elmore delay, logical effort. modern interconnect © rabaey, ch4wire.ppt, slide 22

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Elmore Delay, Logical Effort

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Elmore Delay, Logical Effort

Modern Interconnect

© Rabaey, ch4Wire.ppt, slide 22

Example: Intel 0.25 micron Process

5 metal layersTi/Al - Cu/Ti/TiNPolysilicon dielectric

© Rabaey, ch4Wire.ppt, slide 23

Modern Interconnect• 90nm process

© Chris Kim (image from Intel?)

The Lumped RC-Model, The Elmore Delay

© Rabaey, ch4Wire.ppt, slide 27

(result *0.69)

Example: The Elmore Delay

Shared Paths:

R44 = R1+R3+R4

Rii = R1+R3+Ri

Ri4 = R1+R3

Ri2 = R1

Ti = C1R1 + C2R1 + C3(R1+R3) + C4(R1+R3) + Ci(R1+R3+Ri)

The Elmore Delay RC Chain

© Rabaey, ch4Wire.ppt

The Distributed RC-line

© Rabaey, ch4Wire.ppt

Diffusion Equation

Deriving the Diffusion Eq

Step-response of RC wire as a function of time and space

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 50

0.5

1

1.5

2

2.5

time (nsec)

volta

ge (V

)

x= L/10

x = L/4

x = L/2

x= L

© Rabaey, ch4Wire.ppt

RC-Models

© Rabaey, ch4Wire.ppt

Driving an RC-line

Vi n

Rs Vo ut

(rw,cw,L)

© Rabaey, ch4Wire.ppt

Designing Fast CMOS Gates

Slides from chapter6.ppt of Rabaey’s page

EE141© Digital Integrated Circuits2ndCombinational Circuits

Fan-In ConsiderationsFan-In Considerations

DCBA

D

C

B

A CL

C3

C2

C1

Distributed RC model (Elmore delay)

tpHL = 0.69 Reqn(C1+2C2+3C3+4CL)

Propagation delay deteriorates rapidly as a function of fan-in – quadratically in the worst case.

EE141© Digital Integrated Circuits2ndCombinational Circuits

ttpp as a Function of Fan-In as a Function of Fan-In

tpLH

t p (

pse

c)

fan-in

Gates with a fan-in greater than 4 should be avoided.

0

250

500

750

1000

1250

2 4 6 8 10 12 14 16

tpHL

quadratic

linear

tp

EE141© Digital Integrated Circuits2ndCombinational Circuits

ttpp as a Function of Fan-In and Fan-Out as a Function of Fan-In and Fan-Out

Fan-in: quadratic due to increasing resistance and capacitance

Fan-out: each additional fan-out gate adds two gate capacitances to CL

tp = a1FI + a2FI2 + a3FO

EE141© Digital Integrated Circuits2ndCombinational Circuits

Fast Complex Gates:Fast Complex Gates:Design Technique 1Design Technique 1 Transistor sizing

as long as fan-out capacitance dominates Progressive sizing

InN CL

C3

C2

C1In1

In2

In3

M1

M2

M3

MNDistributed RC line

M1 > M2 > M3 > … > MN (the fet closest to the output is the smallest)

Can reduce delay by more than 20%; decreasing gains as technology shrinks

EE141© Digital Integrated Circuits2ndCombinational Circuits

Fast Complex Gates:Fast Complex Gates:Design Technique 2Design Technique 2

Transistor ordering

C2

C1In1

In2

In3

M1

M2

M3 CL

C2

C1In3

In2

In1

M1

M2

M3 CL

critical path critical path

charged1

01charged

charged1

delay determined by time to discharge CL, C1 and C2

delay determined by time to discharge CL

1

1

01 charged

discharged

discharged

EE141© Digital Integrated Circuits2ndCombinational Circuits

Fast Complex Gates:Fast Complex Gates:Design Technique 3Design Technique 3

Alternative logic structures

F = ABCDEFGH

EE141© Digital Integrated Circuits2ndCombinational Circuits

Fast Complex Gates:Fast Complex Gates:Design Technique 4Design Technique 4

Isolating fan-in from fan-out using buffer insertion

CLCL

Logical Effort

Slides from chapter6.ppt of Rabaey’s page

EE141© Digital Integrated Circuits2ndCombinational Circuits

Transistor SizingTransistor Sizing

Cg=Cg=

Cg=Cint=

Cint=Cint=

D=1+f D=2+4/3 f D=2+5/3 f

Normalized Space

Parasitic Term P

NOTE: p is a gate parameter function(W)

