development of total uranium analytical method by l x-ray .../67531/metadc...analytical development...

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Q t WSRC-MS-96-0569 Development of Total Uranium Analytical Method by L X-Ray Fluorescence by R. A. Dewberry Westinghouse Savannah Rier Company Savannah Riier Site Aiken, South Carolina 29808 DISCLAIMER This report was Prepared as an account Of work sponsored by an agency of the United Statcs Government. Neither the United States Government nor any agency thereof, nor any of their empluyees, Illakes express Or implied, or assumes any legal liability or responsi- bility for the aauracj., completeness, or usefulness of any infomation, apparatus, product, Or process disclosed, Or represents that its use would not infringe privately owned rights. Refer- ence herein to any commercial product, process, or service by trade name, trademark, manufacturer- Or othenvise does not necessarily constitute or imply its endorsement, -m- mendation, or favoring bY the United States Government or any agency thereof. The views and Opinions of authors expresstd herein do not necessarily state or reflect those of the United States Government or any agency thereof. * DISTRIBUTW OF THJ~-DOCUME~ t$ UNLIMITED Adocument preparedfor NUCtEAR INSTRUMENTS AND METHODS at , , from - . DOE Contracl No. DE-AC09-89SR18035 This paper was prepared in connection with work done under the above c Department of Energy. By acceptance of this paper, the publisher andor recipient aCknoWledgeS the u b s. Governmenrs right to retain a nonexclusive, royatly-free license in and to any copyright covering this Paperm along with the right to reproduce and to authorize others to reproduce all or part of he paper. \ .I

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Page 1: Development of Total Uranium Analytical Method by L X-Ray .../67531/metadc...ANALYTICAL DEVELOPMENT SECTION WSRC-MS-96-0569 SAVANNAH RIVER TECHNOLOGY SECTION 18 September page 3 of

Q t WSRC-MS-96-0569

Development of Total Uranium Analytical Method by L X-Ray Fluorescence

by R. A. Dewberry Westinghouse Savannah Rier Company Savannah Riier Site Aiken, South Carolina 29808

DISCLAIMER

This report was Prepared as an account Of work sponsored by an agency of the United Statcs Government. Neither the United States Government nor any agency thereof, nor any of their empluyees, Illakes express Or implied, or assumes any legal liability or responsi- bility for the aauracj., completeness, or usefulness of any infomation, apparatus, product, Or process disclosed, Or represents that its use would not infringe privately owned rights. Refer- ence herein to any commercial product, process, or service by trade name, trademark, manufacturer- Or othenvise does not necessarily constitute or imply its endorsement, -m- mendation, or favoring bY the United States Government or any agency thereof. The views and Opinions of authors expresstd herein do not necessarily state or reflect those of the United States Government or any agency thereof.

*

DISTRIBUTW OF T H J ~ - D O C U M E ~ t$ UNLIMITED

Adocument prepared for NUCtEAR INSTRUMENTS AND METHODS at , , from - .

DOE Contracl No. DE-AC09-89SR18035

This paper was prepared in connection with work done under the above c Department of Energy. By acceptance of this paper, the publisher andor recipient aCknoWledgeS the u b s. Governmenrs right to retain a nonexclusive, royatly-free license in and to any copyright covering this Paperm along with the right to reproduce and to authorize others to reproduce all or part of he paper.

\

.I

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Portions of this document may be illegible in electronic image products. Images are produced from tbe best available original dOr?mnent

Page 3: Development of Total Uranium Analytical Method by L X-Ray .../67531/metadc...ANALYTICAL DEVELOPMENT SECTION WSRC-MS-96-0569 SAVANNAH RIVER TECHNOLOGY SECTION 18 September page 3 of

DISCLAIMER

This report was prtpared as an account of work sponsonxi by an agency of.the United States Government. Neither the United States Government nor any agency thereof, nor any of their employcts, makes any warranty, express or implied., or assumes any legal iiability or -responsibility for the accuracy, completeness, or'uscfdncss of ai~y information, apparatus, product, or prooess discloe.or xpresents that its usc would not infiringt privately owned rights. Reference herein to any specific commercial product, process, or senke by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof. The Views and opinions of authors expressed herein do not necessarily srare or reflecr those of the United States Government or any agency thereof.

This report has bctn reproduced directly from the best available copy.

Available to DOE and DOE dontractors from the Office of S4mtific and T&&d Information, P.O. .Box 62, Oak Ridge, TN 37831; prices available from (615) 576-8401.

