characterization of nano-oxide layer in specular spin valve multilayer
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Thin Solid Films 475
Characterization of nano-oxide layer in specular spin valve multilayer
D.H. Lee*, S.Y. Yoon, J.H. Kim, S.J. Suh
Advanced Materials and Process Research Center for IT, Sungkyunkwan University, 300 Chunchun-dong, Jangan-gu, Suwon, Gyunggi-do, 440-746, Korea
Available online 25 August 2004
Abstract
To characterize the nano-oxide layer (NOL) in specular spin valve multilayer, naturally oxidized CoFe layer was inserted between pinned
CoFe layers. The under-, optimum, and over-oxidized samples were obtained by control of the oxidation time and the oxygen flow rate. The
NOL was analyzed to be Fe oxide mainly by X-ray photoelectron spectroscopy (XPS) data. As oxidation increased, the content of Fe oxide
and the thickness of the NOL increased and too much thicker NOL was obtained in case of over-oxidation. We concluded that the lower
magnetoresistance (MR) ratio and the more slanted magnetization curve than the optimum could be attributed to the Fe oxide as a non-
ferromagnetic defect or magnetic discontinuity in case of under-oxidation and the too thick NOL in case of over-oxidation.
D 2004 Elsevier B.V. All rights reserved.
Keywords: NOL; MR ratio; XPS; Fe oxide
1. Introduction
A multilayer system of specular spin valve giant
magnetoresistance (GMR) is one of the promising systems
for magnetic read head, because it is compatible with high
density recording media due to its high sensitivity and very
thin sensing layer.
The key layer in specular spin valve multilayer is known
to be the nano-oxide layer (NOL) between ferromagnetic
pinned layers, which reflects conduction electrons, thus
increases the magnetoresistance ratio (MR ratio) [1]. There
are several ways to form this NOL; plasma oxidation [2,3],
reactive sputtering, and natural oxidation [4,5]. Also, these
oxidation processes can change the property of NOL and, as
a result, the speculation of conduction electrons and
magnetic coupling between two ferromagnetic pinned
layers.
The NOL can be characterized by its microstructure and
oxidation state. However, the oxidation state and fine
structure of the NOL have not been studied thoroughly
and are still unclear. In this study, we tried the natural
oxidation process varying the oxidation condition, such as
0040-6090/$ - see front matter D 2004 Elsevier B.V. All rights reserved.
doi:10.1016/j.tsf.2004.07.028
* Corresponding author. Tel.: +82 31 290 7373; fax: +82 31 290 7377.
E-mail address: [email protected] (D.H. Lee).
flow rate and oxidation time. We found the optimum
oxidation condition to get the maximum MR ratio and
Hex. Also, the optimum oxidized sample was compared with
the under-oxidized and the over-oxidized samples, espe-
cially focused on the chemical property of the NOL. Finally,
we tried to relate this result to the magnetic properties of
specular spin valve multilayer with oxidation condition.
2. Experiment
Specular spin valves of Si substrate/Ta 5/NiFe 3.5/IrMn
6/CoFe 2(P1)/NOL/CoFe 2(P2)/Cu 2.5/CoFe 4(F)/Ta 2.5
multilayer were deposited by magnetron sputtering system.
The numerical values show the thickness in nm of each
layer. The Co–Fe layer in contact with the Mn–Ir layer is
called pinned layer and the Co–Fe layer situated above Cu
layer-free layer. The seed layer Ta/NiFe was used to
promote the (111) texture of antiferromagnetic Mn–Ir layer.
The base pressure was less than 3�10�8 Torr. Mn81–Ir19at.% was deposited from a Mn target with Ir chips attached
to it. A Ni81–Fe19 wt% and a Co90–Fe10 at.% alloy target
were used for the corresponding layers. The samples were
deposited under 5 mTorr of Ar at room temperature. In order
to induce unidirectional anisotropy, we applied a magnetic
field of 100 Oe to the samples during the process.
