7c x raydiffraction

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    X-RAY DIFFRACTION

    X- Ray Sources

    Diffraction: Braggs Law

    Crystal Structure Determination

    Elements of X-Ray DiffractionB.D. Cullity & S.R. StockPrentice Hall, Upper Saddle River (2001)

    X-Ray Diffraction: A Practical ApproachC. Suryanarayana & M. Grant Norton

    Plenum Press, New York (1998)

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    For electromagnetic radiation to be diffracted the spacingin the grating should be of the same order as the wavelength

    In crystals the typical interatomic spacing ~ 2-3 so thesuitable radiation is X-rays

    Hence, X-rays can be used for the study of crystal structures

    Beam of electrons TargetX-rays

    An accelerating (/decelerating) charge radiates electromagnetic radiation

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    Intensity

    Wavelength ()

    Mo Target impacted by electrons accelerated by a 35 kV potential

    0.2 0.6 1.0 1.4

    Whiteradiation

    Characteristic radiation due to energy transitionsin the atom

    K

    K

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    Target Metal Of K radiation ()

    Mo 0.71

    Cu 1.54

    Co 1.79

    Fe 1.94

    Cr 2.29

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    A beam of X-rays directed at a crystal interacts with theelectrons of the atoms in the crystal

    The electrons oscillate under the influence of the incoming

    X-Rays and become secondary sources of EM radiation

    The secondary radiation is in all directions

    The waves emitted by the electrons have the same frequency

    as the incoming X-rays coherentThe emission will undergo constructive or destructive

    interference with waves scattered from other atoms

    Incoming X-rays

    Secondary

    emission

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    Sets Electron cloud into oscillation

    Sets nucleus (with protons) into oscillation

    Small effect neglected

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    Oscillating charge re-radiates In phase with the incoming x-rays

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    BRAGGs EQUATION

    d

    The path difference between ray 1 and ray 2 = 2d Sin

    For constructive interference: n= 2d Sin

    Ray 1

    Ray 2

    Deviation = 2

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    Incident and scatteredwaves are in phase if

    Scattering from across planes is in phase

    In plane scattering is in phase

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    Extra path traveled by incoming wavesAY

    Extra path traveled by scattered wavesXB

    These can be in phase if and only ifincident= scattered

    But this is still reinforced scatteringand NOT reflection

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    Note that in the Braggs equation:

    The interatomic spacing (a) along the plane does not appear Only the interplanar spacing (d) appearsChange in position or spacing of atoms along the plane should not affect

    Braggs condition !!

    d

    Note: shift (systematic) isactually not a problem!

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    Note: shift is actually not a problem! Why is systematic shift not a problem?

    n AY YB [180 ( )] ( )AY XY Cos XY Cos

    ( )YB XY Cos [ ( ) ( )] [2 ]n AY YB XY Cos Cos XY Sin Sin

    ( )d

    SinXY

    [2 ] 2d

    n Sin Sin d SinSin

    2n d Sin

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    Consider the case for which 12

    Constructive interference can still occur if the difference in the path lengthtraversed by R1and R2before and after scattering are an integral multiple of the

    wavelength(AY XC) = h (h is an integer)

    1Cos

    a

    AY

    2Cosa

    XC hCosaCosa 21

    hCosCosa 21

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    Laues equations

    S0incoming X-ray beam

    S Scattered X-ray beam

    hSSa )(0

    kSSb )( 0

    lSSc )(0

    hCosCosa 21Generalizing into 3D

    kCosCosb 43

    lCosCosc 65

    This is looking at diffraction from atomic arrays and not planes

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    A physical picture of scattering leading to diffraction is embodied in Laues equations

    Braggs method of visualizing diffraction as reflection from a set of planes is a different

    way of understanding the phenomenon of diffraction from crystals

    The plane picture (Braggs equations) are simpler and we usually stick to them

    Hence, we should think twice before asking the question: if there are no atoms in the

    scattering planes, how are they scattering waves?

