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    61

    1

    EEE Transactions on Power Delivery, Vol.

    9,

    No. 2 A p d

    1994

    EFFECTS

    OF

    VOLTAGE SURGES ON EXTRUDED DIELECTRIC CABLE LIFE

    PROJECT UPDATE

    by

    Richard

    A.

    Hartlein, Member V.

    S.

    Harper, Member

    Georgia Power Company Georgia Power Company Electric Power Research

    Harry Ng, Member

    AtlanG, Georgia Atlanta, Georgia

    KEYWORDS

    Cable, Lightning, Water

    Tree,

    mpulse, Thumper

    ABSTRACT

    Electric utility engineers have commented

    [I], [2]

    that

    extruded distribution cables frequently fail during or shortly

    after a thunder storm. These engineers also comment that

    failures often reoccur on cable circuits where previous

    failures were located with a thumper. Linemen at Georgia

    Power often make similar comments.

    To

    investigate this observation, crosslinked W P E ) and tree

    retardant crosslinked

    (TRXLPE)

    cable designs were

    subjected t accelerated water treeing tests. Samples were

    subjected to simulated lightning surges

    or

    simulated

    thumping surges. Crosslinked cables removed after

    15 years

    of

    service operation were also subjected to these surges.

    The results show that,

    in

    some cases, lightning surges do

    reduce extruded distribution cable life. Also, high level

    thumping surges appear to reduce cable life once cables are

    well aged.

    INTRODUCTION

    The Electric Power Research Institute (EPRI) sponsored the

    work

    to

    investigate the effects of voltage surges on extruded

    dielectric cable life under Project

    RP2284-01.

    Since voltage

    surges may affect insulation materials differently, five

    commonly used insulation types were initially chosen for this

    test program. These include high molecular weight

    polyethylene (HMWPE), tree retardant high molecular

    weight polyethylene (TRHMWPE) and ethylene propylene

    rubber (EPR) aswell as XLPE and TRXLPE.

    Preliminary results and a detailed description of the test

    93 SM 357-4 PVRD

    by the IEEE Insulated Conductors Committee of the IEEE

    Power Engineering Society for presentation at the IEEE/

    PES 1993 Summer Meeting, Vancouver, B.C., Canada. July

    18-22, 1993.

    made available for printing April 22, 1993.

    PRINTED IN USA

    A paper recommended and approved

    Manuscript submitted January 4, 1993;

    .

    Institute

    Palo Alto, California

    program were published in

    [3]

    and

    [4].

    Those results

    provide

    data

    on cables aged in the laboratory and subjected

    to 40

    kV,

    7 0

    kV and

    120

    kV lightning surges. The

    data

    also

    include laboratory aged cables which were subjected

    to

    a

    25

    kV thumper surge to simulate surges

    use

    to locate field

    failures.

    Aging times of up to 600

    days

    were reported.

    To gather additional information on the effects of surges on

    aged cable, a second phase was added to the test program.

    In this phase, aging was continued on selected cables beyond

    600 days, crosslinked polyethylene cables aged

    in

    service

    (XLPEF) were added to the test program and a 25 kV

    lightning surge magnitude was also introduced.

    To minimize time and cost, only XLPE, TRXLPE and

    XLPEF cables were included

    in

    the second

    phase.

    These

    compounds were selected because they represent the majority

    of cable insulations used by electric utilities.

    This paper presents the results gathered to

    date

    on the cables

    tested in phase two.

    This

    new

    data

    provides greater insight

    into the effects of lightning and thumping

    surges

    on aged

    cables.

    A

    brief review of the test program is also included.

    TEST CABLES

    Fifteen kV cables were used because they are very common

    and 15 kV cables are easily managed in accelerated

    laboratory tests.

    Since the ac voltage and surge voltage

    stress distribution varies with insulation thickness, cables

    with different insulation thicknesses were evaluated.

    Table 

    outlines the cables utilized for this program.

    The XLPE and TRXLPE cables were made by one

    manufacturer specifically for use in this test program.

    This

    was done to minimize the variations in cable quality that

    can

    occur between manufacturers.

