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Use of Patent Information (Including J-PlatPat) Japan Patent Office Asia - Pacific Industrial Property Center, Japan Institute for Promoting Invention and Innovation ©2016 Collaborator: Mr. Atsushi NOZAKI Senior Director Landon IP GK

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Page 1: Use of Patent Information (Including J-PlatPat) · Patent Classification (IPC, FI, F-term, CPC, USPC) ... Clearance Search/Freedom to Operate Search .....20 iv. Technology Trends

Use of Patent Information

(Including J-PlatPat)

Japan Patent Office

Asia - Pacific Industrial Property Center, Japan Institute for

Promoting Invention and Innovation

©2016

Collaborator: Mr. Atsushi NOZAKI

Senior Director

Landon IP GK

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Contents

1. Introduction ................................................................................................................................. 1

2. Basics of Patent Information ...................................................................................................... 4

i. Definition of Patent Information ............................................................................................. 4

ii. Characteristics of Patent Information ...................................................................................... 6

iii. Structure and Types of Official Patent Gazettes ...................................................................... 7

iv. Patent Classification (IPC, FI, F-term, CPC, USPC) ............................................................ 11

v. Patent Family ......................................................................................................................... 17

3. Types of Patent Research.......................................................................................................... 19

i. Prior Art Search (before filing an application) ...................................................................... 19

ii. Invalidity Search/Known Art Search ..................................................................................... 20

iii. Clearance Search/Freedom to Operate Search ...................................................................... 20

iv. Technology Trends Research/Technological Information Gathering Research ..................... 20

v. Other Research ...................................................................................................................... 21

4. Steps of Patent Searches ........................................................................................................... 22

i. Step 1: Clarifying the target technologies to be searched ...................................................... 23

ii. Step 2: Determining the search approaches (country, period, database, etc.) ........................ 23

iii. Step 3: Selecting keywords and patent classes ...................................................................... 23

iv. Step 4: Creating a search formula.......................................................................................... 24

v. Step 5: Conducting database search and publication read-in ................................................ 26

vi. Step 6: Organizing and storing search results ........................................................................ 26

5. Example of Patent Search Using Patent Search Matrix ........................................................ 26

i. Using the Patent Search Matrix ............................................................................................. 27

ii. Clarifying the Search Target .................................................................................................. 27

iii. Selecting Search Keys ........................................................................................................... 28

iv. Three Basic Search Formula Patterns .................................................................................... 32

v. Creating a Search Formula .................................................................................................... 33

6. Patent Information Databases in Different Countries ........................................................... 38

i. J-PlatPat Patent Information Platform ................................................................................... 38

ii. European Patent Office (EPO) Espacenet ............................................................................. 55

iii. PatFT/AppFT of U.S. Patent and Trademark Office (USPTO) ............................................. 62

iv. Patentscope of the World Intellectual Property Organization (WIPO) .................................. 67

v. Google Patents ....................................................................................................................... 75

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1

1. Introduction

According to statistics1 of the World Intellectual Property Organization, the number

of patent applications filed around the world has been increasing every year, totaling

2.57 million worldwide in 2013. Out of these applications, 1.7 million were filed in

applicants’ home countries, and 870,000 were filed in foreign countries. In 2001, the

total number of applications around the world was 1.5 million; and this number has

increased by around 40% in just 10 years. This growth was largely due to increased

applications in China, the U.S. and South Korea. The growth has been particularly

high in China, with the number of applications increasing about tenfold in the last 10

years.

A patent is one of the fruits of research and development conducted by a company or

research institute. The purpose of the patent system is to protect the products and

services of companies or organizations through patent rights and patent portfolios.

Another purpose is to enable companies and organizations to examine patent

applications already filed by competitors and others to obtain useful information for

their own R&D. In the latter case, examining patent information allows companies to

obtain the following insights:

Trends in technological fields of interest Technological fields that are attracting the attention of their industry

Problems concerning the technologies they are focusing on

Solutions to the problems they are facing

For example, assume that a company is conducting research and development on the

opening and closing mechanism of doors. By searching and analyzing patent

applications on this topic that have been laid open to the public, the company can

learn about the problems found in such mechanisms, as well as what other companies

have done to solve such problems. By researching patents in advance, a company may

find a problem that others have not considered, or find a new way to solve a problem

that others have not used. By looking at applicants, right holders or inventors,

moreover, the following insights can be gained:

Which is the leading company in the technological field of interest?

Which companies or organizations are conducting joint research?

Who are the key persons in the target technological field?

How large are the development projects (scale of human resources) of

competitors in the target technological field?

1 WIPO IP statistics data center http://www.wipo.int/ipstats/en/

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2

Such data constitutes market information within a given technological field, rather

than technical information. By studying patent information, a company may also be

able to find a prospective licensee for a technology that it has developed; or find a

prospective partner for a business alliance.

As discussed above, examining published patent information is useful when a

company is seeking to develop a business strategy, or new product or service. Now,

let's look at the data in the Japan Patent Office Annual Report to see how effectively

companies used published patent information when they filed patent applications and

sought patent rights to protect their products or services. As shown in Fig. 1 below,

when the JPO examined and refused patent applications in 2009, the newest patent

gazettes (published inventions) cited in the reason for refusal had been published an

average of 3.3 years before the refused applications were filed. This graph also shows

the surprising fact that all cited documents included in the reason for refusal had been

published an average of 6.1 years before the filing of the refused applications.

Fig. 1 Distribution of Published Patent Applications Cited in the Reason for Refusal

in 20092

2 Japan Patent Office Annual Report FY2011

https://www.jpo.go.jp/shiryou/toushin/nenji/nenpou2011/honpen/1-2.pdf (* Link to a Japanese page)

Distribution of Published Patent Applications Cited in the Reason for Refusal in 2009

All cited documents (6.1 years on average)

Latest cited documents (3.3 years on average)

Filing date

More than 10 years ago

Within 1 year before the filing date

Published after the filing date

(Note) • Analyzed publications of Japanese patent applications that were cited in the reason for refusal for applications refused in 2009.

• “Published after the filing date” means that publications were cited in the reason for refusal in accordance with Article 29-2 or Article 39 of the Patent Act.

(Source) Japan Patent Office

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There is also other interesting data within old statistics from 2005, including the fact

that about 370,000 patent applications were filed, among which requests for

examinations were made for about 200,000. Patent rights were granted to only about

100,000 of these applications, however, while the remaining 100,000 were refused

following the examination. Moreover, the decision of refusal was finalized for about

half of these 100,000 applications (50,000) without appeals being filed by the

applicants. These applicants shouldered IP-related expenses for the refused

applications (such as the costs of filing the application and requesting an examination),

as well as R&D expenses for the inventions. Although not all of the costs were wasted,

these applicants might have been able to reduce wasted expenses and use these R&D

and IP-related expenses more effectively if they had conducted prior art searches

before choosing their R&D subjects and filing applications.

Fig. 2 Processes for Japanese Patent Applicants Through the Final Decision by JPO

(FY2005)3

The chart above also indicates important points regarding filing patent applications

and acquiring patent rights in other countries. For example, if a company wants to

acquire patent rights for its invention in the U.S. or China, it must file a patent

application with the patent office in that country and go through the examination of

the local patent office. When conducting the prior art search, examiners in foreign

patent offices tend to focus on patent documents prepared in their own language and

in English rather than those prepared in Japanese. Accordingly, applicants must also

carefully examine patent documents in other countries, not only in Japan.

3 Japan Patent Office Annual Report FY2007

http://www.jpo.go.jp/shiryou/toushin/nenji/nenpou2007/honpen/2-1.pdf (* Link to a Japanese page)

Patent grant decision Approx. 100,000/year

Refusal decision Approx. 100,000/year

Filing a patent

application for an invention

Patent applications by Japanese applicants

Approx. 370,000/year

Request for examination

Out of these refused applications, about 50,000 raised no objection

or appeal.

Despite the huge number of applications filed with the Japan Patent Office, only about one-quarter were granted Japanese patents.

About a half of refused applications did not respond to the notice of reason for refusal.

Research and development

R&D expenses Total

1.8 trillion yen

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2. Basics of Patent Information

i. Definition of Patent Information Range of patent information Patent Information = Publications of patent applications + Information on the

progress of the patent examination + patent families Patent information is described below in accordance with the Japanese Patent Act.

Fig. 3 Processes from Application to Acquisition of Patent Rights and Publications4

4 Procedures for Obtaining a Patent Right:

https://www.jpo.go.jp/tetuzuki_e/t_gaiyo_e/pa_right.htm

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As shown in Fig. 3, patent information includes publications of unexamined

patent applications (including published Japanese translations of PCT

international publications for patent applications and re-publication of PCT

international publications for patent applications, in addition to publications of

Japanese patent applications) which are published 18 months after filing of

applications and publications of granted patents. Other types of patent

information include that regarding the progress of the patent examination (file

wrappers and the status of the patent applications), and regarding patent families.