Logical Effort Term g

NOTE: g is a gate parameter function(W)

EE141© Digital Integrated Circuits2ndCombinational Circuits

Transistor Sizing a Complex Transistor Sizing a Complex CMOS GateCMOS Gate

OUT = D + A • (B + C)

D

A

B C

D

A

B

C

1

2

2 2

4

4

8

8

6

3

6

6

EE141© Digital Integrated Circuits2ndCombinational Circuits

Logical EffortLogical Effort

From Sutherland, Sproull

EE141© Digital Integrated Circuits2ndCombinational Circuits

Logical Effort of GatesLogical Effort of Gates

IntrinsicDelay

EffortDelay

1 2 3 4 5

Fanoutf

1

2

3

4

5

Inverter:g =

1; p = 1

2-input N

AND:g =

4/3

;p =

2

No

rmal

ized

Del

ay

EE141© Digital Integrated Circuits2ndCombinational Circuits

ttpp as a Function of Fan-Out as a Function of Fan-Out

2 4 6 8 10 12 14 16

tpNOR2

t p (

pse

c)

eff. fan-out

All gates have the same drive current.

tpNAND2

tpINV

Slope is a function of “driving strength”

EE141© Digital Integrated Circuits2ndCombinational Circuits

Buffer ExampleBuffer Example

N

iiii fgpDelay

1

For given N: Ci+1/Ci = Ci/Ci-1

To find N: Ci+1/Ci ~ 4

How to generalize this to any logic path?

CL

In Out

1 2 N

(in units of inv)

EE141© Digital Integrated Circuits2ndCombinational Circuits

Delay in a Logic GateDelay in a Logic Gate

Gate delay:

d = h + p

effort delay intrinsic delay

Effort delay:

h = g f

logical effort

effective fanout = Cout/Cin

Logical effort is a function of topology, independent of sizingEffective fanout (electrical effort) is a function of load/gate size

EE141© Digital Integrated Circuits2ndCombinational Circuits

Add Branching EffortAdd Branching Effort

Branching effort:

pathon

pathoffpathon

C

CCb

EE141© Digital Integrated Circuits2ndCombinational Circuits

Multistage NetworksMultistage Networks

Stage effort: hi = gifi

Path electrical effort: F = Cout/Cin

Path logical effort: G = g1g2…gN

Branching effort: B = b1b2…bN

Path effort: H = GFB

Path delay D = di = pi + hi

N

iiii fgpDelay

1

EE141© Digital Integrated Circuits2ndCombinational Circuits

Optimum Effort per StageOptimum Effort per Stage

HhN

When each stage bears the same effort:

N Hh

PNHpfgD Niii /1ˆ

Minimum path delay

Effective fanout of each stage: ii ghf

Stage efforts: g1f1 = g2f2 = … = gNfN

EE141© Digital Integrated Circuits2ndCombinational Circuits

Optimal Number of StagesOptimal Number of Stages

For a given load, and given input capacitance of the first gateFind optimal number of stages and optimal sizing

invN NpNHD /1

0ln /1/1/1

invNNN pHHH

N

D

NHhˆ/1Substitute ‘best stage effort’

EE141© Digital Integrated Circuits2ndCombinational Circuits

Example: Optimize PathExample: Optimize Path

1a

b c

5

g = 1f = a

g = 5/3f = b/a

g = 5/3f = c/b

g = 1f = 5/c

Effective fanout, F = 5G =H =h =a =b =c =

EE141© Digital Integrated Circuits2ndCombinational Circuits

Example: Optimize PathExample: Optimize Path

1a

b c

5

g = 1f = a

g = 5/3f = b/a

g = 5/3f = c/b

g = 1f = 5/c

Effective fanout, F = 5G = 25/9H = 125/9 = 13.9h = 1.93a = 1.93b = ha/g2 = 2.23c = hb/g3 = 5g4/f = 2.59

EE141© Digital Integrated Circuits2ndCombinational Circuits

Example – 8-input ANDExample – 8-input AND

EE141© Digital Integrated Circuits2ndCombinational Circuits

Method of Logical EffortMethod of Logical Effort

Compute the path effort: F = GBH Find the best number of stages N ~ log4F Compute the stage effort f = F1/N

Sketch the path with this number of stages Work either from either end, find sizes:

Cin = Cout*g/f

Reference: Sutherland, Sproull, Harris, “Logical Effort, Morgan-Kaufmann 1999.

EE141© Digital Integrated Circuits2ndCombinational Circuits

SummarySummary

Sutherland,SproullHarris