temperature and humidity
tests.
The Test Specimen Units passed the Radiation Exposure Test with no signs of physical or
functional degradation. The Test Specimen Units also passed the temperature and
humidity test. In the first test opportunity, the Test Specimen Units stopped functioning in
the high temperature and high humidity condition after incorrect operation of the chamber
resulted in condensed water on the chamber ceiling dripping into the powered Test
Specimen Units. By adding a condensation shield to the environmental chamber, a retest
was performed and the Test Specimen Units passed all temperature and humidity tests.
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6.2.2. Data Evaluation
6.2.2.1. Radiation Exposure
The irradiation was performed at [ J'!Iigh Level
Radiation Effects Facility. For this irradiation, [ J~uries (Ci) 60Co was used, at the
exposure rate shown in the dosimetry data in Table 6.1.1
The Test Specimen Units were irradiated at a gamma dose rate of 4.27 Gy-air/hr for 3 hours
for a total integrated dose of 12.81 Gy-air. Due to the size of the Test Specimen Units, the
irradiation was conducted on half of the units at a time. All the Test Specimen Units were
rotated 180 degrees at the midpoint of their radiation, to be exposed in a uniform dose.
At the end of the all Qualification Tests, the Performance Proof Test was performed, as
described, and all safety fiuictions were confirmed to be within the required tolerance
provided in the ERS Section 4.1.2 post-exposure.
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Table 6.1.1 Dosimetry test data
RADCAL INSTRUMENT MEASUREMENT FORM
- -
Meter Model No. 2025 SIN: .;t, () 3 Probe Model No.:'.'lnVJ,-Q,C. SIN: ct 5"J..O
CalibrationDate: 'i\ I-;:).. S'-OC. Calibrat:ionDate: Cl-~":;~()G,
Probe Correction Factor (PCF): 137Cs 60Co f0,()~'7 ,R/''R"..,d"'
Measured Exnosure or EX1Jomre Rate, in RoentJ;1ens lR oilR/1iour J L. 6. 2. 7. 3. 8. 4. 9. 5. 10. Aw:.- '-U •• ~ 'R/J....,.
Tamnera:ture; '8'3 "For !l ~ oc WF-32) 519-= •c1
Atmosnheric Pressure: a-<1.0 a in.Ha: '1 ~ q mm Hg (l mc:h = 25.4 mm)
Tomperature & Pressure Correction Factor (TPCF):
::).,B ~C+273°C 760mmH3 TPCF"" ws0 c X .:i .. ~ 9 rrunHg = l.oJ..f9
Total Co:rrectionFactor= IO,il~, vl,o'IC/:::- io ,':)::> (TPCFxPCF)
Actual Exnosure or Exoosure Rate. in R oi\R/hour 1
1. 6. 2, 7. 3. 8. 4. 9. 5_ 10. A\H;.: 4 il.'1 "lJ...~
-.. rads (µ-IP=) Rllfuroncc: Ccmber, 1996 (Pa~ 179 and Appendix F)~ I Gray= I 00 rad rads=o.sn-
µ,Ari Po1, R - .
Actual Dose or Dose Rnte. in rads ow , n, 1smour 1
I. 6. 2. 1. 3. 8. 4, 9. 5. 10. 0.. If a l.f;).'7 i..rtds/kh.
\e, ,.__ j),,~i . S1f¢llture: lJ - - ' - -, - <> Date: ~ V ('\ I '1J ~\li:)0
-
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6.2.2.2. Temperature and Humidity Exposure
The Test Specimen Units were placed in a free-standing instrument rack and installed in the
temperature and humidity test chamber. For the Temperature and Humidity exposure,
specific test patterns shown in Table 6.1.2 were applied, repeating the pattern throughout
the test. The output data were monitored during the tests.
Table 6.1.2 Input and Expected Output Pattern Input Expected Output
LPRMCH 1 APRM/TPM'1> TPM (H) Set LPRMinput Loop FLOW FLOW Output APRM
Time Output Output point TPMHTrip Current Input Current (Computer) HHTrip
(min) (Computer) (Computer) (Computer) DO (microampere) (mA)
(mV) (mV) (mV)
(mV) Output
0-15 0 4 0 0 0 79.36 Not
!Not Occur'3l Occur'2>
15-30 200 14.24 64 128 128 147.2 Not Occur Not Occur
30-45 350 14.24 112 177.79 128 147.2 Occur2> Occur'3l
45-60 500 6.56 160 177.79 64 119.04 Occur Occur
Note: * 1) TPM Output will be delayed from APRM Output with the time constant of 6 seconds. *2) Status change of APRM HH will be made within about 40 ms after the change ofLPRM Signal. *3) Status change ofTPM H will be made within about 40 ms from the TPM Output change.
(1) First Test
APRMINOP
Trip DO
Not Occur
Not Occur
Not Occur
Not Occur
The Temperature and humidity profiles at the first exposure are shown in Figures 6.1.1 and
6.1.2.
The test started at 8:00 AM on Jul 28, 2006. The temperature and humidity were raised
gradually, and at 2:00 PM on July 28, 2006, the temperature and humidity reached the
expected values (140 degree-F and 95 %RH). The high-temperature and high-humidity
conditions were kept for about 96 hours.
During the high-temperature and high-humidity conditions, the Test Specimen Units
stopped functioning at 3:00 AM on Jul. 29, 2006. The trouble shooting performed at that
timing found that some modules included in the Test Specimen Units were broken. Toshiba
decided to interrupt the test and detailed cause investigation was performed. During the
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investigation, Toshiba personnel found marks which indicated water drops from the ceiling
of the chamber were falling on the top face of the Test Specimen Units. Toshiba analyzed
the failed modules in Toshiba's laboratory, and found an electro-migration due to the water
dropped on the IC pins, as shown in Figure 6.1.3. This electro-migration caused a short
circuit between the IC pins and failures in the Test Specimen Units.
The test condition required was non-condensing environment and these results shows the
environmental condition was deviated from the required conditions. By the discussion
with[ Jroshiba determined to add a condensation shield, which prevents the water drop
from the ceiling of the environmental chamber from falling into the Test Specimen Units, as
shown in Figure 6.1.4 (b ).
The broken modules were removed and spare modules which were also subjected to the
radiation exposure were installed in the Test Specimen Units. After these corrective actions,
the second exposure test was started and completed.
160 - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
140 ~--~------~-------------------
120
100
2006/7/29 03:00
BO _________ StoJJ_ped functioning_ _ _______________ _
60 ---------------------------------------------
40 ---------------------------------------------
20 ---------------------------------------------
a~-----~~------~-----~ 2006/7/28 2006/7/30 2006/8/1 2006/8/3
Date
Figure 6.1.1 Temperature Profile in First Exposure Test
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1~ ----------------------------------------------·
90 - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - ·
~ ----------- -----------------------------------
5: 70 "' ~ z, '5 60 -~ :,: ~ 50 >
- - - - - - - - -2006/U29.. Ol:00 - - - _____ - - - - - - - - - - - - - - . ·-g -;; Stopped functioning "' 40
30
20
10
O'-------~-------~----------' 2006/7/28 2006/7/30 2006/8/1 2006/8/3
Date
Figure 6.1.2 Humidity Profile in First Exposure Test
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(a)
a,c
Figure 6.1.3 Results of the analysis of the IC chip.
(b)
Figure 6.1.4 Photographs of the inside of the environmental chamber
(a) For First Exposure
(b) For Second Exposure
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(2) Second Test (Retest)
The Temperature and humidity profiles for the second exposure are shown in Figures 6.1.5 and 6.1.6.
At 1 : 00 PM on Oct. 1 7, 2006, the test started. The temperature and humidity were raised
gradually, and at 5:00 PM on Oct 17, 2006, the temperature and humidity reached the
expected values, 140 degrees F and 95 %RH). The high-temperature and high-humidity
conditions were maintained for about 90 hours.
After the 48 hours of exposure to high-temperature and high humidity condition, the
Operability and Prudency Tests were performed and the Test Specimen Units passed the
Operability and Prudency Tests under the following conditions.
• AC Power Supply: 81V, Frequency: 51Hz
• AC Power Supply: 81 V, Frequency: 70Hz
• AC Power Supply: 165V, Frequency: 51Hz
• AC Power Supply: 165V, Frequency: 70Hz
After the high-temperature and high-humidity conditions, the temperature was lowered
gradually, and at 3:00 PM on Oct. 21, 2006, the temperature reached the expected value, 35
degrees F. The low temperature conditions were kept for about 67 hours. During this
period, the specified relative humidity could not be achieved. The low temperature test was
performed independent of the low humidity test. After 8 hours of low temperature
conditions, Operability and Prudency Tests were performed and the Test Specimen Units
passed the Operability and Prudency Tests. The tests that require manual operation of Test
Specimen switches and jumpers were skipped.
After the low-temperature conditions, the humidity was lowered gradually and at 11 :00 PM
on Oct. 24, 2006, the humidity reached the expected value, below 10 %RH. The low
humidity conditions were kept for about 16 hours. After the first 8 hours of low humidity
conditions, Operability and Prudency Tests were performed and Test Specimen Units
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passed the Operability and Prudency Tests. The tests require manual operation of Test
Specimen switches and jumpers were skipped.
After the low-humidity conditions, the temperature and humidity were moved to ambient
conditions and the Test Specimen Units passed the Operability Tests under the normal
condition.
The period of high temperature and high humidity, low temperature, and low humidity
conditions satisfied the required length shown in Figure 5-2 of the ERS, and the Test
Specimen Units performed correctly as shown in Table 6.1.3.
At the end of the all Qualification Tests, the Performance Proof Test was performed, as
described in Section 6.1, and all safety functions were confirmed that they were within the
required tolerance provided in ERS Section 4.1.2 after the Test Specimen Units was
exposed to the abnormal environmental conditions.
Table 6.1.3 Results of Temperature and Humidity Test
Condition Required Period of Actual Period of Performance of Test
Condition Condition Specimen
High Temperature 48 hours minimum 90 hours Performed correctly
and High Humidity
Low Temperature 8 hours minimum 67 hours Performed correctly
Low Humidity 8 hours minimum 16 hours Performed correctly
The PRM systems were qualified as follows, based on EPRl TR-107330 Figure 4-4 and
Section 4.3.6:
a. High Temperature and Humidity: 140 °F and 95% relative humidity, which
meets EPRl TR-107330 Section 4.3.6 and Figure 4-4 requirements
(Toshiba notes that adding 5% margin to the relative humidity would most
likely induce condensation, which is not included in Toshiba's
qualification envelope).
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b. Low Temperature and Humidity: 35 °F and 10% relative humidity, which
meets EPRI TR-107330 Section 4.3.6 requirements (Figure 4-4
requirements for humidity could not be met in this chamber, even with
relaxation for non-simultaneous temperature and humidity, and Toshiba
notes that the OPRM is constructed of similar components and had no
issues at 40 °F and 5% relative humidity which could be achieved in the
environmental test chamber used for testing the OPRM).
1~ -------------------------------------------------
1 Oct. 21 3:00PM Oct. 24 10:00AM I
140 - - - - - - c-:-=--=--~~~--=--=-::i· I I I i r--1
90 hours · i i . ·i 67hours i
1W ------~--------------J-~----~~--------------j j I ! i i I ! · · I I
100 ------~--------------~1-----------j --------------1 I· · i i ! I
i i ! ! i ----------- I~ ! ---- ---------j i ! !
80
· · I I 60 - - - - - - I - - - - - - - - - - - - - - I 1 - - - - - - - - - - -j - - - - - - - - - - - - - -
I I· . i i ! ! i i ! I
~ ------r--------------1 1--------------------------i i.
20 - -Oct_ l7_5;0Ql?M- - - - -Oct_2J _Jj :ODAM - - - - - - - - - - - - - - - - - - - - - - -
0 '------'-----'-----'-------'--------'------'
2006/10/16 2006/10/18 2006/10/20 2006/10/22 2006/10/24 2006/10/26 2006/10/28
Date
Figure 6.1.5 Temperature Profile in Second Exposure Test
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1W ------------------------------------------------
I
100 -----+--------------1-1
Oct. 24 11 :OOPM I
- - - - - - - - _i_ --Oct.-25 .J;OOP-M - -I i j
I ! I . I • w --------------------~ ---------~----------
! ! 16ihours I i_j 90 hours
e+-------+'11 I · I . I
w -----~--------------J--------------~-j _________ _ I . I
i i I i i i ! i
40 i i I i ·--------------1------------ -r-,----------
• I • I . I i I i
I j I j~~-W --- -~--------------i------------ -~-i ---------
Oct. 17 5:00PM Oct. 21 11 :OOAM 1 • • I
o~--~----'-----~--~---~--~ 2006/10/16 2006/10/18 2006/10/20 2006/10/22 2006/10/24 2006/10/26 2006/10/28
Date
Figure 6.1.6 Humidity Profile in Second Exposure Test
6.3. Seismic Test
6.3.1. Summary of Seismic Test
In this test, the maximum level of acceleration in the SSE was limited to about 10 g, due to
the limitation in [ J~ibration table. Other than this deviation, the tests successfully
completed with no signs of physical or functional degradation of the Test Specimen Units.
Accelerometers are attached to the text fixture, the Test Specimen Units (LPRM,
LPRM/APRM, and FLOW), the power line panel, and the test table. Appendix A
provides the Seismic Tests results.
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6.3.2. Data Evaluation
(1) Resonance Search
A low-level, approximately 0.2 g, single-axis sine sweep was performed in each of the three
orthogonal axes to search for any major resonance of the Test Specimen Units in a defined
frequency band. The sweep was performed at a sweep rate of one octave per minute.
Figures A.1.1 through A.1.15 show the results for the resonance search along vertical axis.
Figures A.1.1, A.1.6, and A.1.11 are the spectra of the test fixtures.
Toshiba performed resonance searches in accordance with IEEE Std. 344-1987. Toshiba
understands that the seismic tests based on IEEE Std. 344-1987 also satisfy IEEE
Std. 344-2004 because the requirements for seismic tests in these versions are essentially
the same. Section 7.1.4.1 of IEEE Std. 344-1987 (and Section 8.1.4.1 of IEEE Std.
344-2004) recommends, " ... that the resonance search be carried beyond 33 Hz, for
example, to 50 Hz, or to the RRS cutoff frequency, whichever is higher, to obtain data on
equipment dynamic characteristics that may be valuable to justify qualification for other
dynamic loads." The required response spectrum used in the testing has a seismic cutoff
frequency of about 40 Hz. Furthermore, since the neutron monitoring system equipment
described in the L TR is installed near the control room (versus the reactor building), there
are no other higher frequency dynamic loads of interest. Accordingly, Toshiba is only
concerned with resonances below 50 Hz: Resonance search data was gathered up to 100 Hz
based on the test facility standard practice and equipment capabilities.
Three accelerometers for three orthogonai axes were located at the Test table for the
acceleration control. Fifteen accelerometers were located for the response of the EDT
acceleration. Three for front-back, side to side and vertical at the following five locations:
1) the top right comer of the test fixture (EDT were mounted),
2) the right side top center of FLOW Unit chassis,
3) the power module mounting plate,
4) the right side top center ofLPRM/APRM Unit chassis,
5) the right side top center ofLPRM Unit chassis
Note) Right/left in above description means right/left wheri a person faces the front panel of
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the FLOW, LPRM/APRM, and LPRM Unit
No resonances are identified below 50 Hz on the transmissibility plots. Several resonant
peaks are identified above 50 Hz. As discussed above, resonances above the 50 Hz cutoff
frequency are not considered consequential. The acceptable seismic test results confirm this
conclusion.
Resonant peaks are identified in the transmissibility plots at about 75 Hz in the side-to-side
(SS) direction and at about 95 Hz in the front-to-back (FB) direction. The results of the
transmissibility plots of the test specimens (the Flow unit, the LPRM/APRM unit, and the
LPRM unit) can be compared to the transmissibility plot of the test fixture. This
comparison shows that the test specimen responses are essentially the same as the test
fixture response. Any resonant peaks in the fixture response are mirrored in the test
specimen response. Therefore, the test specimens are moving with the fixture and any
resonant peaks are a result of the test fixture and not the test specimens. The resonant peaks
are sufficiently high and outside the frequency range of interest. Furthermore, examination
of the survey accelerometer response during the seismic tests show that no filtering of test
input occurred below the test facility standard practice 100 Hz frequency limit.
Thus, Toshiba evaluates the Test Specimen Units and the power line panel do not show
major resonan~e.
(2) Random Multifrequency Tests (5 OBEs and 1 SSE)
The Test Specimens were subjected to 30 second duration triaxial multifrequency random
motion, which was amplitude-controlled in one-sixth octave bandwidth spaced one-sixth
octave apart over the frequency range of 1 to 100 Hz. These simultaneous, but
independent random signals were used as the excitation to produce phase-incoherent
motions in the vertical and two horizontal axes. The amplitude of each one-sixth octave
bandwidth was independently adjusted in each of the three axes until the Test Response
Spectra (TRS) enveloped the Required Response Spectra (RRS). The resulting table
motion was analyzed by a response spectrum analyzer and plotted at one-sixth octave
intervals over the frequency range of 1 to 1 OOHz.
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The Test Specimen was subjected to five Operating Basis Earthquake (OBE) Tests and one
Safe Shutdown Earthquake (SSE). The required peak amplitude of the SSE should be 14
g according to ERS Figure 5-3. · Due to [ J~eismic table limits, the peak amplitude of
SSE was approximately 10 g.
Figures in sections A.2.1 to A.2.5 show the TRS for OBE tests and Figures in Section A2.6
show Test Response Spectra for the SSE test. Figures A.2.6.4 to A.2.6.6 show the
coherency plot of the SSE.
Toshiba planned to conduct the seismic test with the RRS provided in Figure 4-5 of EPRI
TR-107330 dated October 1997. The TRS listed in figures in Appendix A.2 of the
Qualification Test Summary Report were achievable. Toshiba considers that exceedances
below about 3.5 Hz are generally acceptable based on IEEE Std. 344 2004 Section
8.6.3. lG) since there are clearly no resonances below 5 Hz. Toshiba evaluated the higher
frequency area. Toshiba found that Figure 4-5 of a later version of EPRI TR-107330 is
slightly different from Figure 4-5 in the original October 1997 version which is the basis
for the current Toshiba RRS. Toshiba evaluated the difference. The later version (available
from the EPRI website) provides Figure 4-5 with a narrow peak spectral band. Specifically,
the 5% damped SSE response spectrum control points of Figure 4-5 of the later version of
EPRI TR-107330 are (1 Hz, 0.42 g); (4.5 Hz, 14 g); (16 Hz, 14 g); (33 Hz, 6.13 g); and
(100 Hz, 6.13 g). The original version of Figure 4-5 includes a broader frequency.
Specifically, the 5 % damped SSE response spectrum break points of this version of Figure
4-5 are (0.5 Hz, 0.1 g); (1 Hz, 0.8 g); (3 Hz, 14 g); (33 Hz, 14 g); ( 40 Hz, 7 g); and (1 OOHz,
7 g). The discussion here refers to the version of EPRI TR-107330 Figure 4-5 of the later
version of EPRI TR-107330 as the "narrow" spectrum, and the other version of EPRI
TR-107330 Figure 4-5 as the "broad" spectrum.
Because of test table limitation of 9.8 g, Toshiba has had to take exception to the EPRI
TR-107330 requirement of 14 gin the PRM testing. The PRM testing was conducted at a
laboratory where the table could not satisfy the EPRI TR-107330 peak spectral limits.
Specifically, the table could only satisfy a peak spectral demand of 9.8 g. PRM test results
show that the "narrow" spectrum demand is satisfied with the following exceptions.
The 14 g peak in the narrow spectrum was above the table capacity. The table capacity
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produced a peak that exceeded 9.8 g.
Exceedances in the frequency lower than 3.5 Hz are acceptable based on Clause 8.6.3.lG) of IEEE Std. 344-2004 since there are clearly no resonances below 5 Hz.
An additional exception to the "broad" EPRI TR-107330 spectrum demand would have to be taken for the exceedance at the peak above 30 Hz.
Figure 6.3.1 shows the qualified SSE response of the PRM seismic test.
12
I I
I I 10
/ , J \
/ I
I .,
\ J ~ 8 a 0
I \ :;3 c:! M
I I I I I I
<I) ...... G <I) i:.>
I
I ~
I I
,1
I I I I
I I I / I
I I/ -Qualified SSE for Pfu\.f
I (l
0.1 10 100
Frequency (Hz)
Figure 6.3.1 Qualified SSE for PRM
During the vibration application period, the Test Specimen Units were powered and their
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representative signals (Analog Outputs and Digital Outputs) were monitored. The results
of the test confirmed that all signals were within the required tolerance during the vibration
application period.
Following the seismic testing, the performance of the Test Specimen was compared to the
baseline performance, measured during Pre-Qualification Test, to determine if the test
impacted the performance and operability of the Test Specimen. There was no deviation
from the baseline performance.
6.4. EMC Test
6.4.1. Summary of EMC Test
After the first series of EMC Tests (EMI/RFI, Surge Withstand Capability, EFT/B, ESD and
Class lE to Non lE Isolation), modifications of the Test Specimen Units were performed as
discussed in Section 2.4 of this report. The EMC tests were then repeated.
The EMC Test with modified modules was performed from October 18th 2007 to
December 5th 2007 as shown in Table 6.4.1. The Test Specimen Units passed all tests
except CE101 without any deviations from the requirements in Section 3.3. For CE101,
some mitigation is required for the Test Specimen Units as shown in Section 6.4.2.1 (2).
Appendix B shows the detailed test results.
For all EMC Tests, specific test patterns were applied in repetition. For this purpose,
system inputs were varied during the EMC Test as shown in Table 6.4.2. The pattern was
repeatedly applied.
During the susceptibility tests, the output data were continuously compared to the expected
values with the tolerance.
