ultrasonic flaw detection - rit scholar works
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Rochester Institute of TechnologyRIT Scholar Works
Theses Thesis/Dissertation Collections
4-1-1980
Ultrasonic flaw detectionWayne Buchar
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Recommended CitationBuchar, Wayne, "Ultrasonic flaw detection" (1980). Thesis. Rochester Institute of Technology. Accessed from
ULTRASONIC FLAW
DETECTION
by
Wayne A. Buchar
A thesis submitted in partial fulfillment of the requirements for the degree of Bachelor of Science in the School of Photographic Arts and Sciences in the
College of Graphic Arts and Photography of the Rochester Institute of Technology
April, 1980
Signature of the Author , ....... yy~y'n~.~u.cr~~ ............... . Photographic Science
and Instrumentation
John Carson Certified by ............................................. . Thesis Advisor
John Carson Accepted by .............................................. . Supervisor, Undergraduate Research
ULTRASONIC FLAW
DETECTION
by
Wayne A. Buchar
Submitted to the
Photographic Science and Instrumentation Division
in partial fulfillment of the requirements
for the Bachelor of Science degree
at the Rochester Institute of Technology
ABSTRACT
An ultrasonic microscope was designed and constructed
to detect surface flaw defects on materials which contain
natural discontinuities. The application of this flaw
detection system to via-fill defects of single layer
multiple layer ceramic substrates was considered. The
microscope was evaluated for its depth sensitivity and
resolution capabilities.
The results of the experiment are that the ultrasonic
system has repeatable depth sensitivities of better than
ten microns, and resolution capabilities on the order of
3.3 cycles per millimeter. The application of the flaw
detector to ceramic substrate via-fill defect inspection
was verified.
ACKNOWLEDGMENTS
I would like to thank John Carson for being my thesis
advisor- I greatly appreciate the efforts of Richard
Norman, who is responsible for the construction of the
aluminum lens and alignment collar- I would like to thank
Keramos Incorporated of Indiana for the piezoelectric
transducer used in this project. I would also like to
thank the Central Intelligence Agency for its generous
funding of this thesis.
11
TABLE OF CONTENTS
CHAPTER I
PAGE
la
A. INTRODUCTION
1. Problem
2. Past System Attempts
3. Aim
CHAPTER II .
1
3
4
5a
A. BODY *o
1. Background .
5
2 . Theory......7
3. Mechanical .
10
4 . Lens ...... 11
5. Button...... 15
6. Transducer .... 16
7. Mounting the Transducer -17
8. Water Supply18
9. Table 19
10. Test Samples 19
11. Transmitter -20
12. Receiver .... 24
111
TABLE OF CONTENTS (continued)
PAGE
13. Detection Circuit ..... 26
14. Calibration 27
B. RESULTS AND DISCUSSION 29
1. Focus 29
2. Depth Sensitivity 30
3. Resolution ....... 31
ENDNOTES FOR CHAPTER II 33
CHAPTER III 34a
A. SUMMARY AND CONCLUSIONS .... 34
LIST OF REFERENCES 36a
APPENDIX 38a
IV
LIST OF FIGURES
1. Wave Diagram ......... 9
2. Lens Construction ....... 12
3. Wave Propagation Under Lens ..... 3
4. Button 4
5. Transducer and Mount ....... 18
6. Basic Transmitter Circuit ..... 21
7. Filter Circuit 25
8. Through Focus Series ....... 29
9. The Ultrasonic Microscope ..... 39
10. The Ultrasonic Lens 40
11. Transmitted and Reflected Pulses .... 41
12. Water Supply Layout 41
13. Table 42
14. Test Sample One 43
15. Test Sample Two 43
16. Transmitter Circuit ....... 44
17. Receiver Circuit ........ 45
v
LIST OF FIGURES (continued)
18. Detection Circuit. ....... 46
19. Calibration Circuit ....... 47
20. 2220 Micrometers per Cycle, Resolution
Target at Threshold 1 48
21. 932 Micrometers per Cycle Resolution
Target at Threshold 2 (Ultrasonic) ... 49
22. 932 Micrometers per Cycle Resolution
Target (Optical) 49
23. 678 Micrometers per Cycle Resolution Target
at Threshold 2 (Ultrasonic) 50
24. 678 Micrometers per Cycle Resolution Target
(Optical) 50
25. 610 Micrometers per Cycle Resolution Target
at Threshold 2 (Ultrasonic). .... 51
26. 610 Micrometers per Cycle Resolution Target
(Optical) ......... 51
27. 398 Micrometers per Cycle Resolution Target
at Threshold 2 (Ultrasonic ..... 52
vi
LIST OF FIGURES (continued)
28. 398 Micrometers per Cycle Resolution Target
(Optical) 52
29. Scope Trace of Original Signal from the
Transmitter ........ 53
30. Scope Trace of Filtered, Amplified Signal. . 53
31. Scope Trace of Digital Signal 54
32. Scope Trace of Reference and Signal Pulses. . 54
33. Scope Trace of Transmitter Exciting Pulse . . 55
Vll
LIST OF TABLES
1. Depth Measurement Data ...... 30
2. The Lead Zirconate Titanate Transducer
K-350 (PVT5A) 38
Vlll
la
CHAPTER I
A. INTRODUCTION
1. Problem
In industry today there exists a growing need for
a device which could quickly and accurately detect
surface flaws on materials which contain small natural
discontinuities. One such example exists in the detec
tion of non-filled via-holes in a ceramic layer of a
multiple layer ceramic substrate.