    They were manufactured to

    the AEIC CS5-82 specification for crosslinked polyethylene

    insulated power cable using a triple extrusion, steam curing

    process. The conductor shields were extruded, conventional,

    semiconducting XLPE with a nominal thickness of 15 mils.

    The nominal insulation thickness was either

    175

    mils or 220

    mils. The insulation shields were extruded, semiconducting

    XLPE with a nominal thickness of

    30

    mils.

    Extra smooth

    or extra clean shields were not available at the time these

    cables were manufactured.

    Since the XLPEF cable was obtained from the field, the

    0885-8977/94/$04.00

    Q 1993 IEEE

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    613

    applied, the voltage was lowered

    to

    1X the operating voltage

    to ground

    (8.6

    kV). This was also done to represent field

    conditions.

    Thumuer Surne Auulication

    To apply the thumping surge, a thumper was connected to

    each cable rack individually using a dummy cable length

    which contained a simulated fault

    to

    ground. A Biddle

    Model

    No. 652025

    humper with a

    12

    pf capacitor was used

    open end of the test cable is shown in

    Figure

    2.

    r

    to apply the thumping surge. A typical waveform at the

    Figure 2. Typical waveform as seen at the open (far)

    end of the cable subjected to a 25 kV

    thumping surge.

    Aging of Cables Removed From the Field

    The XLPEF cables aged for 15 years in service at 7.6 kV.

    An examination of the insulation revealed numerous, large

    bowtie and vented water trees. The vented trees were

    as

    long

    as 170 mils

    and the bowtie trees were as long

    as 60

    mils.

    A C

    breakdown tests were conducted according

    to

    AEIC CS5-82 starting at 100 V/mil. The resulting

    breakdown strength of five, 30 foot long samples was 220,

    220,220,220

    and

    260

    V/mil. Since cables with this type

    of

    watertreeing

    and

    dielectric strength are considered to be well

    aged, the aging voltage used in the laboratory was the same

    magnitude as the service voltage (7.6 kV).

    Initially, the XLPEF cables were aged in conduits filled with

    tap water but with no water in the conductor. The conductor

    of this cable was

    sealed

    immediately after receipt at the

    laboratory. This was done to preserve field conditions as

    much as possible. However, since no failures occurred after

    aging in the laboratory for 200 days, deionized water was

    added

    to the conductors. Deionized water wasuse to avoid

    adding ions which may not have been present in service.

    Aging Temuerature

    ACCELERATED AGING PROCEDURE

    Aeinn of New Cables

    The cable aging test was designed

    to

    simulate and accelerate

    field aging and was pattemed after the AEIC CS5-82,

    B.5

    accelerated water treeing test which

    was

    in force when this

    project was initiated. In accordance with the AEIC

    accelerated water treeing test procedure, the XLPE and

    TRXLPE cables were thermally preconditioned. This is

    done to reduce the high concentration of volatiles contained

    in the newly manufactured cable insulations.

    Preconditioning was conducted after the cables were placed

    in the aging conduits but before they were filled with water.

    AEIC specifies a preconditioning conductor temperature of

    130 C for

    10 days

    using current in the conductor.

    However, 110

    C

    was

    used

    in

    this

    test to avoid the

    possibility of overheating the insulation. All temperature

    tolerances were 5

    C .

    After preconditioning, the

    conductors and conduits were filled with tap water.

    To

    accelerate aging, 3X rated voltage

    to

    ground

    (26

    kV,

    60

    Hz ac) was applied to both the XLPE and TRXLPE

    175-mil-wall and 220-mil-wall cables. Thus, the aging stress

    was

    149

    V/mil on the thin wall cables and

    118

    V/mil on the

    thick wall cables.

    This

    procedure was followed to represent

    the different stresses that thick and

    thin

    wall cables

    experience

    in

    the field. When the lightning surge was

    Normally, the AEIC accelerated water treeing test is

    performed with sufficient current to achieve a

    90°C

    conductor temperature in air. However,

    in

    phase one, the

    75°C

    rated HMWPE cables were connected

    in series

    with

    the

    90°C

    rated XLPE, TRXLPE and EPR cables. To

    prevent overheating

    of

    the HMWPE cable and to maintain

    the same aging conditions on all cables, a maximum

    conductor temperature of 75 C was chosen for all test

    cables in phase one. For consistency, this temperature was

    also used in the second phase of the test program.