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    Braggs equation is a negative law

    If Braggs eq. is NOT satisfied NO reflection can occur

    If Braggs eq. is satisfied reflectionMAY occur

    Diffraction = Reinforced Coherent Scattering

    Reflection versus Scattering

    Reflection Diffraction

    Occurs from surface Occurs throughout the bulk

    Takes place at any angle Takes place only at Bragg angles

    ~100 % of the intensity may be reflected Small fraction of intensity is diffracted

    X-rays can be reflected at very small angles of incidence

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    n= 2d Sin

    n is an integer and is the order of the reflection

    For Cu Kradiation (= 1.54 ) and d110= 2.22

    n Sin

    1 0.34 20.7 First order reflection from (110)

    2 0.69 43.92Second order reflection from (110)

    Also written as (220)

    222 lkh

    adhkl

    8220

    ad

    2110

    ad

    2

    1

    110

    220

    d

    d

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    sin2 hkldn

    In XRD nthorder reflection from (h k l) is considered as 1storder reflectionfrom (nh nk nl)

    sin2 n

    dhkl

    sin2 nnn lkhd

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    Intensity of the Scattered electrons

    Electron

    Atom

    Unit cell (uc)

    Scattering by a crystal

    A

    B

    C

    Polarization factor

    Atomic scattering factor (f)

    Structure factor (F)

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    Scattering by an Electron

    ),( 00

    Sets electron into oscillation

    Scattered beams),( 00

    Coherent(definite phase relationship)

    A

    The electric field (E)is the main cause for the acceleration of the electron The moving particle radiates most strongly in a direction perpendicular to its

    motion The radiation will be polarized along the direction of its motion

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    x

    z

    r

    P

    Intensity of the scattered beam due to an electron (I) at a point Psuch that r >>

    2

    2

    42

    4

    0r

    Sin

    cm

    eII

    For a wave oscillating in z direction

    For an polarized wave

    -1

    -0.8

    -0.6

    -0.4

    -0.2

    0

    0.2

    0.4

    0.6

    0.8

    1

    0 30 60 90 120 150 180 210 240 270 300 330 360

    t

    Cos(t)

    The reason we are able to

    neglect scattering from theprotons in the nucleus

    The scattered rays are also plane polarized

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    2

    2

    42

    4

    0r

    Sin

    cm

    eII

    F l i d E is the measure of the amplitude of the wave

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    For an unpolarized wave E is the measure of the amplitude of the waveE2= Intensity

    222

    zy EEE zy III

    000

    2

    240 2 4 2

    y

    Py y

    SineI I

    m c r

    IPy= Intensity at point P due to Ey

    IPz= Intensity at point P due to Ez

    240 2 4 2

    z

    Pz z

    SineI I

    m c r

    Total Intensity at point P due to Ey& Ez

    2 240 2 4 2

    y z

    P

    Sin SineI I

    m c r

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    2 240 2 4 2

    y z

    P

    Sin SineI I

    m c r

    2 2 2 2 2 21 1 2y z y z y zSin Sin Cos Cos Cos Cos

    2 2 2 1x y zCos Cos Cos Sum of the squares of the direction cosines =1

    2 2 2 22 2 1 ( ) 1 ( )y z x xCos Cos Cos Cos Hence

    24

    0 2 4 2

    1 ( )xP

    CoseI I

    m c r

    2

    4

    0 2 4 21 (2 )

    PCoseI I

    m c r

    In terms of 2

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    0

    0.2

    0.4

    0.6

    0.8

    1

    0 30 60 90 120 150 180

    2t

    [Cos(2t)]^2

    In general P could lie anywhere in 3D space For the specific case of Bragg scattering:

    The incident direction IOThe diffracted beam direction OPThe trace of the scattering plane BBAre all coplanar

    OP is constrained to be on the xz plane

    x

    z

    r

    P

    2

    2

    2

    42

    4

    0

    2

    r

    Cos

    cm

    eII

    F l i d E is the measure of the amplitude of the wave

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    For an unpolarized wave E is the measure of the amplitude of the waveE2= Intensity