A multiple layer ceramic substrate consists of
thirty layers of thin ceramic sheets assembled into a
package containing an integrated three-dimensional net
work of electrical current passageways.
A single multiple layer ceramic substrate can re
place thousands of conductive circuits used to transport
electrical signals between separate integrated circuit
chips. The manufacturing process to produce these three-
dimensional multiple layer ceramic substrates begins by
casting a ceramic material into large sheets about two
hundred and fifty microns thick. The large castings
are cut into one hundred and seventy millimeter square
sheets. These single ceramic sheets are referred to as
greensheets, as they are made of a ceramic material
which has not yet been kiln fired. Fifteen thousand,
one hundred and twenty-five micron diameter holes are
precisely punched into the greensheets at various pre
determined locations. A thin metal mask containing the
desired surface land-patterns for each individual
ceramic layer level type, is aligned over the greensheet.
A metallic past is spread over the mask, being forced
down through the mask, filling the punched via-holes,
and simultaneously producing a screened image of the
mask on the surface of the greensheet. The mask is
removed, and the greensheet is dried in an oven to
harden the paste. The greensheet is then sent to
inspection. When the thirty desired greensheet layers
for a particular multiple layer ceramic substrate are
produced and inspected, they are stacked, in proper
order, on top of one another. The assembled packages
are put under high pressure and placed into a kiln and
fired. The thirty layers cohese and the metallic paste
flows. The previously screened land patterns internal
to the substrate become the horizontal passageways for
the electrical current and the filled via-holes become
the vertical electrical connections between each previous
layer and the surfaces of the multiple layer ceramic
substrate. The integrated circuit chips are then sol
dered on top of the substrate.
The problem concerned with here arises at the in
spection step after screening. The bottom of the green
sheets must be inspected for via-hole fill. If a
via-hole is not full to specifications, that is, if the
metallic paste is farther than 40 microns from the bottom
of the greensheet, it must be repaired. If the via-hole
is not filled it will cause an open circuit in the
final multiple layer ceramic substrate. Presently,
inspection is done manually. The amount of personnel
required to perform this 100% inspection is tremendous,
and is a major contributing cost of the process. The
future of the multiple layer ceramic substrate demands
a mechanical via-defect detection system.
2. Past System Attempts
A system designed for detection of non-filled vias
by Intec Corporation of Connecticut consisted of a
scanning Helium-Neon laser, photomultiplier tube receiver,
and a single direction moving table. The laser was
mounted25
from normal incidence at a distance of18"
from the table below. The photomultiplier tube receiver
was mounted at a75
incident angle at a distance of 16".
The laser beam scanned in the x-direction while the
table moved in the y-direction below. The greensheet,
located on the table, bottom side up, was scanned in
this manner. It was theorized that if a non-filled via
was located under the incident laser beam, a reflection
would occur from the inside wall of the via. The photo
multiplier tube receiver would be triggered from the
reflection and the defect would be found. Due to the
properties of the ceramic substrate, little specular
reflection reached the photomultiplier tube. On the
contrary, specular reflections were received from the
metallic particles in the past of non-defective vias.
It was also found that via edge characteristics, when
the via holes were punched, produced undesirable
effects. The system failed the detection requirement
specifications necessary. The system described, at
maximum threshold, produced 96% detection of via hole
defects, with 50% overkill per sheet.
Aim
The application of non-destructive ultrasonic
defect detection as a means of detecting via-fill
defects in a ceramic substrate layer is considered
here. The scope of this thesis encompasses the design
and verification of a depth measuring ultrasonic
microscope and its application to the via-fill
detection problem.
5a
CHAPTER II
A . BODY
1. Background
Sound waves, perceivable by the average human ear,
range from about twenty to twenty-thousand cycles per
second. Sound waves of higher frequencies are referred
to as ultrasonic waves. Ultrasonic waves have been
produced as high as three gigihertz. This frequency
corresponds to a wavelength of 520 manometers in water,
slightly shorter than 550 manometers, the optical wave
length at the center of the visible spectrum (green
light).
Scientists in the past forty years have experi
mented with these ultrasonic waves. Many applications
such as sonar, flaw detection, and microscopy have been
developed .
In the above applications of ultrasonic waves, the
system set-ups are similar. They all make use of ultra
sonic waves on the pulse-echo mode. Basically the design
consists of a transmitter which produces an electrical
signal that causes a transducer to oscillate, producing
the ultrasonic waves. These waves propagate through the
medium in contact with the transducer until a boundary
is reached. "When a wave traveling through one material
impinges on a boundary between it and a second medium,
6
part of the energy travels forward as one wave through
the second medium while part is reflected back into the
first medium, usually with a phasechange"
(Ref. 1).