    This

    temperature was achieved with

    260

    amperes in the

    conductor using a lZhour-on, 12-hour-off load cycle.

    Aging With ImDulses

    The lightning surges were applied an average of

    2.3

    times a

    week. They were always applied at the end of the

    12-hour-on period while the cables were still warm.

    Approximately 5 to 10 minutes before the lightning impulse

    was applied, the aging voltage was reduced from 26 kV to

    8.7

    kV.

    Thumping surges were applied in a manner that represents

    field conditions. Cables used for the thumping test condition

    were removed from the aging test and connected to the

    thumper. Nine hundred thumping impulses were applied to

    each test cable rack individually. The cables were then

    placed back in the aging test. Thumping was performed

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    614

    every

    60 days

    after the first

    120

    days of aging.

    175 MI1 ConlMl

    ............................. *...................... *..x

    ...............

    - ?5,M 4??Pu?eA

    .....................

    A. A .A. ..A........

    .........................................

    y ...

    y

    ...

    A.A*.A

    ...A y A n

    ....... .............

    .........

    y ......

    . nMMkx ......................

    175

    HII

    70kv Pulse

    .......................................

    .......A...) .

    .....................................................

    175 MI1

    l 2 U V

    PUIS0

    175 MI1 Thumper

    .....................................................

    Control samples were exposed to the same aging conditions

    as

    the surged samples but with no surges applied. All

    samples were en er g id , deenergized and filled with water

    at the same time. Every effort was taken

    to

    ensure that the

    only difference between the control and surged samples was

    the application of the voltage surges.

    .....................................................................................

    .................................................... ......

    .... ...... .x ...........................

    Each surge test condition was applied

    to

    a separate set of

    cable samples.

    No

    cables were subjected

    to

    both thumping

    and lightning impulses.

    This

    would have been an interest ing

    condition to evaluate because it represents the kind of surge

    combinations that can occur in service. However, individual

    surge effects were considered the most important variables

    to

    investigate first.

    220 MI1 7WV Pula8

    _....

    .....................

    .........

    .....

    y

    .....

    .......... .... ....

    A u . X

    ..........................

    Redicates

    Two, 180-foot-long coils of cable were subjected

    to

    each test

    condition. Each coil was a continuous length which

    contained six, 30-foot-long samples. Thus there were 12

    samples or replicates for each test condition.

    Summarv of Test Variables Investigated

    Table 2 shows a matrix of the test conditions examined in

    phase

    2

    A

    Cy

    indicates that a test covering this condition

    was performed.

    n (N)

    indicates that a test

    to

    evaluate this

    condition was not performed due to time or space

    limitations.

    Table 

    2

    Matrix showing all of the test conditions

    reported in this paper.

    175

    mil wall

    thickness

    surge

    condition

    CNTRL

    25kV 4OkV 70kV 12OkV

    XLPE

    Y N Y Y Y

    TRXLPE

    Y N N Y Y

    XLPEF

    Y Y N Y N

    220

    mil wall

    thickness

    surge condition

    CNTRL 25kV 40kV 70kV 120kV

    XLPE

    Y N N Y N

    TRXLPE

    N N N N N

    XLPEF

    N N N N N

    RESULTS

    In

    phase one, four traditional methods of evaluating the

    integrity of an extruded power cable were

    used

    to determine

    the effects of surges on each cable

    tested

    in the project.

    They included ac breakdown tests, impulse breakdown tests,

    time

    to

    failure and visual analysis. After a thorough

    investigation, time to failure analysis was the only method

    which revealed differences between control and surges

    samples. Therefore, only time to failure data is presented

    for the cables tested in phase two.

    Aging Failures

    To simplify the discussion, an abbreviation is

    used to

    describe the test conditions. The insulation material and

    wall thicknesses in mils is followed by the surge or control

    test variable. For example, the XLPE, 175-mil-wall cable

    subjected to a 70

    kV

    surge is referred to

    as

    XLPE, 175/70.