(2005) 251–255
D.H. Lee et al. / Thin Solid Films 475 (2005) 251–255252
The NOL was formed in the load lock chamber by
exposing to pure oxygen gas. Varying the oxidation time
from 15 to 60 s and the oxygen flow rate from 10 to 50
sccm, optimum, under-oxidized, and over-oxidized NOLs
was obtained. Post-annealing of 200 8C for 30 min under
magnetic field of 3 kOe induced the magnetic anisotropy
and stabilized the NOL.
The MR ratio is defined as: MR ratio=[R(maxi-
mum)�R(minimum)]/R(minimum)�100. Hex was meas-
ured from the shift of the M–H loop away from the zero-
field axis. These are obtained from four-point probe
method and vibrating sample magnetometer (VSM),
respectively.
The chemical property was analyzed with the X-ray
photoelectron spectroscopy (XPS-ESCA2000 from VG
Microthech) X-ray of 13 kV was extracted from Mg anode.
Regarding the analyzer, the pass energy was 20 eV and the
energy resolution was 0.2 eV. The binding energy was
calibrated with the surface carbon. During the XPS analysis,
the sample was etched with the rate of 0.2 nm/min and depth
profiles were obtained. The peaks of Co 2p and Fe 2p were
used to analyze the NOL.
Fig. 1. The variation of MR ratio as a function of oxygen flow rate and
oxidation time. Samples were annealed after deposition at the temperature
of 200 8C. The under-, optimum, and over-oxidation conditions are
indicated.
3. Results and discussion
Natural oxidation was carried out after the deposition of
P1 layer by exposing this layer to the low pressure oxygen
gas. To find out the optimum oxidation condition, at which
maximum MR ratio and Hex were obtained, oxidation time
and oxygen flow rate were changed. According to Fig. 1,
generally, it was good to be said that as the oxidation
increased, MR ratio and Hex increased to their maximum
values and then decreased. These results showed that the
NOL affect the MR and Hex in three different ways as the
oxidation goes on. We could get maximum MR ratio of
10.3% and Hex of 320 Oe when it was oxidized for 30 s with
the oxygen flow rate of 30 sccm. We assigned it as optimum
condition. The condition of 15 s with 10 sccm and 60 s with
50 sccm were assigned as under-oxidation and over-
oxidation conditions, respectively. Their MR ratio and Hex
are listed in Table 1. These results indicated that the
condition of the NOL can be related to magnetic properties
of specular spin valve because the change of the oxygen
flow rate and oxidation time can vary the micro and
chemical structure of NOL.
Fig. 2 shows the MR curves of optimum, under- and
over-, oxidation conditions. For the optimum sample, a
higher Hex, MR ratio, and a plateau in the field region of 0–
300 Oe were obtained. However, for the under oxidized
sample, a lower Hex, MR ratio, and a narrow plateau region
were obtained. Also, for the over-oxidized sample, there is
no plateau region. These results suggested that a shape of
the R–H curve was also related to the oxidation condition of
the NOL. As increasing the applied field, the MR jumps up
to the maximum by magnetization rotation of F layer. The
steep increase of MR indicates the coherent and soft rotation
of F layer. Further increase of the applied field rotates the
pinned layer and it shows slanted hysteresis curve. As
shown in Fig. 2, the under- and over-oxidized samples have
more slated curves than the optimum one. Fig. 3 shows the
M–H curve obtained form VSM, where a hysteresis loop
placed at the lower left is obtained from a free layer and a
hysteresis at the upper right is from a pinned layer. The
pinned layer of the over-oxidized sample (Fig. 3(b)) shows
an asymmetric hysteresis, whereas the pinned layer of the
under-oxidized sample (Fig. 3(b)) shows a symmetric
hysteresis. That is to say, there can be two reasons for
slanted curve of pinned layer. If the hysteresis loop of
pinned layer is symmetric, it can be said that the layer is
composed of magnetically single layer and the layer
converts its magnetization coherently. However, in case of
asymmetric hysteresis loop, the layer can be composed of
magnetically different layers, for example, different
exchange field or coercivity. The over-oxidized sample
had asymmetric hysteresis loop. It can be said that the
pinned layer is composed of magnetically different two
layers but they are separated ambiguously by NOL. The
optimum one showed similar asymmetry of loop. While on
the other hand, the under-oxidized sample had symmetric
hysteresis loop of pinned layer. It means that the layer acts
Fig. 3. Magnetization curves for the oxidation condition of NOL indicated
in Fig. 1.
