font@esa (t-488)
DESCRIPTION
Font@ESA (T-488). FONT: C Clarke, C Swinson, P Burrows, T Hartin, G Christian, H Dabiri Khah SLAC: Mike Woods, Ray Arnold, Steve Smith et al. FONT ESA Test Module -design. Material model of ILC outgoing beamline. QFEX1. BPM. beamcal. low Z mask. FONT ESA Test Module –in situ. - PowerPoint PPT PresentationTRANSCRIPT
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Font@ESA (T-488)
FONT: C Clarke, C Swinson, P Burrows, T Hartin, G Christian, H Dabiri Khah
SLAC: Mike Woods, Ray Arnold, Steve Smith et al
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T Hartin Eurotev 8-Jan-07
FONT ESA Test Module -design
low Z mask
beamcal
BPM
QFEX1
Material modelof ILC outgoingbeamline
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T Hartin Eurotev 8-Jan-07
3
FONT ESA Test Module –in situ
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T Hartin Eurotev 8-Jan-07
Beam test outline
AIM:Recreate ILC-like background hits on BPM
Pass 30 GeV main beam through Be radiator, select momentum bites and transport to A-line
bunch charge 106 1010 obtained by varying transmission at slits
x,y shift beam to impinge on lowZ mask and produce spray
ILC/ESA Comparison
ESA: initial 106 charge bunch produces ~2x106 e+e- per strip
ILC: scheme 14, ~ 2x104 e+e- per strip
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T Hartin Eurotev 8-Jan-07
Raw voltage from BPM pickoffs
• main component is the usual bipolar doublet – 1ns between peaks reflects the 30cm round trip up and down the strip
• secondary “noise” feature apparent in BPM D – “noise” to “signal” ratio should be the greatest here for this configuration
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T Hartin Eurotev 8-Jan-07
Geant Data
• 1mm spot size incident on low Z at (x,y)=(1.4,0)
• “Signal” obtained by counting net charge passing by strips
• “Noise” obtained by counting net charge in the secondary emission from the striplines
• Time response obtained from GEANT T.O.F. parameter
Incident Q = -10000
BPM1 s.e. Q = -2297
BPM2 s.e. Q = -2057
BPM3 s.e. Q = -2848
BPM4 s.e. Q = -1908
Incident beam spot
Net Q at upstream end of BPM strips Q = -16529
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T Hartin Eurotev 8-Jan-07
How to model the noise?
Possible “noise” components: Incident hits – partly make up the “signal” as main charge bunch
passes voltage pickoff – these are generally tangential – must take into account the change in image charge. Charges moving toward a strip roughly balanced by those moving away from it, so no net effect from incident hits
Emitted hits – electrons yield positive (+ reflected negative) voltage pulse, positrons the opposite. Reflected voltage pulse “piles up”
Voltage pickoff
BPM wall
Charges incident on strips
Charges emitted from stripsBPM strip
“noise” voltage pulse
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T Hartin Eurotev 8-Jan-07
TOF histogram “raw” charges
This is “raw” because…
• we have to balance signal against noise by taking into account the fraction of the image charge on each strip
• we want to compare with real voltage measurements, take into account residual impedance and capacitance in the measuring circuit
“signal” is almost a delta function at upstream end of BPM strips
Reflected “signal” after round trip of 30cm/c = 1.0 ns
“Noise”
Reflected“Noise”
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T Hartin Eurotev 8-Jan-07
Simulate measured voltages
Broaden analytic signal pulse by passing through a 2nd order 1.2 GHz Butterworth Low pass filter
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T Hartin Eurotev 8-Jan-07
Simulated Signal+Noise results
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T Hartin Eurotev 8-Jan-07
New ESA run 2007
2006 run aimed the primary beam at LowZ mask directly – noise to signal higher than we can expect at ILC
Modify the module to include thin radiator
Match spray to expected ILC spray
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T Hartin Eurotev 8-Jan-07
Geant studies to compare ILC and ESA
Energy spectra at LowZ mask different between ILC/ESA, but…
At BPM strips the spectra is similar
5% Al radiator ~ 1m upstream of lowZ mask delivers noise:signal ratio twice that of ILC-can adjust down
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T Hartin Eurotev 8-Jan-07
Further work
Further data run at ESA in 2007• Insert thin radiator upstream of LowZ
mask • Attach FONT processer to gauge effect
of noise on processed signal
Firm up simulations by• Theoretical considerations of noise• Full electromagnetic simulation