4 oim analysis eng

8/14/2019 4 OIM Analysis Eng

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TSLolut ons OIM School

OIM Analysis

OIM scan data will be analyzed in form of Map, Chart, Plot and combined

them. It will be analyze the texture or micro structure to know therelationship between these texture and properties of the sample.

Information from OIM scan data analysis will depends on capability

or knowledge of people who analyze the data.


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OIM Analysis

OIM scan data is analyzed in form of Map, Chart, Plot and combined them.


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In OIM a project contains all of the documents created duringan analysis session.

Project

A chart that combines results from any partition in theproject

OIM Datasets

Partitions. Essentially subsets of the data that meet some

user prescribed criteria.

Texture plots (of intensities) such as a Pole Figures or

ODFs.

A Texture this contains all of the results for a given

calculations. I.e. for a user prescribed set of parameters.

A Chart e.g. grain size distribution, IQ distribution

A discrete orientation plot such as a pole figure or an ODF

I.e. discrete points plotted in Euler space.

A map

Project Tree


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Layer structure of the program

Parameters which control the program and analysis

Preference

Project

Dataset Dataset Dataset

Partition Partition Partition Partition

Parameters which control whole program.

Functions which affect to all partition

under each Dataset

Parameters which define properties of analysis for

each partition.Grain size, boundaries, etc

[ Multi Chart ]

The parameters or functions will affects to all under that level.


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OIM Analysis

Lets draw OIM map

Each scan data will be opened under Project.The scan data is called as Dataset. And

partition, All data, will be created

automatically. Map, Plot, or Chat will be

drawn under partition.



Practice:

Lets draw OIM map using Alpha-Steel

Open Alpha-Steel data and draw following maps using Quick Gen buttons

Image Quality map (IQ map)

Inverse Pole Figure mapIPF map Grain map (Unique Grain Color map)

IQ map IPF map Grain map

Lets use these Quick Gen buttons.



Maps

Boundaries

Rotation AngleRotation Axis

Axis/Angle

Grain

Phase

CSL

Shape Ellipses

ReconstructedReconstructed Twins

Gray Scale

Image Quality

Confidence IndexFit

Detector Signal

Grain Size

Grain Shape Orientation

Grain Shape Aspect Ratio

Grain Average IQGrain Average CI

Grain Average Video Signal

Kernel Average Misorientation

Grain Orientation Spread

Grain Average Misorientation

Grain Reference Orientation

DeviationTaylor Factor

Schmid Factor

Import Data

Color Scale

Image QualityConfidence Index

Fit

Detector Signal

Phase

EDS

Inverse Pole Figure

Crystal DirectionCrystal Orientation

Euler Angle RGB

Unique Grain Color

Grain Size


Grain Shape Aspect RatioGrain Average IQ

Grain Average CI

Grain Average Fit




Grain Average MisorientationTaylor Factor

Schmid Factor

Elastic Stiffness

Twin Parent/Daughter

Import Data



Maps

Non-Orientation Scalar maps IQ, CI, fit, Other detectors (FSD,

SED, X-Ray), phase

Grain Based Maps size, shape, avg IQ, orientation spreadOrientation based maps IPF map (2D), Euler Angle map,

Component maps

Misorientation Based Maps local misorientation (strain)

Property Maps Taylor or Schmid Factor, Elastic Modulus



21.6

84.9

Image Quality : 195.3

Image Quality : 62.6

Maps: Image Quality map

IQ map is drawn based on the peak intensity of Hough transformation. If the pattern is

clear which means the crystal has less distortion. If IQ value is low, that point has more

distortion with crystal, or contaminated or damaged.


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Maps: Orientation map

Inverse Pole FigureIPF map)

Normal

Direction

Transverse

Direction

Reference

Direction

In case of IPF map, it should be first specified some sample plane, such as ND plane, then

find which crystal plane becomes parallel to this specified sample plane. Then each pixelis pained depends on the crystal plane using right color key.


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Orientation map such as IPF map is made based on sample coordinate, not the

sample surface. If ND sample plane is specified, the crystal plane which parallel to

the ND normal plane for each pixel. It doesnt mean the same as sample surface.

So it should be always careful about sample coordinate system.