    As mentioned earlier, at the start of this project ac

    breakdown tests were considered an important diagnostic

    tool for evaluating surge effects. Therefore, during the first

    360

    days of aging in the initial tests, numerous samples were

    removed from the test and subjected to

    an

    ac breakdown

    test. By the end of

    360

    days, almost

    no

    samples remained.

    Thus, the 175/control and 175/70 surged samples of XLPE

    and TRXLPE cables were unavailable for further aging

    beyond

    360

    days.

    Other conditions examined for these cables

    as

    well

    as

    the

    XLPEF test cables

    started

    the test program after the

    data

    showed that aging time is more important than breakdown

    strength. Therefore, data are available for longer than

    360.

    Also, since unaged TRXLPE cable was still available, the

    TRXLPE 175/control condition was repeated.

    To compare the time to failure data for all cables, line

    graphs are employed which show when each failure

    occurred. The data presented in this manner provide a

    visual method of observing early failures or clusters of

    failures.

    n X

    at the end

    of

    a line means either the test

    condition was discontinued to perform breakdown tests or

    most of the samples failed at the time the X s shown.

    No

    X at the end of the line means the cable is still under test.

    Except for the XLPEF cable, failures during the surge

    application are rare. The failures

    as

    a

    function of time are

    shown in Figures

    3-5.

    ~

    0

    100

    200 300

    400

    500

    600 700

    Oays of Aging

    Figure

    3.

    XLPE failures

    as

    a function of time in the aging

    test. Each failure is represented by a triangle.

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    1

    175 Mil Cnnlmi

    .........................................................................................................................

    175 MI1

    25 kv Pulse

    ............................................... f ................2 .............

    * ..... ..& ................

    . .....................................................

    .i .

    .. 2

    ...

    .ai.

    ...............................

    75

    Mil

    70kv Pulse

    175 Mil

    Thumper

    -. ............................................................................... .........A............................

    I

    1

    I75

    Mil Cantmi

    .............................. ... ........ ..............A........ ..............................

    175

    Mil

    70kv

    ulse

    .........................................

    K.

    ..........................................................................

    175 Mli

    IZWv Pulse

    ...........................................

    ..A.......

    .A..

    & ...... A...A.

    X

    .............

    .75 Mi l Thumper

    ........... .....................................

    .......................................................................................................................

    0 200

    400

    600

    800

    1000

    Days of Aging

    Figure4. TRXLPE failures as a function of time in the

    Each failure is represented by a

    ging test.

    triangle.

    Figure 5 . XLPEF failures as a function of time in the

    Each failure is represented by a

    ging test.

    triangle.

    Discussion of Time to Failure Data

    Examination of the time to failure

    data

    begins to provide

    interesting insight on surge effects. For the 175 wall XLPE

    cables, it is difficult to compare the control condition to the

    surge conditions because the control test was terminated

    so

    early in the test program. Therefore, it is unclear how

    strongly the lightning surges influenced cable life. There is

    also no clear difference between the 40 kV and 70 kV

    lightning surge conditions. However, comparing the 40 kV

    and

    70

    kV lightning surge conditions to the thumper test

    condition is useful.

    The samples subjected to the lightning surges failed fairly

    regularly throughout the test after the first

    150

    days of

    aging. On the other hand, once the samples subjected to the

    thumping surge started to experience a few failures, they

    failed very rapidly.

    In

    fact, the thumper failure points on

    the graph were artificially spread out to distinguish

    individual failures. Thus, the thumping surge did not appear

    ~

    615

    to have a significant effect on the cable until approximately

    450

    days of aging. At that point, the cable failed rapidly

    until all the samples were consumed.

    For the 220 wall XLPE cables, the only apparent difference

    between the control condition and the

    70

    kV lightning surge

    condition is that failures occurred earlier on the samples

    subjected to the lightning surge. Interestingly, the

    observation made for the 175 wall XLPE cable subjected to

    the thumping surge also applies to the 220 wall XLPE cables

    subjected to the thumping surge.

