comparative analysis of 32 bit carry look ahead adder...

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International Journal of Science, Engineering and Technology Research (IJSETR), Volume 3, Issue 10, October 2014 ISSN: 2278 7798 All Rights Reserved © 2014 IJSETR 2768 COMPARATIVE ANALYSIS OF 32 BIT CARRY LOOK AHEAD ADDER USING HIGH SPEED CONSTANT DELAY LOGIC V.Reethika Rao (1) , Dr.K.Ragini (2) PG Scholar, Dept of ECE, G. Narayanamma Institute of Technology and Science, Hyderabad, India. (1) Assistant Professor, Dept of ECE, G. Narayanamma Institute of Technology and Science, Hyderabad, India. (2) Abstract: In this paper, high speed constant delay logic is implemented for32 bit carry look ahead adder. The objective of CD logic is to reduce power dissipation and mainly speed in the critical path of carry generation (longest path from first to last carry output). The 32 bit CLA is implemented with other logics and the results are tabulated and compared. From the implementation results, the low power and high speed CD logic shows better power reduction and less delay by 40% than other method. The PDP is therefore better than the existing method. Simulation is done using H spice 2008.03 soft ware and the delay is checked using CosmoScope z 2007.03 software. 1.0 INTRODUCTION The main challenging areas in VLSI are performance, cost, testing, area, reliability and power. The demand for portable computing devices and communication system are increasing rapidly. These applications require low power dissipation. The main aim of these devices is to generate low power with high fault coverage. Generally power dissipation of a system in test mode is more than in normal mode. The ability to design, fabricate and test Application Specific Integrated Circuits (ASICs) as well as FPGAs with gate count of the order of a few tens of millions has led to the development of complex embedded SOC. Testing of integrated circuits is important to ensure high level of quality in products. The Built-In- Self-Test (BIST) is one of most popular test solutions to test the embedded cores. Test pattern generation is vital in any BIST circuit. Since off-chip communication between the FPGA and a processor is bound to be slower than on chip communication, in order to minimize the time required for adjustment of the parameters, the built in self test approach is proposed for this method. Analysis of power for testing: Various sources of power dissipation in CMOS are, Static Power Dissipation Dynamic power Dissipation Static Power Dissipation: It is the power dissipated when there is no switching activity within the circuit. Ideally, CMOS circuit dissipates no static power, since there is no direct path from V DD to GND. But practically MOS transistor never acts as perfect switch. There is always leakage current which flows when the input(s) to and the outputs of a gate are not changing, leads to static power dissipation. It is the short circuit current that flows when V DD is connected to V SS during

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International Journal of Science, Engineering and Technology Research (IJSETR), Volume 3, Issue 10, October 2014

ISSN: 2278 – 7798 All Rights Reserved © 2014 IJSETR 2768

COMPARATIVE ANALYSIS OF 32 BIT CARRY LOOK

AHEAD ADDER USING

HIGH SPEED CONSTANT DELAY LOGIC

V.Reethika Rao(1)

, Dr.K.Ragini(2)

PG Scholar, Dept of ECE, G. Narayanamma Institute of Technology and Science, Hyderabad, India. (1)

Assistant Professor, Dept of ECE, G. Narayanamma Institute of Technology and Science, Hyderabad, India. (2)

Abstract:

In this paper, high speed constant delay logic is

implemented for32 bit carry look ahead adder.

The objective of CD logic is to reduce power

dissipation and mainly speed in the critical path of

carry generation (longest path from first to last

carry output). The 32 bit CLA is implemented

with other logics and the results are tabulated and

compared. From the implementation results, the

low power and high speed CD logic shows better

power reduction and less delay by 40% than other

method. The PDP is therefore better than the

existing method. Simulation is done using H spice

2008.03 soft ware and the delay is checked using

CosmoScope z 2007.03 software.

1.0 INTRODUCTION

The main challenging areas in VLSI are performance,

cost, testing, area, reliability and power. The demand

for portable computing devices and communication

system are increasing rapidly. These applications

require low power dissipation. The main aim of these

devices is to generate low power with high fault

coverage. Generally power dissipation of a system in

test mode is more than in normal mode. The ability to

design, fabricate and test Application Specific

Integrated Circuits (ASICs) as well as FPGAs with

gate count of the order of a few tens of millions has

led to the development of complex embedded SOC.