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Table 6.4.1 Compliance Matrix for EMC Test Test
Test ID Test Description Completed Compliance with Specification On
CE101 Conducted Emissions - Power 19 Oct. Complied with limited scope and/or Leads 60 Hz to 10 kHz 2007 condition (Mitigation needed)
CE102 Conducted Emissions - Power
7 Nov. 2007 Yes Leads, 10 kHz to 2MHz Low Frequency Conducted
CS101 Susceptibility Test at AC 5 Nov. 2007 Yes Power Leads High Frequency Conducted
29 Oct. CS114 Susceptibility Test at AC Power
2007 Yes
Leads and Signal Leads Conducted Susceptibility
31 Oct. CS115 (Signal Leads, Bulk cable
2007 Yes
injection, impulse excitation) Conducted Susceptibility
CS116 (Signal Leads, Damped 2 Nov. 2007 Yes sinusoidal transients)
RE101 Radiation Emissions, Magnetic
9 Nov. 2007 Yes Field
RE102 Radiated Emissions, Electric 12 Nov.
Yes Field 2007
RS101 Radiated Susceptibility, 24 Oct.
Yes MaQnetic Field 2007
RS103 Radiated Susceptibility, 30 Oct. Yes Electric Field 2007 (Note 1)
swc Surge Withstand Capability 27 Nov. Yes
2007 (Note 2)
EFT/B Electrical Fast TransienUBurst 28 Nov.
Yes 2007
ESD Electrical Discharge 26 Nov. Yes
2007 (Note 3) Class 1E
to Class 1 E to Non-1 E Isolation
05 Dec. Yes Non-1 E 2007
Isolation Note 1: Toshiba did not test for radiated susceptibility (RS 103) above 1 GHz for the PRM, and thus accepts that either a utility employing this equipment must preclude the use of cell phones and radios near this equipment or accept an open issue from the USNRC in the SER requiring an evaluation by the utility. Note 2: The application of one repetition each second is described in IEC 61000-4-12. However, the Test Lab's equipment could not operate this rapidly. This is only an issue in the application period and has no adverse effect on the equipment qualification envelope. Toshiba and the Test Lab cannot find the record of the coupling impedance value used 12 D or 30 D for the ring wave test Note 3: Some test points in the back panel of the Test Specimen Units showed susceptibilities, but recovered without degradation. These results complied with the requirements of the ESD Test.
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Table 6.4.2 Input and Expected Output pattern Input Expected Output
LPRM Loop FLOW HNS HNS
Time Input Input 511/515 HNS 514/518 HNS 514/518 HNS512/5 HNS513/517
512/516 LPRM APRM 16FLOW FLOW
(sec) Current Current LPRM APRM
(µA) (mA) (V) (mV)
(V) (mV) (V) (V)
0 0.00 20.00 1.00 0.00 0.00 0.00 1.00 5.00
1 37.33 18.67 1.30 11.95 0.15 23.89 0.96 4.79
2 74.67 17.33 1.60 23.89 0.30 47.79 0.91 4.56
3 112.00 16.00 l.90 35.84 0.45 71.68 0.87 4.33
4 149.33 14.67 2.19 47.79 0.60 95.57 0.82 4.08
5 186.67 13.33 2.49 59.73 0.75 119.47 0.76 3.82
6 224.00 12.00 2.79 71.68 0.90 143.36 0.71 3.54
7 261.33 10.67 3.09 83.63 1.05 167.25 0.65 3.23
8 298.67 9.33 3.39 95.57 1.11 177.79 0.58 2.89
9 336.00 8.00 3.69 107.52 l.11 177.79 0.50 2.50
10 373.33 6.67 3.99 119.47 1.11 177.79 0.41 2.04
11 410.67 5.33 4.29 131.41 1.11 177.79 0.29 1.44
12 448.00 4.00 4.58 143.36 1.11 177.79 0.00 0.00
13 485.33 2.67 4.88 155.31 1.11 177.79 0.00 0.00
14 522.67 1.33 167.25 1.11 177.79 0.00 0.00 5.18
15 560.00 0.00 5.44 177.79 1.11 177.79 0.00 0.00
16 522.67 1.33 5.18 167.25 I.l l 177.79 0.00 0.00
17 485.33 2.67 4.88 155.31 1.11 177.79 0.00 0.00
18 448.00 4.00 4.58 143.36 1.11 177.79 0.00 0.00
19 410.67 5.33 4.29 131.41 I.11 177.79 0.29 1.44
20 373.33 6.67 119.47 1.11 177.79 0.41 2.04 3.99
21 336.00 8.00 107.52 1.11 177.79 · 0.50 2.50 3.69
22 298.67 9.33 95.57 1.11 177.79 0.58 2.89 3.39
23 261.33 10.67 3.09 83.63 1.05 167.25 0.65 3.23
24 224.00 12.00 2.79 71.68 0.90 143.36 0.71 3.54
25 186.67 13.33 2.49 59.73 0.75 119.47 0.76 3.82
26 149.33 14.67 2.19 47.79 0.60 95.57 0.82 4.08
27 112.00 16.00 1.90 35.84 0.45 71.68 0.87 4.33
28 74.67 17.33 1.60 23.89 0.30 47.79 0.91 4.56
29 37.33 18.67 1.30 11.95 0.15 23.89 0.96 4.79
30 0.00 20.00 1.00 0.00 0.00 0.00 1.00 5.00
* 1: After 2-3 cycles from the starting of pattern input
*2: 1: Trip, 0: Not Trip
*3: Threshold contains the hysteresis
APRM
High LPRM
High (%)
Trip"'2
0 0.00
0 9.33
0 18.67
0 28.00
0 37.33
0 46.67
0 56.00
1 65.33
1 74.67
1 84.00
1 93.33
1 102.67
1 112.00
1 121.33
1 130.67
1 138.90
l 130.67
l 121.33
I 112.00
1 102.67
1 93.33
I 84.00
l 74.67
I 65.33
0 56.00
0 46.67
0 37.33
0 28.00
0 18.67
0 9.33
0 0.00
Internal Value
APRM FLOW
(%) ("lo)
0.00 125.00
18.67 119.68
37.33 114.11
56.00 108.25
74.67 102.06
93.33 95.47
112.00 88.39
130.67 80.69
138.50 72.17
138.50 62.50
138.50 51.03
138.50 36.08
138.50 0.00
138.50 0.00
138.50 0.00
138.50 0.00
138.50 0.00
138.50 0.00
138.50 0.00
138.50 36.08
138.50 51.03
138.50 62.50
138.50 72.17
130.67 80.69
112.00 88.39
93.33 95.47
74.67 102.06
56.00 108.25
37.33 114.ll
18.67 119.68
0.00 125.00
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APRMHigh TPM
High (%tt
Threshold
68.26 120.00
59.99 120.00
56.22 120.00
56.18 120.00
59.26 120.00
64.94 120.00
72.78 120.00
82.43 120.00
91.78 118.75
99.56 118.75
106.05 118.75
111.46 118.75
115.97 118.75
119.72 118.75
122.85 118.75
125.46 118.75
127.63 118.75
129.44 118.75
130.95 118.75
132.21 118.75
133.26 118.75
134.13 118.75
134.86 118.75
134.16 118.75
130.47 118.75
124.28 120.00
116.01 120.00
106.01 120.00
94.56 120.00
81.91 120.00
68.26 120.00
FPG-TRT-C51-0101 Rev.3
6.4.2. Data Evaluation
6.4.2.1. EMI/RFI Emission Test
(1) Radiated Emissions, Magnetic Field
This test measured radiated magnetic field emissions in the frequency range 30 Hz to 100
kHz with the field applied 7 cm from the surface of test point, according to MIL-STD-461
requirements RE101. Table Bl summarized the test points and results. All emissions were
below the allowable level specified in Section 5.4.2.1. Figures B.1.1 to B.1.5 shows the
example of the emission data obtained.
(2) Radiated Emissions, Electric Field
Vertically and horizontally polarized ennss1ons were measured with antenna placed
one meter from the test boundary. A RF-survey was performed as a pre-scan to determine
that the measurement at th~ front of the Test Specimen would be the worst case. The data
documented in Appendix B Figures B2.1 and B2.2 show that the emissions were below the
allowable level specified in Section 5.4.2.2.
(3) Low Frequency Conducted Emissions
The test setup followed the guidance ofMIL-STD-461E requirement CE101. Table B.3.1
summarized the test points. Figures B.3.1 to B.3.9 are the Test plots. Table B3.2 to Table
B3.6 show the detailed test results between 60 Hz to 1 kHz.
For the CE 101 requirement, appropriate compensatory mitigation should be provided for
the NRW-FPGABased PRM Units. For example, Figure B.3.1 shows the emission from the
power leads. From 100 Hz to approximately 1200 Hz, the emission exceeded the limit
shown in RG l .180Rl. This emission results from waveform distortion from the AC to
DC converter included in the PRM Units. To suppress this emission, inserting a coil was
effective, as shown in Figure B.3.4 through B.3.9. If the suppression is not applied, the
distortion should be evaluated to ensure that the distortion will not affect any other
equipment connected to the same power train.
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( 4) High Frequency Conducted Emissions
The test setup followed the guidance of MIL-STD-461E requirement CE102. Figures
B.4.1 to B.4.3 are the Test plots. Table B4 summarized the test points. All emissions
were below the allowable level specified in Section 5.4.3.2.
6.4.2.2. EMI/RFI Susceptibility Test
(1) Radiated Susceptibility, Magnetic Fields
The Test Specimen Units were tested for susceptibility to radiated magnetic fields in
accordance with MIL-STD-461E requirement RSlOl. The test level is shown in ERS
Section 5.5.3 Figure 5-6. The test frequency range was from 30 Hz to 100 kHz. The
radiated magnetic fields were applied to the test points shown in Table B5 and the Test
Specimen Units operated normally before, during, and after application of the radiated
magnetic field.
(2) Radiated Susceptibility, Electric Field
This test confirmed that the Test Specimen is not susceptible to the radiated electric fields.
The test applied an electric field at 10 volts/meter, with frequency ranging from 30 MHz to
1 GHz, as shown in ERS Section 5.5.3.
The radiated electric field was applied to the front panel of the Test Specimen Units rack
according to MIL-STD-461E requirement RS103. The Test Specimen Units operated
normally before, during, and after the application of the radiated electric field.
Note: Toshiba did not test for radiated susceptibility (RS103) above 1 GHz for the PRM, and thus accepts that
either a utility employing this equipment must preclude the use of cell phones and radios near this
equipment or accept an open issue from the USNRC in the SER requiring an evaluation by the utility.
(3) Low-Frequency Conducted Susceptibility Test at AC Power Leads
This test was performed on the input power cable No. 10 of the AC power sources. The
test was performed according to MIL-STD-461E requirement CSlOl. The envelope limits
are shown in ERS Figure 5-4. The test was performed from 120 Hz, which is the second
harmonic of Power Frequency (60 Hz) to 150 kHz.
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The Test Specimen Units operated normally before, during, and after the testing.
(4) High-Frequency Conducted Susceptibility Test at AC Power Leads
This test was performed to the input power leads to the AC power sources. the test was
performed according to MIL-STD-461E requirement CS114. The envelope limits are
shown in ERS Figure 5-5. Test was performed from 10 kHz to 30 MHz. The test signals
were applied to the test points shown in Table B6.
The Test Specimen Units operated normally before, during, and after testing.
(5) High-Frequency Conducted Susceptibility (Signal Leads)
This test was performed on signal leads in accordance with MIL-STD-461E requirement
CSl 14. The envelope was set from 10 kHz to 30 MHz, and 91 dBµA. The test signals
were applied to the test points shown in Table B 7.
The Test Specimen Units operated normally before, during, and after testing.
(6) Conducted Susceptibility (Signal Leads, Bulk cable injection, impulse excitation)
This test was performed according to MIL-STD-461E requirement CS115. The operating
envelope is set to 2 amperes (A). The test signals were.applied to the test points shown in
Table B8.
The Test Specimen Units operated normally before, during, and after testing.
(7) Conducted Susceptibility (Signal Leads, Damped sinusoidal transients)
This test was performed according to MIL-STD-461E req~irement CSl 16. The operating
envelope was set to SA. The test is performed from 10 kHz to 100 MHz. The test signals
were applied to the test points shown in Table B9.
The Test Specimen Units operated normally before, during, and after testing.
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6.4.2.3. Surge Withstand Capability Test
In this test, surges were applied to the Test Specimen Units in accordance with IEC
61000-4-12 .(for Ring Wave) and IEC 61000-4-5 (for Combination Wave). Surges were
applied to the leads of power cable No. 10. The combinations of the power leads to which
the surges were applied were as follows:
Line and Neutral
Line and Ground
Neutral and Ground
[Line and Neutral] and Ground, only for Ring Wave*
*Note: IEC 61000-4-5 (for Combination Wave) does not require the test for "[Line
and Neutral] and Ground." Only Edition 1 (1995) of IEC 61000-4-12
(for Ring Wave) required the test for "[Line and Neutral] and Ground,"
while later Editions of the same standard do not..
The Ring Wave test signals had the following requirements:
Voltage:+/- 2kV
Pulse Shape: 1 OOkHz, 0.5 microsecond rise time, 10 microseconds pulse
width
Repetition at 1 per 5 second*
Number oftests: Five positive and five negative at the selected points
Phase:O degree, 90 degree and 270 degree
*Note: The application of 1 repetition each second is in IEC 61000-4-12.
However, [ J"~quipment could not operate this rapidly. This is only
the application period issue and this does not create any adverse effects
on the equipment qualification envelope.
The Combination Wave had the following requirements:
Voltage: +/- 2 kV
Pulse Shapes:
• Impulse of 1.2 microsecond(+/- 30 %) rise time, 50 microseconds
pulse width, open circuit, double exponential
• Impulse of 8 microseconds (+/- 20 %) rise time, 20 microseconds
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pulse width, short circuit, double exponential
Repetition: 1 per minute
Number of tests: Five positive and five negative at the selected points
- Phase:O degree, 90 degree and 270 degree
The surges were applied to the test points shown in Tables B 10.1 and B 10.2. The Test
Specimen Units operated normally before, during, and after testing.
Toshiba and the Test Lab cannot find the record of the impedance value used. RG 1.180
Revision 1 does not specify the impedance, and references IEEE Std. C62.41-199 l. IEEE
Std. C62.41 specifies 12 Q for the Category B Location. Toshiba conducted the IEC
61000-4-12 test at Low Exposure for a Category B Location; therefore the impedance was
likely 12 0. A HAEFLEY PIM 110 was used for the surge test and the factory default
impedance is 12 n.
The test was intended to be performed at 12 0, but Toshiba and the Test Lab cannot
confirm the actual setting used. Test results show that the specimen passed the short
circuit test that was performed. This leaves two possibilities. First, the test was actually
performed at the 12 Q setting, and there is no issue. This is the default setting of the test
equipment and the most likely scenario. However, there is still a possibility that the test
was performed with 30 0. For this case, the test results are not confirmed against 12 Q
for Category B location test that brings more energy to the test specimen.
Toshiba considers that it should be assumed that 30 Q was applied for the test to take
conservative position for the appropriate evaluation in a situation where the impedance
value cannot be confirmed. Toshiba considers that the assumption of 30 Q is appropriate,
because the PRM is designed to be connected to the end of the power supply system in
nuclear power plants. Therefore, Toshiba assumes either impedance is workable, and that
the higher impedance would not impact the surge withstand capabilities of the PRM.
6.4.2.4. EFT/8 Test
In this test, EFT/B transients were applied to the Test Specimen Units in accordance with
IEC 61000-4-4 (Reference (8)). The EFT/B transient was applied to the leads of power
cable No. 10. The EFT/B was applied to the following cables, as follows:
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Line
Neutral
Ground
Line, Neutral and Ground simultaneous
FPG-TRT-C51-0101 Rev.3
The specification for the EFT/B applied in this test was as follows:
Limits (Applied peak voltage): Voltage=+/- 2 kVp-p
Pulse Shape: Impulse of 5 nanoseconds(+/- 30 %) rise time, 50 nanoseconds(+/-
30 %) pulse width, double exponential
Repetition rate: 5 kHz(+/- lk Hz)
Burst duration: 15 ms(+/- 20 %)
Burst period: 300 ms(+/- 20 %)
- Test Signal Application Duration: Not less than 1 minute
The EFT/B transients were applied to the test points shown in Tables Bll. The Test
Specimen Units operated normally before, during, and after testing.
6.4.2.5. ESD Test
This test showed that the ESD features of the NRW-FPGA-Based PRM system conformed
to IEC 61000-4-2 and the ESD levels complied with the levels shown in Section 4.3.8 of
EPRI TR-107330 and EPRI TR-102323 Rev.I Appendix B Section 3.5 (+8kV for contact
discharge or + 15kV for air discharge). Detailed results are shown in Table B.12.
No temporary degradation or loss of function or performance at the ESD application were
shown when the ESD transients were applied to the front panels and the parts placed on
the front panels, which can all be touched by people during normal operation. In addition
no temporary degradation, or loss of function or performance occurred with ESD
transients applied to the side panels. Temporary degradation or recoverable loss of
function were identified when the ESD transients were applied to the rear panels, or the
parts placed on these panels, which will not be exposed to ESD during normal operation.
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There is no reason for an operator to access the rear panels. Technicians accessing the rear
panels will do so under work order, with the equipment bypassed. The work order will
specify that grounded wrist straps are required. The back panels in the units are accessible
only when locked cabinet doors are opened. Thus, the back panels are not normally
exposed to ESD.
The cabinet in which the NRW-FPGA-Based PRM Units are installed should be placarded
as containing ESD sensitive equipment, and plant administrative procedures written to
limit access to the rear panels during normal plant operation. A notification that any
person who accesses the rear panels of NRW-FPGA-Based PRM Units shall wear an
anti-BSD wrist strap during normal plant operation should be added to the User's Manual.
6.4.2.6. Class 1 E to Non-1 E Isolation Test
The test levels applied were 600 VAC and 250 VDC at 25 amperes for 30 seconds.
These test level voltages were applied to the test points shown in Tables B 13 .1 and B 13 .2.
The Test Specimen Units were not affected by the voltages, and the modules were not
affected.
7. Conclusion
Table 7.1 summarizes the results of this testing. When the NRW-FPGA-Based PRM
System is applied to actual plants, the following limitation should be considered:
(1) In the Seismic Test, due to the limitation of the [ J~ibration table, the peak
amplitude of SSE was approximately 10 g. The seismic withstand capability of the
NRW-FPGA-Based PRM Units should be evaluated against the plant's maximum
requirements. Retest may be required if the plant SSE maximum requirements are not
enveloped by the testing.
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(2) For conducted emissions (CElOl), appropriate compensatory mitigation should be
provided for the NRW-FPGA-Based PRM Units. To suppress the low frequency
conducted emission, mitigations such as inserting a coil should be considered.
(3) The cabinet in which the NRW-FPGA-Based PRM Units were installed should be
placarded to limit access to the rear panels during normal plant operation and plant
administrative procedures written to limit access to the rear panels during normal plant
operation. A notification that any person . who accesses the rear panels of the
NRW-FPGA-Based PRM Units during the normal plant operation shall wear an anti-ESD
wrist strap should be added to the user's manual.
With the above considerations, the NRW-FPGA-Based PRM Units achieved the required
performance shown in the ERS Section 5 in accordance with the test requirements given in
the ERS Section 7.
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Table 7.1 Summary of Qualification Test
Test ERS Ref. Toshiba Test [ ]¥est Procedure
Results Para. Procedure Number Number
1.1 System Set-up Not Not applicable
and Check-out Test applicable FPG-TPRC-C51-0001
1. 1.2 Burn-in Test 7.2.1 B Not applicable Complied for
Pre- 1.3 System Set-up Not application specific
Qualification and Check-out Test applicable FPG-TPRC-C51-1001 Not applicable requirements for the
PRM defined by the Test
7.2.2, ERS. 1.4 Operability Test
7.2.4 FPG-TPRC-C51-1009 Not applicable
1 .5 Prudency Test 7.2.3,
FPG-TPRC-C51-1010 Not applicable 7.2.4
2.2 Environmental 7.3.2.4,
Test (Radiation FPG-TPRC-C51-1002 FPG-VDN-C51-0200 Complied Exposure)
5.5.1
1•1 Test:Failed due to the problem of
2.4 Environmental 7.3.2.4, environmental
Test (Temperature FPG-TPRC-C51-1002 FPG-VDN-C51-0200 Chamber and Humidity)
5.5.1 2nd Test: Complied with EPRI TR-107330 with limited marain. Complied with limited scope and/or condition.
7.3.2.5, (due to the limitation of
2.6 Seismic Test FPG-TPRC-C51-1003 FPG-VDN-C51-0200 the [ ]Vibration 5.5.2
table, the peak amplitude of SSE was approximately 10 g.) Complied with limited scope and/or condition.
2. (Before this test, modifications of AO
Qualification and LPRM modules to Test enhance the noise
7.3.2.2, withstand capability 2.8 EMI/RFI Test
5.5.3 FPG-TPRC-C51-1004 FPG-VDN-C51-0201 were performed.
For CE101 test, choke coil should be added for mitigation. RS103 test was not conducted for the frequency above 1 GHz. See Note 1.)
2.9 Surge Withstand 7.3.2.7, FPG-TPRC- C51-1005 FPG-VDN-C51-0201
Complied Capability Test 5.5.4 (Note 2)
2.10 EFT/ B Test 7.3.2.9,
FPG-TPRC- C51-1006 FPG-VDN-C51-0201 Complied 5.5.5
2.11 ESD Test 7.3.2.10, FPG-TPRC-C51
FPG-VDN-C51-0201 Complied
5.5.6 -1007 (Note 3)
2.12 Class 1E to 7.3.2.8, FPG-TPRC-C51
Non-1 E Isolation FPG-VDN-C51-0201 Complied Test 5.5.7 -1008
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[ r Test ERS Ref. Toshiba Test Test Procedure
Results Para. Procedure Number Number
Complied for 3.
7.2.2, application specific Performance 3.2 Operability Test
7.2.4 FPG-TPRC-C51-1009
Not applicable requirements for the
Proof Test PRM defined by the ERS.