TD(Y)

RD(X)

(X)

(Y)

(Z)

ND(Z)

NDTD

RD

Maps: IPF map


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NDTD

RD

Maps: IPF map

Sample Surface

normal direction If we want to know the crystalindices of this fractures surface,

we need to know the plane

normal direction.

If we find the plane normal

direction, (RD,TD,ND), is (1,3,11),

Then we can know the crystal

indices of this fractures surface

by input these data to specify

sample surface.

RD

TDND

If we select Map Data at Status bar text in

Preference shown by red arrows, then after

specifying the sample surface, the point dataspecify cursor will be shown as below. .


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Crystal Direction Map It picked up the pixels which has specified crystalDirection along with also specified sample direction. Itspecify only one direction. It doesnt care the rotation

around specified sample direction.

(It is not the crystal plane normal direction. )

Specify sample direction

Specify crystal direction or crystal plane normal.


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Crystal Orientation Map It pick up the pixels which has the specific crystalorientation shown by (hkl) presentation. (hkl) showsthe crystal plane parallel to the sample ND normal plane.

shows the crystal direction of sample RD direction.

(hkl) normal direction and is perpendicular.


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Maps: Area fraction of specified data

It is also possible to know area fraction of each specified area of Crystal

Direction map or Crystal Orientation map.


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(10 0 3)

IPF map Sn sample Crystal Direction map

Difference of IPF Maps and Crystal Direction Map

PF and IPF are defined by crystal plane,

not crystal direction. It is common thatcrystal plane normal and crystal

direction with same Millar indices are

not the same.

Pixels which has

crystal direction is nearly

same as (11 0 1) plane

normal, not (10 0 3).

Pick up the grains which (10 0 3)

plane becomes normal to the

sample ND plane.


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Maps: Map Color

Map color can be selected following color bar

list. Or it can be specified by user preferences.


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Practice:

Lets draw Crystal Direction Map using Sn-Solder scan data.

1 2

Put 1, 1, 2 either Crystal Direction(1) or

Pole(Plane) (2) and see the difference.

P ti


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Practice

Lets paint in different color for following area in Crystal Direction Map.

Specify (001) plane normal along with ND direction with following rejoin.

0 55 1010 1515 20

G O


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Grains in OIM

Grains in OIM is defined by Tolerance Angle and Minimum Grain Size (number of grains).

Neighbor pixels within this tolerance angle are considered to belong to the same grain and ifpixels equal or more than Minimum Grain Size are connected within the Tolerance angle, they

are considered as independent gain. This definition is same as connecting boundary more

than Tolerance angle and make closed loop or touch to the scan boundary. Under this

definition, we may see the boundary more than Tolerance Angle in grains as shown in below.

A

B C

G i i OIM


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Grains in Unique Grain Color map are very much depends on the grain definition (Tolerance

Angle and Minimum Grain Size). As following example of Alpha-Steel, we can see big changesof grain size depending on the definition. Users need to think how they define the grain

thinking about their objects of Analysis.

Tolerance Angle =

2 deg.

Grains in OIM

Tolerance Angle =

5 deg.

Tolerance Angle =

3 deg.

P titi P ti


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Partitions Properties

The definition of Grain is one of the most important parameter.

If we change some

parameters in PartitionProperties, all the maps,

charts and plots under

this partition are affected.

Minimum angle to separate pixels

into two grains

Minimum number of pixels to

consists of grains

Specify that the edged

grains are included ornot in the analysis.

P ti


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Practice

Lets check the changes of grains by changing the definition of grain.

See the difference of grains by changing the parameter of Tolerance Angle and Minimum

Grain Size in Partition Property .

Data : Alpha_Steel Grain Tolerance Angle = 3 and 5 deg.

P titi P ti


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CI, IQ, Video Signal (SEM singnal)can be used to filter the scan data.Mathematical operant can be used to combine the filter condition.

Partition Properties

If we change some

parameters in Partition

Properties, all the maps,

charts and plots under

this partition are affected.


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P titi P ti


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IQ > 50 is set in Partition/Formula. This

means pixels which has IQ value more than

50 will be used for analysis.

The condition specified in Partition/Formula

will affect all data under this partition.

P titi P ti


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It is included not desirable data for analysis.