The amount of energy reflected is a function of density
and wave velocity at the time of intersection. This
characteristic is referred to as the specific acoustical
impedance of the medium. The amplitude of the reflected
wave is related to the incident wave by: (Ref. 2.)
R-i-
RQAr = -
R1+
R2
where: L =
p C,1 l i
R2=
P2C2
p= density of material
C =
velocity in medium
A = ratio between reflected and incidentr
amplitudes .
The energy of the wave is proportional to the ampli
tude squared, as long as the wave travels in the same
medium. (Ref. 2. )
Therefore ;
R_
RPll
"
op1c1
+p2c2
where: R = reflected energy
R0= incident energy
In the case of an air-solid boundary, almost 100% of the
incident energy is reflected.
The energy passing through the boundary proceeds
until another boundary is encountered. The reflected
wave propagates back through the medium in which it
came and impinges on the transducer. The transducer
oscillates producing an electric pulse. The transducer
at this time is coupled with the receiver. The time
between the pulse is sent out and the reflection received
is directly related to the thickness of the material in
which the wave travels. The wave travels the distance
twice, this must be considered. As the object is passed
under the transducer the reflections are electronically
deciphered and a location versus depth image is displayed.
2 . Theory
The system is designed in this thesis utilizes the
pulse-echo mode of ultrasonics, applied to surface flaw
detection. The set-up consists of a piezoelectric Lead
Zirconate Titanate ceramic transducer of diameter 0.5
centimeters and fundamental frequency of 4 megahertz.
The transducer is epoxied to the flat end of an aluminum
rod. The other end of the rod contains a hemispherical
lens surface. The lens surface is located over the
8
ceramic substrate and submerged in water. At first,
the transmitter is connected to the transducer. The
transmitter produces a minus 200 volt pulse across the
plates of the transducer causing the piezoelectric
transducer to resonate at its fundamental frequency
of 4 megahertz. The planar ultrasonic waves produced
propagate through the aluminum at a velocity of 5200
meters per second until they impinge upon the hemi
spherical lens surface. A reflection occurs at this
aluminum-water interface. The reflected wave travels
back to the transducer. At this time the transducer
is electronically coupled to the receiver. The ultra
sonic energy contained in these reflected waves causes
the transducer to oscillate, producing an electrical
differential. This voltage pulse produces a time
reference to which the final reflected signal is
compared. The portion of the ultrasonic energy contained
in the plane waves transmitted at the aluminum-water
boundary, is focused, detraction limited, to the surface
of the ceramic substrate.
"Because the velocity of sound is much greater in
aluminum than in water, an ideal lens with a single
sherical surface can be used without spherical
aberration."
(Ref. 2.)
Reflected spherical waves from the surface of the
ceramic and metallic paste are collected by the same
9
lens, converted back to planar waves, and are transmitted
back to the transducer, which is still connected to the
receiver.
Electronics separate the returning pulse from the
reference pulse. The time difference between these two
pulses is proportional to the distance the wave traveled
through the water beneath the lens, plus the return time
in the aluminum lens barrel. This time interval is con
verted to distance by originally setting a"zero"
depth
with the electronics of the detector circuit. Changes
in signal propagation time can then be referenced to this
zero setting, assuming that the returning pulse is re
flected within the depth of focus of the lens, and be
converted to absolute depth.
BRASS
TUBING
WATER
/TRANSDUCER
i \ULTASONIG
-WAVE5
5U&5TATE
Figure 1. Wave Diagram
10
The ultrasonic microscope is also designed to be
operated in a"go-no-go"
arrangement. The allowable
change in propagation time of the returning signal can
be set, and depth distances greater than this level will
cause the internal electronics to signal a defect. In
this way the surface of the ceramic substrate layer can
be scanned and defective vias can be located and
repaired.
Mechanical
"Most conventional ultrasonic systems use several
feet of shielded cable to connect the transducer and
relatedelectronics."
(Ref. 3.) "The capacitance of
the cable typically degrades the rise time and the
amplitude of the pulse across the transducer, and
degrades the bandwidth of the received echos. The
cable is often a source of noise, which decreases the
effective dynamic range of thereceiver."
(Ref. 4.)
In order to relieve these difficulties the com
ponent layout of the microscope is such that the
distance the excitation pulse travels through the coax
cable is less than one inch in length.
In order to obtain the desired set-up, the
receiver and transmitter were developed small enough
to fit in the focusing barrel of the microscope. The
detection circuit, however, is located in the head.
11
The amplified signals travel from the receiver to the
detection circuit through shielded cable.
The body of the microscope was constructed from
1/4 inch Plexiglass and all joints were connected with
an acrylic solvent. Plexiglass was chosen as it is
non-conductive (electrical), waterproof, and has a low
specific acoustical resistance. The microscope was
attached to a sheet of particle-board, at its base.
Focusing adjustment of the ultrasonic spherical waves
is accomplished by the fine focusing mechanism attached
to the focusing barrel of the ultrasonic microscope.
(_See Appendix, Figure 9.)