Note 1: Toshiba did not test for radiated susceptibility (RSI03) above 1 GHz for the PRM, and thus accepts that either a utility employing this equipment must preclude the use of cell phones and radios near this equipment or accept an open issue from the USNRC in the SER requiring an evaluation by the utility. Note 2: The application of one repetition each second is described in IEC 61000-4-12. However, the Test Lab's equipment could not operate this rapidly. This is only an issue in the application period and has no adverse effect on the equipment qualification envelope. Toshiba and the Test Lab cannot find the record of the coupling impedance value used 12 nor 30 n for the ring wave test. Note 3: Some test points in the back panel of the Test Specimen Units showed susceptibilities, but recovered without degradation. These results complied with the requirement of the ESD Test.
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8. References, Definitions and Acronyms
8 .1 . References
(1) U.S. NRC Regulatory Guide RG-1.180 Revision 1
Guidelines for Evaluating Electromagnetic and Radio-Frequency Interference in
Safety-Related Instrumentation and Control Systems, revised October 2003. Chapters 3 and
4
(2) EPRI TR-102323-R2
Guidelines for Electromagnetic Interference Testing in Power Plant Equipment, Subsystems
and Equipment, November 2000
(3) EPRI TR-107330
Generic Requirements Specification for Qualifying a Com.m.ercially Available PLC for
Safety-Related Applications in Nuclear Power Plants, Final Report dated December 1996
(4) IEEE Std 384-1992
IEEE Standard Criteria for Independence of Class lE Equipment and Circuits
(5) IEEE Std 323-1983
Standard for Qualifying of Class lE Equipment for Nuclear Power Generating Stations
(6) MIL-STD-461E
Requirements for the Control of Electromagnetic Interference Characteristics of
Subsystems and Equipment
(7) IEC61000-4-2: 1995, Amendment 1 (1998), Amendment 2 (2000)
Electros.tatic discharge im.m.unity test
(8) IEC61000-4-4: 1995, Amendment 1 (2000), Amendment 2 (2001)
Electrical fast transient / burst im.m.unity test
(9) IEC61000-4-5: 1995, Amendment 1 (2000)
Surge im.m.unity test
(10) IEC61000-4-12: 1996
Oscillatory Waves Imm.unity Tests
(11) FPG-PLN-C51-0003
NRW-FPGA-Based PRM System. Qualification Project Qualification Plan, Rev.4
(12) FPG-PLN-C51-0005
TOSHIBA ENERGY SYS1EMS I SOWTIONS CORPOIUO'ION Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3
NRW-FPGA-Based PRM System Qualification Project Master Test Plan, Rev.5
(13) FPG-RQS-C51-0001
NR W-FPGA-Based PRM System Qualification Project Equipment Requirement
Specification ofFPGA based Units, Rev.8
(14) FPG-DRT-C51-0001
NRW-FPGA-Based PRM System Qualification Project Preliminary Technical Evaluation
Report, Rev .10
(15) FPG-VDN-C51-0047 Schematic Diagrams (PRM System for Qualification), Rev.9
(16) FPG-VDN-C51-0200 Radiation Exposure, Environmental, and Seismic Qualification
Test Procedure for a Toshiba FPGA-Based PRM System, Rev.1
(17) FPG-VDN-C51-0201 EMI MIL-STD-461E Test Procedure on a new-FPGA-Based
PRM System, Rev.5
(18) FPG-TPRC-C51-0001 System Validation Test Procedure, Rev.2
(19) FPG-TPRC-C51-1001 System Set-Up and Check-out Test Procedure, Rev.6
(20) FPG-TPRC-C5 l-1002 Environmental Test Procedure, Rev.3
(21) FPG-TPRC-C51-1003 Seismic Test Procedure, Rev.3
(22) FPG-TPRC-C51-1004 EMI/RFI Test Procedure, Rev. 7
(23) FPG-TPRC-C51-1005 Surge Withstand Capability Test Procedure, Rev.4
(24) FPG-TPRC-C51-1006 EFT/B Test Procedure, Rev.4
(25) FPG-TPRC-C51-1007 ESD Test Procedure, Rev.5
(26) FPG-TPRC-C5 l-1008 Class lE to Non-IE Isolation Test Procedure, Rev.5
(27) FPG-TPRC-C51-1009 Operability Test Procedure, Rev.5
(28) FPG-TPRC-C51-1010 Prudency Test Procedure, Rev.5
(29) FPG-CFM-C51-0001 Master Configuration List, Rev.9
8.2. Definitions and Acronyms
Test System, Test Specimen, and Test Equipment. The Qualification Project performs
qualification of PRM Units installed in a Test System. Terms relating to the Test System
are d~fined as follows:
• Test System means a system consisting of Test Specimen and Test Equipment.
• Test Specimen means NRW-FPGA-Based PRM Units, and the cable between the
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FPG-TRT-CS 1-0101 Rev.3
Units, to be tested for Qualification.
• Test Equipment means support equipment for the Qualification Test of the Test
Specimen such as the simulator, cable, and data logger.
APRM:
EFT/B:
ERS:
ESD:
FPGA:
LPRM:
MTP:
NED:
NRW-FPGA
OBE:
PRM:
PTER:
SSE:
Average Power Range Monitor
Electrically Fast Transients and Burst
Equipment Requirement Specification
Electro Static Discharge
Field Programmable Gate Array (a programmable logic device).
Local Power Range Monitor
Master Test Plan
Nuclear Energy Systems & Services Division
Non-Rewritable-FPGA
Operating Basis Earthquake
Power Range Monitor
Preliminary Technical Evaluation Report
Safe Shutdown Earthquake
lDSHIBA ENERGY SYS1EMS I SOWTIONS CORPOIUD"ION Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3
APPENDIX A Test results data for Seismic Tests APPENDIX A Test results data for Seismic Tests ..... ~ .................................................... 70
A.1 Resonance Search ................................................................................................ 71
A.2 Random Multi Frequency Tests ........................................................................... 79
A2.1 lst OBE .......................................................................................................... 79
A 2.2 2nd OBE ....................................................................................................... 80
A 2.3 3rd OBE ........................................................................................................ 82
A 2.4 4th OBE ........................................................................................................ 83
A 2.5 5th OBE ...................................................................................................... ,. 85
A2.6 SSE ................................................................................................................ 87
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A. 1 Resonance Search <Vertical>
jl8;55'22 . ()2,f'lov,2006
Lag l'<IXJUGl'icy(Ht)
VERTICAL RESONANCE SEARCH . i'OSHfBA ~ss'R,UNJ . .
· ~lneTe,;INam;,:.VERTRS:901.
FPG-TRT-C51-0101 Rev.3
.5VVSVCA
Figure A.1.1 Test Fixture Vertical Vibration Resonance Search Results
H(n Magnitude 1-911-3'
Ratio
08:55:25 02-Nov-2006
Log
VERHCAL RESONANCESEARCH TOSHIBA 53298 F!UN 1
Sina Tes! Namo: VEATA:S.001
10 100
Frequency (fll)
6VVSVCA
Figure A.1.2 Flow Unit Vertical Vibration Resonance Search Results
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H(~ Magnllude 1-1211·3
log
Ratio
Sweep Numbe<: 1.00 Sweep Rale: V•rlab'.e
10 · Comarosslcin: Variable'
FPG-TRT-C51-0101 Rev.3
Remaining Tlmo: 000:00:00 Tes! Range: 1.000, 10.0.000 Hz · PoinlS Per s,....,p: 1000
· ···· '"' , ........ ····c· ···-··t·· -·-··· ······················· ·---·--········-·· 'f~::::1··-.... -~-=f.=: .. , ...... ~~--··---+----J-·-·"··---'-·-f-·-J--+-c +--··············-······················-·+----····-······+··-·······--·····'·····-·I--+-++-1
i i ·---·····
;--··--····----,·----- --- . 1·--+-·-+--10-•--+--------·1------
l ············ ·······i·•'""······ ·······-··········
............. [ ............................... .
l··-···l·-··1-···l-1--l--···---+---·--I·· ·
- i .. 1. ,..,../--.. ·-· , .. , .. - : __
,-· ... - ··-······---·---·- ··-- ·~'----- --·--········ ··- I·-- il····f··+···+·· ······ ··-··-------·--·· -···- ······-·-·-·'···· ... , ........... , ...•.. , ... , ... ; ..•
ACP: 1 · 0.1
011;55;.29 02·NOY·200S '
+--
·-- >····-+······•··-+····•- • -- - - - - -- ---- ---- -- -
·-- --···--··-·-·----- •-·-·----······+·-····- ··• , ·••· 1--1---1--+-·IH-------+---·--·--l--·· -+·--+---1---,---l·-+
0.01-.~-~----~-------~~------~--~-~!--~~--1
·Log
VERTICAL, RESONANCE SEARCH TOSHIBA 53298 RUN· 1 . . Sino Tosi Namo: VERTRS.oo(
10 100
· Frequency (Hz)
9VVSVCA
Figure A.1.3 Power Line Panel Vertical Resonance Search Results
ll(Q Magnitude · 1-1S'1-3
Log
Ratio
ACP: 1
08:55:40 02·i'IOY·2006
Sweep Number. 1.00 . Sweep Rate: Variatl.e
10 CompreSSOn: Vnrfabta-· ·
, I·-- :---- ; ··--·l·-···-i··-->··- •· ,- ---·· --··-·-····-·· · -,
.'-.
L .. --- r
+··-+--1-1--c--,,,. -·-·-······---·+.
! , .. . .. .. -··-·-··--····! ·--·-·--···-·, ·- -·. ,_ ..... ·-··-·· ··~-· -··-·--···-· -·· - .:,
-··-- -·-·· -- !-· ------~--->---!---+--+-~-•-+-------,-
.. ·-··--·-·--···- . ····-·--·-·· ·- --- ----··•·--·<·······-+--·•·-··-•
'
""'""""'"' '"'~' 000:00:00 Pomts p,ii s,!;:11~.000 Hz
-
............ , ............... , ................ .
' !J,,-/'
·····-··
•········--···•··--•·-- --i- ~:-1
i !-f
··1·········-----+·--··-·--1'--- ······i··--·+······-1·····1 ···+·····+····1-···················-··-··--·+-················· ~-····-··--·- •-··-····-···· ····----··1···--·~:-1=~~:!=~
rr--O.Ot-L--,-----'-------------''--.,_ ............. _._ ____ _,_ __ ..__ ___ ...... __.___,__,_-'-1
1
log
VERTICAi. RESONANCE SEARCH iOSHIBA 5321l8 RUN 1 . .Slno Tosi N.Imo: VERTRS.001.
.JO 100
Frequency (Hz)
12VVSVCA.
Figure A.1.4 LPRM/ APRM Unit Vertical Resonance Search Results
lUSIIBA BIER6Y SYSTEIIS I SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
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H(Q Mogniluda 1-111'1·3
t.00 Elaps«I Tm\o: 000:04:44 Filter Typo: Proportiopat Fundamental: 80.000 .%. BO RMS: 39B. mcvc
+ ·i :··-·-·"',··--· ··- .--··!-·- ·······-··· ···-······--,··-··
FPG-TRT-C51-0101 Rev.3
Remaining Time; 000:00:00 Tost Range:: 1.000; 100.000 Hz POOlts Por,Sweop: 1000 .
::.1 .. ... -i -····· ............ '""'T'"
•--·-----·---•----~--- L ... -----,-- ------ i i ·-------·= ·1---· ---- ·--- ............... + ..... ~ ... -+---- _,,_,, _____ -;_ .... _ --··" .... , ......
i
L.
log
ACP: 1·
09:S!i:45 ONlov-200&
,.,
: -,---: j +.----,-t--t--+----- ---,-------
I i .!
-!--------+---··!·- -- , ---- --•-s----1-t--+,-----------•---,----,------t-·-t---t---+---+-l -t---·--------'---+--+---r---,~,--,--·-r-+--·---····.---··-··•~ ·-·--,~· -·~- ···· .... ,.1,., .... ··-,····· ,·······1--·
log
VERTICAL RESONANCE SEARCH TOSHiBA 53290 RUii\
Sine Test Name: VEl'ITRS.001•
Frequency (l-lz)
to 100
15VVSVCI\
Figure A.1.5 LPRM Unit Vertical Resonance Search Results
<North to South>
H(I) Magnituda 1-511-2
log
Ratro
ACP: 1
09:12:10 02-Nov-2006
Sweep Number: 1.00 Swoop Rote: Variable
100. Ccmpcession~Va.dablo
1Q
, ........ .. --
----•-----
Elapsed ;-;,,,v ... v.-.
1 ;•,;,;,;,:..,,, •• ii'n IWJ %, BB RMS: 398. mcvc
, ---
' '
+·i • - ---· 1 --!-··+··
t \
· · ···-li 1~· ·~
L,_-_·_ -----l---,-----t---------• -r---t---·>--+-;- .. --.. ---~--1/\"' .... ·i··-·-··"f"""·-;---,--·-t--t--+--+----·- --·+-----;---;c--t---+-t--+--1
0.1 '------'----'----'---'----'---'--'--'-'-----'----'-_..--'---'---'--'-'--I; 10 100
LCQ • Fre'ltlency (Hz)
SIDE/SIDE RESONANCE SEARCH 2SSVSSSHCA
TOSHIBA 53298 RUN 2 ·
Sine Test Namir. NSAS.001
Figure A.1.6 Test Fixture Horizontal (North to South) Resonance Search Results
TOSIIBA BIER6Y SYSltllS I SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
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H(~ Magnitude H\11·2
Ratio
ACP: l
09:12:14 02-Nov-2000
Loa·
SIDE/SIDE RESONANCE SEARCH TOsliiBA 53298 RUN 2 · .
Sina Tes! Name: NSRS.001
FPG-TRT-C51-0101 Rev.3
10 .100
5SSVSSSHCA
FigureA.1.7 Flow Unit Horizontal (North to South) Resonance Search
H{ij Magnillldo Hl/1-2
Log
Ralio
ACP: 1
EJap$f)d Time: OOO:o4:44 Alter Type: Plt'l)(!tllonal
0.01.. '"'. ----'----'---'----"'-----~'-'-__._ ___ ___. __ _..._-'---'--"---'--'....-"-' ·1 10 100
Log FroQ1J!!ncy.(Hz)
SIDE/SIDE RESONANCE SEARCH TOSH!SA 53298 RUN 2 . .
&SSVSSSHCA
Sin• Test Nome, NSRS.OOt ·
FigureA.1.8 Power Line Panel Horizontal (North to South) Resonance Search Results
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H(Q Magnitude 1-1411·2
tog,
ACP: 1
09:12:21, 02•NoY•2000
S10£1S!OE RESONANCE SEARCfl ' TOSHIBA 53298 RUN 2· · .
Sine Test Na""1: NSRS.001.
FPG-TRT-C51-0101 Rev.3
10 100 Frequency (Hz!
11SSVSSSHCA.
FigureA.1.9 LPRM/APRM Unit Horizontal (North to South) Resonance Search Results
H(Q Magnitude 1-1711·2
log
Ratio
ACl'i I
10 .100 Frequency {Hz)
S10EISIOE RESONANCE SfARCli 14SSVSSSHCA
TOSHIBA S3200 RUN 2 . .
Sine Test Name: NSRS.001
Figure A.1.10 LPRM Unit Horizontal (North to South) Resonance Search Results
1USIIBA BIER&Y SYSTEMS I SOLUTIONS CDRP111A11DN Nuclear Energy Systems & Services Division
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<East to West>
H(f) Magnitude 1-4/M
Leg
ACP: 1
09:19:64 OHl<W-200&
Log Frequency (Hz) .
FRONT/BACK RESONANCE SEARCH TOSHIBA 53200 AUN 3 .Sino Tosi Namll: EWRS.001 ·
FPG-TRT-C51-0101 Rev.3
10 100
1FBVSFBHCA
Figure A.1.11 Test Fixture Horizontal (East to West) Resonance Search Results
H(f) Magnl!ude Filf.t
log
ACP; 1
09:19:58 02-Nav-2006
Log Fraqoonc:y (Hz)
. FAONTlllACK RESONANCl',SEARCH TOSHIBA 5329S RUN ;I SlnaTestl-lame; EWFIS.091 ·
10 100
4FB.VSFJ3HCA
Figure A.1.12 Flow Unit Horizontal (East to West) Resonance Search Results
TOSIIBA BIER&Y SVUEIIIS I SOLUTIONS CORPCIIATKIH Nuclear Energy Systems & Services Division
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H(I), Magriluda HM-l
Log
Ratio
ACP: 1
09:20:06 02-~ov-2006
O.L,:.::.... . .1.... l: .... ,-.. , __ _
- ---------+---l--+--f--i--t,-»-i .. ·-l-
FPG-TRT-C51-0101 Rev.3
-·-····-'--·-·f--..... -,----·-+-+-+--··-'-• ·-- ~---·~~ \--· · ··········· ······ :··-···t··-·····r--·-t-··- ....
·---····-·········--···--···"·•
-- t ·---·- --------·t--i--i-+-i--1
........... -------+--·-f-----·f----+-·l-i-l··-1----------,:-----t-- -:---t--t--1--+·+-I . ---·-·------·1--·---, ........ -;------t-··t--t-·!--t-!--·---····· - ------,--·-------;---------,-------,-----,-. ,-., •• , .•. ,
!
om .. .._ ___ ..... -----~---~~---~----------. !·
Log Frequency (Hz)
FRONT/BACK RESONANCE SEARCH T0SHIBA53298RUN3 .
Sino Tesi Name-: EWflS.OOt'
10 100
7FBVSFBHCA
FigureA.1.13 Power Line Panel Horizontal (East to West) Resonance Search Results
H(U Magnitude 1-1311-1
Log
Ratio
ACP: 1
09:20:16 02•NOV•2006
S\\!oop l'lumoor: 1.00 Sweep Rate: Vanat!e
8apsed Time: 000:04:44 Filler Tl'Jl": Propaitiona!
100. Comcmssion: Vartable Fundumanial: 00-000 'l(,, BB RMS: 398. mc:yc
Ramai~il'l!l Time: 000;00;00 Test Range: 1.000, 100.000Hz Points Par SWOC!J! 1 COO
-. ... , ... _,_ ,-, __ __
, ___ ..... ......... , .... ,_
_, ___ ---·- ------+----.. +···--· •-----. i
i
-----, __ ;
i ! I I :
Leg Freqooncy (Hz)
FRONT/BACK RESONANCE SEARCH TOSHIBA 53298 RUii S
Sina Test Name: EWRS.001
····-· ---l --~-- -~· ' ·1 • •• +-+.-: .. i--
.... ,: .. ,- ; : ·=--v--·r-· t--·
L.-- ....
-
f -r-----+---+-----f--1
-~---------~----~'-i
10 100
10FB VS FB HCA
Figure A.1.14 LPRM/ APRM Unit Horizontal (East to West) Resonance Search Results
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H(Q Magni1Uoo 1-16/M
Log
Ratio
ACP: 1
09:20:20 02·Nov-2006
Log Frequency (Hz)
FRONT/BACK RESONANCE SEARCH TOSHIBA Sl2B8 RUN 3
Sine Test Name: EY/RS.001
FPG-TRT-C51-0101 Rev.3
10 ,co
13FB VS FB HCA
Figure A.1.15 LPRM Unit Horizontal (East to West) Resonance Search Results
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FPG-TRT-C51-0101 Rev.3
A.2 Random Multi Frequency Tests
A2.1 1st QBE
Coo!ro4 Maxi-Max
log
Peak: 16.227 0.010
07:46:47.7 Frllrov032006
100
Testle\<Of: O.OOOdB Pulse: \ o1 t
·•····· ·-·······--··-··---- ··--
- ····-···----" -- .----
Ccntrol .f ZPA: 7.001 PulsnPo!.iri!y: +
Pulse Typc:lmpolt Roforenoo SAS Damping (%): 5.000
10_, ______ .. ·--· --- ..... •:
' ·',; -- ..
l----.--.. /,/-A'A-/--··,.-+----.-;--+-+--H+ij·r~n-n't'ro-1°]~ -~1------r----+-+-~-~-+-t
.~---~- -----+---+~i-+-+-t-+-+-----;---.. -·--+----+--t---t--1 .. ·,
. ------- .... ·---- ,--·--~-- .. •----+--+·-, .... , ..... _____ .. __ ......... - ... ~.-...... _ ........ , .... _ . .,. ... _.,. ___ ,_,_ ..... ,_L I O.t..~---~-~-~~~~~------~-~-~~~~~-'--'
10 100 Log freQUOrJC'f (Hz)·
TOSH<BA 53298 OB5 FBHCA(EW)
RUN#4'
MIMO Shocl< Test TOSHIBA_OBE.001
Figure A.2.1.1 TRS for 1st OBE for Horizontal Axis (East to West)
Log g
P"1k:
13.738
O.COB
07:46:47.7 Fri Nov 03 2006
Test Level: 0.000 dB PulS!l: 1 of f
C-Onficl 2 ZPA: 6.558 PulsoPolority:+
10 Log Frequency (Hz)
T0SH<8A 53200 OBE AUN/14
t.!IMO Shock Test TOSHIB!\__OBE.001
Pulse Type:lmport Reference . SAS Damping (%): 5.000
SSHCA(NS)
Figure A.2.1.2 TRS for 1st OBE for Horizontal Axis (North to South)
100
fflSIIU BIER6Y SVSll:IIS I SOLUTIONS CDRPORA1111N Nuclear Energy Systems & Services Division
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Conlrol Maxl•Max
Log
Peale 19.859
0.010
07:46,47.7 Fri Nov(l(l2006
Control 3 zPA: • 7,408 Pulse Polari\r, +
:....... ·······i···--~· '····-·····-l·-·-···:-... ···i· .. ! i··· 11rnl l., } ;-/.............. ·--- '. ·r;:;n:..:c~-
I ! i
! -,--!•· ~--!-----·-··-··
,!
