VOL. 2B, NO 1, JANUARY 1008

Ie........ NATIONAL CONFERENCE OF STANDARDS LABORATORIES

PRESIDENT'S MESSAGE

... The Co petitive Edge ...

There is a strong link between advancement in measurement science and competitiveness. Measurement science is an integral part of technological growth, produ quality, an, mmerce. Inn vative management knows that measurements: and processes In er control insure quality and assures it at a competitive price.

Productivity in measurements extends from the calibration/maintenance cost per item to the cost per measurement on the floor, or, at the bottom line, the cost of measurement to the product. Tbe cost per measurement to the product goe well beyond the calibration laboratory. Therefore, the challenge of the "competitive edge" requires all of us to re-evaluate our role and break out of our traditional goals and objectives.

Your organization's Metrology entity and related activities can affect major cost factors in the cost of measurements to the product. As N . L has broadened its scope since 1961, so must our organizations take advantage of expanding opportunities to enhance the "competitive edge". The new opportunities are a result of a tremendous increase in complexity and ost of lest equipment. This, coupled with products of increa~d complexity and sop '·ticlition, results in increasingly-complex testing at higher and higher accuracy.

Some of the opportunities that can affect the "competitive edge" might be outside of our current box. They're somebody else's

responsibility, or nobody's responsibility, or "put in that category of too-hard-to-work, nobody cares, or nobody-will-listen. We must accept th- clwUenges, do our homework, pull down barriers, and move forward, We have to get out of our comfort zone, go into territory that's new to us, or where we lack {Jrmfidencc. We have to gain expertise, and again, go forward.

Breaking Ollt of our "box" means that we must look at things from our "customer's" perspective - a non-traditional sense, It also means that we have to look at tbe total picture and not just our comer, and we have to look at it from several directions. We "!lave to look at tlIe effect of cost and quality to the product and also from a customer viewpoint. Here are some examples to get slarted:

... Quality of work - Certainly effects reliability of instrumenration and acceptance or rejection of goo~ or bad product. What is the right level of qu ality?

... Automated calibration - effective use to cut cost of service/calibration. What works?

'" Automated work flow management - effective lise of overtime, reducing turnaround time. What is the effect?

... Just- -rime - eliminate or reduce backlog, redLLce turnaround time, Does ir work in the cal lab environment?

• Onsite service - eliminates backlog, reduces turnaround time. What are the methods (If 'Operations? What are the pilfalls.?

... Equipment specification/evaluation - reduce cost of ownership. How much'?

... Intervals - cost/quality effect. Too long or too short? (Colltinued on page 49)

NCSL President Ed Nemeroff wanted to be here today, and actually had plane reservations to fly in last night and out this afternoon. However, it just wasn't feasible. So he sends his best wishes and a little something for you to remember us. However, before I make this presentation I would like to say that this was all in jest, and that no matter what was said, we all think you are one hell of a guy, and we are going to miss you. I would also like to thank Mary Lee for her help and foreb ea rance, and to thank all of the Roasters for their

contributions.

Now before I give you a chance for rebuttal, I would like to

say ...

HARTWELL, YOU WERE THE FIRST NCSL PRESI­DENT TO TESTIFY BEFORE THE U.S. CONGRESS, AND THE FIRST CHAfRMAN OF GOVERNMENT AF­FAIRS. Most people will never know the time and effort you expended, but you can always be proud of the job you did.

The "lynching mob';' George Rice, Rolf Schumachel; Dave Mitc!tell, Gary Davidson, Hartwell, Dean Brungalt, Pete England, and John Varl de Houlofl.

Hartwell Honored

Mary Lee and Hartwell, Secretary Cheryl.

Dave Mitchell remembers some photographs from Ihe mid-70s.

Dean, Hmmell and Ray Wade.

Ed Nemeroff sent a special plaque that showed an unusually­

disrespectful use of Congressional testimony and MIL-C-45662.

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T RING HARRlS CORP.

GOVERNMENT ELECTRONIC SYSTEMS DIY. MELBOURNE, FL.

HOST: DICK BOWEN

EQUIPMENT CONTROL CENTER

The Equipment Control Center operates as an equipment management function. It is responsible for the following areas: .. Control of location and movement of test equipment .. Storage of dormant and surplus equipment .. Disposal of all obsolete equipment

In addition, the Equipment Control Center provides a listing of descriptions and quantities of test equipment within the sector's inventory of equipment. Other documentation includes calibration history, equipment inventory and location, and recall records.

Some of the documents that govern the Test Equipment Center's operation are MIL-STD 45662, NASA's NEB 5300.4

Dick Bowen, Metrology and GSS's Standard Procedures S616 and ES850084. Manager at Hanis Cop, our Tour Host

COMPUTE'R·AIDED OSCILLOSCOPE CALIBRATIONS TEST EQUIPMENT CENTER

The Harris Test Equipment Center (TEC) occupies 7000 square feet of laboratory space that is temperature and humidity controlled.

TEC is staffed by a skilled team of engineers, technicians, and administrative and clerical personnel who have many years of experience in the areas of metrology, calibration, and equipment inventory management. TEC is composed of two sections: the Calibration Laboratory and the Equipment Control Center.

CAUBRATION LABORATORY ,Dave Harrly verifying oscilloscope operation utilizing computer­

The Cahbration/Standard Laboratory is subdivided into two aided system. areas responsible for electricaljele(.1ronic test equipment and Computer-aided oscilloscope cahbrations are accomplishedekctromechanical physical measuring equipment. Both areas using the Fluke 1722A controller and the Tektronix CG5001 utilize a wide variety of precision instruments that are Oscilloscope calibrator. A wide variety of general-purpose traceable to the National Bureau of Standards (NBS). These oscilloscopes and plug-ins are certified. instruments are used for accuracy verification, repair, and maintenance of all general purpose and some special purpose COMPUTER-AIDED METER CALIBRATIONS test equipment, i.e., signal generators, oscilloscopes,

The Fluke 1722A controller allows for computer-aidedtheodolites, and receivers. Some areas of measurement calibration for a wide range of general-purpose analog and capability are ac-dc voltage and current, time and frequency, digital meters, power supplies and amplifiers. The Fluke 5100microwave/attenuation, pressure, dimensional, force, and

mass.