File wrappers are a package of documents related to a patent application,

including the patent application and a request for examination submitted by the

applicant to the patent office, a notice of reason for refusal issued by the

Commissioner of the Patent Office or patent examiner, a written argument and/or

correction in response to the notice of reason for refusal, and the decision to grant

a patent.

The status of the patent applications indicates the current phase of the application

for the right. By verifying the status of an application, it is possible to learn, for

example, that the publication of an unexamined patent application was issued,

but a request for examination has not yet been made (of course, you cannot

access the information before the publication of unexamined patent application);

that the request for examination was made, and the application is being

examined; that a publication of a granted patent was issued, but the patent right

has expired and has not been renewed because the annual maintenance fee was

not paid; etc.

As explained above, the patent information also includes information on the

progress of the patent examination and patent family (not only the information

included in the publications of unexamined patent applications and publications

of granted patents).

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ii. Characteristics of Patent Information

In addition to patent information, you can obtain technological information from

academic literature, academic convention minutes, technological magazines,

catalogs, product manuals and the like.

Fig. 4 Technological Information Sources for Companies and Organizations

Among many technological information sources, patent information has the

following characteristics:

(1) It is relatively easy to obtain patent information from free or paid databases.

(2) All patents issued around the world are classified in accordance with the

International Patent Classification (IPC), the international standard for

classifying technology.

(3) Bibliographic data that must be included in official patent gazettes anywhere

around the world are specified by INID Codes5 of the WIPO.

(4) All technological fields are comprehensively covered, without bias to

specific areas.

(5) Official patent gazettes describe disclosed inventions in detail.

As explained above, patent information has excellent characteristics as data to

be examined and analyzed. One of the greatest benefits is that the data are

categorized by the global standard classification.

5 http://www.wipo.int/export/sites/www/standards/en/pdf/03-09-01.pdf

Organization

Customers

Users

Within the

organization (Superiors, colleagues, etc.)

Conferences

Trade shows

Products/services

Competitors

Patent/IP

documents, newspapers,

magazines

Government

Public organizations

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iii. Structure and Types of Official Patent Gazettes

Figure 5 is an example of a patent application publication.

Fig. 5 Example of Publication of Patent Application (EP2418114A1)

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Typically, the first (front) page of an official patent gazette includes various

information items called “bibliographic data.” The front page contains important

useful information for searching and examining patent applications and granted

patents. Titles of inventions, abstracts and other keywords are necessary for

searching patent information on the basis of technological aspects. The

International Patent Classification (IPC) and other patent classification

information are important for gathering comprehensive patent information from

aspects other than keywords. By looking at the applicant and the right holder

information, moreover, you can identify which companies or research institutes

filed those applications. From the inventor information, you can identify key

persons and changes in the R&D activities of the inventors over time.

As shown in the example above, information items in a patent gazette are

prefixed with numbers in parentheses such as (43). This (43) is a universal code

indicating the issuance date of the patent gazette, i.e., the date the invention was

published. This is called an INID code. The following are other major INID

codes:

(21) Application number

(22) Application date

(43) The date when an unexamined patent document was made available to the

public in the form of a printed material or other similar means (date of

publication)

(51) International patent classification

(71) Name of the applicant

(72) Name of the inventor

(73) Name of the right holder

The second and subsequent pages contain the scope of patent claim, detailed

description of the invention, drawings and other information, although specifics

may vary depending on the country. Such data is also important information for

patent searches and research. The progress of the patent examination and the

patent family information are not contained in patent gazettes; they must be

obtained from the databases which will be discussed later in this textbook.

Patent gazettes can be divided into two main types: publications of patent

applications and publications of granted patents. Each patent gazette is assigned

a type code. By looking at the type code, you can see which type of patent gazette

it is. The WIPO Standard ST. 16 (standard codes for identifying patent

documents)6 defines type codes as follows:

6 http://www.wipo.int/export/sites/www/standards/en/pdf/03-16-01.pdf

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Table 1 Major Type Codes of Patent Gazettes

Group Document Type Code/Publication Level

Group 1 Patent documents A: First publication level

B: Second publication level

C: Third publication level

Group 2 Utility model right

documents

U: First publication level

Y: Second publication level

Z: Third publication level

Group 3 Patent documents in

special classifications

M: Drug patent documents

(e.g. in France)

P: Plant patent documents (e.g. in U.S.)

S: Design patent documents (e.g. in U.S.)

The first publication level of patent documents is publication of patent

applications in most countries where the patent publication system is used.

Therefore, if the type code “A” is attached, the document is a publication of a

patent application. If the type code is B or C, the document is a publication of a

granted patent. The following are type codes used in the patent systems in Japan,

the U.S. and Europe.

Table 2 Current Major Type Codes of Patent Gazettes in Japan, U.S., and Europe

Group Type Code Description

Japan A

A1

B1

B2

U

U1

Y

Publication of unexamined patent application, or

published Japanese translation of PCT

international publication for patent application

Domestic re-publication of PCT international

publication for patent application

Publication of examined patent application or

granted patent (without publication of patent

application)

Publication of examined patent application or

granted patent

Publication of unexamined utility model

application or registered utility model

Publication of full text of unexamined utility

model application

Publication of examined utility model application

or utility model registration

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U.S. A A1 B1 B2 E S

Issued patent (before the adoption of the publication of patent application system) Published applications Issued patent (after the adoption of the publication of patent application system, without publication of the application) Issued patent (after the adoption of the publication of patent application system) Reissue patent Design patent

Europe (EP)

A1 A2 A3 B1 B2

Publication of patent application (with search report) Publication of patent application (without search report) Search report only Granted patent Granted patent (amended due to opposition)

International application (WO)

A1 A2 A3

Publication of patent application (with search report) Publication of patent application (without search report) Search report only

The following are important points to note when examining patent gazettes of

these countries. In Japan, Code A is attached to the publication of an unexamined

patent application, and Code B2 is attached to the publication of a granted patent.

Sometimes, publication of a granted patent may be issued in less than 18 months,

which is the normal time frame from the patent application to publication of the

unexamined application, as a result of an accelerated examination or other reason.

In such a case, Code B1 is attached to the publication of that granted patent. As

for utility models, the system has become more complicated since it was revised.

“Registered utility models” are utility models for which applications were filed

in and after 1994 and registered without examination, for which publications

were issued after 6 months from the time of application (Numbers: 3000001

- ). On the other hand, “utility model registrations” are utility models

registered after examination, after the system of publication of applications was

abolished in 1996. (Numbers: 2500001 -)

There was initially no system of publishing patent application in the U.S.

Therefore, the first publication level was that of granted patents. Accordingly,

Code A indicated a granted patent. Subsequently, following revision of the

patent law in 1999, patent applications filed on and after November 29, 2000 in

the U.S. have been published 18 months from their application dates (earliest

priority dates) and these publications were assigned Code A1. However, an

application may be kept secret if certain requirements are satisfied.

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EP and WO use similar code structures for publications of patent applications, i.e.

A1 = A2 + A3

Search reports will be discussed later. Code A1 is publication of a patent

application with a search report, and Code A2 is publication of a patent

application without a search report. Therefore, the A3 publication is generally

published after the A2 publication has been issued.

iv. Patent Classification (IPC, FI, F-term, CPC, USPC)

Each patent gazette is assigned a patent classification according to the

technological contents of that publication. If you search patent documents only

by keywords, the desired results may be missed. To minimize this risk of

omission, it is recommended to perform the search by using patent classifications

in combination with keywords. There are three major patent classifications:

1. Patent classification used internationally;

2. Patent classifications used locally in individual countries; and

3. Patent classifications used in specific databases.

The first one, the internationally used patent classification, is that of the

International Patent Classification, or IPC. The second ones, those used in

individual countries, include FI (File Index) and F-term used only in Japan, and

CPC used in the U.S. and Europe. The last ones, those used in specific databases,

are Derwent Class Codes and Manual Codes that can be used in DWPI and

Thomson Innovation. Patent classifications referred to in 1. and 2. above are

explained below.

The International Patent Classification has the format shown below, consisting

of Section A to Section H encompassing all technological fields, including daily

goods, information and communications, information technology and other

advanced technologies.

(Section)

A Human necessities

B Performing operations; Transporting

C Chemistry; Metallurgy

D Textiles; Paper

E Fixed Constructions

F Mechanical Engineering; Lighting; Heating; Weapons; Blasting

G Physics

H Electricity

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The International Patent Classification has a hierarchical structure consisting of

sections on the top, followed by main classes (or simply referred to as “classes”),

sub-classes, main groups and sub-groups at the bottom. The lower the hierarchy

becomes, the more specifically a technology is classified. FI and CPC, which

will be explained later, also have almost identical formats.

