e sc 412 nanotechnology: materials, infrastructure, and ...€¦ · topography can sometimes be...
TRANSCRIPT
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E SC 412
Nanotechnology: Materials, Infrastructure, and Safety
Wook Jun Nam
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Lecture 20 Outline
• SPM Overview
• AFM
• STM
• NSOM
• Other Applications
Copyright 2014 by Wook Jun Nam
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SPM overview
Copyright 2014 by Wook Jun Nam
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Applications of Scanning Probe Microscopy
(SPM)
Copyright 2014 by Wook Jun Nam
SPM
AFM STM NSOM
Dip-pen
Litho.Nano-
indentation
MFM
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SPM (Movie)
http://virtual.itg.uiuc.edu/training/AFM_tutorial/
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Atomic Force Microscopy (AFM):
Operation Modes
Copyright 2014 by Wook Jun Nam
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• Scanning probe techniques enable nano-scale
characterization.
• AFM is suitable for conducting and insulating
samples.
• AFM does not require vacuum
• A variety of AFM scanning techniques are available
(contact, tapping, etc) for different sample types
• Each technique offers its own benefits and needs to
be chosen based upon the properties of the sample
Why Atomic Force Microscopy (AFM) ?
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• AFM measures sample topography by monitoring the
deflection of the probe tip in the Z direction
• The sample is rastered (scanned) beneath the probe tip
and detection is performed by a segmented photodiode
Z Direction
Atomic Force Microscopy (AFM)
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• Contact Mode
• Non-contact Mode
• Tapping Mode
AFM: Operation Modes
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Atomic Distance vs. Force
SPM training notebook, Bruker Corp.
Tapping mode
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AFM: Contact Mode
SPM training notebook, Bruker Corp.
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Note: If the tip is not moving, the
forces must be balanced.
Repulsive force between
tip and sample
Attractive force between
tip and sampleRepulsive
Attractive
The cantilever deflects as a result of various forces between the
tip and sample. The AFM keeps the force between the tip and
sample constant by utilizing a piezoelectric tube scanner.
F=-kx
Tip – Sample Interactions
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δ
δ
A – B = (+)
A – B = (-)
A
B
A
B
Photodiode Detector: Contact Mode
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AFM: Contact Mode (Movie)
http://virtual.itg.uiuc.edu/training/AFM_tutorial/
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• Advantage
– High scan speed (throughput)
– High resolution (only AFM technique offering “atomic
resolution”
– Rough samples with extreme changes in vertical
topography can sometimes be scanned more easily in
contact mode
• Disadvantages
– Can damage soft samples (e.g., biological samples,
polymers).
– Lateral (shear) forces can distort features in the image.
AFM: Contact Mode (continued)
SPM training notebook, Bruker Corp.
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AFM: Tapping Mode
SPM training notebook, Bruker Corp.
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AFM: Tapping Mode (continued)
http://www.intechopen.com/books/physical-and-chemical-properties-of-carbon-nanotubes/study-of-carbon-nanotube-based-devices-
using-scanning-probe-microscope.
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AFM: Tapping mode (Movie)
http://virtual.itg.uiuc.edu/training/AFM_tutorial/
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• Advantage
– Higher lateral resolution on most samples
– Lower forces and less damage to soft samples
– No scraping
• Disadvantages
– Slightly slower scan speed than contact mode
AFM: Tapping Mode (continued)
SPM training notebook, Bruker Corp.
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AFM: Non-contact Mode
SPM training notebook, Bruker Corp.
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• Advantage
– No force exerted on the sample surface
• Disadvantages
– Lower lateral resolution
– Slower scan speed than tapping and contact modes
– Only works on extremely hydrophobic samples to avoid
contacting the adsorbed fluid layer which results in the
tip getting stuck.
AFM: Non-contact Mode (continued)
SPM training notebook, Bruker Corp.
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Atomic Force Microscopy (AFM):
System
Copyright 2014 by Wook Jun Nam
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Feedback
(to PC)
Piezo tube
Scanner
PhotodetectorLaser Diode
Tip sample interactions
Sample
Ceramic
Chip
Probe Tip
Cantilever
Typical Configuration of AFM
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Optical Microscope
Probe Head
Sample Holder & Scanner
Typical Configuration of AFM
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• Mirror 1: aligns the laser onto the end of the
cantilever
• Mirror 2: aligns the laser’s reflection onto the
photodetector
• AFMs are equipped with an optical microscope to
perform this alignment
Mirror 2 Mirror 1
AFM: Mirrors
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• The ceramic chip is used for transporting the tiny
cantilever, which is attached on the end of the probe.