FPG-TRT-C51-0101 Rev.3
l'llloo Typc:lmp<1rt Rc!ornnco SRS Damping(%): 5.000
,--.-- - -··---- . - ; ... µJ.L., .....
:
...
-- ---, .. -
-1----.,---,--,_ ... H-~.
.................... ;,. ......................... 1--"•·l-··---i---+- I +-0.L '--------'---'----'---'---'---'---'--"-'-----'----'----'---'--"---'--'--"-'I
t 10 100 Log Frequency (Hz)
TOSHIBA 53298 QBE VOA
RUl'll!4 '
MIMO Shoekiest TOSHIBA_OBE.001
Figure A.2.1.3 TRS for 1st OBE for Vertical Axis
A2.2 2nd QBE
Con!rol Maxi-Max
Log g
Pea'<: 15.642
0.012-
00:11:2.ui FrfNov002006.
Test Level: 0.000 6ll 'Pulse: .1 of 1
·100·
.... .. ......... _
Conirm 1 ZPA! 7.150 Pulse Polarity: t
·------- -...... ,_ ____ .... _ .. _ ..... +------,--+ ·+ ' - : + <--~,;'fi,,, t\.ppi,P,(l
Pulse Typo:lmport Ro!ornnm SAS Damping (%): 5.000
,LI
-•--; • • I'
·--------r-; ___ -+-----,-----1--+--- 0---------~---'------+----~---+-l ! ! .)--t\_
10 .. ,_ ... ,
/
····f=:F , .. _,_
·.~_: __ !,:;: - : ... I .L
'
... , ; ;··1·----1·····----··------·· ..... ,............................ ................... • ·+
-+-----i .. -+ .. --~,---,--,-_,l .... _,_n_:o·-n·t-ro--1·1-c~·;:;,.,;~,;:,hu1";;~+----·i""""'" : , .......... .
- ----·----- ---1--1---,---+--l---'--.,--·~-----+---l---l---'~1--'--·•-'-1 : =----·---:-._-----·~==:=·=:=::::=:;::::;.::::-..:f--___ ---__ --.. _--_----... ;-... _ .• ~:=~=:--·.--·l'c-_-... 1.--.---· , .... l= ~-
Log Frequency (Hz)
TOSHIBA S32l)8 OBE FOHCA(EW).
RUN#S '
MIMO Shcc:k.Tesl: T0SHIBI\..08E:002
Figure A.2.2.1 TRS for 2nd OBE for Horizontal Axis (East to West)
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Control Maxi-Max
Log g
Peak: 13.722 0.009
OB:11:24.5 Fri Nert 03 2006 .
------ - -- --------------
Tc•1 LoV<ll: O.ODO dB Pulse:· 1 of 1
10_ -··
O.l
,,---
, __
TOSHIBA. 532.."8 QBE RUN#S
Ccntrtl 2 7PA: 6.671 Pulw P<llarity: +
i ' 10
Freqllsncy (Hz)
MIMO ShockTest TOSHlBA_OBE,002
FPG-TRT-C51-0101 Rev.3
Poise Type:fmport Relerence SAS Oampir.g (%): 5.000
-----
·-··· 1-.-·- .••. '·-
·-t---------+-----1----f·----,!--t---·I- -1~
100
SSI-ICA(NS)
Figure A.2.2.2 TRS for 2nd OBE for Horizontal Axis (North to South)
Conlrol 3· Mald·l,lax
L<Jg g
Peak: 19.666 0.011
08;11:24.5 Fri Nov 03 2000
Test Llwa~ O.OOD dB Pulse: I ol 1
C-0n!rol· 3 ZPA: 7.276 Pulse Polarity:+
. Pulse T\'Pe:lmpCl't Reference :SAS Damping(%): 5.000
100 r:::-::-:=======-;:==::::::::".'.j'.'.'.:==========-:--;:==:-::-========r=-===::-r-:=-=~::=i==;--:-==r;:i
10_
L
!.<Jg
TOSHIBA 53298 OBE RUN,5
Fwquoncy (Hz)
MIMO Shock Test: TOSHJBA...OBE.002
10
VCA
Figure A.2.2.3 TRS for 2nd OBE for Vertical Axis
100-
mSIIBA EIIER&Y SYSTEMS I SOLUTIONS CDRP111A11DN Nuclear Energy Systems & Services Division
81/151
FPG-TRT-C51-0101 Rev.3
A2.3 3rd OBE
Control · Maxi-Max
Peal<: 1&.237 0.012
Tostlo,al: 0.000<1!1 Pulse: 1 of l
Conlrlll 1 2PA: 6.970 Ptdso Polarity:+
Pulse Type:lmport Reference SAS Damping (%): 5.000
ioo:·f -::=:::::---==:::=:~==:::::=:E:=:'::::::=.=t==:=:T-=:::::E=.::~EI:i::cE:=~~'?::::F===:":'E'~F:::::::=E:::E:3=:ETJ f· .:.::::):: · ······· ··········· ,., ..•. :t:::::· ,···-· --, --.r :F··'·--- -.-·f=:J. ·
..... !../ i
, i i i I .. .. ···--:;-··· , .... '····r··ipp·i "i~ -..1 e1 1 ... I ·-···;---,A:<:m"l1,Aat ,~ ~ ,_.;u'um----·-- ---
' - • '-··. i : y I\,. --'---1--.J_.,,. __ __
10, ·:-~· .. ,- c:::.:..:::.::i ...................... •.. .. . ,,. '..· -- ... _ ·--~-,-
··---·-------·--:----~;;:.i-"' ' - . - .·.; ·----'i-l--l--~ -!-----------~-\,-,.-~·_ :__-_··.:..+0 .1·.·_·-----_--_ .. ___ ·····.·_-----/-1·/, :;,,-,,: ........ :.: .. .• • . . . '"'--···········-·····-··---··-'"' ··- ~==t r--- //' i , __ --J-i-Jr-·11--,,~;:-~1'-1-;t:;-;:;-+;;;'~ Control S1 1ectr11m
// i t ___ /,/. __ LL ---·-- _ __J_ ....
-·--+·- :___ ...i
= : -•--·--·····-···········---- r-··· 1... ..'. ... . 1-- --•-4-·..!--1----·-
i
i i
.J
! l 0.1_4,.; ___ __, __ _,___-"---'--'----'--'--'-...._-----'----
Leg
TOSHIBA 53298 OBE AUN~6
Fmquency (Hz)
MIMOShool<TestTOSHIBf\...OOE.003
10
FBHCA(EW)
I
! :
I
! l I
I ·1 !
I
I I 100
Figure A.2.3 .1 TRS for 3rd OBE for Horizontal Axis (East to West)
Test Lewi: O.OOO(IB P~lsa: 1 of 1
Control 2 ZPA: 6.533 Pulse Polarity: +
Pulse Type:lmport Reference SAS Damping (%): s.ooo
100 .. ,.f ===========;:'-::1::-:-:;::::;::+'===========:::;:-:===i Control 2 t,!axH.lax
Log g
Peak: 13.964 0.009
08:33:22.7 Fri Nov032006
Log
TOSHIBA 53298 OBE AllNUG
Frequency (Hz)
MIMO Shock Tosi: TOSHIBA.,.OBE.003
SSHCA(NS)
FigureA.2.3.2 TRS for 3rd OBE for Horizontal Axis (North to South)
1USIIBA BIER6Y SYSTEMS I SOLUTIONS CORPORA11DN Nuclear Energy Systems & Services Division
82/151
100
FPG-TRT-C51-0101 Rev.3
Control 3 MaiU-IMX
Peak: 20.528 0.011
08:33:22.7 Fri Nov 03 2006
Tool Level:· 0.000 dB Pulso; 1 of 1
10 ..
TOSHIBA 53298 QBE RUN~6
Conlrcl 3 ZPA: 7.690 Pulse Polari!y: +
10 Frequency (Hz)
MJMO Shock Test TOSHiBA...OBE.003
Pulse Type:lmport Reference SRS Damping (%): 5.000
VCA
Figure A.2.3.3 IRS for 3rd OBE for Vertical Axis
A2.4 4th OBE
Control 1 · Ma>!-MaX
Leg
~
Peak: 16:604 0.012
06:50:.21.3 Fn Nov os 2006
10
Tool Level: 0.000 dB Pulse: t of · 1
log
TOSHIBA 5329/J QBE RUNN7
Con1ro1 1 iPA: 6.687 Pulse Polarl!y: +
10 Frequency (Hz)
MIMO Shock Test TOSHIBA~OBE.004
Pulse Type:lmpOf\ Reference SAS Damping ("k); s.ooo
FBHCA(EW)
Figure A.2.4.1 IRS for 4th OBE for Horizontal Axis (East to West)
100
1USJIB1 DIER6Y SYSl"EIIIIS I SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
83/151
100
Conitol Maxi-I.tax
Log
9
Pon!<: 13.611 0.009
08:50:21.3 Frt Nov032006
Tes! Level: 0.000 d8 Pulse: 1 of 1
100·.
· Conlrof 2 2PA: 6.519 Pulse Polarity: +
FPG-TRT-C51-0101 Rev.3
l'\Jlse Type:lmport Reference SAS Damping (%): 5.000
• ---H• •,,.,,., .. _,•••-• •• '"'" ""' ,e-<- ,•• ••-•"o• '••••••••m
---f.-· --· _[. f-·"-'"·---f--------,·1'··----.j---·+-l--+··i .. ,-1 ..,.·.·-... ·.-_·,· __ ·_-_··.,.. =:==~=i= . '"-------·· .. ,------···+-··-····1-··
;, .... ·······!···!
10 , •
......................................
J. .. ....... , ....... .
· f----·--·· ···---i--·-+--1---f--+-+-+-+-·'-·--------·· i----+-·---1---i---+-+-l· •.
0.1. ,__ ___ _._ __ ~l _ _._ _______ .._~'------'----'-----'--'---'--'---"-'--t
Log
TOSHIBA 532ll8 OBE RUN/17
Frequency (Hz)
t.!IM0$hocl<Tooi: TOSHIBA...OBE.004
10 100
5SHCA(N$)
Figure A.2.4.2 TRS for 4th OBE for Horizontal Axis (North to South)
Cornrol Maxl•Max
L-09 g
Peak: 21.341 0.012
08:50:21.3 Fri Nov 03 2000
Control 3 ZPA: 8.049 Pulse Po!arity: +
I
i I ........ l .......
.. ·i---·,-··-
--~------+,···-----~---~--t--1---~-l-f-+---------I ; ....... •·
I
;
' I i
Purse Type:Jmport Reference SRS Damping (%): 5.000
I ....... .. ---i •.
!
.. ::::±. ·-:-' i
i I I \
... \· .
0.1. '----'-----'----------~----"'---....... ---'-----------------''---'---'---'-'--
TOSHIBA 53298 OBE RUN#7
frequen"l (Hz)
: Ml MO Shock Test TOSHIBI\..OBE.004
10
VCA
Figure A.2.4.3 TRS for 4th OBE for Vertical Axis
100
1USIIBA BIER&Y SYSTEMS I SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3
A2.5 5th QBE
Control ·1 Mald·Max
Log g
Peal<: 17.011
0.012
09:12:19.6 Fri tlov 03 2006
10.
Test L.e·rol: 0.000 dB .Pulse: 1.ol 1
Log
TOSHIBA 53298 OBE RUNiB
Ceo!rol 1 ZPA: G.891 Pulse Polarity: +
10
Frequency (Hz)
IJIMO Shock Test: TOSHl!lA_OBE.005
Pulse lype:llrport Reference SAS Camping (%): 5.000
FBHCA(EW)
Figure A.2.5 .1 TRS for 5th OBE for Horizontal Axis (East to West)
Test-Lewt. O.OOO.d3. .• Puts,J: 1-01 .1· !Oll,:·.1 ·:-:-==:r
10
Control 1 ZPk 6ES1 f'~sof'oijrlty;.,:
. ·t1_fl ,- -l-.--'H--L -4--1-'-l
i '
0.1 i I . 10
'l'u!c.,,T:,pe:hr'l"'rl Reieran,eSAS Dilm,iilg 1%1: 5.000
FigureA.2.5.l(a) TRS for 5th OBE for Horizontal Axis (East to West)
with EPRI TR-107330 "narrow" RRS and 1/6 octave grid line
mSIIBA BIER6Y SYSTEMS I SOLUTIDIIS CORPORATION Nuclear Energy Systems & Services Division
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100
100
Corurol 2 1.!a11M,\ax
Log g
Peak: 13.794 0.010
09:12:19.6 Fil Nov032006
Tcstl.!wcl: O.ODOdB Con!rof 2 Z~A: 6.592 PIJls.9: 1 of·c 1 Pulse Polaiil)': +
FPG-TRT-C51-0101 Rev.3
Palso Typa:lmpO<t Roforonco SRS Damping (%}: 5.000 ·
100~~~~~~~~~~~~~~~~~~~~~~
Log
TOSHIBA 5;32980BE RUN NO
Frequency (Hz)
MitJO,Shack Test: TOSHl8A,OSE.005
10 100
SSHCA(NS)
Figure A.2.5.2 TRS for 5th OBE for Horizontal Axis (North to South)
Canlro/ S M°axl•Max
Lag g
Peak 21.555 0.012
09;12;19.6 Fri No~ 03 2000
Test Level: 0.000 dB Pu!se: 1 of 1
Coo1Jol 3 ZPA: 8.330 . Pulse Polarity;+
Pulse Type;lmport Reference SAS Damping(%): 5.C<Xl
0.1 "-----~--~~-~~~~I~'-.-----~-~--~~~----10 100
Frequency (Hz)
VCA TOSHIBA 5~298 OBE RUN#8 .
MIMO Sh0ck Test TOSHIBA_OBE.OOS
FigureA.2.5.3 TRS for 5th OBE for Vertical Axis
IDSHIBA ENERGY SYSTEMS I SOUITIONS CDRPOIIAl'IDN Nuclear Energy Systems & Services Division
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A2.6 SSE
Control Maxl·Max
Log g.
Peak: 14.224 0.010
09:33:54.2 FriNC'(032006
Tosi Level: 0.000 <lll Pulse: 1 of I
100
Cc<llro1 1 iPA". 5.705 Pulse Polamy. t
•r-··-"·-··-··-i·-~-+--+--·-1-·.,-..... _ ..... -·-·+-·-··-t--1---,---1-+-,-·H-·····------··-·"'"-
10
Leg Frequency (Hz)
TOSHIBA 5329Ji SSE AUr1#9
Mll.!0 Shock Test: TOSHIBAoSSE.001 ·
FPG-TRT-C51-0101 Rev.3
Pulso Typo:lmpon Aafercnco SRS Damping (%): 5.000
FBHCA(EW)
100
Figure A.2.6.1 TRS for SSE for Horizontal Axis (East to West)
TaSI~ 0.0JOllB Pul!t,: Id t
Coo:ro! t ZPA::5,705 Piitse-Pclality:;
10 Log Frnqooncy IHi)
. Pu!Sll Typo:lrnport Reference. ~RS [JamJi<,g f%): 5.000
100
Figure A.2.6.l(a) TRS for SSE OBE for Horizontal Axis (East to West)
with EPRI TR-107330 "narrow" RRS and 1/6 octave grid line
lUSIIU EIIER&Y SYSTEMS I SOLUTIONS CORPORATHIN Nuclear Energy Systems & Services Division
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Comrcl Maxl·Max
Log g
Peale 13.901 0.012
09:33:54.2
.2
Fd Nov 03 2006
0.1
Tes\ Level: 0.000 dB Pufso: 1 of 1
'"'
. ·-·-·· ·-··-··-i-·--·
.... : ... ,.
• Control 2 ZPA: 8.513 Pulse P"!arily: +
FPG-TRT-C51-0101 Rev.3
Pulse Typc:lmpcd Refcrenro SRS Drunplng (%): 5.000·
, _ _, --::'.1---,·····- :··-·--·, - -1--·· ·····r·--
' ...... -,t:....; _____ .c..,_ ____ ,, ·! ----·-1---+-+--,--,--,~------t---- --+-+---'---r;---t-·1-
.j ________ -+----·, 1 .. - ... --..... \,---l--1--+-+-+--!-.. -·-----f---.... ;·---~--·t---~-,-·
1--·"""'----,.---·-~: ........ +·· .. -+--f-c-f-c-l--t--:---------1-·--"+----·-+--f---+---i-+··,..,
1
T0Sli1BA 53298 SSE .RLIN 19 .
I I
Frequency (Hz).
Mlt.10 Shock Tes\; 1'0Sfil1!A..SS€.C01
:
10 100
SSHCA(NS)
Figure A.2.6.2 TRS for SSE for Horizontal Axis (North to South)
Log g
Peak:· 28.325, 0.010
09:33:54.2
3
~rl Nov o:3°2006
10 . .: ........ .
, ... . ....... ········-:1'"
A' . "'i'" .1. ... tt ... i
-- -,·
Pulso Type:lmport Reference SAS Damping (%): 5:000
Utll···.1 ·
............. ·!
, ..
_ _L. ....
-1--, ................ ,-J--·---t--.... , .. -;-,----l···"·"i·'·""'I•·""'" ,\ ... ;., .... _ ... ,. ..... -· .....:t. ·--·l···-+ ......... , .. ,., ..... ,· .... , ...... ,: .... ,
.1
I · ! ' t 0.1.. . ._ ___ .....,_ __ ....c._ _ _,_--'---"-'---'-----~---'--~------
.Log
TOSHIBA 53200 SSE' RUN#9 . .
Frequency (Hz)
MIMO Slx>d<TestJOSHIBA_SSE.001
10
VCA
Figure A.2.6.3 TRS for SSE for Vertical Axis
100
TOSIIBA BIER&Y SYSIEIIS I SOLUTIONS CORPDIIAllON Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3
TOSHIBA 53298 ssr; , .. AUN/19
Ch X : TOSHIBA_sse.001.FB_HCA.ulf @ Fn Nov 03 2006 09:33:54.2 ,Ch Y: TOSHIBA._SSE.001.SS_HCA.uff@ Fri Nov 0~2006 09:33:54'2.
·Mfj_ ! '~ IH~ .:::.:1········:········i n]jJ j;~: 0·: , ... ,, .. 2 .. blYcJv/1' .. ,; .... , .... i, ... , ... ,, , ... ,. ·4,·--r, ,.
O 10 20 30 40 50 60 70 80 90 100
-~~WIJI _,.,===== =·,,, ... ,,,. t•· T L '••••l········i· T.L: ...• 1. -200 .
O 10 20 30 40 50 60 70 80 90 100
Figure A.2.6.4 Coherency Plot between Horizontal Axes (East to West and North to
South)
TOSHIBA 53298 SSE· RUN,9
Ch X : TOSHIBA_SSfo.001.FB_HCA.ulf @ Fri Nov 03 2000 09:33:54.2
Figure A.2.6.5 Coherency Plot for Horizontal Axis (East to West) and Vertical Axis
mSIIBA BIER6Y SYSTEMS I SOLUTIOIIS CORPORATION Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3
TOSHIBA 53298 SSE .RUN#9
Ch X :TOSBIOA,__SSE,001.SS HCA.ufl @ Fri Nov 03 2006 09:33:54.2 Ch Y: TOSHIBl\:..SSE.001.\/CA.ufl@ Fil Nov 03 2006 09:33:54.2 .02,--,--,--,------,,--,--;--...:.._,-----,,---i---;;::====::i
· - Coherence 0:15 . -.. ' ..... ' : '~ .......... :
~ Q.1 \·r--0.05 ·:v. ··.w··· ... Huv:·· ·: . ....... ··-···· .. .
- . . . 00'----1-'-0-----'2'-o .___ __ 30_,__, _ ___c.~4,_0 ___ so...._ ___ sL.0---.,,...1.0__.\!.._---1,=----aL.o _ __.:,,_sa::o:__::....Y...J100
200,.------:-"1,--.---.-;:---.----r----:-r----.-:----.--:--====
V~?~,~ 'i 100 O> e.. 0
~ -100 - •
-200L----'----'----_l.---'-'----...L.~~-L----1---L---...1.._--....J ·a
0.8 --
~ 0.6 -- .
0.4 .,. .•.
0.2.
00
10
10
20 . 30
20, 30
40 50
".:.' .. , .. ~. . . : ...... .
40 50 Hz
60
60
70 80 90 100
70 80 90 100
Figure A.2.6.6 Coherency Plot for Horizontal Axis (North to South) and Vertical Axis
Conlrof Acceleration·
Linear .g
Peak:
TestLevel:.O.OOOdB Control l•ZPA: 5;705 Pulse: · 1 of 1 Pulse Polarii\<: +
Pulse Type:fmport R.elerence
10-,------,-----,--------------------I
\
5.077 · .5_ ---· ···--·--f---~ . .L
-5.705
09:33:542 Fri Nov 03 2006
-10.,.i.....,----'------'------'------1----_j_ ____ J._--I
CJ 5000 Linear.
TOSHIBA 53298 SSE RUNM9 .
1e+o4
Time (msec)
MIMO Shock Daia Review: TOSllfBI\..SSE.001·
1.5ef04 2e+04. 2.5e+o4 . ·3e+o4. 32<H04
FBHCA(EW)
Figure A.2.6.7 Time History for SSE for Horizontal Axis (East to West)
1USIIBA BIER&Y SYmlllS I SOLUTIONS CDRPlllATIDN Nuclear Energy Systems & Services Division
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Control 2 AcceleraUon
Linear 9
Peak: 7.377 -ll.513
09:33:54.2 Fri Nov 03 2006
Tesl Level: 0.000 dB Puls.a: 1 of 1
Control 2 ZPA: 8.513 Pulse Polanly: -t
FPG-TRT-C51-0101 Rev.3
Pulse Type:lmport Relerence
10 ~----------~""'--~~.-'--'---~-----------~
o. 5000 Linear
T0SHIBA53298 SSE RUNtt9·
1e+04
Tune_ (msec)
MIMO Shock Data Review: TOSHIBA_SSE.001
·1.5e+04 28+-04 2.5e+04 3e-t04 3.2e+-04
SSHCA(NS)
Figure A.2.6.8 Time History for SSE for Horizontal Axis (North to South)
Control 3 Acceleration
Linear g
Peale 7.458
·8.321
09:33:54.2 Fri Nov032006
Test Level: 0.000 dB ·Pulse: 1 of' · 1
Control 3 ZPA: 8.321 Pulse Polarity: +·
PulseTYP.e:lmport Reference-
10 .. ~--------~----'----1-----------------~
0 . 5000
Linear.