Table 1
MR ratio and exchange biased field (Hex) for the oxidation condition of
NOL indicated in Fig. 1
Oxidation condition Under Optimum Over
Hex (Oe) 200 320 147
MR (%) 9.4 10.3 8.4
D.H. Lee et al. / Thin Solid Films 475 (2005) 251–255 253
as a single layer and the NOL does not play a role as a
separating layer.
For these samples, XPS analysis was carried out. By
etching the sample, Co 2p, Fe 2p, and O 1 s peaks were
surveyed. The point where the highest oxygen peak was
observed during the pinned layer survey was designated to
the center of NOL. Firstly, not shown in here, we analyzed
the Co XPS result. As oxidation progressed, a distinct
shoulder on the high binding energy side of Co 2p peak
indicates the presence of some Co oxide in the NOL
region. However, we cannot calculate or acquire the exact
quantity of Co oxide due to low oxidation of Co.
However, as oxidation goes, the more Co oxide may be
generated. Also, after oxidation, the amount of magnetic
moment loss of pinned layer supports the presence of Co
oxide in the NOL region. In case of Fe, however, Fe oxide
was dominant. The peaks of Fe 2p in the NOL region are
shown in Fig. 4. It is obvious that most of Fe in the NOL
region is oxidized in contrast to the Co. The depth profile
of Fe 2p2/3 peaks was obtained from manual peak fitting.
We referenced the handbook of XPS to fit of Fe 2p2/3peaks [6]. It shows two kinds of Fe oxide–FeO (709.82
eV) and Fe2O3 (710.64 eV), and metallic Fe (707.14 eV)
as shown in Fig. 4(b). In addition, the Fe oxide is
composed of FeO and Fe2O3. This indicated that the
magnetic properties and shape of magnetization curve can
be affected by Fe oxide. Fig. 5 shows the depth profile of
Fe oxide around the NOL. The depth profiles have
Gaussian-like profile. Fitting by this function, we esti-
Fig. 4. XPS narrow scans of Fe 2p peaks for (a) the oxidation condition
indicated in the Fig. 1 and (b) the fitting result of optimum Fe XPS spectra.
Fig. 2. MR curves for the oxidation condition of NOL indicated in the
Fig. 1.
Fig. 5. XPS depth profile of Fe oxide for the oxidation condition of NOL
indicated in Fig. 1. The content of Fe oxide was deduced from the relative
peak area to that of the metallic Fe.
D.H. Lee et al. / Thin Solid Films 475 (2005) 251–255254
mated the thickness of the NOL by the width of the
Gaussian function. Our previous TEM result shows that, in
case of optimum oxidized sample, the NOL is formed
discontinuously and the thickness is about 0.5–2 nm and
some NOL regions are so thin that the upper CoFe layer is
directly connected with the lower CoFe layer [7]. We
estimated the NOL thickness from considering Fe oxide
distribution since the NOL mainly composed of Fe oxide.
The over-oxidized sample had the thickness about
1.8F0.176 nm, and the under-oxidized and the optimum
samples had the thickness about 1.5F0.054 and 1.4F0.129
nm, respectively. The estimated NOL thickness from XPS
well agreed with TEM result. However, there may be
difference between the estimated thickness of NOL from
XPS and that of actual thickness with oxidation condition
since we only consider the distribution of Fe oxide. The
content of Fe oxide in under-oxidized sample was lower
than the optimum and over-oxidized samples. This means
that only a part of Fe is oxidized in case of under-oxidized
sample due to the lack of oxygen. In case of over-oxidized
sample, the as-deposited NOL had excess oxygen and it
diffused out from NOL during the post-annealing. The
thicker NOL could be attributed to this.
