biased reflectometry (international zurich congress on emc september 2007)

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A method for building up signal/power integrity models of active devices is presented in this papaper. The method is based on TDR measures taken at varying operating points of the device.

TRANSCRIPT

Page 1: Biased Reflectometry (International Zurich Congress On Emc September 2007)
Page 2: Biased Reflectometry (International Zurich Congress On Emc September 2007)
Page 3: Biased Reflectometry (International Zurich Congress On Emc September 2007)
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