Testing of integrated circuits is important to

ensure high level of quality in products. The Built-In-

Self-Test (BIST) is one of most popular test solutions

to test the embedded cores. Test pattern generation is

vital in any BIST circuit. Since off-chip

communication between the FPGA and a processor is

bound to be slower than on chip communication, in

order to minimize the time required for adjustment of

the parameters, the built in self test approach is

proposed for this method.

Analysis of power for testing:

Various sources of power dissipation in CMOS are,

Static Power Dissipation

Dynamic power Dissipation

Static Power Dissipation:

It is the power dissipated when there is no

switching activity within the circuit. Ideally, CMOS

circuit dissipates no static power, since there is no

direct path from VDD to GND. But practically MOS

transistor never acts as perfect switch. There is

always leakage current which flows when the input(s)

to and the outputs of a gate are not changing, leads to

static power dissipation. It is the short circuit current

that flows when VDD is connected to VSS during

International Journal of Science, Engineering and Technology Research (IJSETR), Volume 3, Issue 10, October 2014

ISSN: 2278 – 7798 All Rights Reserved © 2014 IJSETR 2769

transition between high to low or low to high at any

node.

The static power dissipation is given by

P static = V DD* I leakage (1)

Ileakage= is (eqV/kT-1) (2)

Where Vdd is the supply voltage

is is reverse saturation current

V is diode voltage

K is Boltzmann’s constant (1.38Ψ 10-23 J/K)

Q is electronic charge (1.602Ψ 10-19 C)

T is temperature

Dynamic Power Dissipation:

It is due to switching transient current and

charging & discharging of load capacitance.

Transient power consumption is due to the current

that flows only when the transistors of the devices are

switching from one logic state to another. The

average power consumption of internal circuit node i

can be given by

Pi=0.5Vdd2C0FiSif (3)

Where f is the clock frequency

C0 is load capacitance

The product of Fi and Si is called the weighted

switching activity of internal circuit node i.

Carry Look a head Adder:

CLA differs from the RCA in the case of carry

generation. The CLA performs the carry generation

using the generate and propagate and the carry

doesn’t get rippled to the next bit. We implement 32-

bit CLAs to further analyze CD logic’s performance.

The detailed operations of CLA are described in and

the schematic is displayed. The 32-bit CLA uses

eight 4-bit FAs with dedicated circuitry to facilitate

carry generation. The energy-efficient FA used in this

analysis utilizes pass transistor logic styles with only

24 transistors for sum generation. For the carry

generation, only the critical path is replaced with

different logic style. The maximum fan-in is limited

to four, except in the case of dynamic domino logic

due to the footer transistor. In this case, the 4-bit

critical carry generation path of CLA is

Carry3:0 = G3 + P3 (G2 + P2 (G1 + P1 (G0)))

Where G and P are the generate (A・B) and

propagate (A⊕B) signals, respectively. CDL are

implemented to reduce the number of fan-ins. One

can utilize the inversion property and rearrange

G1:0 = G1 + P1G0, P3:2 = P3P2

G3:2 = G3 + P3G2, G3:0 = G3:2(P3:2 + G1:0).

Figure 1 32 bit CLA block diagram

2.0 EXISTING TECHNIQUE

2.1 DOMINO DYNAMIC 32 BIT CLA:

Figure 2 Sum Generations for the CLA

The sum generation is done using the above circuit

shown in fig 2 and this uses the pass transistors

International Journal of Science, Engineering and Technology Research (IJSETR), Volume 3, Issue 10, October 2014

ISSN: 2278 – 7798 All Rights Reserved © 2014 IJSETR 2770

Figure 3 4 bit Carry generations of Domino-dynamic

logic in 32 bit CLA

The fig 3 is for the carry generations in the domino-

dynamic logic. This logic carry isgenerated by the

generate ’G’ and propagate ’P’blocks.Where the

Propagate P= A XOR B

Generate G=A AND

The carry in is given to the first bit and the

carry to the next 4 bit block is generated by the above

circuit.The above circuit is implemented by the

equation given below

Carry3:0 = G3 + P3(G2 + P2(G1 + P1(G0))).

International Journal of Science, Engineering and Technology Research (IJSETR), Volume 3, Issue 10, October 2014

ISSN: 2278 – 7798 All Rights Reserved © 2014 IJSETR 2771

Figure 4. Output waveforms of domino dynamic 32

bit CLA.

The above fig 4 shows the output waveforms of the

32 bits of the outputs of every single 1 bit full adder

and each 4 bits are shown in separate window for the

clear view of the output waveforms and every sum

and carry out put are verified as full adder and the

frequency is trans wave up to 100nano seconds with

the supply voltage vdd=1.8v.