The data with pixels IQ < 50 are

excluded from the analysis.

Practice


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Practice

Lets check how parameters in Formula in Partition Property will affects to the

analysis of scan data.

Data : Cu IC Line Check IQ or CI to remove un-necessary data from the

scan data.

M Mi i t ti M


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For a given grain calculate theaverage misorientation between all

data points in the grain.

Grain Average Misorientation

For a given grain calculate theaverage misorientation between all

neighboring data points in the grain.


For a given data point calculate theaverage misorientation between the

data point and all of its neighbors

(exclude misorientations greater than

some prescribed value - 5 in this

case)

Maps: Misorientation Map



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Grain Reference Orientation DeviationShow the deviation of each point in the grain with respect to a reference orientation. Two

types of references are possible: 1) The average orientation for the grain and 2) the

orientation of the point in the grain with the lowest Average Kernel Misorientation.


Grain Average Misorientation map


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0.0mm 3.0mm 5.0mm 7.0mm 8.0mm

7.0mm

Grain Average Misorientation map

Cross section of Al ample under bending test was

observed. Grain Average Misorientaion maps were

made for each bended condition. We can see that the

Grain Average Misorientation Value is increasingaccording to bending angle.


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Maps: Phase map


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Maps: Phase map

All dataPartition

Maps: Phase map


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Maps: Phase map

In case of multi phase data, Allpartition and partitions for each

Phase will be made

automatically.

Maps: Phase map


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Maps: Phase map

CI map of above

phase map.

CI map of

appropriate scan.

If two phases with same crystal structure, it is not

possible to distinguish these two phases. Then it

becomes messy map.

Grain Boundary in OIM


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If edge between two pixels exceeds the specified rotation angle, the edgeis considered as boundary.

g

OIM has three types of boundaries.

Basic boundaries which is used for boundary

fraction. It contains all sub-grain boundary.

Boundary to define grains

Boundary must be closed or connected to scan

boundaries.

(Same as the definition in material science)

Boundaries which are used to boundaries.

These boundaries are defined by rotation angle

or axis angle, twins or CLS.This one segment becomes

a unit of grain boundaries.

Grain Boundary in OIM

Boundary menu in OIM Software


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Boundary menu in OIM Software

Select the type of boundary

from this area.

Definition of Grain boundary


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Definition of Grain boundary

Grain 1 Grain 2

Boundary plane

Boundary

Two parameters are necessary todefine boundary character.

1. Rotation Angle/ Common Axis

2. Boundary plane

EBSD doesnt have info in depth direction. So there is

no info about Boundary plane in EBSD analysis.

* It is not possible to distinguish these two

difference without boundary plane info.

Boundaries


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Rotation Angle A line segment is drawn between two neighboring points if themisorientation falls in a given range (e.g. between 5 and 15 degrees)

Axis/Angle A line segment is drawn between two neighboring points if themisorientation between the two points is within a given tolerance of a

specified ideal misorientation where defined by an axis/angle pair (e.g. 60degrees about ).

Grain A line segment is drawn between two neighboring points if they belong totwo different grains.

Phase A line segment is drawn between two neighboring points if they belong totwo different phases.

CSL A line segment is drawn between two neighboring points if they are within agiven tolerance of specified CSL (coincident site lattice boundary).

Shape Ellipses An ellipse is fit to each grain in the map and then overlaid on the map.

Boundaries


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Baoundary: Rotation Angle


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Baoundary: Rotation Angle

Rotation Angle

A line segment is drawn between two neighboring points if the

misorientation falls in a given range. (60 5 in this example.)

This is very basic way to show the boundary in OIM. This boundary

is just for display. And it is not necessary to be closed loop.


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Preferences


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Preferences

OIM-A5.2

Boundary : Minimum Misorientation


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Boundary : Minimum Misorientation

Attention must be paid that the Rotation Angle boundaries which rotation angle is less than

Minimum Boundary Misorientation will be ignored to display the boundary.

minimum boundary misorientation

= 2 degrees

minimum boundary misorientation

= 0.5 degrees

Practice


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Practice

Lets draw rotation angle boundary using Rolled Steel data.

Draw rotation angle boundary with rotation Angle , 1~55~15 and15~180(65) deg. on Image Quality map.

