X-PEEM and its applications

EE 235 Presentation 2Brian LambsonX-PEEM and its applicationsKey TermsPhotoelectron Emission Microscopy (PEEM)

Key TermsPhotoelectron Emission Microscopy (PEEM)X-ray Magnetic Circular Dichroism (XMCD)

Key TermsPhotoelectron Emission Microscopy (PEEM)X-ray Magnetic Circular Dichroism (XMCD)

Examples of X-PEEMNolting, F., A. Scholl, et al. (2000). "Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins." Nature 405(6788): 767-769.

Young, A. T., A. Bartelt, et al. (2007). "An Ultrafast X-ray Detection System for the Study of Magnetization Dynamics." AIP Conference Proceedings 879(1): 1206-1209.

Element SelectivityStrong absorption peaks allow for element-selective imagingOf particular interest, X-PEEM can image multiple layers of a 3D structure

LaFeO3 (antiferromagnet)Cobalt (ferromagnet)Imaging Exchange Bias

Nolting, F., A. Scholl, et al. (2000). "Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins." Nature 405(6788): 767-769.1.2nm Co / 40nm LaFeO3 grown on SrTiO3 (001) substrateTime Resolved ImagesPump-probe technique is used to image magnetization dynamicsThe time-resolution is limited by the convoluted length or rise times of both laser and X-ray pulses

Ultrafast Imaging via Streak Camera

Young, A. T., A. Bartelt, et al. (2007). "An Ultrafast X-ray Detection System for the Study of Magnetization Dynamics." AIP Conference Proceedings 879(1): 1206-1209.ConclusionsX-PEEM is a useful tool for exploring the static and dynamic behavior of magnetic materialsResolution of < 20nm allows for nanoscale applicationsElement selectivity makes it possible to study interactions between multiple magnetic layersTime resolution on the order of 1-10 ps allows for ultrafast dynamic studies