The preferential oxidation of Fe against the Co could be
attributed to the concentrated Fe at the grain boundary and
the surface of the P1 [8]. So it could be said that Fe was
oxidized preferentially and the Co and the remnant Fe
present in the inner part were not oxidized. According to
Gillies et al. [8], Fe oxides are indispensable to the specular
reflection of conduction electrons. In our case, we can
suggest that the preferential oxidation of Fe made specular
oxide layer at the surface of P1.
Considering the above results, the magnetic properties
and structure of NOL depended strongly on the oxidation
condition. In case of the under-oxidation, the content of
Fe oxide was relatively small comparing with the
optimum and over-oxidation. However, its distribution
range was comparable to the optimum. So the density of
the oxide is low and it cannot make a continuous oxide
layer but a non-ferromagnetic defect or magnetic disconti-
nuity. Thus, the P1 and the P2 are not separated firmly.
The symmetrically slanted curve of the under-oxidized
sample can be attributed to this defect that obstructs the
coherent rotation of magnetization in the pinned layer.
That is to say, as oxidation goes on, firstly the Fe-oxide
islands will be developed at grain boundaries of CoFe
layer [8] and this small amount of Fe oxide may act as a
non-ferromagnetic defect or magnetic discontinuity in the
CoFe pinned layer although many direct contacting paths
will exist in under oxidized NOL. This Fe oxide in the
NOL may be reason for the slant R–H curve and lower
MR ratio of the under oxidized specular spin valve. The
symmetric slanted curve of the under-oxidized sample can
be attributed to this Fe oxide that obstructs the magnet-
ization rotation. In the case of the optimal oxidized NOL,
a mixture of island and layer of mainly Fe-oxide may
exist. Also direct contacting path between P1 and P2 will
exist and less disruption of the CoFe grain structure [7].
At the over-oxidation condition, the direct path will be
diminished and the continuous layer growth will be
predominant. The Fe oxide and Co oxide may invade
into grain of CoFe. This microstructure may lead to a
lower MR ratio and a slant R–H curve.
4. Conclusion
To characterize the NOL of specular spin valve multi-
layer, we had made differently oxidized samples and
analyzed them. As a result of XPS study, we could find
out that Fe was oxidized preferentially and the thickness of
NOL was around 1.4–1.8 nm depending on the oxidation
condition. The slanted MR curve and the lower MR ratio
can be attributed to the Fe oxide as a non-ferromagnetic
defect or magnetic discontinuity in case of the under-
oxidation and to the too thick NOL in case of over-
oxidation, respectively.
Acknowledgement
This work was supported by the Advanced Materials and
Process Research Center for IT at Sungkyunkwan Univer-
sity (Grant No. R12-2002-057-01001-0).
References
[1] Y. Kamiguchi, H. Fukuzawa, K. Koui, Intermag Conf. (1999) DB-01.
[2] S. Sant, M. Mao, J. Kools, K. Koi, H. Iwasaki, M. Sahashi, J. Appl.
Phys. 89 (2001) 6931.
D.H. Lee et al. / Thin Solid Films 475 (2005) 251–255 255
[3] D.M. Jeon, J.P. Lee, D.H. Lee, S.Y. Yoon, Y.S. Kim, S.J. Suh, J. Magn.
Magn. Mater. 272–276 (2004) 1903.
[4] M.F. Gillies, A.E.T. Kuiper, G.W.R. Leibbrant, J. Appl. Phys. 89
(2001) 6922.
[5] F. Shen, Q.Y. Xu, G.H. Yu, W.Y. Lai, Z. Zhang, Z.Q. Lu, G. Pan, Abdul
Al-Jibouri, Appl. Phys. Lett. 80 (2002) 4410.
[6] Handbook of Monochromatic XPS Spectra, B. Vincent Crist, Wiley,
pp. 361–371.
[7] S.Y. Yoon, D.H. Lee, D.M. Jeon, Y.S. Kim, D.H. Yoon, S.J. Suh, Sens.
actuators, A, Phys. 115 (2004) 91.
[8] M.F. Gillies, A.E.T. Kuiper, J. Appl. Phys. 88 (2000) 5824.