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Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman Performance Films Date: October, 29 th , 2018 Approved for external use

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Page 1: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Fast Characterization of Defects and Inclusions in Multi-layer Films

Presented by: Peng GaoAnalytical chemist, Eastman Performance Films

Date: October, 29th, 2018

Approved for external use

Page 2: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Eastman Performance Films, LLCMartinsville, VA, US

Mounting

Adhesive

PET

Metal Deposit

(vapor deposition and sputtering)

Scratch Resistant

Coating

Silicone

PET+ Dye

Release liner

Laminated

Components

2 Approved for external use

Page 3: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

OverviewContaminants in optically clear films

• Large impact on quality• Trapped in multi-layers• Particles: 5-100 microns• Organic/inorganic

100 µm

3 Approved for external use

Page 4: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Analysis of contaminants• Involves deconstruction of multi-layer films or microtome

techniques. • Analysis of contaminants using current techniques could

take a couple of days. • Location information is very often inconclusive.

4 Approved for external use

Page 5: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

5 Approved for external use

Page 6: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Cutting by hand is not precise enough

6 Approved for external use

Page 7: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Nanoindenter (CB500, Nanovea) modified with cutting blades• Nanoindenter offers precise control to cut through the

contamination in films.• Locate the contamination using the built-in microscope• Cut through the contamination using a sharp blade.

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Page 8: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Samples cut by the new technique

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Page 9: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Small particle contamination

30 µm 40 µm

2 4 6 8 10 12 14keV

0

1

2

3

4

5

6

cps/eV

C O

Fe Fe

5 microns

9 Approved for external use

Page 10: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Flaky contamination

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Page 11: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Outcome of the new technique

• Took less than 2 hours• In the coating

Deconstruction New technique

Approved for external use

• Took days • Machine? • Process?

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Page 12: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Microtome vs. Nanoindenter technique

Nanoindenter techniqueAdvantages No contamination from resin embedding Fast PreciseLimitations Non-contact methods of chemical analysis Organic contamination

12 Approved for external use

Page 13: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Summary

• A new technique for faster identification of contamination was developed by cutting precisely through contaminants.

• Works for contamination as small as 5 microns.• No chemical or resin are needed.• Provides more conclusive information on the location of

contamination (process & machine), offering a possible source for root cause analysis.

• For organic contamination, microtoming may be required.

13 Approved for external use

Page 14: Fast Characterization of Defects and Inclusions in Multi ... · Fast Characterization of Defects and Inclusions in Multi-layer Films Presented by: Peng Gao Analytical chemist, Eastman

Thanks!