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Touring our Member Labs

Micky Gates perfonning computer-aided meter calibration.

provides dc voltage to llOOV, ac voltage to 600 Vnns, and decade resistance froru 1 ohm to 10M ohms.

TEM ERATUAE CALIBRATJO S

Temperature calibration is perfonned by Ron Masters using

Fuke Scanner and Rosemont Balh

Temperature calibrations are typically performed in the -200 to +400 DC range with an accuracy of .±0.2 DC but can be made -250 to 2400 °c with lesser accuracy. Platinum resistance thermometers can also provide higher accuracies in the -220 to +630 DC range. A primary platinum resistance thermometer is maintained as the temperature reference and is traceable to NBS with accuracies of ,±0.10 DC, -100 to +100 DC.

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PRESSURE CAUBRATION

Pressure cahbrations are performed by comparison with standard gages in the 0-500 psi range. The Bell and Howell calibration pressure controller is used to establish a reference pressure, using dry nitrogen. High pressure calibrations are accomplished with the Ashcroft deadweight tester which is accurate to .±0.1% IR from 500-10,000 psi.

This pressure calibration station is certified using a CEC 6-201 primary pneumatic pressnre standard with resolution of 0.002% IR and an accuracy of 0.025% of reading. The primary standard is referenced to fundamental quantities of mass, length, and time for calibration of gage and absolute types of pressure measl1ring devices.

DIM SIONAL

Dick Hampton certifying plug gages using a Pratt & Whitney Supennicrometer.

All dimensional measurements are traceable to NBS through a Starrett master gage block set of grade 1 accuracy by

comparison methods using a Federal 130 precision gage block comparator with an accuracy of .±.1 micro-inch.

Rudy Barnhill verifies pressure gage accuracy by companson with standard gages

Touring our Member Labs

THEODOLITES CALIBRATION AND REPAIR

The K & E theodofite test stand is used by Andy Fontenot.

Mechanical and electronic theodolites are calIbrated using a K&E 71-7010 theodolite test stand with capabilities of certification to .±.1 arc-second. Repair and realignment capabilities extend to the component level and include the reworking of modules for spares to expedite turnaround time. The theodolite stand-in maintained is a separate environment and is traceable through a special test jig manufactured by K&E.

VACUUM

Ron Masten setting up the Ultek vacuum system

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Vacuum calIorations can be performed in the low, high, and ultrahigh vacuum ranges. A Wallace and Tiernan manometer is used in the 0.1 to 800 mm Hg with a resolution of 0.001 rum Hg and an accuracy of .±.0.01 mm Hg. Ultrarugh calibrations are performed using the Utek vacuum system with capabilities of 10 to lxlO·ll torr and an acuracy of 10% utilizing the Bayard-Alpert ionization gage tube for mOnitoring.

MASS

Analytical balances, like the Troernner 1751 dual pan balance, are used to compare test weights with working standard weights. Up to 30 kg and a sensitivity of one grain, these weights are certified and traceable to NBS. Accuracy is determined by the NBS class of the weights. Class T, C, S, and S-l weights are maintained and used for a variety of applications to support other areas such as torque and pressure.

F ECUENCY ST NDAR'D

The primary frequency standard is an FTS4050 cesium-beam oscillator with outputs of 10, 5, and 1 WIz, 100 kHz, and 1 pps with a stability of 1 part in 101Z per 24 hours. This frequency is constantly compared to Loran C via the NBS frequency system which is monitored, by modem, by NBS in Boulder, CO. The outputs of the FTS4050 are distnbuted to all frequency counters/synthesizers/generators that use crystal oscillators as a reference, thereby providing direct NBS traceability for all frequency related measurements.

DC/ACVOLTS

The primary de voltage reference consists of two banks of Guildline 9154D saturated cells which are alternately returned to NBS for recertification with accuracies of .±.1 ppm de calibrations using the Fluke 5440B de calibrator with a voltage output range of 0-1100 volts and basic uncertainty of 3 to 4 ppm utilizing the F1uke 73'1A de reference standard and Fluke 752A de reference standard and fluke 752A reference divider.

CAPACITANCEIINDUCTANCE/HES,ISTANCE

Primary fundamental electrical standards are housed and maintained in the reference standards room. Capacitors from 1.0 pF to 0.5 .uF, inductors from 100 ,uH to 1 H, and resistors from 0.01 ohm to 1M ohms are maintained with direct traceability to National Bureau of Standards. Additionally, measurement capabilities range from 0.05 pF to 10,000 ',uF .±.0.1% for capacitance, 0.05 .uH to 10,000 H .±.0.1% for inductance, and up to 100G ohms .±.15 ppm for resistance.

The F1uke 540B thermal transfer standard provides traceability to NBS with an accuracy of better than 0.01% using calibration curves in the 0.25-1000 Vnns ac with

frequency range of 5 Hz to 1 MHz. The ac calibration is performed using the Auke 5200/5215 ac calibrator with a range of 0-1200 Vrms and an accuracy of .±0.05%.

SCALAR/NETWORK ANALYSIS

The HP 8510 allows verification of a wide variety of active and passive devices including amplifiers, attenuators, directional coupler, filters, and phase shifters in the 45 MHz to 18 GHz range traceable to NBS, with resolutions of 0.001 dB, 001 degree. Scalar and network analyzers of all types are certified and repaired to the component level.

SPECTRUM ANA YSIS

Spectrum analyzers are certified using computer-aided precedures as demonstrated by Andy Schott

Touring our Member Labs

Spectrum analysis of signal generators is performed from 5 Hz to 110 GHz with frequency accuracies of .±100 Hz at 100 GHz, phase locked to distnbuted C-beam standard. Computer-aided procedures are utilized for calIbration of both signal generators and spectrum analyzers for automatic recording of test results as well as uniformity of measurement technique. Capabilities also include troublehooting and repair to component level.

LOW OUENCY BRATIJONS

Synthesized function, level, and signal generator, electronic counters, audio analyzers, and spectrum analyzers, all phase locked to distnbuted C-beam frequency reference, provide for direct traceability of measurements for electronic counters, generators, and spectrum analyzers in the dc to 100 MHz range. Level measurements are traceable through thermal transfer techniques providing for accuracies of less than.±l%.

'0 QUE CAUBR'ATIONS

Utica torque analyzers are used to certifY and cahbrate torque wrenches, screwdrivers and other static torque applying devices in the 0-500 oz. in., 0-2000 lb. in. and 0-500 lb. ft.

ranges with ±1.0% accuracy. The analyzers are certified in­house using mass and dimensional standards traceable to NBS.