    The control and

    120

    kV lightning surge TRXLPE cables

    appear to experience similar failure rates. However,

    as

    before, the samples subjected to the thumping surge fail

    rapidly after they have aged for 450 days.

    The effect of the 25 kV and 70 kV lightning surges on the

    XLPEF cable is very pronounced. Multiple failures

    occurred on the samples subjected to lightning surges while

    no control samples failed. Once again, there are no clear

    differences between the 25 kV and

    70

    kV surge levels.

    Interestingly, the thumper has not had a significant effect on

    the cable life.

    Unlike the XLPE and TRXLPE cables, the XLPEF cables

    often failed when the lightning surge was applied. This

    phenomena will be discussed in more detail later.

    Statistical Analysis of Time to Failure Data

    To provide a more in depth analysis of the time to failure

    data, Weibull probability statistics were employed. The

    estimated failure rates for the XLPE, TRXLPE and XLPEF

    cables using the Weibull model are presented in Figures

    6 -

    9. The test conditions are noted on the graphs following the

    insulation material description. The abbreviations used are

    similar to those employed for the aging failure graphs except

    that a 0 represents the control condition.

    The characteristic life for each test condition is the point at

    which 63.2% of the samples have already failed. For

    convenience, the 63.2% level is shown with a dotted line on

    each graph. If fewer than three failures occurred for a given

    test condition, a failure model could not be calculated.

    .

    --

    TIME

    DAYS

    Figure

    6.

    Weibull life model for 175 wall XLPE cable.

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    616

    w

    50

    1 , , , ' k

    1 1

    TIME. DAYS

    Figure

    7.

    Weibull life model for

    220

    wall XLPE cable.

    TIME,

    DAYS

    Figure 8. Weibull life model for TRXLPE cable.

    TIME, DAYS

    Figure 9. Weibull life model for XLPEF cable.

    Confidence Intervals

    To gain further insight from the Weibull statistical mdel,

    the values for characteristic life (indicated as I* ) ith

    corresponding

    90%

    confidence intervals are shown for each

    test condition in Figure

    10. 

    The values for the Weibull,

    shape parameter (also indicated as I* )ith corresponding

    90% confidence intervals are shown in Figure 11.  %e

    shape parameter gives an indication of

    bow

    the probability

    distribution function changes with aging time.

    Discussion of Statistical Model

    F6r the XLPE and TRXLPE cable designs, there are slight

    differences in characteristic life between test conditions.

    However,

    in

    all cases, the confidence intervals overlap,

    Figure

    10.

    Weibull life model parameters. 90%

    confidence intervals on characteristic life.

    The calculated characteristic life values are

    shown

    as

    a *'

    Figure 11. Weibull life model parameters.

    90%

    confidence intervals on shape factor. The

    calculated shape factor values are shown as a

    * U .

    making distinctions between the characteristic lives of each

    sample statistically inconclusive.

    h e XLPEF cable design does show a noticeable difference

    in characteristic life between samples subjected to the

    25

    kV

    lightning surge and those subjected to the

    70

    kV lightning

    surge. Although there is a slight overlap in the confidence

    intervals of the

    two

    test conditions, the amount is very

    small. Thus the observation that the two test conditions

    differ is statistically valid, indicating that lowering the surge

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    level from 70 kV to 25 kV increases cable life.

    There is a distinct difference in the slope for the 220 wall

    XLPE cable between the control and the 70 kV lightning

    surge condition.

    This

    verifies the observation made on the

    time

    to

    failure

    data

    that the samples subjected

    to

    the 70 kV

    surge failed earlier than the control samples.

    Another interesting observation for the XLPE and TRXLPE

    Weibull curves is that the slope for the thumper test

    condition is consistently higher than the slope for other test

    conditions. Although there is

    some

    overlap in the

    confidence intervals, this trend indicates that the samples

    subjected to the thumper surge very likely experience a wear

    out phase. That is, after a period of occasional failures,

    they start to fail rapidly,

    as

    if the cable reached the end of

    its reliable service life.

    FAILURE MECHANISMS

    Several possible

    reasons

    for differences between control and

    surged sample failure rates

    as

    well

    as

    differences in lightning

    surge and thumping surge failure rates were discussed in [4].