3. LATEST METHOD

Figure 5 CD logic carry circuit

Figure 6 CD logic sum circuit

3.1 CD Logic Operations

To mitigate the above-mentioned problems, CD logic

is proposed with a schematic shown in Fig. 7(a).

Timingblock(TB) creates an adjustable window

period to reduce the static power dissipation. Logic

Block (LB) helps to reduce the unwanted glitch and

also makes cascading CD logic feasible.A buffer

implemented in CD logic with schematics of TB and

LB is shown in fig 7(a) & (b).

When CLK is low, CD logic enters the

evaluation period and three scenarios can take place:

namely, the contention, C-Q delay, and D-Q delay

modes. The contention mode happens when CLK is

low while IN remains at logic "1." In this case, X is at

a nonzero voltage level which causes Out to

International Journal of Science, Engineering and Technology Research (IJSETR), Volume 3, Issue 10, October 2014

ISSN: 2278 – 7798 All Rights Reserved © 2014 IJSETR 2772

experience a temporary glitch. The duration of this

glitch is determined by the local window width,

which is determined by the delay between CLK and

CLK_d. When CLK_d becomes high, and if X

remains low, then Y rises to logic "1," and turns off

M1.Thus the contention period is over, and the

temporary glitch at Out is eliminated. C-Q delay

mode takes places when IN make a transition from

high to low before CLK becomes low. When CLK

becomes low, X rises to logic "1" and Y remains at

logic "0" for the entire evaluation cycle. The delay is

measured by the falling edge of both CLK and Out:

hence the name C-Q delay. D-Q delay mode utilizes

the pre-evaluated characteristic of CD logic to enable

high-performance operations. In this mode, CLK falls

from high to low before IN transit, hence X initially

rises to a nonzero voltage level. As soon as IN

become logic "0," while Y is still low, then X quickly

rises to logic "1.

Figure 7. (a) CD logic block diagram (b) buffer

4.0 RESULTS AND DISCUSSIONS

PROPOSED TECHNIQUE

CD 32 bit CLA:

Figure 8 Sum Generations for the CLA

The sum generation is done using the above circuit

shown in fig 8 and this uses the pass transistors

Figure 9 8 bit Carry generations of CD logic in 32

bit CLA

The fig 9 is for the carry generations in the CD logic.

This logic carry is generated by the generate ’G’ and

propagate ’P’blocks.

Where the Propagate P= A XOR B

Generate G=A AND B

The carry in is given to the first bit and the carry to

the next 4 bit block is generated by the above circuit.

The above circuit is implemented by the equation

given below

Carry3:0 = G3 + P3(G2 + P2(G1 + P1(G0)))

International Journal of Science, Engineering and Technology Research (IJSETR), Volume 3, Issue 10, October 2014

ISSN: 2278 – 7798 All Rights Reserved © 2014 IJSETR 2773

Figure 10 Simulated output waveforms of the CD

logic in 32 bit CLA

The outputs of the cla is presented above and with

each window showing the outputs of the 4 bits

each.the outputs are verified to be as that of a full

adder function and the outputs are plotted at the

voltage supply of vdd=1.8v of trans 100nsec.

The delay of the CD logic is thoroughly

enhanced and its speed increases and the power

consumption is also less.

International Journal of Science, Engineering and Technology Research (IJSETR), Volume 3, Issue 10, October 2014

ISSN: 2278 – 7798 All Rights Reserved © 2014 IJSETR 2774

Discussions on proposed CD logic:

Table 1 Simulation results of 32 bit CLA

Domino

dynamic

CD

logic

Avg

power(W)

2.03E-4 2E-4

Propagation

delay(sec)

176.67E-

12

105.45E-

12

Power

delay product

358.4E-

16

210.9E-16

The power of the pseudo dynamic logic is more as

the static power dissipation is present and the delay

of the pseudo is more compared to the other logics

and the delay of the CD logic style is less and power

consumption is less and the PDP of the CD logic is

best compared to domino dynamic logic.

5.0 CONCLUSIONS

CD logic is high performance logic style with the

self-reset circuitry. The timing block reduces the

contention and power consumption is reduced. The

delay is reduced in the critical path as the circuitry

has an advantage of pre-evaluation in the D-Q delay

mode and this reduces the delay.

In 32 bit CLA CD logic is 40.4% faster than domino

dynamic.PDP of 32 bit CLA is 41.4% and 59% of cd

logic. CD logic primarily concentrates on delay

improvement at the critical path and yields better

PDP.

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