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I

AVA

Editor:

Please accept the enclosed brief biographies and pictures of this years graduating Metrology students from the Technical Institute of Hutchinson. We hope you will once again publish these in the NCSL Newsletter.

This years' class is an energetic group. They have developed their individual ski!l.ls with a willing, positive attitude toward learning. These students are eager to begin applying the skills they have learned, and are committed to continued learning in the field of Metrology.

We wish to thank you for the opportunity to be included in the Newsletter, and for your time and consideration in this matter. Ifyou have any questions, please feel free to call us at (612) 587-3636.

Sincerely, Pat Rasset, Brad Mrozek, Jeff Bulau, Brad DesMarais, Rick 'Lennes.

Grams, Rogers,

Paul Paul

Wegscheid, Mathwig,

Pat Ben

Paul S. Wegsheid Paul D. Mathwig

P ul W sheid. I am currently completing the Metrology Techn Jogy program at the Technical Institute of Huchinson, specializing in the area of DC-Low Frequency test equipment. Upon graduation in July of 1988, I will be seeking employment as a Metrology Technician or in the Quality Control area. With my hands on experience at T.I.H., two years of college education and two years of industrial experience (3M), I have developed the confidence and determination to achieve a position as an entry level employee. In addition to training and experience, I am currently President of the Metrology Society in Hutchinson, a member of the Instrument Society of America and an applicant to the Precision Measurements Association.

Palll Mathwig. I am looking to obtain an entry level position in a Metrology related field (physicalfElectrical). My major has been in troubleshooting, repair and calibration of DC­Low Frequency electronic test and measurement equipment.

I am seeking a position in a calibration or standards lab. work well with people and enjoy the challenge which a career in this field allows. For the past two years I have been pursuing my education in Metrology Technology and working for the United Parcel Service. I have a wife and four children, and will be seeking employment upon graduation in May, 1988. I am willing to relocate.

Jeff Bulau Parlick G. Russet

Je Bulau. Planning to graduate from the Hutchinson Metrology Program in July, 1988, I will be seeking employment as a MetrOlogy Technician. Major areas of study are in the calibration and repair of DC-Low Frequency instruments. I am a working, full-time student with prior industrial experience at 3M in Hutchinson,:MN. I member of the Instrument Society of America, and representative of the Student Senate.

am a a

~ trick kasseL I am seeking an entry level position as a Metrology Technician upon graduation from the Technical - stitute of Huthchinson Metrology program in March, 1988. y major area of training is in the calibration and repair of

DC-Low Frequency Icest equipment. As a National Merit Scholarship recipient, I previously attended the University of Minnesota, studying courses related to pre-engineering. I am confident that my educational background has provided me with a solid foundation to meet the challenges of a career in

MetrolOgy, and upon which to continue building throughout my career.

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Brad Rogers Benel1. DesMarsais

Brad Rogers. I am currently completing my fmal semester in Metrology at the Technical Institute of Hutchinson. My major area of study includes the calibration of DC-Low Frequency test equipment. I am SeekiJlg a challenging position in the Metrology field or in he Quality Control area. I am a member of the Instrument Society of America, and the Precision Measurements Association. I would consider relocation within the U.S.

Benet J. DesMarsais. I am "c,eking employment as a Metrology Technician or i [he Q ality Control area. My major area of Stlldy is in th.e cali 1'lltJ n and repair of DC-Low Frequency Instruments. I have al had prf;-'Vious training in Electronics. I am wilting to work in an.y location within the continental United States.

Metrology Talent

Patrick Mrozek. Upon completion of the Metrology program I will be seeking employment as an entry level Metrology Technician. My major areas of study are the calibration and repair of DC-Low Frequency Instruments. I would be willing to relocate, and after employment I would like to continue my education. My expected graduation date is May, 1988.

Rick Lennes

Rick Lennes. Upon graduation I would like to obtain a position as a Metrology/Electronic Technician. I am anxious to apply the knowledge and skills acquired in my academic education, which in addition to the Hutchinson Metrology program includes an Associate Degree in Electronics Technology from Northwestern Electronics Institute. Some hobbies include carpentry, woodworking and skiing.

Bradley D. Grams Patrick Mrozek

Bradley D. Grams. Upon graduation from the Technical Institute of Hutchinson Metrology program in March, 1988, I will be seeking an entry level position as a Metrology Technician. My major areas of study are in the calibration and repair of DC-Low Frequency Instruments. Through the use of a lIands on approach, the education and confidence that I have acquired has prepared me for a career in Metrology. I am willing to relocate.

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Eya owSOM SHOULD K

DR CALDWELL

Del Caldwell, the new Executive Vice President of NCSL, is the manager of the Measurement Technology Division of the Navy's Metrology Engineering Department in Corona, California. Del joined the Center (the forerunner of the new Department) 23 years ago as an instructor in electronic and microwave metrology. Del went from that position to staff engineer, specializing in microwave and millimeter wave calibration standards development and evaluation for the Navy Metrology and Calibration (METCAL) Program. Involvement in this field led naturally to a management position responsible for analyzing requirements and planning calibration support for test equipment used to support a wide range of Naval aviation systems.

In a later reorganization of the Center, Del was assigned as manager of the Requirements Analysis Division which had responsibility for analyzing calibration requirements and planning support for new test equipment developed for use on all Naval systems. Establishing basic requirements for Navy standards and cahbration laboratories and calibration technician training were also included in this division's responsibility along with updating and publishing the Navy's Metrology Requirements List (METRL), the Navy Calibration Equipment (NCE) List, and other data base oriented publications.

In Del's present position, he is primarily responsible for the research, development, test, evaluation, and procurement of new calIbration standards and equipment for the Navy METCAL Program. This also includes development of new

measurement techniques, automation and instrument control requirements and the development and evaluation of analytical models for calibration systems and programs. Prior to a recent reorganization, the analytical metrology segment included the analysis of calibration data and the establishment and adjustment of calibration intervals for the Navy's 2-plus million test equipment inventory.

Del is a member of Joint Service/Calibration Coordination Group sponsored Engineering Working Group and acts as liaison representative to the IEEE Committee to Promote National Microwave Standards.