Lens
The ultrasonic lens was constructed from an aluminum
rod of radius one inch. The rod was turned down on a
machine lathe to a diameter of 20 millimeters. The rod
was then cut to 12.5 millimeters in length. One end of
the cylinder was turned flat while the corners were
beveled on the other end leaving a 65 millimeter plateau
in the center of the cylinder.
12
P/ //
Lf STEEL
\ /BALI-// PRCS5
t^ ;
V )
Figure 2. Lens Construction
The concave hemispherical lens surface was created
by pressing a steel ball of 3/8 inch diameter into the
surface of the plateau. Alignment of the steel ball
was obtained by an alignment collar- The collar was an
aluminum disk into which a 1/4 inch diameter hole was
drilled. The back end of the disk had a recessed center
of diameter slightly greater than the diameter of the
aluminum lens barrel. This indentation allowed the
collar to be positioned over the end of the aluminum
13
barrel. The ball was then positioned in the center of
the collar, in the hole provided. This allowed slight
contact between the steel ball and the lens barrel
beneath. The assembly was then placed in a press. The
ball was forced into the top of the lens barrel slightly.
The collar was then removed, and the steel ball, placed
in the pre-formed indentation, was pressed the remainder
of the way into the aluminum producing the hemispherical
lens surface (see Appendix, Figure 10).
The focal length of an ultrasonic lens is given by
(Ref. 3. )
f = CR0/(l-y)][l- |y2(l-cos aQ)]
where : Rn= radius of curvature
=.476 cm.
Vw 1440nnn
=
5200=
-27? C'm-
AIj
a.= half angle
=.737 cm.
the focal length of the described lens becomes:
f =[.476/l-.277][l- |(.277)2(l-cos(.737)]
f =. 65 cm.
14
The f -number of the lens is given by:
.65
.65
= 1
where d is the diameter of the lens. The length of the
the aluminum lens barrel was determined by realizing
that multiple-internal reflections would exist from the
lens surface and the transducer. The returning plane
wave signal from the ceramic must reach the transducer
in absence of such reflections (see Appendix, Figure 11)
The beveled edge on the bottom of the lens barrel was
designed to reflect unwanted scattered ultrasonic
reflections away from the lens surface (see Figure 3).
Figure 3. Wave Propagation Under Lens.
15
5. Button
The button is the device which supports the ultra
sonic lens assembly and provides isolation between stray
ultrasonic radiation and the sensitive electronics of
the receiver. The button consists of a hard rubber
cylinder (a rubber stopper was used) of radius 5 centi
meters and of length 4 centimeters. A 5 millimeter
diameter hole was drilled through the center of the
rubber cylinder to allow passage of the coax connecting
cable. A hole of 18 millimeters in diameter and 20 mill
imeters deep was cut into the bottom of the rubber button
to accept the lens and transducer assembly (see Figure 4),
rubber
BUTTOM
LENS
Figure 4. Button,
16
6. Transducer
The transducer chosen was a Lead Zirconate Titanate
piezoelectric crystal, type PVT5A. The crystal was
chosen for its wide range of applications and its avail
ability (see Appendix, Table 2). The fundamental
frequency of 4 megahertz was chosen because many
computer clock crystals oscillate at this frequency,
an important consideration had another type of trans
mitter, other than the one chosen, been used. The four-
megahertz frequency also corresponds to a wavelength of
360 micrometers in water. "A 375 megahertz scanning
acoustical microscope built by Rolf D. Weglein of Hughes
Research Laboratories has a measured resolution of 1.67
micrometers."
(Ref. 5.) This value corresponds to a
spatial frequency of 3340 cycles per millimeter, the
wavelength of the 375 megahertz waves in water- The
set-up described in this thesis is very similar to Rolf
Weglein'
s, therefore defects of 180 micrometers in size
should be able to be detected with this system. Although
the diameter of the via holes in the ceramic substrate
layer are smaller than 180 micrometers (125 micrometers),
the application of ultrasonics to the problem of via-
hole defect detection can still be shown. A transducer
of higher frequency, six megahertz, would be necessary
to resolve the via holes.
17
7. Mounting the Transducer
The piezoelectric transducer was obtained without
the leads attached. The transducer surfaces, which were
plated by Keramos Incorporated of Indiana, with silver,
were first polished with a very fine abrasive. The
transducer was attached to the back of the lens barrel
using an epoxy resin. The resin was mixed with a fine
aluminum powder. The mixture was then applied to the
center of the flat end of the lens barrel. The amuminum
powder was used not only to help match the acoustical
impedance of the transducer to that of the lens, but
also to act as a conduction medium between the bottom
plate of the transducer and the lens surface.
The ground lead of the coax connecting cable was
connected to the outside of the lens barrel. The signal
lead, consisting of a short length of fine stranded
wire, was carefully tack-soldered to the top plate of
the transducer. The other end of the signal lead was
soldered to the center wire of the coax connecting cable.
A strain relief line was attached between the lens and
the coax cable to prevent damage to the transducer -
The lens-transducer assembly was then inserted into the
bottom of the button and tack epoxied. (See Figure 5.)