    However, failures of the XLPEF cables during the lightning

    surge application is a newly observed phenomena. Almost

    all of the other cable designs failed sometime after the surge

    was applied. The different failure

    mode

    for the XLPEF

    cable can

    be

    explained by the degree of water treeing in the

    insulation.

    The XLPEF cables age at 1X ra td voltage which allows the

    dielectric to experience greater deterioration before they fail

    than the other cables which were aged at 3X rated voltage.

    Thus the ratio of the surging voltage to aging voltage (degree

    of deterioration) is larger for the cables operated at 1X than

    for the cables operated at 3X rated voltage.

    This phenomena

    is

    demonstrated by the very large bowtie

    and vented water trees which formed while the XLPEF cable

    was in service. Many of the trees found in the insulation of

    this cable extend through

    as

    much

    as

    97 9 of the insulation

    wall. They continued to grow slowly in the aging test where

    the applied voltage magnitude is 1X the operating voltage.

    However, they easily become a failure path in the presence

    of a large magnitude lightning surge.

    The XLPE and TRXLPE cables started the test new, with no

    water

    trees

    present. Since the aging voltage on these cables

    was 3X the operating voltage, failures occurred in the aging

    test long before the water trees reached the length observed

    in the XLPEF cables. Since extremely long water trees are

    not present in these cables, they are not nearly

    as

    susceptible

    to failure during voltage surges.

    617

    CONCLUSIONS

    Phase 2

    The results of EPRI Project RP2284-01 have provided some

    interesting insight into the effects of voltage impulses on

    extruded cables aged in the laboratory. Several conclusions

    drawn during the first phase of the project are presented in

    [3] and [4]. Only new conclusions developed during

    phase 2 are

    stated

    in

    this

    paper. They apply only to the

    cables evaluated in the test program described in this paper.

    They may

    or

    may not

    be

    applicable to cables operating in

    service. Obviously, many questions remain unanswered.

    1.

    2.

    3.

    1.

    2.

    3 .

    Lightning Voltage Impulses Can Reduce Cable Life.

    This observation was made in phase one and reinforced

    in phase 2. The 175 mil and 220

    mil

    XLPE cables, the

    175 mil TRXLPE cables and the 175 mil XLPEF cables

    which were surged often failed more than the same

    cables that were aged without the voltage impulses.

    Thumping Voltage Surges Can Reduce Cable Life.

    This is a new observation. After 400 days of aging in

    the laboratory, the XLPE and TRXLPE cables subjected

    to a thumping surge failed more rapidly than the same

    cables subjected the control

    or

    lightning surge condition.

    This implies that once cables have been in service long

    enough to develop water tree growth similar to that

    obtained after 400 days of aging under the conditions

    described in this paper, they may fail prematurely if

    subjected to thumping surges.

    Lighting Surge Magnitude Does Not Strongly Affect

    Cable Failure Rates.

    Only the XLPEF cables demonstrated a change in failure

    rate

    as

    a function of surge magnitude. However, the

    effect was not observed in the characteristic life, but in

    the slope

    of

    the Weibull model curve.

    REFERENCES

    Minutes of the 78 ' Meeting of the Institute of Electrical

    and Electronics Engineers Insulated Conductors

    Committee Meeting, April 21-23, 1986. pp. V-C.

    Minutes of the

    80

    Meeting of the Institute of Electrical

    and Electronics Engineers Insulated Conductors

    Committee Meeting, April 27-29, 1987. pp. V-E2.

    R.

    A. Hartlein, V. S. Harper and H. Ng. Effects of

    Voltage Surges on Extruded Dielectric Cable Life,

    IEEE Transactions on Power Delivery, April, 1989

    Volume 4, Number 2, pp. 829-841.

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    618

    4.

    Electric Power Research Institute, Effects of Voltage

    Surges on Solid-Dielectric Cable Life , Report EL-

    6902,

    Interim Report, September,

    1990.

    ANOWLEDGEMENTS

    The authors would like to thank the Electric Power Research

    Institute for funding

    this

    research project. It addresses an

    area that has concerned electric utility engineers for many

    years.