(Example 1 of IPC)

B Performing operations; Transporting

B60 Vehicles in general

B60W Conjoint control of vehicle sub-units of different type or

different function; Control systems specially adapted for

hybrid vehicles; Road vehicle drive control systems for

purposes not related to the control of a particular sub-

unit

B60W10/00 Conjoint control of vehicle sub-units of different type or

different function

B60W10/24 including control of energy storage means

B60W10/26 storing electric energy, e.g. batteries, capacitors

(Example 2 of IPC)

C Chemistry, Metallurgy

C01 Inorganic chemistry

C01B Non-metallic elements; and their compounds

C01B31/00 Carbon; Compounds thereof

C01B31/02 Preparation of carbon

C01B31/04 Graphite

B25J 13/02

Sub-Class

Main Group

Sub-GroupMain Class

Hierarchy Item Description

B Section PERFORMING OPERATIONS; TRANSPORTING

B25 Main Class HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS

B25J Sub-Class MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES

B25J13/ Main Group Controls for manipulators

B25J13/02 Sub-Group Hand grip control means

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In addition to IPC, individual countries have established their own classifications.

In Japan, FI (File Index) and F-term are unique patent classifications. Because

the segmentation of IPC is not narrow enough, the Japan Patent Office uses FI

to divide classification groups into smaller groups. As shown below, FI suffixes

a file discriminating code (an alphabetic letter) and extension numbers (three

digits) to an IPC code. The structure of the FI code is similar to that used in the

Cooperative Patent Classification (CPC), a patent classification system jointly

developed by EPO and USPTO. CPC will be discussed later. (Example of FI)

C Chemistry, Metallurgy

C01 Inorganic chemistry

C01B Non-metallic elements; and their compounds

C01B31/00 Carbon; Compounds thereof

C01B31/02: Preparation of carbon

C01B31/04 Graphite

C01B31/04,101 Preparation of graphite

C01B31/04,101@A Compact

C01B31/04,101@B Powder

C01B31/04,101@Z Others

C01B31/04,102 Pyrolytic graphite F-term (File Forming Term) is designed mainly to facilitate prior art searches by

patent examiners in the JPO. Accordingly, unlike IPC and FI that define classes

from the technological viewpoint, F-term adopts more segmented classification

from multiple viewpoints (purpose of the invention, purpose of use, materials,

control, control volume, etc.) as shown in Fig. 6.

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Fig. 6 Relationship of IPC, FI and F-term7

As shown in Fig. 7, IPC and FI do not use classifications such as the purpose of

the invention or the purpose of use, while F-term has additional classifications

such as problem/purpose, and type/mode.

Fig. 7 Example of F-term (5H601)

7 Source: National Center for Industrial Property Information and Training, “Overview

of IPC, FI and F-term and Their Use in Prior Art Searches (2015)”

http://www.inpit.go.jp/jinzai/kensyu/kyozai/outlink00057.html (* Link to a Japanese page)

Theme (subject)

Objective 1 AA01, AA02, ...

Objective 2 BB01, BB02, ...

Objective 3 CC01, CC02, ...

Relationship Between IPC, FI and F-term IPC FI (mainly search by a single objective) F-term (search by multiple

objectives)

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As shown in the table below, F-term consists of a 5-digit theme code, followed

by a 2-digit objective code and a 2-digit number.

Table 3 Examples of F-term

Meaning of a F-term Theme Code Objective Number

5H601AA05

Iron core of a rotating

electrical machine

designed for

downsizing

5H601

Iron core of a

rotating electrical

machine

AA

Purpose/Effect

05

・Downsizing

5B057AA18

Image processing

designed for textile and

apparel

5B057

Image processing

AA

Use

18

・ Textile and

apparel

5K067KK13

Mobile wire

communication system

having a CPU as a

constituent element

5K067

Mobile wire

communication

system

KK

Constituent

element

13

CPU

4G140DB01

A process/device for

hydrogen, water, or

hydride related to

regeneration or

activation of catalyst

4G140

Hydrogen, water,

or hydride

DB

Characteristic

of a

process/device

01

Related to

regeneration or

activation of

catalyst

The U.S. Patent and Trademark Office (USPTO) has used the U.S. Patent

Classification (USPC) and the European Patent Office (EPO) has used the

European Classification (ECLA) and In Computer Only (ICO) codes. From

January 2013, the USPTO and the EPO started to use a common patent

classification (CPC).

(Example 1 of CPC)

C CHEMISTRY; METALLURGY

C01 INORGANIC CHEMISTRY

C01B NON-METALLIC ELEMENTS; COMPOUNDS

THEREOF

C01B31/00 Carbon; Compounds thereof

C01B31/02 Preparation of carbon; Purification; After-

treatment

C01B31/04 Graphite, including modified graphite e.g.

graphitic oxides, intercalated graphite, expanded

graphite or graphene

C01B31/0407 Purification; Recovery or purification of

graphite formed in iron making, e.g. kish graphite

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C01B31/0415 Intercalation

C01B31/0423 Expanded or exfoliated graphite

C01B31/043 Graphitic oxides, graphitic acids or salts thereof

C01B31/0438 Graphene

C01B31/0446 Preparation

C01B31/0453 by CVD

C01B31/0461 by epitaxial growth

C01B31/0469 by exfoliation

C01B31/0476 starting from graphitic oxide

C01B31/0484 After-treatments

C01B31/0492 Purification

An outline of the CPC is available on the official CPC website8. In addition to

the U.S. and Europe, China and Korea also decided to adopt the CPC. We must

pay attention to this movement to ensure effective and efficient global patent

search and patent information research.

The USPC, the original patent classification used in the U.S. having a different

structure from IPC, FI and CPC, was practically abolished as of December 31,

2014, although the design patent and the plant patent continue to be classified by

the USPC.

The USPC coding consists of prefix numbers followed by a slash and numbers.

(Example of USPC)

Class Schedule

Class 701 DATA PROCESSING: VEHICLES, NAVIGATION, AND

RELATIVE LOCATION

1 VEHICLE CONTROL, GUIDANCE, OPERATION, OR

INDICATION

2 . Remote control system

3 . Aeronautical vehicle

4 . . Altitude or attitude control or indication

5 . . . Rate of change (e.g., ascent, descent)

6 . . . . Angle of attack

7 . . . Air speed or velocity measurement

8 . . . Threshold or reference value

9 . . . . Warning signal or alarm

10 . . . Compensation for environmental conditions

8 http://www.cooperativepatentclassification.org/index.html

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v. Patent Family A group of patents for which applications are filed for the same invention in two or more countries (such as the U.S. and Germany) and organizations (such as EPO and the Eurasian Patent Convention (EAPC)), by using an international application route in accordance with the Paris Convention or the Patent Cooperation Treaty (PCT), is called a patent family. There are two major benefits in searching patent families.

Fig. 8 Patent Family

The first benefit is that a company can check whether a Japanese patent in which it is interested has had applications filed in other countries. If a company faces severe competition not only in Japan but also in other countries, it should aim to understand its competitors’ moves by continuously checking whether they have filed patent applications outside Japan, and then use this information to develop its own patent application strategy. The second benefit is a practical one. If you find an interesting or conflicting patent for your company while searching for patents, but the documents are in a foreign language (such as English, German, or Chinese), you may look at the patent family to find relevant patent documents published by the Japan Patent Office to learn the outline of the patent. For example, assume you received a warning letter from a foreign company together with a patent specification written in a foreign language. To understand the content of the patent, you must read that patent specification in the foreign language, but this may be time-consuming. Instead, you can look at the relevant patent family to check if an equivalent patent has been granted in Japan. If a

Patent Family (a group of equivalent patents)

Japanese patent

Filing with USPTO

Filing with EPO

Filing with Chinese Patent Office

Claim of priorityPatents corresponding to the Japanese patent

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patent gazette is published in Japan for the equivalent patent, you can understand the contents of the patent more quickly.

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3. Types of Patent Research

Patent research includes the following types according to the phases of the IP Cycle

(Creation of an invention → Protection of the invention → Use of the invention) and

the R&D cycle (Basic research/applied research → Development/design →

Production/commercialization → Sales/marketing).

Fig. 9 Types of Patent Research According to the IP Cycle and the R&D Cycle

Each research type is explained in detail below.

i. Prior Art Search (before filing an application)

In the stage before a patent application is filed, namely, the stage when a

researcher/engineer has conceived of an idea and is preparing an idea sheet to

summarize it, prior art searches should be conducted to investigate whether any

application has already been filed for a similar invention. Filing a patent

application with the Japan Patent Office costs several hundred thousand yen (and

filing a patent application with a foreign patent office incurs additional costs such

as for translation and local attorneys). If a person files a patent application

without knowing whether there was any previous patent application similar to

the conceived idea, the application may be rejected, thus wasting these costs. If

a company finds a prior patent application for an invention similar to its idea

during the prior art search, it may use the information in the prior application to

improve its own idea.