The tip is under the end of the cantilever
Ceramic Chip
Probe
Probe=Cantilever + Tip
Tip size: 10’s Å-10’s nmMagnified 70° view
Cantilever lengths: 100’s
mm
Cantilever width: 10-40 mm
Cantilever thickness: 0.3-2
mm
Top down view
(~1 cm x 1 cm)
Ceramic Chip, Cantilever, and Probe
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Probe Cartridges Pre-Mounted Tips
Spring Tool
Contact Tapping
AFM: Tip Holder
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x
y
z
Tube-shaped scanner allows for movement in all three directions
(x,y, z)
Movement in x & y: used to raster sample beneath stationary tip
Movement in z: used to maintain constant cantilever deflection
(feedback)
Piezoelectric
Tube Scanner
AFM: Piezoelectric Tube Scanner
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Metal Disk Adhesive
Circles
Properly Mounted
Sample
AFM: Sample Loading Disk
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Putting it all together…
Typical Configuration of AFM
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Atomic Force Microscopy (AFM):
Image Processing
Copyright 2014 by Wook Jun Nam
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Schematics and image profile of spheres scanned with a
sharp (left) and dull (right) probe
Tip Diameter
Practical guide to SPM, Bruker Corp.
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Sidewall angle measurements of trench with vertical side walls.
Tip Diameter
Practical guide to SPM, Bruker Corp.
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Schematics and image profile of trenches scanned with a
contaminated tip.
Tip Contamination
Practical guide to SPM, Bruker Corp.
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Scanning Tunneling Microscopy (STM)
Copyright 2014 by Wook Jun Nam
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Typical Configuration of STM
Nanofabrication: Principles, Capabilities, and Limits, Zheng Cui, Springer (2008)
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STM (Movie)
http://virtual.itg.uiuc.edu/training/AFM_tutorial/
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• STM is operated in high vacuum environment.
• Feedback is controlled by tunneling current.
• Tunneling current changes exponentially as the
distance between the sample and the tip is
changed.
• There are two operation modes: constant
current mode and constant gap mode.
Scanning Tunneling Microscopy (STM)
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STM Images (Si)
http://www.tf.uni-kiel.de/matwis/amat/def_en/kap_4/illustr/g4_2_4.html
• Si surface in ultra high
vacuum conditions
(otherwise the surface
would immediately oxidize
and we would see
amorphous SiO2
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STM Images (Pt)
a Pt surface. Vacancies are clearly visible
http://www.tf.uni-kiel.de/matwis/amat/def_en/kap_4/illustr/g4_2_4.html
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Atomic Manipulation: the world’s smallest
movie
http://www.youtube.com/watch?v=QOujRp
2xKTY
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Atomic Manipulation
http://www.youtube.com/watch?v=BUq2bQkL
1zo
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Atomic Manipulation Application
http://www.youtube.com/watch?v=f2OKVQm
ODC8
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Near-field Surface Optical Microscopy (NSOM)
Copyright 2014 by Wook Jun Nam
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Near-field Surface Optical Microscopy
(NSOM)
• AFM and STM utilizes atomic force and electric current, respectively.
• NSOM uses light.
• Light diffraction limits resolution of conventional optical microscopy: ~250nm
• NSOM offers high resolution optical image, ~50nm. 25nm resolution image was demonstrated using a light source at wavelength of 488nm.
Nanofabrication: Principles, Capabilities, and Limits, Zheng Cui, Springer (2008)
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Typical Configuration of NSOM
Nanofabrication: Principles, Capabilities, and Limits, Zheng Cui, Springer (2008)
http://www.nano-science.de/external/research/instruments/snom/snom.htm
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NSOM: Tips
• There are two kinds of tips: apertured (a) apertureless (b).
The tips used in the apertureless mode are very sharp
and do not have a metal coating.
http://en.wikipedia.org/wiki/Near-field_scanning_optical_microscope
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NSOM: Operation Mode
• Apertured modes of operation: a) illumination, b) collection, c)
illumination collection, d) reflection and e) reflection collection.
• Although there are many issues associated with the apertured tips
(heating, artifacts, contrast, sensitivity, topology and interference
amongst others), aperture mode remains more popular since
apertureless mode is even more complex to set up and operate, and
is not understood as well.
http://en.wikipedia.org/wiki/Near-field_scanning_optical_microscope
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NSOM: Operation Mode
Apertureless modes of operation: a) photon scanning tunneling
microscopy (PSTM) by a sharp transparent tip, b) PSTM by sharp
opaque tip on smooth surface, and c) scanning interferometric
apertureless microscopy with double modulation
http://en.wikipedia.org/wiki/Near-field_scanning_optical_microscope
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High Resolution Optical Imaging
https://nanohub.org/resources/2005/download/2006.11.02-ece695s-l13.pdf.
SEM
AFM NSOM
83 nm Optical resolution
seen with “100” nm tip
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NSOM Applications
• High resolution optical imaging
• Spectroscopy
– Near-field Surface Enhanced Raman Spectroscopy
– Local spectroscopy of semiconductor devices
• Modification of Surface
– Subwavelength photolithography
– High density data storage
– Laser ablation
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Other Applications
Copyright 2014 by Wook Jun Nam
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Dip-Pen Lithography
Nanofabrication: Principles, Capabilities, and Limits, Zheng Cui, Springer (2008)
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Other Applications
• Field induced deposition
• Electrochemical etching
• Nano-indentation/scratch
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Lecture 20 Outline
• SPM Overview
• AFM
• STM
• NSOM
• Other Applications
Copyright 2014 by Wook Jun Nam