    The authors would also like to thank the following Georgia

    Power Research Center personnel for their hard work and

    dedication to accomplish the project goals.

    - Mr.

    Larry

    Coffeen who designed and constructed the

    lightning surge test equipment.

    - Mr. Boyd Pettitt who processed the large volume of data

    generated and developed many of the graphs and

    maintained the surge test equipment.

    In addition, the authors would like to thank Dr. Russell G.

    Heikes of the Georgia Institute of Technology for providing

    the statistical data analysis and the project advisor,

    Mr.

    P.

    Pate1 for his suggestions and guidance.

    BIOGRAPHIES

    Richard A. Hartlein (M 80) was born in Atlanta, Georgia

    on March 20, 1952. He received a Bachelor and Master of

    Mechanical Engineering degrees in 1976and 1982 from the

    Georgia Institute of Technology in Atlanta, GA. He

    has

    been employed at the Georgia Power Research Center since

    1970 where he is currently manager of the mechanical

    section. He has conducted test programs on extruded, thin

    wall, 230 kV transmission cable, water tree resistance of

    extruded cable designs, and power cable ampacity inside

    riser shields. He has also managed EPRI projects on the

    short-circuit characteristics of cable metallic shields.

    He is a member of the IEEE Insulated Conductors

    Committee. He is chairman of ICC Task Group

    10-27

    which writes the IEEE

    404

    splice testing standard. He is

    also a past chairman of the Cable Engineering Section of the

    Association of Edison IlluminatingCompanies and chairman

    of the task group which writes the S I C CS5 specification

    for XLPE insulated distribution cables.

    V.

    S. Ha mr (M 74) was born

    in

    Marietta, Georgia on

    October 3,

    1943.

    He received a Bachelor of Electrical

    Engineering degree in 1966 from the Georgia Institute

    of

    Technology in Atlanta, Georgia. He has been employed

    with the Georgia Power Company since

    1966 and

    is

    presently a Research Manager. Previous fields of work

    include substation control, power line relaying, fault current

    calculations and project engineering for customer

    substations.

    Mr. Harper is a member of the IEEE Power Engineering

    Society, Insulated Conductors Committee and has served on

    several EPRI task forces and committees.

    H a m W.

    Hg

    (SM

    74)

    received his B.S. degree in

    Electrical Engineering in

    1971

    from the University of

    Arizona, Tucson, Arizona. From 1971

    to

    1983 he was with

    Tucson Electric Power Co. in Tucson, Arizona in various

    distribution engineering positions, starting

    as

    a Distribution

    Engineer. In

    1976,

    he was appointed Supervisor of

    Distribution Engineering.

    In 1983 he joined the Electric Power Research Institute in

    Palo Alto, California where he is presently Manager,

    Distribution System Design and Operations, in the Electrical

    Systems Division. His work has been

    in

    a broad area

    related to the distribution of power by electric utilities.

    Some of his responsibilities include distribution cables,

    electrical fault location, wood pole management, distribution

    design and analysis software, energy conservation and

    amorphous steel core distribution transformers. He has

    authored many papers related to power distribution.

    Mr. Ng is a member of the IEEE Power Engineering

    Society, the IEEE Insulated Conductors Committee, and the

    American

    Wood

    Preservers Association. He serves

    on

    the

    Wood

    Pole

    Working

    Group of the Distribution Committee of

    IEEE, the research committee of the American Wood

    Preservers Association and

    as

    advisor to the Forest Products

    Laboratory, Mississippi State University. He is also a

    Registered Professional Engineer (Electrical) in the states of

    Arizona and California.

  • 8/9/2019 Cables Surges

    9/9

    619

    surge had

    a

    very noticeable effect on cable performance. In

    Figure

    3,

    the

    175

    mil and

    220

    mil cables clearly had more

    failures earlier

    in

    the test when the

    40

    kV and

    70

    kV surges

    were applied. In the case of the field aged XLPE cables, the

    surged samples failed and the samples which were not

    surged experienced no failures.

