band structure and electrical conductivity in …...the resistance of the semiconductor sample is...

31
Amrozia Shaheen

Upload: others

Post on 12-Jan-2020

12 views

Category:

Documents


0 download

TRANSCRIPT

Page 1: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Amrozia Shaheen

Page 2: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Semiconductors and their types. Energy band gap. Conduction in intrinsic and extrinsic

semiconductors. Experimental setup. Results.

Page 3: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Semiconductors are materials in which both electrons and holes contribute to the conduction process. According to band theory of solids, semiconductors posses a band gap.

Page 4: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Energy band gap is a region in solids where no electron states can exist.

Manifestation of the discrete character of basic atomic states.

Page 6: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

An intrinsic semiconductor is a pure semiconductor having no impurities and equal numbers of excited electrons and holes, i.e., n = p.

A semiconductor in which doping has been introduced, thus changing the relative number and type of free charge carriers, is called an extrinsic semiconductor.

Page 7: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

If the conduction electrons are the majority carriers that is an n-type semiconductor and the holes for the p-type semiconductor.

Page 8: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Thermally or optically excited electron’s contribution to the conduction is called intrinsic semi conduction.

The electron density from bottom to the top of conduction band is

Page 9: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Density of state is,

Probability of an electronic state of energy E being occupied by an electron is,

Page 10: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Electron and holes concentrations are,

Page 11: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

In intrinsic semiconductor, ne=nh , so charge carrier concentration is,

Where, is the energy band gap, and intrinsic conductivity is,

Page 12: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

In extrinsic semiconductor Nd>ni, so the conductivity depends on carrier cocentration and mobility

Temperature dependence of carrier concentration

Ionization regime: The electronconcentration is given as,

Page 13: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Extrinsic regime: The electricalconductivity is,

Intrinsic regime: Dopingimportance is lost here andmaterial behaves as an intrinsicsemiconductor with,

Page 14: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

High temperature: Electrons in CB or CV suffer collision with the impurity ion. The mean free time between scattering event and mobility is,

Page 15: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Low temperature: Electron scattering is done by interaction with the ionized impurity.

K.E>|P.E|, electron movesstraight.

K.E<|P.E|, electron isdeflected.

K.E≈|P.E|,

Page 16: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity
Page 17: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Purpose Calculate the energy band gap for doped Si and

pure Ge. Calculate the temperature dependent coefficient of

the majority carriers. Important parameters Resistance measurement. Achieving high and low temperature regimes. Temperature control.

Page 18: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

The resistance of the semiconductor sample is measured by the four-probe technique.

Page 19: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Two-probe method

Four-probe method

Page 20: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

The resistivity of a bulk samplein which h>>a is,

For thin sheetshaving h<<a,resistivity is,

Page 21: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity
Page 22: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Low temperature is achievedusing Liquid nitrogen thatis poured into the flow cryostat.

High temperature is attainedby passing current througha heater wire wound aroundthe sample cell.

Page 23: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Heater calculationsNicrome wire (36)Resistance=42.7Ω/m.Resistance of the used wire=42.7*3=128.1Ω.Applied voltage=100 V AC.Power=78.1.

Cryostat dimensionsLength=12 inches.Diameter=20mm.

Page 24: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

The temperature of the sample is measured by using a K-type thermocouple and controlled temperature is attained by a multi-zone controller (CN1504-TC).

Page 25: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity
Page 26: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

PID constants

P=0.5, I=1, D=1.

Page 27: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity
Page 28: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Constant current of 100 Resistance values in the temperature range of -150

°C to 250 °C . Calculate band gap from the

intrinsic region data. Calculate the temperaturecoefficient of the carriersmobility from theextrinsic region data.

Page 29: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Eg=1.03 eV α=2.5

Page 30: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Constant current of 10 mA. Resistance values from room temperature to 150°C

. Resistance is calculated through 4-probe method. Calculate band gap from the

intrinsic region data.

Page 31: Band structure and electrical conductivity in …...The resistance of the semiconductor sample is measured by the four-probe technique. Two-probe method Four-probe method The resistivity

Eg=0.77eV