In recent years, Del's involvement with NCSL has included participation in many conference workshops and sessions and chairing the National Measurement Requirements Committee from 1981 through 1984. In 1985 he was elected to Vice President for Laboratory Management and held that position until his election to the position of Executive Vice President. Del gives high marks to the NCSL community for contributing to his personal and professional growth and providing the opportunity and means to make a contnbution to the Nation's Measurement System.

Del resides with his wife Beverley in Claremont, California. They have two children, Chris and Alane. Chris and her husband have given the family two super grandchildren and Alane has graduated from Cal Poly, Pomona and is pursuing a venture in retail sales. All of the family love music, art, crafts, and activities that keep them in touch with the outdoors.

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RE OMTHE

Oct. 13, 1987

11B-EG/0JV Rosemount, Inc.

Burnsville, MN John Buck

Twin Cities Section Coordinator, Region 11

Jerry Valley of Rosemount Inc. welcomed us and presented some very interesting info about the company's work in the

field of aviation and space. They make some very impressive measurements in the field of temperature and pressure.

Phil Harrison of Datron, a Wavetek subsidiary, explained various methods for obtaining high resolution in DVM's. He also explained how a precision built-in voltage source is used to self-calibrate the DVM by removing some of the error due

to drift. Ron Rola, also of Datron, added details on the various internal waveshapes used to further improve the accuracy of DVMs.

Rod Enke of Unisys told about automating standard cell measurements and how it significantly reduces uncertainties. He also gave several other ways to reduce uncertainties. One was the use of the statistical software packages to compute the line of regression from a series of measurements, thus gaining and using the knowledge of the natural drift of standards. Another was using a computer network to collect, analyze, and utilize actual measurements on calibration standards that have better capabilities than the mfg states; thus improving

accuracy ratios without purchasing better standards.

Sandy Breault of 3M and Regional 11 Coordinator briefed us on his visit to the NCSL board meeting, the Equipment Management Conference, and status of doing MAP's in Region 11.

John Buck of Unisys and Twin Cities Sectional Coordinator briefed attendees on proposed revisions to MIL-STD-45662 and followed it with a short discussion of the problems.

Dennis Swanson of Air Automation Equipment explained some of the pitfalls in obtaining repeatable results with torque

wrenches. Some of the most important factors are operator awareness, checking tools on regular basis, and operator training.

Copies of a list of Statistical Software packages were distributed as well as copies of Flukes' Interpreting

Specifications of Calibration Instruments paper.

After lunch, we toured the Metrology facilities of our host. One of the highlights was the use of a laser to measure the height of mercury in a manometer.

Our thanks to Rosemount Inc. and especially to Urban J

Hartman for tlIeir efforts in making it a successful day.

Region 11, Twin Cities Sectional Schedule:

April 19, 1988 October 11, 1988

.........

Ron Rota ofDatron explains high-resolution DVM operation.

Lab tour ofRosemount. Inc

AITENDEES

S. Allison 3M Company Gregg Anderson Rosemount Inc. Leon M. Barnes Alljed Bendix Aerospace

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Oct 29, 1987 FMC, Corp. San Jose, CA Paul Chong Region 7 Coordinator

Re '011 "7 met at the FMC Corporation - with 39 individuals represe ling 26 different organizations. Our hosts were John D and Jim Veny.

Ie meeting agenda included the NCSL BOD report, two special topics, a demonstration of the Brown & Sharpe validawr, and a tour of the Bradley assembly area and test track. See photo--General Lee (John Lee of Telogy) rides again I

After the welcomes and introductions, I announced two objectives for Region 7 for 1988, namely: increase our membership by 10% and provide an environment to promote more interactions at our tri-annual meetings. Also announced was an opening for an adjunct training committee member to

represent Region 7.

Jim Ingram of Lockheed Missles & Space and NCSL Region Director gave the BOD report along with highlights from the Denver Conference. Two members of Region 7 received high honors at the conference: Mr. John L. Minck of Hewlett­Packard Company received the 1987 William A. Wildhack Award for his contributions to the field of metrology and measurement science, and Jim Ingram received the best paper presented at the '87 conference.

John Lee of Telogy and chairman of the NCSL Government Affairs Committee reports that the proposed MIL-STD 45662A has gone back to the government committee for re­draft after receiving NCSL's input and many inputs from individual companies. John also reports that the National Quality Improvement Act of 1987 established the Malcom Baldrige Award to be administered by NBS in three categories: companies and subsidiaries, companies primarily providing services, and small businesses. Watch for the future role of NBS under the pending National Institute of Standards and Technology (NIST)

Jim Veny, community relations manager for FMC Corporation, gave us an interesting overview of the FMC Corporation and showed two video films titled "Second To None" and "Reshaping The Future."

Mike Groccia of Locltheed Missiles & Space described their process used to develop a 117 questions test for new hires for the position of physical/dimensional technician. Traditional problems with just using resumes, employment applications and interviews conducted by non-technical Human Resources personnel is that they don't tell the complete story on the candidate. Since the test is administered by HR personnel, it

Reports from the Regions

had to be objective rather than subjective or combinations thereof. Terminology was another issue that had to be addressed. Lockheed's technician union representative also endorsed the test.

Christopher Garcia, vi.ce president of engineering for Valisys Corporation, a subsidiary of FMC, gave a very informative presentation on their "CIGMA", which stands for Computer Integrated Gaging Manufacturing Automation. CIGMA is a software system for integrating designer's specifications, quality assurance and mspection testing requirements. CIGMA solved a common information transfer problem between terms used by the designer, QA and inspection personnel by applying the General Dimensioning & Tooling Standard (ANSI). This has resulted in the formation of the Valisys Corporation and the dramatic reduction of BCO's and an approximate savings of $2K per BCO not generated. The test program has tolerance of 0.0000001 inches.

Raj Brian, quality engineer for FMC-Ordnance Division demonstrated the automated Brown & Sharpe validator which has reduced their testing time to 1/10th of what it used to require. The test platform cradles the Bradley chassis which the validator probes travels around taking the required measurements from many different points.

John Duarte, QA supervisor for FMC-Ordnance Division, assisted by quality engineers Gary Croft and Keith Willingham, guided us on an mteresting tour of the Bradley assembly area and test track facility. (The weather was being cooperative, it had threatened to rain but it didn't).

