dvortsov a. v., "resonance method of measuring a stuff dielectric properties at microwave...
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Saint Petersburg Electrotechnical University "LETI "
1886
TEP Conference presentation
Theme: «Resonance Method of Measuring a Stuff Dielectric
Properties at Microwave Frequencies»
Student: Dvortsov A. V.
Managers: Medvedeva N. Y.
Mikerov A. G.
The purpose of the work:
Investigation of the resonance method of measuring the dielectric properties of materials at microwave frequencies, which includes:
• methodology for calculating the dielectric constant, quality factor and loss tangent of the samples of materials
• calculation error of method• using this method to study
the degradation phenomena in packages of integrated circuits and dielectric materials.
Dvortsov A. V., 6202 2
1 1.5 2 2.5 3GHz
-200
-150
-100
-50
0
S21, dB - no sample - pattern Characteristics of the vector network
analyzer Rohde&Schwarz
ZVA-40: Operating frequency range:10 MHz-40 GHz The sensitivity of the frequency - 0,5 HzSensitivity of the transfer - 0,01 dB
Test bench
Measured parameters:- resonant frequency,- transfer coefficient(S21- parameter)
Vector Network Analyzer Rohde & Schwarz ZVA-40
Coaxial Resonator
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Design scheme of the resonatorL
b a
Mobile terminal Movable sample holderSampleMicrowave input
Microwave input
L = 100 mma = 10 mmb = 20 mm
The equivalent circuit of the resonator:
Resonance condition: - impedance of the coaxial line
- wave number
- impedance of the capacitor С at a frequency ω
- input resistance of short-line
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Calculation formulas
Capacity of the measured sample
Permittivity
Q-factor of the sample :
Loss tangent
Q-factor of empty resonator and resonator with the sample :
Capacity of a flat capacitor
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Treatment of experimental results
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 50
1
2
3
4
5
f, GHz
ε
Sample under investigation
Measurement error was calculated :- for the resonant frequency- for the capacity- for permittivity
The dependence of the dielectric constant of the sample frequency
Physical
quantity
1 mode 2 mode 3 mode 4 mode
f, GHz 0,618 1,947 3,302 4,707
ε 4,19 2,69 1,91 1,63
№
measurement
f (1 mode),
GHz
f (2 mode),
GHz
f (3 mode),
GHz
f (4 mode),
GHz
1 0,6184 1,944 3,298 4,709
2 0,6183 1,947 3,301 4,701
3 0,6186 1,944 3,302 4,707
4 0,6183 1,951 3,307 4,711
5 0,6185 1,948 3,3 4,705
The calculation results of ε
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1
2
3
4
0 1 2 3 4 5 6
f, GHz
C,
pF
fresh _dry
fresh _ moistened
aged _dry
aged _ moistened
0 1 2 3 4 5 6
f,
baseline
baseline after exposure to moisture
agedaged after exposure
to moisture
3
4
5
6
7
8
0 1 2 3 4 5
f, GHz
EMC_dry
EMC _ moistened
3
4
5
6
7
8
0 1 2 3 4 5
f,
baselinebaseline after exposure
to moisture
aged
baseline
Results of the research
Epoxy Compound
Corps of Integrated Circuits
ε
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Conclusion
• A method for measuring permittivity materials at microwave frequencies (UHF), based on the dependence of the resonance frequency of bulk coaxial microwave cavity of the electrical parameters embedded in the cavity of the samples of the materials.
• Calculated measurement error.
• The calculation of the dielectric constant epoxy compound and determined its dependence on frequency.
• Evaluated the possibility of applying the method to assess the degradation phenomena in packages of integrated circuits and dielectric materials.
Studies have shown that the investigated method is accurate, reliable and informative.
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