TestStation Software and Hardware Release Information

Software Versions 5.6.1, 5.7.0, and 5.8.0

Active Life End Of LifeLimited SupportFull Support

Last Production

No Software Enhancements

Reasonable Effort

SSASoftware Support Agreement

Product Support Life Cycle

Product Support Life Cycle Map

TestStation TSM

Stinger

TestStation 12X

Accelerate

TestStation 8x

228Xi Series

228Xe w/ ICA

228Xe Series

228X(VMS and Unix based systems)

TestStation(Standard,

LH, LX and TSR)

TestStation/228X Support Status Effective Q1, 2005

Notes:

Release 5.8.0 was the last software version that supports Combo based TestStation 8x and 2228x i-Series systems.

Release 5.7.0 was the last software release that supports non-ICA based 228X testers

Continuous Product Enhancements...

• Valuable Features have been added to the TestStation software in the last three Releases

• Choice of GR228X Monitor Pages or new Navigate Development environment

• Some older GR228X tester models are no longer supported

– Refer to TestStation Product Support Status Document on the web

– PC- Upgrade and Trade-In Programs Available

TestStation Software Release Information

Software Version 5.6.1

TestStation Version 4.6.1 / 5.6.1

• Features-At-A Glance – Optional Navigate Development Environment

– Integrated D2B/Alchemist CAD Preparation Software

– Test Quality Tools

– ICA Auto-Calibration

– New modeling tools and model updates

– Over 125 miscellaneous software improvements

Released in March of 2002:

Optional Navigate Development Environment

• Intuitive User Interfaces

• Fixture, Product, and Message Databases

• Node-Based Test Program Development

• Test Project Management Features

• Automatic Conversion Software

Integrated D2B CAD Preparation

• CAD Translators

• Board and Schematic Viewers

• SmartBOM Importer

• Automatic Component and Package Identification

• Powerful Data Editor

• Fast and Accurate Probe Placement Solution

• Test Equipment File Exporters

Test Quality Toolset• Test Quality Tools

– Autodebug - Automatically Adjust Test Parameters

– Adjust Limits - Automatically Shift and Widen Test Limits

– Analyze (Allfault) - Record Analog Statistics and Digital Fault Information

– Throughput Optimizer - Adjust Test Parameters and Runtime Settings to Decrease Test Time

• Customizable based on user defined quality criteria– User specifies metrics for both accuracy and

stability per test type

AutoDebug Test Quality Tool

• Selects Solution Based On Quality Of Results

• Debugs Passing as well as Failing Components

• New Guarding Algorithm

• Intelligence Added To Command File Format

• Optimized Speed

Adjust Limits Test Quality Tool

• Automatically Adjusts Test Limits according to Test Quality Criteria

Analyze Test Quality Tool

• Analyzes Test Program Quality

• Reports Analog and Digital Fault Coverage

• Reports measurement Stability and Accuracy

• Identifies measurements that Pass when UUT is Lifted

• Identifies tests that require excessive Backdrive Currents

Throughput Optimizer Test Quality Tool

• Optimizes Throughput

• Reduces sample counts

• Reduces settling time

• Selects fast Shorts Test

• Reduces program Delays

• Minimizes Autoranging

Test Quality Tools - Example Results

PCB Statistics

• Components: 3034

Nets: 4027

Technology: 6 different power voltages (5V,

2.5V, 3V, 5V, 12V, 48V DC)

6 DC-DC Regulators

54 Digital Logic components

965 Resistors, 332 Resistor Packs, 1578 Capacitors, 11 Inductors

Results

• Pre-Adjust Limits

– 91.3% Passing

– 08.6% Marginal

– 00.2% Failing

• Pre-Optimizer

– 51.71 seconds

• Post-Adjust Limits

– 98.5% Passing

– 01.5% Marginal

• Post-Optimizer

– 39.32 seconds

(24% time savings)