Development/design

Sales and marketing

Patent technology trends search

Technological Information Gathering Research

Invalidity Search/Known Art Search

Clearance Search/Freedom to Operate Search

Prior Art Search (before filing an application)

Patent assessment/patent inventory-taking

Create an invention - Develop IP strategyProtect the invention - Filing patent

application/patent registrationBuild a patent portfolio

Use the patent - In-house/licensing, etc.

Patent analysis

Patent search

IP Cycle

R&D CycleBasic research/applied research

Production/commercialization

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ii. Invalidity Search/Known Art Search

If its product or service infringes upon any other person’s intellectual property

right (such as patent right, utility model right and design right), a company may

conduct invalidity searches or known art searches to find prior documents that

prove the invalidity of the registered IP right. In patent right infringement cases

such as those between Apple and Samsung Electronics, both the plaintiff and the

defendant conducted thorough searches to argue the invalidity of the other’s

granted patent. In invalidity searches and known art searches, non-patent

documents (such as academic papers, catalogs and magazines) are usually

examined in addition to patent documents to ensure extensive coverage.

iii. Clearance Search/Freedom to Operate Search

Before a company introduces a new product or service into the market, it should

conduct clearance searches or freedom-to-operate (FTO) searches to confirm

that the product or service does not infringe the IP rights of others (such as patent

right, utility model right and design right). Searches must be conducted in each

country where the company plans to introduce the new product or service,

usually covering patented inventions, registered utility models and registered

designs currently in effect, as well as patent applications that are likely to be

registered. If a company conducts such a search and finds a patent that would

hinder its business, it must conduct invalidity searches to prepare for arguing the

invalidity of such patent. If it is difficult to argue the invalidity, the company

must then consider modifying the specifications of the relevant products or

services such that they do not fall under the scope of that patent.

iv. Technology Trends Research/Technological Information Gathering Research

A company must research technology trends to comprehensively analyze the trend

in a specific technological field in order to develop its R&D strategy and to choose

an R&D subject. Such research usually covers more than 1,000 patents, and may

have to cover more than 10,000 patents in some technological fields. Some

examples of research documents made publicly available include the Report of

Patent Application Technological Trend Research9, an annual report published by

the Japan Patent Office, and the WIPO Patent Landscape Reports (PLRs) 10

published by the World Intellectual Property Organization. Once the research

subject is determined, technological information research is conducted to gather

and sort information on past technologies that are similar to the chosen subject.

9 http://www.jpo.go.jp/shiryou/gidou-houkoku.htm (* Link to the Japanese page) 10 http://www.wipo.int/patentscope/en/programs/patent_landscapes/

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v. Other Research

Other research includes status searches and patent family searches. Status searches

are conducted to confirm the current status of a patent (in effect or expired) or a patent

application (still in the application publication stage, or being examined, etc.). For example,

if a company finds a patent or patent application that would impede its business, it must

conduct a status search to confirm the stage reached by the patent examination of the

application, or whether the patent is registered in effect or expired.

Patent family searches are conducted to investigate specific patent families.

Patent rights in each country are independent from those in other countries. To

do business in Japan, the U.S. and China, a company must file a patent

application in each of these countries. A group of patent applications with

identical content filed in different countries is called a “patent family” (strictly

speaking, the scope of the patent right may vary in the end because, in the course

of the examination by each local patent office, the scope of the claims or the

content, which defines the scope of the patent right, may be modified). Data on

patent families are available, free of charge, from Espacenet, a database provided

by the European Patent Office (EPO).

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4. Steps of Patent Searches

The steps shown in Fig. 10 should be followed when conducting searches. To

accomplish the purpose of a patent information search, it is necessary to form a right

parent population. Accordingly, the major challenge is how to structure the search

formula.

Fig. 10 Steps of Patent Searches

Step 1Clarifying the Search

Target

Step 2Determining the Search Method

Step 3Selecting Search

Keys

What are the background technology and the technological field?What are problems/purposes?What are technological characteristics and what solution will be used?What is the consequence/effect?

Which databases should be used?Which countries should be included in the search?Which period should be included in the search?Will the search be conducted internally, or outsourced?

What are keywords?What are patent classes?

* Which company should be watched carefully?

* Which inventor should be watched carefully?

Step 4Creating a Search

Formula

Step 5Searching Databases

and Creating a ListReading in

publications

Step 6Organizing and Storing Search

Results

Create a search formula based on the search keys identified in Step 3. Patent Search Matrix Three Basic Search

Formula Patterns

It is difficult or impossible to use an advanced search formula in J-PlatPat and other free databases. In these free databases, searches are typically conducted using a single search formula.

*The clustering function may be used when publications are read-in to save labor.

How should the search results be stored?

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i. Step 1: Clarifying the target technologies to be searched

The first step is to clarify which technology should be searched. What are the

background technologies and the technological field? What is the problem or

purpose of the technology to be searched? What solution will be used to solve

the problem? What is the consequence or effect of the solution? It is important

to clarify these points before starting the search.

ii. Step 2: Determining the search approaches (country, period, database, etc.)

After clarifying the target technology, the second step is determining the search

approaches. It should be determined how the search will be conducted, including

the target countries, databases and periods (how many years should be tracked

back), excluding the characteristics of the technology.

In determining which countries’ patents should be searched, you may consult

statistics published by the WIPO and the JPO to see which countries are strong

in which technological fields (i.e. in which countries many patent applications

were filed for a specific technological field). In the software or

telecommunications field, for example, more patent applications have been filed

in the U.S. than Japan. To know the technological trend in these fields, it is

recommended to include the U.S. in the search in addition to Japan. In the

Clearance Search/Freedom to Operate Search explained above, a company

conducts searches in those countries where it does business. If a company does

not plan to expand into other countries, the search range may be restricted to

Japan.

iii. Step 3: Selecting keywords and patent classes

Search keys such as keywords and patent classes are used when structuring a

search formula. To search patent documents in which the target technology is

disclosed, relevant patents should be identified by using keywords, patent classes

and other search keys.

Equivalent terms, synonymous words and different expressions may also need

to be included when choosing keywords. For example, you may want to search

printer-related patents, but other applicants may use terms such as “image

forming device,” “imaging device,” “image output device” or other synonyms

instead of “printer”. When you conduct a search, these synonymous terms should

also be included.

As explained previously, individual countries and regions adopt their own

classifications besides the International Patent Classification (IPC), such as FI

and F-term in Japan, and the Cooperative Patent Classification (CPC) used in the

U.S. and Europe. If a company searches patent information in Japan only, FI and

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F-term should be used primarily. If a global search is needed, CPC should also

be used in addition to IPC.

The most orthodox method for choosing keywords and patent classes is called a

preliminary search or preliminary research. As the first step, only the most

relevant keywords are used to find 10 to 20 patent gazettes that exactly match

those keywords in order to identify relevant patent classes. Then, based on the

identified patent classes (patent classes that are highly relevant to the target

technology to be searched), 10 to 20 patent gazettes are chosen to retrieve other

relevant keywords (equivalent terms, synonymous words and broader or

narrower definitions).

Online thesauruses, 11 , 12 English-English dictionaries 13 and other online

dictionaries are also effective tools to extract keywords. To extract patent classes,

you may use online tools such as the IPC/FI Ranking of “Kantan Tokkyo

Kensaku” (Quick Patent Research)14 and the patent class keyword search in the

J-PlatPat Patent Map Guidance.

The Japan Patent Office operates the Patent Search Portal site15 which publishes

patent-related information (in Japanese only) to assist prior art searches. It

provides a tool to check the correspondence relationship between the FI classes

and the CPC classes, as well as a subject-specific search guidance that illustrates

examples of subject-specific searches and other search approaches.

Keywords and patent classes are mainly used to search and extract patents based

on technological characteristics. In addition, the applicant name (company or

research institute) and the inventor name contained in the bibliographic data are

also important search keys to identify a specific technology of a specific

company.

iv. Step 4: Creating a search formula

A search formula should be created by using search keys and “AND”, “OR” and

“NOT” operators. Figure 11 outlines the concept of AND and OR.

11 Weblio: http://thesaurus.weblio.jp/ 12 Thesaurus.com: http://www.thesaurus.com/ 13 Longman English Dictionary Online: http://www.ldoceonline.com/ 14 “Kantan Tokkyo Kensaku” (Quick Patent Research): http://kantan.nexp.jp/ (* Link to a Japanese page) 15 Patent Search Portal Site: https://www.jpo.go.jp/torikumi/searchportal/htdocs/search-

portal/top.html (* Link to a Japanese page)

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Fig. 11 Operators AND and OR

Although they are fundamental elements, AND and OR are often used

incorrectly. Examples of search formulas using AND and OR for the following

keywords are shown below.