My thanks again to our hosts, John Duarte, Jim Veny and their associates for the use of the excellent FMC-Ordnance facilities and for providing refreshments. A special thanks to Geri Stahlheber of FMC who did a lot of the preliminary preparations for this meeting but couldn't join us because of her scheduled surgery. My personal thanks to each of the presenters and the attendees for their contnbutions to this meeting.

Looks like if Congress doesn't listen to John Lee's testimony, he will resolt to Ofher techniques.

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Reports from the Regions

Region 7 meeting at FMC Corp. in San Jose had a good tum out.

AITENDEES Wayne Adams John Amos John Archer Mike Bradshaw Steve Breitner David W. Blyth Debra Cabusas Paul P. Chong Joe Corege David Cross F.J. Dancisin Steve Dickey Bard Dunkelberger Fred Espenshade Christopher Garcia Mike Groccia Bob Guggemos Robert Harano William Harrison Bill Highchew Jim Ingram Richard Katsch John Lee Dana Loson Sergio Marquez William Mauer Jack Milburn Dave Moberg Pat Obuchowski Dean Pederson Gary Ross Fred Sieg Alexander Suchy Ivan Therrien Jim. Veny William Wexted Warren 1. Wilson C.M. Wiseman

IBM Simco Electronics Leasametric Test Lab Watkins-Johnson FMC Corp-Ordnance Div Watkins-Johnson ESL Inc. HP-Product Support Div. Watkins-Johnson ESL Inc. Intel (Folsom) Leasametric Signetics Valisys Corp. Lockheed Missiles & Space Intel (Santa Clara) IBM Applied Technology Interdyne Lockheed Missiles & Space Fluke Mfg & Phillip Co. Telogy FMC Corp-Ordnance Div. Oximetrix Apple Computer NBR Enterprises Applied Technology Leasametric Test Lab IBM Raychem National Semiconductor Apple Computer FMC Corp. GTE Government Systems Lockheed Missiles & Space Systron-Donner, Western Div.

October 8, 1987 Inn at the Airport Tucson,AZ Lee Walters, Phoenix/fucson Section Coordinator, Region 8

Lee Walters (Motorola Government Electronics Group, Scottsdale) was presented with a pen and pencil set for coordination efforts for the Region 8, Phoenix/Tucson Section the past several years. The set was engraved and decorated with the NCSL ensignia.

Wayne Benda (Hughes) began a discussion of Calibration Software Control by describing efforts made at Hughes, Tucson, thus far, to put a formal program into place.

The calibration software control system at Hughes includes provisions to take parameter data for comparison with data taken during the previous calibration. A listing of available calibration software includes reference to model, software author, and other useful information. Control forms are maintained for software development/revision history and calibration labels are used on floppy disk media. Stamped seals are placed over the disk write protect notch to insure against unauthorized changes. Tapes are handled in a similar manner. Softw'lfe has also been developed to check working calibration software for possible unauthorized changes or media failure. The discussion generated a great deal of interest among those present.

Ken Haupt (DCASMA Phoenix, Tucson Office), noted that a description of how software is generated is subject to the requirements of paragraph 3.3 of MIL-Q-9858.

Discussion of revision control was exchanged and consensus within the group indicated that copies of revisions no longer in service must be retained in the master file along with the current revision. Security of software and other problems experienced by those present were discussed.

Selden MCKnight (Hughes) was introduced and a discussion of improving communication (within the NCSL) ensued. The basic elements of communication theory were described and patterns of miscommunication were identified. 1) Newsletters, 2) Conferences, 3) Board of Director offices, 4) Regional/Sectional meetings, and 5) Committee participation. Selden reviewed the NCSL organization chart and described the mission of 12 of the 24 NCSL functional committees. He noted that attempts to solicit comments from the general membership have not always been fruitful.

The floor. was opened for discussion and Richard Hanley (Micro-ReI) suggested that NCSL sponsor an open electronic bulletin board which would provide an opportunity for the exchange of new information or perhaps clarify information

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Reports from the Regions

corrections fot the effects of time and temperature drift in the meters circuits thereby enhancing its long term performance.

After lunch, an excellent slide presentation and tour with comments by Richard Dease of Fermi Lab, was given on the operation of the National Accelerator Laboratory. With the aid of modern technology, accelerators duplicate conditions one ten-billionth of one trillionth of a second after the universe was created. The accelerator enables one to look at particles that are one ten-millionth of one billionth of a centimeter in size.

Fermilab's accelerator creates large quantities of quarks and leptons for many experiments that are carried on twenty-four hours a day, five and a half days a week. The main accelerator is 6,562 feet in diameter and about four miles in circumference. ']'he main accelerator tunnel has two rings of magnets. The upper ring contains 1,000 conventional copper water-cooled magnets and the lower ring has 1.000 superconducting helium cooled magnets. There are some 2,200 full-time employees and approximately 3,000 scientists have done research at Fermilab since it was opened in 1974.

I would like to thank Richard Dease of Fermilab for hosting this outstanding meeting.

AlTENDEES

Chuck Andrle Fermi National Lab Ralph Bertermann G.D. Searle MichaelBi:r:d Abbott Laboratories Lauren V. Bodenstab Honeywell-T.I.D. Stan Chytla The Nutrasweet Co. Glenn Crawford Commodore-I, Inc.

Ronald Dettling Rockwell/Wescom Gary Drasch John Fluke Mfg. Co., Inc. Larry D. Erickson Barber-Colman Co. Roger B. Gable Woodward Governor Co. Edward Harbeck Simpson Electric TedM. Held Abbott Laboratories Jack Herrmann J.H. Metrology Gary L. Hoffman John Fluke Mfg. Co., Inc. Harvey Joseph Simpson Electric William Keinz G.T.E. Communications System Jack E. Leedom Simpson Electric Company Frank Luckenbach Nutra Sweet R&D Joseph N. McIntryre lIT Research Institute Jerry McKenzie Sundstrand Aviation Dean Marxer Precision Measurements Assoc. John Masters I&C Sales Ed Nemeroff Datron Instruments, Inc. Art Neubauer Fermi National Acceleration Lab Davfid Pacchini Du Pont Critical Care Joseph Petersen Abbott Laboratories Marvin E. Piper J.H. Metrology Co., Inc. Ron Rola WavetekjDatron

- 70­

Merrill Rudes D.R. RueWmann

Dan Schreiber Doug Smith Duane Smith George Sollinger Stan Vale Art Vogt David Waltrich Stuart Wells James F. Williams

Commadore-I Inc. Commonwealth Edison lIT Research Institute Abbott Laboratories John Fluke Mfg. Co., Inc. G.T.E. Communication Systems G.D. Searle lIT Research Institute Nutra Sweet R&D Woodward Governor Co. Woodward Governor Co.

principle eas for consideration; Increased Competition for

Busin- Seclor Useful Life of M&TE, and More Stringent

cost controls. He then continues on to develop models of (;'I.~ rol f1 r the Metrology Lab, for Asset Management, and for e Equipment Management Center.