AutoFLASH Tool

Automatically generates Hybrid Test Models to program and test FLASH devices

New Device Library Models

NS16C552

PC16C552

93C46

93C56

PCF8574

PCF8574A

PCF8594

TC59S1616AFT

MAX303

82371AB

82371EB

82443GX

82443MX

82555

82558A

82801BA

82810

82441

82442

82093

TDK78Q2120

IntelNational Semiconductor

Philips

Toshiba

MaximTDK

AM29DL162DB

AM29DL162DT

AM29DL163DB

AM29DL163DT

AM29DL164DB

AM29DL164DT

AM29DL322DB

AM29DL322DT

AM29DL323DB

AM29DL323DT

AM29LV017D

28F004S3

28F004S5

28F008S3

28F320B3TA

28F320C3TA

AT45DB041

AT49LV002

AM29DL324DB

AM29DS323DT

AM29F010B

AM29F016B

AM29F016D

AM29F017D

AM29F032B

AM29F080B

AM29F800BB

AM29F800BT

AM29LV400B

28F320J5

28F160BXB

28F160FXB

28F160BXT

28F160FXT

AM29LV116DB

AM29LV116DT

AM29LV160DB

AM29LV160DT

AM29F002

AM29F010

AM29F016

AM29F040B

AM29DL163

28F160SX

28F016SX

AMD

Intel

Atmel

TestStation Software Release Information

Software Version 5.7.0

GRNavigate Release 4.7.0 / 5.7.0

• Features-At-A Glance – Support for TestStation LH Tester Models

– Retest-On-Fail Runtime Feature

– Automatic Runtime Overvoltage Detection

– Automatic ICA Calibration

– Single Fault Coverage Report Tool

– Support for Windows XP Operating System

– Over 250 miscellaneous software improvements

Released in January of 2003:

Note: 4.7.0/5.7.0 is the last TestStation software release that supports non-ICA testers!

– 20-40% lower price than equivalent TestStation 12X/LX tester models

– 52% smaller footprint

– Scalable test features

– Up to 4096 test points

– Test program and fixture compatible with most GR228X and TestStation 12X tester models

– Combines HSC, MTG, CST, DSM, and FTI boards on single System Control Card

– Dedicated Accessory board slot for CFB, DSM, or AFTM

TestStation LH - New for 2003

A new member of Teradyne’s family of In-Circuit Tester products...

• Increased Memory Behind the Pin

– Support for 64K unique test vectors per Burst in both low-speed and high-speed test modes

• Supports Windows XP Operating System

– Windows NT or XP Operating Systems are supported

• Mandarin User Interface option – Increased convenience for Chinese Production Test Operators

• Enhanced Programming Language

– System Frequency Test Module programmable using standard test language commands

TestStation LH Software Enhancements

Retest-On-Fail Feature

• Automatically re-tests components if they fail

• Can be applied globally or to individual tests using RTOF command

• Option to cycle fixture before re-test

• Option to capture Retest-On-Fail statistics

• Helps eliminate false failures due to intermittent fixture contact or marginal tests

Automatic Overvoltage Detection Option

• Automatically detects On-Board Voltages that could damage tester pin electronics

• Protects tester pin boards and reduces repair costs

• Safe Voltage range for non-UltraPin testers is -6V to +10V

• Safe Voltage range for UltraPin testers is -2.5V to +5.5V

Automatic ICA Calibration

• Automatically calibrates ICA when ambient temperature changes by more than 10 degrees C

• Reduces measurement drift due to environmental conditions

• Improves system to system measurement compatibility

• Option set by Running 228Xcfg.exe

• Test system must contain MXI-2 Card

Single Fault Coverage Report Generator

• Fault coverage information stored in database

• Contains Combined Fault coverage information from ATG, BSCAN, ALLFAULT, and Vectorless tests

• Users can customize report content

• Information can be viewed with HTML browser

TestStation Software Release Information

Software Version 5.8.0

TestStation Version 4.8.0 / 5.8.0

• Features-At-A Glance– New TestStation LX Tester Model – Support for D2B Version 3.2– Program Prep Support for SafeTest Features– Improved Vectorless Test Capabilities– New Test Program # INCLUDE Keyword– Support for Intel® Socket Test Technology Solution– Enhanced Power and Capacitor Discharge Routines– New Hybrid Test Models– Support for new TestStation Licenses– New TestStation LH Fixture Converters and Adapters

Released in May of 2004:

Note: 4.8.0/5.8.0 is the last TestStation software release that supports non-UltraPin Combo-based testers!