ランニング、靴、赤、クツ、ウォーキング、くつ、徒歩、ジョギング、

シューズ、レッド、紅 (i.e. running, shoes, red, shoes, walking, shoes, walk, jogging, shoes, red, red)

(note: “靴”, “クツ”, and “くつ” and “shoes” all refer to the same concept; and

“赤”, “red” and “紅” all refer to the same concept; but the characters used to

express the meaning (kanji, hiragana, katakana, roman characters) are different)

(1) Search Formula Pattern A

(ランニング OR ウォーキング OR 徒歩 OR ジョギング) AND

(靴 OR クツ OR くつ OR シューズ) AND (赤 OR レッド OR 紅)

(2) Search Formula Pattern B

S1 (ランニング OR ウォーキング OR 徒歩 OR ジョギング)

S2 (靴 OR クツ OR くつ OR シューズ)

S3 (赤 OR レッド OR 紅)

S4 S1 AND S2 AND S3

A search formula can be created by putting keywords referring to the same

concept (such as a keyword indicating a color) into a group by using the OR

operator, and then binding these different concept groups of keywords by using

the AND operator. The creation of search formulas will be discussed in more

detail in the next chapter.

In Pattern A, the search formula is written in one single row. In Pattern B, a

group of keywords referring to the same concept is created in each row, and all

of these groups are coupled by using the AND operator in the final row. Pattern

B or other similar advanced search formulas may not be available in most of the

free patent search databases.

AND OR NOT

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v. Step 5: Conducting database search and publication read-in

It is not practical to create a complete search formula before starting database

searches. Typically, you create search formulas and then read in publications

while you are conducting a database search. You may use free databases

provided by the JPO and other patent offices in foreign countries and paid

databases with advanced functions provided by vendors. J-PlatPat, the free

patent data platform in Japan, and free databases available in other countries are

discussed in Chapter 7.

vi. Step 6: Organizing and storing search results

The search results should be compiled into a report by using word-processing or

spreadsheet software. When creating a report, at least the following items must

be included:

- Description of the search (target technology and extract criteria);

- Search method (target countries, target period, target databases, etc.);

- Search results (conclusions, extracted patents’ identification numbers);

and

- Name of the person who conducted the search

It is important to describe the search, but it is even more important to know who

conducted the search and to what extent. Patent search databases are updated

every week. It should be clarified, for example, whether the search covers data

up to October 31, 2015 or up to December 31, 2015. Otherwise, when another

update search is subsequently conducted, the searcher cannot know how far back

the search should go.

5. Example of Patent Search Using Patent Search Matrix

This section discusses some examples of actual searches for Step 1 to Step 5 of the

patent information search explained in the previous chapter.

Example:

On rainy days, manhole covers catch rainwater and become

slippery, which is dangerous for pedestrians. The subject to be

searched is that of manhole covers with concave-convex patterns to

prevent slipping on rainy days.

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i. Using the Patent Search Matrix

The patent search matrix may be used as a tool to effectively organize search

keys and create a search formula.

Fig. 12 Patent Search Matrix

Figure 12 shows the patent search matrix, which is a tool that is mainly used to

organize search keys (keywords, patent classes, applicants/right holders, dates,

etc.). Based on the search keys organized by this matrix, a search formula should

be created following the three search formula patterns described later. The main

purpose is to centrally manage information necessary for patent information

searches by organizing search keys in this matrix. Creating the matrix in MS

Excel or other spreadsheet software makes it easy to share information and

knowledge necessary for searching. In addition, by applying three basic patterns

to the matrix (i.e. operation only by keywords, by patent classes, or by both),

anyone can create a mother population with some accuracy (low noise).

ii. Clarifying the Search Target

The search target should be clarified in the first step. Background technologies

and objectives (problems, purposes or technological characteristics) should then

be entered in the highlighted sections for each constituent element. In this

example,

On rainy days, manhole covers catch rainwater and become

slippery, which is dangerous for pedestrians. Manhole covers with

concave-convex patterns to prevent slipping on rainy days.

A manhole (cover) is the background technology, prevention of slipping is the

problem, and concave-convex patterns on the surface of manhole covers are the

technological characteristics.

Background technology

Objective 1

Problem/purpose

(consequence/effect) or

technological

characteristics/solutions

Objective 2

Problem/purpose

(consequence/effect) or

technological

characteristics/solutions

Search key Clarifying the Search Target

Keywords/equivalent terms

(in Japanese)

Keywords/equivalent terms

(in English)

IPC

FI

F-term

CPC

Selecting Search Keys

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Fig. 13 Patent Search Matrix after Clarifying the Search Target

iii. Selecting Search Keys

The next step is identifying keywords, synonymous words, patent classes (IPC,

FI, F-term and CPC) and other search keys, and entering them in the matrix. As

discussed above, it is recommended to first conduct a preliminary search by

using the most relevant keywords. The screen below is an example of a

preliminary search by using the text search of J-PlatPat for patents and utility

models.

Background technology

Objective 1

Problem/purpose

(consequence/effect) or

technological

characteristics/solutions

Objective 2

Problem/purpose

(consequence/effect) or

technological

characteristics/solutions

Search key Manhole covers Anti-slip Cover surface/concave-convex

Keywords/equivalent terms

(in Japanese)

IPC

FI

F-term

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Fig. 14 Example of Preliminary Search Using J-PlatPat

The purpose of a preliminary search is to identify patent publications that exactly

match the most relevant keywords, rather than conducting a comprehensive

search, then extract patent classes and other relevant keywords from those

publications. In this example, searches are conducted as shown in Fig. 14:

Abstract + Scope of Claim = Manhole

and

Abstract + Scope of Claim = Slip Prevention

and

Abstract + Scope of Claim = Slip Prevention

The search extracted 17 matches. From these results, you can easily find a

publication of patent application, Tokkai 2001-090097 “Iron cover of manhole

or the like applied with anti-slip treatment.” Looking at the patent classes

assigned to this publication,

“マンホール” is a Japanese word for manhole.

“滑り止め” is anti-slip.

“模様 凹凸” is the concave-convex pattern.

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(IPC)

E02D29/14 ..covers for manholes or the like; frames for covers

(FI)

E02D29/14E structures of covers, e.g. layered covers, anti-slip covers

(F-term)

2D047BB00 manhole covers/cover-receiving frames

2D047BB21 . structures of covers

2D047BB22 .. layered covers

2D047BB23 .. anti-slip covers

2D047BB24 .. double covers (with inner cover)

may be selected as relevant patent classes. The definitions of the identified patent

classes should be confirmed in the Patent Map Guidance as needed. When

identifying relevant patent classes, note that patent classifications have

hierarchical structures. Even if the definition of a class in a lower hierarchy

matches the target technology, it cannot be used as a search key unless its upper

classification also matches the target technology to be searched.

The following screen is an example of using the Quick Patent Search website

tool to identify patent classes. In the Top screen, enter “マンホール 滑り止

め ” (manhole anti-slip) and click the [Search] button. Then, click the [FI

Ranking] link to show a ranking table as shown in Fig. 15. In the default setting,

the top 20 primary FI classes are listed with their application numbers. This

setting can be changed in the pull-down menu as necessary.

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Fig. 15 Example of Using Quick Patent Searches to Search Patent Classes

After search keys are selected, the patent search matrix looks like that shown

below. with identified keywords and patent classes. Although this is a simple

example, you can effectively create a search formula by filling in the patent

search matrix.

Fig. 16 Patent Search Matrix after Selecting Search Keys

Background technology

Objective 1

Problem/purpose

(consequence/effect) or

technological

characteristics/solutions

Objective 2

Problem/purpose

(consequence/effect) or

technological

characteristics/solutions

Search key Manhole covers Anti-slip Cover surface/concave-convex

Keywords/equivalent terms

(in Japanese)

マンホール地下構造物用蓋“マンホール” is a Japanese word

for manhole.

“地下構造物用蓋” refers to covers

for underground structures.

滑止、防滑、すべり、スリップ、撥水“滑止” and “防滑” both refer to

anti-slip.

“すべり” and “スリップ” both refer to

slip.

“撥水” is water repellent.

模様、凹凸、凸部、凹部、突起“模様” is pattern.

“凹凸”, “凸部”, “凹部” and “突起”

all refer to concavity, convexity, or

protrusion.

IPC E02D29/14

FI E02D29/14E (E02D29/14E)

F-term 2D047BB21-BB24

Corresponding F-term 2D047BB23

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iv. Three Basic Search Formula Patterns

Another important point in creating a search formula is using the three basic

search formula patterns. Table 4 below shows these three patterns.

Table 4 Three Basic Search Formula Patterns

Pattern Use

Merit/Demerit

Considerations

Basic Pattern (1)

Keywords only

○ / △ May result in a huge number of hits unless

the keywords are carefully chosen (△).

It is useful to run an operation by using

two or more keywords to prevent

omission (○).

Basic Pattern (2)

Patent classes only

/ × Very useful if there is a patent class that

matches the search target technology ().