    222

    zy EEE

    zy III

    000

    2

    242

    4

    02

    2

    42

    4

    0

    12

    rcm

    eI

    r

    Sin

    cm

    eII yyPy

    IPy= Intensity at point P due to Ey

    IPz= Intensity at point P due to Ez

    2

    2

    42

    4

    02

    2

    42

    4

    0

    222

    r

    Cos

    cm

    eI

    r

    Sin

    cm

    eII zzPz

    The zx plane is to the y direction: hence, = 90

    1

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    -1

    -0.8

    -0.6

    -0.4

    -0.2

    0

    0.2

    0.4

    0.6

    0.8

    1

    0 30 60 90 120 150 180 210 240 270 300 330 360

    t

    Cos(t)

    2

    2

    00

    42

    4 2

    r

    CosII

    cm

    eIII

    zy

    PzPyP

    2

    2

    42

    4

    0 21

    2 r

    Cos

    cm

    eIIP

    Scattered beam is not unpolarized

    Forward and backward scattered intensity higher than at 90Scattered intensity minute fraction of the incident intensity

    Very small number

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    Polarization factorComes into being as we usedunpolarized beam

    2

    212

    42

    4

    2

    0 Cos

    cm

    e

    r

    IIP

    0

    0.2

    0.4

    0.6

    0.8

    1

    1.2

    0 30 60 90 120 150 180 210 240 270 300 330 360

    2t

    (1+Cos(2t)^2)/2

    B

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    B Scattering by an Atom

    Scattering by an atom [Atomic number, (path difference suffered by scattering from each e, )]

    Scattering by an atom [Z, (, )] Angle of scattering leads to path differences

    In the forward direction all scattered waves are in phase

    electronanbyscatteredwaveofAmplitudeatomanbyscatteredwaveofAmplitude

    FactorScatteringAtomicf

    f

    )(Sin(1)

    0.2 0.4 0.6 0.8 1.0

    10

    20

    30

    Schematic

    )(Sin

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    Coherent scattering Incoherent (Compton) scattering

    Z Sin() /

    B S i b A

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    B Scattering by an Atom

    BRUSH-UP

    The conventional UC has lattice points as the vertices

    There may or may not be atoms located at the lattice points

    The shape of the UC is a parallelepiped (Greekparalllepipedon)in 3D

    There may be additional atoms in the UC due to two reasons:

    The chosen UC is non-primitive

    The additional atoms may be part of the motif

    C S tt i b th U it ll ( )

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    C Scattering by the Unit cell (uc)

    Coherent ScatteringUnit Cell (UC) is representative of the crystal structureScattered waves from various atoms in the UC interfere to create the diffraction pattern

    The wave scattered from the middle plane is out of phase with the onesscattered from top and bottom planes

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    d(h00)

    B

    Ray 1 = R1

    Ray 2 = R2

    Ray 3 = R3

    Unit Cell

    x

    M

    C

    N

    R

    B

    S

    A

    '

    1R

    '

    2

    R

    '

    3R

    (h00) planea

    a

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    h

    adAC h 00

    ::::ACMCN

    xABRBS ::::

    ha

    xx

    AC

    AB

    )(2 0021 SindMCN hRR

    ha

    x

    AC

    ABRBSRR 31

    2

    axh

    hax

    RR 22

    31 xcoordinatefractional

    a

    x xhRR 231

    Extending to 3D 2 ( )h x k y l z Independent of the shape of UC

    Note: R1is from corner atoms and R3is from atoms in additional positions in UC

    2

    [2 ( )]i i h x k y l zE A f

    2 ( )h k l In complex notation

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    If atom B is different from atom A the amplitudes must be weighed by the respectiveatomic scattering factors (f)

    The resultant amplitude of all the waves scattered by all the atoms in the UC gives thescattering factor for the unit cell The unit cell scattering factor is called theStructure Factor (F)

    Scattering by an unit cell = f(position of the atoms, atomic scattering factors)

    electronanbyscatteredwaveofAmplitudeucinatomsallbyscatteredwaveofAmplitudeFactorStructureF