– New mechanical frame and smaller footprint

– Up to 7680 test points

– Test program and fixture compatible with all existing GR228X and TestStation12X tester models

– Consolidated System Controller

– New Frequency Test Instrument

– Shipments begin July 2004

– Current TestStation 12X frame effectively discontinued in July 2004

New TestStation LX for 2004

Updated Design for TS12X and TS12XL Tester Models...

Ultra Pin 124128 pins2:8 Mux

Ultra Pin 124128 pins2:8 Mux

Ultra Pin 121128 pins1:1 All Real

Ultra Pin 121128 pins1:1 All Real

Ultra Pin 128L256 pins2:8 - 2:16 Mux

Ultra Pin 128L256 pins2:8 - 2:16 Mux

Ultra Pin 124LX256 pins2:4 - 2:8 Mux

Ultra Pin 124LX256 pins2:4 - 2:8 Mux

Ultra Pin 128128 pins2:16 Mux

Ultra Pin 128128 pins2:16 Mux

TestStation LX30 Card Chassis

3840 pins TS128

TS 124

TS 121

7680 pins TS 128L

TS 124L

TestStation LX30 Card Chassis

3840 pins TS128

TS 124

TS 121

7680 pins TS 128L

TS 124L

Pin Card OptionsDifferent Multiplexing Options to match your product technology requirements, development preferences, and test equipment budget...

TestStation UltraPin Product FamilyTesStation LH

16 Card Chassis

2048 pins TSLH 128

TSLH 124

TSLH 121

4096 pins TSLH 128L

TSLH 124L

TesStation LH16 Card Chassis

2048 pins TSLH 128

TSLH 124

TSLH 121

4096 pins TSLH 128L

TSLH 124L

• Latest Windows XP Operating System

– Windows NT Operating System is still supported

• Consolidated System Controller– Five board control set (HSC, MTG, CST, DSM, and FTI) reduced to a single System Control

Card

– Same System Controller as used in the TestStation LH

• New System/Frequency Time Measurement Instrument– Programmable using standard test language commands

– Lower cost alternative to AFTM and FTI instruments

• Smaller Footprint and Ergonomic Design– 66” Width x 44.5” Depth x 33.25” Height

– Faster Repair and Maintenance

• Dedicated Accessory Slot– Maintain pin capacity when adding optional CFB, AFTM, or DSM instruments

• Increased Memory Behind the Pin

– Supports 64K unique test vectors in both low-speed and high-speed test modes

New TestStation LX Enhancements

• Same 3840 pin Standard and 7680 pin Large Receiver Interfaces

– Accepts all small, half-size, standard, and large GR228X and TestStation fixture kits

• Same System Controller as used on TestStation LH– Proven compatible test execution

– Simplified support and spares

• Same UltraPin D/S Boards as used on TestStation LH and 12X– No fixture or program changes required

• Same ICA (In-Circuit Analog) Instrument– High quality compatible analog component measurements

• Accepts Older Optional CFB, AFTM, FTI and DSM Instruments– No fixture or program changes required

• Selectable Programmer and Operator Software Environments– Use traditional GR228X or new Navigate development environments

New TestStation LX: Protects your Investments...

Support for D2B Version 3.2

• Create Panels from a Single Board

• Enhanced electrical probe placement rules

• Support for Tecnomatix CAD Translators

• D2B/ECO software compares fixture, design, and BOM data

• FLEXlm supports floating, node-locked, and WAN licensing

Program Prep Support for SafeTest

• Technology Data Library– Stores key parametric information– Voltage logic levels, slew rates, and output currents

• Updated Test Library Models – TECHNOLOGY keyword associates device pins with Technology Names in the

Technology Data Library

• New Assign Logic Test Generator– Automatically creates ASSIGN LGC statements with accurate voltage, current, and

slew rate settings for each net on the board

• Backdrive Current Learn and Create Commands – /LEARN option learns the maximum backdrive currents associated with each logic

lamily and automatically updates Burst

– /CREATE option creates a backdrive data file that contains the maximum backdrive current measured on each net of the board

Technology Data Library and Technology Model Keyword

• Common Technology Types Defined in System Technology Data Library

• User defined Technology Types defined in Site and User Technology Data Libraries