May result in a huge number of hits if

there is no patent class that matches the

search target technology (×). Narrowing

by using keywords is necessary.

Basic Pattern (3)

Combined use of

keywords and patent

classes

Easy to set the mother population for the

search to a desired size (fewest hits

possible or lowest noise, etc.)

Major search keys are keywords and patent classes. By combining these two

types of keys, the three basic patterns can be structured as shown above. There

are other methods to narrow the search range based on names of applicants, right

holders or inventors, or dates. But these three basic search patterns are the main

patterns to narrow the search range based on technological characteristics of

patents. It is recommended to combine these patterns as appropriate, considering

their merits and demerits.

When using keywords, it is important to decide whether to limit the search range

to abstracts and scopes of claims or to search the full text. Typically, it is

recommended to limit the search range to abstracts and scopes of claims when

searching technological terms, and to conduct full-text searches to find problems,

consequences or effects, or proper names.

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v. Creating a Search Formula

As shown in Fig. 16 (Patent Search Matrix after Selecting Search Keys), you

start can creating a search formula after you have finished identifying and

organizing the search keys. In this patent search matrix, as shown in Fig. 17, the

vertical direction (columns) represents the same concepts, while the horizontal

direction (rows) indicates different concepts.

Fig. 17 Concept of Columns and Rows in Patent Search Matrix

As explained regarding the use of operators OR and AND in Fig. 11, if you want

to set a comprehensive range for background technology, the following is

recommended:

Keyword=マンホール OR 地下構造物用蓋) OR IPC=E02D29/14

OR FI=E02D29/14E OR F-term = (2D047BB21 OR 2D047BB22 OR

2D047BB23 OR 2D047BB24) ... Proposed Search Formula 1

If you want to narrow down, you may cross-couple the basic search patterns as

shown below.

IPC = E02D29/14 AND Keyword =(蓋 OR ふた OR フタ) AND

キーワード = (滑止 OR 防滑 OR すべり OR スリップ OR

撥水) AND Keyword = (模様 OR 凹凸 OR 凸部 OR 凹部 OR 突

起) ... Proposed Search Formula 2

FI = E02D29/14E AND Keyword = (滑止 OR 防滑 OR すべり

OR スリップ OR 撥水) AND Keyword = (模様 OR 凹凸 OR 凸

部 OR 凹部 OR 突起)...Proposed Search Formula 3

Keyword = (マンホール OR 地下構造物用蓋) AND Keyword

= (滑止 OR 防滑 OR すべり OR スリップ OR 撥水) AND

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キーワード=(模様 OR 凹凸 OR 凸部 OR 凹部 OR 突起) ...

Proposed Search Formula 4

(In the above formulas, “マンホール” is manholes;

“地下構造物用蓋” is covers for underground structures;

“蓋”, “ふた” and “フタ” all refer to covers, and are pronounced “futa,”

but are expressed by different Japanese characters (kanji, hiragana and

katakana),

滑止 and 防滑 both refer to anti-slip but in different expressions;

“すべり and スリップ” both refer to slip but in different expressions;

“撥水” is water repellent;

“模様” is patterns;

“凹凸 , 凸部 and 凹部 ” refer to concavities, convexities or

protrusions; and “突起” is protrusions.)

Because IPC E02D29/14 (covers for manholes or the like; frames for covers) is

used in the Proposed Search Formula 2, more keywords related to covers are

coupled. Because FI E02D29/14E (Structures of covers, e.g. Layered covers,

anti-slip covers) is used in the Proposed Search Formula 3, keywords related to

covers are not coupled. Figure 18 shows the results of a J-PlatPat patent/utility

model text search by using the Proposed Search Formula 2 to limit the keyword

range to abstracts and scopes.

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Fig. 18 Screen Showing the Results of Patent Gazette Text Searches by Using the

Proposed Search Formula 2

“蓋”, “ふた”, and “フタ” all refer to a cover.

“滑止” and “防滑” both refer to anti-slip. “すべり” and “スリップ” both refer to slip. “撥水” is water repellent.

“模様” is pattern. “凹凸”, “凸部”, “凹部” and “突起” all refer to concavity, convexity, or protrusion.

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The patent gazette is checked on its default setting of patent application

publications (publication of applications filed with the JPO, publication of

Japanese translations of PCT international publication for patent applications,

and re-publication of PCT international publication for patent applications). The

search resulted in 44 hits (as of Dec. 13, 2015). F-term 2D047BB23 related to

manhole covers was extracted as a result of a search key identification. Although

this F-term does not include reference to anti-slip by patterns or concavities and

convexities, it is recommended to use only 2D047BB23 for the search because

it is a highly relevant patent class.

In this search example, the following search formula was created as explained

above:

Search Formula Pattern 1

Keyword = (マンホール OR 地下構造物用蓋) AND Keyword

= (滑止 OR 防滑 OR すべり OR スリップ OR 撥水) AND

キーワード=(模様 OR 凹凸 OR 凸部 OR 凹部 OR 突起)

Search Formula Pattern 2

F-term = 2D047BB23

Search Formula Pattern 3

IPC = E02D29/14 AND Keyword= (蓋 OR ふた OR フタ) AND

キーワード=(滑止 OR 防滑 OR すべり OR スリップ OR 撥水)

AND Keyword = (模様 OR 凹凸 OR 凸部 OR 凹部 OR 突起)

Search Formula Pattern 4

FI = E02D29/14E AND Keyword = (滑止 OR 防滑 OR すべり

OR スリップ OR 撥水) AND Keyword = (模様 OR 凹凸 OR 凸

部 OR 凹部 OR 突起)

(In the above formulas, “マンホール” is manholes;

“地下構造物用蓋” is covers for underground structures;

“蓋”, “ふた” and “フタ” all refer to covers, and are pronounced “futa,”

but are expressed by different Japanese characters (kanji, hiragana and

katakana),

滑止 and 防滑 both refer to anti-slip but in different expressions;

“すべり and スリップ” both refer to slip but in different expressions;

“撥水” is water repellent;

“模様” is patterns;

“凹凸 , 凸部 and 凹部 ” refer to concavities, convexities or

protrusions; and

“突起” is protrusions.)

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Because unions of sets cannot be retrieved by the above-mentioned search

formulas, search results obtained by individual search formulas in J-PlatPat may

overlap. In commercially available databases, however, you may get a union of

sets by each search formula. Because the case of anti-slip manholes above is a

very simple example, not many search patterns are created from the patent search

matrix. In actual cases, search subjects are more complicated; so it is

recommended to use cross coupling using several patterns, instead of a single

pattern, by following the basic search formula patterns.

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6. Patent Information Databases in Different Countries

In this chapter, J-PlatPat provided by the Japan Patent Office, Espacenet provided by

the European Patent Office, Patent Full-Text Database (PatFT/AppFT) provided by

the USPTO, Patentscope provided by the World Intellectual Property Organization,

and Google Patents provided by Google are explained as examples of patent

information databases available in different countries. Patent offices in other countries

also provide their own patent databases.

Commercial vendors such as Thomson Reuter, Minesoft, RWS, Questel, and

LexisNexis also develop and provide paid patent databases. Paid databases provide

many additional functions that are not available in free databases.

i. J-PlatPat Patent Information Platform

This is a database operated by the Japan Patent Office. On March 23, 2015, IPDL,

the former digital patent library, was renewed as J-PlatPat, a new patent

information platform. (The following explanations are based on the English user

interfaces used in J-PlatPat).

URL: https://www.j-platpat.inpit.go.jp/web/all/top/BTmTopEnglishPage

Fig. 19 Top Page of J-PlatPat

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Figure 19 shows the top page of J-PlatPat, which features the following search

menus:

Patents/Utility Models

- Patent & Utility Model Number Search

- FI/F-term Search

- PAJ

- Patent Map Guidance (PMGS)

Designs

- Design Number Search

- Design Classification Search

- Japanese Design Classification List

Trademarks

- Searching Figure Trademarks or Non-traditional Marks

- Japanese Trademark Database

- Searching Goods & Services

- Japanese Well-Known Trademark

- Table of the Classification of Figurative or Other Elements of Marks

In the Patent/Utility Model Search Menu, the search can be made by FI or F-

term, which are both Japanese original patent classifications, as well as by

English keywords using Patent Abstracts of Japan (PAJ), which are English

excerpts of publications of patent applications. Patent Map Guidance is also

provided to help you with FI and F-term searches. Explanations of design and

trademark searches are omitted in this textbook. Menus for patent/utility model

searches are explained below.

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Fig. 20 J-PlatPat Patent & Utility Model Number Search Screen

Figure 20 is a screen of J-PlatPat Patent & Utility Model Number Search. On

this screen, you can search publications using application numbers, numbers of

publications of patent applications, numbers of examined applications, numbers

of granted patents/utility models and other number data. In the entry fields,

examples of entry formats are shown in light gray.