TOSHIBA 53298 SSE RUN#9
.11lfll4 Time(msec)
MIMO Shock Data Review: TOSHIBA_SSE.001
. 1.5e+04 . 2e+04 2.59+04
VCA
Figure A.2.6.9 Time History for SSE for Vertical Axis
3e+04 3.2e+04
lUSIIBA BIEll6Y SYSTEIIS I SOLUTIONS CtJIPORATIDN Nuclear Energy systems & Services Division
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FPG-TRT-C51-0101 Rev.3
TOSHIBA 53298 SSE • RUNff9
Ch X: TOSHIBA::..SSli.001.FB-'cHCA.uff @ Fri Nov 03 2006 09:33:54.2
.,:· : ... -·
0 0 msec Hz
100
Figure A.2.6.10 Time-Interval PSD Coherency Plot, SSE Horizontal Axis (East to West)
TOSHIBA 53298 SSE . RUN#9
Ch X: TOSHIBA.c.SSG.001:SS.cHCA.uff @ Fri Nov 03 2006 09:33:54.2
,.,:-····
100 .
0 msec ·Hz
Figure A.2.6.11 Time-Interval PSD Coherency Plot, SSE Horizontal Axis (North to
South)
TDSIIBA BIER6Y SYSIEIIS I SOLUTIONS CIIIPORAllDN Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3
N f0-:4 ;;£"
"b,
10""'
10_,,
3.5
msec-
TOSHIBA 53298 SSE RUN#9
Ch X : TGSHIBA.:.SSE.001 ;VCA.ulf @ Fri Nov 03 200009:33:54.2
... '~.
0 0 Hz.
Figure A.2.6.12 Time-Interval PSD Coherency Plot, SSE Vertical Axis
TIISJIBA BIER6Y SYSTEMS I SOLUTIONS ctllPORA110N Nuclear Energy Systems & Services Division
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100
FPG-TRT-C51-0101 Rev.3
APPENDIX 8 Test results data for EMC Tests
APPENDIX B Test results data for EMC Tests .................................................................... 94
B.1 Radiated Emission, Magnetic Field (RE101) ............................................................ 95
B.2 Results of Radiated Emission, Electric Field (REl 02) .............................................. 99
B.3 Results of Low Frequency Conducted Emissions (CElOl) ..................................... 100
B.4 Results of High Frequency Conducted Emissions (CE102) .................................... 110
B.5 Results of Radiated Susceptibility, Magnetic Fields (RSlOl) ................................. 112
B.6 Results of High-Frequency Conducted Susceptibility Testing at AC Power Leads
(CS114) ........................................................................................................................... 117
B.7 Results of High-Frequency Conducted Susceptibility (Signal Leads) (CS114) ...... 118
B.8 Results of Conducted Susceptibility (Signal Leads, Bulk cable injection, impulse
excitation) (CSllS) ......................................................................................................... 119
B.9 Results of Conducted Susceptibility (Signal Leads, Damped sinusoidal transients)
(CS116) ........................................................................................................................... 120
B.10 Results of Surge Withstand Capability Testing ...................................................... 121
B.11 Results ofEFT/B Testing ....................................................................................... 122
B.12 Results of ESD Testing .......................................................................................... 123
B.13 Results of Class lE to Non-lE Isolation Testing ................................................... 133
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---- ----------
FPG-TRT-C51-0101 Rev.3
B.1 Radiated Emission, Magnetic Field (RE101)
Table B.1 RE101 Test Matrix Test Point Compliant with Specification
Connector of LVPS Cable #18 Yes
Connector of LVPS Cable #34 Yes
Connector of LVPS Cable #47 Yes
Front Face of LPRM Unit Yes
Back Face of LPRM Unit Yes Top Face of LPRM Unit Yes Bottom Face of LPRM Unit Yes Right Face of LPRM Unit Yes Left Face of LPRM Unit Yes Connector of LPRM Cable #128 Yes Connector of AO Cable #169 Yes Connector of AO Cable #182 Yes Connector of DIO Cable #336 Yes Front Face of LPRM/APRM Unit Yes Back Face of LPRM/APRM Unit Yes Top Face of LPRM/APRM Unit Yes Bottom Face of LPRM/APRM Unit Yes Right Face of LPRM/APRM Unit Yes Left Face of LPRM/APRM Unit Yes Connector of LPRM Cable #105 Yes Connector of AO Cable # 195 Yes Connector of AO Cable # 208 Yes Connector of AO Cable# 215 Yes Connector of DIO Cable #332 Yes Front Face of FLOW Unit Yes Back Face of FLOW Unit Yes Top Face of FLOW Unit Yes Bottom Face of FLOW Unit Yes Right Face of FLOW Unit Yes Left Face of FLOW Unit Yes Connector of FLOW Cables(#139, 140) Yes Connector of AO Cable# 228 Yes Connector of AO Cable #234 Yes Connector of AO Cable # 240 Yes Connector of DIO Cable #333 Yes
IDSHIBA ENERGY SYSTEMS I SOUITIDNS CORPORATION Nuclear Energy Systems & Services Division
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[
[ ML.S1D461E, Ridll1fc1Emissicm RE101
EUT Adive-PCEilknNa 1
FPG-TRT-C51-0101 Rev.3
EQ.ii:meitlD-NRW-IPGA-llasedPRMSy,m,1
s..-1~ t1-00J00011, 00J60015 & OOJ600l3
M:Il!I NIITil:Er -HNU JOO, HNU 100 & HNU ;m
JC0-15Il00
Figure B.1.1 RElOl Data for Connector ofLVPS cable (No,18)
f.SL-S1D-461E, Raclated Em issims RE101
EUTActive-PositiooHo.4
E(Jifrnen!ID-HRW.fPGA-BasedPRMSys!em
Serial #-00360017, 00360015 & 00360013
Mod>I Hunb,r-HNU 300, HNU 100 & HHU 200
JC0-1"53300
1B0.0
150.0
~ 120.0,+-····-·····--·················•·············-·· :---+ -+ -+ +·+-++-----·--··---+···--·--1--··--+--f--lll ;a. ~
" I 90.D+--··--·----+--~··-·--l
a
100.0 1.0K
Fre<p,ncy(Hz)
10.0K
Figure B.1.2 RElOl Data for Front Face ofLPRM Unit
IDSHIBA ENERGY SYS1EMS I SOUITIDNS CORPORATION Nuclear Energy Systems & Services Division
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100.0K
FPG-TRT-C51-0101 Rev.3
[ r,'IL-S1D461E, R3Cl.tec1Emisslan RE101
EUT Adive-PosllklnHo.10
E(JiimentJD -NRW.fPGA.SasedPRMSystem
SEffal #-00360017, 00360015 & 00360013
l.bi,lllunbef -HIIU 300, HtlU 100& HtlU 200
JC0-153300
[
180.0
, .. o-l-----+---+-+---+--l--l---l--1-1----+--+----l-----l----l-----+-l---l-+-----l----l--i----+->-l--+-!-+---i-----+--+-' ~Wc\'!Jl!.~ 10.0 100,0 1.0K 10.0K 100.0K
M:L-SlD-461E, Racl.'te<IEmissicns RE101
EUT Adive-Pmitioollo.14
180.0
30.0
Freq.ency(Hz)
Figure B.1.3 RE101 Data for LPRM Unit Cable (No. 128)
E(JiimentlD -tlRW.fPGA.SasedPRMSystem
Serial#-00360017, 00360015 & 00360013
Mldll llun rer • HNU 300, HNU 100 & HIIU 200
JC0-1"53300
o-l------l-----l--+-+-+-l-+-./-l-----<r--1-+--+-+-+-+++---+--+--+-+-++-i-+-!----+--i---1r--'-i'-'i.-'f'"P--l-'1 10.0
Figure B.1.4 RE101 Data for LPRM/APRM Unit Front Face
mBHIBA ENERGY SYSTEMS I SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3
[ r.lL.S1D-461E. Rad.eel Emisskm RE101
EUTActive-PositiooNo.25
.....
Eq.ipnenf:ID -NRW..ffl GA.8asedPRri,system
SeriaJ#-00360017, OOJG0015& 00360013
~blel Hun b:r - HNU 300, HNU 100 & Hl·IU 200
JCO - lo330-0
~ 120.0-j-· .. ·· .. ··--...... - ......... 1 ..................... , ......... I ...... Jf ..... j. ti j.... ............... . ... j ........... -I " 1---1--! --i -1-1 .. J.......... -===t::=+--.-.L= .. I 1 .. j ...... , .. 1.J .. _____ ............ -... J ........... - ...... 1 al '.!!. .. J so.o+-----· .. ·--1---.. 1---:--,v,
i
100.D 1.DK
frecpn:y(llz)
10.DK
Figure B.1.5 RElOl Data for Flow Unit Front Face
MSHIBA ENERGY fflTEMS I SOUJTIONS CORPORATION Nuclear Energy Systems & Services Division
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100.0K
FPG-TRT-C51-0101 Rev.3
8.2 Results of Radiated Emission, Electric Field (RE102)
e~m-11RW~a>odPR,lS1>-.. S<!fiaj#,«1Zdl017,~&ro!&lll13
~l!,&11).!iGJl!,_£,i,_RE102
Et!TM,'>--H<r--P<m~
~--·IINU:itl),HNU111)&HNU :00 JCO-'l!illXI
[
OM"rT"~------~---,--
nn
l'ji$JJ+---------+--•••i:======4;==,;=.,,+--
J •••+-·---··········-··--····+-···-·····-·-·-····+·--
i M» £i 4&13+--------
"' Si •••+-------+---: ill ·~· I ::: ........ ---------
a._,__ _______ _
wo.:ic----------------l--·--·---1---\.-------1
M+··-·-------+--·--J
Figure B.2.1 Results of REI 02 (Horizontal Antenna Position)
~•~,Ro,bbf£,i,-Rl!102
EIJTA<t,'ili'Ntll'i·V...blAmm~
l!~pmodlO,IIR\\!-fl"Gi\.ll_,,llMSy,t,,m SM!IN,CDSl!Y.)17,fflltro15&oo.l!ial13 ~-1-ll- .JMJ 3'U, HNU l!IJ S. H!-IIJ :00 JCO-'l!il:I)()
,~o,rr--,==c---rr----r---i---r
,~• 1•• t-l.:=->lllllU.!1.l!!c.:.m-1-1---r-- ·-1·· 1-··
i,11.u+--··----
f ••• ill oao+-------:e. s 4•o+---"' .!•llll'f-----;~4.0+---u. jllJl+-----i , .. ~---c
···+-----,
Figure B.2.2 Results of RE 102 (Vertical Antenna! Position)
IDSHIBA ENERGY SYSlEMS & SOUITIONS CORPORATION Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3
8.3 Results of Low Frequency Conducted Emissions (CE101) Table B.3.1 CElOl Test Matrix
Test Point Compliant with Specification
Cable#10 (Line) No (approximately 1 OOHz to approximately 1200Hz, emission exceeds the limit)
Cable#10 (Neutral), No (approximately 1 OOHz to approximately 1200Hz, emission exceeds the limit)
Cable#10 (Ground) Yes
Cable#1 O (Line) with choke-coil (100 mH) Yes
Cable#10 (Neutral) with choke-coil (100 mH) Yes
Cable#10 (Ground) with choke-coil (100 mH) Yes
Cable#10 (Line) with choke-coil (120 mH) Yes
Cable#10 (Neutral) with choke-coil (120 mH) Yes
Cable#10 (Ground) with choke-coil (120 mH) Yes
Table B.3.2 Results of Line without coil
Frequency Peak
CE101 Limit CE101 Relaxed Limit Margin Compliant
Amplitude with (Hz)
(dB micro A) (dB micro A) (dB micro A) (dB micro A)
Specification
60.499 122.9 119.9 122.9 0.0
180.614 122.1 108.8 111.8 10.3
299.465 120.3 103.7 106.7 13.6
419.315 117.5 100.2 103.2 74.3
540.810 113.4 97.7 100.7 12.7
660.572 107.2 95.6 98.6 8.6
780.040 98.6 93.9 96.9 1.7
899.038 96.6 92.5 95.5 1.1
CElOl Relaxed Limit= CElOl Limit+ 20Log(Fundamental Current)
Margin= PeakAmplitude-CElOl RelaxedLimit
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Yes
No No No No No No No
Table B.3.3 Results of Line with 100 mH coil
Frequency Peak CE101 Limit CE101 Relaxed Limit Amplitude (Hz) (dB micro A) (dB micro A) (dB micro A)
60.764 122.5 119.9 122.5
74.188 72.1 117.8 120.5
75.304 66.1 117.7 120.3
76.949 65.8 117.5 120.1
78.095 68.1 117.3 119.9
82.061 65.6 116.8 119.4
84.088 69.4 116.6 119.2
86.496 67.7 116.3 118.9
88.729 66.0 116.0 118.6
90.609 66.3 115.8 118.4
111.230 67.4 113.7 116.4
128.326 68.7 112.3 114.9
180.438 111.2 108.8 111.4
299.876 101.5 103.7 106.3
419.403 94.5 100.2 102.9
530.000 66.3 97.9 100.5
540.927 88.1 97.7 100.3
660.396 81.8 95.6 98.3
779.805 75.7 93.9 96.6
899.273 68.7 92.5 95.1
CE101 Relaxed Limit= CE101 Limit+ 20Log(Fundamental Current)
Margin= Peak Amplitude- CE101 Relaxed Limit
FPG-TRT-C51-0101 Rev.3
Margin Compliant
with (dB micro A) Specification
0.0 Yes
-48.4 Yes
-54.2 Yes
-54.3 Yes
-51.8 Yes
-53.8 Yes
-49.8 Yes
-51.2 Yes
-52.6 Yes
-52.1 Yes
-49.0 Yes
-46.2 Yes
-0.2 Yes
-4.8 Yes
-8.4 Yes
-34.2 Yes
-12.2 Yes
-16.5 Yes
-20.9 Yes
-26.4 Yes
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Table B.3.4 Results ofNeutral with 100 mH coil Frequency
Peak CE101 Limit CE101 Relaxed Limit
(Hz) Amplitude
(dB micro A) (dB micro A) (dB micro A)
60.6 122.7 119.9 122.7
75 69.6 117.7 120.5
77.6 66.5 117.4 120.2
82.5 68.3 116.8 119.6
84.1 64.7 116.6 119.4
86.5 67.2 116.3 119.1
90.3 66.6 115.8 118.6
110.8 66.7 113.8 116.6
125.7 67.1 112.5 115.3
129.1 65.6 112.2 115
132.6 65.1 111.9 114.7
180.4 111.3 108.8 111.6
192.7 71.8 108.1 110.9
299.9 101.5 103.7 106.5
419.4 94.3 100.2 103
530 66 97.9 100.7
540.9 87.8 97.7 100.5
550.5 61.7 97.5 100.3
780 74.9 93.9 96.7
899.5 67.6 92.5 95.3
CE101 Relaxed Limit= CElOl Limit+ 20Log(Fundamental Current)
Margin~ Peale Amplitude - CEl O 1 Relaxed Limit
FPG-TRT-C51-0101 Rev.3
Margin Compliant
(dB micro A) with
Specification
0 Yes
-50.9 Yes
-53.7 Yes
-51.3 Yes
-54.7 Yes
-51.9 Yes
-52 Yes
-49.9 Yes
-48.2 Yes
-49.4 Yes
-49.6 Yes
-0.3 Yes
-39.1 Yes
-5 Yes
-8.7 Yes
-34.7 Yes
-12.7 Yes
-38.6 Yes
-21.8 Yes
-27.7 Yes
IDSHIBA ENERGY SYS1EMS I SOUITIDNS CORPORATION Nuclear Energy Systems & Services Division
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Table B.3.5 Results of Line with 120 mH coil
Frequency Peak
CE101 Limit CE101 Relaxed Limit Amplitude
(Hz) (dB micro A)
(dB micro A) (dB micro A)
60.6· 122.5 119.9 122.5
74.6 65.4 117.8 120.3
76.8 66.6 117.5 120.1
80.9 66.6 117.0 119.5
85.3 67.0 116.4 119.0
87.2 68.0 116.2 118.8
89.9 67.6 115.9 118.4
93.6 65.7 115.5 118.0
110.7 66.9 113.8 116.3
114.2 66.4 113.5 116.0
124.3 65.4 112.6 115.2
131.2 66.1 112.0 114.6
180.4 109.3 108.8 111.4
. 299.9 99.8 103.7 106.2
419.5 92.4 100.2 102.8
530.0 65.3 97.9 100.4
540.9 85.9 97.7 100.2
660.4 79.3 95.6 98.2
779.9 73.0 93.9 96.5
899.3 66.4 92.5 95.1
CEIOl Relaxed Limit= CEIOl Limit+ 20Log(Fundamental Current)
Margin= Peak Amplitude- CElOl Relaxed Limit
FPG-TRT-C51-0101 Rev.3
Margin Compliant
with (dB micro A)
Specification
0.0 Yes
-54.9 Yes
-53.5 Yes
-52.9 Yes
-52.0 Yes
-50.8 Yes
-50.8 Yes
-52.3 Yes
-49.4 Yes
-49.6 Yes
-49.8 Yes
-48.5 Yes
-2.1 Yes
-6.4 Yes
-10.4 Yes
-35.1 Yes
-14.3 Yes
-18.9 Yes
-23.5 Yes
-28.7 Yes
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Table B.3.6 Results of Neutral with 120 mH coil
Frequency Peak Amplitude CE101 Limit CE101 Relaxed
Limit (Hz) (dB micro A) (dB micro A) (dB micro A)
60.8 122.4 119.9 122.4
74.3 70.0 117.8 120.4
75.2 64.7 117.7 120.3
77.4 69.5 117.4 120.0
79.0 64.7 117.2 119.8
80.7 63.7 117.0 119.5
83.7 67.1 116.6 119.2
87.6 65.8 116.2 118.7
125.3 66.4 112.5 115.1
132.1 64.2 112.0 114.5
166.9 64.0 109.6 112.2
180.4 109.3 108.8 111.4
299.9 99.7 103.7 106.2
419.4 92.0 100.2 102.8
530.0 63.3 97.9 100.4
540.9 85.3 97.7 100.2
660.3 78.5 95.6 98.2
780.0 71.8 93.9 96.5
899.3 65.0 92.5 95.1
CElOl Relaxed Limit= CElOl Limit+ 20Log(Fundamental Current)
Margin= Peak Amplitude- CElOl Relaxed Limit
FPG-TRT-C51-0101 Rev.3
Margin Compliant with (dB micro A) Specification
0.0 Yes
-50.4 Yes
-55.6 Yes
-50.5 Yes
-55.1 Yes
-55.8 Yes
-52.1 Yes
-52.9 Yes
-48.7 Yes
-50.3 Yes
-48.2 Yes
-2.1 Yes
-6.5 Yes
-10.8 Yes
-37.1 Yes
-14.9 Yes
-19.7 Yes
-24.7 Yes
-30.1 Yes
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FPG-TRT-C51-0101 Rev.3
40.0 --·-··-·--'---~~~~~'-'-+----~----·---~--~-·-
10.0 100.0 Frequency [Hz]
1.0K 10.0K
Figure B.3.1 Results of CElOl (Line, No coil)
150.0
140.0
130.0
120.0
j 110.0 I .co ~ 1000
I ~ ,, ::I 90.0 .t:: C. c 80.0
~
70.0
60.0
50.0
40.0
10.0 100.0 1.0K 10.0K
Frequency [Hz}
Figure B.3.2 Results of CElOl (Neutral, No coil)
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FPG-TRT-C51-0101 Rev.3
50.0 -l-------+--+--1--1--!-
40.0 +······-·-·-·························'······--··-····-·········'-·····-'
10.0 100.0 Frequency [HzJ
1.0K 10.0K
Figure B.3.3 Results of CE101 (Ground, No coil)
150.0 ~----~~----.----~-~~~-~-c,----,-l---.------,---,--.,
I 140.0 -1------'-----1---1--'--+~-l---+--1------1---+--l---l-'--!----!---J-'-+-----+---!--l----+--i--+--+---'-I
··- ---1-130.0 +-----+--·.__-->--:-
~ 110.0 1----+--+--l--+-i--lHrl--t------"'~"'1-.::---l--t---+-l+-+--t-l-t----CO ::!:_. 100.0 +----+---i---+-+-+--Hrl--t----1-'!+---f--"'!'--..::"'c...-i;:--+--t-l-t---,--t--+-rl---+--1--t--t-H cu
""' :E 9J.o -l----!---1---l-__;_-1---W-!---1-----1-µ_ __ n_-l-l---+.-!---+-!-+-=;,,,,.....---L-+---'---+----+-....,....-'--+__.__,
ii. i 80.0 -1-----+----l--l-----+--!--~...l-+-1-----1-l-l----Fl---411-+llµ.Jl+-+-'-1---+---+--+--+-1 -;!-+I +, --HI
00.0
40.0 · -·---····-
10.0 100.0 1.0K Frequency [Hz]
Figure B.3.4 Results of CE101 (Line, with 100 mH coil addition)
roSHIBA ENERGY SYS11:MS I SOUlflDNS CORPORATION Nuclear Energy Systems & Services Division
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10.0K
FPG-TRT-C51-0101 Rev.3
10.0 100.0 Frequency [Hz] 1.0K
Figure B.3.5 Results of CE101 (Neutral, with 100 mH coil addition)
10.0 100.0 Frequency [Hz]
1.01(
Figure B.3.6 Results of CElOl (Ground, with 100 mH coil addition)
IDSHIBA ENERGY SYSTEMS I SOUITIONS CORPORATION Nuclear Energy Systems & Services Division
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10.0K
10.01<
FPG-TRT-C51-0101 Rev.3
~ iil 110..0 +----+---+----+--i--i-lt-+-+-t---'"""'-,aic:+--..-::--+-+.,Y--+-
"C ~ 100.0 CII
"Cl :I 90.0 :!= C. a 30.0 --;----t---t--+-+-+--tl-H-+---+-1.;---m--111-+11-1-1
70.0 +-----f---+---+----+-+l+-+-t----ll-l+--+H--lH--Hl-+-.1-
60.0
10.0 100.0 Frequency [Hz] 1.0K
Figure B.3.7 Results of CE101 (Line, with 120 mH coil addition)
10.0K
150.0 ~--~----~~~~~----~-~-~--,-~~--,-~.-----,-····----~·-···-···,·······-,--,-_,.~-···,
140.0 +-----+---+--i--+--,-+-+-t-+-----+----+--+--;--+--+-t-------,--+--+-i-+--,--;
120.0 -i-----+---+---i-+--i.\:::/'--+..-J-t-----i----+Afli3Will8le--b6'1eH-bi'f±lli-Kecli00:){1-b,Hffilf---+-+-+-+-+-H -·-···-··r-···············1-t··-1: 1 t! I
~ 110.0 +----+---f---i-+--i-+--+-1-t--""'""-~--+--i--'rl.--+--t-+-+-H----t---t--+-+-+-+-+-H CQ
::!, 100.0 +----+---++--ic--+--i-+--i--t----H-l--i:--::;,-......J"--..-:;-:-+-l--Hf----+--t--CII
"C £ 90.0 +------------+-+--+---+-H---tl---ff--j--f-i--+-f-?-----'-----'--
c. ~ 30.0 +------+----+--f----i-+lc+-;H---i-H---f-t---+tl--t-1-+--;-+-+-1----+---+--,-~---0--,-+-+-1
10.0 100.0 Frequency [Hzl
1.0K 10.0K
Figure B.3.8 Results of CE101 (Neutral, with 120 mH coil addition)
IDSHIBA ENERGY SYSTEMS I SOUITIONS CORPORATION Nuclear Energy Systems & Services Division
108/151
FPG-TRT-C51-0101 Rev.3
~o ~---.----.---r---,----,--.-.,-,-,--------.---.-----,-----.-----.--.-T"""T".,------,--.-------.------,----.----,--,-,---, ---···-·----1----l--l--···-·-1 l·-c--l-H------··-··---l---·---t---+----!-··--l·----l·-·-l--:,--1---·--- ··----·-··-- ·-L_~·-t-··-·1--···l-l
140 -l-----l---+---+----<--+--'----++----l---+----+--i---+-+-+--+-+----t---\---t---'i--1---+-+--t-1
~o +----+---'---+--1-+-+-+++-----+---+----+--+--+-+-+--+-t-----+---t---+-i--f-t--t-t-l ~·-----·····-··-··i-·····---e--·---l- 1--1-t--:-+-1----·-----1----f--·--t--·-·1----1·--1--t-f-t-----------!---+----l-+--f--t-t-H
uo+----+---+---+--1i-,...d:--+++----+--:--:-:--t,f-:-:--i::--+-:--t=l:-:+:tt--:---:--:--:-:-l:--:::--1_!---±::::-:+:-:r.t:T--H ':.' r-----+--+---+-+-+-!-r-..._,;::,,-"'-l-.=-----+-"All.o.wable.lLeYl1et Cl JJ, ll
1E _elaxe_d..L.imi )_(S.ame_asJ:EJ 1Lioi10. ~ ..., I I -........ I I I
:I 110 1 I :::::b..___LI I - I ! !8 i I --r-..--i--rt~-- Allowab e Leve (CBIOI Girilt- ~ -~
100 I j !"'""- j / I i
,, I I I I ,....., ~ I f : +----+---+---+-'---··!-·······_····}·_·-+-I++++-+· -·_··--_--_···_·······_········_········+-······_········_-·····-_l,----·-+·1-_····· ·-+···· l_·······+--f-+++---+---!----t--+--1-+---1--+··--H·-·'·--
~ m -~ - --.t~ i--i:- -i;r,--' --
:-i----+--+--:-t·-.--·~--·+_-~"~J.-i.T ~~-rr 10.0 1000
Frequency [Hz] 1 OK 100K
Figure B.3.9 Results of CElOl (Ground, with 120 mH coil addition)
IDSHIBA ENERGY SYS1EMS I SOUJTIDNS CORPORATION Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3
8.4 Results of High Frequency Conducted Emissions (CE102)
Table B4 CE102 Test Matrix
Test Point
Cable#1 O(Line)
Cable#1 O(Neutral)
Cable#1 O(Ground)
[ J•.c ML.SID461E, ~EmlssicnsCE102Re&lls 10kHz-10fvllz
EUT Adive Resutsfa- Ure L1
eo.o
> &) 10.0+--.. --·-·--V-----'-<~ ................ , ............... , ............. +.";" .... , ...... .