• Technology Data Editor allows user to view and modify technology data

• Digital and Hybrid Models associate device pins to defined Technologies

.HEAD;…

/* Default Pin Technology is AHCT */ .TECHNOLOGY AHCT; .TECHNOLOGY RSL(5,18,22,24);.END HEAD;

New Assign Logic Test Generator• Analyzes technologies

on each net and assigns compatible logic levels

• Optionally uses Backdrive Learn Data File to assign Backdrive limits

• Generates Assign Logic Program and Report

• Assign Logic Program automatically merged with Digital, Hybrid, and BSCAN test programs

• Warning and Errors written to Report file

Sample Assign Logic Files

/* Backdrive Data File: GRdemo.bdd *//* OBC File: D:\8X\Tests\grdemo\binary\TS124sys\GRdemo.obc *//* Date: Thursday, April 22, 2004 15:52 *//* Node Name Imax Backdrive Burst Label */ CLK 76 mA; /* U12_FUNC_DIGITAL */ RESETL 129 mA; /* U10 */ P5V 401 mA; /* U12_C2 */ PCENAL 212 mA; /* U12_FUNC_DIGITAL */ CERAML 56 mA; /* U12_FUNC_DIGITAL */ MISO 52 mA; /* U4 */ MOSI 521 mA; /* U10 */ IMEAS 321 mA; /* U16 */ NC9 89 mA; /* U4 */ RXV 93 mA; /* RAM32KX8 */ SCK 58 mA; /* U4 */ SS 388 mA; /* U9 */ TXD 64 mA; /* U5 */ VFILTER 110 mA; /* U8 */ VGAIN 123 mA; /* U7_C2*/ VPEAK 137 mA; /* U4 */

/* Assign Logic Program generated Thursday, April 01, 2004 14:57 */GLOBAL_ASSIGN_LOGICS:ASSIGN LGC VCDH=1.45 VCDL=0.40 VCST=0.92 VTT=0.92 VOHA=2.40 VOLA=0.40 VIHA=3.50 VILA=0.40 SLEWA=100.00 BDIA=100.00M BDTA=10.00M LVLA(A20GATE,ANAGND,APIC,AUD_LINK,AUD_LINK_RST...)

VOHB=2.00 VOLB=0.60 VIHB=2.46 VILB=0.12 SLEWB=50.00 BDIB=50.00M BDTB=10.00M HIACCURACYB LVLB(CK_M_133M,CK_MN_DDR1…)

VOHC=2.40 VOLC=0.40 VIHC=3.25 VILC=0.25 SLEWC=100.00 BDIC=50.00M BDTC=10.00M LVLC(CORE_HS,CORE_VS,GLUE4_3V,GLUE4_CSDA_3V...)

VOHD=1.28 VOLD=0.11 VIHD=1.45 VILD=0.08 SLEWD=100.00 BDID=50.00M BDTD=0.18M HIACCURACYD LVLD(GMCH_FSB,HI0,HI1,HI2,HI3,HI4…)

VOHE=1.15 VOLE=0.60 VIHE=1.50 VILE=0.20 SLEWE=100.00 BDIE=50.00M BDTE=0.05M HIACCURACYE LVLE(G_AD0,G_AD1,G_AD11,G_AD12…)

VOHF=1.30 VOLF=0.80 VIHF=1.50 VILF=0.20 SLEWF=100.00 BDIF=50.00M BDTF=0.05M HIACCURACYF LVLF(H_ADSTB0_,H_ADS_,H_A_10…);

Improved Vectorless Test Capabilities

• New FrameScan Capacitive Opens Technique

• Active Probe improves pin coverage of low measurement signals

• New User Interface simplifies Vectorless Test Debug Activities

• Also Supports Opens Xpress and Junction Xpress Techniques

/* Main Test Program*/U16A: CLEAR CLOCK;SET CLOCK /* CLOCK NAME IS TCK */ AT(CDA=2) NINC=10,5 TINC=100N SIGNAL(CDA=L0),(CDA=L0,H2,L4) DST(D1,S4),(D0,S4) VCDH=4.0 VCDL=0.2 OFF;

/* Start of Burst for U16_A */U16_A:#INCLUDE "burstu16a.txt"/* End of Burst for U16_A */