18
GROUNDLEAD
RELIEF LINE
t- N\"T RAW5DUCER
LENS
Figure 5. Transducer and Mount
8. Water Supply
Water is necessary between the hemispherical lens
surface and the ceramic substrate as described previously.
Water is transported to the lens and object via four
brass tubing ducts located between the lens and the
sample. The 5/32 inch brass tubing jets pass through
the head of the microscope to the top where they are
connected to a four-terminal fishtank air-valve,
attached to the body of the microscope. The valve
controls the amount of water flow of each individual
jet on the sample. Water is fed to the valve input
19
by gravity from a basin located above the microscope.
(See Appendix, Figure 12.)
9. Table
The table was constructed from clear 1/4 inch
thick Plexiglass. The table consists of two main
sections, a large stationary rectangular tray and a
smaller square tray. The smaller tray slides, in one
direction, within the rectangular tray. A micrometer
position indicator is attached to the moving tray.
The ceramic substrate layer can be placed in the small
tray and can thus be scanned, in one direction, under
the lens located above. (See Appendix, Figure 13.)
10. Test Samples
Samples were made to determine the depth measure
ment accuracy, repeatability, and resolution, of the
ultrasonic microscope.
The first sample consisted of an array of various
thicknesses of metal strips arranged on a stainless
steel base (see Appendix, Table 14). The thicknesses
of these materials were previously known. Optical
microscope depth measurement readings were also conducted
on these samples.
The second sample, to test the resolution of the
microscope, consisted of a three-dimensional bar target
20
of varying spatial frequency (see Appendix, Figure 15).
The bars of the resolution target were cut from aluminum
tape 125 microns thick. The bars, of various width,
were carefully positioned under an optical microscope,
on a stainless steel base. The spatial frequencies of
the bars were optically measured. Plots of height versus
location, of the bars, were generated (see Appendix,
Figures 20-28).
11. Transmitter
"There are two different methods commonly used for
exciting ultrasonic transducers in the pulse echo mode.
The first involves the generation of a medium voltage,
pulsed radio frequency sinusoid using a gated oscillator,
and the second involves the generation of a high voltage
spike by a sudden discharge from a capacitor charged
to several hundredvolts."
(Ref. 6.) The second method,
referred to as shock excitation, was the method used.
The basic circuit is shown in Figure 6. (See following
page. )
21
Figure 6. Basic transmitter Circuit.
The circuit consists of a D.C. voltage source V,
s
storage capacitor C, damping resistor R, and silicon
controlled rectifier SCR1. Assuming SCRl is initally
open, capacitor C is charged to supply voltage Vs
through resistor R . SCRl is triggered at its gate bys
an input pulse allowing C to discharge through SCI to
ground potential. A pulse voltage then occurs across
the damping resistor R. When the charge in capacitor
C has dissipated, SCRl turns off as the current through
it has dropped below the necessary holding current.
The pulse circuit is initiated by an input pulse
at the gate of the SCR. The SCR experiences a finite
turn-on time before its anode reaches ground potential.
22
The voltage across the damping resistor is given by:
-V -t/RC
VQ= -S RC(l-e ).
on
As can be seen from the above equation, as the turn-on
time of the SCR increases the output voltage V"n decreases.
"From the frequency domain viewpoint, the shorter the
turn-on time of the SCR, the more higher frequencies
are contained in the falling edge of the output pulse
voltage and the easier it is to excite proportionally
higher frequencytransducers."
(Ref. 7.) One of the
features of using an SCR circuit as described here is
that there is no need for any external circuit to turn
off the SCR. The SCR is designed such that it turns
off when the magnitude of the anode current falls
below the required holding current I., thus:
V
IT< Ih
s
where I, is the SCR holding current. It is also desirableh
in pulse-echo systems to have the damping resistor R
small so that the energy of the pulse is dissipated
quickly to allow echos from close flaws to be received.
"The lowest value of damping resistance depends essen
tially on the maximum pulse current that the SCR can
deliver." (Ref. 8.) Therefore:
23
V
R .
=*
min Imax
The average electrical power delivered to the transducer
is given by:
1 9P = CV f^AVE 2 s
1
where f is the pulse repetition frequency of the
transmitter.
The transmitter circuit selected was designed by
J. G. Okyere and A. J. Cousin of the University of
Toronto (see Appendix, Figure 16). The circuit basically
consists of a 555 integrated circuit timer running in an
astable mode at a repetition rate of 1000 cycles per
second, making up the rate generator. The inverter
(CD4049) and power transistor (2N2270) drive the dual
secondary transformer, making up the pulse amplifier.
The two separate secondary windings provide isolation
between the gates of the two series connected SCR's .
"In order to obtain minimum turn-on time of the series
connected SCR's, it is desirable not only to trigger
the gates with a strong drive but also to produce a
triggering pulse with a fast risetime."
(Ref. 9.)
"To accomplish this, the slowly rising pulse produced
at the secondary of the pulse transformer is shaped to
give a fast rise-time using a pulse sharpening circuit
first introduced by GeneralElectric."
(Ref. 10.)
24
The SCR 2N4203 was used because of its high peak
blocking voltage (700v), its fast turn-on time (100ns)
and its high current switching capability (200 Amps).