Available to the public from the National Technical.hformation Service, US. Department of Commerce, 5285 Port Royal Road, Springfield, VA 22161.

-

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I ' L

WSRC-MS-96-0569

DEVELOPMENT OF TOTAL U,RANIUM ANALYTICAL METHOD BY 1 X-RAY FLUORESCENCE

I R . A. Dewberry Savannah River Technology Center Westinghouse Savannah River Company Aiken , SC 29801

ABSTRACT

Thi s paper describes devel perform t o t a l uranium anal added direct ly t o t h e samp U samples i n t h e the advantages o f normally be found zn an ext determined by counting L x- Cd-109 added d i rec t ly to source from t h e detector is included i n the analy

INTRODUCTION

Thi s paper de method of anal range of 1 g/ described use fluoresce t h e fluorescence d ce. The technique of x-ray fluorescence ly t i ca l instruments ex is t which provide anayl ime, inc luding uraniuml. These instruments u measure each element by fluorescence .of the K x-ray d River S i t e we have dev oped and demonstrated an on-l uses a co-57 source t o prescence o f Pu and seve ins t ruments it has bee source and then t o rem detector is not exposed t o it.

The use of Cd-109 as an excitation source for t h e U L x-rays i advantageous. Its decay p r f ive x-ray and 7-ray t r a i n Table 1. absorption edge fo r uraniu ionize the L electrons and not energetic enough t o f l and we can expect t o obtair; active L fluorescence spectra which a r e very clean of anything'but t h e uranium transit ions.

t i n g of an L x-ray fluorescence content i n the

not require an external x-ray

nd generally a re designed t o let. A t t h e Savannah type instrument which

-rays t o measure t o t a l uranium i n the ch case for these e t o t h e exc so tha t the

The Cd-109 t r a ar 22 kev are jus t la

L x-rays of any of the Z > 92 elements,

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c

A N A L Y T I C A L DEVELOPMENT S E C T I O N W S R C - M S - 9 6 - 0 5 6 9 SAVAWNAH R I V E R TECHNOLOGY SECTION 18 September

page 2 of 11

I n the technique we describe here, the Cd-109 spiked activity is introduced directly into t h e l i q u i d sample, and the sample and excitation source are counted simultaneously. large enough that we are able t o count. the fluoresced L x-rays without shielding t h e detector from-the Cd-109 spiked activity. t h i s technique over others sensitive i n t h i s range are simplicity, speed, and that t h i s technique empirically subtracts interferences. If t h e Pu content is low, no chemical preparation of the sample is necessary. No interaction w i t h the counting instrument is necessary after the analysis is initiated.

Note we require t h a t the Pu content of ti7 t o U and produces large quantities o f t h e photons we wish t o count i n t h i s fluoresc Since a l l Pu isotope decay w i t h half-lives much shorter than eith or U-238, atom contents of PU up t o ~ 1 0 0 t h r s u l t i n significa interference i n t h i s analysi t h i s interference is that the L x-rays from Pu decay are passive transitions and do not contribute t o the active fluorescence spectrum. Th the blank sample spectrum and ca active spectrum.

I n t h e event that the Pu content of t h e introduced i n the analysis. Rather t h e i n t h e measuremen t o dominate t h e results. That is the s u

the active s p e e ld a n e t small a ls that t h e sample must be

The cross section for ionization of t h e U L x-rays is .

The advantages of

ample is very low. L x-rays, which are the same

Pu a-decays

o large, no bias is

the passive bac

nty i n t h e data

PRINCIPAL OF MEASUREMENT - The mode of fluorescence used i n t h i s techniq depicted i n Figure 1. tates of Ag-10 emitting K x-rays w i t h energies o f 21.990-, y-ray of energy 88.034-keV. The two lowest are particularly suited i n energy t o fluore n cross section for t h i s fluorescence can estimated from available d be 43 cmz/g. Thus a 1 g/l U solution w i t h a 1 cm absorption 1 absorb these K x-rays a t t h e rate

Cd-109 decays w i t h a 463-day half-li .603-keV and a

U L x-rays.

I = Io exp [(-1)(43)(0.001)] (1)

where IO is t h e i n i t i a l intensity of Cd-109 K x-rays. The f for these L x-ray holes is approximately 0.5 41, so $he rat L x-rays from a 1pCi sp ike of Cd-109 is

0.51(1 - 0.958)(3.7 x lo4) = 790 <U L x-rays)/sec. (2)

Thus t h e ra t io of U x-rays t o transmitted Ag x-rays is i n the range of 0.02, and we Can count t h e fluoresced L x-rays i n the presence of the excitation source without s h i e l d i n g the detector from the source. relative intensit ies of t h e U L x-rays obtdined are shown i n Tqble 2.