    [2 ( )]i i h x k y l z E Ae fe

    2 ( )h x k y l z p

    2FI

    [2 ( )]

    1 1

    j j j j

    n ni i h x k y l z hkl

    n j j

    j j

    F f e f e

    Structure factor is independent of theshapeandsize of the unit cell

    For natoms in the UC

    If the UC distorts so do the planes in it!!

    nni)(S f l l i

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    nnie )1(

    )(2

    Cos

    ee ii

    Structure factor calculations

    A Atom at (0,0,0) and equivalent positions

    [2 ( )]j j j ji i h x k y l z

    j jF f e f e

    [2 ( 0 0 0)] 0i h k l F f e f e f

    22 fF F is independent of the scattering plane (h k l)

    nini ee

    Simple Cubic

    1)( inodde

    1)( inevene

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    B Atom at (0,0,0) & (, , 0) and equivalent positions

    [2 ( )]j j j ji i h x k y l z

    j jF f e f e

    1 1[2 ( 0)]

    [2 ( 0 0 0)] 2 2

    [ 2 ( )]0 ( )2

    [1 ]

    i h k l i h k l

    h ki

    i h k

    F f e f e

    f e f e f e

    F is independent of the l index

    C- centred Orthorhombic

    Real

    ]1[ )( khi

    efF

    fF 2

    0F

    224fF

    02 F

    e.g. (001), (110), (112); (021), (022), (023)

    e.g. (100), (101), (102); (031), (032), (033)

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    If the blue planes are scattering in phase then on C- centering the red planes will scatter out

    of phase (with the blue planes- as they bisect them) and hence the (210) reflection will

    become extinct

    This analysis is consistent with the extinction rules: (h + k) odd is absent

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    In case of the (310) planes no new translationally equivalent planes are added on lattice

    centering this reflection cannot go missing. This analysis is consistent with the extinction rules: (h + k) even is present

    Body centred

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    C Atom at (0,0,0) & (, , ) and equivalent positions

    [2 ( )]j j j ji i h x k y l z

    j jF f e f e

    1 1 1[2 ( )]

    [2 ( 0 0 0)] 2 2 2

    [ 2 ( )]0 ( )2

    [1 ]

    i h k l i h k l

    h k li

    i h k l

    F f e f e

    f e f e f e

    Orthorhombic

    Real

    ]1[ )( lkhi

    efF

    fF 2

    0F

    224fF

    02 F

    e.g. (110), (200), (211); (220), (022), (310)

    e.g. (100), (001), (111); (210), (032), (133)

    F C d C bi

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    D Atom at (0,0,0) & (, , 0) and equivalent positions

    [2 ( )]j j j ji i h x k y l z

    j jF f e f e

    ]1[)()()(

    )]2

    (2[)]2

    (2[)]2

    (2[)]0(2[

    hlilkikhi

    hli

    lki

    khi

    i

    eeef

    eeeefF

    Face Centred Cubic

    Real

    fF 4

    0F

    22 16fF

    02 F

    (h, k, l) unmixed

    (h, k, l) mixed

    e.g. (111), (200), (220), (333), (420)

    e.g. (100), (211); (210), (032), (033)

    (, , 0), (, 0, ), (0, , )

    ]1[ )()()( hlilkikhi eeefF

    Two odd and one even (e.g. 112); two even and one odd (e.g. 122)

    Mixed indices Two odd and one even (e g 112); two even and one odd (e g 122)

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    Mixed indices CASE h k l

    A o o e

    B o e e

    ( ) ( ) ( )CASE A: [1 ] [1 1 1 1] 0i e i o i oe e e

    ( ) ( ) ( )CASE B: [1 ] [1 1 1 1] 0i o i e i oe e e

    0F 02 F(h, k, l) mixed e.g. (100), (211); (210), (032), (033)

    Mixed indices Two odd and one even (e.g. 112); two even and one odd (e.g. 122)