~ -a 60.Q+-----------<---+---.,..--,-c-111,-;i l ... ,+------!---!--+--+-!-
Compliant with Specification
Yes
Yes
Yes
100.QK 1~M
FigureB.4.1 Results ofCE102 (Line)
EcµpmrtlD-NRW-IPGA-BasedPRMSystem S11 lalli'-OCWI017, OOJl'OOIS& 003{1)()13 r.tx.l><i'Q>armlal-HNU JOO, HNU 100& HNU 200 JC0-153300
10.0M
mBHIBA ENERGY SYSTEMS I SOUlflDNS CORPORATION Nuclear Energy Systems & Services Division
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[
[ Ja,c 1nL-S1D-l61E. C<nll:IEdEmlssirn;, CE102 Resuts 10 l<llz-10 ~Hz
EUTAcliwReslllsfcr Urel2
- -CE102 ,J C leJd B A.:tiv~
120.0
110.0 ~ ................................. , .........
100.0 - -90.0 --. . ,z:,:·
··--~'\"' -· -.. --
80.0
> tS 70.0
,rr; l''r,
........... - ....
~ i 60.0
t 50.0
40.0
30. 0
20. 0
10. 0
0 10.0K
tttJ=~ A . I ,.__ ~
!. n IU ·-:,Tl ,JI l"•· LJ,~ ''l'I \
I I
10 .OK
. , .. ., Cl
.................
' .1 7 ·x·-........ .................
; i
FPG-TRT-C51-0101 Rev.3
- ..
.................
, .......................... 1. M
E(Jlpnl!tlD -NRW-ll'GA-BasooPRM Symn Serial #-00Jro017, 00360015 & 00360013 M:xlld(lp,rmi<n-HNU 300, HNU 100& HNU 200 JC0-15lll0
.......
' ........................ .......... ~j;~;8J~FH
'
I
' ........... , ......... '
' 10.0 M
Figure B.4.2 Results of CEI02 (Neutral)
t/lL-SlD-461E Caru:tedEmisskm, CE102 101<1lz-10 P.flz USN C
EUT ActiveResutsfcr Ural:!
EqiµmrtlD -NRW-ll'GA-BasooPRM S)'&flll Se-iol #-OOJWOf/, OOJW015 & O!OO'.X)1J M:xlld0p,r!licn-HNU300, HNU 100&HNU200 JCO-T53JOO
110.0 -·.CE102· I
110.0 - C le;id C Active-I
100A - -so.o , ....... ................. . ............... ................
ao.o
> ffi 70.0
:l!. ~.,, ........... ; .... .................. ,_ .. -. Q 60.0 i t 50.0
40.0 ~-·--- ... ............. , ......
30.0 ~---
20.0
10.0
• 10.0K
'
=: -
-! I I
I ...
....
'tr I 111\1.J~hlP. µuµ
I I ' .. , ..... , ....... ..... .. .....
-k. I ,,. ................. , .................. . ...... , ....... --'-.
.............. ......... , .. l<'E ,,n IT~
~ .......... ........... ·:.; i
, ........
. '" I
I
I I , .............. .........
I I
' i a ....... i I
i I I I I ; i I ' I ' I !
100.0K ,!,,
Figure B.4.3 Results of CEI02 (Ground)
IDSHIBA ENERGY SYS1EMS I SDUJTIDNS CORPORATION Nuclear Energy Systems & Services Division
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, ........ ...... , ........ , ..
, ....... i
, ....
I I i I
10.0 u
FPG-TRT-C51-0101 Rev.3
8.5 Results of Radiated Susceptibility, Magnetic Fields (RS101)
Table BS Summary of test results for RS 101
Test Points Test Specimen Operation Compliant with Specification
Connector of LVPS Cable #18 Within the required tolerance of the normal
Yes operation
Connector of LVPS Cable #34 Within the required tolerance of the normal
Yes operation
Connector of LVPS Cable #47 Within the required tolerance of the normal
Yes operation
116mm from the left edge and 89 mm Within the required tolerance of the normal from bottom edge on the front Panel operation Yes of LPRM Unit 116mm from the right edge and 89 Within the required tolerance of the normal mm from bottom edge on the front operation Yes panel of LPRM Unit 116mm from the left edge and 89 mm Within the required tolerance of the normal from bottom edge on the back Panel operation Yes of LPRM Unit 116mm from the right edge and 89 Within the required tolerance of the normal mm from bottom edge on the back operation Yes panel of LPRM Unit 111 mm from the front panel and 89 Within the required tolerance of the normal mm from the bottom edge on the operation Yes right side wall of LPRM Unit 111 mm from the back panel and 89 Within the required tolerance of the normal mm from the bottom edge on the operation Yes right side wall of LPRM Unit 111 mm from the front panel and 89 Within the required tolerance of the normal mm from the bottom edge on the left operation Yes side wall of LPRM Unit 111 mm from the back panel and 89 Within the required tolerance of the normal mm from the bottom edge on the left operation Yes side wall of LPRM Unit 111 mm from the front panel and 116 Within the required tolerance of the normal mm from the right side wall on the operation Yes upper surface of LPRM Unit 111 mm from the front panel and 116 Within the required tolerance of the normal mm from the left side wall on the operation Yes upper surface of LPRM Unit 111 mm from the back panel and 116 Within the required tolerance of the normal mm from the right side wall on the operation Yes upper surface of LPRM Unit
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FPG-TRT-C51-0101 Rev.3
Test Points Test Specimen Operation Compliant Specification
111 mm from the back panel and 116 Within the required tolerance of the normal mm from the left side wall on the operation Yes upper surface of LPRM Unit 111 mm from the front panel and 116 Within the required tolerance of the normal mm from the right side wall on the operation Yes bottom surface of LPRM Unit 111 mm from the front panel and 116 Within the required tolerance of the normal mm from the left side wall on the operation Yes bottom surface of LPRM Unit 111 mm from the back panel and 116 Within the required tolerance of the normal
mm from the right side wall on the operation Yes bottom surface of LPRM Unit
111 mm from the back panel and 116 Within the required tolerance of the normal mm from the left side wall on the operation Yes
bottom surface of LPRM Unit
Connector of LPRM Cable #128 Within the required tolerance of the normal
Yes operation
Connector of AO Cable #169 Within the required tolerance of the normal
Yes operation
Connector of AO Cable #182 Within the required tolerance of the normal
Yes operation
Connector of DIO Cable #336 Within the required tolerance of the normal
Yes operation
116mm from the left edge and 89 mm Within the required tolerance of the normal from bottom edge on the front Panel operation Yes
of LPRM/APRM Unit 116mm from the right edge and 89 Within the required tolerance of the normal mm from bottom edge on the front operation Yes
panel of LPRM/APRM Unit 116mm from the left edge and 89 mm Within the required tolerance of the normal from bottom edge on the back Panel operation Yes
of LPRM/APRM Unit 116mm from the right edge and 89 Within the required tolerance of the normal mm from bottom edge on the back operation Yes
panel of LPRM/APRM Unit 111 mm from the front panel and 89 Within the required tolerance of the normal
mm from the bottom edge on the operation Yes right side wall of LPRM/APRM Unit 111 mm from the back panel and 89 Within the required tolerance of the normal
mm from the bottom edge on the operation Yes right side wall of LPRM/APRM Unit 111 mm from the front panel and 89 Within the required tolerance of the normal mm from the bottom edge on the left operation Yes
side wall of LPRM/APRM Unit
IDSHIBA ENERGY SYSTEMS I SDUITIDNS CORPORATION Nuclear Energy Systems & Services Division
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with
FPG-TRT-C51-0101 Rev.3
Test Points Test Specimen Operation Compliant with Specification
111 mm from the back panel and 89 Within the required tolerance of the normal mm from the bottom edge on the left operation Yes
side wall of LPRM/APRM Unit 111 mm from the front panel and 116 Within the required tolerance of the normal
mm from the right side wall on the operation Yes upper surface of LPRM /APRM Unit 111 mm from the front panel and 116 Within the required tolerance of the normal
mm from the left side wall on the operation Yes upper surface of LPRM /APRM Unit
111 mm from the back panel and 116 Within the required tolerance of the normal mm from the right side wall on the operation Yes upper surface of LPRM/APRM Unit
111 mm from the back panel and 116 Within the required tolerance of the normal mm from the left side wall on the operation Yes
upper surface of LPRM /APRM Unit
111 mm from the front panel and 116 Within the required tolerance of the normal mm from the right side wall on the operation Yes
bottom surface of LPRM /APRM Unit 111 mm from the front panel and 116 Within the required tolerance of the normal
mm from the left side wall on the operation Yes bottom surface of LPRM/APRM Unit 111 mm from the back panel and 116 Within the required tolerance of the normal
mm from the right side wall on the operation Yes bottom surface of LPRM/APRM Unit 111 mm from the back panel and 116 Within the required tolerance of the normal
mm from the left side wall on the operation Yes bottom surface of LPRM /APRM Unit
Connector of LPRM Cable #105 Within the required tolerance of the normal
Yes operation
Connector of AO Cable # 195 Within the required tolerance of the normal
Yes operation
Connector of AO Cable # 208 Within the required tolerance of the normal
Yes operation
Connector of AO Cable# 215 Within the required tolerance of the normal
Yes operation
Connector of DIO Cable #332 Within the required tolerance of the normal
Yes operation
116mm from the left edge and 89 mm Within the required tolerance of the normal from bottom edge on the front Panel operation Yes
of FLOW Unit 116mm from the right edge and 89 Within the required tolerance of the normal mm from bottom edge on the front operation Yes
panel of FLOW Unit
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Test Points Test Specimen Operation Compliant Specification
116mm from the left edge and 89 mm Within the required tolerance of the normal from bottom edge on the back Panel operation Yes
of FLOW Unit 116mm from the right edge and 89 Within the required tolerance of the normal mm from bottom edge on the back operation Yes
panel of FLOW Unit 111 mm from the front panel and 89 Within the required tolerance of the normal
mm from the bottom edge on the operation Yes right side wall of FLOW Unit
111 mm from the back panel and 89 Within the required tolerance of the normal mm from the bottom edge on the operation Yes
right side wall of FLOW Unit 111 mm from the front panel and 89 Within the required tolerance of the normal mm from the bottom edge on the left operation Yes
side wall of FLOW Unit 111 mm from the back panel and 89 Within the required tolerance of the normal mm from the bottom edge on the left operation Yes
side wall of FLOW Unit 111 mm from the front panel and 116 Within the required tolerance of the normal
mm from the right side wall on the operation Yes upper surface of FLOW Unit
111 mm from the front panel and 116 Within the required tolerance of the normal mm from the left side wall on the operation Yes
upper surface of FLOW Unit 111 mm from the back panel and 116 Within the required tolerance of the normal
mm from the right side wall on the operation Yes upper surface of FLOW Unit
111 mm from the back panel and 116 Within the required tolerance of the normal mm from the left side wall on the operation Yes
upper surface of FLOW Unit 111 mm from the front panel and 116 Within the required tolerance of the normal
mm from the right side wall on the operation Yes bottom surface of FLOW Unit
111 mm from the front panel and 116 Within the required tolerance of the normal mm from the left side wall on the operation Yes bottom surface of FLOW Unit
111 mm from the back panel and 116 Within the required tolerance of the normal mm from the right side wall on the operation Yes
bottom surface of FLOW Unit 111 mm from the back panel and 116 Within the required tolerance of the normal
mm from the left side wall on the operation Yes bottom surface of FLOW Unit
Connector of FLOW Cables Within the required tolerance of the normal Yes
(#139,149) operation
Connector of AO Cable # 228 Within the required tolerance of the normal
Yes operation
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Test Points Test Specimen Operation Compliant with Specification
Connector of AO Cable #234 Within the required tolerance of the normal
Yes operation
Connector of AO Cable # 240 Within the required tolerance of the normal
Yes operation
Connector of DIO Cable #333 Within the required tolerance of the normal
Yes operation
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8.6 Results of High-Frequency Conducted Susceptibility Testing at AC Power Leads (CS 114)
Table B6 Summary of test results for CS 114 (Power)
Test Points Test Specimen Operation Compliant with Specification
Cable#9 and Cable#10 Within the required tolerance of the normal Yes
simultaneously operation
Cable #10 only Within the required tolerance of the normal
Yes operation
'L' lead of Cable #10 only Within the required tolerance of the normal
Yes operation
Note: Cable 9 is the Chassis ground. Cable 10 is the Chassis Power Lme (Hot), Neutral, and Ground Lines.
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B. 7 Results of High-Frequency Conducted Susceptibility (Signal Leads) (CS114)
Table B7 Summary of test results for CS 114 (Signal)
Test Points Test Specimen Operation Compliant Specification
Bundle of LPRM Cables Within the required tolerance of the normal Yes (#123~#134) operation
Bundle of LPRM Cables (#101 ~ Within the required tolerance of the normal Yes #110) operation Bundle of FLOW Cables Within the required tolerance of the normal Yes (#139,140) operation
DIO Cable #332 Within the required tolerance of the normal Yes operation
DIO Cable#333 Within the required tolerance of the normal Yes operation
DIO Cable #336 Within the required tolerance of the normal Yes operation
Bundle of AO Cables Within the required tolerance of the normal Yes (#169, #195 and #228) operation Bundle of AO Cables Within the required tolerance of the normal Yes (#208 and #234) operation Bundle of AO Cables Within the required tolerance of the normal Yes (#182, #215 and #240) operation
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8.8 Results of Conducted Susceptibility (Signal Leads, Bulk cable injection, impulse excitation) (CS115)
Table B8 Summary of test results for CS 115
Test Points Test Specimen Operation Compliant Specification
Bundle ofLPRM Cables Within the required tolerance of the normal Yes (#123"-'#134) operation
Bundle of LPRM Cables (#101 Within the required tolerance of the normal Yes "-'#110) operation Bundle of FLOW Cables Within the required tolerance of the normal Yes (#139,140) operation
DIO Cable #332 Within the required tolerance of the normal Yes operation
DIO Cable #333 Within the required tolerance of the normal Yes operation
DIO Cable #336 Within the required tolerance of the normal Yes operation
Bundle of AO Cables Within the required tolerance of the normal Yes (#169, #195 and #228) operation Bundle of AO Cables Within the required tolerance of the normal Yes (#208 and #234) operation Bundle of AO Cables Within the required tolerance of the normal Yes (#182, #215 and #240) operation
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8.9 Results of Conducted Susceptibility (Signal Leads, Damped sinusoidal transients) (CS 116)
Table B9 Summary of test results for CS 116 ; Compliant with Test Points Test Specimen Operation
Specification Bundle of LPRM Cables Within the required tolerance of the normal
Yes (#123-#134) operation Bundle of LPRM Cables Within the required tolerance of the normal Yes (#101-#110) operation Bundle of FLOW Cables Within the required tolerance of the normal Yes (#139,140) operation
010 Cable #332 Within the required tolerance of the normal Yes operation
DIO Cable #333 Within the required tolerance of the normal Yes operation
010 Cable #336 Within the required tolerance of the normal Yes operation
Bundle of AO Cables Within the required tolerance of the normal Yes (#169, #195 and #228) operation Bundle of AO Cables Within the required tolerance of the normal Yes (#208 and #234) operation Bundle of AO Cables Within the required tolerance of the normal Yes (#182, #215 and #240) operation
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8.10 Results of Surge Withstand Capability Testing
Table B 10.1 Summary of test results for Surge Withstand Capability (Ring wave)
Test Points Test Specimen Operation Compliant with Specification
'Line' and 'Neutral' Within the required tolerance of the normal
Yes operation
'Line' and 'Ground' Within the required tolerance of the normal Yes operation
'Neutral' and 'Ground' Within the required tolerance of the normal Yes operation
['Line' & 'Neutral'] and 'Ground' Within the required tolerance of the normal Yes operation
Note: The ring wave test was expected to be performed with 12 0 coupling impedance. This is the default setting of the test equipment and the most likely scenario. However, this is not described in the record and it cannot be reconfirmed that the test was performed with 12 0, not 30 0. If the possibility that the test was performed with 30 0 cannot be fully denied, in this possibility, the test results are not confirmed against 12 0 that brings more energy to the test specimen. Toshiba considers that it should be assumed that 30 0 was applied for the test to take conservative position for the appropriate evaluation in a situation where the impedance value cannot be confirmed. Toshiba considers that the assumption of 30 0 is appropriate, because the PRM is designed to be connected to the end of the power supply system in nuclear power plants. Therefore, Toshiba assumes either impedance is workable, and·that the higher impedance would not impact the surge withstand capabilities of the PRM.