The energies and

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A N A L Y T I C A L DEVELOPMENT S E C T I O N W S R C - M S - 9 6 - 0 5 6 9 SAVANNAH R I V E R TECHNOLOGY S E C T I O N 1 8 September

page 3 o f 11

Since t h e technique is based on the sample absorption of 22xkeV x-rays, it is obvious that the fluoresced L x-rays of approximately 17 keV x-rays w i l l themselves be strongly self-absorbed by the sample. method t o measure the sample self-absorption and t o correct for it. describe our sample self-absorption correction below based on the approach used i n reference 5.

We require a We

EXPERIMENT AND RESULTS

To demonstrate the fluorescence technique we made five U solutions i n 2M HN03 w i t h U contents of 1-, 4-, 6-, 8-, and 15-g/l. Then 5ml aliquots of each were pipetted in to p las t ic v i a l s o f 25 m i capacity. items w i t h a 4-cm circular base and a wall thickness of 2 mm.

exposure of t h e l iqu i#d sample t o the detector active area and t o minimize absorption of photons by the vial .

The v ia l s are screw They are

t o sit on an up-looking photon detector provide maximum surface

Each of the samples was placed on the up-looking surface of a Si(Li) low energy photon detector w i t h an active surface area of 80 mm2 and an operating

calibration. keV was taken for each sa Canberra Series 90 Multic

Each sample was then s p i counted i n - t h e same conf blank sample was a l so s p sample is shown i n Figure 3. 3.4% was obtained. The previously s tor normalized t o 1000 seconds and subtract spectrum. For each o f t h and 17.2-keV L x-ray peak 22.2-keV K x-ray peak was'obtained. tabulated as xs i n Table 3.

The data of xs are shown p t ted i n Figure 4 i n the 1 the curve is significantly concave downward-due t o t h

It is clear that sample abs causes a negative bias i n the detected fluorescence r

1000 V. The detector had a 2 u b l e t of K x-rays a t 5.9 keV an

A 300 sec passive x-

Note i n the f i g u

The r a t io between these two quantit ies is

- o f the uranium L x-rays. -

increases.

To correct fo r t h e sample self-abs ption effect, we constr shown i n Figure 2(b). T h i s v ia l h a 2 gram sample of nat by epoxy t o the under surface of the screw cap; The uraniu suspended 1 cm above the surface of the sample, and t h e ac t spectrum was again collected for 1000 sec for each sample a w i t h t h e f o i t i n p l is U L x-ray t o Ag K x-ray ra t io is tabulated i n '

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, I 4

A N A L Y T I C A L DEVELOPMENT S E C T I O N W S R C - M S - 9 6 - 0 5 6 9 SAVANNAH R I V E R TECHNOLOGY S E C T I O N 18 September

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I n the conf igurat ion o f Figure 2(b), Ag K x-rays escape the sample and fluoresce the U L x-rays i n the U f o i l i n the same mechanism t h a t occurs i n the sample. reach the detector, and i n t h i s way the act ive spectrum i s a sum o f sample fluorescence and f o i l fluorescence. Since sample x-rays and f o i l L x-rays both su f fe r from sample absorption, t h i s technique o f analysis provides a very good method o f empir ica l ly subtracting the e f fec t o f sample self-absorption.

Using the method o f referen 5 for photon transmissio transmission correct ion fac s and corrected detect io as shown i n the fol lowing. We determin the sample se a(i) f o r each sample from

These fo i l - f luoresced L x-rays must then traverse the sample t o

(3) x 0

where xo i s the x t value obtained f o r the blank.

For example, since x t f o r sample 1 i s 0. 0.01397, then

, and xs i s 0.01246, and xo i s

= 0.7974. 0.02360 - 0.01246’ 0.01397

a(i) =

We then determine a correct ion factor CF(i) f o r each sample by

(4) -In a (i) 1 -a (i)

CF(i) =

So the correct ion fac to r f o r sample 1 i s 1.1 . The correct fluorescent y i e l d f o r each sample i s

CC(i) = CF(i) x xs(i), (51

where CC(i ) i s the corrected count (L t o K ra t io) o f sample i , the calculated correct ion factor. reference 5 pages 1-1 through 1-12.