    Unmixed indices CASE h k l

    A o o o

    B e e e

    Unmixed indices

    fF 4 22 16fF (h, k, l) unmixede.g. (111), (200), (220), (333), (420)

    All odd (e.g. 111); all even (e.g. 222)

    ( ) ( ) ( )CASE A : [1 ] [1 1 1 1] 4i e i e i ee e e

    ( ) ( ) ( )CASE B: [1 ] [1 1 1 1] 4i e i e i ee e e

    Na+ at (0 0 0) + Face Centering Translations ( 0) ( 0 ) (0 )

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    E Na at (0,0,0) + Face Centering Translations (, , 0), (, 0, ), (0, , )Clat (, 0, 0) + FCT (0, , 0), (0, 0, ), (, , )

    )]2

    (2[)]2(2[)]

    2(2[)]

    2(2[

    )]2

    (2[)]2

    (2[)]2

    (2[)]0(2[

    lkhi

    li

    ki

    hi

    Cl

    hli

    lki

    khi

    i

    Na

    eeeef

    eeeefF

    ][

    ]1[

    )()()()(

    )()()(

    lkhilikihi

    Cl

    hlilkikhi

    Na

    eeeef

    eeefF

    ]1[

    ]1[

    )()()()(

    )()()(

    khihlilkilkhi

    Cl

    hlilkikhi

    Na

    eeeef

    eeefF

    ]1][[

    )()()()( hlilkikhilkhi

    ClNa eeeeffF

    NaCl:Face Centred Cubic

    )()()()( hlilkikhilkhi

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    ]1][[ )()()()( hlilkikhilkhiClNa

    eeeeffF

    Zero for mixed indices

    Mixed indices CASE h k l

    A o o e

    B o e e

    ]2][1[ TermTermF

    0]1111[]1[2:ACASE )()()( oioiei eeeTerm

    0]1111[]1[2:BCASE )()()( oieioi eeeTerm

    0F 02 F(h, k, l) mixed e.g. (100), (211); (210), (032), (033)

    Mixed indices

    Unmixed indices CASE h k li d i di

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    (h, k, l) unmixed ][4)( lkhi

    ClNa

    effF

    ][4 ClNa ffF If (h + k + l) is even22 ][16 ClNa ffF

    ][4 ClNa

    ffF If (h + k + l) is odd22 ][16 ClNa ffF

    e.g. (111), (222); (133), (244)

    e.g. (222),(244)

    e.g. (111), (133)

    Unmixed indices CASE h k l

    A o o o

    B e e e

    4]1111[]1[2:ACASE)()()(

    eieiei

    eeeTerm

    4]1111[]1[2:BCASE )()()( eieiei eeeTerm

    Unmixed indices

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    Presence of additional atoms/ions/molecules in the UC can alterthe intensities of some of the reflections

    Selection / Extinction Rules

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    Bravais LatticeReflections whichmay bepresent

    Reflectionsnecessarilyabsent

    Simple all NoneBody centred (h + k + l) even (h + k + l) odd

    Face centred h, k and l unmixed h, k and l mixed

    End centredh and k unmixed

    C centred

    h and k mixed

    C centred

    Bravais Lattice Allowed Reflections

    SC All

    BCC (h + k + l) even

    FCC h, k and l unmixed

    DC

    h, k and l are all oddOr

    all are even& (h + k + l) divisible by 4

    h2+ k2+ l2 SC FCC BCC DC

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    1 100

    2 110 110

    3 111 111 111

    4 200 200 2005 210

    6 211 211

    7

    8 220 220 220 220

    9 300, 22110 310 310

    11 311 311 311

    12 222 222 222

    13 320

    14 321 321

    15

    16 400 400 400 400

    17 410, 322

    18 411, 330 411, 330

    19 331 331 331

    Crystal structure determination

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    y

    Monochromatic X-rays

    Panchromatic X-rays

    Monochromatic X-rays

    Many s (orientations)Powder specimen

    POWDERMETHOD

    Single LAUETECHNIQUE

    Varied by rotation

    ROTATINGCRYSTALMETHOD

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    POWDER METHOD

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    http://www.matter.org.uk/diffraction/x-ray/powder_method.htm