\ e concluded the Forum with another "repeat by popular cJc1and" panel discussion on "Equipment Management

Charge Back Systems", moderated by Arnie Doll of Boeing

Aerospace Company. Panel members were from Motorola,

Roc1.-well, Tektronix and TRW. Each organization represented employs some form of an equipment charge back system. Also represented by the panel was a variety of

"ownership" schemes covering almost any possible

combination of capitalized and expensed equipment, new and fully depreciated, certified traceable, maintenance only, rented, leased, wholly owned, and all of the above.

One might draw from such a potpourri that the subject abounds with abject confusion. But in spite of the myriad of

variables, each had may positive attributes. The bottom line

being: there are many ways to address the issue of cost and inventory control, and NBS traceability. Any of which can place an Equipment Management program wherever you want it: from a burden center, to a zero base budget center, to a profit center.

Audience questions brought out many other aspects of user

charge back including, incentives to share and thereby reduce

EMF meeting draws a sizeable group from industry.

Equipment Forum

inventory, redeploy existing assets, true cost focus, improved

physical control, and more.

Charlie Sides wrapped up the forum with a critique of the past two days and announcement that Randy Seefeldt of Navy Primary Labs had offered to host the next EMF in San Diego, California on April 7 and 8, 1988. (The Steering Committee will meet on April 6, the day prior to the Forum.)

After a quick lunch, attendees were hosted to a tour of McDonnell Aircraft Company's F15 and F18 fmal assembly plant.

The EMF will attempt to fill all requests for copies of papers

presented at any of the Forums.

CONTACT: Ray Barrett M/S 45/000, c/o Tektronix, Inc., P.O. Box 500, Beaverton, OR 97077

Our thanks to our host, Ben Brown, his most efficient staff,

and McDonnell Aircraft Company for a great Forum.

Ray Barrett, EMF Newsletter Chairman

(Ed Note: we're out of space in this issue. I will run about 3­4 pages of Problems/Solutions in the April issue.)

Steering Committee members are: (front row L-R) Ray Barrett, Tektronix; Arnie Doll, Boeing; Ken Pierce, Motorola; Ben Brown, McDonnell Douglas; Charlie Sides, Boeing. (Back row L-R) Jim Bergstrand, Northrop; Bill Martin, Lockheed; Ron Groom, AT&T; Tom McGovney, TRW

- 73­

C L BOARD F DIRECTOR 1988

4.0 PRESlDENT* 8.0 TREASURER*

Gary Davidson TRW Space & Defense One Space Park, S-2767 Redondo Beach, CA 90278 (213) 535-1684

5.0 EXECUTIVE VICE PRESIDENT*

Delbert H. Caldwell (Code 312) NWS Seal Beach Det. Corona Annex Corona, CA 91720-5000 (714) 736-4247

20.0 - 60.0 VICE PRESIDENTS

20.0 Bob Weber Lockheed Missiles & Space Co. Dept. 0/48-70, Bldg. 195 A P.O. Box 3504, Sunnyvale, CA 94088-3504

.~_ (408) 756-0270

30.0 Bill Simmons Sverdrup Technology, Inc. Bldg. 1105, Rm B208 NSTL, MS 39529

_ ..."'--"-..... (601) 688-3191

40.0 Bob Smith Ford Aerospace & Communications Ford Rd., MS EV-26 P.O. BoxA Newport Beach, CA 92663 (714) 720-4820

50.0 James Ingram, Jr. Inwil Metrology 34037 Mello Wy. Fremont, CA 94555 (408) 756-0276

60.0 John Martin Westinghouse NTSD, Forest Hills P.O. Box 855 Pittsburgh, PA 15230 (412) 829-3703

6.0 PASTPRESIDENT*

Ed Nemeroff EN Instruments P.O. Box 1469 Stuart, FL 34995

.......~.-.. (305) 287-3547

7.0 SECRETARY*

Selwyn (Smitty) Smith GE Solid State Route 202 Somerville, NJ 08876

LYf~2..J (201) 685-6952

*Executive Committee Members - 74­

Roland Vavken Rockwell International, D120 031-HC02 3370 Miraloma Ave. Anaheim, CA 92803 (714) 762-3560

9.0 NBS REPRESENTATIVE TO THE BOARD

50.0 Joe D. Simmons National Bureau of Standards B 160 Physics Bldg.

).w"~ Gaithersburg, MD 20899 (301) 975-4201

10.0 NSCL BUSINESS MANAGER

r::z==:a_ L. Kenneth Armstrong NCSL Secretariat

.'_~.""'::.I/l

1800 30th St., Suite 305B Boulder, CO 80301 (303) 440-3339

71.0 - 79.0 DIRECTORS

71.0 Ralph Bertermann (Regions 1 & 11) G. D. Searle & Co. 4901 Searle Pkwy. Skokie, IL 60077

_~_ (312) 982-7611

72.0 L.D. (Dave) Duff (Regions 2 & 5) Eli Lilly & Co., MC263, 32/W 303 McCarty Street Indianapolis, IN 46285

_,~_.._ (317) 276-2973

73.0 Anthony Anderson (Regions 3 & 4) Guildline Instruments, Inc. 4403 Vineland Rd., Suite B-10

.:IP.:,~£' .. Orlando, FL 32811-7335 (305) 423-8215

74.0 Chester J. Crane (Regions 6 & 8) Teledyne Microelectronics 12964 Panama St., MS-15 Los Angeles, CA 90066 (213) 822-8229, Ext. 2449