Change Minimum Boundary Misorientation value in Preference.

Boundaries: Axis/Angle


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Rotation Angle A line segment isdrawn between two neighboring points if

the misorientation falls in a given range.

(60 5 in this example.)

Rotation Axis A line segment is drawn

between two neighboring points if the

two orientations have specified

directions aligned within a specified

tolerance. ( crystal directions

aligned within 5 of each other in this

example.)

Axis/Angle A line segment is drawn

between two neighboring points if the

misorientation between the two points is

within a given tolerance of a specified

ideal misorientation where defined by an

axis/angle pair. (within 10 of 60

about in this example.)

Axis/Angle

Boundaries: Axis/Angle

Boundaries: CSL


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CSL A line segment isdrawn between two

neighboring points if they

are within a given tolerance

of specified CSL (coincident

site lattice boundary).Coincident site lattice

boundaries are special

boundaries where a given

fraction of the atoms at the

boundary are in coincident

positions. The numberfraction of coincident atom

sites are given by 1/. An

example is given for 5

which corresponds to a

36.9 rotation about .The tolerance is given by

K/n. The default settingscorrespond to Brandons

criterion (K=15 and n = ).

Boundaries: CSL

Equivalency in Grain Boundary


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Rotated 70.5 deg/

Rotated 60 deg/

Equivalency in Grain Boundary

Ni Annealed twins

1

2

Grain boundaries are calculated based on

relationship between rotation angle and common

axis. Sometimes two (or more) different rotation

angle and common axis relations show the same

relations.

Grain 1 is..

These areexactly same.

Practice


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Practice

Lets draw the following boundaries using Ni-Std_small-area data.

Rotation angle: Rotation angle more than 15 deg.

Axis Angle : 60 deg rotation around common axis.

CSL boundary : 3 boundary

Boundaries: Reconstructed


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Reconstructed A line is fit to a set of grain boundary line

segments and drawn on the map. It is drawn between two triplejunctions.

*Reconstructed Twins Reconstructed boundaries can be

colored according to their fit to specific twin boundary criteria

both in terms of misorientation and twin plane/boundary alignment.

First the average misorientation of the segments the reconstructedboundary represents is calculated. In this case the average

misorientation must be within 9of a 60rotation about

(the primary recrystallization twin in fcc materials) and the (111)

plane trace must also be aligned with 9 of the reconstructed

boundary.

Extraction of Twins from Orientation Imaging Microscopy Scan Data S. I. Wright, R. J. Larsen,

Journal of Microscopy, 205, 245-252 (2002).

Boundaries: Reconstructed

Grains without twin boundaries


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Grains without twin boundaries

It is possible to recognize grainswithout twin boundaries.

If you want to remove just coherent twins, specify here.

Add twin boundary condition to

be removed.

Specify twin boundary

indecies to be removed.

Rotation Angle

Common Rotation axis

Practice


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act ce

Lets draw a Unique Grain Color map without twin boundaries using Ni-

Std_smalloarea data.

Sub menu for Map display


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p p y

Additional functions for Map display.

Map/FlexView


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p

Unit Cell, Pole Figure and

Reconstructed EBSD patternof the point specified by cursor

will be shown in both Flyby or

Static mode on FlexView tag.

Chart


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Image Quality

Confidence Index

FitVideo Signal

Grain Size (points)

Grain Size (diameter)

Grain Size (area)

Grain Size (ASTM)

Grain Size (Intercept)


Grain Shape Aspect Ratio

Grain Average IQ

Grain Average CI

Grain Average Fit


Grain Orientation SpreadGrain Average Misorientation


Crystal Orientation

Crystal Direction

Pole Plot

Pseudo Rocking Curve

Kearns ParameterTaylor Factor

Schmid Factor

Elastic Stiffness

Misorientation Angle

Misorientation Profile

CSL BoundariesCSL Deviation

GBCD

Boundary Density

Texture Fiber

Texture Index

Texture Gradient

EDS

Phase

All data shown in Maps or Plots can be

shown in Chart, too. There are several

Chart only data in the menu.

Chart Menu in OIM


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Select required chart

in Type and set

detail condition by

opening Edit.