    Diffraction cones and the Debye-Scherrer geometry

    Film may be replaced with detector

    POWDER METHOD

    Different cones for different reflections

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    The 440 reflection is not observed

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    The 331 reflection is not observed

    THE POWDER METHOD

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    THE POWDER METHOD

    2222 sin)( lkh

    2

    2

    2222

    sin4

    )( a

    lkh

    )(sin4

    222

    2

    22 lkha

    222

    lkh

    adCubic

    dSin2

    222

    222 sin4

    lkh

    a

    Cubic crystal

    Relative Intensity of diffraction lines in a powder pattern

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    Structure Factor (F)

    Multiplicity factor (p)

    Polarization factor

    Lorentz factor

    RelativeIntensity of diffraction lines in a powder pattern

    Absorption factor

    Temperature factor

    Scattering from UC

    Number of equivalent scattering planes

    Effect of wave polarization

    Combination of 3 geometric factors

    Specimen absorption

    Thermal diffuse scattering

    2

    1

    2

    1

    Sin

    Cos

    Sin

    factorLorentz

    21 2CosIP

    Multiplicity factor

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    Lattice Index Multiplicity Planes

    Cubic

    (with highest

    symmetry)

    (100) 6 [(100) (010) (001)] (2 for negatives)

    (110) 12 [(110) (101) (011), (110) (101) (011)] (2 for negatives)

    (111) 12 [(111) (111) (111) (111)] (2 for negatives)

    (210) 24*(210) 3! Ways, (210) 3! Ways,

    (210) 3! Ways, (210) 3! Ways

    (211) 24(211) 3 ways, (211) 3! ways,

    (211) 3 ways

    (321) 48*

    Tetragonal

    (with highestsymmetry)

    (100) 4 [(100) (010)] (2 for negatives)

    (110) 4 [(110) (110)] (2 for negatives)

    (111) 8 [(111) (111) (111) (111)] (2 for negatives)

    (210) 8*(210) = 2 Ways, (210) = 2 Ways,

    (210) = 2 Ways, (210) = 2 Ways

    (211) 16 [Same as for (210) = 8] 2 (as l can be +1 or 1)

    (321) 16* Same as above (as last digit is anyhow not permuted)

    * Altered in crystals with lower symmetry

    Multiplicity factor

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    Cubichkl hhl hk0 hh0 hhh h00

    48* 24 24* 12 8 6

    Hexagonal hk.l hh.l h0.l hk.0 hh.0 h0.0 00.l24* 12* 12* 12* 6 6 2

    Tetragonalhkl hhl h0l hk0 hh0 h00 00l

    16* 8 8 8* 4 4 2

    Orthorhombichkl hk0 h0l 0kl h00 0k0 00l

    8 4 4 4 2 2 2

    Monoclinichkl h0l 0k0

    4 2 2

    Triclinichkl

    2

    * Altered in crystals with lower symmetry (of the same crystal class)

    Polarization factor Lorentz factor

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    0

    5

    10

    15

    20

    25

    30

    0 20 40 60 80

    Bragg Angle ( , degrees)

    Lorentz-Polarization

    factor

    2

    1

    2

    1

    SinCos

    SinfactorLorentz 21 2CosIP

    CosSin

    CosfactoronPolarizatiLorentz

    2

    2 21

    Intensity of powder pattern lines (ignoring Temperature & Absorption factors)

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    Intensity of powder pattern lines (ignoring Temperature&Absorptionfactors)

    CosSin

    CospFI

    2

    22 21

    Valid for Debye-Scherrer geometry

    I Relative IntegratedIntensityF Structure factorp Multiplicity factor

    POINTS

    As one is interested in relative (integrated) intensities of the lines constant factorsare omittedVolume of specimen me, e (1/dectector radius)