Table BI0.2 Summary oftest results for Surge Withstand Capability (Combination Wave)
Test Points Test Specimen Operation Compliant Specification
'Line' and 'Neutral' Within the required tolerance of the normal
Yes operation
'Line' and 'Ground' Within the required tolerance of the normal Yes operation
'Neutral' and 'Ground' Within the required tolerance of the normal Yes operation
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B.11 Results of EFT/B Testing Table B 11 Summary of test results for EFT /B
Test Points Test Specimen Operation Compliant with Specification
'Line' Within the required tolerance of the normal
Yes operation
'Neutral' Within the required tolerance of the normal Yes operation
Ground' Within the required tolerance of the normal Yes operation
Line', 'Neutral' and 'Ground' Within the required tolerance of the normal Yes simultaneous operation
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B.12 Results of ESD Testing
Table B12 Test Results ofESD Test (1/9) Test Levels
Test Point without any Compliant with
Note temporary Specification degradations
LPRM Unit Contact Discharge On the right edge on the front surface of the +8kV
Yes chassis of LPRM Unit -8kV On the left edge on the front surface of the +8kV Yes chassis of LPRM Unit -8kV
On the top of the status module front panel +8kV Yes -8kV
On the mode key switch of LPRM module in +8kV Yes FSL-7 -8kV On the mode key switch of LPRM module in +8kV Yes FSL-1 -8kV
On the bottom of the status module front panel +8kV Yes -BkV
On the mode key switch of LPRM module in +8kV Yes FSL-12 -8kV On the surface of the connector of the signal +8kV Yes cable (No. 123) connected to the LPRM Unit -8kV On the surface of the connector of the optical +8kV Yes cable (No. 328) connected to the LPRM Unit -8kV On the fixing screw of the connector of the signal +8kV Yes cable (No. 169) connected to the LPRM Unit -8kV
On the fixing screw of the connector of the signal +8kV Yes cable (No. 182) connected to the LPRM Unit -8kV
On the fixing screw of the connector of the signal +8kV Yes cable (No. 336) connected to the LPRM Unit -BkV
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Table B12 Test Results ofESD Test (2/9) Test Levels without
Compliant with Test Point any temporary Note degradations
Specification
LPRM Unit Air Discharge
On the "RESET" switch of the status module +15kV
Yes -15kV
On the upper side 3 digits LED indicator of +15kV Yes
LPRM module in FSL-1 -15kV On the lower side 3 digits LED indicator of +15kV
Yes LPRM module in FSL-1 -15kV On the mode "SELECT" switch of LPRM +15kV
Yes module in FSL-1 -15kV
On the"+" switch of LPRM module in FSL-1 +15kV
Yes -15kV
On the "-" switch of LPRM module in FSL-1 +15kV
Yes -15kV
On the"~" switch of LPRM module in FSL-1 +15kV
Yes -15kV
On the "RESET" switch of LPRM module in +15kV Yes
FSL-1 -15kV On the "SET" switch of LPRM module in +15kV
Yes FSL-1 -15kV On the upper side 3 digits LED indicator of +15kV
Yes LPRM module in FSL-7 -15kV On the lower side 3 digits LED indicator of +15kV
Yes LPRM module in FSL-7 -15kV On the mode "SELECT" switch of LPRM +15kV
Yes module in FSL-7 -15kV
On the"+" switch of LPRM module in FSL-7 +15kV
Yes -15kV
On the"-" switch of LPRM module in FSL-7 +15kV
Yes -15kV
On the"~" switch of LPRM module in FSL-7 +15kV
Yes -15kV
On the "RESET" switch of LPRM module in +15kV Yes
FSL-7 -15kV
On the "SET" switch of LPRM module in +15kV Yes
FSL-7 -15kV
On the upper side 3 digits LED indicator of +15kV Yes
LPRM module in FSL-12 -15kV
On the lower side 3 digits LED indicator of +15kV Yes
LPRM module in FSL-12 -15kV
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Table B 12 Test Results of ESD Test (3/9)
Test Point Test Levels without any Compliant with
Note temporary deQradations Specification LPRM Unit Air Dischari:te (Continued) On the mode "SELECT" switch of LPRM +15kV
Yes module in FSL-12 -15kV
On the"+" switch of LPRM module in FSL-12 +15kV
Yes -15kV
On the"-" switch of LPRM module in FSL-12 +15kV
Yes -15kV
On the"~" switch of LPRM module in FSL-12 +15kV
Yes -15kV
On the "RESET" switch of LPRM module in +15kV Yes
FSL-12 -15kV On the "SET" switch of LPRM module in +15kV
Yes FSL-12 -15kV On the surface of the connector of the power +15kV
Yes cable connected to the LVPS-1 module -15kV On the surface of the connector of the power +15kV
Yes cable connected to the LVPS-2 module -15kV LPRM Unit Indirect Dischari:te
Left vertical side of the LPRM Unit +BkV Yes -BkV
Right vertical side of LPRM Unit +BkV Yes -BkV
Back vertical side of LPRM Unit +BkV Yes -BkV
Front vertical side of LPRM Unit +BkV Yes -BkV
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Table B12 Test Results ofESD Test (4/9) Test Levels
Compliant Test Point without any
with Note temporary Specification
degradations LPRM/APRM Unit Contact Discharge On the right edge on the front surface of the +BkV Yes chassis of LPRM/APRM Unit -BkV On the left edge on the front surface of the +BkV Yes chassis of LPRM/APRM Unit -BkV
On the top of the status module front panel +BkV Yes -SkV
On the bottom of the status module front panel +BkV Yes -BkV
On the mode key switch of LPRM module in +BkV Yes FSL-1 -BkV On the mode key switch of LPRM module in +BkV Yes FSL-10 -BkV
On the mode key switch of APRM module in +BkV Yes FSL-11 -BkV On the surface of the connector of the signal
+BkV Yes cable (No. 101) connected to the
-BkV LPRM/APRM Unit
On the surface of the connector of the optical Yes Temporary
cable (No. 330) connected to the +2kV Degradation was -2kV observed at +4/-4
LPRM/APRM Unit kV levels
On the fixing screw of the connector of the Yes +BkV
signal cable (No. 195) connected to the -BkV
LPRM/APRM Unit
On the fixing screw of the connector of the Yes signal cable (No. 208) connected to the +BkV LPRM/APRM Unit -BkV
On the fixing screw of the connector of the Yes Temporary signal cable (No. 215) connected to the +4kV Degradation was LPRM/APRM Unit -4kV observed at +6/-6
kV levels
On the fixing screw of the connector of the Yes Temporary +OkV Degradation was
signal cable (No. 332) connected to the -4kV observed at +2/-4
LPRM/APRM Unit kV levels
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Table Bl2 Test Results ofESD Test (5/9) Test Levels without
Compliant with Test Point any temporary Note degradations Specification
LPRM/APRM Unit Air Discharae On the "RESET" switch of the status +15kV
Yes module -15kV On the upper side 3 digits LED +15kV
Yes indicator of LPRM module in FSL-1 -15kV On the lower side 3 digits LED indicator +15kV
Yes of LPRM module in FSL-1 -15kV On the mode "SELECT" switch of +15kV
Yes LPRM module in FSL-1 -15kV On the "+" switch of LPRM module in +15kV
Yes FSL-1 -15kV On the "-" switch of LPRM module in +15kV
Yes FSL-1 -15kV On the ...... switch of LPRM module in +15kV
Yes FSL-1 -15kV On the "RESET" switch of LPRM +15kV
Yes module in FSL-1 -15kV On the "SET" switch of LPRM module +15kV
Yes in FSL-1 -15kV On the upper side 3 digits LED +15kV
Yes indicator of LPRM module in FSL-10 -15kV On the lower side 3 digits LED indicator +15kV
Yes of LPRM module in FSL-10 -15kV On the mode "SELECT" switch of +15kV
Yes LPRM module in FSL-10 -15kV On the "+" switch of LPRM module in +15kV
Yes FSL-10 -15kV On the "-" switch of LPRM module in +15kV
Yes FSL-10 -15kV On the ...... switch of LPRM module in +15kV
Yes FSL-10 -15kV On the "RESET" switch of LPRM +15kV
Yes module in FSL-10 -15kV On the "SET" switch of LPRM module +15kV
Yes in FSL-10 -15kV On the upper side 3 digits LED +15kV
Yes indicator of APRM module in FSL-11 -15kV On the middle side 3 digits LED +15kV
Yes indicator of APRM module in FSL-11 -15kV On the lower side 3 digits LED indicator +15kV
Yes of APRM module in FSL-11 -15kV
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Table B12 Test Results ofESD Test (5/9) Test Levels without
Compliant with Test Point any temporary Note
deoradations Specification
LPRM/APRM Unit Air Discharae On the "mode SELECT" switch of +15kV
Yes APRM module in FSL-11 -15kV
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Table B12 Test Results ofESD Test (6/9) Test Levels without
Compliant with Test Point any temporary Note
degradations Specification
LPRM/APRM Unit Air Discharge (Continued)
On the upper "SELECT" switch of APRM +15kV Yes module in FSL-11 -15kV
On the lower "SELECT" switch of APRM +15kV Yes module in FSL-11 -15kV
. On the"+" switch of APRM module in FSL-11 +15kV
Yes -15kV
On the"-" switch of APRM module in FSL-11 +15kV
Yes -15kV
On the"~" switch of APRM module in FSL-11 +15kV
Yes -15kV
On the "RESET" switch of APRM module in +15kV Yes FSL-11 -15kV
On the "SET" switch of APRM module in +15kV Yes FSL-11 -15kV
On the surface of the connector. of the power +15kV Yes cable connected to the LVPS-1 module -15kV
On the surface of the connector of the power +15kV Yes cable connected to the LVPS-2 module -15kV
LPRM/APRM Unit Indirect Discharge
Left vertical side of the LPRM/APRM Unit +8kV
Yes -8kV
Right vertical side of LPRM/APRM Unit +8kV
Yes -8kV
Back vertical side of LPRM/APRM Unit +8kV
Yes -8kV
Front vertical side of LPRM/APRM Unit +8kV
Yes -8kV
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Table B12 Test Results ofESD Test (7/9) Test Levels
Test Point without any Compliant with Note
temporary Specification degradations
FLOW Unit Contact Dischan:1e
On the right edge on the front surface of the +8kV Yes chassis of FLOW Unit -8kV ·.
On the left edge on the front surface of the +8kV Yes
chassis of FLOW Unit -8kV
On the top of the status module front panel +8kV
Yes -8kV
On the bottom of the status module front panel +8kV
Yes -8kV
On the mode key switch of FLOW module in +8kV Yes
FSL-12 -8kV On the surface of connector of the signal cable +8kV (No. 139 and No.140) connected to the FLOW
-8kV Yes
Unit Temporary
On the surface of the connector of the optical +4kV Yes
Degradation was cable (No. 330) connected to the FLOW Unit -2kV observed at +6/-4 kV
levels
On the fixing screw of the connector of the signal +8kV Yes
cable (No. 228) connected to the FLOW Unit -8kV
On the fixing screw of the connector of the signal +8kV Yes
cable (No. 234) connected to the FLOW Unit -8kV
On the fixing screw of the connector of the signal +8kV Yes
cable (No. 240) connected to the FLOW Unit -8kV
On the fixing screw of the connector of the signal +8kV Yes cable (No. 333) connected to the FLOW Unit -8kV
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Table B12 Test Results ofESD Test (8/9) Test Levels without
Compliant with Test Point any temporary Note
degradations Specification
FLOW Unit Air Discharge On the "RESET" switch of the status +15kV
Yes module -15kV On the upper side 3 digits LED indicator +15kV
Yes of FLOW module in FSL-12 -15kV On the middle side 3 digits LED indicator +15kV
Yes of FLOW module in FSL-12 -15kV On the bottom side 3 digits LED indicator +15kV
Yes of FLOW module in FSL-12 -15kV On the "+" switch of FLOW module in +15kV
Yes FSL-12 -15kV On the "-" switch of FLOW module in +15kV
Yes FSL-12 -15kV On the "~" switch of FLOW module in +15kV
Yes FSL-12 -15kV On the "RESET" switch of FLOW module +15kV
Yes in FSL-12 -15kV On the "SET" switch of FLOW module in +15kV
Yes FSL-12 -15kV On the "SELECT" switch of SQ-ROOT +15kV
Yes module in FSL-11 -15kV On the "mode SELECT" switch of FLOW +15kV
Yes module in FSL-12 -15kV
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Table B12 Test Results ofESD Test (9/9)
Test Point Test Levels without any Compliant with Note
temporary degradations Specification FLOW Unit Air Discharge (Continued) On the upper side 3 digits LED +15kV indicator of SQ-ROOT module in Yes FSL-11 -15kV
On the lower side 3 digits LED +15kV indicator of SQ-ROOT module in Yes FSL-11 -15kV
On the "RESET" switch of SQ-ROOT +15kV Yes module in FSL-11 -15kV
On the volume knob of SQ-ROOT +15kV Yes module in FSL-11 -15kV
On the surface of the connector of +15kV the power cable connected to the Yes LVPS-1 module -15kV
On the surface of the connector of +15kV the power cable connected to the
-15kV Yes
LVPS-2 module FLOW Unit Indirect Discharge
Left vertical side of the FLOW Unit +8kV
Yes -8kV
Right vertical side of FLOW Unit +8kV
Yes -8kV
Back vertical side of FLOW Unit +8kV
Yes -8kV
Front vertical side of FLOW Unit +8kV
Yes -8kV
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8.13 Results of Class 1 E to Non-1 E Isolation Testing
Table BI3.I Summary oftest results for Class IE to Non-IE Isolation for 600VAC
Test Points Test Specimen Operation Compliant with Specification
Between pin D and pin K of the output connector { ]" c Within the required tolerance of the normal
Yes [ Jot HNS518 AO module operation installed in BSL 1 of LPRM Unit Between pin N and pin T of the output connector { ]" c Within the required tolerance of the normal
Yes [ Jot H NS515 AO module operation installed in BSL3 of LPRM Unit
Between pin JJ and pin PP of the output connector { ]"
C
[ Jot HNS518 AO module Within the required tolerance of the normal
Yes installed 'in BSL 1 of LPRM/APRM
operation
Unit
Between pin JJ and pin PP of the Within the required tolerance of the normal output connector { ]" c operation [ Jot HNS516 AO module Yes installed in BSL2 of LPRM/APRM Unit Between pin A and pin E of the Within the required tolerance of the normal output connector { ]" c operation [ Jot HNS515 AO module Yes installed in BSL3 of LPRM/APRM Unit Between pin L and pin R of the output connector { ]"
C
[ Jot HNS518 AO module Within the required tolerance of the normal
Yes installed in BSL 1 of FLOW Unit
operation
Between pin L and pin R of the output connector { ]" c Within the required tolerance of the normal
Yes [ Jot HNS516 AO module operation installed in BSL2 of FLOW Unit Between pin L and pin R of the Yes output connector { ]" c Within the required tolerance of the normal [ Jot HNS517 AO module operation installed in BSL3 of FLOW Unit
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Table B13.2 Summary oftest results for Class lE to Non-IE Isolation for 250VDC
Test Points Test Specimen Operation Compliant · Specification
Between pin D and pin K of the output connector ( ]" c Within the required tolerance of the normal
Yes [ Jot HNS518 AO module operation installed in BSL 1 of LPRM Unit Between pin N and pin T of the output connector ( ]" c Within the required tolerance of the normal
Yes [ Jof HNS515 AO module operation installed in BSL3 of LPRM Unit
Between pin JJ and pin PP of the output connector ( ]"
C
[ Jof HNS518 AO module Within the required tolerance of the normal
Yes installed in BSL 1 of LPRM/APRM
operation
Unit
Between pin JJ and pin PP of the Within the required tolerance of the normal output connector ( ]" c operation [ Jof HNS516 AO module Yes installed in BSL2 of LPRM/APRM Unit Between pin A and pin E of the Within the required tolerance of the normal output connector ( ]" c operation [ Jof HNS515 AO module Yes installed in BSL3 of LPRM/APRM Unit Between pin L and pin R of the output connector ( ]"
C
[ Jof HNS518 AO module Within the required tolerance of the normal
Yes installed in BSL 1 of FLOW Unit
operation
Between pin L and pin R of the output connector ( ]" c Within the required tolerance of the normal
Yes [ Jof HNS516 AO module operation installed in BSL2 of FLOW Unit Between pin L and pin R of the output connector ( ]" c Within the required tolerance of the normal
Yes [ Jof HNS517 AO module operation installed in BSL3 of FLOW Unit
mSHIBA ENERGY SYSTEMS I SOUJTIDNS CORPORATION Nuclear Energy Systems & Services Division
134/151
with
FPG-TRT-C51-0101 Rev.3
APPENDIX C Details of the Operability Test and the Prudency Test
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
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Table C 1 Description ofEPRI-TR-107330 Table 5-1 and Detailed Scope and Timing of PRM Operability Tests
J~sg:~[1~ti,oiiC(~.~~,\2~ ', . quaUfi~atioh test~r · .
Pre-Qualification Test(Base Line)
Radiation Exposure
Environmental
Test
Before High
Temperature and High Humidity Exposure
'
.... ,· ·" •.·
§c9pe "'''
"All"
No Description
A. Accuracy
B. Response time
C. Discrete input operability
D. Discrete output operability
E. Communication operability
F. Coprocessor operability
G. Timer Tests
H. Test of failure to complete scan
detection
I. Failover Operability Tests
J. Loss of power test
K. Power Interrupt Test.
----------No Description A. Accuracy
B. Response time
C. Discrete input operability
D. Discrete output operability
E. Communication operability
(1), (2), (3), (7)
(4), (5), (6)
(9)
( 4), (5), (6), (8)
Confirm no communication alarms
occurred
NIA
NIA
(13), (14), (15)
(10), (11), (12), (16)
(17)
(18)
(2), (7)
(5)
Response time measurement of
TPM H, in which the TPM time
constant is set to[ J~cond was not
performed
(9)
(5)
Confirm no communication alarms
occurred.
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
136/151
FPG-TRT-C51-0101 Rev.3
The PRM does not use coprocessors.
The PRM does not provide any separate timer
functions.
--------See Note B (i)
See Note B (ii)
See Note B (v)
--------
· T~st <;:ondition(Toshiba
qualific~tion.Je~is)
During High Temperature
and High
Humidity Exposure
After (End of) High
Temperature
and High
Humidity
Exposure
FPG-TRT-C51-0101 Rev.3
. ', ' , . . ,, Description of'tR-J07330 'rable·5~i
I,
Operability Test for PRM . . '. Op~~ability fe. sts ($e.ction.5.3)_ ·..... . · ..
... ' . ' . . ' . ,,. ' 7 .. ' .• ,,. ' . ' ' ' ' .·• ' .' "' •·. <:.
No Description
"ALL" at the point per
Figure 4-4
F. Coprocessor operability
G. Timer Tests
H. Test of failure to complete scan
detection
I. Failover Operability Tests
NIA The PRM does not use coprocessors.
NI A The PRM does not provide any separate timer function.
Test Items (13), (14), and (15) were See Note B (iii)
not performed.
(16)
Test Items (10), (11), and (12) were
not performed.
See Note B (iv)
J. Loss of power test (17)
K. Power Interrupt Test. (18)
~~ A. Accuracy
B. Response time
C. Discrete input operability
D. Discrete output operability
E. Communication operability
F. Coprocessor operability
(2), (7)
(5)
Response time measurement of
TPM H, in which the TPM time
constant is set to[ Js'econd was not
performed
(9)
(5)
Confirmed no communication
alarms occurred.
NIA
Toshiba monitored the equipment operation during the tests. Table C 4 in this Appendix shows the
acceptance criteria for the output signals.
See Note B (i)
See Note B (ii)
See Note B (v)
--------The PRM does not use coprocessors.
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
137/151
Tcisj qhnditicni(Tosliip~
. , R4:a11fi~~tia~ t~·s1~\l(: .. : . p·e~cription ofTR:J07330 Table5;-J
·: :\\6perabliity'.f~~t{(S~~ti6n 5.3) ' . '~";.'~'" ,;,:;," . ,' ,., '"'--"~ '-::,, " . ., . '
G. Timer Tests
FPG-TRT-C51-0101 Rev.3
The PRM does not provide any separate timer
function.
H. Test of failure to complete scan
detection
Test Item (13), (14), and (15) were See Note B (iii)
During Low
Temperature
Exposure
After (End of)
Low Temperature
Exposure
I. Failover Operability Tests
J. Loss of power test
K. Power Interrupt Test.
No Description
"ALL" at the A. Accuracy
point per
Figure 4-4 B. Response time
C. Discrete input operability
D. Discrete output operability
E. Communication operability
F. Coprocessor operability
G. Timer Tests
not performed.
(16)
Test Items (10), (11), and (12) were
not performed.
(17)
(2), (7)
(5)
Response time measurement of
TPM H, in which the TPM time
constant is set to[]s~cond was not
performed
(9)
(5)
Confirmed no communication
alarms occurred.
NIA
NIA
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
138/151
See Note B (iv)
Toshiba monitored the equipment operation during
the tests. Table C 4 in this Appendix shows the
acceptance criteria for the output signals.
See Note B (i)
See Note B (ii)
See Note B (v)
The PRM does not use coprocessors.
The PRM does not provide any separate timer
functions.
Test Coh<lition(Tbshiba ·
quali±ic~tion tests f ...
. Des,~ription of'T,]{.:I07pgT,abl(~-':J : . · Op~rabilify_T¢st~ (Se:ctioI1 5.3): : · · ·
Test Iterii •
FPG-TRT-C51-0101 Rev.3
.
P!!i:fClrllled Tes,(:?, (S(,e Note A at the ~cop~, .. .. , ....... "_, .. . : .. ·· · · · · · ·· ·· · · · · Justjfication/.Etis'lariatiqn
. , •. .: ·· . end qfTable) •••- .. . . -•. · ••• .· .. · ... ·. ;'. . ··. .r · ·• · :. : .· ..
During Low
Humidity
Exposure
After (End of)
Low Humidity
Exposure
No Description
"ALL" at the
point per
Figure 4-4
H. Test of failure to complete scan
detection
I. Failover Operability Tests
J. Loss of power test
K. Power Interrupt Test.
Test Items (13), (14), and (15) were See Note B (iii)
not performed.
(16)
Test Items (10), (11), and (12) were
not performed.
(17)
(18)
See Note B (iv)
~~ Toshiba monitored the equipment operation during
the tests. Table C 4 in this Appendix shows the
acceptance criteria for the output signals.