Charts: Grain Size


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Grain Size (points): Number of measurement points in a grain

Grain Size (diameter): The diameter (D) is calculated from the area (A) assuming the grain is a circle: D

= (4A/)1/2.

Grain Size (area): The area (A) of a grain is the number (N) of points in the grain multiplied by a factor of

the step size (s). For square grids: A = Ns2. For hexagonal grids: A = N3/2s2

Grain Size (ASTM): G = -6.64*log10(D) - 2.95 where D is the grain diameter given in mm

Grain Size (Intercept): Vertical or linear intercepts

Charts: Grain Size


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The area (A) of a grain is the number (N) of points in the grain

multiplied by a factor of the step size (s).

For square grids: A = Ns2

For hexagonal grids: A = N3/2s2The diameter (D) is calculated from the area (A) assuming thegrain is a circle: D = (4A/)1/2.

Data used for making chart is shown in right side.

Charts: Grain Size


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Calculation methods for Averaging.

Average by Number method

Average by Area Fraction method

Total area: 100

8

8

25

59

Average by Number method

100/4 = 25

Average by Area Fraction method

8*0.16 + 25*0.25 + 59*0.59

= 42.34

Practice


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Lets draw Grain Size chart using Alpha-Steel data.

Draw a chart using Log scale or Liner Scale.

Check what happen when Tolerance for grain recognition in Partition

Properties.

Chart : Crystal Direction


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y

Cumulative

Chart : Misorientation Profile


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Map data can be plot in addition to

Misorientation data.

IQ ValueMisorientation between neighbor pixels

Misorientation against start point

Practice


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Lets make Profile Vector chart using Alpha-Steel map data. Draw a line on the

map and make the misorientation chart.

Use this Profile Vector icon.

Chart : Misorientation Angle


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Misorientation Angle chart shows the

misorientation angle of boundaries in the map.

We can see that the low angle boundaries are

major part of boundaries.

Chart : Graphics


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All Map data and Plot data can be shown in chart

format. Also there are several chart only menus.

Setting detail condition for the chart.

Chart: Graphics


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We can change Chart style

using Graphic properties.

Practice


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1. Lets draw Misorientation chart using Ni-Std_small-area.

2. Change character size or make the Chart in 3D format.

Chart : Boundary Density


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Boundary Density shows the density of the

boundaries with specified angle (total lengthof specified boundaries divided by area) in

cumulative format.

Example of partial annealed steel

20% 60% 85%

Multi Chart


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Practice


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1. Draw charts for IQ value of phase using Dual Phase Titanium.

2. Draw multi chart for IQ values of both phase and phase using Dual

Phase Titanium.

Pole Figure, Inverse Pole Figure, ODF


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Pole Figure

Inverse Pole Figure

Euler spaceBunge

Kocks

Roe

Rodrigues Orientation

Rodrigues MisorientationAxis/Angle Misorientation

Discrete Plots Al Evaporation Film

IPF map (ND) IPF map (RD)

Lets think about Pole Figure, Inverse Pole Figure and ODF

using this example.

Pole Figure : Specify some crystal plane and show the relationship between that crystal plane

normal and sample coordinate using stereo projection.

Inverse Pole Figure :

Specify some sample plane such as ND plane and show the crystal plane normal

which becomes parallel to the specified sample plane.

Discrete Plots : Pole Figure


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Specify Crystal plane

Data : Al-film

Any crystal plane can be specified, butgenerally it uses (001), (101) and (111) planes

in case of cubic.

Edit detail display condition

Discrete Plots : Inverse Pole Figure


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Specify sample plane normal by vector value. Data : Al-film

Any sample plane can be specified, butgenerally it uses RD, TD, ND planes.

Select Inverse Pole Figure

[RD, TD, ND] components are shown.

Discrete Plots: ODF plot


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Euler angles of each pixel are plot

directly in 3D display. There is 90

degrees symmetry in cubic, so it is

shown in (90, 90, 90) deg area. 3D

display is not so convenient. It isgenerally shown using 2 asconstant value as shown in left.

We can see that the orientations

are continuously changed.

In ODF plot, one point can display

complete orientation.