    Diecussion

    MARC AUDET, KILBORN INC. TORONTO, CANADA :

    The authors have reeented data on impulee

    testing of XLPE RND EPR insulation under

    laboratory conditione, and thie data seems

    to indicate little difference in erformance

    between the control samplee a n 8 the test

    samples, although th e teet eamples were

    eub ected t o impulee waves to simula te

    ligitni n surges. It appeare from thi e that

    any furtxer teeting of similar cables under

    labor atory co nd iti on s with bar e eam 1,s

    immersed in water is not liable to resul t in

    much usef ul information.

    The teat data presented by the authore on1

    reinforces reviouely ubliehed data tha z

    XLPE E%R ine ulat ea cables and cablee

    ineulatnedd with similar compounds fail when

    subjected to moieture, generally from water

    treeing.

    Various pap ers have been presented, which

    provide information or teat data concerning

    the performance of such cablee of varioue

    CO fi U atione and compounds. Some of thie

    in?or#afion wae preeented as etatietical

    data on cablee installed in th e field. The

    data indicates that all similar compounde,

    whether TRXLPE or EPR provide good life if

    the cablee are sealed against moieture at

    the shield. and at the conductor

    termination.

    It appears that futu re efforte in regard to

    cab1 m r v ent s uld be dire ed tow

    provfdt n8 %ez?er cakne conf guraelone

    w l l g

    filled conductors, sealed condinuoue

    ehielding tapes or eimilar barriers againet

    moisture if long cable life is to be

    realized.

    Some really useful information could have

    been obtained if t he teat eamplee had been

    made up in such a manner ae to reflect

    actual field conditions. with am ro ve d

    terminations etrees -relief debices

    rounded shielde, and impervious jackete:

    8uch teete would yield really useful data

    for cable suppliere, s ecifiere, and

    installere. Perhape t he facifitiee available

    to th e authore did not permit thi e manner of

    testing.

    It would have been intereeting to know where

    the test cablee failed. whether they f led

    at or near th e termina'tione due t o vo?tage

    streae, or somewh ere in the middle of the

    cables, or randomly. Also, were th e

    compou nde teated in any ray after failure,

    to eee if any chemical change had occurred?

    In

    many

    cases,

    Weibull statistics do show that the

    characteristic life of a specific cable design may be similar

    for control and surged conditions (Figures

    -

    9).

    However,

    the slope of the Weibull curves in Figures

    and

    7

    is very

    different for control samples and surged samples. This is

    direct evidence that there is indeed a difference between

    control and surged samples.

    This

    is

    demonstrated again in Figure

    11 

    where the

    confidence intervals are plotted for the Weibull shape factor.

    For example, the there is a significant difference in the

    calculated shape factor and the corresponding confidence

    interval for the XLPE

    220

    control samples and the XLPE

    220

    samples subjected to the

    70

    kV lightning surge.

    Test Cables

    Since

    the scope of our work was to evaluate the effect

    of

    lightning surges on

    aged

    underground cable, we used a very

    common procedure of aging cables in an accelerated water

    treeing test. They had unfilled, stranded conductors and no

    jackets to allow for maximum accelerated aging. Water

    impervious jackets and/or blocked conductors would have

    significantly increased the time to achieve significant aging.

    Other tests are currently underway in

    our

    laboratory to judge

    the effects of jackets and moisture barriers on cable aging.

    These results will

    be

    presented sometime in the future.

    It

    is important to note that there

    is

    a considerable amount of

    cable in service which is very similar to the cable in our

    test. The results obtained in this test program should be

    applicable to those cables.

    Manuscript

    received

    August 9,

    1993.

    Test Procedure

    RICHARD A. HARTLEIN,

    V. S.

    HARPER AND HARRY

    NG: The authors would like to thank the discussor for the

    opportunity to clarify and provide comments on several

    aspects

    of the paper.

    Suree Effects

    Although there were some test conditions where the surge

    appeared to have no effect, there were others where the

    All test samples were constructed with standard terminations

    as used in the field. All cable neutrals were grounded. All

    reported test sample failures occurred in the cable within the

    water filled tube.

    Termination failures were repaired and

    not considered cable failures. These procedures are

    commonly used throughout the cable industry in accelerated

    aging tests on extruded dielectric cables.

    Manuscript received October 5, 1993.