Because the Japan Patent Office uses the Japanese Calendar system for

document administration, refer to the following relationship between the

Japanese Calendar and the Western Calendar if a character like “S” or “H” is

included in a Japanese publication number that you searched in Espacenet:

1868-1912 = M1 (M01)-M45 * M refers to the “Meiji” era in the

Japanese Calendar.

1912-1926 = T1 (T01)-T15 * T refers to the “Taisho” era.

1926-1989 = S1 (S01)-S64 * S refers to the “Showa” era.

1989-2015 = H1 (H01)-H27 * H refers to the “Heisei” era.

As shown in the example below, publication numbers issued in and before 1999

(Heisei 11) used the Japanese Calendar. Publications issued from 2000 (Heisei

12) use the Western Calendar.

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特開昭 63-123456 * Publication of unexamined patent application

特公昭 58-001145 * Publication of examined patent application

実開昭 57-003215 * Publication of unexamined utility model

application

実公昭 57-003215 * Publication of examined utility model application

特開平 05-004567 * Publication of unexamined patent application

特公平 04-000278 * Publication of examined patent application

実開平 08-000164 * Publication of unexamined utility model

application

特開 represents a publication of unexamined patent application;

特公 represents an abbreviation of publication of examined patent;

実公 represents an abbreviation of publication of examined utility model

application;

実開 represents an abbreviation of publication of unexamined utility model

application;

昭 refers to “Showa” era; and

平 refers to “Heisei” era.

The publication of examined application system was discontinued in 1996. From

then onward, registration numbers were adopted as shown in the examples

below:

特許 2555678 * Granted patent

実登 2555678 * Registered utility model

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The table below compares the formats of publication numbers between JPO

publications, J-PlatPat and Espacenet.

Table 5 Formats of Japanese Patent Publication Numbers

Publication

Number

J-PlatPat Format

(Description in ( ) is a kind

(type) of publication)

Espacenet

Format

特開昭 63-123456 S63-123456

1988-123456

(A: Publication of patent

application (A))

JPS63123456A

特公昭 58-001145 S58-001145

1983-001145

(B: Publication of

examined/granted patent)

JPS581145B

特開平 05-004567 H05-004567

1993-004567

(A: Publication of patent

application (A))

JPH054567A

特公平 04-000278 H04-000278

1992-00278

(B: Publication of

examined/granted patent)

JPH04278B

特開 2000-123456 2000-123456

H12-123456

(A: Publication of patent

application (A))

JP2000123456A

特許 2555678 2555678

(B: Publication of

examined/granted patent)

JP2555678B

The screen below is an example of searching 特開平 05-004567 (A: Publication

of patent application (A), H05-004567). From the pull-down menu of [Kind],

select [A: Publication of patent application (A)], enter H05-004567 in

[Document Number], and click the [Search] button. Then, the following screen

will be displayed.

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Fig. 21 Search Result of H05-004567

Click the link of JP, 05-004567, A (1993) to view the Patent Abstracts of Japan

(PAJ) containing bibliographic data, an abstract in English and a representative

drawing.

Fig. 22 PAJ Screen for H05-004567

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From the [PAJ], [Detail], and [Image] tabs in the upper part of the screen, click

the [Detail] tab to view claims and working examples in English. These are

created by machine translation, and so are often not very accurate. Click the

[Image] tab to view the publication format. However, you cannot retrieve a PDF

file of the publication identified by the Patent & Utility Model Number Search

of J-PlatPat in English. To retrieve a PDF file, you must use the Japanese

interface of J-PlatPat to search for the relevant patent/utility model number or

access Espacenet.

Click the [Legal Status] button on the upper-right corner to show the status of

the patent right in the pop-up window as shown below.

Fig. 23 Pop-Up Window of Legal Status of H05-004567

The [Date of request for examination] and [Registration info] lines are left blank.

The [Detailed info. of application] line shows “Kind of final decision (Deemed

to be withdrawn).” From this data, you learn that no request for examination was

made for the patent application, so the JPO deemed that the application must has

been withdrawn.

Now, let’s look at Fig. 24 showing the FI/F-term search menu.

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Fig. 24 FI/F-term Search Screen of J-PlatPat

In this menu, you can use FI or F-term, both original patent classifications used

by the JPO, for searching patent publications. FI and F-term can be searched by

using the Patent Map Guidance as shown below.

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Fig. 25 Patent Map Guidance Screen of J-PlatPat

If you already know an FI class, you may click the [Classification] link shown

next to FI to select the class, or directly enter the identified FI class in the blank

field. As an example, the FI classification for E02D29/00 is shown below.

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Fig. 26 Screen of FI E02D29/00 List

The list also shows the F-term classification link corresponding to FI E02D29/00.

Click this link, then a list of the F-term theme code 2D047 will be displayed as

shown below.

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Fig. 27 Screen of F-term List of Theme Code 2D047

If you do not know an FI or F-term class, select the [Search by Keyword] button

on the upper side of Patent Map Guidance.

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Fig. 28 Patent Map Guidance Screen of J-PlatPat

The [Search by Keyword] screen has the following layout. Checkmark the

classification you want to search (FI, FI Handbook, F-term List, F-term

Description) and enter the English keywords in the [Keyword] blank field.

Fig. 29 Patent Map Guidance Screen of J-PlatPat (Search by Keyword)

In this example, checkmark FI, enter “manhole” in the [Keyword] field and click

the [Search] button. Then, a screen listing the FI search results as shown below

will be displayed.

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Fig. 30 Patent Map Guidance Screen of J-PlatPat (Keyword Search Results)

Click a searched FI to view the list of other FI main groups including that FI.

Read the FI definitions and choose the appropriate class. In the following

example, assume the keyword search results are as follows:

E02D29/00 Independent underground or underwater structures;

Retaining walls; Making conduits in situ, e.g. of

concrete

E02D29/10 . Tunnels or galleries specially adapted to house

conduits, e.g. oil pipe-lines, sewer pipes; Making

conduits in situ, e.g. of concrete; Casings or coverings

of boreholes or narrow wells

E02D29/12 . . Manhole shafts; Other inspection or access

chambers; Accessories therefor

E02D29/14 . . . Covers for manholes or the like; Frames for covers

E Structures of lids per se, e.g. laminated lids, non-slip lids

Choose E02D29/14E, a subordinate FI class of E02D29/14, then conduct a

search in FI/F-term Search by using this FI.

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Fig. 31 FI/F-term Search Screen of J-PlatPat

Note that when you enter E02D29/14E in the FI/F-term search, you must add @

(at mark) before E (a letter suffixed to a FI sub-group code is called a file

discrimination code). To specify the type(s) of publications, choose the desired

type(s) from [Kind]. To specify the date, enter the date in the [Publication Date]

field in the YYYYMMDD format. The [Priority of search result display] field is

used to choose which results should be listed first, publications of unexamined

applications or publications of examined applications/registrations. In this

example, 897 matches were found by the search shown above (as of December

15, 2015). If there are more than 1,000 matches, you cannot view them in a single

screen. Choose a lower FI class or choose a cross coupling of two or more FI

classes to narrow the search range. If a narrower F-term class is found by clicking

the F-term link corresponding to the FI class, that F-term may be used.

The result of the search is as shown below, listing the numbers of publications.

Click each publication number link to view the details of the publication.

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Fig. 32 FI/F-term Search Result Screen of J-PlatPat

Lastly, let’s look at PAJ in the Patent & Utility Model search menu of J-PlatPat.

Fig. 33 PAJ Search Screen of J-PlatPat

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PAJ is an abbreviation of Patent Abstracts of Japan. The titles and abstracts of

inventions are translated manually, not by machine, from Japanese to English.

English abstracts of Japanese patents accessible from Espacenet are those from

PAJ.

In the PAJ Search Menu, you can couple the following five items to search

publications:

- Abstract,

- Title of invention,

- Applicant,

- Publication date, and

- IPC

In J-PlatPat, this is the only search menu with English interfaces from which you

can use English keywords for the search of Japanese patents and utility models.

In this example, “VEHICLE” is entered in the [Abstract] field, and “GOOGLE”

is entered in the [Applicant] field. In this case, three patents matched as shown

below.

Fig. 34 Example of PAJ Search of J-PlatPat

Click [View list] to view the list of publication numbers and titles of inventions

of these three matches, as shown below.

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Fig. 35 PAJ Search Results of J-PlatPat

Click the second line item of the list (2014-197404) to see the PAJ for the

publication as shown below. The keyword and the applicant name used in the

search are highlighted in red.

Fig. 36 PAJ Search Results of J-PlatPat

To see more details of the patent, click the [Full Text (Machine Translation)]

button at the bottom of the page to show the full text of the machine translation.

To check the right-related status of the publication, click the [Legal Status]

button at the upper-right corner.