The resu l t i ng correcte These data show t h a t t orrect ion has aightened the rescence curve. The di f ference between the two curve demonstrates the ma ude o f the se l f - absorption e f fec t , which i n the case f the 15 g / l sample factor o f two correction.

Equations (3) through (5) a r

unt data are p n Figure 4 i n the upper curve.

greater than a

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A N A L Y T I C A L DEVELOPMENT S E C T I O N W S R C - M S - 9 6 - 0 5 6 9 SAVANNAH R I V E R TECHNOLO SECTION 18 September

page I 5 of 11

CONCLUSION

T h i s experiment has demonstrated the u t i l i t y of the i x-ray fluorescence analysis of uranium u s i n g an internal excitation source The samples i n the range of 1 g/ l t o 15 g / l can be dete counting time o f less than one hour. section for,uranium u s i n g 22.1-keV x-rays as the excitation source i (43 cm*/g) that the detector can be exposed t o the excitation source causing an unacceptable dead time.

T h i s technique requires no chemical treatment of t h e sample when it less than -0.lg Pu/ l . ins t rument is ini t ia t ion of each count. analyzer of the instrument can be set up tomatically store the t h e appropriate memory segment, acquire t ive spectra, perform subtraction, and provide the 5, x t , and xo for eac run, w i t h one task command. can also be set up t o calculate and the precision obtained for each measurement.

The advantages that t h i s technique of U dete dependent techniques and over external excit techniques are elaborated below.

i k e i n the sample. ned w i t h an overall orption cross The fluorescence

The only operator interaction w i t h t h e analys With preparation t h e multic

-

nation provide over matrix fluorescence

The system is simple t o operate, as no excitati source instrument exis complicate operation. Initiation of each _spect collection w i t h a s i n task command can be the only operator interaction required. automatically collects the spectrum, s u b t c t s background, and displays the peak ra t io data and errors needed for sub quent calculations using equations (3) through (5)

The technique empirically subtracts interferences from U self-absorption and any other matrix absorption effect. Larg interferences from too much Pu i n t h e sample are signalled by large impreci alues xs and x t . For samples w i t h large U L x-ray contribution y, the values xs and x t will be large and very near each other i n v the uncertainty i n these values w i l l become larger an the difference between them, and t h e self-absorption factor a(i) cal ated i n (3) can go negative from random variation.

The system

Using t h e ra t io of U fluorescent yield t o transmitted Ag x-rays automatically normalizes the data t o remove deadtime corrections and decay of excitation source s t r e n g t h . Thus exact knowledge o e sp iked activ not required. The Cd-109 source has a long (463 day) h everal years of free excitation.

l i f e , t h u s ass

The data from t h i s experiment have demonstrated t h e u t i l i t y over the l i m i t e d range of 1 g/l t o 15 g/ l .

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Table 3

Fluorescent yield data and co range 1 g/l to 15 g/l . The u corrected data are tabulated as xt. Corrected and uncorrected yields are explained in

cted yield results fo rrected data are tabu CC.

quid U samples in the d as XS, and the

The sample plus U foil data are tabulated The correction factors are listed in the urth column as CF.

U XS xt 0 (no units1 (no units1

0 ----- 0.01397 1.000 0.01397

0.992 3.970 6.000 7.937 15.00

0.01246 0.03976 0.05600 0.07300 0.11187

0.02360 0.04730 0.06319 0.07627 0.11400

1.117 1.340 1.369 1.896 2.219

, 0.01392 0.05327 0.07664 0.1384 0 - 24826

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L

,

. Determination

""Cd

\ 463d O9Ag + 22.1 63' keV X-Ray

X-Rays 1 09 Ag u- U + LX-Rays

FIGURE 1. Schematic R8preS8ntatiOn of U L X-Ray Fluorescence by"39Cd Decay

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' ,. * --

0 .

r 3

Detector X-PHP(

. . . . . . . . _ _ . ... - - .

. .

Sample Vial U +- loSCd Spike

Sampie Vial U + '%d Spike

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Dead Time = 3.4% IUI = a gtr ' Cd

I

I - 0) C . 8

a . 2 ~ -- 3 0 0

-. - 4.1K logCd -

1 32.5

4 4 ~ -1 1

2.8 17.7 E (keV)

- : , FIGURE 3. U L X-Ray Spectrum Obtained using the Counting Configuration of Figure 2(a) with an 8 g/l U Solution and a 2pCi lWCd Spike in the Sample as Described in the Text

. Y

r: 8

I

3 . L . .

1

F

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