75.0 Val Gersbach (Regions 7 & 9) John Fluke Mfg. Co., Inc. P.O. Box C9090 Everett, WA 98206 (206) 356-5473

79.0 INTERNATIONAL DIRECTOR

J. Graham Cameron Dept. of National Defence Quality Engineering Test. Estab., QETE 7 Ottawa, Ontario, CANADA KIA OK2

,---.__~ (819) 997-3411

CO I M'ITTE CHAIR, 1988

11.Q Go ernment Affairs

John Lee Telog'y, Inc. 150 Shoreline Dr. Redwood City, CA 94065

, (415) 594-1700

20.0 VP Operatio s - Robert Weber 21.0 BUSINESS SYSTEMS

G. Tom McGovney TRW Space & Defense S/2767 One Space Park Redondo Beach, CA 90278 (213) 535-1684

22.0 MEETINGS AND PROGRAMS

....~r.. M. J. (Moe) Corrig'an, Jr. Lockheed Electronics Co., Inc. 1501 U.S. Highway 22, MS-724 Plainfield, NJ 07061 (201) 757-1600, Ext. 3023

23.0 PUBLICATIONS

Thomas D. Knowles ITT Avionics Div. 100 KingBland Rd. Clifton, NJ 07014 (201) 284-3230

24.0 ADMINISTRATIVE GUIDELINES & BY-LAWS

Dean A. Brungart Teledyne Systems Company 19601 Nordhoff Street Northridge, CA 91324 (818) 717-6872

30.0 VP Marketing - Bill Simmons 31.0 NEWSLETTER

John Minck Hewlett-Packard Co. SPD 5U, Box 10151 Palo Alto, CA 94303-0889 (415) 857-2060

32.0 MEMBERSHIP

(TBA)

33.0 PUBLICITY

Allan Herman Cooper-Cameron Inc. 9 Village Square East Clifton, NJ 07011 (201) 546-2262

34.0 HONORS AND AWARDS

Jeff Taylor Lockheed Georgia Co., Dept. 59-13, Z-262 86 S. Cobb Dr. Marietta, GA 30063

_"--'- (404) 424-2900

40.0 VP ab Mg t. Bob mith 41.0 CALIBRATION SYSTEM MANAGEMENT

Selden McKnight Hughes Aircraft Co., MS 801, H-18

1 P.O. Box 11337 Tucson, AZ 85734-3733 (602) 295-4800

42.0 MEASUREMENT ASSURANCE PROGRAMS

Arno Ehman, MIS H-02-C Beckman Instruments Inc. 2500 Harbor Blvd. Fullerton, CA 92634 (714) 773-8475

43.0 NATIONAL MEAS. REQUIREMENTS

Laurie H. Baker Rockwell International AES Metrology HC02 3370 Miraloma Avenue Anaheim, CA 92803 (714) 762-7864

44.0 LABORATORY EVALUATION

. Carl Quinn Simco Electronics 382 Martin Ave. Santa Clara, CA 95050 (408) 727-3788

45.0 CALIBRATION INTERVALS

Howard T. Castrup Science Applications Int'!. 1307 W. 6th Corona, CA 91720 (714) 272-2503

46.0 EQUIPMENT MANAGEMENT FORUM

C. A. (Charlie) Sides Boeing Aerospace Co. P.O. Box 3999, MIS 86-03 Seattle, WA 98124 (206) 773-9944

50. VP Indust.rlal 'F chnolo y Jim Ingram

51.0 BIOMEDICAL & PHARMACEUTICAL METROLOGY

Douglas Smith, Dept. 736-M4 Abbott Laboratories

:.t......d- 1400 Sheridan Rd. N. Chicago, IL 60064 (312) 937-4929

- 75­

COMM1TTEE CHAIRMEN (cont'd)

52.0 AUTOMATIC TEST & CALIBRATION SYSTEM 62.0 TRAINING INFORMATION & DIRECTORY COMMITTEE Dave Lorenzen

McDonnell-Douglas Corp. TBA) 5301 Bolsa Ave.

Huntington Beach, CA 92647 (714) 896-4574

63.0 ADJUNCT TRAINING

53.0 PRODUCT DESIGN & SPECIFICATION Bill Doyle U.S. Instrument Rentals

....;..." James Hartley Tennessee Valley Authority 1101 Market St., LA PSC1 Chattanoog'a, TN 37401

2701 S. Shiloh Rd. Garland, TX 75041 (214) 278-6147

(615) 697-4341 64.0 EDUCATION LIAISON

54.0 UTILITIES Kate Webster

Raymond D. DiSandro Philadelphia Electric Co. 2301 Market St., N4-1 Philadelphia, PA 19101

Cortez III 5111 W. 164th St. Brookpark, OH 44142 (216) 362-0040

(215) 841-4900 65.0 METROLOGY COMPENDIUM

60.0 VP Education & Training ­John Martin

Clifford Koop Rockwell-Collins P.O. Box 728, M/S 137-152

61.0 TRAINING AIDS Cedar Rapids, IA 52498 Joan Wingo (319) 395-5554 Barrios Technology Inc. 1331 Gemini Houston, TX 77058 (713) 483-3578

-..----~-

REGIO A COORDINATORS 71.1 REGION 1 72.1 REGION 2

Harry Haymes William Brenant Sanders Associates Loral Electronics Corp. 95 Canal St., NCA1·0137 1440 Story Ave. Nashua, NH 03061·2004 Bronx, NY 10473

__~....I. (603) 885-4913 (212) 378-2300 Ext. 376

71.2 REGION 11 72.2 REGION 5 John Buck Amos (Max) Green Unisys Corp. Technology Applications, Inc. P.O. Box 64525, MS/S1M16 5100 Springfield Pike, Suite 500 St. Paul, MN 55164-0525 Dayton, OH 45431 (612) 696-4419 (513) 256-6633

71.2.1 TWIN CITIES SECTION, Region 11 72.2.1 SO. OHIO/KENTUCKY SECTION, Region 5

John Buck Amos (Max) Green (Acting) Unisys Corp. Technology Applications, Inc. P.O. Box 64525, MS/S1M16 5100 Springfield Pike, Suite 500 St. Paul, MN 55164-0525 Dayton, OH 45431 (612) 696-4419 (513) 256-6633

71.2.2 CHICAGO SECTION, Region 11 72.2.2 INDIANA SECTION, Region 5 Arthur Vogt C.B. (Bert) Butts IIT Research Institute Allison Gas Turbine

., 10 West 35th Street General Motors Chicago, IL 60616 P.O. Box 420 (312) 567-4499 Indianapolis, IN 46206

71.2.3 ST. LOUIS SECTION, Region 11 (317) 242-4552

Jim Perkins 72.2.3 NORTHERN OHIO, Region 5 Precision Calibration Laboratory Anne Zucker 11789 Lackland Rd. The Standard Oil Co. St. Louis, MO 63146 Research Cetner, E320C (314) 997-1981 4440 Warrensville Center Rd.