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ii. European Patent Office (EPO) Espacenet

Espacenet is a database operated by the European Patent Office (EPO) that

manages patent information not only in Europe but in about 90 total countries

and regions. Unlike the J-PlatPat patent data platform and the USPTO database,

Espacenet allows you to search patent family information. Espacenet has smart

search, advanced search and classification search menus. The figure below

shows the interface in the advanced search menu.

URL: http://worldwide.espacenet.com/advancedSearch

Fig. 37 Top Page of the Advanced Search Menu of Espacenet

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Searchable items are the invention titles, abstracts, publication numbers,

application numbers, priority numbers, publication dates, applicants, inventors,

CPCs and IPCs. By entering a country code (e.g. JP for Japan, and US for the

United States), you may limit the search range to publications in a specific

country. The following search items are entered in this example:

Title or abstract: AIR CONDITIONER

Publication number: EP

CPC: B60K6

as shown below. Entering EP in the Publication number field, the search is made

only for publications in Europe. (By adding a type code to the country code, you

may also limit the search to a specific type of publication. For example, entering

EPA will limit the search to publications of patent applications in Europe, and

entering EPB will limit the search to publication of granted patents in Europe.)

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Fig. 38 Example of Advanced Search in Espacenet

Eight matches are retrieved as a result of the search.

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Fig. 39 Example of Advanced Search Results in Espacenet

Click the title of the invention of the first item in the match list. Bibliographic

data and abstracts in English are displayed as shown below.

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Fig. 40 Example of Advanced Search Results in Espacenet (publication view)

By clicking [INPADOC patent family] on the left side menu, you can see the

patent family related to this patent.

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Fig. 41 Example of Advanced Search Results in Espacenet (patent family)

By clicking [INPADOC legal status] on the left side menu, you can see the right-

related status of this patent (there may be a time lag, or right-related status data

may not be provided in some countries and regions).

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Fig. 42 Example of Advanced Search Results in Espacenet (INPADOC legal status)

If you are looking for information on patents in Europe, you may click the [EP

Register] button as indicated by an arrow in Fig. 42 to navigate to the

examination progress details page.

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iii. PatFT/AppFT of U.S. Patent and Trademark Office (USPTO)

The U.S. Patent and Trademark Office (USPTO) provides free patent databases,

known as Patent Fulltext Databases (PatFT/AppFT)19). PatFT is a database of

granted patents and AppFT is a database of patent application publications. Both

databases have Quick Search, Advanced Search and Number Search menus.

URL: http://patft.uspto.gov/

Fig. 43 Top Page of USPTO Patent Full-Text Databases

Interfaces in the [Advanced Search] menu are as shown in the figure below. Field

codes can be combined to create a search formula.

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Fig. 44 Top Page of the Advanced Search Menu of USPTO

A query can be structured in the search formula. For example,

TTL/HYBRID AND TTL/VEHICLE AND ABST/AIR AND

ABST/CONDITIONER

TTL specifies a keyword included in the title of inventions, and ABST specifies

a keyword included in abstracts. If you want to use patent classification, you may

use International Classification (ICL), Cooperative Patent Classification (CPC)

or U.S. Current Classification (CCL). The figure below shows the search results

of this example.

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Fig. 45 Search Results of USPTO Advanced Search (Search formula: TTL/HYBRID

AND TTL/VEHICLE AND ABST/AIR AND ABST/CONDITIONER)

You can view the publication either by clicking the publication number link or

the title of invention link. For example, click the publication number link in the

first line. Then, the following page for that publication will be displayed. This

publication page includes only text data, and has no drawings.

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Fig. 46 Example of Publication Page found in the USPTO Advanced Search

(US 8,892,287)

If you want to view drawings, click the [Images] button on the upper section of

the page. The publication in the PDF format is then displayed.

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Fig. 47 Example of Publication Page found in the USPTO Advanced Search

(US 8,892,287)

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iv. Patentscope of the World Intellectual Property Organization (WIPO)

Patentscope is a free database operated by the World Intellectual Property

Organization (WIPO), storing not only information on WO international patent

applications but also patent information collected from various countries and

organizations including IP5 (Japan, U.S., Europe, China and Korea).

URL: http://patentscope.wipo.int/

Fig. 48 Top Page of Patentscope

Patentscope has Simple, Advanced and Field Combination search menus. To

perform a simple search, you can use the [Simple search] menu. To customize a

search formula, use the [Advanced Search] menu. If you want to select multiple

search items and combine them, you may use the [Field Combination] menu.

This example is used to explain how the Field Combination search is performed.

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Fig. 49 Top Page of Patentscope Field Combination Search Menu

In the top page of the Field Combination Search Menu, a search item is listed in

each line. You may also use the pull-down menu to choose the search items you

want to use. By clicking [Specify] in the lower-right corner of the menu, you can

specify countries to be included in the search as shown in the figure above. In

the default setting, [All] is checkmarked to search all relevant applications filed

in countries in Africa, America, Asia and Europe, not only PCT applications.

You can check the filing conditions of individual countries covered by

Patentscope (such as the start date of record filing, and the latest filing date) by

navigating through the following:

Help > Data Coverage > National Collections

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Fig. 50 Patentscope National Collections - Data Coverage

In the Field Combination Search menu, patents including English search

keywords of HYBRID, VEHICLE, AIR, and CONDITIONER were searched.

(Patentscope’s search formula is: EN_AB:HYBRID AND EN_AB:VEHICLE

AND EN_AB:AIR AND EN_AB:CONDITIONER) The hit list is displayed as

shown below, and the searched keywords are highlighted.

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Fig. 51 Patentscope Search Results (Search formula: EN_AB:HYBRID AND

EN_AB:VEHICLE AND EN_AB:AIR AND EN_AB:CONDITIONER)

Click the publication number in the first item in the search result list. The link

opens a page with publication details.

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Fig. 52 Publication Page Found in the Patentscope Search (Example:

KR1020090118228)

The example above is a publication related to a Korean patent. To view claims

in the Korean language, click the [Claim] tab in the upper part.

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Fig. 53 Publication Page Found in the Patentscope Search - Claims

(Example: KR1020090118228)

Click the [Machine translation] button in the upper part of the page to show the

machine translation tool options. In this example, choose [Google Translate],

and choose [English]. The claims in the Korean language are translated into

English by machine translation as shown below. You can now examine the

contents of the Korean patent in English.

Fig. 54 Publication Page Found in the Patentscope Search - Claims Translated into

English by Machine Translation (Example: KR1020090118228)

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You may go back to the list of search results and click the [Analysis] button

above the list to view the macro statistic results of the search.

Fig. 55 Patentscope Search Results (Search formula: EN_AB:HYBRID AND

EN_AB:VEHICLE AND EN_AB:AIR AND EN_AB:CONDITIONER)

The following statistics are shown:

- Countries,

- Main IPC,

- Main Inventor,

- Main Applicant, and

- Pub Date

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Fig. 56 Result of Patentscope Search Analysis

If you change the format from [Table] to [Graph] in the options section, the

statistics will be displayed as a graph.

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v. Google Patents

Google Patents is a patent search database operated by Google, not by national

patent offices. It includes not only U.S. patents, but also European, Japanese,

WO, Chinese, Canadian and German patents.

URL: https://patents.google.com/

Fig. 57 Top Page of Google Patents

You just enter keywords as with usual Google searches, and relevant patents are

shown. The first search results are derived by groupings based on patent

classifications, and are listed in descending order of relevance. To change the

order of the search results, you can choose options from the pull-down menu of

“order by relevance” and “grouped by classification” at the top of the search

result page.

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Fig. 58 Search Result in Google Patents

(Search keywords: hybrid vehicle air conditioner)

In the default setting, all relevant patents are searched in addition to U.S. patents.

To narrow the search range to U.S. patents, specify [US] in the [Patent office]

field provided in the left side of the search results page.

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Fig. 59 Narrowing the Search Results to a Specific Country of Publication

The screen below is a page of a patent registered in Germany found by the

Google Patents search. In Google Patents, publications in foreign languages are

translated to English by machine translation. You can confirm the title of

invention, abstract, claims and detailed description of invention in English.

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Fig. 60 Page of a Publication found by the Google Patents Search

(Example: DE19801167C1)

In the upper-right corner of the page, basic data such as [Legal status],

[Applicant], [Right holder], [Filing date], [Publication date], [Registration date],

are shown. In [External links], links to patent office databases, such as Espacenet,

are provided so that you can confirm the patent family or obtain the publication

in PDF format.

Fig. 61 Find Prior Art Button in Google Patents (Example: DE19801167C1)

The [Find Prior Art] button provided in each publication page is a useful function.

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Fig. 62 Search Results of Find Prior Art Button in Google Patents

(Example: DE19801167C1)

When this button is clicked, prior arts related to the patent are automatically

extracted from patents, literatures, websites, books and other materials. This

function can be used for simplified invalidity searches.