Test Language #INCLUDE Keyword• Allows test programs to

be stored as separate files

• Separate files can be combined into single OBC by Translator

• Simplifies test program management and debug activities

• Reduces editing time of large test program files

• Simplifies support for multiple board revisions

• #INCLUDEs replaced with WRITE message and FAIL bit if not selected

Intel® Socket Test Technology• A special module for testing Intel mPGA478 and

LGA775 processor socket and ball-grid array interconnect components

– Designed by Intel– Licensed to Teradyne– Special test model created by Teradyne

• Allows testing for open solder joints of all balls of the mPGA478 or LGA775 processor sockets

– Including signal, power, and ground balls

– Ensures that all CPU connections through the socket to the circuit board are electrically correct across all three primary pin types

– Historical test solutions have only provided coverage for signal pin connections

• Module is an array of N-Channel FET pairs– Module plugs directly into the Board Under Test Processor

socket– Processor must be removed from the Board under test

Enhanced Power and Capacitor Discharge Routines

• Analog Test Library and Power Supply Editor have new Capacitor and Power Discharge code

• Support for older non-ICA power supplies (UPS, SVS, PVS, HCS) removed from Discharge routine

• Discharge time is 28% to 53% faster compared to code generated in previous software release

• Less relay stress during discharge increases longevity of pin board relays

• Requires users to re-generate their Analog and Power Test Programs using 5.8.0 and paste into their existing programs

New Hybrid Device Models

L293

L298

L6203

MAX202

MAX206

MAX22

MC145406

TS2P8V

Hybrid Models

Created by Teradyne application engineers to demonstrate how the analog and digital subsystems can be used together to test Digital/Analog devices that exceed the voltage range of the UltraPin sensor (voltages greater than 5.5 volts or less than -2.5V).

New TestStation Licenses

• 580 License allows users to run TestStation 5.8.0 software

• CST License allows TSLH testers to execute Bursts that use Clock and Trigger resources

• Backdrive License allows tester to use Backdrive Measurement and Control features

• Backdrive and CST licenses are optional for TSLH testers, standard on other TS

New TSLH Fixture Converters and Adapters

• New fixture converter makes it possible to run existing TestStation 12X 33 slot fixtures and programs on the TestStation LH 19 slot receiver

– refer to the TSLH Standard Size Fixture Converter document located in the C:\Teradyne\228x\applications directory

• A new Adapter is also available for TestStation L/LX large 33 slot receivers. This adapter can be used to put a large TSLH 19 slot fixture on the TestStation L/LX large 33 slot receivers

Summary:Benefits of 580 Features...

• TestStation 12X Enhanced Controller Testers– Smaller Footprint and ergonomic design – Consolidated control cards and Accessory slot increase tester pin capacity– Lower cost built-in DSM and Frequency Test instruments– Increased memory behind the pin

• D2B Version 3.2– Improved Probe Placement Solutions– Support for all Tecnomatix CAD Translators– D2B ECO software simplifies Board Revision changes and fixture modifications– Floating software licenses support cost-effective collaborative program development

• SafeTest Program Prep Support– Automatic generation of ASSIGN LGC statements saves hours of development time– Automatic selection of optimum Backdrive Current and Duration limits– Reduces chances of exposing components to Electrical Over-Stress conditions

• Improved Vectorless Test– New FrameScan technique with active probes improve fault coverage of low signal pins– Simple user interface allows faster Vectorless Test generation and debug

• #INCLUDE Test Language Keyword– Reduces editing time of large test program files– Simplifies support for multiple board revisions

• Intel Socket Test Technology– Increased ICT Coverage for boards with Intel Processor Sockets– Detects opens on individual power and ground socket pins

• Enhanced Voltage Discharge Routines– Reduces test times by seconds– Tiered discharge technique produces less stress on pin board relays

• New Hybrid Device Models– Automatic generation of mixed signal tests– Tests use Analog subsystem to measure digital voltages that exceed range of Ultrapin

• New Fixture Converters and Adapters– Run 33 slot GR228X/TS12X programs and fixtures on 19 slot TS LH testers

– Run 19 slot slot TS LH fixtures on TS12X L/LX testers

Summary:Benefits of 580 Features...

Special 5.8.0 Promotion Program

• Visit Teradyne Web site for details on the promotion– URL: http://www.teradyne.com/ict/grteststation-in-circuit-test/prod_teststation.html

Questions?