Data : Al-film

Select Inverse Euler Space

Practice


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Lets draw Pole Figure, Inverse Pole Figure and ODF of Al Extrusion data, and

think about features in texture of data.

IPF(ND) map

Intensity Plots : Pole Figure


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Data : Al-film

If the points in Pole Figures overlap each other, we cannot tell how many points are

overlapped. Then we need to convert this discrete plot to intensity plot.

There are two methods to calculate intensity of Pole

Figure or inverse Pole Figure or ODF, Harmonic Series

Expansion and Discrete Binning methods. Level key is calculated based on perfect random

distribution. Perfect random becomes intensity 1.

And number of intensity means multiple of perfect

random.

Intensity Plots : Calculation methods


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Data : Al-film

We cannot see so much difference between the results of these two methods in case of Al film

sample, except absolute intensity. But generally it becomes very difficult to calculate the

intensity around the center (around ND axis in the following case) in Discrete Binning . Becauseof that the area becomes infinity small at the center. Harmonic Series Expansion doesnt have

such problem. So Harmonic Series Expansion is better to calculate intensity.

Harmonic Series Expansion Discrete Binning

Intensity Plots : Calculation methods


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Data : Ni-Std_small-area

Harmonic Series Expansion is generally better to calculate the intensity. But like following case, a

group of very strong single peak , such as single crystal, the intensity plot becomes very strange

as follows. It becomes from oscillation term of series expansion calculation. The intensity is veryclose to 1, so there is actually no problem. But it looks very bad. There is no such problem with

Discrete Intensity method.

Harmonic Series Expansion Discrete Binning

Resolution of Intensity calculation.


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L=16

=5

L=16

=2

If we improve the resolution, the peakbecomes shaper, and looks like more real

plot. But it will take a lot of time for

calculation.

Intensity Plots : Adjust display


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Edit the display methods ofintensity plot by clicking Edit and

open scale window.

There will be three major factors to be

adjusted.

1. Iselect ntensity plot or Counter plot.

2. Scale can be set as absolute value

scale.

3. Display color, B&W or Color display.

1

2

3

Practice


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Lets make Pole Figure and Inverse Pole Figure in absolute scale using Al-Bend_00and Al-Bend_80. The compare it how they are different.

Pole Figure of Al-Bend_00

Practice


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These are examples of Pole Figure and Inverse Pole Figure. If this sample has these PF and IPF,

please think how IPF map of this sample should look like.

ND TD

RD

Practice


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IPF maps of previous sample look like as follows.

IPF map (ND)IPF map (RD) IPF map (TD)

Highlighting


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Highlight is a function to make relationship among Maps, Plots and Charts. It is very

effective to show some specific features of the texture.

Highlighting: Toolbar


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Record: record highlighting results in

the Interactive pane of themap window.

Undo Back to previous situation ofHighlighting.

Redo Move forward from Undo situation.Clear Clear all highlight data

Show Interactive Properties by click

right mouse and select properties.

Specify detail of displayed info

in Interactive page.



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Highlight the point clicked.

Highlight all orientations within

a given tolerance of the point

clicked.

Define the color to be used.



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Highlight all orientations withingrain and color them according to

the angular distance from the

point clicked.




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Calculate misorientation between two

points.

Calculate misorientations at a triple

junction. Actually it repeats two points

misorientation calculation three times.



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Displays a crystal direction

parallel to a line.


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Angular tolerance used for various

highlighting modes.

Tolerance = 30 Tolerance = 15

Define the (hkl) for the plane traces.

Use the average grain orientations

when calculating misorientations.



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Find all points in the scan within the

angular tolerance of the point clicked in

discrete plot.

Calculate the misorientation between

two points in a discrete plot




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Select a color gradient multiple point highlights.

Select a color for individual

highlights.

Highlighted -> Partition


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Crystal Direction map along with TD

direction within 10 deg of CVD-Ta data.

Practice


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Lets separate grains into Recrystallized grains and Non-recrystallized grains ofPart-Rx Steel data. Then draw boundary density for both two groups of grains.

Please try to use Multi chart to show the difference of boundary density.

IQ of Part-Rx Steel data

Clean Up


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Sometimes there are isolated points that are not indexed correctly or at all due todust particles or pits on the surface. Various clean up schemes are available to

assign these points an orientation based on their neighbors.