Cleveland, OH 44128-2837 (216) 581-5959

- 76­

REGIONAL COORDINATORS (cont'd) 1988

72.2.4 MICHIGAN SECTION, Region 5 74.2 REGION 8

Gloria A. Madrazo Volkswagen America 7111 E. 11 Mile Rd. Warren, MI 48092 (313) 574·4184

73.1 REGION 3

Marlin Johnson Johns Hopkins Applied Physics Lab. Johns Hopkins Rd. Laurel, MD 20702 (301) 953-5000 Ext. 8021

73.2 REGION 4 P.W. (Woody) Tramel EG&G Florida, Inc. EG&G 305, CIF Bldg. Kennedy Space Center, FL 32899 (305) 867-2419

73.2.1 ATLANTA SECTION - Reg'ion 4

J. Samuel Tolbert Scientific Atlanta, rnc. Calibration & Repair, MS/ATL. 33C 4357 Park Dr., Suite E Norcross, GA 30093

73.2.2 CENTRAL FLORIDA SECTION - Region 4

John Riley NASA SI-PEI-1B

I Kennedy Space Center, FL 32899 (305) 867-4737

74.1 REGION 6

(TBA)

74.1.1 DALLAS/FT. WORTH SECTION, Region 6

(TBA)

74.1.2 DENVER SECTION, Region 6

(TBA)

74.1.3 HOUSTON SECTION, Region 6

Randy Wear John Fluke Mfg. Co. 2602 Lively Ln. Sugarland, TX 77479 (713) 240-5995

RolfB. F. Schumacher Rockwell Int'l/Autonetics Dept. 120 031-HC02 3370 Miraloma Ave. Anaheim, CA 92803 (714) 762-0265

74.2.1 LOS ANGELES SECTION, Region 8

Rolf B. F. Schumacher (Acting) Rockwell Int'llAutonetics Dept. 120 031-HC02 3370 Miraloma Ave. Anaheim, CA 92803 (714) 762-0265

74.2.2 SAN DIEGO SECTION, Reg'ion 8

Rolf B. F. Schumacher (Acting) Rockwell Int'llAutonetics Dept. 120 031-HC02 3370 Miraloma Ave. Anaheim, CA 92803 (714) 762-0265

74.2.3 PHOENIX-TUCSON SECTION, Region 8

Lee J. Walters Motorola G.E.G. MS. H1179 8201 E. McDowell Rd. Scottsdale, AZ 85257 (602) 949-3613

74.2.4 SALT LAKE SECTION, Region 8 (TBA)

75.1 REGION 7

Paul P. Chong ESL Inc., MS303 495 Java Dr. Sunnyvale, CA 94088-3510 (408) 738-2888 Ext. 5207

75.2 REGION 9

Val Gersbach (Acting) John Fluke Mfg. Co., Inc. P.O. Box C9090 Everett, WA 98206 (206) 356-5473

79.0 INT'L DIRECTOR REGION 10

J. Graham Cameron Dept. of National Defence Quality Engineering Test Estab., QETE 7 Ottawa, Ontario, KIA OK2 Canada (819) 997-3411

79.1 CANADA REGION

Duane Brown Measurements Int'l Ltd. P.O. Box 2359 Prescott, Ontario, K1E ITO Canada (613) 925-5934

-77 ­

IAIS iN DEILEGA ES 1988

80.1 PREC]SION MEASUREMENTS ASSOCIATION

Glenn Rasmussen Northrop Corp. Ventura Div. 1515 Rancho Conejo Blvd. Newbury Park, CA 91320 (805) 373-2517

80.2 GIDEP METROLOGY COMMI'I"TEE

Don Cox GIDEP Operations Fleet Analysis Ctr Corona, CA 91720-5000 (714) 736-4677

80.3 MEASUREMENT SCIENCE CONFERENCE

Chester J. Crane Teledyne Microelectronics 12964 Panama St., MS-15 Los Angeles, CA 90066 (213) 822-8229, Ext. 2449

80.4 OIML

(TBA)

80.5 AALA

Peter S. Unger American Assoc. for Lab Accreditation 656 Quince Orchard Rd., #704 Gaithersburg, MD 20878 (301) 670-1377

80.6 ANSI

Rolf B. F. Schumacher Rockwell Int'I!Autonetics Dept. 120 031-HC02 3370 Miraloma Ave. Anaheim, CA 92803 (714) 762-0265

80.7 CPEM/CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENT

Dr. Arthur McCoubrey NBS Gaithersburg, MD 20899 (301) 921-3301

80.8 AMERICAN SOCIETY FOR QUALITY CONTROL

Karl F. Speitel Eastman Kodak Co. Kodak Park, QSS, MC #58, B-6

......i,'"--;rl;.,1 Rochester, NY 14650 716) 722-2318

- 78­

80.9 INSTRUMENT SOCIETY OF AMERICA 80.15IMEKO

J. Michael Suraci Lockheed Missiles & Space Co. P.O. Box 6429 NSB Bangor Bremerton, WA 98315 (206) 396-4362

80.10 W.E.C.C.

J. Graham Cameron Dept. of National Defence Quality Engineering Test. Estab., QETE 7 Ottawa, Ontario, KIA, OK2 Canada

_ ......._. (819) 997-3411

80.11 IEEE I&M

Jerry Hayes Science Applications Inc. 1241 Moro Circle Placentia, CA 92670 (714) 993-6120

80.12 ASTM

(TBA)

80.13 CORM

Bill Simmons Sverdup Technology, Inc. Bldg. 1105, Rm B208 NSTL, MS 39529

.\lliJilio...-J (601) 688-3191

80.14 JLC/CCG CALIBRATION COORDINATION GROUP

Fred Seeley U.s. Army TMDE Support Group Attn: AMXTM-S Redstone Arsenal, AL 35898 (205) 876-2666

80.16 AIA

Robert Willett Rockwell Int'l Telecommunications Div., MS 405-110 1200 N. Alma Rd.

-.,. .-- Richardson, TX 75081 (214) 996-7070