The voltage across the damping resistor of 33 ohms
becomes:
_200
v-6 -100/(33)(.012E-6)
V0=
TM(ns)(33)(.012E
(1-e
VQ=-177 volts.
By selecting one of four damping resistors, output
pulses of different amplitude and duration can be
produced.
12. Receiver
The receiver circuit operates continuously when the
microscope is turned on (see Appendix, Figure 17). The
return (echo) signals are converted to electrical signals
by the piezoelectric transducer. The receiver is
directly coupled to the transducer at all times. Un
fortunately, the allowable input base voltage of trans
istor T, is only a few volts, and thus some kind of
protection must be provided against the transmitter
200 volt exciting pulse. Diodes Dl and D2 limit the
amplitude of this "mainbang"
spike and prevent damage
to the receiver. The circuits consisting of Tl, T2 and
T3 amplify the 4 megahertz signal and filter out all
25
other signals. Transistor T4 and associated components
also serve to amplify the 4 megahertz signal, but the
amount of amplification is determined by the setting of
sensitivity control Rl. The amplification of the
receiver is also varied by the input D.C. bias voltage.
The range of the variable voltage regulated by integrated
circuit 723 and resistor R2, is from 2-7.3 volts D.C.
Filtration of the 4-megahertz input signal of
unwanted signals is accomplished by using two pass band
filters, Fl and F2 . The basic circuit is shown in
Figure 7.
L G
o--^m
r\U>
SK
O- 1 1 r\W 1 : w
Figure 7. Filter Circuit.
26
Series resonance is established at the fundamental
frequency of 4 megahertz between inductor L and
capacitor C. At frequencies higher or lower than
resonance, the impedance of the L-C combination increases
over that of R, resulting in a voltage drop across R.
Only the 4 megahertz signal passes to the next ampli
fication stage.
13. Detection Circuit
The amplified 4 megahertz signals are sent from
the receiver to the input of the detector circuit (see
Appendix, Figure 18). The analog signal is converted to
digital by Schmitt trigger IC2. A threshold is set so
that only the reference signal, and the ultrasonic
signals reflected from the ceramic substrate, are passed.
Noise from the original transmitter pulse is removed by
the logical AND performed by IC3A between the output of
the Schmitt trigger and the output pulse from IC1. IC1
is triggered by the astable 555 integrated circuit timer
of the transmitter. The output of IC3A is fed into
monostable multivibrator IC6, and converted into two
individual pulses. These pulses are separated by IC3
and IC5 resulting in only the reflected signal pulse
being outputted by IC3. This signal is further sharpened
by IC2 and is fed into IC4B. At the same time the
inverted output of IC5 is logically AND with the output
27
of IC6 resulting in only the reference pulse at the out
put of IC4A.
The output of IC4A, or reference pulse, then
triggers IC7 producing a pulse of variable time dura
tion. This output pulse is logically AND with the signal
pulse from IC2 at IC4B. If an output pulse results, IC8
produces a pulse of one millisecond duration. The high
state produced by IC8 causes light emitting diode LI to
glow.
If the result of the AND performed at IC4B does
not output a pulse, IC8 will not be triggered and LI
will not glow. This will be an indication that the
signal pulse occurred, after the output of IC7 went low.
The length of the pulse duration of IC7 can be increased
by increasing the resistance of VRl . This is done until
LI just begins to glow.
14. Calibration
Calibration of the ultrasonic microscope to
absolute depth distances is accomplished with selector
range switch VR2, and variable resistor VRl. As men
tioned in the detection analysis section, monostable
multivibrator IC7 produces a pulse of variable time
duration related to the capacitance across pins 10 and
11, and variable resistance VRl. To obtain precise
and repeatable depth measurements, the change in pulse
28
duration of IC7 by adjusting VRl should be small. To
allow measurements to be made over a large range,
selector switch VR2 is coupled in series with potentio
meter VRl. Thus, VR2 becomes a fine adjustment at that
range. The three ranges available can also be adjusted
by potentiometers VR3, VR4 and VR5 (see Appendix, Fig
ure 19). To obtain a depth measurement the microscope
is focused by setting the zero on the top surface of
the substrate layer. When in focus, L.E.D., LI glows.
A change in depth is indicated when LI fails to glow.
The resistance of variable resistor VRl is increased
until LI just glows. If L2 continues to remain off,
the selector switch VR2 is rotated to position two.
VRl is again rotated until LI glows. This procedure
is continued, if necessary, until the limit of the
instrument is reached. This will occur when the
electrical signal falls below the threshold set by the
detection circuit, due to the finite depth of focus of
the microscope. The variable resistance dial of VRl is
calibrated in micrometers. When the L.E.D. begins to
glow, a reading of depth is taken from the position of
VRl, and range selector switch VR2 . The dials of VRl
and VR2 were calibrated using an oscilloscope realizing
that the velocity of sound in water is 1440 meters per
second.