Some danger in Clean Up procedure


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This is an example of Clean-upresult by Grain Dilation method. IfClean-up is done by not appropriatemethod it makes artifact to the data.

On the other hand if Grain boundaryfeatures are studied it is notappropriate to analyze them with manybad points at grain boundary like theleft map. Clean-up is necessary in thiscase. Users need to judge what is done inClean-up procedures and also needto check the results are reasonableor containing artifacts.

Clean-Up menu


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OIM Analysis Software has manyClean-up methods as shown in

left Figure. Users need to select

suitable ways to do clean up the

data.

As shown before, Clean-up may

introduce artifacts. So the user

has to check the results

comparing with original data and

find if it is reasonable or

introducing unacceptable artifacts.

Grain CI Standardization


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Grain CI Standardization is check CI values of allpixels in recognized grains and change their CIvalues to the highest one in the grains as follows.This method does not change any orientationdata and only helps to identify points that arecorrectly indexed but may have had a lowerconfidence index.



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As-collected

CI>0.1 96.5%


CI>0.1 98.9%



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IPF map (CI>0.3)CI map

Before Clean Up

CI Chart

After Clean Up

Only CI values are changed. Any other date will be stay same.


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Clean up


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However, it is important to make sure that the resulting microstructure makes sense also

watch the texture and grain boundary changes.

Grain DilationCu IC Lines data


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Cu IC Lines data

Clean up by Grain Dilation

method w/o single iteration.IPF Filtered the clean up data by IQ>50.

If single iteration is checked, Grain Dilation Clean up stop the

procedure after it cleans up (expands) the data one pixel layer.

Clean up with single

Iteration

After clean up process, it some

artifacts are introduced, there are

some cases we can remove those

artifacts by filtering the data by

other parameters such as IQ, CIWe should be careful that those

cleaned up pixels has modified

orientation data, CI data.

Grain Dilation (Single Iteration)


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Original IPF 1st Iteration 2nd Iteration 3rd Iteration

4th

Iteration 5th

Iteration 6th

Iteration 7th

Iteration

Practice


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Lets compare the Misorientation chart of Cu_Cold-Rolled92 data before andafter clean up. ( Use Grain Dilation method.)

Data Process at DataSet level


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If you use the data processfunctions in red box, all the

partition data under this dataset

will be affected by these

processes.

Coarsen removes pixels

every two pixels and the

data 1/4 size.

Rotation

R i i d f d


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Rotate orientation data of dataset.

Be careful!! It rotate only orientation data. It

is not rotate the image data. The image

(grain shape) stay same and only the

orientation data is rotated. So after this

rotate process, there happens discrepancy

between image data and orientation data.

Practice


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Lets draw IPF(ND) map and Pole Figure of CVD-Ta data. The rotate the dataaround RD axis by 90 deg. and check the difference from original data.

Crop


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Cut out the specified area and make it as a new dataset.

Select Single Rectangle or Multiple

Polygons. In case of Multiple Polygons,

continuous left click specify the area

and final right click close the polygon.

Merge


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Datasets can be merged

together.

The relative positioning

of the datasets is

controlled by the user.


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Practice


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1. Crop one grain from Steel_Fcc-Bcc data and check the orientationrelationship between FCC phase and BCC phase.

2. Merge Al-FSW1, Al-FSW2 and Al-FSW3 data and make them as one dataset.

Templates


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The conditions to make Map, Plot, Chart can

be saved as Templates. The apply these

templates to other data to draw Map, Plot

and Chart with same condition.

Save Template

Apply Template to the Partition

Templates


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Map, Plot and Chart conditions can be saved as individual templates. Not only individual

templates, all Map, Plot and Chart conditions can be saved as one partition Template .It is very convenient to draw same series of data for different dataset .

Map, Plot and Chart conditions are saved as one

template at Partition level.

When Partition Template is applied, it must be

done at one level higher, Dataset level.


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Batch Processor


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A tool to apply a partition template to multiple

sets of data.

Includes Rotate, Cleanup, Crop, and Export

functions.

An alignment function to align consecutive

sets of data for a sequence of scans, e.g.

from serial sectioning or slices in time.

4 oim analysis eng

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