    Random orientation of crystals in a with Textureintensities are modified

    Iis really diffracted energy(as Intensity is Energy/area/time)

    Ignoring Temperature & Absorption factors valid for lines close-by in pattern

    THE POWDER METHOD

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    THE POWDER METHOD

    2222 sin)( lkh

    2

    2

    2222

    sin4

    )( a

    lkh

    )(sin4

    222

    2

    22 lkha

    222

    lkh

    adCubic

    dSin2

    222

    222 sin4

    lkh

    a

    Cubic crystal

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    n 2 Intensity Sin Sin2 ratio

    Determination of Crystal Structure from 2versus Intensity Data

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    2 Intensity Sin Sin2 ratio

    1 21.5 0.366 0.134 3

    2 25 0.422 0.178 4

    3 37 0.60 0.362 8

    4 45 0.707 0.500 115 47 0.731 0.535 12

    6 58 0.848 0.719 16

    7 68 0.927 0.859 19

    FCC

    h2+ k2+ l2 SC FCC BCC DC

    1 100

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    1 100

    2 110 110

    3 111 111 111

    4 200 200 200

    5 210

    6 211 211

    7

    8 220 220 220 220

    9 300, 22110 310 310

    11 311 311 311

    12 222 222 222

    13 320

    14 321 32115

    16 400 400 400 400

    17 410, 322

    18 411, 330 411, 330

    19 331 331 331

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    The ratio of (h2+ K2+ l2) derived from extinction rules

    SC 1 2 3 4 5 6 8

    BCC 1 2 3 4 5 6 7

    FCC 3 4 8 11 12

    DC 3 8 11 16

    Powder diffraction pattern from Al Radiation: Cu K, = 1.54056

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    420

    111

    200

    220

    311

    222

    4

    00 3

    31

    422

    1& 2peaks resolved

    Note: Peaks or not idealized peaks broadened

    Increasing splitting of peaks with g

    Peaks are all not of same intensity

    X-Ray Diffraction: A Practical Approach, C. Suryanarayana & M. Grant Norton, Plenum Press, New York (1998)

    Determination of Crystal Structure from 2versus Intensity Data

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    n 2 Sin Sin2 ratio Index a (nm)1 38.52 19.26 0.33 0.11 3 111 0.404482 44.76 22.38 0.38 0.14 4 200 0.40457

    3 65.14 32.57 0.54 0.29 8 220 0.40471

    4 78.26 39.13 0.63 0.40 11 311 0.40480

    5* 82.47 41.235 0.66 0.43 12 222 0.40480

    6* 99.11 49.555 0.76 0.58 16 400 0.40485

    7* 112.03 56.015 0.83 0.69 19 331 0.40491

    8* 116.60 58.3 0.85 0.72 20 420 0.40491

    9* 137.47 68.735 0.93 0.87 24 422 0.40494

    * 1, 2peaks are resolved (1peaks are listed)

    1

    d

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    0

    0.1

    0.2

    0.3

    0.4

    0.5

    0.6

    0.7

    0.8

    0.9

    0 30 60 90

    t

    Sin(t)

    Sind

    2

    22

    )(

    Sin

    Cos

    d

    dd

    Tan

    dd

    Sin

    Cos

    d

    dd

    )(

    Error in d spacing

    14

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    0

    2

    4

    6

    8

    10

    12

    14

    0 20 40 60 80 100

    t

    Cot(t)

    Tan

    dd

    Sin

    Cos

    d

    dd

    )(

    Error in d spacing

    Error in d spacing decreases with

    Applications of XRD

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    Bravais lattice determination

    Lattice parameter determination

    Determination of solvus line in phase diagrams

    Long range order

    Crystallite size and Strain

    More

    y

    CrystalS h ti f diff b t

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    Diffraction angle (2)

    Intensity

    90 1800

    Diffraction angle (2)

    Intensit

    y

    Liquid / Amorphous solid

    90 180

    Diffraction angle (2)

    Intensity

    Monoatomic gas

    Schematic of difference betweenthe diffraction patterns of various phases