29
B. RESULTS AND DISCUSSION
Focus
The signal to noise ratio was small for some
substances such as plastics, wood and rubber. This
is of no surprise as the amount of reflection at a
boundary is proportional to the difference in the
sound velocities at the interface. Ceramic, similar
to that of ceramic substrate layers, produces very
low signal to noise ratio, about 1.5 to 1. The
metallic paste, however, has similar reflection
properties to that of aluminum, about 5 to 1. The
signal to noise ratio is also a function of focus.
The signal to noise ratio of an ultrasonic wave
reflecting from a stainless steel boundary, as a
function of propagation time is shown in Figure 8.
Figure 8. Through Focus Series
30
The threshold of the microscope was set at about
the 4 to 2, signal to noise, level, utilizing a depth
of focus of about 1.5 microseconds, corresponding to
a depth distance of two millimeters.
2. Depth Sensitivity
Depth measurements from the first sample are
shown in Table 1.
TABLE 1
Depth Measurement Data
1
Trial
2 3 X S Known
OpticallyMeasured
205 190 200 198.3 7.6 203 193.0
140 135 140 138.3 2.9 152 177.8
115 115 120 116.7 2.9 127 121.2
100 90 90 93.3 5.8 102 109.2
75 75 75 75.0 0.0 76 78.3
60 60 65 61.7 2.9 38 50.8
The repeatability of the microscope in measuring
depth was very good. Accurate samples, however, were
a problem. The exact heights of the different levels
were difficult to measure optically. The microscope
was, however, able to measure 40 to 125 micrometer
31
depths with repeatability error less than six percent,
required for defect detection on a ceramic substrate
layer .
3. Resolution
The resolution of the system as described was no
better than 0.5 cycles per millimeter (see Appendix,
Figure 20). This value was extremely lower than the
2.8 cycles per millimeter predicted. This difference
was attributed to the threshold setting of the
detection circuit. It was found that the amplitude
of the returning signal fell greatly when the edge of
a bar was encountered. The amplitude of the resulting
signal was too low to trigger the detection circuit.
To relieve this situation the threshold level was
lowered. Unwanted noise from internal reflections
in the lens broke the new threshold level, upsetting
the present detection curcuit . The resolution of the
microscope, however, increased drastically. Measure
ments at this threshold level were done directly from
the oscilloscope cathode ray tube. Bars of spatial
frequency as high as 2.5 cycles per millimeter were
resolved (see Appendix, Tables 21 - 24). The detection
circuit can easily be modified to remove the unwanted
noise (see Appendix, Figure 18). The microscope could
then be operated, independent of the oscilloscope, at
32
this new threshold level. Comparisons between the
optical microscope measurements, and the ultrasonic
microscope measurements, reveal many differences
(see Appendix, Figures 21-28). It should be
pointed out that two totally different wavelengths,
and wave types, are at work here.
33
ENDNOTES FOR CHAPTER II
1. Carlin, Ultrasonics (N.Y., N.Y., 1960), pp. 9.
2, 5. Maugh, Science, vol. 201, 2220 (1978).
3. Baum, Tr . Am. Acad. Opthth. Otalaryn vol. 69,
943, (1965).
4. Myers, Thumin, Feldman, deSantis, Lupo,
Ultrasonics, Mar., 87 (1972).
6, 7, 8. Okyere, Cousin, Ultrasonics, Mar., 81-82,(1979).
9, 10. SCR Manual, 5th Ed. (Syracuse, N.Y., 1972).
34a
CHAPTER III
34
A. SUMMARY AND CONCLUSIONS
The ultrasonic microscope system described in this
thesis is capable of accurately and repeatably detecting
depth differences of 25 to 2000 micrometers. The system
possesses resolution capabilities of up to 2.5 cycles per
millimeter, corresponding to the wavelength of the ultra
sound in the medium in which the waves propagate. Appli
cation of ultrasonic flaw detection as a means of
detecting surface flaw defects has been shown.
Defects in ceramic substrate layers, caused by non
filled vias can be found. Considerations must be made,
however, if this instrument is to be directly applied to
multiple layer ceramic substrate manufacture. Due to the
characteristics of the ceramic, little reflection occurs
at the water-ceramic interface. A strong reflection does
occur from the metallic paste in the vias. The system
described, after being modified to operate at 6 megahertz,
could be operated in the"go-no-go"
mode. Signals would
only be detected from the vias. If a via depth should be
below the specified 40 micrometer distance, the returning
signal would be detected, and the defect would be found.
A means of calibration check would have to be considered
to assure that the reference setting is correct in
35
relation to the ceramic substrate height. Many methods
could be utilized to accomplish this. A method of two-
dimensional scanning would also have to be developed.
The application of ultrasonics to via-fill defect
detection on a single ceramic layer of a multiple layer
ceramic substrate does exist. The ultimate ultrasonic
tool, making use of those considerations mentioned,
could be developed, and the via-fill detection problem,
of multiple layer ceramic substrate manufacturing, solved.
36a
LIST OF REFERENCES
36
LIST OF REFERENCES
REF. #
20 Beaver, W., Dameron,D.
,and Macovski, IEEE on
Sonics and Ultrasonics. Su-24. 4 (1977)235-236.
2 Carlin, Ultrasonics. New York: McGraw-Hill Pub.
Co., Inc. (1960).