A. Accuracy
B. Response time
C. Discrete input operability
D. Discrete output operability
E. Communication operability
F. Coprocessor operability
G. Timer Tests
H. Test of failure to complete scan
detection
I. Failover Operability Tests
(2), (7)
(5)
Response time measurement of
TPM H, in which the TPM time
constant is set to[]s·econd was not
performed
(9)
(5)
Confmned no communication
alarms occurred.
NIA
NIA
See Note B (i)
See Note B (ii)
See Note B (v)
Test Items (13), (14), and (15) were See Note B (iii)
not performed.
(16) See Note B (iv)
Test Items (10), (11), and (12) were
not performed.
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
139/151
.
...
:rest C:ondition(Tgshiba
. \q1,1alifi,c;afip11 t;~t~) ' '
After all
Environmental
;. ··•
"ALL" at the
point per
Figure 4-4
J. Loss of power test
K. Power Interrupt Test.
A. Accuracy
B. Response time
C. Discrete input operability
D. Discrete output operability
E. Communication operability
F. Coprocessor operability
G. Timer Tests
H. Test of failure to complete scan
detection
(18)
(2), (7)
(5)
Response time measurement of
TPM H, in which the TPM time
constant is set to[Jecond was not
performed
(9)
(5)
Confirmed no communication
alarms occurred.
NIA
NIA
Test Items (13), (14), and (15) were
not performed.
FPG-TRT-C51-0101 Rev.3
.,.,.,, --• y/.-<·
' -:
See Note B (i)
See Note B (ii)
See Note B (v)
-------The PRM does not use coprocessors.
The PRM does not provide any separate timer
functions.
See Note B (iii)
' .. · .. •:,,:::.
' ':
I. Failover Operability Tests (16) See Note B (iv)
Seismic Test Before Seismic
Test
No Description
"All"
Test Items (10), (11), and (12) were
not performed.
J. Loss of power test (17)
K. Power Interrupt Test. (18)
A. Accuracy
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
140/151
qualific:a,tion tests) . t, :. Scope . T~~t'It~rn,:
..... \:. : ' " ·. ,,': : . ':,.,. , ;:: " ''""''': ·: , .. , .. ::,'<
During Seismic
Test
After Seismic Test
"All"
B. Response time
C. Discrete input operability
D. Discrete output operability
E. Communication operability
F. Coprocessor operability ,__ ____________ _, No operability test was performed
G. Timer Tests
H. Test of failure to complete scan
detection
I. Failover Operability Tests
J. Loss of power test
K. Power Interrupt Test.
A. Accuracy
B. Response time
C. Discrete input operability
D. Discrete output operability
E. Communication operability
F. Coprocessor operability
G. Timer Tests
H. Test of failure to complete scan
detection
but output signals are monitored.
(1), (2), (3), (7)
( 4),(5),(6)
(9)
( 4),(5),(6),(8)
Confirm no communication alarms
occurred
NIA
NIA
(13), (14), (15)
I. Failover Operability Tests (10), (11), (12), (16)
J. Loss of power test (17)
K. Power Interrupt Test. (18)
FPG-TRT-C51-0101 Rev.3
••• , : • ' : ; <
<,
, C<•
Due to the short duration of the seismic tests,
Operability Tests cannot be performed during the
seismic event. Toshiba chose to monitor the equipment operation during the test and performed
the operability tests before and after the tests to
ensure that the PRM remained operable during and
after the seismic event.
The acceptance criteria during the Seismic test is
described in the Seismic test procedure.
The analog outputs and discrete outputs of each unit
are set as shown in Table C 3 in this Appendix with
their acceptance criteria.
The PRM does not use coprocessors.
The PRM does not provide any separate timer
functions.
Exchange of Modules (LPRM Modules was exchanged for HNSO 13 from HNSOl 1. AO Modules was exchanged for HNS515151615171518 from HNS5 l l/512l513l5 l4.
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
141/151
'"··
> .· Te,st CCll).~itigp(Toshib11
· " qtialifi6ati6ii te_sts Y: · .•,, ..
EMC Test Before EMC
Test
During EMC
Test
FPG-TRT-C51-0101 Rev.3
No Description A Accuracy (1), (7) The LPRM and AO modules were modified to
B. Response time
C. Discrete input operability
D. Discrete output operability
E. Communication operability
F. Coprocessor operability
G. Timer Tests
H. Test of failure to complete scan
detection
I. Failover Operability Tests
J. Loss of power test
K. Power Interrupt Test.
Test Items (2) and (3) were not
performed.
(4)
Test Items (5) and (6) were not
performed.
(9)
( 4), (8)
Test Items (5) and (6) were not
performed.
Confirmed no communication
alarms occurred
NIA
NIA
(13), (14)
Test Item (15) was not performed.
Test Items (13) and (14) were only
performed for the LPRM module.
(10), (11), (12)
Test (16) was not performed.
(17)
(18)
enhance immunity against EMC.
As a test after modification, accuracy was tested
using worst case configuration for the LPRM
modules.
The LPRM and AO modules were modified to
enhance immunity against EMC.
As a test after modification, accuracy was tested
using worst case configuration for the LPRM
modules.
Because modification to the LPRM and AO
modules does not influence discrete outputs, Tests
( 4) and (8) are sufficient.
The PRM does not use coprocessors.
The PRM does not provide any separate timer
functions.
Because the LPRM module was the only module
that was modified and contained FPGAs.
Because the LPRM module and AO modules were
only modules that were modified.
"All except A" ,__A_. _A_c_c_ur_a_cy _________ ,__ ___________ _____, Due to the special set-up required for the EMC
B. Response time The operability tests were not tests, Operability Tests cannot be performed during
performed. EMC testing. Toshiba chose to monitor the '--------------'-'"----------------'
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
142/151
..
.. Te~tCondition(To~liiba
. :',qualification tes,ts)
FPG-TRT-C51-0101 Rev.3
' ,,·, ,. :_ '. , • , , • ,, ' • ' " • '<> ,, ' ~- '" :
· Description cifTR'-:107330 Table g,l . bp~rability Jests (Section !qf ' "' '. : , : .',' : ~ . •, ;; ."'.,'" .
OperabilifyT¢st for PRM < . ' '., .•. ' ', .. ,. ' ' •. ',
' Scope<. ' ' ,,,, Tekdt~~
'-"·:r·,rc-: ,·<:
C. Discrete input operability The operability tests were not equipment operation during the test and perform the ,__ _____________ _,__,p_e_rfi_o_rm_e_d. _________ __, operability tests before and after the tests to ensure
D. Discrete output operability The operability tests were not that the PRM remained operable during and after performed. the EMC testing.
E. Communication operability Confirmed no communication Table C 5 in this Appendix shows the acceptance alarms occurred criteria for the output signals. t---------------+-----------------1
F. Coprocessor operability
G. Timer Tests
H. Test of failure to complete scan detection
I. Failover Operability Tests
J. Loss of power test
K. Power Interrupt Test.
NIA
NIA
The operability tests were not performed.
The operability tests were not
performed.
The operability tests were not
performed.
The operability tests were not
performed.
After EMC Test "All" A. Accuracy The operability tests were not Tests were carried out as Post Qualification Tests (After re-exchange of modules).
Isolation Test(Class 1E to Non
Class 1E Isolation Test)
No Description
,__ ____________ ___,
B. Response time performed.
C. Discrete input operability
D. Discrete output operability
E. Communication operability
F. Coprocessor operability .
G. Timer Tests
H. Test of failure to complete scan
detection
I. Failover Operability Tests
J. Loss of power test
K. Power Interrupt Test.
Note: Toshiba conducted Class 1E to Non Class 1E Isolation Test
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
143/151
FPG-TRT-C51-0101 Rev.3
" .. : i ,,,
.
Post Qualification Test(Before re- No Description A. Accuracy (1), (7) The LPRM and AO modules were modified to
exchange of modules)
B. Response time
C. Discrete input operability
D. Discrete output operability
E. Communication operability
F. Coprocessor operability
G. Timer Tests
H. Test of failure to complete scan
detection
I. Failover Operability Tests
Tests (2) and (3) were not
performed.
(4)
Test Items (5) and (6) were not
performed.
(9)
( 4), (8) Test Items (5) and (6) were not
performed.
Confirmed no communication
alarms occurred
NIA
NIA
(13), (14)
Test Item (15) was not performed.
Test Items (13) and (14) were
performed only on LPRM module.
(10), (11), (12)
Test Item (16) was not performed.
J. Loss of power test ( 17)
K. Power Interrupt Test. (18)
enhance immunity against EMC.
As a test after modification, accuracy was tested
using worst case configuration for the LPRM
modules.
The LPRM and AO modules were modified to
enhance immunity against EMC.
As a test after modification, accuracy was tested
using worst case configuration for the LPRM
modules.
Because modification to the LPRM and AO
modules does not influence discrete outputs, Tests
( 4) and (8) are sufficient.
The PRM does not use coprocessors.
The PRM does not provide any separate timer
functions.
Because the LPRM module was the only module
that was modified and contained FPGAs.
Because the LPRM module and AO modules were
only modules that were modified.
Re-Exchange of Modules (LPRM Modules was exchanged for HNS011 from HNS013. AO Modules was exchanged for HNS51ll512l51315 l4 from HNS5151516l517l5 l8.
No Description A. Accuracy (1), (2), (3), (7)
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
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FPG-TRT-C51-0101 Rev.3 '.,
·.·' ,·,·
"
Description ofTR•l07330 Tabk5~1
Test Conditioii(Tosluba · Opyral:Jility Tests (Sectiori5jj ·• OperabilityTest for PRM
' • ," •• • '" < " '·, '"''
, .. '" ·''
" ,,. " qualifica,tion tests) ,,,' '. -,,·> , c·,C
P.~;cfQ~~~~ T\<~ts (S,ey NC?tr 4 at tliy ... ,'
1 ·Scope:. . Tesdtem ,,.·:.,,,;•[': ... ' J u~tifi~atfon/ExphmatiQri; ,.
,: ·:,',;",; ,: ', elid•gf:Table) ··.,,, ·, .'.}·; ,, ". .. , ' :\:;.c· ·.:.,, ,, '
'' '
B. Response time (4), (5), (6)
C. Discrete input operability (9)
D. Discrete output operability (4), (5), (6), (8)
E. Communication operability Confirmed no communication alarms occurred
F. Coprocessor operability NIA Post-Qualification Test(After re-
G. Timer Tests NIA exchange of modules)
H. Test of failure to complete scan (13), (14), (15) detection
I. Failover Operability Tests (10), (11), (12), (16)
J. Loss of power test (17)
K. Power Interrupt Test. (18)
Note A ( 1) Linearity test for APRM level, TPM level, and LPRM level at the LPRM gains 40 µA/100% (2) Linearity test for APRM level, TPM level, and LPRM level at the LPRM gains 400 µA/100% (3) Linearity test for APRM level, TPM level, and LPRM level at the LPRM gains 2400 µA/100% ( 4) APRM Upscale (High-High) trip and TPM Upscale trip response time test at the LPRM gains 40 µA/100% (5) APRM Upscale (High-High) trip and TPM Upscale trip response time test at the LPRM gains 400 µA/100% (6) APRM Upscale (High-High) trip and TPM Upscale trip response time test at the LPRM gains 2400 µA/100% (7) Linearity test for FLOW level (8) APRM Inoperable trip function test (9) DI function test (10) Low voltage power supply failure test for the LPRM unit (11) Low voltage power supply failure test for the LPRM/APRM unit (12) Low voltage power supply failure test for the FLOW unit (13) Watchdog function test for the LPRM unit (14) Watchdog function test for the LPRM/APRM unit (15) Watchdog function test for the FLOW unit (16) Current value test of the Square Root module in the FLOW unit ( 17) Loss of power test (18) Power interruption test
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
145/151
.. ;(;:•;,,·, '' ,; . ·.::: .... ;., ,· '·: ' ,: '' "i .· ..
The PRM does not use coprocessors.
The PRM does not provide any separate timer functions.
FPG-TRT-C51-0101 Rev.3
NoteB (i) Test Items (1) and (3) were not performed, because the LPRM gain or the leal setting change can be made only by manual operation on the front panel, which was not accessible while
the PRM was in the chamber. Fresh LPRM detectors send over 400 µA signals to the LPRM module, and the signal level decreases by aging in the core. Toshiba chose 400 µA setting as the leal value, which is
generated to simulate the LPRM detectors signal for testing. The LPRM module is calibrated using data from a Traversing In-core Probe (TIP) in actual plants.
The lea! setting is implemented by selecting one resistor from a resistor array in the input of each LPRM module. Since all three selectable resistors are in the same resistor array and all
selectable resistors were tested in the factory test, Toshiba selected the 400 µA setting that is the most commonly used in actual operation due to the limitation mentioned above.
Toshiba chose to confirm the accuracy of the PRM for all lea! settings in the Post qualification testing. Toshiba did not observe any degradation in accuracy for all lea! settings.
(ii) Test ( 4) and (5) with the TPM time constant[J;·~cond were not performed, because the TPM time constant can be changed only by manual operation on the front panel of the PRM
module, which was not accessible while the PRM was in the chamber. Toshiba set the TPM time constant to 6 seconds, which is consistent with Toshiba recommendations for the initial
value in the plant.
(iii) Test (13), (14), and (15) were not performed, because the watchdog function test requires intentionally expiring the watchdog timer by removing a jumper pin on the PC board of the
test specimen and stop the reset signals from FPGAs to the watchdog timer. This was not possible while the PRM was in the chamber. Instead, Toshiba monitored the equipment operation
during the tests. An alarm was generated by the watchdog timer when the jumper pin was removed.
(iv) Test (10), (11), and (12) were not performed, because the output voltage of the LVPS module, which is in the chamber, can be changed only by manual operation on the front panel of
the L VPS module. Toshiba monitored the equipment operation during the tests. An alarm is generated when the voltage ofLVPS module was lowered.
(v) Tests ( 4) and (6) were not performed, because the LPRM gain or the lea! setting change can be made only by manual operation on the front panel, which was not accessible while the
PRM was in the chamber. Since the lea! value does not influence discrete output operability, Test (5) is sufficient to ensure discrete output operability.
Test (8) was not performed, because the APRM Inoperable trip is generated only by manual operation on the front panel of the APRM or LPRM modules. The operation changes the mode
of the APRM or LPRM module to other than "OP," and makes the number of the operable LPRM modules, i.e., LPRM modules in the "OP" mode, less than the "minimum number of
operable LPRM modules" set value. Toshiba monitored the equipment operation during the tests. An inoperable signal is generated when the mode of the APRM module and LPRM
modules were changed.
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
146/151
Table C 2 Description ofEPRI-TR-107330 Table 5-1 and Detailed Scope and Timing of PRM Prudency Tests
Test ¢ondition(Tostib~ · quai~(i~~tion te~ts) :- . . ....
Pre-Qualification Test(Base Line)
Radiation Exposure
Environmental Before High Test Temperature and
High Humidity
Exposure
During High
Temperature and
High Humidity
Ex osure
After( End of) *)High
Temperature and High Humidity
Exposure
_Desc:riptio_nofTR'.~1onJqTable_5~1 .Prµtl~li~y°Tests(Settioiif4) .. ;, < X :, ,<, X \:, < : ; ' •,, a' ',' '• ~' ,.~" 0 > \ C
testl>tiint
"All"
No Description
No Description
No Description
"ALL at end of
high temp/RH only"
'·Item A Burst of events test.
B. Failure of serial port receiver test.
C. Serial port noise test.
D. Fault simulation.
A Burst of events test.
B. Failure of serial port receiver test.
C. Serial port noise test.
(19), (20)
NIA
NIA
(21)
(19), (20)
NIA
NIA
TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION Nuclear Energy Systems & Services Division
147/151
FPG-TRT-C51-0101 Rev.3
There is no serial port receiver in the PRM.
The Toshiba NRW-FPGA-based PRM uses fiber
optic links.
The test was performed during the operability test.
(Note A (10), (11), and (12)) Failure simulation test is to disconnect the one AC Power source for L VPS I module of each test specimen unit.
There is no serial port receiver in the PRM.
The Toshiba NRW-FPGA-based PRM uses fiber
optic links.
_J
Test.Conditiori(Toshiba
qtalif{9~t,iqn tests) · · Description of TR-1073.JQ'J:able 5-1 Pr~dy~cy ,'f ests(Se9ti9~t4): ·; ...
Seismic Test
During Low Temperature Exposure
No Description
After (End of)*) No Description
Low Temperature Exposure
During Low No Description
Humidity
Exposure
After (End of)*) No Description
Low Humidity Exposure
After*) all Environmental
Before Seismic Test
During Seismic
Test
No Description
No Description
"All"
After Seismic "None"
Test
D. Fault simulation. The tests were not performed.
A. Burst of events test. The all Prudency tests were not t-------------,
B. Failure of serial port performed.
receiver test.
C. Serial port noise test.
D. Fault simulation.
FPG-TRT-C51-0101 Rev.3
Test (21) was not performed because the AC Power
of the test specimen in the chamber could not be disconnected.
Toshiba chose to monitor the equipment operation
during the test. Table C 4 in this Appendix shows
the acceptance criteria for the output signals. An
alarm is generated when the voltage was lowered.
Due to the short duration of the seismic tests,
Prudency Tests cannot be performed during the
seismic event. Toshiba chose to monitor the
equipment operation during the test.
Exchange of Modules (LPRM Modules was exchanged for HNSO 13 from HNSOI l. AO Modules was exchanged for HNS515/516/5 l 7 /518 from HNS5 ll/512/513/514.
EMC Test Before EMC Test No Description
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Test'<::ohdition(Toshibti. < qualification tests~ <
Description ofTR0 l07330 Table s~1 ', Pnid~ncr Tests(SectioI15.4). .
During EMC Test "A only"
After EMC Test Isolation Test(Class 1E to Non 1E Test) Post Qualification Test(Before reexchange of modules)
"None"
No Description
No Description
Prude#p)."Test
The tests were not performed.
FPG-TRT-C51-0101 Rev.3
Due to the special set-up required for the EMC tests, Prudency Tests cannot be performed during EMC testing. Toshiba chose to monitor the equipment operation during the test and perform the operability tests before and after the tests to ensure that the PRM remained operable during and after the EMC testing. Table C 5 in this Appendix shows the acceptance criteria for the output signals.
Re-Exchange of Modules (LPRM Modules was exchanged for HNS011 from HNS013. AO Modules was exchanged for HNS51ll512l513l514 from HNS515l516l517l518.
Post-Qualification Test(After reexchange of modules)
Note: Prudency Test item (19) DI Toggling test (20) AI Toggling test (21) Failure simulation test
No Description · A. Burst of events test.
B. Failure of serial port receiver test. C. Serial port noise test.
D. Fault simulation.
(19), (20)
NIA
NIA
(21)
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There is no serial port receiver in the PRM.
The Toshiba NRW-FPGA-based PRM uses fiber optic links.
The test was performed during the operability test. (Note A (10), (11), and (12)) Failure simulation test is to disconnect the one AC Power source for L VPS I module of each test specimen unit.
FPG-TRT-C51-0101 Rev.3
Table C 3 Acceptance Criteria for Output Signals Monitored during Seismic Test of the PRM
.;'l)gget, Viil.iie '"'
•.;itrts~tt:i:ttt~ttttl!!::~i:1,•·:· .. . , .. Ac,sipfa?.~~ mit~r"if.c;:.,:':, .: (F9r an~l'.9) £t1~µls, ~c,c:~?t~~lt:, qeviatioiif[om the targefval,ii~}
Analog output LPRM # 1 in LPRM/ APRM unit
APRM in LPRM/APRM unit
TPM in LPRM/ APRM unit
FLOW in LPRM/ APRM unit
LPRM # 1 in LPRM unit
Loop a FLOW in FLOW unit
FLOW in FLOW unit
Discrete output APRM FAIL in LPRM/ APRM unit
APRM !NOP in LPRM/APRM unit
APRM High-High in LPRM/APRM unit
TPM High in LPRM/ APRM unit
i>~tp.ut,signal b~ciim~:·~~:th~ target v~l~i · .. shown: below) ,,L.
Occurred*
Not Occurred
Not Occurred
Not Occurred
Not change
Not change
Not change
Not change
* To simulate the APRM Fail during seismic test, removed the [
[ . ]Norn the FLOW Unit.
]from the LPRM/APRM Unit during the seismic test. The
Table C 4 Acceptance Criteria for Output Signals Monitored during Environmental Test of the PRM
Time
(min)
0-15
15-30
30-45
45-60
Note:
Input
Current Current
(µA) (mA)
FLOW Output TPMHigh Set
Output (Computer) point
(Computer) (mV) (Computer)
(mV) (mV)
1) TPM Output is a first order lag of APRM Output with 6 seconds time constant.
2) APRM High-High trip occurs about 40 ms after the change of LPRM Signal.
3) TPM High trip occurs about 40 ms after the TPM Output change.
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APRM TPMHigh
High-High Trip
Trip Discrete
Discrete Output
Output
"· · Not Occur2> Not Occur3>
Not Occur Not Occur
Occur2> Occur3>
Occur Occur
APRM
INOP
Discrete
Output
Not Occur
Not Occur
Not Occur
Not Occur
FPG-TRT-C51-0101 Rev.3
Table C 5 Acceptance Criteria for Output Signals Monitored during EMC Test of the PRM
Input Expected Output (Acceptance Criteria)
Time LPRM FLOW HNS511/ HNS514/ HNS512/ HNS514/ HNS512/ (s) (µA) (mA) HNS515 HNS518 HNS516 HNS518 HNS516
LPRM LPRM APRM APRM FLOW r) (mV) (V) (mV) (V)
:t_J Ll LU: 1a,c 0 1 2 3 4 5 6 7 8 9 10
11
12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
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HNS513/ APRM
HNS517 High-High
FLOW Trip Discrete
(V) Output
a,
--
,_ Not Occur
I-
--
-e--
e--
,_ ,_
~
,_
~
Occur ~
,_
e--
,_ e--
e--
e--
. e--
~
~
~
Not Occur ,_
-
-