21 Chart Recording Depth Sounder. Heath Company,Benton Harbor, Mich. (1976).
7 Cheney, S. P., Lees, S., Gerhard, Jr., Kranx, P. R.,
Ultrasonics. 11 (1973) 111-113.
15 Devey, P. Wells. Science America. 238 (1978)98-104.
13 Glickson. Basic Ultrasonics. J. F. Rider, Publ,Inc.
,N.Y. (1960).
19 Kossoff, G., Robinson, D., Garrett, W.
J. Acoust. Soc. Am. 44.5 (1968) 1310-1318.
11 Mason. Piezoelectric Crystals and Their
Application to Ultrasonics. D. Van Nostrand
Co .,Inc .
18 Mattiat, 0. J. Acoust. Soc Am. 25.2 (1953) 291-
296.
1 Maugh, T. H.,III. Science. 201 (1978) 2220-1113.
12 Myers, G. H., Thumin, A., Feldman, S., deSantis, G.
,
Lupo, F. T. Ultrasonics. 20 (1972) 87-89.
10 Olson. Acoustical Engineering. Princeton, N.J..:
D. Van Nostrand Co., Inc., (1964).
4 Okyere, J. G., Cousin, A. J. Ultrasonics . 17
(1979) 81-84.
37
REF. #
3, 5 Penttinen, A., Luukkala, M. J. Phys . D. : Appl.
Phys., 9 (1976) 2547-57.
8, Luukkala, M. Ultrasonics. 15 (1977)
205-210.
9 Quate, C. F., Lemons, R. A. Science. 188 (1975)905-911.
16. Scientific American. 241 (1979) 62-70,
14 Seti, W. W. Acoustics. New York, N.Y. : McGraw^
Hill Book Pub. Co., Inc. (1971).
17 Smith, W. M. R., Awojobi, A. 0. Ultrasonics.
Jan. (1979) 20-26.
22 Turabian, K. A Manual for Writers. Chicago, 111.
University of Chicago Press, (1973).
12 Wilson. An Introduction to Scientific Research.
New York, N.Y. : McGraw-Hill Book Co,, Inc.,(1952).
38a
APPENDIX
38
APPENDIX
TABLE 2
The Lead Zirconate Titanate Transducer
K-350 (PVT5A)
Physical Properties
Density (g.cc) 7.7
Curie Temp (C) 360
Mechanical Q 75
Dielectric Properties
Dielectric Constant 1700
Piezoelectric Properties
K31 35%
K33 70%
K15 65%
D31170 (x 20~12m/v)
D33350 (x 10~12m/v)
D1C- 575 (x 10~12m/v)
G01 11 (x 10~3v.m/NEW)'31
'33
}15
G0 25 (x 10 3v.m/NEW)
G 37 (x 10_3v.m/NEW)
APPENDIX
39
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41
VOLTA6E
SPIKE
REFERENCE
PULSE
INTERNA-L
REFLECTIONS
SIGNAL
PULSE
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Figure 11. Transmitted and Reflected Pulses,
I.EN3
Figure 12. Water Supply Layout
APPENDIX
42
CD
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43
APPENDIX
Figure 14. Test Sample One.
932/"^/ctcL6
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APPENDIX
44
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45
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46
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47
APPENDIX
Figure 19. Calibration Circuit
48
APPENDIX
r\pA
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M 1 1
0
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Figure 20. 2220 Micrometers per Cycle,
Resolution Target at Threshold 1.
49
APPENDIX
Figure 21. 932 Micrometers per Cycle Resolution
Target at Threshold 2 (Ultrasonic)
Figure 22. 932 Micrometers per Cycle
Resolution Target (Optical)
50
APPENDIX
110+
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Figure 23. 678 Micrometers per Cycle Resolution
Target at Threshold 2 (Ultrasonic)
Figure 24. 678 Micrometers per Cycle
Resolution Target (Optical)
51
APPENDIX
Figure 25. 610 Micrometers per Cycle Resolution
Target at Threshold 2 (Ultrasonic)
Figure 26. 610 Micrometers per Cycle
Resolution Target (Optical)
52
APPENDIX
45o miCRomeTeo-s P6R Division
Figure 27. 398 Micrometers per Cycle Resolution
Target at Threshold 2 (Ultrasonic)
Figure 28, 398 Micrometers per Cycle
Resolution Target (Optical)
.2S
pen
DiV.
53
APPENDIX
REFERENCE /SIGNAL
flEar?
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in
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Figure 29. Scope Trace of Original Signal from
the Transducer.
REFERENCb /5IGNAL
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T^BSSSESTl
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Figure 30. Scope Trace of Filtered,
Amplified Signal.
54
APPENDIX
NoisE REFERENCE S16NAL
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2^5 / DlV.
Figure 31. Scope Trace of Digital Signal
REFERENCE SiSA'AL
2^5/DW.
Figure 32. Scope Trace of Reference
and Signal Pulses.
55
APPENDIX
o-
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m
DiV.
50On5/D\V.
Figure 33. Scope Trace of Transmitter
Exciting Pulse.